JP2020008543A - Inspection device, image reading device, image formation device, inspection method, and program - Google Patents

Abstract

To achieve high-speed processing when inspecting printing quality including flare correction.SOLUTION: An inspection device for inspecting printing quality of a printed matter on the basis of print data by a read image of a printing surface includes: reference image acquisition means for acquiring the read image as an image to be inspected and acquiring an image obtained by ripping the print data as a reference image; calculation means for calculating a flare reverse correction value on the basis of flare generated when forming the image to be inspected from the reference image; corrected reference image acquisition means for performing the flare reverse correction to the reference image on the basis of the flare reverse correction value and acquiring the reference image after correction; and inspection means for inspecting by comparing the corrected reference image with the image to be inspected.SELECTED DRAWING: Figure 5

Description

  The present invention relates to an inspection device, an image reading device, an image forming device, an inspection method, and a program.

  In production printing, there is a request to perform some kind of inspection on the print output of a printer. Therefore, a conventional production printing printer is provided with a print inspection device that reads the print output of the printer with an imaging device such as a camera / scanner and checks whether or not printing is normally performed based on the read result.

  Further, depending on the contents of the abnormal image detected by the print inspection apparatus, it is necessary to perform maintenance and repair of a device such as a printer.

  In a print inspection apparatus, particularly when a print quality inspection is performed, inspection data (captured image) obtained by reading and reference data (master image) assumed to rip, print, and read original image data prepared by a user. ) In many cases. As a result of the comparison, it is determined whether or not the difference between the master image and the read image is a defect based on a certain threshold.

  In a captured image, when a document image is read by a scanner device, a copying machine, or the like, a flare, which is a pseudo signal generated by scattering or reflection of incident light for reading the document, occurs. Since the master image is not affected by flare, when the master image is compared with the read image, a difference occurs due to the influence of flare.

  Patent Literature 1 discloses a technique of inspecting a reference pattern and a comparison pattern by correcting flare for the purpose of inspecting a mask pattern. Patent Document 2 discloses a technique for inspecting a printed matter by controlling a threshold value for each area of a reference image.

  However, according to the related art, there is a problem that it takes a long time to calculate the flare correction amount and must wait for the next process until the calculation of the flare correction amount is completed. There is also a problem that even if the calculation of the flare correction amount is completed early, it is necessary to wait for the inspection (comparison) image to be input.

  The present invention has been made in view of the above, and an object of the present invention is to realize high-speed processing when inspecting print quality including flare correction.

  In order to solve the above-described problems and achieve the object, the present invention is an inspection apparatus that inspects the print quality of a printed matter based on print data using a read image of a print surface, and acquires the read image as an inspection target image. A reference image acquisition unit that acquires an image obtained by ripping the print data as a reference image, and a calculation unit that calculates a flare reverse correction value based on a flare generated when the inspection target image is created from the reference image, A post-correction reference image obtaining means for performing a flare reverse correction on the reference image based on the flare reverse correction value to obtain a corrected reference image, and comparing the corrected reference image with the inspection target image for inspection Inspection means for performing the inspection.

  According to the present invention, there is an effect that the processing can be speeded up in the printing quality inspection including the flare correction.

FIG. 1 is a diagram illustrating a configuration example of the inspection system according to the first embodiment. FIG. 2 is a diagram illustrating an example of a hardware configuration of the inspection device. FIG. 3 is a diagram showing an inspection method of a conventional inspection device. FIG. 4 is a block diagram illustrating a functional configuration of the inspection device. FIG. 5 is a diagram illustrating an inspection method of the inspection device. FIG. 6 is a flowchart showing the flow of the defect inspection processing. FIG. 7 is a block diagram illustrating a functional configuration of the inspection device according to the second embodiment. FIG. 8 is a diagram illustrating an inspection method of the inspection device. FIG. 9 is a flowchart showing the flow of the defect inspection processing. FIG. 10 is a diagram illustrating a modification of the inspection method of the inspection device. FIG. 11 is a block diagram illustrating a functional configuration of the inspection device according to the third embodiment. FIG. 12 is a diagram illustrating an inspection example of the inspection device. FIG. 13 is a diagram illustrating an example of a hardware configuration of the image reading apparatus on which the inspection function operates. FIG. 14 is a diagram illustrating an example of a hardware configuration of the image forming apparatus on which the inspection function operates.

  Hereinafter, embodiments of an inspection device, an image reading device, an image forming device, an inspection method, and a program will be described in detail with reference to the accompanying drawings.

(First Embodiment)
<System configuration>
FIG. 1 is a diagram illustrating a configuration example of an inspection system 1000 according to the first embodiment. FIG. 1 shows a configuration example in which the scanner 140 and the inspection apparatus 100 are connected by a predetermined data transmission path N (for example, a “network cable” or a “serial / parallel cable”) as the inspection system 1000. I have.

  The scanner 140 is an image reading device that optically reads a print surface of a printed material and acquires a read image. On the other hand, the inspection device 100 is an information processing device that inspects the print quality of a printed matter based on a read image of a print surface.

  As a result, the user can use the following service for inspecting the print quality of the printed matter (hereinafter referred to as “inspection service”). For example, a user inputs an image obtained by ripping print data for obtaining a printed material into the inspection apparatus 100 as a reference image for inspecting print quality. Next, the user reads the printed surface of the printed material with the scanner 140.

  As a result, the read image is transmitted from the scanner 140 to the inspection device 100. In the inspection apparatus 100, a difference between pixel values is detected by comparing the received read image with the input reference image, and based on the detected difference between the pixel values and a set inspection threshold (defect determination criterion). Defect determination processing is performed. As a result, the user can obtain a print quality inspection result.

  As described above, the inspection system 1 according to the present embodiment can provide a printed material inspection service with the above system configuration. Note that the inspection system 1000 may have a configuration in which a plurality of scanners 140 are connected to one inspection apparatus 100. Accordingly, when inspecting a large amount of printed matter such as commercial printing, a plurality of printed matters are read in the same manner by the plurality of scanners 140, and the inspection apparatus 100 performs defect determination processing in parallel, thereby efficiently inspecting print quality. Can be implemented.

<Hardware configuration>
Next, a hardware configuration of the inspection device 100 according to the present embodiment will be described.

  FIG. 2 is a diagram illustrating an example of a hardware configuration of the inspection apparatus 100. As shown in FIG. 2, the inspection device 100 includes an input device 101, a display device 102, a drive device 103, a RAM (Random Access Memory) 104, a ROM (Read Only Memory) 105, a CPU (Central Processing Unit) 106, an interface device A hard disk drive (HDD) 107 and the like are provided, and are mutually connected by a bus B.

  The input device 101 includes a keyboard, a mouse, and the like, and is used to input each operation signal to the inspection device 100. The display device 102 includes a display or the like, and displays a processing result by the inspection device 100.

  The interface device 107 is an interface that connects the inspection device 100 to the data transmission path N. Thus, the inspection device 100 can perform data communication with another device having a communication function including the scanner 140 via the interface device 107.

  The HDD 108 is a nonvolatile storage device that stores programs and data. The stored programs and data include an information processing system (for example, an operating system (OS) that is basic software such as “Windows (registered trademark)” and “UNIX (registered trademark)”) that controls the entire inspection apparatus, and a system. There are applications that provide various functions (for example, an “inspection function”) above. The HDD 108 manages stored programs and data by using a predetermined file system and / or a DB (Data Base).

  The drive device 103 is an interface with the removable recording medium 103a. Accordingly, the inspection device 100 can read and / or write the recording medium 103a via the drive device 103. The recording medium 103a includes, for example, a CD (Compact Disk) and a DVD (Digital Versatile Disk), an SD memory card (SD Memory card), a USB memory (Universal Serial Bus memory), and the like.

  The ROM 105 is a nonvolatile semiconductor memory (storage device) that can retain internal data even when the power is turned off. The ROM 105 stores programs and data such as a basic input / output system (BIOS), an information processing system setting, and a network setting that are executed when the inspection apparatus 100 is started. The RAM 104 is a volatile semiconductor memory (storage device) that temporarily stores programs and data. The CPU 106 is an arithmetic unit that reads out a program or data from the storage device (for example, “HDD” or “ROM”) onto a RAM and executes processing to realize control of the entire apparatus and implement functions.

  The program executed by the inspection apparatus 100 according to the present embodiment is a file in an installable format or an executable format in a computer such as a CD-ROM, a flexible disk (FD), a CD-R, and a DVD (Digital Versatile Disk). It is provided by being recorded on a readable recording medium.

  Further, the program executed by the inspection apparatus 100 of the present embodiment may be stored on a computer connected to a network such as the Internet, and provided by being downloaded via the network. Further, the program executed by the inspection apparatus 100 of the present embodiment may be provided or distributed via a network such as the Internet.

  Further, the program executed by the inspection apparatus 100 of the present embodiment may be configured to be provided in a manner incorporated in a ROM or the like in advance.

  As described above, the inspection apparatus 100 according to the present embodiment can provide the inspection service with the hardware configuration.

<Inspection function>
Prior to the description of the inspection function according to the present embodiment, a conventional inspection function will be described.

  FIG. 3 is a diagram showing an inspection method of a conventional inspection device. As shown in FIG. 3, the conventional inspection apparatus acquires a read image a of a print surface (hereinafter, referred to as an “inspection target image”) and an image b obtained by ripping print data (hereinafter, referred to as a “reference image”). The inspection device analyzes flatness representing a change in pixel value in the acquired reference image b. The inspection apparatus determines an image area for each type from the flatness of the analysis result, determines an inspection threshold (defect determination criterion) for the determined image area, and sets it as a threshold image c. The inspection device compares the pixel of the threshold image c corresponding to the determined image area with the pixel of the inspection target image a located at the same position as the determined image area, and detects a difference between the corresponding pixel values. The inspection device determines whether the detected difference exceeds a threshold value, and inspects a defective portion on the printing surface.

  However, according to the conventional inspection function, there is a problem that it takes time to calculate the flare correction amount at the time of creating the inspection target image, and it is necessary to wait for the next processing until the calculation of the flare correction amount is completed. . Another problem is that even if the calculation of the flare correction amount is completed early, it is necessary to wait for the input of the reference image.

  Therefore, in the inspection apparatus 100 according to the present embodiment, the reference image (the image obtained by ripping the print data) is subjected to the flare reverse correction to create the reference image after the flare reverse correction, and the threshold image is generated.

  As a result, the inspection apparatus 100 according to the present embodiment has an effect that the processing can be speeded up when inspecting print quality including flare correction.

  Hereinafter, a configuration and operation of an inspection function realized by the CPU 106 of the inspection apparatus 100 according to the present embodiment operating according to a program will be described.

  FIG. 4 is a block diagram illustrating a functional configuration of the inspection apparatus 100. FIG. 5 is a diagram illustrating an inspection method of the inspection apparatus 100.

  As shown in FIG. 4, the inspection apparatus 100 includes a calculation unit 101, a reference image acquisition unit 102, a corrected reference image acquisition unit 103, and an inspection unit 104.

  The reference image acquiring unit 102 acquires the reference image A by receiving an input of an image obtained by ripping the print data. The reference image acquiring unit 102 acquires the inspection target image B by receiving the read image of the printing surface from the scanner 140.

  The calculating unit 101 calculates a flare reverse correction value based on a flare generated when the inspection target image B is created from the reference image A. That is, the calculating unit 101 calculates a difference between the reference image A and the inspection target image B having the flare as a flare reverse correction value.

  The post-correction reference image obtaining means 103 performs a flare reverse correction on the reference image A based on the flare reverse correction value to obtain a corrected reference image C. That is, the corrected reference image acquisition unit 103 adds the flare reverse correction value to the reference image A to obtain a corrected reference image C.

  The inspection unit 104 compares the corrected threshold image D created from the corrected reference image C with the inspection target image B and performs inspection.

  The inspection unit 104 includes an area determination unit (threshold determination unit) 111, a difference detection unit 112, a determination unit (defect detection unit) 113, and the like. The inspection means 104 can change the threshold value for each area such as a character portion, a picture portion, and a solid portion, or can change the threshold value for an edge or non-edge.

  The region determining unit (threshold determining unit) 111 is a functional unit that determines an image region for each type in the corrected reference image C based on an analysis result (a value representing the calculated flatness) by a known flatness analysis method. is there. As described above, the area determining unit 111 determines the “background area”, the “edge area”, the “picture area”, and the like of the image portion based on the calculated value indicating the flatness.

  In addition, the area determination unit 111 determines an inspection threshold (defect determination criterion) for the determined image area. As described above, in order to improve the inspection accuracy of the image portion, a smooth region having a high flatness (a region where the change in pixel value is small) and a region having a low flatness and a non-smooth region (a region having a large change in pixel value) are required. ) And a defect determination process using a different threshold value. Therefore, the area determination unit 111 determines a plurality of thresholds (for example, set values such as “45”, “30”, “15”, and “4”) that are set in advance in steps, based on the type of the determined image area. By assigning each of the inspection threshold values, a threshold value for inspection (defect determination criterion) used in the defect determination processing is determined. Specifically, an inspection threshold value (defect determination criterion) is determined by the following method.

  For example, when the determined area is the “background area” of the image portion, the change amount (difference) of the pixel value between the target pixel and the adjacent pixel in the image portion is the smallest, and the pixel value change is very small. Must be detected. Therefore, the smallest value (for example, “4”) compared to other areas in the non-image area (“paper white area”) or the image area (“picture area” or “edge area”) is required. (Set value) is determined as the inspection threshold.

  On the other hand, when the determined area is the “edge area” of the image portion, the change amount (difference) of the pixel value between the target pixel and the adjacent pixel in the image portion is the largest, and the pixel value change is slight. Since it is not necessary to detect the threshold value, the largest value (for example, the set value of “45”) is determined as a threshold value for inspection in comparison with other regions (“background region” or “picture region”) of the image portion.

  Further, when the determined area is the “picture area” of the image area, the amount of change (difference) in the pixel value between the target pixel and the adjacent pixel is larger than the “background area” in the image area, and Since it is smaller than the “edge area”, an intermediate value (for example, a set value of “15”) is determined as an inspection threshold value compared to other areas (“background area” or “edge area”) of the image portion. .

  The “paper white area” of the non-image area among the determined areas has the highest flatness. However, in the “paper white area” of the non-image area, dirt on the paper surface corresponds to a defective portion, and considering its characteristics, the amount of change in the pixel value between the pixel of interest (the pixel corresponding to the dirt on the paper surface) and the adjacent pixel ( The difference may be large and a small change in pixel value may be detected. Therefore, in the case of the “paper white area” of the non-image area, an intermediate value (for example, a setting value of “30”) between the set values assigned to the “picture area” and the “edge area” of the image area is inspected. Is determined as the threshold value for

  As described above, the inspection unit 104 sets the inspection threshold (defect determination criterion) for each type of image area (“paper”) according to the flatness representing the change in the pixel value obtained by analyzing the corrected reference image C. White area "," background area "," picture area ", and" edge area ". That is, in the inspection unit 104, the detection sensitivity of the defective portion is switched according to the flatness of the corrected reference image C.

  The difference detection unit 112 is a functional unit that detects a difference in pixel value from a comparison between the corrected reference image C and the inspection target image B received from the reference image acquisition unit 102. The difference detection unit 112 compares the pixel of the corrected reference image C corresponding to the determined image area with the pixel of the inspection target image B located at the same position as the determined image area, and detects the difference of the corresponding pixel value.

  The determination unit (defect detection unit) 113 is a functional unit that executes a defect determination process. The determination unit 113 determines whether or not the difference detected by the difference detection unit 112 exceeds the threshold (the inspection threshold corresponding to the image area for each type) determined by the region determination unit 111, According to the determination result, it is determined whether or not a defective portion exists on the printing surface (the defective portion on the printing surface is inspected). Specifically, it is determined whether or not a defective portion exists on the printing surface by the following method. For example, when it is determined that the detected difference exceeds the threshold value, it is determined that there is an abnormality (defect) in the image area of the inspection target image B.

  As described above, the inspection unit 104 performs a defect determination for each of the determined image areas, and inspects a defective portion on the printing surface.

  As described above, the inspection function according to the present embodiment is realized by the above-described functional units operating in cooperation with each other. In the inspection function according to the present embodiment, a program (software for realizing the inspection function) installed (installed) in the inspection apparatus 100 is executed by a computing device (eg, “CPU”) and a storage device (eg, “HDD”). Or “ROM”) on a memory (RAM) and the following processing is executed.

  A detailed operation of the inspection function according to the present embodiment (cooperative operation of the functional unit group) will be described using a flowchart showing a processing procedure.

  FIG. 6 is a flowchart showing the flow of the defect inspection processing according to the present embodiment. As shown in FIG. 6, the inspection apparatus 100 (reference image acquisition unit 102) acquires a reference image A and an inspection target image B (step S1).

  Next, the inspection apparatus 100 (calculation means 101) calculates a flare reverse correction value from the reference image A (step S2).

  Next, the inspection apparatus 100 (the corrected reference image obtaining unit 103) performs the flare reverse correction on the reference image A based on the flare reverse correction value to obtain the corrected reference image C (Step S3). In other words, the corrected reference image C is the same as the captured image (inspection target image) B affected by flare.

  Next, the inspection apparatus 100 (the inspection unit 104) compares the corrected reference image C with the inspection target image B and performs an inspection (Step S4).

  As described above, according to the present embodiment, the corrected reference image C and the inspection target image B can be compared with each other without performing heavy flare correction on the inspection target image B. Speed can be realized. Furthermore, since the influence of flare can be excluded, inspection can be performed with high accuracy.

(Second embodiment)
Next, a second embodiment will be described.

  The second embodiment differs from the first embodiment in the inspection method. Hereinafter, in the description of the second embodiment, the description of the same parts as those of the first embodiment will be omitted, and the points different from the first embodiment will be described.

  FIG. 7 is a block diagram illustrating a functional configuration of the inspection apparatus 100 according to the second embodiment. FIG. 8 is a diagram illustrating an inspection method of the inspection apparatus 100.

  As shown in FIG. 7, the inspection device 200 includes a calculation unit 101, a reference image acquisition unit 102, a corrected threshold image acquisition unit 201, and an inspection unit 202.

  The reference image acquiring unit 102 acquires the reference image A by receiving an input of an image obtained by ripping the print data. The reference image acquiring unit 102 acquires the inspection target image B by receiving the read image of the printing surface from the scanner 140.

  The calculating unit 101 calculates a flare reverse correction value based on a flare generated when the inspection target image B is created from the reference image A. That is, the calculating unit 101 calculates a difference between the reference image A and the inspection target image B having the flare as a flare reverse correction value.

  The post-correction threshold image acquisition unit 201 creates a threshold image E calculated for each area from the reference image A, performs flare reverse correction on the threshold image E based on the flare reverse correction value, and executes the corrected threshold image D To get. That is, the post-correction threshold image acquiring unit 201 adds the flare reverse correction value to the threshold image E to obtain a corrected threshold image D.

  The inspection means 202 compares the corrected threshold image D corrected using the flare inverse correction value with the inspection target image B and performs inspection.

  A detailed operation of the inspection function according to the present embodiment (cooperative operation of the functional unit group) will be described using a flowchart showing a processing procedure.

  FIG. 9 is a flowchart illustrating the flow of the defect inspection processing according to the present embodiment. As shown in FIG. 9, the inspection apparatus 100 (reference image acquisition unit 102) acquires a reference image A and an inspection target image B (step S1).

  Next, the inspection apparatus 100 (calculation means 101) calculates a flare reverse correction value from the reference image A (step S2).

  Next, the inspection apparatus 100 (the corrected threshold image acquisition means 201) creates a threshold image E from the reference image A, performs flare reverse correction on the threshold image E based on the flare reverse correction value, and executes the corrected threshold image. An image D is obtained (step S11).

  Next, the inspection apparatus 100 (inspection unit 202) performs an inspection by comparing the corrected threshold image D and the inspection target image B (Step S12).

  As described above, according to the present embodiment, the corrected threshold image D and the inspection target image B can be compared with each other without performing a flare correction that requires heavy processing on the inspection target image B. Higher processing speed can be realized. Furthermore, since the influence of flare can be excluded, inspection can be performed with high accuracy.

  Further, according to the present embodiment, the flare inverse correction value can be calculated from the reference image A while the threshold image E is being generated from the reference image A.

  Here, FIG. 10 is a diagram showing a modification of the inspection method of the inspection apparatus 100. As illustrated in FIG. 10, the inspection device 100 (reference image acquisition unit 102) may create a difference image F between the reference image A and the inspection target image B. Then, the inspection device 100 (inspection unit 202) performs an inspection by comparing the corrected threshold image D and the difference image F.

(Third embodiment)
Next, a third embodiment will be described.

  The third embodiment is different from the second embodiment in that the flare inverse correction is performed only in a specific area of the reference image. Hereinafter, in the description of the third embodiment, the description of the same parts as in the first embodiment or the second embodiment will be omitted, and the description will be different from the first embodiment or the second embodiment. The parts will be described.

  FIG. 11 is a block diagram illustrating a functional configuration of the inspection apparatus 300 according to the third embodiment. The inspection apparatus 300 shown in FIG. 11 inspects the print quality of a printed matter based on a read image of a print surface.

  As shown in FIG. 5, the inspection apparatus 200 includes a calculation unit 101, a reference image acquisition unit 102, a corrected threshold image acquisition unit 301, and an inspection unit 202.

  The calculating unit 101 calculates a flare reverse correction value based on a flare generated when the inspection target image B is created from the reference image A. That is, the calculating unit 101 calculates a difference between the reference image A and the inspection target image B having the flare as a flare reverse correction value.

  The reference image acquiring unit 102 acquires the reference image A by receiving an input of an image obtained by ripping the print data. The reference image acquiring unit 102 acquires the inspection target image B by receiving the read image of the printing surface from the scanner 140.

  The corrected threshold image acquiring unit 301 creates a threshold image E calculated for each region from the reference image A, performs flare inverse correction based on the flare inverse correction value on the threshold image E, and corrects the threshold image D after correction. To get. Further, the corrected threshold image acquiring unit 301 performs the flare reverse correction only on a specific region (flat portion) of the reference image A (the threshold image E), and generates the corrected threshold image D. Here, the flat portion is a region where the change in the pixel value is small, such as the background (a region where the flatness is high).

  The inspection means 202 compares the corrected threshold image D corrected using the flare inverse correction value with the inspection target image B and performs inspection.

  FIG. 12 is a diagram illustrating an inspection example of the inspection device 300. In the example shown in FIG. 12, the flare inverse correction is performed only on a specific region (a flat portion (a region such as a background where a change in pixel value is small (a flatness is high))) of the reference image A (the threshold image E). Is created. In general, an inspection that measures the color of a flat portion requires a high-precision inspection. Therefore, the flare reverse correction is performed only in an area where the inspection is severe such as a flat portion of a reference image.

  As described above, according to the present embodiment, the inverse flare correction is performed only in an area where inspection is strict, such as a flat part (an area where a change in pixel value is small (an area having a high degree of flatness) such as a background) of the reference image A. Therefore, it is possible to perform a strict inspection for seeing only a few colors in a solid portion (flat portion), and a sweet inspection for other portions.

<Modification>
Here, a modified example of the above embodiment will be described.

(Modification 1)
In the above embodiment, the inspection apparatus 100 has been described as a hardware environment in which the inspection function operates, but the present invention is not limited to this. For example, an image reading device 400 as shown in FIG. 13 may be used.

  FIG. 13 is a diagram illustrating a hardware configuration example of the image reading apparatus 400 on which the inspection function operates. As shown in FIG. 13, the image reading apparatus 400 includes a controller 410, a scanner 440, and the like, which are mutually connected by a bus B.

  The scanner 440 is an image reading unit that optically reads a printed material and generates a read image. The controller 410 is a control board including a CPU 411, a storage device 412, a network I / F 413, an external storage I / F 414, and the like.

  The storage device 412 includes a RAM, a ROM, and / or an HDD, and is a device that stores and holds various programs and data. The CPU 411 reads out a program or data from a ROM or HDD onto a RAM (memory) and executes processing (executes processing of the read program or data), thereby performing an operation for controlling the entire apparatus or realizing a mounted function. Device. Therefore, the above-described inspection function can be realized by the CPU 411 executing the program read on the RAM.

  The network I / F 413 is an interface that connects the image reading device 400 to the data transmission path N. Thus, the image reading device 400 can perform data communication with another device having a communication function via the network I / F 413. The external storage I / F 414 is an interface with a recording medium 414a corresponding to an external storage device. The recording medium 414a includes, for example, an SD memory card and a USB memory. Thus, the image reading device 400 can read and / or write on the recording medium 414a via the external storage I / F 414.

  As described above, the image reading apparatus 400 can provide a printed matter inspection service by itself with the above hardware configuration.

(Modification 2)
Further, for example, as shown in FIG. 14, an image forming apparatus such as an MFP (Multifunction Peripheral) may be used.

  FIG. 14 is a diagram illustrating a hardware configuration example of the image forming apparatus 500 on which the inspection function operates. As shown in FIG. 14, the image forming apparatus 500 includes a controller 510, an operation panel 520, a plotter 530, a scanner 540 serving as an image reading unit, and the like, and these are connected to each other via a bus B.

  The operation panel 520 includes an input unit and a display unit, and is an input / display device that provides various information such as device information to a user and receives various user operations such as operation settings and operation instructions. . The plotter 530 includes an image forming member, and is an image forming unit that forms an output image on a sheet based on print data. Examples of a method for forming an output image include an electrophotographic process and an inkjet method.

  The controller 510 is a control board including a CPU 511, a storage device 512, a network I / F 513, an external storage I / F 514, and the like.

  The storage device 512 includes a RAM, a ROM, an HDD, and the like, and is a device that stores and / or holds various programs and data. The CPU 511 reads a program or data from the ROM or HDD onto the RAM and executes the processing (executes the processing of the program or data read from the storage device), thereby controlling the entire apparatus or realizing the mounted functions. Device. Therefore, the above-described inspection function can be realized by the CPU 511 executing the program read on the RAM.

  The network I / F 513 is an interface that connects the image forming apparatus 500 to the data transmission path N. Thus, the image forming apparatus 500 can perform data communication with another device having a communication function via the network I / F 513. The external storage I / F 514 is an interface with a recording medium 514a corresponding to an external storage device. The recording medium 514a includes, for example, an SD memory card and a USB memory. Thus, the image forming apparatus 500 can read and / or write on the recording medium 514a via the external storage I / F 514.

  As described above, the image forming apparatus 500 can also provide the inspection service of the printed matter by itself, similarly to the image reading apparatus 400, by the above hardware configuration.

  Further, in the above embodiment, the inspection system 1000 in which the scanner 140 and the inspection device 100 are connected has been described, but the present invention is not limited thereto. For example, the inspection apparatus 100 may be configured to be connected to the image reading apparatus 400 or the image forming apparatus 500. In this case, the inspection target image B is transmitted from the image reading device 400 or the image forming device 500 to the inspection device 100.

100, 200, 300 Inspection device 101 Calculation means 102 Reference image acquisition means 103 Corrected reference image acquisition means 104 Inspection means 201 Corrected threshold image acquisition means 202 Inspection means 301 Corrected threshold image acquisition means 400 Image reading device 440 Image reading unit 500 Image forming apparatus 530 Image forming section 540 Image reading section

Patent No. 5330019 Japanese Patent No. 5678595

Claims (10)

An inspection device for inspecting the print quality of a printed matter based on print data by a read image of a print surface,
A reference image acquisition unit that acquires the read image as an inspection target image, and acquires an image obtained by ripping the print data as a reference image,
Calculation means for calculating a flare reverse correction value based on flare generated when the inspection target image is created from the reference image,
A corrected reference image acquisition unit that performs flare inverse correction on the reference image based on the flare inverse correction value to obtain a corrected reference image,
Inspection means for inspecting by comparing the corrected reference image and the inspection target image,
An inspection apparatus comprising: An inspection device for inspecting the print quality of a printed matter based on print data by a read image of a print surface,
A reference image acquisition unit that acquires the read image as an inspection target image, and acquires an image obtained by ripping the print data as a reference image,
Calculation means for calculating a flare reverse correction value based on flare generated when the inspection target image is created from the reference image,
A threshold image calculated for each region from the reference image, and a corrected threshold image acquiring unit configured to perform a flare inverse correction based on the flare inverse correction value on the threshold image to acquire a corrected threshold image. ,
Inspection means for inspecting by comparing the corrected threshold image corrected using the flare inverse correction value and the inspection target image,
An inspection apparatus comprising: The reference image acquisition unit creates a difference image between the reference image and the inspection target image,
The inspection means compares and inspects the corrected threshold image and the difference image.
The inspection device according to claim 2, wherein: The post-correction threshold image obtaining means performs flare reverse correction only on a region where the flatness of the reference image is high, and creates the corrected threshold image.
The inspection device according to claim 2, wherein: An image reading unit that reads a print surface of a printed matter based on the print data and generates a read image,
An inspection device according to any one of claims 1 to 4,
An image reading apparatus comprising: An image forming unit that generates a printed matter based on the print data;
An image reading unit that reads a printing surface of the printed matter to generate a read image,
An inspection device according to any one of claims 1 to 4,
An image forming apparatus comprising: An inspection method in an inspection device that inspects the print quality of a printed matter based on print data by a read image of a print surface,
A reference image obtaining step of obtaining the read image as an inspection target image and obtaining an image obtained by ripping the print data as a reference image,
A calculation step of calculating a flare reverse correction value based on flare generated when the inspection target image is created from the reference image,
A corrected reference image obtaining step of performing a flare reverse correction on the reference image based on the flare reverse correction value to obtain a corrected reference image,
An inspection step of comparing and inspecting the corrected reference image and the inspection target image,
An inspection method comprising: An inspection method in an inspection device that inspects the print quality of a printed matter based on print data by a read image of a print surface,
A reference image obtaining step of obtaining the read image as an inspection target image and obtaining an image obtained by ripping the print data as a reference image,
A calculation step of calculating a flare reverse correction value based on flare generated when the inspection target image is created from the reference image,
Creating a threshold image calculated for each area from the reference image, performing a flare inverse correction based on the flare inverse correction value on the threshold image, and acquiring a corrected threshold image by performing a corrected threshold image acquisition step; ,
Inspection step of inspecting by comparing the corrected threshold image and the inspection target image corrected using the flare reverse correction value,
An inspection method comprising: A computer that controls an inspection device that inspects the print quality of a printed matter based on print data based on a read image of a print surface,
A reference image acquisition unit that acquires the read image as an inspection target image, and acquires an image obtained by ripping the print data as a reference image,
Calculation means for calculating a flare reverse correction value based on flare generated when the inspection target image is created from the reference image,
A corrected reference image acquisition unit that performs flare inverse correction on the reference image based on the flare inverse correction value to obtain a corrected reference image,
Inspection means for inspecting by comparing the corrected reference image and the inspection target image,
Program to function as. A computer that controls an inspection device that inspects the print quality of a printed matter based on print data based on a read image of a print surface,
A reference image acquisition unit that acquires the read image as an inspection target image, and acquires an image obtained by ripping the print data as a reference image,
Calculation means for calculating a flare reverse correction value based on flare generated when the inspection target image is created from the reference image,
A threshold image calculated for each region from the reference image, and a corrected threshold image obtaining unit configured to perform a flare reverse correction based on the flare reverse correction value on the threshold image to obtain a corrected threshold image. ,
Inspection means for inspecting by comparing the corrected threshold image corrected using the flare inverse correction value and the inspection target image,
Program to function as.