JP2020531825A5 - - Google Patents
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- JP2020531825A5 JP2020531825A5 JP2020510552A JP2020510552A JP2020531825A5 JP 2020531825 A5 JP2020531825 A5 JP 2020531825A5 JP 2020510552 A JP2020510552 A JP 2020510552A JP 2020510552 A JP2020510552 A JP 2020510552A JP 2020531825 A5 JP2020531825 A5 JP 2020531825A5
- Authority
- JP
- Japan
- Prior art keywords
- ray
- optical
- signal
- detector
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP17187475.3 | 2017-08-23 | ||
| EP17187475.3A EP3447538A1 (en) | 2017-08-23 | 2017-08-23 | X-ray detection |
| PCT/EP2018/071847 WO2019038113A1 (en) | 2017-08-23 | 2018-08-13 | X-RAY DETECTION OF A FRICTION OF X-RAY INCIDENCE FRAGMENTS IN PHASE CONTRAST X-RAY IMAGING AND / OR SUD BLACK BACKGROUND |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020531825A JP2020531825A (ja) | 2020-11-05 |
| JP2020531825A5 true JP2020531825A5 (OSRAM) | 2021-09-24 |
| JP7221938B2 JP7221938B2 (ja) | 2023-02-14 |
Family
ID=59702559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020510552A Active JP7221938B2 (ja) | 2017-08-23 | 2018-08-13 | 位相コントラスト及び／又は暗視野ｘ線イメージングにおけるｘ線入射干渉縞パターンのｘ線検出 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10539688B2 (OSRAM) |
| EP (2) | EP3447538A1 (OSRAM) |
| JP (1) | JP7221938B2 (OSRAM) |
| CN (1) | CN109863424B (OSRAM) |
| RU (1) | RU2721153C1 (OSRAM) |
| WO (1) | WO2019038113A1 (OSRAM) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| WO2019220410A1 (en) * | 2018-05-17 | 2019-11-21 | Institut National De La Recherche Scientifique (Inrs) | Method and system for sampling and denoising amplification of a signal |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| CN112638261B (zh) | 2018-09-04 | 2025-06-27 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| EP3754382B1 (en) * | 2019-06-17 | 2023-10-25 | Detection Technology Oyj | Radiation detector and method for manufacturing thereof |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US12379331B2 (en) | 2019-09-06 | 2025-08-05 | The Board Of Trustees Of The Leland Stanford Junior University | Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography |
| US20210088682A1 (en) * | 2019-09-23 | 2021-03-25 | Sino Canada Health Engineering Research Institute (Hefei) Ltd. | Readout Board Muxing for PET Systems |
| EP3799787A1 (en) * | 2019-10-01 | 2021-04-07 | Koninklijke Philips N.V. | Detector for a dark-field; phase-contrast and attenuation interferometric imaging system |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
| US11389124B2 (en) * | 2020-02-12 | 2022-07-19 | General Electric Company | X-ray phase contrast detector |
| US20230333215A1 (en) * | 2020-04-14 | 2023-10-19 | Technion Research & Development Foundation Ltd. | Device and method for generating image and distance information |
| US11215572B2 (en) | 2020-05-18 | 2022-01-04 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
| KR20230078684A (ko) * | 2020-09-03 | 2023-06-02 | 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 | 결정체-채널 결합을 위한 시스템 및 방법 |
| US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| WO2022126071A1 (en) | 2020-12-07 | 2022-06-16 | Sigray, Inc. | High throughput 3d x-ray imaging system using a transmission x-ray source |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| JP7403517B2 (ja) * | 2021-10-13 | 2023-12-22 | 日本電子株式会社 | 放射線検出装置および試料分析装置 |
| CN114325805A (zh) * | 2021-12-14 | 2022-04-12 | 无锡通透光电科技有限公司 | 辐射成像探测器及其通道压缩电路、通道压缩方法 |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11860319B2 (en) * | 2022-03-10 | 2024-01-02 | GE Precision Healthcare LLC | High-resolution detector having a reduced number of pixels |
| DE112023001408T5 (de) | 2022-03-15 | 2025-02-13 | Sigray, Inc. | System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung |
| JP2025515085A (ja) | 2022-05-02 | 2025-05-13 | シグレイ、インコーポレイテッド | Ｘ線シーケンシャルアレイ波長分散型分光計 |
| WO2024124159A1 (en) * | 2022-12-08 | 2024-06-13 | Schlumberger Technology Corporation | Downhole tools that include a radiation detector and processes for using same |
| US20240272313A1 (en) * | 2023-02-15 | 2024-08-15 | Innocare Optoelectronics Corporation | Electronic device |
| CN121013975A (zh) | 2023-02-16 | 2025-11-25 | 斯格瑞公司 | 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统 |
| CN116879326B (zh) * | 2023-09-07 | 2023-12-19 | 浙江大学杭州国际科创中心 | 基于多频条纹的x射线光学相衬成像系统及方法 |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| WO2025101530A1 (en) | 2023-11-07 | 2025-05-15 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
| CN118799868B (zh) * | 2024-06-17 | 2025-03-11 | 沈阳工业大学 | 一种光栅莫尔条纹智能细分方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102006037281A1 (de) * | 2006-02-01 | 2007-08-09 | Siemens Ag | Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt |
| DE102006017291B4 (de) * | 2006-02-01 | 2017-05-24 | Paul Scherer Institut | Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren |
| DE102006037256B4 (de) * | 2006-02-01 | 2017-03-30 | Paul Scherer Institut | Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System |
| JP5702586B2 (ja) * | 2010-02-04 | 2015-04-15 | 富士フイルム株式会社 | 放射線撮影システム |
| JP5844545B2 (ja) * | 2010-05-31 | 2016-01-20 | 富士フイルム株式会社 | 放射線撮影装置 |
| JP5796908B2 (ja) * | 2010-10-29 | 2015-10-21 | 富士フイルム株式会社 | 放射線位相画像撮影装置 |
| JP2012150144A (ja) * | 2011-01-17 | 2012-08-09 | Fujifilm Corp | 放射線画像撮影用グリッド、放射線画像検出器、放射線画像撮影システム及び放射線画像撮影用グリッドの製造方法。 |
| CN103460301B (zh) * | 2011-02-01 | 2017-08-11 | 皇家飞利浦电子股份有限公司 | 具有聚焦偏转结构板的微分相位对比成像 |
| WO2013004574A1 (en) | 2011-07-04 | 2013-01-10 | Koninklijke Philips Electronics N.V | Phase contrast imaging apparatus |
| DE102011082878A1 (de) * | 2011-09-16 | 2013-03-21 | Siemens Aktiengesellschaft | Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung |
| DE102012217286A1 (de) | 2012-09-25 | 2014-03-27 | Siemens Aktiengesellschaft | Strahlungsdetektor |
| DE102012224258A1 (de) | 2012-12-21 | 2014-06-26 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren |
| CN104869905B (zh) * | 2012-12-21 | 2019-08-06 | 卡尔斯特里姆保健公司 | 基于微分相衬成像的医疗放射照相光栅 |
| US9357975B2 (en) * | 2013-12-30 | 2016-06-07 | Carestream Health, Inc. | Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques |
| JP6529984B2 (ja) * | 2014-05-01 | 2019-06-12 | シグレイ、インコーポレイテッド | Ｘ線干渉イメージングシステム |
| EP3143384B1 (en) * | 2014-05-15 | 2020-03-04 | Sigray Inc. | X-ray system and method for measurement, characterization, and analysis of periodic structures |
| JP6581713B2 (ja) * | 2015-07-21 | 2019-09-25 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 位相コントラスト及び／又は暗視野撮像のためのｘ線検出器、該ｘ線検出器を有する干渉計、ｘ線撮像システム、位相コントラストｘ線撮像及び／又は暗視野ｘ線撮像を行う方法、コンピュータプログラム、コンピュータ読取可能な媒体 |
| CN106404809A (zh) * | 2016-07-27 | 2017-02-15 | 中国科学技术大学 | 一种用于x射线光栅相衬成像装置的图像校正方法 |
-
2017
- 2017-08-23 EP EP17187475.3A patent/EP3447538A1/en not_active Withdrawn
-
2018
- 2018-08-03 US US16/335,819 patent/US10539688B2/en not_active Expired - Fee Related
- 2018-08-13 RU RU2019111467A patent/RU2721153C1/ru active
- 2018-08-13 WO PCT/EP2018/071847 patent/WO2019038113A1/en not_active Ceased
- 2018-08-13 CN CN201880003957.8A patent/CN109863424B/zh not_active Expired - Fee Related
- 2018-08-13 EP EP18750229.9A patent/EP3494415B1/en active Active
- 2018-08-13 JP JP2020510552A patent/JP7221938B2/ja active Active
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