JP2023158001A - Substrate processing device and substrate processing system - Google Patents

Substrate processing device and substrate processing system Download PDF

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JP2023158001A
JP2023158001A JP2023136047A JP2023136047A JP2023158001A JP 2023158001 A JP2023158001 A JP 2023158001A JP 2023136047 A JP2023136047 A JP 2023136047A JP 2023136047 A JP2023136047 A JP 2023136047A JP 2023158001 A JP2023158001 A JP 2023158001A
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hydrogen peroxide
tank
substrate processing
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solution
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敬次 岩田
Keiji Iwata
博章 内田
Hiroaki Uchida
啓二 真柄
Keiji Magara
哲弥 柴田
Tetsuya Shibata
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Screen Holdings Co Ltd
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Abstract

To improve cleaning performance by creating a highly active SPM solution.SOLUTION: A substrate processing device includes a processing tank, an external tank, a circulatory path, a heating unit, and a hydrogen peroxide water replenishment unit. The processing tank is for processing a substrate with a mixed solution including sulfuric acid and hydrogen peroxide water. The external tank is for collecting the mixed solution that overflows from the processing tank. One end of the circulatory path is connected to the mixed solution collected in the external tank. The other end of the circulatory path is connected and circulated in the mixed solution stored inside the processing tank. The circulatory path is for circulating the mixed solution from the external tank to the processing tank. The heating unit is arranged in the circulatory path for heating the mixed solution circulating through the circulatory path. The hydrogen peroxide water replenishment unit is for replenishing hydrogen peroxide water to the mixed solution in the vicinity of the one end of the circulatory path in the external tank or to the mixed solution on the upstream side of the heating unit in the circulatory path.SELECTED DRAWING: Figure 1

Description

本発明は、半導体ウェハ、液晶ディスプレイ用基板、プラズマディスプレイ用基板、有機EL用基板、FED(Field Emission Display)、光ディスプレイ用基板、磁気ディスク用基板、光磁気ディスク用基板、フォトマスク用基板、太陽電池用基板(以下、単に「基板」と称する)に対して、処理液によって処理を行う基板処理装置及び基板処理システムに関する。 The present invention relates to semiconductor wafers, liquid crystal display substrates, plasma display substrates, organic EL substrates, FEDs (Field Emission Displays), optical display substrates, magnetic disk substrates, magneto-optical disk substrates, photomask substrates, The present invention relates to a substrate processing apparatus and a substrate processing system that process a solar cell substrate (hereinafter simply referred to as a "substrate") using a processing liquid.

従来、基板の表面に残存するレジストの剥離やその他の有機性の汚染物質を除去するために、洗浄能力の高いカロ酸を生じる硫酸過酸化水素水混合液(SPM:Sulfuric acid/hydrogen Peroxide Mixture)が用いられている。特に、混合液を満たした処理槽内に複
数枚の基板を同時に浸漬して洗浄を行うバッチ式の基板処理装置においては、SPM液内に数十枚の基板を浸漬し、所定時間経過後に基板を取り出した後に、次の基板を浸漬する動作を繰り返す。このように連続的に洗浄を行う場合には、処理槽内のSPM液が基板表面に付着し、処理槽外に持ち出されることにより、SPM液のレベルが低下するので、所定のタイミングで硫酸や過酸化水素水を補充している。
Conventionally, in order to remove resist peeling and other organic contaminants remaining on the surface of the substrate, a sulfuric acid/hydrogen peroxide mixture (SPM), which produces caroic acid with high cleaning ability, has been used. is used. In particular, in batch-type substrate processing equipment that cleans multiple substrates by simultaneously immersing them in a processing tank filled with a mixed solution, dozens of substrates are immersed in the SPM solution, and after a predetermined period of time, the substrates are cleaned. After taking out the substrate, repeat the process of dipping the next substrate. When cleaning is performed continuously in this way, the SPM solution in the processing tank adheres to the substrate surface and is carried out of the processing tank, reducing the level of the SPM solution. Replenishing hydrogen peroxide.

また、過酸化水素水は比較的不安定な物質であり、徐々に分解して水を生成することから、液レベルの低下に合せて硫酸や過酸化水素水を補充してもSPM液中の硫酸濃度が経時的に低下し、これによりSPM液の洗浄能力も低下する。 In addition, hydrogen peroxide is a relatively unstable substance and gradually decomposes to produce water, so even if sulfuric acid or hydrogen peroxide is replenished as the liquid level drops, the The sulfuric acid concentration decreases over time, which also reduces the cleaning ability of the SPM solution.

このような過酸化水素水の特性を考慮し、過酸化水素水の補充に関して種々の提案がなされている。例えば、特許文献1では、外槽と内槽とを接続して混合液を循環させる循環ラインに設けられたヒータと、内槽の底部に配置されるSPM供給ノズルとの間の部に過酸化水素水供給ラインが接続されている。ここでは、過酸化水素水供給ラインから循環ラインに供給された過酸化水素水がSPM供給ノズルの吐出孔から吐出するまでの時間が5秒以内、または、過酸化水素水供給ラインの循環ラインへの接続部からSPM供給ノズルの吐出孔までの距離が50cm以下とされている。 In consideration of such characteristics of hydrogen peroxide, various proposals have been made regarding replenishment of hydrogen peroxide. For example, in Patent Document 1, peroxide is added to a part between a heater installed in a circulation line that connects an outer tank and an inner tank and circulates a mixed liquid, and an SPM supply nozzle arranged at the bottom of the inner tank. A hydrogen water supply line is connected. Here, the hydrogen peroxide solution supplied from the hydrogen peroxide solution supply line to the circulation line is discharged from the discharge hole of the SPM supply nozzle within 5 seconds, or the hydrogen peroxide solution supplied to the circulation line of the hydrogen peroxide solution supply line is discharged from the discharge hole of the SPM supply nozzle. The distance from the connection part to the discharge hole of the SPM supply nozzle is 50 cm or less.

特許第5454108号公報Patent No. 5454108

しかし、このよう構成では、SPM供給ノズルから吐出される混合液においてカロ酸が十分に活性化していない可能性がある。 However, in such a configuration, Caro's acid may not be sufficiently activated in the liquid mixture discharged from the SPM supply nozzle.

そこで、開示の技術の1つの側面は、硫酸と過酸化水素水とを含む高活性の混合液を作成し、洗浄能力を向上させることを課題とする。 Therefore, one aspect of the disclosed technology is to create a highly active liquid mixture containing sulfuric acid and hydrogen peroxide solution to improve the cleaning ability.

開示の技術の1つの側面は、次のような基板処理装置によって例示される。
すなわち、本基板処理装置は、
基板を処理する基板処理装置において、
硫酸と過酸化水素水とを含む混合液で前記基板を処理する処理槽と、
前記処理槽から溢れた前記混合液を回収する外槽と、
一端が前記外槽に回収された前記混合液中に流通接続され、他端が前記処理槽内に貯留された前記混合液中に流通接続され、前記混合液を前記外槽から前記処理槽に向けて循環させる循環路と、
前記循環路に配置され、前記循環路内を流通する前記混合液を加熱する加熱部と、
前記外槽内における前記循環路の前記一端の近傍に存在する前記混合液又は前記循環路内における前記加熱部よりも上流側に存在する前記混合液に対して前記過酸化水素水を補充する過酸化水素水補充部と、
を備えることを特徴とする。
One aspect of the disclosed technology is exemplified by the following substrate processing apparatus.
In other words, this substrate processing apparatus:
In a substrate processing apparatus that processes a substrate,
a treatment tank for treating the substrate with a mixed solution containing sulfuric acid and hydrogen peroxide;
an outer tank for collecting the mixed liquid overflowing from the processing tank;
One end is connected to flow into the mixed liquid collected in the outer tank, the other end is connected to flow into the mixed liquid stored in the processing tank, and the mixed liquid is transferred from the outer tank to the processing tank. A circulation path that circulates toward
a heating unit that is disposed in the circulation path and heats the mixed liquid flowing in the circulation path;
replenishing the hydrogen peroxide solution to the mixed liquid existing in the vicinity of the one end of the circulation path in the outer tank or to the mixed liquid existing upstream of the heating section in the circulation path; A hydrogen oxide water replenishment section,
It is characterized by having the following.

このような発明によれば、過酸化水素水が外槽内における循環路の一端の近傍に存在する混合液に補充されることにより、外槽内の混合液に希釈される前に循環路を流通する混合液に過酸化水素水を補充することができる。また、過酸化水素水が循環路内における加熱部よりも上流側に存在する混合液に補充されることにより、加熱部により加熱される前の低温の混合液に補充されるので、分解による過酸化水素水の濃度の低下を抑制することができる。従って、過酸化水素水の濃度が高く、高活性の混合液を作成することでき、基板の洗浄能力が向上する。
ここで、流通接続は、流体が流通可能な態様で接続されていることをいう。
According to such an invention, the hydrogen peroxide solution is replenished to the liquid mixture existing near one end of the circulation path in the outer tank, so that the hydrogen peroxide solution is added to the liquid mixture in the outer tank before being diluted into the liquid mixture in the outer tank. The flowing mixed liquid can be replenished with hydrogen peroxide solution. In addition, hydrogen peroxide water is replenished into the mixed liquid existing upstream of the heating part in the circulation path, and the low-temperature mixed liquid before being heated by the heating part is replenished, so the hydrogen peroxide solution is A decrease in the concentration of hydrogen oxide water can be suppressed. Therefore, a highly active mixed solution with a high concentration of hydrogen peroxide solution can be prepared, and the ability to clean the substrate is improved.
Here, the term "flow connection" refers to connection in such a manner that fluid can flow therethrough.

本発明においては、
前記過酸化水素水補充部は、
前記過酸化水素水を貯留する過酸化水素水貯留槽と、
一端が該過酸化水素水貯留槽に流通接続され、他端が前記外槽に回収された前記混合液中に接続される過酸化水素水補充管と、
を備え、
前記過酸化水素水補充管の前記他端は、前記循環路の前記一端の前記近傍に配置されるようにしてもよい。
In the present invention,
The hydrogen peroxide replenishment section is
a hydrogen peroxide water storage tank that stores the hydrogen peroxide water;
a hydrogen peroxide water replenishment pipe whose one end is connected to the hydrogen peroxide water storage tank and whose other end is connected to the mixed liquid collected in the outer tank;
Equipped with
The other end of the hydrogen peroxide water replenishment pipe may be arranged near the one end of the circulation path.

このように本発明によれば、過酸化水素水補充管の他端を循環路の一端の近傍に配することにより、外槽内の混合液に希釈される前に循環路を流通する混合液に過酸化水素水を補充することができる。従って、過酸化水素水の濃度が高く、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 According to the present invention, by arranging the other end of the hydrogen peroxide solution replenishment pipe near one end of the circulation path, the mixed liquid flowing through the circulation path before being diluted with the mixed liquid in the outer tank is can be refilled with hydrogen peroxide. Therefore, a highly active mixed solution with a high concentration of hydrogen peroxide solution can be prepared, and the ability to clean the substrate is improved.

本発明においては、
前記循環路の前記加熱部より上流側に、前記外槽で回収された前記混合液を前記処理槽に向けて送液する混合液送液ポンプを備え、
前記混合液送液ポンプにより前記外槽内の前記混合液が前記循環路の前記一端から吸引されるときに周囲の領域よりも負圧となる領域に、前記過酸化水素水補充管の前記他端が配置されるようにしてもよい。
In the present invention,
A mixed liquid feeding pump is provided upstream of the heating part of the circulation path to feed the mixed liquid collected in the outer tank toward the processing tank,
When the mixed liquid in the outer tank is sucked from the one end of the circulation path by the mixed liquid feeding pump, the other part of the hydrogen peroxide water replenishment pipe is placed in an area where the pressure is more negative than the surrounding area. The ends may be arranged.

このように本発明によれば、混合液送液ポンプにより外槽内の混合液が循環路の一端から吸引されるときに周囲の領域よりも負圧となる領域に、過酸化水素水補充管の他端を配置することにより、補充された過酸化水素水が外槽内の混合液に希釈される前に混合液送液ポンプの次の吸引動作によって吸引されて循環路内の混合液に混合される。従って、過酸化水素水の濃度が高く、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 As described above, according to the present invention, the hydrogen peroxide water replenishment pipe is installed in the area where the pressure is more negative than the surrounding area when the mixed liquid in the outer tank is sucked from one end of the circulation path by the mixed liquid feeding pump. By arranging the other end, before the refilled hydrogen peroxide solution is diluted into the mixed liquid in the outer tank, it is sucked into the mixed liquid in the circulation path by the next suction operation of the mixed liquid feed pump. mixed. Therefore, a highly active mixed solution with a high concentration of hydrogen peroxide solution can be prepared, and the ability to clean the substrate is improved.

本発明においては、
前記過酸化水素水補充部は、
前記過酸化水素水を貯留する過酸化水素水貯留槽と、
一端が該過酸化水素水貯留槽に流通接続され、他端が前記循環路の前記加熱部よりも上
流側に流通接続される過酸化水素水補充管と、
を備えるようにしてもよい。
In the present invention,
The hydrogen peroxide replenishment section is
a hydrogen peroxide water storage tank that stores the hydrogen peroxide water;
a hydrogen peroxide water replenishment pipe, one end of which is connected to the hydrogen peroxide storage tank, and the other end of which is connected to the upstream side of the heating section of the circulation path;
may be provided.

このように本発明によれば、過酸化水素水補充管の他端が循環路の加熱部よりも上流側に流通接続されるので、過酸化水素水が循環路内における加熱部よりも上流側に存在する混合液に補充されることとなる。これにより、過酸化水素水が加熱部により加熱される前の低温の混合液に補充されるので、分解による過酸化水素水の濃度の低下を抑制することができる。従って、過酸化水素水の濃度が高く、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 According to the present invention, the other end of the hydrogen peroxide replenishment pipe is connected to the upstream side of the heating section in the circulation path, so that the hydrogen peroxide solution is connected to the upstream side of the heating section in the circulation path. This will be replenished by the mixed liquid present in the Thereby, the hydrogen peroxide solution is replenished into the low-temperature mixed liquid before being heated by the heating section, so that a decrease in the concentration of the hydrogen peroxide solution due to decomposition can be suppressed. Therefore, a highly active mixed solution with a high concentration of hydrogen peroxide solution can be prepared, and the ability to clean the substrate is improved.

本発明においては、
前記循環路の前記加熱部より上流側に、前記外槽で回収された前記混合液を前記処理槽に向けて送液する混合液送液ポンプを備え、
前記過酸化水素水補充管の前記他端は前記混合液送液ポンプよりも上流側において前記循環路に流通接続されるようにしてもよい。
In the present invention,
A mixed liquid feeding pump is provided upstream of the heating part of the circulation path to feed the mixed liquid collected in the outer tank toward the processing tank,
The other end of the hydrogen peroxide water replenishment pipe may be fluidly connected to the circulation path upstream of the mixed liquid feeding pump.

このように本発明によれば、混合液送液ポンプの上流側で生じる負圧によって、補充された過酸化水素水の混合液との混合が促進され、混合液の活性化が促進される。従って、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 As described above, according to the present invention, the negative pressure generated on the upstream side of the mixed liquid feeding pump promotes mixing with the replenished hydrogen peroxide mixture, and promotes activation of the mixed liquid. Therefore, a highly active mixed solution can be created, and the ability to clean the substrate is improved.

本発明においては、
前記過酸化水素水補充部は、前記過酸化水素水を前記過酸化水素水補充管に送液する過酸化水素水送液ポンプをさらに有し、
前記混合液送液ポンプと前記過酸化水素水送液ポンプとを制御する制御部を、さらに備え、
前記制御部は、前記混合液送液ポンプの吸引動作が開始される前に、前記過酸化水素水補充部から前記過酸化水素水が補充されるように前記混合液送液ポンプと前記過酸化水素水送液ポンプとを制御するようにしてもよい。
In the present invention,
The hydrogen peroxide water replenishment unit further includes a hydrogen peroxide water feeding pump that feeds the hydrogen peroxide water to the hydrogen peroxide water replenishment pipe,
further comprising a control unit that controls the mixed liquid feeding pump and the hydrogen peroxide water feeding pump,
The control unit controls the mixed liquid feeding pump and the peroxide solution so that the hydrogen peroxide solution is replenished from the hydrogen peroxide solution replenishing unit before the suction operation of the mixed liquid feeding pump is started. The hydrogen water supply pump may also be controlled.

このように、本発明によれば、混合液送液ポンプの吸引動作が開始される前に、過酸化水素水補充部から過酸化水素水が補充されるように混合液送液ポンプと過酸化水素水送液ポンプが制御されるので、過酸化水素水の希釈や分解により過酸化水素水の濃度が低下する前に混合液に過酸化水素水が補充される。従って、過酸化水素水の濃度が高く、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 As described above, according to the present invention, the mixed liquid feeding pump and the peroxide solution are refilled with hydrogen peroxide from the hydrogen peroxide replenishing section before the suction operation of the mixed liquid feeding pump is started. Since the hydrogen water pump is controlled, the mixed solution is replenished with hydrogen peroxide before the concentration of the hydrogen peroxide drops due to dilution or decomposition of the hydrogen peroxide. Therefore, a highly active mixed solution with a high concentration of hydrogen peroxide solution can be prepared, and the ability to clean the substrate is improved.

本発明においては、
前記処理槽内の前記混合液に対して前記硫酸を補充する硫酸補充部をさらに備えるようにしてもよい。
In the present invention,
You may make it further include a sulfuric acid replenishment part which replenishes the said sulfuric acid to the said mixed liquid in the said processing tank.

このように、本発明によれば、硫酸補充部により硫酸を補充することができるので、混合液における硫酸の濃度を適切に維持することができる。従って、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 As described above, according to the present invention, sulfuric acid can be replenished by the sulfuric acid replenisher, so that the concentration of sulfuric acid in the mixed liquid can be maintained appropriately. Therefore, a highly active mixed solution can be created, and the ability to clean the substrate is improved.

また、本発明は、前記基板処理装置を備える基板処理システムである。 Further, the present invention is a substrate processing system including the substrate processing apparatus.

このように、本発明によれば、上述の基板処理装置から基板処理システムを構成することにより、基板処理システムにおける基板の洗浄能力が向上する。 As described above, according to the present invention, by configuring a substrate processing system from the above-described substrate processing apparatus, the substrate cleaning ability of the substrate processing system is improved.

また、本発明は、
基板を処理する基板処理方法であって、
硫酸と過酸化水素水とを含む混合液で前記基板を処理する処理槽と、
前記処理槽から溢れた前記混合液を回収する外槽と、
一端が前記外槽に回収された前記混合液中に接続され、他端が前記処理槽内に貯留された前記混合液中に流通接続され、前記混合液を前記外槽から前記処理槽に向けて循環させる循環路と、
前記循環路に配置され、前記循環路内を流通する前記混合液を加熱する加熱部と、
前記循環路の前記加熱部より上流側に、前記外槽で回収された前記混合液を前記処理槽に向けて送液する混合液送液ポンプと、
前記外槽内における前記循環路の前記一端の近傍に存在する前記混合液又は前記循環路内における前記加熱部よりも上流側に存在する前記混合液に対して前記過酸化水素水を補充する過酸化水素水補充部であって、補充すべき前記過酸化水素水を送液する過酸化水素水送液ポンプを有する過酸化水素水補充部と、
を備える基板処理装置において、
前記混合液送液ポンプによって前記混合液を吸引するステップと、
前記混合液送液ポンプによる前記混合液の吸引を開始する前に、前記過酸化水素水送液ポンプによって前記過酸化水素水を吸引するステップと、
を含む基板処理方法である。
Moreover, the present invention
A substrate processing method for processing a substrate, the method comprising:
a treatment tank for treating the substrate with a mixed solution containing sulfuric acid and hydrogen peroxide;
an outer tank for collecting the mixed liquid overflowing from the processing tank;
One end is connected to the mixed liquid collected in the outer tank, the other end is connected to the mixed liquid stored in the processing tank, and the mixed liquid is directed from the outer tank to the processing tank. a circulation path for circulating the
a heating unit that is disposed in the circulation path and heats the mixed liquid flowing in the circulation path;
A mixed liquid sending pump that sends the mixed liquid collected in the outer tank toward the processing tank upstream of the heating part of the circulation path;
replenishing the hydrogen peroxide solution to the mixed liquid existing in the vicinity of the one end of the circulation path in the outer tank or to the mixed liquid existing upstream of the heating section in the circulation path; a hydrogen peroxide water replenishing unit, the hydrogen peroxide water replenishing unit having a hydrogen peroxide water feeding pump for feeding the hydrogen peroxide water to be refilled;
A substrate processing apparatus comprising:
suctioning the mixed liquid by the mixed liquid feeding pump;
Suctioning the hydrogen peroxide solution by the hydrogen peroxide water supply pump before starting suction of the mixed solution by the mixed solution supply pump;
A substrate processing method including:

このように、本発明によれば、混合液送液ポンプの吸引動作が開始される前に、過酸化水素水補充部から過酸化水素水が補充されるように混合液送液ポンプと過酸化水素水送液ポンプが制御されるので、過酸化水素水の希釈や分解により過酸化水素水の濃度が低下する前に混合液に過酸化水素水が補充される。従って、過酸化水素水の濃度が高く、高活性の混合液を作成することでき、基板の洗浄能力が向上する。 As described above, according to the present invention, the mixed liquid feeding pump and the peroxide solution are refilled with hydrogen peroxide from the hydrogen peroxide replenishing section before the suction operation of the mixed liquid feeding pump is started. Since the hydrogen water pump is controlled, the mixed solution is replenished with hydrogen peroxide before the concentration of the hydrogen peroxide drops due to dilution or decomposition of the hydrogen peroxide. Therefore, a highly active mixed solution with a high concentration of hydrogen peroxide solution can be prepared, and the ability to clean the substrate is improved.

本発明に係る基板処理装置によれば、硫酸と過酸化水素水とを含む高活性の混合液を作成し、洗浄能力を向上させることができる。 According to the substrate processing apparatus according to the present invention, it is possible to create a highly active mixed solution containing sulfuric acid and hydrogen peroxide solution, and improve cleaning performance.

図1は、実施例1の基板処理装置の概略構成を示すブロック図である。FIG. 1 is a block diagram showing a schematic configuration of a substrate processing apparatus according to a first embodiment. 図2は、実施例1の基板処理方法を示すフローチャートである。FIG. 2 is a flowchart showing the substrate processing method of Example 1. 図3は、実施例2の基板処理装置の概略構成を示すブロック図である。FIG. 3 is a block diagram showing a schematic configuration of a substrate processing apparatus according to a second embodiment. 図4は、実施例2の基板処理方法の一部を示すフローチャートである。FIG. 4 is a flowchart showing part of the substrate processing method according to the second embodiment. 図5は、実施例3の基板処理装置の概略構成を示すブロック図である。FIG. 5 is a block diagram showing a schematic configuration of a substrate processing apparatus according to the third embodiment. 図6は、実施例4の基板処理装置の概略構成を示すブロック図である。FIG. 6 is a block diagram showing a schematic configuration of a substrate processing apparatus according to the fourth embodiment. 図7は、実施例5の基板処理システムの概略構成を示す平面図である。FIG. 7 is a plan view showing a schematic configuration of a substrate processing system of Example 5.

<実施例1>
以下、本発明の実施例1について図面を参照しながら詳細に説明する。なお、以下に示す実施例は、本願発明の一態様であり、本願発明の技術的範囲を限定するものではない。図1は、実施例1に係る基板処理装置1の概略構成を示すブロック図である。
<Example 1>
Hereinafter, a first embodiment of the present invention will be described in detail with reference to the drawings. Note that the example shown below is one aspect of the present invention, and does not limit the technical scope of the present invention. FIG. 1 is a block diagram showing a schematic configuration of a substrate processing apparatus 1 according to a first embodiment.

基板処理装置1は、複数枚の基板Wを一括してSPM液Lで洗浄処理するバッチ式の装置である。この基板処理装置1は、処理槽11とオーバーフロー槽12とを備える。処理槽11は複数枚の基板Wを収容可能な大きさを有し、SPM液Lを貯留して複数枚の基板Wに対してSPM液Lによる洗浄処理を行う。オーバーフロー槽12は、処理槽11の上縁の周囲に設けられ、処理槽11から溢れたSPM液を回収する。ここでは、SPM液が本発明の「混合液」に対応し、オーバーフロー槽12が本発明の「外槽」に対応する。 The substrate processing apparatus 1 is a batch type apparatus that cleans a plurality of substrates W at once with an SPM liquid L. This substrate processing apparatus 1 includes a processing tank 11 and an overflow tank 12. The processing tank 11 has a size capable of accommodating a plurality of substrates W, stores SPM liquid L, and performs a cleaning process using the SPM liquid L on the plurality of substrates W. The overflow tank 12 is provided around the upper edge of the processing tank 11 and collects the SPM liquid overflowing from the processing tank 11. Here, the SPM liquid corresponds to the "mixed liquid" of the present invention, and the overflow tank 12 corresponds to the "outer tank" of the present invention.

処理槽11とオーバーフロー槽12とは、循環配管13によって流通接続されている。循環配管13は、一端側がオーバーフロー槽12の上部から底部に向って配置され、他端側が処理槽11の底部に配置されたSPM液供給管141,142に接続されている。循環配管13には、オーバーフロー槽12側に設けられたSPM液送液ポンプ15から、処理槽11側、すなわち処理液の下流側に向って、インラインヒータ16、フィルタ17、制御弁18が、その順に配置されている。ここでは、循環配管13が本発明の「循環路」に対応し、SPM液送液ポンプ15が本発明の「混合液送液ポンプ」に対応し、インラインヒータ16が本発明の「加熱部」に対応する。 The processing tank 11 and the overflow tank 12 are connected through a circulation pipe 13 . One end of the circulation pipe 13 is arranged from the top to the bottom of the overflow tank 12, and the other end is connected to SPM liquid supply pipes 141 and 142 arranged at the bottom of the processing tank 11. In the circulation pipe 13, an in-line heater 16, a filter 17, and a control valve 18 are connected from the SPM liquid feeding pump 15 provided on the overflow tank 12 side toward the processing tank 11 side, that is, the downstream side of the processing liquid. They are arranged in order. Here, the circulation pipe 13 corresponds to the "circulation path" of the present invention, the SPM liquid feed pump 15 corresponds to the "mixed liquid feed pump" of the present invention, and the inline heater 16 corresponds to the "heating section" of the present invention. corresponds to

SPM液送液ポンプ15は、循環配管13を通じてSPM液を圧送する。インラインヒータ16は、循環配管13を流通するSPM液を加熱し、処理温度(例えば、約120℃~140℃)に温調する。フィルタ17は循環配管13を流通するSPM液中のパーティクル等の異物をろ過して除去する。制御弁18は、循環配管13中における処理液の流通を制御する。SPM液送液ポンプ15がオンされると、オーバーフロー槽12に貯留するSPM液が循環配管13に吸い込まれ、インラインヒータ16による温調と、フィルタ17によるろ過が行われて処理槽11に送られる。 The SPM liquid feeding pump 15 pumps the SPM liquid through the circulation piping 13 . The in-line heater 16 heats the SPM liquid flowing through the circulation pipe 13 and adjusts the temperature to a processing temperature (for example, about 120° C. to 140° C.). The filter 17 filters and removes foreign substances such as particles in the SPM liquid flowing through the circulation pipe 13. The control valve 18 controls the flow of the processing liquid in the circulation pipe 13 . When the SPM liquid feed pump 15 is turned on, the SPM liquid stored in the overflow tank 12 is sucked into the circulation pipe 13, temperature-controlled by the in-line heater 16, filtered by the filter 17, and sent to the processing tank 11. .

処理槽11には、硫酸を硫酸供給部19から処理槽11に供給する硫酸供給管20の一端が配置されている。硫酸供給部19には硫酸が貯留されている。硫酸供給管20には、硫酸供給部19から処理槽11への硫酸の供給を制御する制御弁21が設けられている。 One end of a sulfuric acid supply pipe 20 for supplying sulfuric acid from the sulfuric acid supply section 19 to the processing tank 11 is arranged in the processing tank 11 . Sulfuric acid is stored in the sulfuric acid supply section 19. The sulfuric acid supply pipe 20 is provided with a control valve 21 that controls the supply of sulfuric acid from the sulfuric acid supply section 19 to the processing tank 11 .

処理槽11には、過酸化水素水を過酸化水素水供給部22から処理槽11に供給する過酸化水素水供給管23の一端が配置されている。過酸化水素水供給部22には過酸化水素水が貯留されている。過酸化水素水供給管23には、過酸化水素水供給部22から処理槽11への過酸化水素水の供給を制御する制御弁24が設けられている。 One end of a hydrogen peroxide water supply pipe 23 that supplies hydrogen peroxide water from a hydrogen peroxide water supply section 22 to the processing tank 11 is arranged in the processing tank 11 . Hydrogen peroxide solution is stored in the hydrogen peroxide solution supply section 22 . The hydrogen peroxide supply pipe 23 is provided with a control valve 24 that controls the supply of hydrogen peroxide from the hydrogen peroxide supply section 22 to the processing tank 11 .

オーバーフロー槽12には、過酸化水素水貯留槽25からオーバーフロー槽12に過酸化水素水を補充する過酸化水素水補充管26の一端に設けられた吐出口26a(図1では円で囲って示している。)が配置されている。過酸化水素水貯留槽25には過酸化水素水が貯留されている。過酸化水素水補充管26には、過酸化水素水貯留槽25からオーバーフロー槽12への過酸化水素水の供給を制御する制御弁27が設けられている。過酸化水素水貯留槽25は、循環配管13を流通するSPM液に過酸化水素水を補充する。ここでは、過酸化水素水貯留槽25及び過酸化水素水補充管26が、本発明の「過酸化水素水補充部」に対応する。 The overflow tank 12 has a discharge port 26a (shown as a circle in FIG. ) are located. Hydrogen peroxide water is stored in the hydrogen peroxide water storage tank 25 . The hydrogen peroxide replenishment pipe 26 is provided with a control valve 27 that controls the supply of hydrogen peroxide from the hydrogen peroxide storage tank 25 to the overflow tank 12 . The hydrogen peroxide storage tank 25 replenishes the SPM liquid flowing through the circulation pipe 13 with hydrogen peroxide. Here, the hydrogen peroxide water storage tank 25 and the hydrogen peroxide water replenishment pipe 26 correspond to the "hydrogen peroxide water replenishment section" of the present invention.

ここでは、過酸化水素水補充管26の吐出口26aは、循環配管13の一端である吸引口13a(図1では円で囲って示している。)の近傍に配置される。循環配管13の吸引口13aの近傍とは、SPM液送液ポンプ15の吸引動作により、吸引口13aから吸い込まれる領域であり、換言すれば吸引口13aの周囲の領域であって、その周辺に対して負圧となり圧力差が生じる領域である。SPM液送液ポンプ15の能力により、近傍の具体的な範囲は異なるが、例えば、吸引口13aから半径約100mmの範囲である。このように、過酸化水素水補充管26の吐出口26aを、循環配管13の一端である吸引口13aの近傍に配置することにより、循環配管13の一端である吸引口13aの近傍に存在するSPM液に対して過酸化水素水が補充される。このようにして、循環配管13の吸引口13aの近傍で過酸化水素水が補充されたSPM液は約10~約20秒後にSPM液の反応によって生じるカロ酸の活性が高い状態で処理槽11に到達する。 Here, the discharge port 26a of the hydrogen peroxide water replenishment pipe 26 is arranged near the suction port 13a (circled in FIG. 1), which is one end of the circulation pipe 13. The vicinity of the suction port 13a of the circulation pipe 13 refers to an area where the SPM liquid is sucked from the suction port 13a by the suction operation of the SPM liquid feeding pump 15. In other words, it is the area around the suction port 13a, and the area around the suction port 13a is On the other hand, this is a region where the pressure becomes negative and a pressure difference occurs. The specific range in the vicinity varies depending on the capacity of the SPM liquid feeding pump 15, but is, for example, within a radius of about 100 mm from the suction port 13a. In this way, by arranging the discharge port 26a of the hydrogen peroxide water replenishment pipe 26 near the suction port 13a, which is one end of the circulation pipe 13, the hydrogen peroxide solution replenishment pipe 26 is located near the suction port 13a, which is one end of the circulation pipe 13. The SPM solution is replenished with hydrogen peroxide. In this way, the SPM solution supplemented with hydrogen peroxide near the suction port 13a of the circulation pipe 13 is returned to the processing tank 10 after about 10 to about 20 seconds in a state where the activity of caroic acid generated by the reaction of the SPM solution is high. reach.

このように、過酸化水素水補充管26の吐出口26aを、循環配管13の吸引口13aの近傍に配置することにより、過酸化水素水がオーバーフロー槽12内のSPM液に希釈される前に循環配管13に流通するSPM液に補充することができる。このため、高活性
のSPM液を生成することができ、処理槽11における基板Wの洗浄能力も向上する。
In this way, by arranging the discharge port 26a of the hydrogen peroxide water replenishment pipe 26 near the suction port 13a of the circulation pipe 13, the hydrogen peroxide water is prevented from diluting into the SPM liquid in the overflow tank 12. The SPM liquid flowing through the circulation pipe 13 can be replenished. Therefore, a highly active SPM liquid can be generated, and the ability to clean the substrates W in the processing tank 11 is also improved.

過酸化水素水貯留槽25は、基板処理装置1内に設けられてもよいし、ファシリティごとの設備として設けられていてもよい。また、制御弁27の下流に流量計を設けてもよい。 The hydrogen peroxide water storage tank 25 may be provided within the substrate processing apparatus 1 or may be provided as equipment for each facility. Further, a flow meter may be provided downstream of the control valve 27.

処理槽11には、硫酸を硫酸補充部28から処理槽11に供給する硫酸補充管29の一端が配置されている。硫酸補充部28には硫酸が貯留されている。硫酸補充管29には、硫酸補充部28から処理槽11への硫酸の補充を制御する制御弁30が設けられている。 One end of a sulfuric acid replenishment pipe 29 for supplying sulfuric acid from the sulfuric acid replenishment section 28 to the processing tank 11 is arranged in the processing tank 11 . Sulfuric acid is stored in the sulfuric acid replenishment section 28. The sulfuric acid replenishment pipe 29 is provided with a control valve 30 that controls replenishment of sulfuric acid from the sulfuric acid replenishment section 28 to the processing tank 11 .

基板Wは、基板保持部31の本体板311の下部に設けられた保持棒312,313,314によって起立姿勢で保持される。昇降ユニット32により、基板保持部31は、図1に示す基板Wが処理槽11内部で処理液に浸漬される処理位置と、処理槽11上方の待機位置との間で昇降移動する。 The substrate W is held in an upright position by holding rods 312, 313, and 314 provided at the lower part of the main body plate 311 of the substrate holding section 31. The substrate holder 31 is moved up and down by the lifting unit 32 between a processing position where the substrate W shown in FIG.

上述した、SPM液送液ポンプ15、インラインヒータ16、フィルタ17、制御弁18、制御弁21、制御弁24、制御弁27、制御弁30及び昇降ユニット32は、制御部33によって統括制御される。制御部33は、CPU等のプロセッサ、RAMやROM等の主記憶装置、EPROM等の補助記憶装置を有するコンピュータにより構成することができる。補助記憶装置には、各種プログラム、各種テーブル等が格納され、そこに格納されたプログラムを主記憶装置の作業領域にロードして実行し、プログラムの実行を通じて各構成部等が制御されることによって、後述するような、所定の目的に合致した各機能を実現することができる。 The SPM liquid feeding pump 15, in-line heater 16, filter 17, control valve 18, control valve 21, control valve 24, control valve 27, control valve 30, and lifting unit 32 described above are collectively controlled by a control unit 33. . The control unit 33 can be configured by a computer having a processor such as a CPU, a main memory such as RAM or ROM, and an auxiliary memory such as EPROM. The auxiliary storage device stores various programs, various tables, etc. The programs stored there are loaded into the work area of the main storage device and executed, and each component etc. is controlled through the execution of the program. , it is possible to realize each function that meets a predetermined purpose, as will be described later.

(基板処理方法)
以下に、図2のフローチャートを参照して実施例1に係る基板処理方法について説明する。
処理槽11内のSPM液が廃棄され、空になった状態を初期状態として説明する。
(Substrate processing method)
The substrate processing method according to the first embodiment will be described below with reference to the flowchart in FIG. 2.
A state in which the SPM liquid in the processing tank 11 is discarded and becomes empty will be described as an initial state.

まず、処理槽11にSPM液Lを供給する(ステップS1)。具体的には、制御部33により制御弁24を制御し、過酸化水素水供給部22から過酸化水素水供給管23を介して処理槽11に過酸化水素水を供給する。同様に、制御部33により制御弁21を制御し、硫酸供給部19から硫酸供給管20を介して処理槽11に供給する。このようにして処理槽11内で生成されたSPM液Lは、処理槽11に貯留されるとともに、処理槽11から溢れてオーバーフロー槽12にも貯留される。 First, the SPM liquid L is supplied to the processing tank 11 (step S1). Specifically, the control unit 33 controls the control valve 24 to supply hydrogen peroxide solution from the hydrogen peroxide solution supply unit 22 to the processing tank 11 via the hydrogen peroxide solution supply pipe 23 . Similarly, the control valve 21 is controlled by the control unit 33, and sulfuric acid is supplied from the sulfuric acid supply unit 19 to the processing tank 11 via the sulfuric acid supply pipe 20. The SPM liquid L generated in the processing tank 11 in this way is stored in the processing tank 11 and also overflows from the processing tank 11 and stored in the overflow tank 12 .

処理槽11及びオーバーフロー槽12に所定量貯留されると、制御部33はSPM液送液ポンプ15をオンし、SPM液が処理槽11、オーバーフロー槽12、循環配管13を循環する(ステップS2)。このとき、制御部33は、インラインヒータ16をオンし、循環配管13を流通するSPM液を120℃~140℃に温調する。 When a predetermined amount of SPM liquid is stored in the processing tank 11 and overflow tank 12, the control unit 33 turns on the SPM liquid feeding pump 15, and the SPM liquid circulates through the processing tank 11, overflow tank 12, and circulation pipe 13 (step S2). . At this time, the control unit 33 turns on the in-line heater 16 and adjusts the temperature of the SPM liquid flowing through the circulation pipe 13 to 120°C to 140°C.

送液ポンプ15をオンし、インラインヒータ16がオンした状態で、制御部33は、制御弁27を制御し、過酸化水素水貯留槽25に貯留された過酸化水素水を、過酸化水素水補充管26を介して補充する(ステップS3)。また、必要に応じて、制御部33は、制御弁30を制御し、硫酸補充部28から硫酸補充管29を介して硫酸を補充する。 With the liquid feed pump 15 turned on and the inline heater 16 turned on, the control unit 33 controls the control valve 27 to convert the hydrogen peroxide solution stored in the hydrogen peroxide solution storage tank 25 into a hydrogen peroxide solution. It is replenished via the replenishment pipe 26 (step S3). Further, if necessary, the control unit 33 controls the control valve 30 to replenish sulfuric acid from the sulfuric acid replenishment unit 28 via the sulfuric acid replenishment pipe 29.

SPM液が所定の温度に調整されると、制御部33は、昇降ユニット32を制御し、基板保持部31を待機位置から処理位置へと下降させて、複数の基板Wを処理槽11内に貯留されたSPM液Lに浸漬させる(ステップS4)。 When the SPM liquid is adjusted to a predetermined temperature, the control unit 33 controls the lifting unit 32 to lower the substrate holding unit 31 from the standby position to the processing position, and transfer the plurality of substrates W into the processing tank 11. It is immersed in the stored SPM liquid L (step S4).

そして、制御部33は、処理槽11の底部に配置されたSPM液供給管141,142からSPM液Lを供給するとともに、SPM液Lを処理槽11、オーバーフロー槽12及び循環配管13を循環流通させて基板保持部31に保持された基板Wを洗浄する(ステップS5)。 Then, the control unit 33 supplies the SPM liquid L from the SPM liquid supply pipes 141 and 142 arranged at the bottom of the processing tank 11, and circulates the SPM liquid L through the processing tank 11, the overflow tank 12, and the circulation pipe 13. The substrate W held by the substrate holding section 31 is then cleaned (step S5).

洗浄が終了すると、制御部33は、昇降ユニット32を制御し、基板保持部31を処理位置から待機位置へと上昇させ、洗浄処理済みの基板Wを搬送ロボットに受け渡す(ステップS6)。 When the cleaning is completed, the control unit 33 controls the lifting unit 32 to raise the substrate holding unit 31 from the processing position to the standby position, and transfers the cleaned substrate W to the transfer robot (step S6).

図2のフローチャートでは説明のためにステップS6で処理を終了しているが、実際には、ステップS3に戻り、必要に応じて過酸化水素水が補充されると、ステップS4に進み次の基板Wの洗浄を行い、この過程が繰り返される。 In the flowchart of FIG. 2, the process ends at step S6 for the sake of explanation, but in reality, the process returns to step S3, and after the hydrogen peroxide solution is replenished as necessary, the process proceeds to step S4. Washing with W is performed and this process is repeated.

ここでは、ステップS4における基板保持部31の待機位置から処理位置への下降の前に、過酸化水素水を補充しているが、ステップS4とステップS5との間に、過酸化水素水を補充してもよく、過酸化水素水を補充するタイミングはこれに限られない。 Here, the hydrogen peroxide solution is replenished before the substrate holder 31 is lowered from the standby position to the processing position in step S4, but the hydrogen peroxide solution is replenished between step S4 and step S5. However, the timing of replenishing the hydrogen peroxide solution is not limited to this.

<実施例2>
以下、本発明の実施例2について図面を参照しながら詳細に説明する。図3は、実施例2に係る基板処理装置2の概略構成を示すブロック図である。実施例1と同様の構成については、同様の符号を用いて詳細な説明を省略する。
<Example 2>
Hereinafter, a second embodiment of the present invention will be described in detail with reference to the drawings. FIG. 3 is a block diagram showing a schematic configuration of the substrate processing apparatus 2 according to the second embodiment. Components similar to those in the first embodiment are designated by the same reference numerals, and detailed description thereof will be omitted.

実施例2に係る基板処理装置2は、過酸化水素水貯留槽25に貯留された過酸化水素水を過酸化水素水補充管26に送液する過酸化水素水送液ポンプ34を設けている。ここでは、過酸化水素水貯留槽25、過酸化水素水補充管26及び過酸化水素水送液ポンプ34が、本発明の「過酸化水素水補充部」に対応する。
基板処理装置2の構成は、過酸化水素水送液ポンプ34を除き、実施例1に係る基板処理装置1と同様である。また、基板処理装置2における基板Wの洗浄処理は、基本的に基板処理装置1と同様である。
The substrate processing apparatus 2 according to the second embodiment is provided with a hydrogen peroxide water supply pump 34 that transports the hydrogen peroxide water stored in the hydrogen peroxide water storage tank 25 to the hydrogen peroxide water replenishment pipe 26. . Here, the hydrogen peroxide water storage tank 25, the hydrogen peroxide water replenishment pipe 26, and the hydrogen peroxide water supply pump 34 correspond to the "hydrogen peroxide water replenishment unit" of the present invention.
The configuration of the substrate processing apparatus 2 is the same as that of the substrate processing apparatus 1 according to the first embodiment, except for the hydrogen peroxide water supply pump 34. Further, the cleaning process of the substrate W in the substrate processing apparatus 2 is basically the same as that in the substrate processing apparatus 1.

以下に、図4に示すフローチャートを参照して、基板処理装置2に特有の基板処理方法について説明する。図4は、図2に示す基板処理方法全体のうち、過酸化水素水を補充する処理(ステップS3)の詳細を示す。
基板処理装置2では、制御部33により、SPM液送液ポンプ15と過酸化水素水送液ポンプ34の相互の吸引タイミングを制御する。
A substrate processing method specific to the substrate processing apparatus 2 will be described below with reference to the flowchart shown in FIG. FIG. 4 shows details of the process of replenishing the hydrogen peroxide solution (step S3) in the entire substrate processing method shown in FIG.
In the substrate processing apparatus 2, the control unit 33 controls mutual suction timing between the SPM liquid feeding pump 15 and the hydrogen peroxide water feeding pump 34.

まず、過酸化水素水送液ポンプ34及び制御弁27の制御により過酸化水素水貯留槽25から過酸化水素水を吸引して、過酸化水素水補充管26の吐出口26aからオーバーフロー槽12内に過酸化水素水を吐出させる(ステップS31)。 First, by controlling the hydrogen peroxide water supply pump 34 and the control valve 27, hydrogen peroxide water is sucked from the hydrogen peroxide water storage tank 25, and the hydrogen peroxide water is sucked into the overflow tank 12 from the discharge port 26a of the hydrogen peroxide water replenishment pipe 26. The hydrogen peroxide solution is discharged (step S31).

そして、SPM液送液ポンプ15の吸引動作によって循環配管13の吸引口13aからオーバーフロー槽12内のSPM液を吸引する(ステップS32)。 Then, the SPM liquid in the overflow tank 12 is sucked from the suction port 13a of the circulation pipe 13 by the suction operation of the SPM liquid feeding pump 15 (step S32).

すなわち、SPM液送液ポンプ15の吸引動作によって循環配管13の吸引口13aからオーバーフロー槽12内のSPM液を吸引する吸引動作を開始する前に、過酸化水素水送液ポンプ34により過酸化水素水貯留槽25から過酸化水素水を吸引して、過酸化水素水補充管26の吐出口26aからオーバーフロー槽12内に過酸化水素水を吐出させる。 That is, before starting the suction operation of suctioning the SPM liquid in the overflow tank 12 from the suction port 13a of the circulation pipe 13 by the suction operation of the SPM liquid supply pump 15, hydrogen peroxide is The hydrogen peroxide solution is sucked from the water storage tank 25 and is discharged into the overflow tank 12 from the discharge port 26a of the hydrogen peroxide solution replenishment pipe 26.

このようにすれば、過酸化水素水の希釈や分解により過酸化水素水の濃度が低下する前にSPM液に過酸化水素水が補充され、過酸化水素水の濃度が高い状態で、循環配管13
を通じて処理槽11にSPM液を送液することができる。従って、処理槽11における基板Wの洗浄能力が向上する。
In this way, the SPM solution is replenished with hydrogen peroxide before the concentration of hydrogen peroxide decreases due to dilution or decomposition of hydrogen peroxide, and the circulation piping is refilled while the concentration of hydrogen peroxide is high. 13
The SPM liquid can be sent to the processing tank 11 through the tank. Therefore, the ability to clean the substrates W in the processing tank 11 is improved.

なお、図4では、過酸化水素水送液ポンプ34とSPM液送液ポンプ15の動作は1回のみ表示しているが、必要に応じて、これらの処理を繰り返す。 Although FIG. 4 shows that the hydrogen peroxide water pump 34 and the SPM liquid pump 15 operate only once, these processes are repeated as necessary.

<実施例3>
以下、本発明の実施例3について図面を参照しながら詳細に説明する。図5は、実施例3に係る基板処理装置3の概略構成を示すブロック図である。実施例1と同様の構成については、同様の符号を用いて詳細な説明を省略する。
<Example 3>
Hereinafter, a third embodiment of the present invention will be described in detail with reference to the drawings. FIG. 5 is a block diagram showing a schematic configuration of the substrate processing apparatus 3 according to the third embodiment. Components similar to those in the first embodiment are designated by the same reference numerals, and detailed description thereof will be omitted.

実施例3に係る基板処理装置3は、過酸化水素水貯留槽25からSPM液に過酸化水素水を補充する過酸化水素水補充管26が、循環配管13の吸引口13aとSPM液送液ポンプ15との間の部位13bに接続されている。このように、過酸化水素水補充管26を、循環配管13の吸引口13aとSPM液送液ポンプ15との間の部位13bに接続することにより、循環配管13におけるSPM液送液ポンプ15の上流側、すなわちインラインヒータ16の上流側に存在するSPM液に対して過酸化水素水が補充される。 In the substrate processing apparatus 3 according to the third embodiment, the hydrogen peroxide replenishment pipe 26 for replenishing the SPM liquid with hydrogen peroxide from the hydrogen peroxide storage tank 25 is connected to the suction port 13a of the circulation pipe 13 for supplying the SPM liquid. It is connected to a portion 13b between the pump 15 and the pump 15. In this way, by connecting the hydrogen peroxide replenishment pipe 26 to the portion 13b between the suction port 13a of the circulation pipe 13 and the SPM liquid feed pump 15, the SPM liquid feed pump 15 in the circulation pipe 13 can be The SPM liquid present on the upstream side, that is, on the upstream side of the in-line heater 16, is replenished with hydrogen peroxide solution.

このようにすれば、SPM液送液ポンプ15の上流側の循環配管13内においてSPM液が負圧となる領域で過酸化水素水が補充されるので、過酸化水素水がSPM液に効率よく混合され、かつ、濃度が低下することもないので、過酸化水素水の濃度が高いSPM液を処理槽11に供給することができる。従って、SPM液Lの活性化が促進され、処理槽11における基板Wの洗浄能力が向上する。 In this way, the hydrogen peroxide solution is replenished in the area where the SPM solution becomes negative pressure in the circulation piping 13 on the upstream side of the SPM solution feed pump 15, so that the hydrogen peroxide solution is efficiently added to the SPM solution. Since the SPM liquid is mixed and the concentration does not decrease, it is possible to supply the SPM liquid with a high concentration of hydrogen peroxide solution to the processing tank 11. Therefore, activation of the SPM liquid L is promoted, and the ability to clean the substrates W in the processing tank 11 is improved.

なお、実施例3に係る基板処理装置3においても、実施例2に係る基板処理装置2と同様に、過酸化水素水貯留槽25から過酸化水素水補充管26に過酸化水素水を送液する過酸化水素水送液ポンプ34を設けてもよい。 In addition, in the substrate processing apparatus 3 according to the third embodiment, as well as the substrate processing apparatus 2 according to the second embodiment, hydrogen peroxide solution is sent from the hydrogen peroxide solution storage tank 25 to the hydrogen peroxide solution replenishment pipe 26. A hydrogen peroxide water pump 34 may be provided.

<実施例4>
以下、本発明の実施例4について図面を参照しながら詳細に説明する。図6は、実施例4に係る基板処理装置4の概略構成を示すブロック図である。実施例1及び2と同様の構成については、同様の符号を用いて詳細な説明を省略する。
<Example 4>
Hereinafter, a fourth embodiment of the present invention will be described in detail with reference to the drawings. FIG. 6 is a block diagram showing a schematic configuration of the substrate processing apparatus 4 according to the fourth embodiment. Components similar to those in Embodiments 1 and 2 are designated by the same reference numerals, and detailed description thereof will be omitted.

実施例4に係る基板処理装置4は、過酸化水素水貯留槽25からSPM液に過酸化水素水を補充する過酸化水素水補充管26が、循環配管13のSPM液送液ポンプ15とインラインヒータ16との間の部位13cに接続されている。このように、過酸化水素水補充管26を、循環配管13のSPM液送液ポンプ15とインラインヒータ16との間の部位13cに接続することにより、循環配管13におけるインラインヒータ16の上流側に存在するSPM液に対して過酸化水素水が補充される。 In the substrate processing apparatus 4 according to the fourth embodiment, the hydrogen peroxide replenishment pipe 26 for replenishing the SPM liquid with hydrogen peroxide from the hydrogen peroxide storage tank 25 is in-line with the SPM liquid supply pump 15 of the circulation piping 13. It is connected to a portion 13c between the heater 16 and the heater 16. In this way, by connecting the hydrogen peroxide solution replenishment pipe 26 to the part 13c of the circulation pipe 13 between the SPM liquid feeding pump 15 and the in-line heater 16, it can be connected to the upstream side of the in-line heater 16 in the circulation pipe 13. The existing SPM solution is replenished with hydrogen peroxide.

このようにすれば、インラインヒータ16によって加温される前のSPM液に対して、過酸化水素水が補充されるので、過酸化水素水の分解による濃度の低下を抑制することができ、過酸化水素水の濃度が高いSPM液を処理槽11に送液することができる。このように、過酸化水素水の濃度が高く、高活性のSPM液Lを作成することできるので、処理槽11における基板Wの洗浄能力が向上する。 In this way, the hydrogen peroxide solution is replenished to the SPM solution before it is heated by the in-line heater 16, so that it is possible to suppress a decrease in the concentration due to the decomposition of the hydrogen peroxide solution. SPM liquid with a high concentration of hydrogen oxide water can be sent to the processing tank 11. In this way, it is possible to create a highly active SPM liquid L with a high concentration of hydrogen peroxide solution, so that the ability to clean the substrates W in the processing tank 11 is improved.

なお、実施例4に係る基板処理装置4においても、実施例2に係る基板処理装置2と同様に、過酸化水素水貯留槽25から過酸化水素水補充管26に過酸化水素水を送液する過酸化水素水送液ポンプ34を設けてもよい。 In addition, in the substrate processing apparatus 4 according to the fourth embodiment, as well as the substrate processing apparatus 2 according to the second embodiment, hydrogen peroxide solution is sent from the hydrogen peroxide solution storage tank 25 to the hydrogen peroxide solution replenishment pipe 26. A hydrogen peroxide water pump 34 may be provided.

<実施例5>
(基板処理システム)
図7は、本実施例に係る基板処理装置を適用した基板処理システム100の全体構成の概略を示す平面図である。基板処理システム100は、上述の実施例1~4に係る基板処理装置1~4を備えるシステムである。
<Example 5>
(Substrate processing system)
FIG. 7 is a plan view schematically showing the overall configuration of a substrate processing system 100 to which the substrate processing apparatus according to the present embodiment is applied. The substrate processing system 100 is a system that includes the substrate processing apparatuses 1 to 4 according to the first to fourth embodiments described above.

基板処理システム100は、複数枚の基板Wを一括して処理するバッチ式の装置である。基板処理システム100は、半導体ウェハなどの円板状の基板Wを収容するキャリアCが搬送されるロードポートLPと、ロードポートLPから搬送された基板Wを薬液やリンス液などの処理液で処理する処理ユニット102と、ロードポートLPと処理ユニット102との間で基板Wを搬送する複数の搬送ロボットと、基板処理システム100を制御する制御装置103とを含む。 The substrate processing system 100 is a batch type device that processes a plurality of substrates W at once. The substrate processing system 100 includes a load port LP to which a carrier C containing a disk-shaped substrate W such as a semiconductor wafer is transported, and a substrate W transported from the load port LP is processed with a processing liquid such as a chemical solution or a rinsing liquid. The processing unit 102 includes a processing unit 102 , a plurality of transport robots that transport the substrate W between the load port LP and the processing unit 102 , and a control device 103 that controls the substrate processing system 100 .

処理ユニット102は、複数枚の基板Wが浸漬される第1薬液を貯留する第1薬液処理槽104と、複数枚の基板Wが浸漬される第1リンス液を貯留する第1リンス処理槽105と、複数枚の基板Wが浸漬される第2薬液を貯留する第2薬液処理槽106と、複数枚の基板Wが浸漬される第2リンス液を貯留する第2リンス処理槽107とを含む。処理ユニット102は、さらに、複数枚の基板Wを乾燥させる乾燥処理槽108を含む。本基板処理システム100の第1薬液処理槽104、第2薬液処理槽106を、上述の実施例に係る基板処理装置1,2,3又は4により構成することができる。このように基板処理システム100を構成することにより、基板Wの洗浄能力が向上する。
なお、上述の実施例に係る基板処理装置1,2,3又は4を備える基板処理システムの構成は上述のものに限られない。
The processing unit 102 includes a first chemical solution processing tank 104 that stores a first chemical solution in which a plurality of substrates W are immersed, and a first rinsing processing tank 105 that stores a first rinsing solution in which a plurality of substrates W is immersed. , a second chemical solution processing tank 106 that stores a second chemical solution into which a plurality of substrates W are immersed, and a second rinsing processing tank 107 which stores a second rinsing solution into which a plurality of substrates W are immersed. . The processing unit 102 further includes a drying tank 108 that dries the plurality of substrates W. The first chemical liquid processing tank 104 and the second chemical liquid processing tank 106 of the present substrate processing system 100 can be configured by the substrate processing apparatuses 1, 2, 3, or 4 according to the above-described embodiments. By configuring the substrate processing system 100 in this way, the ability to clean the substrate W is improved.
Note that the configuration of the substrate processing system including the substrate processing apparatuses 1, 2, 3, or 4 according to the embodiments described above is not limited to that described above.

ここでは、第1薬液および第2薬液は、SPM液である。第1リンス液および第2リンス液は、たとえば、純水(脱イオン水)である。第1リンス液および第2リンス液は、純水以外のリンス液であってもよい。第1リンス液および第2リンス液は、互いに異なる種類のリンス液であってもよい。 Here, the first chemical liquid and the second chemical liquid are SPM liquids. The first rinsing liquid and the second rinsing liquid are, for example, pure water (deionized water). The first rinsing liquid and the second rinsing liquid may be rinsing liquids other than pure water. The first rinsing liquid and the second rinsing liquid may be different types of rinsing liquid.

複数の搬送ロボットは、ロードポートLPと処理ユニット102との間でキャリアCを搬送し、複数のキャリアCを収容するキャリア搬送装置109と、キャリア搬送装置109に保持されているキャリアCに対して複数枚の基板Wの搬入および搬出を行い、水平な姿勢と鉛直な姿勢との間で基板Wの姿勢を変更する姿勢変換ロボット110とを含む。姿勢変換ロボット110は、複数のキャリアCから取り出した複数枚の基板Wで1つのバッチを形成するバッチ組み動作と、1つのバッチに含まれる複数枚の基板Wを複数のキャリアCに収容するバッチ解除動作とを行う。 The plurality of transfer robots transfer the carriers C between the load port LP and the processing unit 102, and transfer the carriers C to the carrier transfer device 109 that accommodates the plurality of carriers C and the carriers C held in the carrier transfer device 109. It includes an attitude changing robot 110 that carries in and out a plurality of substrates W and changes the attitude of the substrates W between a horizontal attitude and a vertical attitude. The attitude changing robot 110 performs a batch assembly operation in which a plurality of substrates W taken out from a plurality of carriers C form one batch, and a batch assembly operation in which a plurality of substrates W included in one batch are accommodated in a plurality of carriers C. Performs a release operation.

複数の搬送ロボットは、さらに、姿勢変換ロボット110と処理ユニット102との間で複数枚の基板Wを搬送する主搬送ロボット111と、主搬送ロボット111と処理ユニット102との間で複数枚の基板Wを搬送する複数の副搬送ロボット112とを含む。複数の副搬送ロボット112は、第1薬液処理槽104と第1リンス処理槽105との間で複数枚の基板Wを搬送する第1副搬送ロボット112Aと、第2薬液処理槽106と第2リンス処理槽107との間で複数枚の基板Wを搬送する第2副搬送ロボット112Bとを含む。 The plurality of transfer robots further include a main transfer robot 111 that transfers a plurality of substrates W between the attitude conversion robot 110 and the processing unit 102, and a main transfer robot 111 that transfers a plurality of substrates W between the main transfer robot 111 and the processing unit 102. It includes a plurality of sub-transport robots 112 that transport W. The plurality of sub-transport robots 112 include a first sub-transfer robot 112A that transports a plurality of substrates W between a first chemical processing tank 104 and a first rinsing processing tank 105, a second sub-transport robot 112A that transports a plurality of substrates W between a first chemical processing tank 104 and a first rinsing processing tank 105; A second sub-transport robot 112B that transports a plurality of substrates W to and from the rinsing treatment tank 107 is included.

主搬送ロボット111は、複数枚(たとえば50枚)の基板Wからなる1バッチの基板Wを姿勢変換ロボット110から受け取る。主搬送ロボット111は、姿勢変換ロボット110から受け取った1バッチの基板Wを第1副搬送ロボット112Aおよび第2副搬送ロボット112Bに渡し、第1副搬送ロボット112Aおよび第2副搬送ロボット112Bに保持されている1バッチの基板Wを受け取る。主搬送ロボット111は、さらに、1
バッチの基板Wを乾燥処理槽108に搬送する。
The main transfer robot 111 receives one batch of substrates W consisting of a plurality of substrates W (for example, 50 substrates W) from the posture changing robot 110 . The main transfer robot 111 passes one batch of substrates W received from the attitude conversion robot 110 to the first sub-transfer robot 112A and the second sub-transfer robot 112B, and holds them in the first sub-transfer robot 112A and the second sub-transfer robot 112B. One batch of substrates W is received. The main transport robot 111 further includes 1
The batch of substrates W is transported to the drying treatment tank 108.

第1副搬送ロボット112Aは、主搬送ロボット111から受け取った1バッチの基板Wを第1薬液処理槽104と第1リンス処理槽105との間で搬送し、第1薬液処理槽104内の第1薬液または第1リンス処理槽105内の第1リンス液に浸漬させる。同様に、第2副搬送ロボット112Bは、主搬送ロボット111から受け取った1バッチの基板Wを第2薬液処理槽106と第2リンス処理槽107との間で搬送し、第2薬液処理槽106内の第2薬液または第2リンス処理槽107内の第2リンス液に浸漬させる。 The first sub-transport robot 112A transports one batch of substrates W received from the main transport robot 111 between the first chemical processing tank 104 and the first rinsing processing tank 105. 1 chemical solution or the first rinsing liquid in the first rinsing tank 105. Similarly, the second sub-transport robot 112B transports one batch of substrates W received from the main transport robot 111 between the second chemical processing tank 106 and the second rinsing tank 107, and or the second rinsing liquid in the second rinsing tank 107.

1,2,3,4・・・基板処理装置
11・・・処理槽
12・・・オーバーフロー槽
13・・・循環配管
13a・・吸引口
15・・・SPM液送液ポンプ
16・・・インラインヒータ
25・・・過酸化水素水貯留槽
26・・・過酸化水素水補充管
26a・・吐出口
33・・・制御部
34・・・過酸化水素水送液ポンプ
L・・・・SPM液
W・・・基板
1, 2, 3, 4... Substrate processing device 11... Processing tank 12... Overflow tank 13... Circulation piping 13a... Suction port 15... SPM liquid feeding pump 16... In-line Heater 25...Hydrogen peroxide water storage tank 26...Hydrogen peroxide water replenishment pipe 26a...Discharge port 33...Control unit 34...Hydrogen peroxide water supply pump L...SPM liquid W... Board

Claims (5)

基板を処理する基板処理装置において、
硫酸と過酸化水素水とを含む混合液で前記基板を処理する処理槽と、
前記処理槽から溢れた前記混合液を回収する外槽と、
一端が前記外槽に回収された前記混合液中に流通接続され、他端が前記処理槽内に貯留された前記混合液中に流通接続され、前記混合液を前記外槽から前記処理槽に向けて循環させる循環路と、
前記循環路に配置され、前記外槽で回収された前記混合液を前記処理槽に向けて送液する混合液送液ポンプと、
前記循環路の前記混合液送液ポンプより下流側に配置され、前記循環路内を流通する前記混合液を加熱する加熱部と、
前記混合液送液ポンプと前記加熱部との間の前記循環路内に存在する前記混合液に対して前記過酸化水素水を補充する過酸化水素水補充部と、
を備えることを特徴とする基板処理装置。
In a substrate processing apparatus that processes a substrate,
a treatment tank for treating the substrate with a mixed solution containing sulfuric acid and hydrogen peroxide;
an outer tank for collecting the mixed liquid overflowing from the processing tank;
One end is connected to flow into the mixed liquid collected in the outer tank, the other end is connected to flow into the mixed liquid stored in the processing tank, and the mixed liquid is transferred from the outer tank to the processing tank. A circulation path that circulates toward
a mixed liquid feeding pump that is disposed in the circulation path and sends the mixed liquid collected in the outer tank toward the processing tank;
a heating unit that is disposed downstream of the mixed liquid feeding pump in the circulation path and heats the mixed liquid flowing in the circulation path;
a hydrogen peroxide solution replenishing unit that replenishes the hydrogen peroxide solution to the mixed solution present in the circulation path between the mixed solution feed pump and the heating unit;
A substrate processing apparatus comprising:
前記過酸化水素水補充部は、
前記過酸化水素水を貯留する過酸化水素水貯留槽と、
一端が該過酸化水素水貯留槽に流通接続され、他端が前記混合液送液ポンプと前記加熱部との間の前記循環路に流通接続される過酸化水素水補充管と、
を備えることを特徴とする請求項1に記載の基板処理装置。
The hydrogen peroxide replenishment section is
a hydrogen peroxide water storage tank that stores the hydrogen peroxide water;
a hydrogen peroxide water replenishment pipe having one end fluidly connected to the hydrogen peroxide water storage tank and the other end fluidly connected to the circulation path between the mixed liquid feeding pump and the heating section;
The substrate processing apparatus according to claim 1, further comprising:
前記過酸化水素水補充部は、前記過酸化水素水を前記過酸化水素水補充管に送液する過酸化水素水送液ポンプをさらに有することを特徴とする請求項2に記載の基板処理装置。 The substrate processing apparatus according to claim 2, wherein the hydrogen peroxide solution replenishment unit further includes a hydrogen peroxide solution supply pump that sends the hydrogen peroxide solution to the hydrogen peroxide solution replenishment pipe. . 前記処理槽内の前記混合液に対して前記硫酸を補充する硫酸補充部をさらに備えることを特徴とする請求項1乃至3のいずれか1項に記載の基板処理装置。 4. The substrate processing apparatus according to claim 1, further comprising a sulfuric acid replenisher that replenishes the mixed liquid in the processing tank with the sulfuric acid. 請求項1乃至4のいずれか1項に記載の基板処理装置を備える基板処理システム。 A substrate processing system comprising the substrate processing apparatus according to any one of claims 1 to 4.
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