JP2019505251A5 - - Google Patents
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- JP2019505251A5 JP2019505251A5 JP2018528002A JP2018528002A JP2019505251A5 JP 2019505251 A5 JP2019505251 A5 JP 2019505251A5 JP 2018528002 A JP2018528002 A JP 2018528002A JP 2018528002 A JP2018528002 A JP 2018528002A JP 2019505251 A5 JP2019505251 A5 JP 2019505251A5
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- JP
- Japan
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15197268 | 2015-12-01 | ||
| EP15197268.4 | 2015-12-01 | ||
| PCT/EP2016/078224 WO2017093055A1 (en) | 2015-12-01 | 2016-11-21 | Apparatus for x-ray imaging an object |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2019505251A JP2019505251A (ja) | 2019-02-28 |
| JP2019505251A5 true JP2019505251A5 (https=) | 2019-12-26 |
| JP6816144B2 JP6816144B2 (ja) | 2021-01-20 |
Family
ID=54770934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018528002A Expired - Fee Related JP6816144B2 (ja) | 2015-12-01 | 2016-11-21 | 被検体をｘ線撮像する装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10779776B2 (https=) |
| EP (1) | EP3383273B1 (https=) |
| JP (1) | JP6816144B2 (https=) |
| CN (1) | CN108289649B (https=) |
| WO (1) | WO2017093055A1 (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10859517B2 (en) * | 2016-04-18 | 2020-12-08 | The Board Of Trustees Of The Leland Stanford Junior University | Single X-ray grating X-ray differential phase contrast imaging system |
| US10670744B2 (en) * | 2017-10-23 | 2020-06-02 | General Electric Company | Current measurement in an imaging system |
| US11013482B2 (en) * | 2017-10-31 | 2021-05-25 | Shimadzu Corporation | Phase contrast X-ray imaging system |
| EP3603515A1 (en) * | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Apparatus for generating x-ray imaging data |
| EP3701868A1 (en) * | 2019-02-28 | 2020-09-02 | Koninklijke Philips N.V. | System, method and computer program for acquiring phase imaging data of an object |
| EP3705044A1 (en) * | 2019-03-08 | 2020-09-09 | Koninklijke Philips N.V. | System for x-ray dark field; phase contrast and attenuation tomosynthesis image acquisition |
| EP3832690A1 (en) * | 2019-12-05 | 2021-06-09 | Koninklijke Philips N.V. | Estimation of full-field scattering for dax imaging |
| EP3925539A1 (en) * | 2020-06-19 | 2021-12-22 | Koninklijke Philips N.V. | X-ray imaging system |
| DE102023204333B3 (de) * | 2023-05-10 | 2024-05-16 | Siemens Healthineers Ag | Verfahren zum Betreiben eines Röntgenbildgebungssystems, Verfahren zur Generierung einer Datenbank, Regelungseinrichtung, Röntgenbildgebungssystem, Steuereinrichtung, Computerprogramm und elektronisch lesbarer Datenträger |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2015103A (en) | 1931-11-07 | 1935-09-24 | Celanese Corp | Process of treating fabrics and product thereof |
| CN101576515B (zh) * | 2007-11-23 | 2012-07-04 | 同方威视技术股份有限公司 | X射线光栅相衬成像系统及方法 |
| JP2011045655A (ja) * | 2009-08-28 | 2011-03-10 | Konica Minolta Medical & Graphic Inc | Ｘ線撮影装置 |
| JP5269041B2 (ja) | 2009-12-04 | 2013-08-21 | キヤノン株式会社 | Ｘ線撮像装置およびｘ線撮像方法 |
| WO2011114845A1 (ja) * | 2010-03-18 | 2011-09-22 | コニカミノルタエムジー株式会社 | Ｘ線撮影システム |
| CN102221565B (zh) * | 2010-04-19 | 2013-06-12 | 清华大学 | X射线源光栅步进成像系统与成像方法 |
| JP2014014379A (ja) | 2010-10-27 | 2014-01-30 | Fujifilm Corp | 放射線撮影システム及び放射線撮影方法 |
| JP5238787B2 (ja) * | 2010-10-27 | 2013-07-17 | 富士フイルム株式会社 | 放射線撮影装置及び放射線撮影システム |
| WO2012056724A1 (ja) * | 2010-10-29 | 2012-05-03 | 富士フイルム株式会社 | 放射線位相画像撮影装置 |
| JP2012120653A (ja) * | 2010-12-07 | 2012-06-28 | Fujifilm Corp | 放射線撮影装置、及び放射線撮影システム |
| JP5150713B2 (ja) | 2010-12-08 | 2013-02-27 | 富士フイルム株式会社 | 放射線画像検出装置、放射線撮影装置、放射線撮影システム |
| JP6353361B2 (ja) * | 2011-07-04 | 2018-07-04 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 位相コントラストイメージング装置 |
| CN104321805B (zh) * | 2012-05-14 | 2017-12-15 | 皇家飞利浦有限公司 | 暗场计算机断层摄影成像 |
| EP2867655B1 (en) * | 2012-06-27 | 2019-05-08 | Koninklijke Philips N.V. | Dark-field imaging |
| JP2014090967A (ja) * | 2012-11-06 | 2014-05-19 | Canon Inc | Ｘ線撮像装置 |
| JP6422646B2 (ja) * | 2012-11-16 | 2018-11-14 | キヤノンメディカルシステムズ株式会社 | Ｘ線コンピュータ断層撮影装置及び情報処理装置 |
| US10096098B2 (en) * | 2013-12-30 | 2018-10-09 | Carestream Health, Inc. | Phase retrieval from differential phase contrast imaging |
| WO2014207193A1 (en) * | 2013-06-28 | 2014-12-31 | Koninklijke Philips N.V. | Correction in slit-scanning phase contrast imaging |
| DE102013214388B4 (de) * | 2013-07-23 | 2023-04-20 | Siemens Healthcare Gmbh | Medizinisches Instrument zur Verwendung mit einer Phasenkontrastbildgebung und Röntgenaufnahmesystem mit Phasenkontrastbildgebung |
| WO2015067461A1 (en) * | 2013-11-05 | 2015-05-14 | Koninklijke Philips N.V. | X-ray imaging device with fast spatial modulation of photon flux |
| EP3065642B1 (en) * | 2013-11-08 | 2020-01-08 | Koninklijke Philips N.V. | Empirical beam hardening correction for differential phase contrast ct |
| EP3082600B1 (en) * | 2013-12-17 | 2018-03-28 | Koninklijke Philips N.V. | Phase retrieval for scanning differential phase contrast systems |
| KR20170009909A (ko) * | 2014-05-15 | 2017-01-25 | 시그레이, 아이엔씨. | 주기적 구조의 측정과 특성화 및 분석을 위한 x-선 방법 |
| JP2016032573A (ja) * | 2014-07-31 | 2016-03-10 | キヤノン株式会社 | トールボット干渉計、トールボット干渉システム、及び縞走査法 |
-
2016
- 2016-11-21 JP JP2018528002A patent/JP6816144B2/ja not_active Expired - Fee Related
- 2016-11-21 US US15/779,107 patent/US10779776B2/en not_active Expired - Fee Related
- 2016-11-21 CN CN201680069968.7A patent/CN108289649B/zh not_active Expired - Fee Related
- 2016-11-21 WO PCT/EP2016/078224 patent/WO2017093055A1/en not_active Ceased
- 2016-11-21 EP EP16798182.8A patent/EP3383273B1/en active Active
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