JP2022500843A - 量子アプリケーションのための、インピーダンスを制御し、クロストークの低減または軽減あるいはその両方を行った、プリント回路基板から誘電体層へのトランジション - Google Patents
量子アプリケーションのための、インピーダンスを制御し、クロストークの低減または軽減あるいはその両方を行った、プリント回路基板から誘電体層へのトランジション Download PDFInfo
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- 230000007704 transition Effects 0.000 title abstract description 24
- 230000009467 reduction Effects 0.000 title abstract description 12
- 230000005540 biological transmission Effects 0.000 claims abstract description 80
- 239000000758 substrate Substances 0.000 claims abstract description 64
- 238000000034 method Methods 0.000 claims description 45
- 239000010410 layer Substances 0.000 description 29
- 238000003860 storage Methods 0.000 description 27
- 230000006870 function Effects 0.000 description 16
- 238000010586 diagram Methods 0.000 description 15
- 230000008901 benefit Effects 0.000 description 14
- 238000012545 processing Methods 0.000 description 14
- 238000013461 design Methods 0.000 description 13
- 239000000463 material Substances 0.000 description 12
- 239000010949 copper Substances 0.000 description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- 230000009471 action Effects 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- 238000004891 communication Methods 0.000 description 9
- 238000004088 simulation Methods 0.000 description 9
- 239000002887 superconductor Substances 0.000 description 9
- 238000004590 computer program Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 6
- 239000002096 quantum dot Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000000116 mitigating effect Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 241001424392 Lucia limbaria Species 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 230000001276 controlling effect Effects 0.000 description 3
- 239000000835 fiber Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000006399 behavior Effects 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 2
- 230000001976 improved effect Effects 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000005055 memory storage Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000001902 propagating effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 210000002615 epidermis Anatomy 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000009545 invasion Effects 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000010587 phase diagram Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 208000024891 symptom Diseases 0.000 description 1
- 239000002470 thermal conductor Substances 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0213—Electrical arrangements not otherwise provided for
- H05K1/0237—High frequency adaptations
- H05K1/0243—Printed circuits associated with mounted high frequency components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
- H05K1/184—Components including terminals inserted in holes through the printed circuit board and connected to printed contacts on the walls of the holes or at the edges thereof or protruding over or into the holes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N10/00—Quantum computing, i.e. information processing based on quantum-mechanical phenomena
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0213—Electrical arrangements not otherwise provided for
- H05K1/0237—High frequency adaptations
- H05K1/025—Impedance arrangements, e.g. impedance matching, reduction of parasitic impedance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/10—Junction-based devices
- H10N60/12—Josephson-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/80—Constructional details
- H10N60/805—Constructional details for Josephson-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N69/00—Integrated devices, or assemblies of multiple devices, comprising at least one superconducting element covered by group H10N60/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
- H05K1/183—Components mounted in and supported by recessed areas of the printed circuit board
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09372—Pads and lands
- H05K2201/09481—Via in pad; Pad over filled via
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10371—Shields or metal cases
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/20—Details of printed circuits not provided for in H05K2201/01 - H05K2201/10
- H05K2201/2036—Permanent spacer or stand-off in a printed circuit or printed circuit assembly
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/04—Soldering or other types of metallurgic bonding
- H05K2203/049—Wire bonding
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- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
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Abstract
Description
Claims (16)
- 量子デバイスであって、
誘電体基板上のマイクロ波量子回路と、
伝送回線を備えるビアを備えるプリント回路基板と
を備え、前記プリント回路基板の前記伝送回線と前記マイクロ波量子回路の伝送回線との間のワイヤボンドが、前記プリント回路基板に前記マイクロ波量子回路を動作可能なように連結し、前記ビアが、定義した特性インピーダンスを備える、
量子デバイス。 - 前記ワイヤボンドの長さが、前記ビアの第1の位置、および前記誘電体基板の第2の位置に基づく、請求項1に記載の量子デバイス。
- 前記誘電体基板が、前記プリント回路基板の上に形成される、請求項1に記載の量子デバイス。
- 前記誘電体基板が、前記プリント回路基板の内側に少なくとも部分的に形成される、請求項1に記載の量子デバイス。
- 前記プリント回路基板および前記誘電体基板を支えるカバー
をさらに備える、請求項1に記載の量子デバイス。 - 前記プリント回路基板および前記誘電体基板の上にカバーをさらに備える、請求項1に記載の量子デバイス。
- 前記ワイヤボンドと別のワイヤボンドの間の遮蔽壁をさらに備える、請求項1に記載の量子デバイス。
- 前記プリント回路基板が、前記ビアと別のビアの間のクロストークを低減させるグランド・ビアを備える、請求項1に記載の量子デバイス。
- 量子計算デバイスである、請求項1に記載の量子デバイス。
- 方法であって、
プリント回路基板内のビアを伝送回線で満たすことであって、前記ビアが、定義した特性インピーダンスを備える、前記満たすことと、
誘電体基板上のマイクロ波量子回路に前記プリント回路基板を、前記プリント回路基板の前記伝送回線と前記マイクロ波量子回路の伝送回線との間のワイヤボンドを介して、動作可能なように連結することと
を含む、方法。 - 前記マイクロ波量子回路に前記プリント回路基板を動作可能なように前記連結することが、前記プリント回路基板および前記マイクロ波量子回路に、ある長さの前記ワイヤボンドを取り付けることを含み、前記長さが、前記ビアの第1の位置、および前記マイクロ波量子回路の第2の位置に応じて決定される、請求項10に記載の方法。
- 前記プリント回路基板の上に前記誘電体基板を形成すること
をさらに含む、請求項10に記載の方法。 - 前記プリント回路基板の内側に少なくとも部分的に前記誘電体基板を形成すること
をさらに含む、請求項10に記載の方法。 - 前記プリント回路基板および前記誘電体基板をカバーの上に置くことであって、前記カバーが、前記プリント回路基板および前記誘電体基板を支える、前記置くことをさらに含む、請求項10に記載の方法。
- 前記ワイヤボンドと別のワイヤボンドの間に遮蔽壁を形成すること
をさらに含む、請求項10に記載の方法。 - 前記ワイヤボンドが、前記ビアから前記誘電体基板にマイクロ波信号を搬送するように構成される、請求項10に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/136,855 | 2018-09-20 | ||
US16/136,855 US11102879B2 (en) | 2018-09-20 | 2018-09-20 | Printed circuit board to dielectric layer transition with controlled impedance and reduced and/or mitigated crosstalk for quantum applications |
PCT/EP2019/074333 WO2020058073A1 (en) | 2018-09-20 | 2019-09-12 | Printed circuit board to dielectric layer transition with controlled impedance and reduced and/or mitigated crosstalk for quantum applications |
Publications (1)
Publication Number | Publication Date |
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JP2022500843A true JP2022500843A (ja) | 2022-01-04 |
Family
ID=67988975
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JP2021510662A Pending JP2022500843A (ja) | 2018-09-20 | 2019-09-12 | 量子アプリケーションのための、インピーダンスを制御し、クロストークの低減または軽減あるいはその両方を行った、プリント回路基板から誘電体層へのトランジション |
Country Status (4)
Country | Link |
---|---|
US (1) | US11102879B2 (ja) |
JP (1) | JP2022500843A (ja) |
CN (1) | CN112740838A (ja) |
WO (1) | WO2020058073A1 (ja) |
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WO2020103147A1 (zh) * | 2018-11-23 | 2020-05-28 | 北京比特大陆科技有限公司 | 芯片散热结构、芯片结构、电路板和超算设备 |
US11676903B2 (en) * | 2020-08-20 | 2023-06-13 | International Business Machines Corporation | Combined backing plate and housing for use in bump bonded chip assembly |
EP4113591A1 (en) * | 2021-07-02 | 2023-01-04 | Qdevil ApS | Holder and mounting method for quantum device |
CN114325007B (zh) * | 2022-01-06 | 2023-03-17 | 北京东方计量测试研究所 | 四端对交流电阻计量样品的非对称屏蔽结构 |
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- 2018-09-20 US US16/136,855 patent/US11102879B2/en active Active
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2019
- 2019-09-12 WO PCT/EP2019/074333 patent/WO2020058073A1/en active Application Filing
- 2019-09-12 CN CN201980061775.0A patent/CN112740838A/zh active Pending
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US20200100357A1 (en) | 2020-03-26 |
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