JP2022520150A5 - - Google Patents

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Publication number
JP2022520150A5
JP2022520150A5 JP2021533424A JP2021533424A JP2022520150A5 JP 2022520150 A5 JP2022520150 A5 JP 2022520150A5 JP 2021533424 A JP2021533424 A JP 2021533424A JP 2021533424 A JP2021533424 A JP 2021533424A JP 2022520150 A5 JP2022520150 A5 JP 2022520150A5
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JP
Japan
Application number
JP2021533424A
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Japanese (ja)
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JP7354253B2 (ja
JPWO2020123471A5 (https=
JP2022520150A (ja
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Priority claimed from US16/590,515 external-priority patent/US11119909B2/en
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Publication of JP2022520150A publication Critical patent/JP2022520150A/ja
Publication of JPWO2020123471A5 publication Critical patent/JPWO2020123471A5/ja
Publication of JP2022520150A5 publication Critical patent/JP2022520150A5/ja
Priority to JP2023153988A priority Critical patent/JP7754612B2/ja
Application granted granted Critical
Publication of JP7354253B2 publication Critical patent/JP7354253B2/ja
Active legal-status Critical Current
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JP2021533424A 2018-12-11 2019-12-10 インラインecc保護のための方法及びシステム Active JP7354253B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023153988A JP7754612B2 (ja) 2018-12-11 2023-09-20 インラインecc保護のための方法及びシステム

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201862777993P 2018-12-11 2018-12-11
US62/777,993 2018-12-11
US16/590,515 US11119909B2 (en) 2018-12-11 2019-10-02 Method and system for in-line ECC protection
US16/590,515 2019-10-02
PCT/US2019/065416 WO2020123471A1 (en) 2018-12-11 2019-12-10 Method and system for in-line ecc protection

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2023153988A Division JP7754612B2 (ja) 2018-12-11 2023-09-20 インラインecc保護のための方法及びシステム

Publications (4)

Publication Number Publication Date
JP2022520150A JP2022520150A (ja) 2022-03-29
JPWO2020123471A5 JPWO2020123471A5 (https=) 2022-12-09
JP2022520150A5 true JP2022520150A5 (https=) 2022-12-09
JP7354253B2 JP7354253B2 (ja) 2023-10-02

Family

ID=70972067

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Application Number Title Priority Date Filing Date
JP2021533424A Active JP7354253B2 (ja) 2018-12-11 2019-12-10 インラインecc保護のための方法及びシステム
JP2023153988A Active JP7754612B2 (ja) 2018-12-11 2023-09-20 インラインecc保護のための方法及びシステム

Family Applications After (1)

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JP2023153988A Active JP7754612B2 (ja) 2018-12-11 2023-09-20 インラインecc保護のための方法及びシステム

Country Status (5)

Country Link
US (4) US11119909B2 (https=)
EP (1) EP3895017B1 (https=)
JP (2) JP7354253B2 (https=)
CN (2) CN119127562A (https=)
WO (1) WO2020123471A1 (https=)

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US11119909B2 (en) * 2018-12-11 2021-09-14 Texas Instmments Incorporated Method and system for in-line ECC protection
US11416334B2 (en) * 2019-05-24 2022-08-16 Texas Instmments Incorporated Handling non-correctable errors
US12175363B2 (en) 2020-07-27 2024-12-24 Microchip Technology Inc. Regression neural network for identifying threshold voltages to be used in reads of flash memory devices
US11385961B2 (en) * 2020-08-14 2022-07-12 Micron Technology, Inc. Adaptive parity techniques for a memory device
US12393846B2 (en) 2020-08-20 2025-08-19 Microchip Technology Inc. Partitionable neural network for solid state drives
US12493778B2 (en) 2020-12-15 2025-12-09 Microchip Technology Inc. Method and apparatus for performing a neural network operation
US12014068B2 (en) 2021-04-27 2024-06-18 Microchip Technology Inc. System and method for double data rate (DDR) chip-kill recovery
US11561857B2 (en) * 2021-05-11 2023-01-24 Robert Bosch Gmbh Method for the secured storing of a data element to be stored by a computer program in an external memory
US11934696B2 (en) 2021-05-18 2024-03-19 Microchip Technology Inc. Machine learning assisted quality of service (QoS) for solid state drives
US11699493B2 (en) 2021-05-24 2023-07-11 Microchip Technology Inc. Method and apparatus for performing a read of a flash memory using predicted retention-and-read-disturb-compensated threshold voltage shift offset values
US11663076B2 (en) 2021-06-01 2023-05-30 Microchip Technology Inc. Memory address protection
DE112022002131B4 (de) 2021-09-28 2026-02-05 Microchip Technology Inc. Ldpc-dekodierung mit trapped-block-management
US12124328B2 (en) * 2022-04-26 2024-10-22 Nxp Usa, Inc. Data processing system having a memory controller with inline error correction code (ECC) support
TWI823519B (zh) * 2022-08-15 2023-11-21 慧榮科技股份有限公司 資料儲存裝置以及非揮發式記憶體控制方法

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IT1261411B (it) * 1993-03-12 1996-05-23 Texas Instruments Italia Spa Metodo e circuiteria per l'uso di memorie aventi locazioni difettose erelativa apparecchiatura di produzione.
US6804799B2 (en) 2001-06-26 2004-10-12 Advanced Micro Devices, Inc. Using type bits to track storage of ECC and predecode bits in a level two cache
US7043679B1 (en) 2002-06-27 2006-05-09 Advanced Micro Devices, Inc. Piggybacking of ECC corrections behind loads
TWI277869B (en) * 2005-08-23 2007-04-01 Via Tech Inc Architecture and method for storing data
US7676730B2 (en) * 2005-09-30 2010-03-09 Quantum Corporation Method and apparatus for implementing error correction coding in a random access memory
JP2007104708A (ja) 2006-11-27 2007-04-19 Renesas Technology Corp データ処理方法
US8135935B2 (en) * 2007-03-20 2012-03-13 Advanced Micro Devices, Inc. ECC implementation in non-ECC components
JP2009104757A (ja) 2007-10-02 2009-05-14 Panasonic Corp 半導体記憶装置
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JP5617776B2 (ja) 2011-06-27 2014-11-05 株式会社デンソー メモリ回路,メモリ装置及びメモリデータの誤り訂正方法
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US11119909B2 (en) * 2018-12-11 2021-09-14 Texas Instmments Incorporated Method and system for in-line ECC protection

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