JP2023168266A - 偏光異方に基づく測定による解析方法及び解析装置 - Google Patents

偏光異方に基づく測定による解析方法及び解析装置 Download PDF

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Publication number
JP2023168266A
JP2023168266A JP2023076794A JP2023076794A JP2023168266A JP 2023168266 A JP2023168266 A JP 2023168266A JP 2023076794 A JP2023076794 A JP 2023076794A JP 2023076794 A JP2023076794 A JP 2023076794A JP 2023168266 A JP2023168266 A JP 2023168266A
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Japan
Prior art keywords
target substance
time
analysis method
luminescent
polarized light
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Pending
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JP2023076794A
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English (en)
Japanese (ja)
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JP2023168266A5 (enExample
Inventor
法重 掛川
Norishige Kakegawa
考洋 増村
Takahiro Masumura
文生 山内
Fumio Yamauchi
健吾 金崎
Kengo Kanezaki
智広 中村
Tomohiro Nakamura
生朗 中嶋
Ikuo Nakajima
悌互 榊原
Teigo Sakakibara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Canon Medical Systems Corp
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Canon Inc
Canon Medical Systems Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Canon Inc, Canon Medical Systems Corp filed Critical Canon Inc
Priority to PCT/JP2023/017784 priority Critical patent/WO2023219139A1/ja
Priority to EP23803613.1A priority patent/EP4509820A4/en
Priority to CN202380039464.0A priority patent/CN119173758A/zh
Publication of JP2023168266A publication Critical patent/JP2023168266A/ja
Priority to US18/938,509 priority patent/US20250060364A1/en
Publication of JP2023168266A5 publication Critical patent/JP2023168266A5/ja
Pending legal-status Critical Current

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2023076794A 2022-05-13 2023-05-08 偏光異方に基づく測定による解析方法及び解析装置 Pending JP2023168266A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
PCT/JP2023/017784 WO2023219139A1 (ja) 2022-05-13 2023-05-11 偏光異方に基づく測定による解析方法及び解析装置
EP23803613.1A EP4509820A4 (en) 2022-05-13 2023-05-11 ANALYSIS METHOD AND ANALYSIS DEVICE USING A MEASUREMENT BASED ON POLARIZATION ANISOTROPY
CN202380039464.0A CN119173758A (zh) 2022-05-13 2023-05-11 利用基于偏振各向异性的测量的分析方法和分析设备
US18/938,509 US20250060364A1 (en) 2022-05-13 2024-11-06 Analysis method and analysis device employing measurement based on polarization anisotropy

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022079524 2022-05-13
JP2022079524 2022-05-13

Publications (2)

Publication Number Publication Date
JP2023168266A true JP2023168266A (ja) 2023-11-24
JP2023168266A5 JP2023168266A5 (enExample) 2026-05-14

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JP2023076794A Pending JP2023168266A (ja) 2022-05-13 2023-05-08 偏光異方に基づく測定による解析方法及び解析装置

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JP (1) JP2023168266A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026058935A1 (ja) * 2024-09-12 2026-03-19 キヤノン株式会社 標的物質の検出方法及び標的物質の検査キット

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026058935A1 (ja) * 2024-09-12 2026-03-19 キヤノン株式会社 標的物質の検出方法及び標的物質の検査キット

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