JP2020043482A - Pattern generation device, pattern generation method, error rate measurement device, and error rate measurement method - Google Patents

Abstract

To display only a pattern corresponding to a standard group or a standard name in a pattern list.SOLUTION: In generating multi-level modulated signals of four or more values using patterns corresponding to various transmission standards, a pattern selection screen 15a for selecting and setting a pattern of the multi-level modulation signal from a pattern list is displayed, and, when at least one of the standard organization and the standard name is selected on the pattern selection screen 15a, only the corresponding pattern is controlled to be displayed in the pattern list.SELECTED DRAWING: Figure 2

Description

  The present invention relates to a pattern generation device, a pattern generation method, an error rate measurement device, and an error rate measurement method for generating a multilevel modulated signal of four or more values of a desired pattern defined by a standard organization or a standard name in various transmission standards. .

  In standards such as 100G and 400G defined by the IEEE, transmission using a PAM4 signal, instead of the conventional transmission using a PAM2 (NRZ) signal, is specified in order to respond to an extremely high bit rate.

  For example, as shown in Patent Document 1 below, a PAM4 signal is generated by generating a most significant bit string signal MSB and a least significant bit string signal LSB using two signal sources and then adding these signals to obtain a value of 0 (00). , 1 (01), 2 (10), and 3 (11).

  By the way, when the above-mentioned PAM4 signal is generated, for example, in the pattern selection screen as shown in FIG. 6, a pattern corresponding to the standard is selected from a pattern list displayed in a pull-down menu under the item of “pattern”. Settings were being made. FIG. 6 shows a state in which “PRBS13Q” corresponding to IEEE802.3bs indicated by oblique lines is selected and set from a pattern list.

JP 2018-033098 A

  However, the above-mentioned ultra-high-speed standards include, for example, IEEE 100g / 200G / 400G, OIF-CEI-4.0, InfiniBand HDR, and 64GFiber Channel. In particular, in the PAM4 signal, there are various patterns to be used depending on various standards, and there are many similar standard names. Therefore, it is difficult to determine which standard the pattern belongs to only by looking at the pattern name.

  And today, the number of standards using this kind of PAM4 signal has increased, and 100 Gbit Ethernet (registered trademark) is not the only exception, and various patterns according to various standards have been proposed. It became difficult to determine the linking of the patterns just by looking at the names of the patterns.

  As a result, it is difficult to easily select a pattern corresponding to a standard organization or a standard from a pattern list as shown in FIG. 6, and a pattern that does not correspond to a standard organization or a standard may be erroneously selected and set from the pattern list. was there.

  Therefore, the present invention has been made in view of the above problems, and provides a pattern generating apparatus and a pattern generating method capable of displaying only a pattern corresponding to a standard organization or a standard name in a pattern list. It is an object of the present invention to provide an error rate measurement device and an error rate measurement method capable of measuring a bit error rate by using a pattern multi-level modulation signal generated by a pattern generation method.

In order to achieve the above object, a pattern generating device according to claim 1 of the present invention is a pattern generating device 2 that generates a multi-level modulated signal of four or more values by a pattern corresponding to various transmission standards,
Display means 15 for displaying a pattern selection screen 15a for selecting and setting the pattern of the multi-level modulation signal from a pattern list;
When at least one of a standard organization and a standard name is selected on the pattern selection screen, the control means 14 controls the display of only the corresponding pattern in the pattern list.

The pattern generator according to claim 2 is the pattern generator according to claim 1,
The control means 14 controls display of a brief description of a pattern selected and set from the pattern list.

A pattern generation method according to claim 3, which is a pattern generation method for generating a multilevel modulated signal having four or more values by a pattern corresponding to various transmission standards,
Displaying a pattern selection screen 15a for selecting and setting a pattern of the multi-level modulation signal from a pattern list;
A step of, when at least one of a standard organization and a standard name is selected on the pattern selection screen, displaying only the corresponding pattern in the pattern list.

According to a fourth aspect of the present invention, in the pattern generation method of the third aspect,
The method includes a step of controlling display of a brief description of a pattern selected and set from the pattern list.

An error rate measurement device according to claim 5 is a pattern generation device 2 according to claim 1 or 2,
An error detection device for measuring a bit error rate by receiving a signal from the device under test in accordance with the input of the multi-level modulation signal generated by the pattern generating device to the device under test W .

An error rate measuring method according to claim 6 is a step of inputting a multi-level modulation signal generated by the pattern generating method according to claim 3 or 4 to a device under test W;
Receiving a signal from the device under test in response to the input of the multi-level modulation signal to the device under test and measuring an error rate.

  According to the present invention, only the pattern corresponding to the item of the specified standard organization or standard name can be displayed in the pattern list and easily selected and set. There is no danger of selecting and setting from a list, and it is possible to generate a multi-level modulation signal in a pattern corresponding to a desired standard organization or standard name. Then, it is possible to measure the bit error rate by using a multilevel modulation signal based on a pattern corresponding to a desired standard organization or standard name.

1 is a block diagram illustrating a schematic configuration of an error rate measurement device including a pattern generation device according to the present invention. It is a figure showing an example of a pattern selection screen when a pattern of a PAM4 signal is selected and set. It is a figure which shows another example of the pattern selection screen at the time of selecting and setting the pattern of a PAM4 signal. It is a figure showing the example of a display of the outline explanation of the pattern of the PAM4 signal selected and set. 9 is a flowchart illustrating a flow of a method for setting a pattern of a PAM4 signal. It is a figure showing an example of the display screen of the conventional pattern selection setting.

  Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the accompanying drawings.

  The present invention relates to a pattern generating apparatus and a pattern generating method for generating a multilevel modulated signal of four or more values based on a known pattern input to a device under test (DUT) as a test signal, and a test signal for the signal under test The present invention relates to an error rate measuring device and an error rate measuring method for receiving a signal from a device under test in response to an input of a signal and measuring a bit error rate (BER).

  Hereinafter, in the present embodiment, a case will be described as an example in which a PAM4 signal is generated as a multilevel modulated signal having four or more values to measure the bit error rate.

  As shown in FIG. 1, an error rate measuring device 1 according to the present embodiment is schematically configured to include a pattern generating device 2 on a transmitting side and an error detecting device 3 on a receiving side. A PAM4 signal having a desired pattern specified by the pattern generator 2 is generated by the pattern generator 2, and the generated PAM4 signal is transmitted to the device under test W as a test signal. A signal from the device under test W accompanying the transmission of the test signal And measures the bit error rate.

  When generating a PAM4 signal of a desired pattern defined by a standard organization, a standard name, or the like, the pattern generator 2 selects and sets a pattern of the PAM4 signal on a pattern selection screen 15a shown in FIGS. 2 and 3. It has a filter function of hiding patterns that do not correspond to the specified standard organization or standard name.

  As shown in FIG. 1, the pattern generation device 2 includes a setting unit 11, a signal generation unit 12, a storage unit 13, a control unit 14, and a display unit 15 to realize the filter function.

  The setting unit 11 functions as a user interface for performing “standards group”, “standard name”, and “pattern” on the display screen of the display unit 15 in order to select and set a PAM4 signal pattern corresponding to the standard. More specifically, as shown in FIGS. 2 and 3, three items 21, 22, and 23 of “standard organization”, “standard name”, and “pattern” are displayed on the pattern selection screen 15 a of the display unit 15. Then, when item 21 of “standards organization” is selected, a list of standard organizations is displayed below this item 21 in a pull-down menu. When an item 22 of “standard name” is selected, a list of standard names is displayed below this item 22 in a pull-down menu. Then, after selecting a desired standard organization or standard name from the list of "standard organizations" or "standard names", selecting item 23 of "pattern" corresponds to "standard organization" or "standard name". Only the selected pattern is displayed as a pattern list under the item “pattern” 23 as a pull-down menu, and a desired pattern is selected and set from the pull-down menu.

  More specifically, when the standard organization: IEEE, the standard name: IEEE802.3bs, and the pattern: PRBS13Q are selected and set, as shown in FIG. Select “IEEE” and select “IEEE802.3bs / cd” from the list of standard names displayed in the pull-down menu below the item of “standard name”. Only the patterns corresponding to “standard group” and “standard name” Is set by selecting “PRBS13Q” from the pattern list displayed in the pull-down menu below the item of “pattern”.

  In FIG. 3, “Infiniband” is selected from “Standards organization”, and only the pattern corresponding to “Standards organization” is “PRBS13Q (Infiniband)” from the pattern list displayed on the pull-down menu under the item “Pattern”. This shows a state in which the selection is set.

  The signal generating means 12 generates a PAM4 signal according to a pattern based on the standard organization or standard name selected and set by the setting means 11.

  The storage unit 13 stores setting information for generating a PAM4 signal of a desired pattern, information necessary for performing various measurements such as a bit error rate, and the like. In addition, the storage unit 13 stores information that associates each pattern with a standard organization and a standard name for a plurality of types of PAM4 signals that can be generated by the pattern generation device 2.

  The control unit 14 performs overall control of each unit when performing various measurements including generation of a PAM4 signal having a desired pattern and a bit error rate specified by a standard organization or a standard name in various transmission standards.

  The control means 14 includes a display control means 14a for controlling the display of the display means 15. The display control means 14a displays a pattern selection screen 15a on the display screen of the display means 15 when selecting and setting the pattern of the PAM4 signal generated by the signal generation means 12.

  The display control means 14a displays a brief description of the pattern selected and set on the pattern selection screen 15a on a display screen (pattern selection screen 15a) in a desired language.

  Further, the display control unit 14 a displays a setting screen and a measurement screen relating to various measurements on the display screen of the display unit 15 in addition to the above-described display control.

  The display means 15 is composed of, for example, a display such as a liquid crystal provided in the apparatus main body, and is controlled by the display control means 14a, for example, a pattern selection screen 15a as shown in FIGS. Is displayed on the display screen (pattern selection screen 15a) in a desired language (in the illustrated example, English) according to the user and the usage environment.

  The display unit 15 is controlled by the display control unit 14a, in addition to the above-described display, various setting screens, a compliance test (a test of whether or not the device under test W conforms to a standard), and a bit error rate measurement screen. And so on.

  When the PAM4 signal is transmitted from the pattern generator 2 to the device under test W as a test signal of a known pattern, the error detection device 3 receives the signal from the device under test W accompanying the transmission of the PAM4 signal. Measure the bit error rate.

  Next, a method of setting the pattern of the PAM4 signal generated by the pattern generator 1 will be described with reference to FIG.

  When setting the pattern of the PAM4 signal, a pattern selection screen 15a shown in FIGS. 2 and 3 is displayed on the display screen of the display means 15 under the control of the display control means 14a (ST1).

  Next, the control means 14 determines whether or not at least one of "standard organization" and "standard name" is specified on the pattern selection screen 15a (ST2). The specification of the “standards group” and “standard name” is performed by the setting unit 11 accompanied by the operation of the user. Specifically, on the pattern selection screen 15a, an item 21 of "standard organization" is selected, and a desired standard organization is selected from a list of standard organizations displayed in a pull-down menu below this item 21, or " An item 22 of "standard name" is selected, and a desired standard name is selected from a list of standard names displayed in a pull-down menu below the item 22 to perform the operation. For example, as shown in FIG. 2, “IEEE” is selected from the item 21 of “standards organization”, and “IEEE802.3bs / cd” is selected from the item 22 of “standards name”.

  If it is determined that at least one of “standards group” and “standard name” is specified (ST2-Yes), the specified “standards” is displayed in the pattern list displayed in the pull-down menu below the item “pattern” 23. Patterns that do not correspond to "group" or "standard name" are hidden (ST3). That is, only the pattern corresponding to the designated “standards group” or “standard name” is displayed as a pattern list in the “pattern” item 23 as a pattern list. Then, a desired pattern is selected and set from a list of non-displayed patterns that do not correspond to the specified "standards group" or "standard name" (ST4).

  On the other hand, if it is determined that there is no designation of “standard organization” or “standard name” on the pattern selection screen 15a (ST2-No), all selectable patterns are displayed as shown in FIG. A pull-down menu is displayed as a pattern list in the item 23 of "pattern", and a desired pattern is selected and set from the pattern list (ST4).

  Then, when a desired pattern is selected and set on the pattern selection screen 15a, a summary description (Summary) of the selected and set pattern, that is, a description of a desired language indicating the outline of the pattern is displayed on the display screen of the display unit 15 ( It is displayed on the pattern selection screen 15a). For example, when “PRBS13Q” is selected and set as a desired pattern, as shown in FIG. 4, a description of “PRBS13Q” in a desired language (for example, English) is displayed on the pattern selection screen 15a as a brief description of the pattern.

  When the pattern is set by the above-described method, the putter generation device 2 generates a PAM4 signal in a pattern corresponding to a desired standard organization or standard name. When the PAM4 signal is input from the pattern generator 2 to the device under test W as a test signal of a known pattern, the error detection device 3 receives the signal from the device under test W accompanying the input of the PAM4 signal, and Measure the error rate. The measurement result is displayed on the display screen of the display unit 15 under the control of the display control unit 14a.

  Next, a specific example in the case where a desired pattern is selected and set from the pattern list on the pattern selection screen 15a will be described.

[Specific example 1]
When “PRBS13Q” is selected and set as a desired pattern, as shown in FIG. 2, “Standard organization” is selected from a list of standard organizations displayed in a pull-down menu under item 21 of “Standard organization” on the pattern selection screen 15a, as shown in FIG. In addition to selecting and specifying “IEEE”, “IEEE802.3bs / cd” is selected and specified from a list of standard names displayed in a pull-down menu below the item 22 of “standard name”. As a result, in the pattern list displayed in the pull-down menu below the item "pattern", patterns that do not correspond to the standard group "IEEE" and the standard name "IEEE802.3bs / cd" are not displayed. As a result, only “PRBS13Q”, “PRBS31Q”, “SSPRQ”, and “Square Wave” are displayed in the pattern list of the item “pattern” 23. And set the pattern.

  Note that even if different standard names are used in the same pattern, such as “IEEE802.3bs” and “IEEE802.3cd”, the standard names are integrated.

[Example 2]
When "PRBS13Q (Infiniband)" is selected and set as a desired pattern, as shown in FIG. 3, a list of standard organizations displayed in a pull-down menu below the item 21 of "standard organizations" on the pattern selection screen 15a. Select and specify "Infiniband" from the list. In Infiniband, since there is only one standard corresponding to PAM4, there is no need to specify a standard name, so the item 22 of “standard name” is not displayed. As a result, in the pattern list displayed in the pull-down menu below the item 23 of “pattern”, the pattern not corresponding to the standard group “Infiniband” is not displayed. As a result, only “PRBS13Q (Infiniband)”, “PRBS23Q”, and “PRBS31Q (Infiniband)” are displayed as a pattern list under the item 23 of “Pattern”. (Infiniband) "and set the pattern.

  As described above, according to the present embodiment, when a standard organization or standard name is specified on the pattern selection screen 15a, a pattern that does not correspond to the specified standard organization or standard name is hidden by the filter function, Only the pattern corresponding to the specified "standard organization" or "standard name" is displayed in the pattern list, so select the pattern corresponding to the desired standard organization or standard name while narrowing down the selection items. A multi-level modulation signal can be generated. Then, it is possible to measure the bit error rate by using a multilevel modulation signal based on a pattern corresponding to a desired standard organization or standard name.

  Also, according to the filter function described above, even when a new standard organization, standard name and pattern items are added, the visibility of the existing filtered pattern group is not affected and the standard organization and standard name are not affected. , Pattern items can be added. If necessary, not only the standard organization and the standard name, but also a filter of a small item can be added to narrow down selectable patterns, which is excellent in expandability. Furthermore, it is possible to greatly reduce the possibility of performing a test with an incorrect pattern selected.

  Further, when a pattern corresponding to a desired standard organization or standard name is selected and set on the pattern selection screen 15a, a description in a desired language indicating an outline of the selected and set pattern is displayed. It is possible to recognize which part refers to the pattern and what kind of pattern it refers to.

  As described above, the best mode of the pattern generating apparatus, the pattern generating method, the error rate measuring apparatus, and the error rate measuring method according to the present invention have been described, but the present invention is not limited by the description and the drawings according to this mode. That is, other forms, examples, operation techniques, and the like made by those skilled in the art based on this form are all included in the scope of the present invention.

REFERENCE SIGNS LIST 1 error rate measurement device 2 pattern generation device 3 error detection device 11 setting means 12 signal generation means 13 storage means 14 control means 14a display control means 15 display means 15a pattern selection screen 21 items of standard group 22 items of standard name 23 patterns Item W DUT

In order to achieve the above object, a pattern generating device according to claim 1 of the present invention is a pattern generating device 2 that generates a multi-level modulated signal of four or more values by a pattern corresponding to various transmission standards,
Display means 15 for displaying a pattern selection screen 15a for selecting and setting the pattern of the multi-level modulation signal from a pattern list;
On the pattern selection screen, when at least one of a standard organization and a standard name is selected, only the corresponding pattern is displayed and controlled in the pattern list, and an outline of the pattern selected and set from the pattern list is displayed. Control means 14 for controlling the display of the explanation .

A pattern generating method according to claim 2 , which is a pattern generating method for generating a multilevel modulated signal having four or more values by a pattern corresponding to various transmission standards,
Displaying a pattern selection screen 15a for selecting and setting a pattern of the multi-level modulation signal from a pattern list;
On the pattern selection screen, when at least one of a standard organization and a standard name is selected, a step of controlling display of only the corresponding pattern in the pattern list ,
Controlling display of a brief description of a pattern selected and set from the pattern list .

An error rate measuring device according to a third aspect includes a pattern generating device 2 according to the first aspect,
An error detection device for measuring a bit error rate by receiving a signal from the device under test in accordance with the input of the multi-level modulation signal generated by the pattern generating device to the device under test W .

An error rate measuring method according to a fourth aspect includes a step of inputting a multi-level modulation signal generated by the pattern generating method according to the second aspect to the device under test W
Receiving a signal from the device under test in response to the input of the multi-level modulation signal to the device under test and measuring an error rate.

Claims (6)

A pattern generator (2) for generating a multilevel modulated signal of four or more values according to a pattern corresponding to various transmission standards,
Display means (15) for displaying a pattern selection screen (15a) for selecting and setting the pattern of the multi-level modulation signal from a pattern list;
When at least one of a standard organization and a standard name is selected on the pattern selection screen, a control means (14) for controlling display of only the corresponding pattern in the pattern list is provided. Generator. 2. The pattern generator according to claim 1, wherein the control means (14) controls display of a brief description of a pattern selected and set from the pattern list. A pattern generating method for generating a multi-level modulated signal of four or more values by a pattern corresponding to various transmission standards,
Displaying a pattern selection screen (15a) for selecting and setting a pattern of the multi-level modulation signal from a pattern list;
A step of, when at least one of a standard organization and a standard name is selected on the pattern selection screen, displaying only the corresponding pattern in the pattern list. 4. The pattern generation method according to claim 3, further comprising a step of controlling display of a brief description of a pattern selected and set from the pattern list. A pattern generator (2) according to claim 1 or claim 2,
An error detection device (3) for measuring a bit error rate by receiving a signal from the device under test when the multi-level modulation signal generated by the pattern generator is input to the device under test (W) An error rate measurement device characterized by the above-mentioned. Inputting the multi-level modulation signal generated by the pattern generation method according to claim 3 or 4 to a device under test (W);
Receiving a signal from the device under test accompanying the input of the multi-level modulation signal to the device under test and measuring an error rate.

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