JP2020145363A - レーザアニール装置 - Google Patents
レーザアニール装置 Download PDFInfo
- Publication number
- JP2020145363A JP2020145363A JP2019042257A JP2019042257A JP2020145363A JP 2020145363 A JP2020145363 A JP 2020145363A JP 2019042257 A JP2019042257 A JP 2019042257A JP 2019042257 A JP2019042257 A JP 2019042257A JP 2020145363 A JP2020145363 A JP 2020145363A
- Authority
- JP
- Japan
- Prior art keywords
- laser beam
- laser
- substrate
- thin film
- predetermined region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims abstract description 68
- 239000010409 thin film Substances 0.000 claims abstract description 41
- 238000005224 laser annealing Methods 0.000 claims description 44
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 28
- 238000000034 method Methods 0.000 claims description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 10
- 229910052710 silicon Inorganic materials 0.000 claims description 10
- 239000010703 silicon Substances 0.000 claims description 10
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 230000010355 oscillation Effects 0.000 abstract description 9
- 238000009826 distribution Methods 0.000 abstract description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 11
- 238000000137 annealing Methods 0.000 description 8
- 239000010408 film Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 238000002407 reforming Methods 0.000 description 4
- 238000011144 upstream manufacturing Methods 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000007493 shaping process Methods 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- High Energy & Nuclear Physics (AREA)
- Manufacturing & Machinery (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Ceramic Engineering (AREA)
- Recrystallisation Techniques (AREA)
- Thin Film Transistor (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019042257A JP2020145363A (ja) | 2019-03-08 | 2019-03-08 | レーザアニール装置 |
PCT/JP2020/007185 WO2020184153A1 (fr) | 2019-03-08 | 2020-02-21 | Dispositif de recuit laser |
TW109106672A TW202037440A (zh) | 2019-03-08 | 2020-03-02 | 雷射退火裝置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019042257A JP2020145363A (ja) | 2019-03-08 | 2019-03-08 | レーザアニール装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2020145363A true JP2020145363A (ja) | 2020-09-10 |
Family
ID=72354550
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019042257A Pending JP2020145363A (ja) | 2019-03-08 | 2019-03-08 | レーザアニール装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2020145363A (fr) |
TW (1) | TW202037440A (fr) |
WO (1) | WO2020184153A1 (fr) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003151904A (ja) * | 2001-11-14 | 2003-05-23 | Fujitsu Ltd | 半導体薄膜の結晶化方法、半導体薄膜、及び、薄膜半導体装置 |
JP4092414B2 (ja) * | 2004-11-29 | 2008-05-28 | 住友重機械工業株式会社 | レーザアニール方法 |
JP7051806B2 (ja) * | 2017-03-01 | 2022-04-11 | 株式会社半導体エネルギー研究所 | 認証システム及び通信システム |
-
2019
- 2019-03-08 JP JP2019042257A patent/JP2020145363A/ja active Pending
-
2020
- 2020-02-21 WO PCT/JP2020/007185 patent/WO2020184153A1/fr active Application Filing
- 2020-03-02 TW TW109106672A patent/TW202037440A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2020184153A1 (fr) | 2020-09-17 |
TW202037440A (zh) | 2020-10-16 |
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