JP2020518990A5 - - Google Patents
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- Publication number
- JP2020518990A5 JP2020518990A5 JP2019560662A JP2019560662A JP2020518990A5 JP 2020518990 A5 JP2020518990 A5 JP 2020518990A5 JP 2019560662 A JP2019560662 A JP 2019560662A JP 2019560662 A JP2019560662 A JP 2019560662A JP 2020518990 A5 JP2020518990 A5 JP 2020518990A5
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- limiting aperture
- lens array
- source
- holes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022015515A JP7329637B2 (ja) | 2017-05-05 | 2022-02-03 | 電子ビームシステム及び方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/587,720 | 2017-05-05 | ||
| US15/587,720 US10242839B2 (en) | 2017-05-05 | 2017-05-05 | Reduced Coulomb interactions in a multi-beam column |
| PCT/US2018/013425 WO2018203936A1 (en) | 2017-05-05 | 2018-01-12 | Reduced coulomb interactions in a multi-beam column |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022015515A Division JP7329637B2 (ja) | 2017-05-05 | 2022-02-03 | 電子ビームシステム及び方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2020518990A JP2020518990A (ja) | 2020-06-25 |
| JP2020518990A5 true JP2020518990A5 (https=) | 2021-02-18 |
Family
ID=64014281
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019560662A Pending JP2020518990A (ja) | 2017-05-05 | 2018-01-12 | マルチビームカラムにおけるクーロン相互作用の低減 |
| JP2022015515A Active JP7329637B2 (ja) | 2017-05-05 | 2022-02-03 | 電子ビームシステム及び方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022015515A Active JP7329637B2 (ja) | 2017-05-05 | 2022-02-03 | 電子ビームシステム及び方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10242839B2 (https=) |
| EP (1) | EP3549154A4 (https=) |
| JP (2) | JP2020518990A (https=) |
| KR (1) | KR102352097B1 (https=) |
| CN (1) | CN110313048B (https=) |
| IL (1) | IL267815B (https=) |
| WO (1) | WO2018203936A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11615938B2 (en) * | 2019-12-20 | 2023-03-28 | Nuflare Technology, Inc. | High-resolution multiple beam source |
| KR102830218B1 (ko) | 2020-01-06 | 2025-07-08 | 에이에스엠엘 네델란즈 비.브이. | 하전 입자 평가 툴, 검사 방법 |
| US12451319B2 (en) | 2020-10-05 | 2025-10-21 | Kla Corporation | Electron source with magnetic suppressor electrode |
| US11699564B2 (en) * | 2020-10-23 | 2023-07-11 | Nuflare Technology, Inc. | Schottky thermal field emitter with integrated beam splitter |
| US11869743B2 (en) * | 2021-05-11 | 2024-01-09 | Kla Corporation | High throughput multi-electron beam system |
| US11651934B2 (en) | 2021-09-30 | 2023-05-16 | Kla Corporation | Systems and methods of creating multiple electron beams |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4419182A (en) * | 1981-02-27 | 1983-12-06 | Veeco Instruments Inc. | Method of fabricating screen lens array plates |
| JP4647820B2 (ja) * | 2001-04-23 | 2011-03-09 | キヤノン株式会社 | 荷電粒子線描画装置、および、デバイスの製造方法 |
| JP2003077814A (ja) * | 2001-09-05 | 2003-03-14 | Nikon Corp | 荷電粒子線露光装置の結像性能の計測方法及びその計測装置、荷電粒子線露光装置 |
| US6768125B2 (en) * | 2002-01-17 | 2004-07-27 | Ims Nanofabrication, Gmbh | Maskless particle-beam system for exposing a pattern on a substrate |
| CN101414534B (zh) | 2002-10-30 | 2012-10-03 | 迈普尔平版印刷Ip有限公司 | 电子束曝光系统 |
| JP4459568B2 (ja) * | 2003-08-06 | 2010-04-28 | キヤノン株式会社 | マルチ荷電ビームレンズおよびそれを用いた荷電ビーム露光装置 |
| GB2408143B (en) * | 2003-10-20 | 2006-11-15 | Ims Nanofabrication Gmbh | Charged-particle multi-beam exposure apparatus |
| US7176459B2 (en) | 2003-12-25 | 2007-02-13 | Ebara Corporation | Electron beam apparatus |
| KR101099487B1 (ko) * | 2004-05-17 | 2011-12-28 | 마퍼 리쏘그라피 아이피 비.브이. | 대전 입자 빔 노광 시스템 |
| JP5663717B2 (ja) * | 2005-09-06 | 2015-02-04 | カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh | 荷電粒子システム |
| KR101464388B1 (ko) * | 2006-07-25 | 2014-11-21 | 마퍼 리쏘그라피 아이피 비.브이. | 다중 빔 대전 입자 광학 시스템 |
| US8134135B2 (en) * | 2006-07-25 | 2012-03-13 | Mapper Lithography Ip B.V. | Multiple beam charged particle optical system |
| KR101118692B1 (ko) * | 2006-10-11 | 2012-03-12 | 전자빔기술센터 주식회사 | 자기 렌즈층을 포함한 전자 칼럼 |
| JP5103033B2 (ja) * | 2007-03-02 | 2012-12-19 | 株式会社日立ハイテクノロジーズ | 荷電粒子線応用装置 |
| US7821187B1 (en) * | 2007-09-07 | 2010-10-26 | Kla-Tencor Corporation | Immersion gun equipped electron beam column |
| US7960697B2 (en) | 2008-10-23 | 2011-06-14 | Hermes-Microvision, Inc. | Electron beam apparatus |
| JP2011059057A (ja) * | 2009-09-14 | 2011-03-24 | Fujitsu Ltd | 電子スピン分析器及び表面観察装置 |
| US8294125B2 (en) * | 2009-11-18 | 2012-10-23 | Kla-Tencor Corporation | High-sensitivity and high-throughput electron beam inspection column enabled by adjustable beam-limiting aperture |
| US9184024B2 (en) | 2010-02-05 | 2015-11-10 | Hermes-Microvision, Inc. | Selectable coulomb aperture in E-beam system |
| TWI593961B (zh) * | 2010-12-15 | 2017-08-01 | 日立全球先端科技股份有限公司 | Charged particle line application device, and irradiation method |
| US8362425B2 (en) | 2011-03-23 | 2013-01-29 | Kla-Tencor Corporation | Multiple-beam system for high-speed electron-beam inspection |
| KR20120128105A (ko) * | 2011-05-16 | 2012-11-26 | 캐논 가부시끼가이샤 | 묘화 장치 및 물품의 제조 방법 |
| US8618480B2 (en) * | 2012-03-23 | 2013-12-31 | Hermes Microvision Inc. | Charged particle beam apparatus |
| EP2879155B1 (en) * | 2013-12-02 | 2018-04-25 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Multi-beam system for high throughput EBI |
| JP2016197503A (ja) * | 2015-04-02 | 2016-11-24 | 株式会社ニューフレアテクノロジー | 電子ビーム装置 |
| US9607805B2 (en) * | 2015-05-12 | 2017-03-28 | Hermes Microvision Inc. | Apparatus of plural charged-particle beams |
| US9922799B2 (en) * | 2015-07-21 | 2018-03-20 | Hermes Microvision, Inc. | Apparatus of plural charged-particle beams |
| KR20240042242A (ko) | 2015-07-22 | 2024-04-01 | 에이에스엠엘 네델란즈 비.브이. | 복수의 하전 입자 빔을 이용하는 장치 |
-
2017
- 2017-05-05 US US15/587,720 patent/US10242839B2/en active Active
-
2018
- 2018-01-12 JP JP2019560662A patent/JP2020518990A/ja active Pending
- 2018-01-12 KR KR1020197036059A patent/KR102352097B1/ko active Active
- 2018-01-12 EP EP18793779.2A patent/EP3549154A4/en active Pending
- 2018-01-12 CN CN201880009523.9A patent/CN110313048B/zh active Active
- 2018-01-12 WO PCT/US2018/013425 patent/WO2018203936A1/en not_active Ceased
- 2018-01-12 IL IL267815A patent/IL267815B/en unknown
-
2022
- 2022-02-03 JP JP2022015515A patent/JP7329637B2/ja active Active
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