JP2022539083A - Probe block assembly for display panel inspection, its control method and display panel inspection apparatus - Google Patents

Abstract

In the probe block assembly for testing a display panel according to the present invention, the plurality of electrode pads of the display panel moved to the testing position are brought into contact with each other through the movement of the mother glass panel, and the testing for defects proceeds. and a probe unit supporting the plurality of probe blocks, each of the plurality of probe blocks having a probe pin contacting each of the plurality of electrode pads, and the display In order to inspect the panel, the probe blocks are selected from among the probe blocks loaded on the probe block loading unit, and then carried out to the position where the inspection for defects in the display panel is performed. It can be characterized by being mounted at a predetermined position on the probe unit.

Description

The present invention relates to a probe block assembly for display panel inspection, its control method, and a display panel inspection apparatus.

Organic light-emitting diodes (OLEDs), which are used as flat panel displays, have wide viewing angles, excellent contrast, and fast response speeds, and are thus widely used in smartphones, televisions, and the like.

An organic light emitting diode (OLED) is formed by depositing an organic material layer for forming an organic light emitting layer on a panel serving as a substrate, thereby realizing a pixel that emits light and color according to an electrical signal. will be

Here, when pixels are implemented by forming an organic material layer on a panel, which is a substrate, by deposition, an inspection for defects in the pixels should be performed before the sealing process.

Conventionally, in order to prevent contamination from scattering particles during inspection, a face-down method, that is, a state in which the deposition part of the display panel to be inspected faces downward. inspection was carried out.

The display panel may be manufactured in various sizes depending on the purpose of use, and is provided on the mother glass panel in the manufacturing process. It may be a single type in which a plurality of panels exist or a mixed type in which display panels of various sizes are mixed.

Conventionally, in order to inspect the presence or absence of defects in the display panel, it is placed on a fishbone type stage module with one side of the mother glass panel on which the display panel deposition part exists faces downward. The fishbone-type stage module grips the outer part of the surface where the deposition part is not formed, with the deposition part facing downward, and then puts it in a chamber for inspection. will move.

After that, the other surface of the mother glass panel where the vapor deposition part does not exist is sucked by the vacuum plate, and after the probe block of the probe unit is moved to the place where the probe block is located, the contact pad of the display panel comes into contact with the probe block. The examination proceeded by doing so.

However, although the conventional inspection method is useful for inspecting a display panel on a relatively small mother glass panel, it is difficult to detect defects in a display panel on a large mother glass panel in a face-down manner. It is the actual situation that it is difficult to apply it because serious problems occur in inspecting .

In other words, in the case of a large mother glass panel, if it is placed in a fishbone type stage module with one surface where the vapor deposition part is present facing downward, the fishbone type stage module is used. Of the one surface where the deposition part exists, the outer part where the deposition part is not formed is supported, but at this time, the center part of the large mother glass panel sag due to its own weight, making it virtually impossible to perform an accurate inspection. is.

In addition, the conventional inspection method has the following problems in addition to the problems described above.

The probe unit can only be equipped with a probe block for inspecting the presence or absence of defects in one type of display panel, so there are various sizes of display panels that need to be inspected on the mother glass panel. When the display panel to be inspected is changed, it is necessary to replace it with a new probe unit that matches it.

The replacement work of the probe unit is generally performed manually by an operator, and accordingly, there is a problem that the time required for the replacement work increases and the yield decreases.

In addition, there is a problem that workers are often injured or electrocuted when replacing the probe unit.

Therefore, it is a face-down method to prevent contamination from scattered particles during inspection, and quickly and accurately inspect various types of display panels on large mother glass panels for defects. The reality is that there is an urgent need for research on the development of equipment for this purpose.

It is an object of the present invention to replace a probe unit to inspect display panels of various sizes included in a large or small mother glass panel for defects in a face down or face up manner. It is an object of the present invention to provide a probe block assembly for display panel inspection, a control method therefor, and a display panel inspection apparatus capable of increasing the yield and preventing safety accidents of workers by proceeding without .

A probe block assembly for inspecting a display panel according to the present invention includes a mother glass panel - at least one kind of display panel having an organic material layer deposited on one surface of the mother glass panel for forming an organic light emitting layer. and the display panel includes a plurality of electrode pads formed along the side surface of the display panel. a plurality of probe blocks for testing to proceed; and a probe unit supporting the plurality of probe blocks, the plurality of probe blocks having respective probe pins contacting the respective plurality of electrode pads. In order to inspect the display panel, the probe blocks loaded on the probe block loading unit are selected and then unloaded to inspect the display panel for defects. It can be characterized in that it is mounted at a predetermined position on the probe unit existing at the position of .

When at least one of the plurality of probe blocks is unnecessary or needs to be replaced in order to inspect another display panel having a different size after the inspection of the display panel is completed, the probe block assembly according to the present invention. The three-dimensional probe blocks that are unnecessary or need to be replaced may be picked up from the probe unit and then unloaded and loaded on the probe block loading unit.

When the probe unit of the probe block assembly according to the present invention needs an additional probe block to inspect another display panel having a different size after the inspection of the display panel is completed, the probe block loading unit After the additional probe unit is selected in the probe block loaded in the probe block, the additional probe unit is unloaded to provide a mounting area in which the additional probe unit can be mounted.

The probe unit of the probe block assembly according to the present invention includes a plurality of mounting areas for individually mounting the probe blocks, and one of the plurality of mounting areas for mounting the probe blocks. The area may be selected based on the number and formation positions of the electrode pads of the display panel to be inspected.

Each of the plurality of mounting areas of the probe block assembly according to the present invention includes a guide part interacting with a position fixing part formed in the probe block to guide the position where the probe block is mounted. It can be characterized as

The probe unit of the probe block assembly according to the present invention includes a power applying unit for applying power to each of the probe blocks when the plurality of probe blocks are mounted on the probe unit. The probe block further comprises a plurality of probe pins, a main body supporting the plurality of probe pins, and a connection terminal for applying the power to the plurality of probe pins through electrical connection with the power applying unit. and a circuit pattern portion for electrically connecting the plurality of probe pins and the connection terminal.

The connection terminals of the probe block assembly according to the present invention are formed in the same number as or less than the number of power supply terminals to which power is applied by the power supply part, and the circuit pattern part is formed on the plurality of probe pins. If the number is less than the number of the power applying terminals, only part of the power applied to the power applying terminals may be applied to the plurality of probe pins.

The probe unit of the probe block assembly according to the present invention replaces at least one of the plurality of probe blocks mounted at the predetermined position without replacement, and the display panel on which the inspection is performed. And other display panels may be inspected for defects.

According to the probe block assembly, the control method and the display panel inspection apparatus for inspecting a display panel according to the present invention, the probe block assembly is included in a large or small mother glass panel in a face down or face up manner. It is possible to inspect display panels of various sizes for defects without replacing the probe unit, thereby increasing the yield and preventing safety accidents of workers.

4 is a view for explaining a display panel inspected for defects by the display panel inspection equipment according to the present invention; FIG. 4 is a diagram for explaining various embodiments of a combination of display panels included in a mother glass panel that can be mounted on a stage module provided in the display panel inspection equipment according to the present invention; 1 is a block configuration diagram for explaining display panel inspection equipment according to the present invention; FIG. 1 is a diagram for explaining a display panel inspection equipment according to the present invention; FIG. 5 is a schematic cross-sectional view taken along line AA of FIG. 4 for explaining the flow of air in the inspection process progress equipment provided in the display panel inspection equipment according to the present invention; FIG. 5 is a schematic cross-sectional view taken along line BB of FIG. 4 for explaining the flow of air in the inspection process progress equipment provided in the display panel inspection equipment according to the present invention; 4 is a flowchart for explaining a process of sucking a mother glass panel to a vacuum adsorption module by a mother glass panel transfer device provided in the display panel inspection equipment according to the present invention; FIG. 4 is a view for explaining a state in which a mother glass panel is placed in a normal state on a stage module provided in the mother glass panel transfer apparatus according to the present invention; FIG. 9 is a view for explaining a state in which the mother glass panel in a normal state changes to a reversed state due to the rotation of the stage module from the state shown in FIG. 8; FIG. 9 is a view for explaining a state in which the mother glass panel in a normal state changes to a reversed state due to the rotation of the stage module from the state shown in FIG. 8; FIG. 4 is a view for explaining a state in which a transfer module provided in the mother glass panel transfer apparatus according to the present invention enters a stage module; FIG. FIG. 5 is a view for explaining a state in which a transfer module provided in the mother glass panel transfer device according to the present invention sucks a reversed mother glass panel; FIG. 5 is a view for explaining a state in which a transfer module provided in the mother glass panel transfer device according to the present invention sucks a reversed mother glass panel; FIG. 4 is a view for explaining a state in which a transfer module provided in the mother glass panel transfer apparatus according to the present invention is moved to a first position; FIG. FIG. 5 is a view for explaining a state in which a picker module provided in the mother glass panel transfer apparatus according to the present invention descends and picks up a reversed mother glass panel; FIG. 5 is a view for explaining a state in which a picker module provided in the mother glass panel transfer apparatus according to the present invention descends and picks up a reversed mother glass panel; FIG. 5 is a view for explaining a state in which a transfer module provided in the mother glass panel transfer apparatus according to the present invention returns to its original position; FIG. FIG. 5 is a view for explaining a state in which a picker module provided in the mother glass panel transfer apparatus according to the present invention is raised to a second position; FIG. FIG. 5 is a view for explaining a state in which a picker module provided in the mother glass panel transfer device according to the present invention is raised to a third position; FIG. 1 is a diagram for explaining a display panel inspection apparatus provided in a display panel inspection facility according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a diagram for explaining a state in which a defect inspection of a 65-inch display panel and a 55-inch display panel provided on a mother glass panel is performed by the display panel inspection apparatus according to the present invention; FIG. 4 is a view for explaining another method of applying power to probe pins provided in a probe block; FIG. FIG. 4 is a drawing for explaining a method for fixing or separating a probe block on a probe unit; FIG. FIG. 4 is a drawing for explaining a method for fixing or separating a probe block on a probe unit; FIG.

A probe block assembly for inspecting a display panel according to the present invention includes a mother glass panel - at least one kind of display panel having an organic material layer deposited on one surface of the mother glass panel for forming an organic light emitting layer. and the display panel includes a plurality of electrode pads formed along the side surface of the display panel. a plurality of probe blocks for testing to proceed; and a probe unit supporting the plurality of probe blocks, each of the plurality of probe blocks having a probe pin contacting each of the plurality of electrode pads. , a position where the display panel is inspected for defects after being selected from the probe blocks loaded on the probe block loading unit and carried out to inspect the display panel. It can be characterized in that it is mounted at a predetermined position on the probe unit existing in the.

Specific embodiments of the present invention are described in detail below with reference to the drawings. However, the spirit of the present invention is not limited to the presented embodiments, and a person skilled in the art who understands the spirit of the present invention may add, change, or delete other components within the scope of the same idea, and may Other embodiments within the scope of the invention and the idea of the present invention can be easily proposed, and it can be said that this is also included in the scope of the idea of the present invention.

Also, constituent elements having the same function within the scope of the same concept shown in the drawings of the respective embodiments will be described using the same reference numerals.

1. 1. Display Panel and Mother Glass Panel FIG. 1 is a view for explaining a display panel inspected for defects by the display panel inspection equipment according to the present invention, and FIG. 2 is provided to the display panel inspection equipment according to the present invention. 4 is a diagram for explaining various embodiments of combinations of display panels included in a mother glass panel that can be mounted on a stage module;

Referring to FIG. 1, the display panel DP is formed by depositing an organic material layer for forming an organic light-emitting layer on a panel serving as a substrate to implement pixels. Before the stopping process, the display panel inspection equipment (1000, see FIGS. 3 and 4) according to the present invention may be used to inspect for defects.

The display panel DP includes a first electrode pad EP1 formed along a first side for testing for defective pixels, a second electrode pad EP2 formed along a second side, and a third electrode pad EP2 formed along a third side. A third electrode pad EP3 formed along the fourth side surface and a fourth electrode pad EP4 formed along the fourth side surface may be provided.

However, the display panel DP may vary in the number and position of the electrode pads according to the characteristics of the panel.

A plurality of display panels DP are formed on a mother glass panel MP whose size is determined according to the size of the stage module (110, see FIGS. 3 and 4) in the manufacturing process, and then cut. The mother glass panel MP may be manufactured through a process and may be a glass substrate serving as a base for production of the display panel DP.

The mother glass panel MP has a single type or a plurality of display panels DP of the same size in order to minimize the empty space and increase the efficiency of defect inspection, that is, to increase the chamfering efficiency. It may be a mixed type formed by mixing display panels DP of various sizes.

For example, the mother glass panel MP is a mixed type with two 98-inch display panels as shown in FIG. 2(a), and three 65-inch display panels and a 32-inch display as shown in FIG. A mixed type of 6 panels, a single type of 18 31.5 inch display panels as shown in FIG. 2(c), two 49 inch display panels and 75 as shown in FIG. A mixed type of two inch display panels and a mixed type of three 65 inch display panels and two 55 inch display panels as shown in FIG. Instead, it may be a panel to which mixed types of display panels of various sizes are applied.

The display panel inspection equipment 1000 according to the present invention can inspect the presence or absence of defects in all display panels included in the mixed type mother glass panel MP of various combinations as described above. A representative example will be described in which the panel is a mixed type in which three 65-inch display panels and two 55-inch display panels are formed.

2. Display Panel Inspection Equipment FIG. 3 is a block diagram for explaining the display panel inspection equipment according to the present invention, and FIG. 4 is a diagram for explaining the display panel inspection equipment according to the present invention.

Referring to FIGS. 3 and 4, the display panel inspection equipment 1000 according to the present invention uses a back adsorption method, that is, a face down method to inspect display panels of various sizes included in a mother glass panel MP. A testing facility capable of maximizing the accuracy and speed of testing for defects by allowing the presence or absence of defects in the DP to be performed without replacing the probe units (PU1, PU2, see FIG. 20), An inspection process preparation facility 1100 and an inspection process progress facility 1200 may be included.

The inspection process preparation equipment 1100 is in a normal state in which one surface of a mother glass panel MP, which is provided with at least one kind of display panel DP having an organic material layer for forming an organic light emitting layer deposited thereon, faces upward. When the other surface of the mother glass panel MP is attracted to the stage module 110, the stage module 110 is rotated so that the mother glass panel MP changes from the normal state to the reversed state in which the one surface faces downward. After that, the transfer module 120 receives the transfer of the mother glass panel MP in the reversed state, and while maintaining the reversed state, moves the mother glass panel MP to equipment for the next process. It may be equipment.

After the picker module 130 picks up the other surface of the mother glass panel MP that has entered by the transfer module 120, the inspection process progress equipment 1200 moves the position of the picker module 130 to move the vacuum adsorption module 140 to the mother glass panel MP in the reversed state. When the glass panel MP is sucked, the electrode pads of the display panel DP are attached to the probe pins (3002, see FIG. 22) of the probe block (PB, see FIG. 22) of the display panel inspection device 200 through the positional movement of the vacuum adsorption module 140. It may be a facility for inspecting whether the display panel DP is defective by contacting the display panel DP.

Meanwhile, in the display panel inspection equipment 1000 according to the present invention, the mother glass panel MP is placed on the stage module 110, and the mother glass panel MP is adsorbed to the vacuum adsorption module 140 via the picker module 130 by the transfer module 120. can be defined as a mother glass panel transfer device 100, and the display panel DP adsorbed to the vacuum adsorption module 140 by the mother glass panel transfer device 100 is a probe block assembly 2000 and a probe block loading unit 3000. The process of inspecting for defects by the display panel inspection apparatus 200 will be described in detail with reference to FIGS. 20 to 28. FIG.

5 and 6 are drawings for explaining the air flow in the inspection process progress equipment provided in the display panel inspection equipment according to the present invention, and FIG. 5 is a schematic cross section along line AA of FIG. 6 is a schematic cross-sectional view taken along line BB of FIG. 4. FIG.

Referring to FIGS. 5 and 6 together with FIGS. 3 and 4, the inspection process progressing equipment 1200 is such that the electrode pads of the display panel DP and the probe pins (3002, see FIG. 22) of the probe block (PB, see FIG. 22) are in contact with each other. The first space 300 for performing the inspection for the presence or absence of the defects of the display panel DP, and the display panel DP to be inspected for the presence or absence of the defects are photographed to remove stains or stains on the display panel DP. The second space 400 may include a second space 400 in which a vision module 410 for checking the presence of scratches is movably installed, and the second space 400 is located below the first space 300 . can do.

Here, the vision module 410 may include, for example, four camera units, and the camera units change the working distance (WD) according to the size of the display panel DP to be photographed. It may be positionally movable toward the bottom.

In addition, since the four camera units must photograph the entire area of the display panel DP corresponding to the size of the display panel DP to be photographed, each of the four camera units has a size of 1/4 of the display panel DP to be photographed. It must be located in the middle of the region and can therefore be moved forward or backward, left or right. Also, if necessary, it may be rotated forward or backward to correspond to the rotation of the display panel DP to be shot.

Meanwhile, the inspection for defects of the display panel DP in the inspection process preparation equipment 1100 and the inspection process progress equipment 1200 may be performed under a nitrogen atmosphere.

In particular, in the case of the inspection process progress equipment 1200, the nitrogen air should be stably circulated in the first space 300 and the second space 400 without stagnation.

For this purpose, the inspection process progress equipment 1200 includes a forced circulation module 310 located in the upper part of the first space 300, and an upper and a lower part for circulating the nitrogen air in the first space 300. A connecting first circulation duct module 320 and a second circulation duct module 420 connecting the first space 300 and the second space 400 may be included.

The second circulation duct module 420 may allow the nitrogen air that has flowed into the second space 400 from the first space 300 to flow back into the first space 300 and be circulated. A forced suction module 430 may be positioned on the second circulation duct module 420 .

Here, the forced circulation module 310 and the forced suction module 420 are a kind of suction fan. After the nitrogen air introduced into the second space 400 is sucked, it may be discharged to the first space 300 .

Therefore, the inspection process progress equipment 1200 performs the inspection process of the display panel under a uniform nitrogen atmosphere.

On the other hand, since the inspection process preparation equipment 1100 and the inspection process progress equipment 1200 require an operator to enter during maintenance, the atmosphere can be changed to a clean dry air (CDA) atmosphere.

3. Mother Glass Panel Transfer Apparatus FIG. 7 is a flow chart illustrating a process of sucking a mother glass panel to a vacuum suction module by a mother glass panel transfer apparatus provided in the display panel inspection equipment according to the present invention.

First, referring to FIGS. 3 and 4, the mother glass panel transfer device 100 may include a stage module 110, a transfer module 120, a picker module 130, a vacuum adsorption module 140, and the like.

The stage module 110 is a component for adsorbing and fixing the other surface of the mother glass panel MP in a normal state in which one surface of the mother glass panel MP faces upward. At least one kind of display panel DP having an organic material layer deposited thereon for forming an organic emission layer may be provided.

Here, the other surface of the mother glass panel MP may be a non-vapor-deposited portion as a whole.

The stage module 110 can be rotated so that the display panel can be inspected in a face-down manner, so that the mother glass panel is placed in the normal state and adsorbed to the stage module 110 . The MP can be in an inverted state with the one side facing downward.

After the transfer module 120 sucks the other surface of the mother glass panel MP whose state is changed from the normal state to the reversed state on the stage module 110, the transfer module 120 moves the mother glass panel MP while maintaining the reversed state. It may be a component for moving to a first position for inspection for defects.

The picker module 130 picks up the other surface of the mother glass panel MP moved to the first position by the transfer module 120, and then rises from the first position while maintaining the reversed state. A plate-like vacuum adsorption module 140, which is a component for moving to the second position and will be described later, can adsorb the reversed mother glass panel MP.

When the transfer module 120 moves the reversed mother glass panel MP to the second position, the vacuum suction module 140 can suction the mother glass panel MP while maintaining smoothness in the reversed state. Further, it may be a component for inspecting whether or not the display panel DP is defective by interacting with the probe pins 3002 of the probe block PB of the display panel inspection apparatus 200 .

When the mother glass panel MP is sucked in the reversed state by the vacuum suction module 140, the vacuum suction module 140 maintains the mother glass panel MP in the reversed state and moves the electrodes of the display panel DP through positional movement. The inspection for defects of the display panel DP is performed in the reversed state by contacting the pads with the probe pins 3002 of the probe block PB.

Here, the reason why the mother glass panel MP should be finally sucked by the vacuum suction module 140 while maintaining the reversed state is that the display panel DP should be accurately inspected for defects in the display panel DP. This is to maintain the position control and the smoothness of the display panel DP. This is because problems such as smoothness occur, and an accurate inspection for the presence or absence of defects cannot be guaranteed.

Hereinafter, a process of sucking the mother glass panel MP to the vacuum suction module 140 by the mother glass panel transfer device 100 according to the present invention will be described.

Referring to FIG. 7, the step of sucking the mother glass panel to the vacuum suction module by the mother glass panel transfer device 100 according to the present invention is the first step in which the mother glass panel MP is placed on the stage module 110 in a normal state. (S10), the second step (S20) in which the stage module 110 rotates, the third step (S30) in which the transfer module 120 enters and sucks the mother glass panel MP, and the transfer module 120 moves to the first position. a fifth step (S50) in which the picker module 130 descends to suck the mother glass panel MP; a sixth step (S60) in which the transfer module 120 returns; A seventh step (S70) in which the display panel DP is sucked by the vacuum suction module 140 (S80), and a ninth step (S80) in which the picker module 130 rises and moves to a third position ( S90).

Hereinafter, each step described above will be described in detail with reference to FIGS. 8 to 19. FIG.

FIG. 8 is a view for explaining how the mother glass panel is placed in a normal state on the stage module provided in the mother glass panel transfer apparatus according to the present invention.

Referring to FIG. 8, the mother glass panel MP can be attached to the stage module 110 after being placed (S10) on the stage module 110 in a normal state.

Here, for convenience of explanation, the mother glass panel MP has one surface provided with at least one or more display panels DP represented by shading.

On the other hand, the method of disposing the mother glass panel MP on the stage module 110 is not particularly defined, and may be various, such as an automatic method using a robot device under a nitrogen atmosphere or a manual method by an operator.

The stage module 110 may include a plurality of stage units 112 for sucking the other surface SF2 of the mother glass panel MP in the normal state, and the stage units 112 are spaced apart from each other. A first space S1 can be formed in the .

For example, as shown in FIG. 8, the stage units 112 may be formed of nine pieces, but the present invention is not limited thereto. The number may be changed as long as it can be stably supported.

Each of the stage units 112 may be provided with a suction means 114 such as a suction pad for sucking the mother glass panel MP, and the number of the suction means 114 is not limited.

9 and 10 are diagrams for explaining a situation in which the mother glass panel in a normal state changes to a reversed state due to the rotation of the stage module from the situation shown in FIG.

9 and 10, the stage module 110 can be rotated (R, S20) while sucking the mother glass panel MP in a normal state, and the rotation direction is not limited.

A driving method for rotating the stage module 110 is not particularly defined, and the stage module 110 may be rotated using, for example, a known motor.

When the stage module 110 rotates, the mother glass panel MP sucked in the normal state changes its state to a reversed state in which the one surface SF1 on which the vapor deposition portion exists faces downward.

The mother glass panel MP continuously maintains the reversed state while the defect inspection is being performed, so that the display panel DP can be inspected for the defect in a face down manner. become.

FIG. 11 is a view for explaining how a transfer module provided in the mother glass panel transfer apparatus according to the present invention enters the stage module, and FIGS. 12 and 13 are views for the mother glass panel transfer apparatus according to the present invention. FIG. 10 is a view for explaining a state in which a provided transfer module sucks a reversed mother glass panel; FIG.

11 to 13, when the mother glass panel MP is reversed due to the rotation of the stage module 110, the transfer module 120 enters the stage module 110 and then sucks the mother glass panel MP (S30). It will be.

The transfer module 120 may include a plurality of transfer units 122 for sucking the other surface SF2 of the mother glass panel MP that is inserted into the first space S1 provided by the stage unit 112 and arranged in an inverted state. can.

The transfer units 122 may be spaced apart from each other like the stage units 112 .

For example, as shown in the drawing, the transfer units 122 may be formed in eight units, but are not necessarily limited thereto.

After entering the first space S1 provided by the mother glass panel MP and the stage unit 112, the transfer unit 122 can absorb the other surface SF2 of the mother glass panel MP, thereby removing the mother glass panel MP. If necessary for adsorption, the position may be moved in the vertical direction.

Each transfer unit 122 may be provided with a suction means 124 such as a suction pad for sucking the mother glass panel MP, and the number of the suction means 124 is not limited.

When the mother glass panel MP is sucked by the transfer unit 122 as described above, the suction of the mother glass panel MP by the stage unit 112 is released, whereby the mother glass panel MP is transferred. It will be interlocked with the movement of the unit 122 .

FIG. 14 is a view for explaining a state in which a transfer module provided in the mother glass panel transfer apparatus according to the present invention is moved to the first position.

Referring to FIG. 14, the transfer module 120 may be moved to a first position for inspection for defects while maintaining the reversed state while sucking the reversed mother glass panel MP (S40).

Here, the first position may refer to a position above the reversed mother glass panel MP with respect to the position where the vacuum adsorption module 140 and the picker module 130 are arranged. can stably adsorb the mother glass panel MP in the reversed state while maintaining the reversed state.

15 and 16 are diagrams for explaining a state in which a picker module provided in a mother glass panel transfer apparatus according to the present invention descends to pick up a reversed mother glass panel, and FIG. FIG. 4 is a view for explaining a situation in which a transfer module provided in the mother glass panel transfer device returns to its original position; FIG.

Referring to FIGS. 15 and 16, the picker module 130 can be moved to the first position after passing the vacuum adsorption module 140 while being positioned at the third position, and the transfer module 120 can move the picker module 130 to the first position. The mother glass panel MP in the reversed state that has moved to the position can be sucked (S50).

The picker module 130 may include a plurality of picker units 132 spaced apart from each other so as to uniformly attract the other surface SF2 of the mother glass panel MP and prevent it from sagging.

When the mother glass panel MP is sucked by the picker module 130, the transfer module 120 is separated from the mother glass panel MP and moved to its original position as shown in FIG. S60).

The transfer module 120 moved to the original position can operate to inspect other display panels provided on other mother glass panels.

FIG. 18 is a view for explaining a situation in which the picker module provided in the mother glass panel transfer apparatus according to the present invention is raised to the second position.

Referring to FIG. 18, the picker module 130 picks up the mother glass panel MP in the reversed state, and then moves up to the second position (S70). S80) It becomes possible.

Here, the second position may be a position raised to the vacuum adsorption module 140 by the picker module 130 with respect to the first position, and the vacuum adsorption module 140 may be stabilized by the picker module 130. The mother glass panel MP can be sucked in a reversed state.

The vacuum adsorption module 140 may include a plurality of adsorption means such as adsorption pads for adsorbing the mother glass panel MP.

FIG. 19 is a view for explaining a situation in which the picker module provided in the mother glass panel transfer apparatus according to the present invention is raised to the third position.

Referring to FIG. 19, when the second surface SF2 of the mother glass panel MP moved to the second position is sucked by the vacuum suction module 140, the picker module 130 releases the suction and separates from the mother glass panel MP. After that, it may be raised and returned to the third position (S990).

After that, an inspection for defects may be performed by interacting with the vacuum adsorption module 140 and the display panel inspection apparatus 200 .

Here, the interaction implements contact between the electrode pads of the display panel DP provided on the mother glass panel MP and the probe pins 3002 of the probe block PB by moving the position of the vacuum adsorption module 140 to determine whether or not the display panel DP is defective. It can mean that the inspection for

Hereinafter, a process of inspecting whether or not the display panel DP is defective by the display panel inspection apparatus 200 will be described in detail.

4. Display Panel Inspection Apparatus FIG. 20 is a diagram for explaining a display panel inspection apparatus provided in the display panel inspection equipment according to the present invention.

Referring to FIG. 20, the display panel inspection apparatus 200 is an apparatus capable of inspecting LCDs or OLEDs, and is applicable to all equipment for inspecting display panels using probe units PU1, PU2 and probe block PB. good.

That is, the display panel inspection apparatus 200 can be applied not only to the face down type inspection equipment described with reference to FIGS. 1 to 19, but also to the face up type inspection equipment. can also be applied to

In the following, a situation in which the display panel inspection apparatus 200 is applied to an inspection facility using the face down method described with reference to FIGS. 1 to 19 will be described as an example.

The display panel inspection apparatus 200 may include a probe block assembly 2000 and a probe block loading unit 3000. FIG.

The probe block assembly 2000 is moved to the inspection position through the positional movement of the vacuum adsorption module 140 that adsorbs the other surface of the mother glass panel MP in an inverted state in which one surface of the mother glass panel MP faces downward. a probe block PB contacting an electrode pad of the display panel DP and a probe unit PU1 supporting the probe block PB, which is configured to perform inspection for defects in the reversed state of the panel DP; PU2 can be included.

Here, the probe block assembly 2000 inspects whether or not the display panel DP moved to the inspection position is inspected for defects through the positional movement of the vacuum adsorption module that adsorbs the mother glass panel MP in a face-up manner. The configuration may be such that the

The probe block loading unit 3000 loads and stores various types of probe blocks PB, and may be capable of loading and unloading the loaded probe blocks PB.

In order to inspect the display panel DP, the probe block PB is selected while being loaded on the probe block loading unit 3000, and then unloaded and mounted at a predetermined position on the probe units PU1 and PU2. can be

The probe units PU1 and PU2 are the first probe unit PU1 for inspecting the display panel DP and the second probe unit PU2 for inspecting other display panels of different sizes after the inspection of the display panel DP is completed. can include

The first probe unit PU1 includes a 1-1 probe unit PU1-1 arranged in the horizontal direction D1, a 1-2 probe unit PU1-2 arranged in the vertical direction D2, and a 1-2 probe unit PU1-2 arranged in the vertical direction D2. 1-3 probe units PU1-3 and 1-4 probe units PU1-4 arranged in the lateral direction D1 can be included.

The second probe unit PU2 includes a 2-1 probe unit PU2-1 arranged in the horizontal direction D1, a 2-2 probe unit PU2-2 arranged in the vertical direction D2, and a 2-2 probe unit PU2-2 arranged in the vertical direction D2. It can include a 2-3 probe unit PU2-3 and a 2-4 probe unit PU2-4 arranged in the lateral direction D1.

Here, the 1-1 probe unit PU1-1 and the 2-1 probe unit PU2-1 may be formed as a single unit as shown in the drawings.

The probe blocks PB loaded on the probe block loading unit 3000 can be unloaded based on the display panel DP to be inspected and mounted on the probe units PU1 and PU2. It can be embodied by a free delivery mounting means.

The unloading/mounting means may be any of a variety of known means such as robotic arms, including, but not limited to, belts or rails, for example.

Hereinafter, the process of inspecting the 65-inch display panel and the 55-inch display panel included in the mother glass panel MP for defects by the display panel inspection apparatus 200 shown in FIG. 20 will be described.

FIGS. 21 to 28 are diagrams for explaining how a 65-inch display panel and a 55-inch display panel provided on a mother glass panel are inspected for defects by the display panel inspection apparatus according to the present invention. .

First, it is assumed that one mother glass panel MP includes three 65-inch display panels and two 55-inch display panels, and electrode pads are provided on each side of each display panel. However, it is assumed that the 65-inch display panel is inspected first, and the 55-inch display panel is inspected after all the 65-inch display panels are inspected.

The display panel inspection apparatus 200 according to the present invention senses that the mother glass panel MP includes three 65-inch display panels and two 55-inch display panels through a sensing unit (not shown).

The sensing unit may include an imaging unit using a camera and/or various sensor units. The size of the display panel DP constituting the mother glass panel MP, the electrode pads of the display panel DP, and the electrode pads of the display panel DP before or during the movement to the position where the probe units PU and PU2 are arranged while being adsorbed to the module 140 , the number and position of formation of .

Of course, the detection of the number and formation positions of the electrode pads of the display panel DP by the sensing unit is not restricted in terms of time before the inspection by the display panel inspection apparatus 200 proceeds.

When the sensing unit senses the size and/or type of the display panel DP constituting the mother glass panel MP, the control unit determines which type of display panel to inspect first. Now, as described above, a situation in which the 65-inch display panel is determined to be inspected with priority over the 55-inch display panel will be described as an example.

When the size and/or type of display panels formed on the mother glass panel MP are sensed by the control unit, and the 65-inch display panel among the sensed display panels is preferentially inspected, the control unit senses Based on the number and formation position of the electrode pads of the 65-inch display panel sensed by the unit, the probe block PB required for inspection is selected from the probe blocks PB loaded on the probe block loading unit 3000, and the probe unit PU1 selects the probe block PB. , a mounting region SR on which the selected probe block should be mounted is selected and determined from among the mounting regions SR on PU2.

Here, the mounting area SR is an area for individually mounting the probe blocks PB. The probe block may not be attached to the specific attachment region SR depending on the type of electrode pad, the formation position and number of electrode pads, and the like.

Meanwhile, the control unit controls the first probe unit PU1 after completing the above-described processes.

That is, the control unit controls the 1-2nd probe unit PU1-2, the 1-3rd probe unit PU1-3 and the 1-4th probe unit PU1-3 while the 1-1st probe unit PU1-1 is fixed. At least one of the probe units PU1-4 is moved so that the first probe unit PU1 is positioned corresponding to the electrode pads provided on the 65-inch display panel.

For example, as shown in FIG. 21, the control unit controls the first-second probe unit PU1-2, second The 1-3 probe unit PU1-3 and the 1-4 probe unit PU1-4 can be moved on the support plate unit 210, and the position movement may be linear movement.

Here, the position movement can be implemented using various known elements such as a linear motion guide, motor, ball screw and ball nut, but this is only an example and various known movement methods can be applied. can be embodied in

The 1-2nd probe unit PU1-2 and the 1-3rd probe unit PU1-3 can approach each other by a predetermined distance, and the 1-4th probe unit PU1-4 can approach the 1-1st probe unit PU1. -1 can be approached by a predetermined distance.

Here, when the 1-4th probe unit PU1-4 is linearly moved, the above-mentioned Positional movement can be realized at the bottom of the first-second probe unit PU1-2 and the first-third probe unit PU1-3.

When the positional movement of the first probe unit PU1 for inspecting the 65-inch display panel is completed as described above, the control unit detects that the selected probe block PB is placed on the 1-1 probe unit PU1-1 by the unloading/mounting means. Determined mounting area SR, determined mounting area SR on 1-2 probe unit PU1-2, determined mounting area SR on 1-3 probe unit PU1-3, 1-4 probe unit PU1 -4 to control the unloading/mounting means so that it is mounted in the predetermined mounting area SR above.

As shown in FIGS. 22 and 23, the mounting of the probe block PB can be stably implemented by the interaction of the position fixing parts 3001 and 3003 and the guide parts 3005 and 3007. The position fixing parts 3001 and 3003 are connected to the probe A first position fixing part 3001 recessed from the bottom surface of the block PB and a second position fixing part 3003 protruding from the bottom surface may be included.

The guide parts 3005 and 3007 may include a first guide part 3005 protruding from the upper surface of the probe units PU1 and PU2 and a second guide part 3007 recessed from the upper surface.

In the probe block PB, the first position fixing part 3001 is matched with the first guide part 3005, and the second position fixing part 3003 is matched with the second guide part 3007, so that the probe unit PU1 is stably mounted. , PU2 in the mounting area SR.

The mounting regions SR on the probe units PU1 and PU2 have guiding portions 3005 and 3007 interacting with the position fixing portions 3001 and 3003 formed on the probe block PB to guide the mounting position of the probe block PB. In addition to the above method, other known methods may be applied as a method for stably attaching the probe blocks PB to the probe units PU1 and PU2.

On the other hand, when the probe blocks PB are unloaded from the probe block loading unit 3000 and mounted in the mounting regions SR on the probe units PU1 and PU2, the probe blocks PB are shown in FIGS. As described above, the probe pins 3002 of the probe block PB may be capable of applying power through electrical connection between the connection terminals 3006 and the power applying unit 3009 .

The power applying unit 3009 is a circuit board having a power applying terminal pattern formed thereon so that power is applied to the probe block PB when the probe block PB is mounted on the probe units PU1 and PU2. may be

The probe block PB is electrically connected to the probe pins 3002 contacting the electrode pads of the display panel, the main body 3004 supporting the probe pins 3002, and the power applying unit 3009 so that the power is applied to the probe pins 3002. and a circuit pattern portion 3008 for electrically connecting the probe pin 3002 and the connection terminal 3006. The circuit pattern portion 3008 may be a printed circuit board.

Here, the connection terminals 3006 may be formed in the same number as or less than the number of power application terminals to which power is applied by the power application unit 3009, and the circuit pattern unit 3008 may have the number of the probe pins 3002 equal to the number of the power application terminals. If the number is less than the number of terminals, the printed circuit board may apply only a part of the power applied to the power applying terminals to the probe pins 3002 .

On the other hand, among the probe blocks carried out from the probe block loading unit 3000 by the loading/unloading means, the probe blocks PB to be mounted on the 1st-4th probe units PU1-4 are carried out from the probe block loading unit 3000, The 1-2 probe unit PU1-2 or the probe block PB attached to the 1-3 probe unit PU1-3 is formed longer in the height direction D3, and the 1-2 probe unit PU1-2 and the 1-3 probe block PB The position of the 1-4th probe unit PU1-4 in the height direction D3 based on the 1-3 probe unit PU1-3 can be compensated.

In other words, the display panel DP to be tested is maintained in a horizontal state. must be located in

For this reason, in the case of the 1-4th probe unit PU1-4 positioned relatively lower than the 1-2nd probe unit PU1-2 and the 1-3rd probe unit PU1-3, A probe block PB that is longer in the height direction D3 than the probe blocks PB mounted on the 1-2nd probe unit PU1-2 and the 1-3rd probe unit PU1-3 should be mounted.

That is, when the probe block PB is to be attached to the 1st-4th probe units PU1-4, the control unit selects the probe block PB for position compensation in the height direction D3.

Of course, the probe block PB, which must be attached to the 1-4 probe unit PU1-4, is combined with a separate component such as a spacer to form the 1-2 probe unit PU1-2 and the 1-3 It may be longer in the height direction D3 than the probe blocks PB mounted on the probe units PU1-3.

In the above description, it has been described that the first probe block PB is mounted on the first probe unit PU1 after the first probe unit PU1 is positioned corresponding to the electrode pads provided on the 65-inch display panel by the control unit. However, it is not necessarily limited to this. After the probe block PB is mounted on the first probe unit PU1, the first probe unit PU1 mounted with the probe block PB is mounted on the 65-inch display panel. may be arranged at positions corresponding to the electrode pads provided in the .

As shown in FIG. 24, when the mounting of the probe block PB for inspecting the 65-inch display panel on the first probe unit PU1 is completed, the first probe unit PU1 is supported as shown in FIG. Rotation (R) of the plate unit 210 will rotate 180 degrees.

When the first probe unit PU1 is rotated by the rotation of the support plate unit 210, the electrode pads of the 65-inch display panel are moved by the positional movement of the vacuum adsorption module 140 to the probes of the probe block PB mounted on the first probe unit PU1. By contacting the pin 3002 and applying power through the power applying unit 3009, the inspection for defects is performed.

Meanwhile, as shown in FIG. 26, while the first probe unit PU1 is inspecting the 65-inch display panel for defects, the second probe unit PU2 detects whether the 55-inch display panel is defective by the control unit. I will prepare for the inspection.

With the 2-1 probe unit PU2-1 fixed, the control unit controls the 2-2 probe unit PU2-2, the 2-3 probe unit PU2-3, and the 2-4 probe unit PU2-4. At least one of them is moved so that the second probe unit PU2 is positioned corresponding to the electrode pads provided on the 55-inch display panel.

For example, as shown in FIG. 26, the control unit can control the second-second probe unit PU2-2, the first-second The 2-3 probe unit PU2-3 and the 2-4 probe unit PU2-4 can be moved on the support plate unit 210, and the position movement may be linear movement.

Here, the position movement can be implemented using various known elements such as a linear motion guide, motor, ball screw and ball nut, but this is only an example and various known movement methods can be applied. can be embodied in

The 2-2nd probe unit PU2-2 and the 2-3rd probe unit PU2-3 can approach each other by a predetermined distance, and the 2-4th probe unit PU2-4 can approach the 2-1st probe unit PU2. -1 can be approached by a predetermined distance.

Here, the 2nd-4th probe unit PU2-4 is configured to prevent interference with the 2nd-2nd probe unit PU2-2 and the 2nd-3rd probe unit PU2-3 during linear movement. A positional movement can be implemented at the bottom of the 2-2 probe unit PU2-2 and the 2-3 probe unit PU2-3.

When the positional movement of the second probe unit PU2 to inspect the 55-inch display panel is completed as described above, the control unit detects that the selected probe block PB is placed on the 2-1 probe unit PU2-1 by the unloading/mounting means. Determined mounting area SR, determined mounting area SR on the 2-2nd probe unit PU2-2, determined mounting area SR on the 2-3rd probe unit PU2-3, 2-4th probe unit PU2 -4 to control the unloading/mounting means so that it is mounted in the predetermined mounting area SR above.

As a result, as shown in FIG. 27, the mounting of the probe block PB for testing the 55-inch display panel on the second probe unit PU2 is completed, and all the 65-inch display panels are tested by the first probe unit PU1. is completed, the rotation (R) of the support plate unit 210 causes the second probe unit PU2 to rotate 180 degrees as illustrated in FIG.

When the second probe unit PU2 is rotated by the rotation of the support plate unit 210, the electrode pads of the 55-inch display panel are moved by the positional movement of the vacuum adsorption module 140 to the probes of the probe block PB mounted on the second probe unit PU2. By contacting the pin 3002 and applying power through the power applying unit 3009, the inspection for defects is performed.

Here, the probe block PB mounted on the first probe unit PU1 is moved to the probe block loading unit 3000 by the unloading and mounting means, and proceeds to a preparation mode for inspecting a display panel of a different size. As a result, the above process is repeated.

On the other hand, in the above description, the electrode pads of the display panel DP to be inspected are formed on all four side surfaces. Of course, only some of the side surfaces may be formed, and in this case, only some of the probe units required for inspection may be used.

The above contents are organized as follows.

The display panel inspection apparatus 200 according to the present invention selectively mounts the probe blocks PB necessary for inspection on the probe units PU1 and PU2 to inspect the display panel DP, and inspects other display panels DP. In this case, the inspection work can be performed more conveniently by exchanging the probe block PB without exchanging the probe units PU1 and PU2, thereby improving the yield.

For this purpose, the display panel inspection apparatus 200 may include a probe block assembly 2000 and a probe block loading unit 3000, and the probe block assembly 2000 contacts a plurality of electrode pads provided on the side of the display panel DP. A plurality of probe blocks PB and probe units PU1 and PU2 supporting the plurality of probe blocks PB can be included.

Here, in order to inspect the display panel DP, the plurality of probe blocks PB are selected from among the probe blocks PB loaded on the probe block loading unit 3000 and carried out to display the display panel DP. It is mounted at a predetermined position on the probe units PU1 and PU2, which are located at the position where the inspection for the presence or absence of defects is progressed.

The probe units PU1 and PU2 may include a plurality of mounting areas SR for individually mounting the probe blocks PB. Among the plurality of mounting areas SR, the probe blocks PB may be mounted. The mounting region SR to be mounted is selected based on the number and formation position of the electrode pads of the display panel DP to be inspected.

Meanwhile, the probe units PU1 and PU2 may include a first probe unit PU1 and a second probe unit PU2, and a specific display is performed by a probe block PB mounted on the first probe unit PU1 and the first probe unit PU1. When the inspection of the panel is completed, the second probe is rotated so that the positions of the first probe unit PU1 and the second probe unit PU2 are exchanged for inspection of other display panels of different sizes. The other display panel can be inspected by the unit PU2 and the probe block PB mounted on the second probe unit PU2.

That is, the probe units PU1 and PU2 can be inspected for defects in the specific display panel and the other display panels without being replaced with other external probe units.

Of course, the first probe PU1 or the second probe unit PU2 are not replaced with each other, but only by replacing the probe block PB currently mounted for inspection, so that the display on which the inspection for the presence or absence of the current defect is progressing. A display panel having a size different from that of the panel may be inspected for defects.

The probe block assembly 2000 mentioned above is an assembly capable of inspecting the display panel DP by mounting a plurality of probe blocks PB necessary for inspecting the display panel DP on the probe unit as necessary. , Face down or Face up methods may be applied to the apparatus for inspecting the display panel DP.

At this time, the control method of the probe block assembly 2000 includes at least one kind of display panel included in the mother glass panel MP--the display panel has a plurality of electrode pads formed along its side surface--. a first step of sensing the number and formation positions of a plurality of electrode pads of the first display panel that need to be inspected for defects; a second step of selecting probe blocks necessary for inspection from among the obtained probe blocks, selecting a mounting region where the probe blocks should be mounted among the mounting regions on the probe unit based on the sensing result of the first step; and a fourth step of unloading the selected probe block from the probe block loading unit and mounting it on the selected mounting area.

Here, in the fourth step, after the first display panel has been tested, at least one of the probe blocks mounted in the mounting area is unnecessary for testing the second display panel having a different size. The method may include a step of selecting the probe blocks that are unnecessary or need to be replaced, and unloading and loading them on the probe block loading unit when the probe blocks are unneeded or need to be replaced.

In addition, in the fourth step, when an additional probe block is required for testing a second display panel having a different size after the testing of the first display panel is completed, it is loaded on the probe block loading unit. selecting the additional probe block in the probe block, selecting a mounting region where the additional probe block should be mounted, and then mounting the selected additional probe block in the selected mounting region. can be done.

Therefore, the probe block assembly can inspect various types of display panels for defects by replacing the probe block.

FIG. 29 is a diagram illustrating another method of applying power to probe pins provided in a probe block.

Referring to FIG. 29, the connection between the connection terminal 3106 of the probe block PB' and the power applying unit 3109 may be implemented by a method such as a socket.

Here, when carrying out the probe block PB' from the probe block loading unit 3000, the carry-out mounting means grips the main body 3104 and the connection terminals 3106, and then places the main body 3104 on the mounting area on the probe unit, The terminal 3106 is inserted into the power applying part 3109 so that the connection terminal 3106 and the power applying part 3109 are electrically connected.

30 and 31 are drawings for explaining a method for fixing or separating the probe block on the probe unit.

Referring to FIG. 30, the probe unit mounting area may be partitioned by a partition wall W, and the probe block PB may be positionally fixed and separated by first fixing means 3200 and second fixing means 3300 .

The first fixing means 3200 may be movable in the height direction D3, and when it moves downward in the height direction D3, the second fixing means 3300 rotates around the hinge. As a result, separation of the probe block PB becomes possible.

Referring to FIG. 31, the position of the probe block PB may be fixed and separated by a third fixing means 3400, and the pressing means 3500 that pressurizes the probe block PB by sliding the third fixing means 3400 is Rotation enables separation of the probe block PB.

Although the configuration and features of the present invention have been described above based on the embodiments of the present invention, the present invention is not limited thereto, and the present invention belongs to the present invention that can be variously changed or modified within the spirit and scope of the present invention. Such modifications or variations are obvious to those skilled in the art and are therefore intended to be covered by the appended claims.

Claims (8)

One surface of the mother glass panel is provided with at least one type of display panel on which an organic material layer for forming an organic light emitting layer is deposited, and the display panel is provided with a plurality of electrode pads formed along the side surface. a plurality of probe blocks contacting the plurality of electrode pads of the display panel moved to the inspection position through the positional movement of the mother glass panel to inspect for defects;
a probe unit that supports the plurality of probe blocks;
including
The plurality of probe blocks are
comprising respective probe pins contacting each of the plurality of electrode pads;
In order to inspect the display panel, each of the plurality of probe blocks is selected from among the probe blocks loaded on the probe block loading unit and then unloaded to inspect the display panel for defects. A probe block assembly for inspecting a display panel, wherein the probe block assembly is mounted at a predetermined position on the probe unit located at a position for advancing. If at least one of the plurality of probe blocks is unnecessary or needs to be replaced in order to inspect another display panel having a different size after the inspection of the display panel is completed;
The probe block that is unnecessary or needs to be replaced,
2. The probe block assembly of claim 1, wherein the probe block assembly is unloaded and loaded on the probe block loading unit after being selected from the probe unit. The probe unit is
After completing the inspection of the display panel, if an additional probe block is required for inspection of another display panel having a different size, the additional probe unit among the probe blocks loaded on the probe block loading unit is used. 2. The probe block assembly for testing a display panel as claimed in claim 1, wherein the probe block assembly is carried out after being selected to provide a mounting area in which the additional probe unit can be mounted. The probe unit is
comprising a plurality of mounting areas for individually mounting the probe blocks;
A mounting region for mounting a probe block among the plurality of mounting regions,
2. The probe block assembly for testing a display panel as claimed in claim 1, wherein the probe block assembly is selected based on the number and positions of electrode pads of the display panel to be tested. The plurality of mounting areas are
5. The display panel tester of claim 4, further comprising a guide part interacting with a position fixing part formed in the probe block to guide a position where each probe block is mounted. probe block assembly for further comprising a power applying unit for applying power to each of the probe blocks when the plurality of probe blocks are mounted on the probe unit;
The probe block is
a plurality of probe pins;
a body supporting the plurality of probe pins;
a connection terminal for applying the power to the plurality of probe pins by electrical connection with the power applying unit;
a circuit pattern portion for electrically connecting the plurality of probe pins and the connection terminal;
A probe block assembly for testing a display panel as claimed in claim 1, comprising: The connection terminals are
formed in the same number as or less than the number of power supply terminals to which power is applied by the power supply unit;
The circuit pattern part is
When the number of the plurality of probe pins is less than the number of the power supply terminals, only part of the power applied to the power supply terminals is applied to the plurality of probe pins, A probe block assembly for testing a display panel as claimed in claim 6. The probe unit is
At least one of the plurality of probe blocks mounted at the predetermined position is replaced without replacement, and the display panel and other display panels to be inspected are inspected for defects. The probe block assembly for inspecting a display panel as claimed in claim 1, characterized in that:

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