JP2020521138A - プローブ装置 - Google Patents
プローブ装置 Download PDFInfo
- Publication number
- JP2020521138A JP2020521138A JP2019564521A JP2019564521A JP2020521138A JP 2020521138 A JP2020521138 A JP 2020521138A JP 2019564521 A JP2019564521 A JP 2019564521A JP 2019564521 A JP2019564521 A JP 2019564521A JP 2020521138 A JP2020521138 A JP 2020521138A
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- Japan
- Prior art keywords
- electromagnetic radiation
- layer
- transition
- probe
- transmission cavity
- Prior art date
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- 239000000523 sample Substances 0.000 title claims abstract description 63
- 230000005540 biological transmission Effects 0.000 claims abstract description 68
- 230000005670 electromagnetic radiation Effects 0.000 claims abstract description 55
- 230000007704 transition Effects 0.000 claims abstract description 52
- 230000008878 coupling Effects 0.000 claims description 10
- 238000010168 coupling process Methods 0.000 claims description 10
- 238000005859 coupling reaction Methods 0.000 claims description 10
- 230000003071 parasitic effect Effects 0.000 claims description 7
- 230000003993 interaction Effects 0.000 claims description 4
- 230000008859 change Effects 0.000 claims description 2
- 238000013461 design Methods 0.000 claims description 2
- 239000004020 conductor Substances 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 230000004888 barrier function Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000033228 biological regulation Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/01—Arrangements for measuring electric power or power factor in circuits having distributed constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/24—Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/06—Arrangements for measuring electric power or power factor by measuring current and voltage
- G01R21/07—Arrangements for measuring electric power or power factor by measuring current and voltage in circuits having distributed constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/10—Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance
- G01R21/12—Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance in circuits having distributed constants
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
- H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced lines or devices with unbalanced lines or devices
- H01P5/107—Hollow-waveguide/strip-line transitions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/12—Coupling devices having more than two ports
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Waveguide Aerials (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
1.エネルギーの僅かな部分が導波路から捕らえられ、それを、例えばダイオードで測定してもよく、すなわち電力計量器モードである。
2.エネルギーの僅かな部分が導波路から捕らえられ、それを、何らかの用途における信号処理のために使用してもよく、すなわち信号処理モードである。
3.マイクロストライプラインが、例えば、調整可能な受動回路を搭載し、導波路の内側の信号に影響を与えてもよく、すなわち移相器モードである。
Claims (10)
- ミリメートル又はサブミリメートル無線周波数帯域のプローブ装置であって、前記プローブ装置(100)は、層状構造(102)を有し、
前記プローブ装置の反対側の表面において最外層(110、116)を有する遷移層(104、106)であって、前記最外層の少なくとも1つは外側導波路(112、132)に接続可能である、遷移層(104、106)と、
前記プローブ装置(100)内に電磁放射を誘導するために、前記遷移層(104、106)を通って延伸する内部伝送空洞(114)と、
前記遷移層(104、106)間に配置されたプローブ層(108)であって、前記内部伝送空洞(114)によって誘導される前記電磁放射と相互作用するために、横方向伝送線(118)を有するプローブ層(108)と
を備える、プローブ装置。 - 前記プローブ層(108)の前記横方向伝送線(118)は、前記内部伝送空洞(114)からの前記電磁放射の少なくとも一部の出力、及び/又は前記電磁放射の特性の変化を生じさせるために前記内部伝送空洞(114)への信号入力を可能にするように構成されている、請求項1に記載の装置。
- 前記プローブ装置は、前記横方向伝送線(118)と接続し、前記電磁放射の電力を測定するように構成された電力計量器(200)を備える、請求項2に記載の装置。
- 前記横方向方伝送線(118)は、前記伝送線(118)で受信された前記電磁放射の前記少なくとも一部の出力を、DC信号に整流するように構成された整流構成要素(120)に接続され、前記電力計量器(200)は、前記DC信号を測定するように構成されている、請求項3に記載の装置。
- 前記最外層の第1の外層(110)は、前記電磁放射を前記内部伝送空洞(114)に搬送するために、外側導波路のうちの第1の外側導波路(112)と動作可能に接続可能である第1の遷移要素(124)を備え、前記最外層の第2の外層(116)は、前記内部伝送空洞(114)からの前記電磁放射の更なる搬送のために、前記内部伝送空洞(114)を通って誘導される前記電磁放射と相互作用するように構成された第2の遷移要素(126)を備える、請求項1〜4の何れか一項に記載の装置。
- 前記層状構造(102)は、前記最外層の前記第1及び第2の外層(110、116)に関連付けられたコネクタ(128、130)を備え、前記コネクタのうちの第1のコネクタ(128)は、前記外側導波路のうちの前記第1の外側導波路(112)と、前記電磁放射を前記第1の外側導波路(112)から前記内部伝送空洞(114)に搬送するために接続可能であり、前記コネクタのうちの第2のコネクタ(130)は、終端端子又は前記外側導波路のうちの第2の外側導波路(132)と、前記電磁放射を前記内部伝送空洞(114)から受信するために接続可能である、請求項5に記載の装置。
- 前記第2の遷移要素(126)は、前記第2の外側導波路又は前記終端端子(132)と、前記電磁放射をそれらのうちの何れかにそれぞれ供給するために動作可能に接続可能である、請求項6に記載の装置。
- 前記プローブ層(108)の両側において、前記内部伝送空洞(114)は、前記電磁放射のための結合孔(134)を有する、請求項1に記載の装置。
- 前記横方向伝送線(118)と前記プローブ層(108)内の前記電磁放射との間の相互作用の程度は、前記結合孔(134)の設計で調整可能であるように構成されている、請求項8に記載の装置。
- 前記内部伝送空洞(114)は、前記層状構造(102)を通る前記電磁放射の遷移帯域幅を増加させるために、前記遷移層(104、106)に関連付けられた少なくとも2つの寄生遷移要素(136)を備える、請求項1に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20175463 | 2017-05-23 | ||
FI20175463A FI127973B (en) | 2017-05-23 | 2017-05-23 | The detector device |
PCT/FI2018/050385 WO2018215694A1 (en) | 2017-05-23 | 2018-05-22 | Probe apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020521138A true JP2020521138A (ja) | 2020-07-16 |
JP7169303B2 JP7169303B2 (ja) | 2022-11-10 |
Family
ID=62620903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019564521A Active JP7169303B2 (ja) | 2017-05-23 | 2018-05-22 | プローブ装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US11486900B2 (ja) |
EP (1) | EP3631474B1 (ja) |
JP (1) | JP7169303B2 (ja) |
CN (1) | CN110945367B (ja) |
FI (1) | FI127973B (ja) |
WO (1) | WO2018215694A1 (ja) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08101236A (ja) * | 1994-09-30 | 1996-04-16 | Anritsu Corp | ハイパーパワーセンサ |
JP2013167600A (ja) * | 2012-02-17 | 2013-08-29 | Nippon Telegr & Teleph Corp <Ntt> | 電力検出器付導波管 |
WO2016094129A1 (en) * | 2014-12-03 | 2016-06-16 | Nuvotronics, Inc. | Systems and methods for manufacturing stacked circuits and transmission lines |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
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DE3669593D1 (de) | 1985-05-28 | 1990-04-19 | Marconi Instruments Ltd | Leistungssensor. |
US5204614A (en) * | 1991-08-14 | 1993-04-20 | Hewlett-Packard Company | Broad-band microwave power sensor using diodes above their resonant frequency |
US6870438B1 (en) | 1999-11-10 | 2005-03-22 | Kyocera Corporation | Multi-layered wiring board for slot coupling a transmission line to a waveguide |
US6956448B1 (en) * | 2002-12-17 | 2005-10-18 | Itt Manufacturing Enterprises, Inc. | Electromagnetic energy probe with integral impedance matching |
US7705582B2 (en) | 2007-04-16 | 2010-04-27 | Anritsu Company | Broadband micro-machined thermal power sensor |
US8390403B1 (en) | 2009-01-26 | 2013-03-05 | Hrl Laboratories, Llc | Wideband ridged waveguide to diode detector transition |
US9958485B2 (en) | 2011-05-18 | 2018-05-01 | Qualcomm Incorporated | On-chip millimeter-wave power detection circuit |
CN103280619B (zh) * | 2013-04-28 | 2015-02-25 | 电子科技大学 | 一种用于高功率测量的毫米波小孔耦合器 |
KR20160099589A (ko) * | 2013-12-17 | 2016-08-22 | 키사, 아이엔씨. | 자동 검사 장비(ate)에서 테스트하는 동안 무선 칩들에 의해 전송되는 근접 전자기 방사를 캡쳐하기 위한 도파관 |
EP3026441A1 (en) * | 2014-11-27 | 2016-06-01 | Nxp B.V. | Apparatus for measuring RF power and associated methods |
CN104579176A (zh) * | 2015-01-07 | 2015-04-29 | 电子科技大学 | 基于共面波导传输线的分谐波混频器 |
JP2016178571A (ja) | 2015-03-23 | 2016-10-06 | 日本無線株式会社 | 導波管/伝送線路変換器 |
-
2017
- 2017-05-23 FI FI20175463A patent/FI127973B/en active IP Right Grant
-
2018
- 2018-05-22 WO PCT/FI2018/050385 patent/WO2018215694A1/en active Application Filing
- 2018-05-22 EP EP18731503.1A patent/EP3631474B1/en active Active
- 2018-05-22 JP JP2019564521A patent/JP7169303B2/ja active Active
- 2018-05-22 US US16/615,239 patent/US11486900B2/en active Active
- 2018-05-22 CN CN201880048395.9A patent/CN110945367B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08101236A (ja) * | 1994-09-30 | 1996-04-16 | Anritsu Corp | ハイパーパワーセンサ |
JP2013167600A (ja) * | 2012-02-17 | 2013-08-29 | Nippon Telegr & Teleph Corp <Ntt> | 電力検出器付導波管 |
WO2016094129A1 (en) * | 2014-12-03 | 2016-06-16 | Nuvotronics, Inc. | Systems and methods for manufacturing stacked circuits and transmission lines |
Also Published As
Publication number | Publication date |
---|---|
CN110945367B (zh) | 2022-11-29 |
WO2018215694A1 (en) | 2018-11-29 |
CN110945367A (zh) | 2020-03-31 |
US20200158757A1 (en) | 2020-05-21 |
EP3631474C0 (en) | 2023-06-07 |
WO2018215694A8 (en) | 2018-12-20 |
FI20175463A1 (en) | 2018-11-24 |
US11486900B2 (en) | 2022-11-01 |
FI20175463A (fi) | 2018-11-24 |
JP7169303B2 (ja) | 2022-11-10 |
EP3631474B1 (en) | 2023-06-07 |
EP3631474A1 (en) | 2020-04-08 |
FI127973B (en) | 2019-06-28 |
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