JP7046993B2 - Error rate measurement system and error rate measurement method - Google Patents

Description

The present invention relates to an error rate measuring system and an error rate measuring method for scrambling a pattern converted by a serial data encoding method at the time of measuring an object to be measured.

Conventionally, when a desired digital communication device is used as an object to be measured and the bit error rate in the object to be measured is measured, for example, the error rate measuring device disclosed in Patent Document 1 below is used. In this type of error rate measuring device, in order to measure how much the measured object can tolerate electrical stress, an electrical stress signal of a known pattern is applied to the measured object as a test signal from a pattern generator. This test signal is looped back inside or outside the object to be measured and received, and by comparing the received signal with the test signal, the jitter tolerance is measured to measure the presence or absence of an error with respect to the applied amount of the test signal. ..

Here, when measuring the error rate of the measured object described above, the pattern transmitted to the measured object and the reference pattern for comparison with the signal received by the loopback from the measured object are mainly used. It was common to select either a binary number or a hexadecimal number and set the input. Specifically, when a binary number was selected, it was input with 0 or 1, and when a hexadecimal number was selected, it was input with 0 to F for setting.

Japanese Unexamined Patent Publication No. 2007-274474

However, if you want to transmit a pattern converted by 8b10b, 128b130b, 128b132b encoding, which is a serial data encoding method used in serial communication standards such as PCIe and USB, a dedicated pattern editing screen is required.

When the same data is repeatedly transmitted, the energy component is concentrated on a specific frequency, which is a disadvantage in terms of EMI (Electro Magnetic Interference). Further, when the pattern is biased to 0 or 1, there is a problem that the DC component becomes large and it becomes difficult for the object to be measured to receive the pattern.

By the way, in PCIe and USB, it is stipulated by the specifications that a part of the pattern is scrambled. However, in the case of the conventional error rate measuring device, for example, in 128b130b, only the setting that the entire 128-bit block is scrambled or not scrambled can be set. In addition, of one block, only a part of the section specified by the standard was scrambled. That is, conventionally, the scramble target range has been limited.

Further, in the above-mentioned error rate measuring device, there is a request to verify an abnormal system and to measure with various patterns according to a user's own protocol, and it is desired that the user can flexibly and arbitrarily set the scramble target range. Was there.

Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide an error rate measuring system and an error rate measuring method capable of flexibly and arbitrarily setting a scramble target range.

In order to achieve the above object, the error rate measuring system according to claim 1 of the present invention is an error rate measuring system 1 that scrambles a pattern converted by a serial data encoding method when measuring an object W to be measured.
A pattern setting screen 12 for setting the pattern, a display unit 6 for displaying a check box 13 of the Scramble Enable on the pattern setting screen, and a display unit 6.
The determination means 7a for determining whether or not the check box of the ScrambleEnable is checked, and the determination means 7a.
When the determination means determines that the check box of the scramble enable is checked, the mode is switched to the mode for selecting the target to be scrambled, and the bit range to be scrambled is selected and specified on the pattern setting screen. Operation unit 4 to be scrambled
A display control means 7b for identifying and displaying the bit range set by the operation unit as the scramble target range H on the pattern setting screen is provided.
It is characterized in that it is possible to switch 0/1 of the bit selected on the pattern setting screen when the determination means determines that the check box of the Scramble Enable is not checked .

The error rate measuring system according to claim 2 of the present invention is the error rate measuring system according to claim 1.
The display control means is characterized in that a pattern of predetermined bits defined by a standard is set as one block, and the pattern is divided into blocks and displayed on the pattern setting screen .

The error rate measuring method according to claim 3 of the present invention is a method for measuring an error rate in which a pattern converted by a serial data encoding method is scrambled when measuring an object W to be measured.
A step of displaying the pattern setting screen 12 for setting the pattern and the check box 13 of the Scramble Enable on the pattern setting screen, and
A step of determining whether or not the check box of the ScrambleEnable is checked, and a step of determining whether or not the check box is checked.
A step of switching to a mode for selecting a target to be scrambled when it is determined that the check box of the Scramble Enable is checked, and selecting and specifying a bit range to be scrambled on the pattern setting screen, and setting the scrambled bit range .
A step of identifying and displaying the set bit range as the scramble target range H on the pattern setting screen, and
It is characterized by including a step of enabling 0/1 switching of a bit selected on the pattern setting screen when it is determined that the check box of the Scramble Enable is not checked .

The error rate measuring method according to claim 4 of the present invention is the error rate measuring method according to claim 1.
The pattern of predetermined bits defined by the standard is set as one block, and the pattern is divided into blocks and displayed on the pattern setting screen .

According to the present invention, the user can flexibly and arbitrarily set the scramble target range. This makes it possible to verify anomalous systems and perform measurements in various patterns according to the user's own protocol.

It is a block diagram which shows the schematic structure of the error rate measurement system which concerns on this invention. It is a figure which shows an example of the pattern setting screen only for 128b130b, 128b132b encoding. It is a flowchart of the pattern setting method which generates the pattern signal which scrambled the desired bit range in the error rate measurement system which concerns on this invention.

Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the attached drawings.

As shown in FIG. 1, in the error rate measuring system 1 of the present embodiment, for example, pulse amplitude modulation (PAM: Pulse-Amplitude Modulation) of a known pattern in a state where the object W to be measured is transitioned to the signal pattern folding state. The object W to be measured is transmitted using the multi-valued signal according to the above as a test signal, and the bit error rate of the input data received by returning from the object W to be measured with the transmission of this test signal is measured.

The error rate measurement system 1 has a function of scrambling a pattern converted by a serial data encoding method (8b10b, 128b130b, 128b132b encoding) when measuring an object W to be measured, and has a function of scrambling the pattern, the pattern generator 2, the error detector 3, and the like. It includes an operation unit 4, a storage unit 5, a display unit 6, and a control unit 7. In the present embodiment, the operation unit 4, the storage unit 5, the display unit 6, and the control unit 7 also have the functions of the pattern setting device.

The pattern generator 2 is a multi-valued signal (for example, 0, 1, 2, 3) composed of known data of a desired symbol string as a pattern signal to be input to the measured unit W or a reference pattern signal to be input to the error detector 3. (PAM4 signal by a sequence of symbols consisting of symbol values of) is generated as a pattern signal. Further, the pattern generator 2 has, for example, FIG. 2 with respect to a multi-valued signal (for example, a PAM4 signal) composed of known data as a pattern signal to be input to the measured unit W or a reference pattern signal to be input to the error detector 3. A pattern signal obtained by scrambling the scramble target range H set on the pattern setting screen 12 is generated. The pattern signal may be an NRZ signal.

When the known pattern signal generated by the pattern generator 2 is input to the measured object W as a test signal, the error detector 3 generates a pattern and a signal from the measured object W accompanying the input of the test signal. The error rate of the object to be measured W is measured by comparison with the reference pattern signal generated by the device 2.

The operation unit 4 includes a mouse 11 used in the pattern setting method described later, and is equipped with, for example, a rotary encoder, various keys, switches, buttons, and a display unit 6 on the display screen of the error rate measurement system 1 of FIG. Includes user interface such as softkeys.

The storage unit 5 is a symbol string of a pattern signal (for example, a string of symbols of a PAM4 signal consisting of symbol values of 0, 1, 2, and 3) and an error detector that are input to the object W as a test signal from the pattern generator 2. The symbol string of the reference pattern signal (for example, the symbol string of the PAM4 signal consisting of the symbol values of 0, 1, 2, and 3) that is input to 3 and compared with the input data from the object W to be measured is stored.

Further, the storage unit 5 includes information on the scramble target range (bit range to be scrambled) H set by the pattern setting method described later, setting timing, baud rate, and symbol string as information necessary for measuring the object W to be measured. Information such as the occurrence condition, waveform image display start condition, and waveform image display stop condition is stored. These pieces of information can be appropriately selected and set by the operation unit 4 via the user interface.

The display unit 6 is composed of, for example, a liquid crystal display provided in the error rate measurement system 1 of FIG. 1, the pattern setting screen 12 of FIG. 2, and each compliance test (whether or not the measured object W conforms to the communication standard). Test) and bit error rate measurement screens are displayed. Further, the display unit 6 also has an operation function of the operation unit 4 such as a cursor key and a soft key on the display screen.

Here, FIG. 2 shows an example of the pattern setting screen 12 dedicated to 128b130b and 128b132b encoding displayed on the display unit 6. The pattern setting screen 12 of FIG. 2 is displayed on the display unit 6 under the control of the control unit 7 when the bit to be scrambled is selected and set when scrambling the pattern signal.

In the pattern setting screen 12 of FIG. 2, a 128-bit pattern defined by a PCIe or USB standard is set as one block, and is displayed by dividing each block. Further, each block is composed of symbols, and one symbol is defined by 8 bits. Further, 16 symbols are connected to form a block. Each block is divided into an Ordered Set Block and a Data Block by the Sync Header of the first 2 bits.

On the right side of the pattern setting screen 12 of FIG. 2, a check box 13 of the Scrambler Enable for switching to a mode for arbitrarily selecting the target to be scrambled by the operation of the operation unit 4 is displayed. For example, by clicking the left button of the mouse 12 of the operation unit 4 to check the check box 13 of the Scrambler Enable, the mode can be switched to a mode in which the target to be scrambled is arbitrarily selected.

When the check box 13 of the Scrambler Enable is not checked, 0/1 of the bit selected on the pattern setting screen 12 can be switched.

The control unit 7 is composed of storage elements such as a central processing unit (CPU), ROM, and RAM, and controls the pattern generator 2, the error detector 3, the operation unit 4, the storage unit 5, and the display unit 6 in an integrated manner. The discriminating means 7a and the display control means 7b are provided.

The determination means 7a determines whether or not the check box 13 of the Scrambler Enable is checked while the pattern setting screen 12 of FIG. 2 is displayed on the display unit 6. When the control unit 7 determines that the check box 13 of the scrambler enable is checked by the discrimination means 7a, the control unit 7 switches to a mode (scramble selection mode) in which the target to be scrambled is arbitrarily selected.

In the scramble selection mode, the determination means 7a selects and designates the bit range to be scrambled (for example, the range surrounded by the diagonal line in FIG. 2) by the operation of the mouse 11 of the operation unit 4 on the pattern setting screen 12 of FIG. Then, the set bit range is determined as the scramble target range H.

The display control means 7b, including the pattern setting screen 12 of FIG. 2, is a display unit for displaying each compliance test (test of whether or not the object W to be measured conforms to the communication standard), a bit error rate measurement screen, and the like. Control the display of 7.

The display control means 7b determines the bit range (for example, the range surrounded by the diagonal line in FIG. 2) set by selecting and designating by operating the mouse 11 of the operation unit 4 as the scramble target range H in the scramble selection mode. When the 7a is determined, the display unit 7 is controlled so that the scramble target range H is identified and displayed in, for example, a semi-transparent red color.

Next, as a pattern setting method using the error rate measurement system 1 configured as described above, a method of generating a pattern signal in which a desired bit range is scrambled will be described with reference to FIG.

First, the pattern setting screen 12 of FIG. 2 is displayed on the display unit 6 under the control of the display control means 7b of the control unit 7 (ST1).

Next, by operating the mouse 11 of the operation unit 4, the check box 13 of the Scrambler Enable on the pattern setting screen 12 of FIG. 2 is checked (ST2). This switches to the scramble selection mode.

Then, in the state of switching to the scramble selection mode, the bit range to be scrambled (for example, the range surrounded by the diagonal line in FIG. 2) is selected and specified on the pattern setting screen 12 of FIG. 2 by operating the mouse 11 of the operation unit 4. And set (ST3).

When the discriminating means 7a of the control unit 7 is set by selecting and designating a bit range to be scrambled by operating the mouse 11 of the operation unit 4, the discriminating means 7a discriminates the set bit range as the scramble target range H and controls the control unit 7. The display control means 7b of 7 identifies and displays the scramble target range H (ST4).

Then, the pattern generator 2 generates a pattern signal obtained by scrambling the scramble target range H set on the pattern setting screen 12 (ST5).

By the way, in the above-described embodiment, as shown in FIG. 1, the error rate measuring system 1 includes a pattern generator 2, an error detector 3, an operation unit 4, a storage unit 5, a display unit 6, and a control unit 7. Although it is configured, it is not limited to this configuration. For example, the pattern generator 2 and the error detector 3 may be modularized or individually housed separately, and the operation unit 4 and the display unit 6 may be configured by an external device such as a personal computer connected to the outside.

Further, in the above-described embodiment, the pattern setting screen 12 dedicated to 128b130b and 128b132b encoding has been described as an example, but even in the case of 8b10b encoding, the bit range to be scrambled is selected and specified by the same configuration / method and scrambled target range. Can be set arbitrarily.

As described above, according to the present embodiment, as shown in FIG. 2, the user can flexibly and arbitrarily set the scramble target range H on the pattern setting screen 12. This makes it possible to verify anomalous systems and perform measurements in various patterns according to the user's own protocol.

Although the best form of the error rate measuring system and the error rate measuring method according to the present invention has been described above, the present invention is not limited by the description and drawings in this form. That is, it goes without saying that all other forms, examples, operational techniques, and the like made by those skilled in the art based on this form are included in the scope of the present invention.

1 Error rate measurement system 2 Pattern generator 3 Error detector 4 Operation unit 5 Storage unit 6 Display unit 7 Control unit 7a Discrimination means 7b Display control means 11 Mouse 12 Pattern setting screen 13 Check box H Scramble target range W Measured object

Claims (4)

In the error rate measurement system (1) that scrambles the pattern converted by the serial data encoding method when measuring the object to be measured (W).
A pattern setting screen (12) for setting the pattern, a display unit (6) for displaying a check box (13) of the Scramble Enable on the pattern setting screen, and a display unit (6).
A discriminating means (7a) for determining whether or not the check box of the ScrambleEnable is checked, and
When the determination means determines that the check box of the scramble enable is checked, the mode is switched to the mode for selecting the target to be scrambled, and the bit range to be scrambled is selected and specified on the pattern setting screen. Operation unit (4) to be scrambled
A display control means (7b) for identifying and displaying the bit range set by the operation unit as a scramble target range (H) on the pattern setting screen is provided.
An error rate measuring system characterized in that when it is determined by the discriminating means that the check box of the Scramble Enable is not checked, 0/1 of the bit selected on the pattern setting screen can be switched . The error rate measuring system according to claim 1 , wherein the display control means has a pattern of predetermined bits defined by a standard as one block, and the pattern is divided into blocks and displayed on the pattern setting screen . In the error rate measurement method of scrambling the pattern converted by the serial data encoding method when measuring the object to be measured (W).
A step of displaying a pattern setting screen (12) for setting the pattern , a check box (13) of the Scramble Enable on the pattern setting screen, and a step of displaying the check box (13) .
A step of determining whether or not the check box of the ScrambleEnable is checked, and a step of determining whether or not the check box is checked.
A step of switching to a mode for selecting a target to be scrambled when it is determined that the check box of the Scramble Enable is checked, and selecting and specifying a bit range to be scrambled on the pattern setting screen, and setting the scrambled bit range .
A step of identifying and displaying the set bit range as a scramble target range (H) on the pattern setting screen.
An error rate measuring method comprising a step of enabling 0/1 switching of a bit selected on the pattern setting screen when it is determined that the check box of the Scramble Enable is not checked . The error rate measuring method according to claim 3 , wherein a pattern of predetermined bits defined by a standard is set as one block, and the pattern is divided into blocks and displayed on the pattern setting screen .

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