JP2019502100A5 - - Google Patents

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Publication number
JP2019502100A5
JP2019502100A5 JP2018526076A JP2018526076A JP2019502100A5 JP 2019502100 A5 JP2019502100 A5 JP 2019502100A5 JP 2018526076 A JP2018526076 A JP 2018526076A JP 2018526076 A JP2018526076 A JP 2018526076A JP 2019502100 A5 JP2019502100 A5 JP 2019502100A5
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JP
Japan
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detection
pixels
value determination
pixel
priority
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JP2018526076A
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English (en)
Japanese (ja)
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JP7059180B2 (ja
JP2019502100A (ja
JP7059180B6 (ja
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Priority claimed from PCT/EP2016/078216 external-priority patent/WO2017085304A1/en
Publication of JP2019502100A publication Critical patent/JP2019502100A/ja
Publication of JP2019502100A5 publication Critical patent/JP2019502100A5/ja
Publication of JP7059180B2 publication Critical patent/JP7059180B2/ja
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Publication of JP7059180B6 publication Critical patent/JP7059180B6/ja
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JP2018526076A 2015-11-20 2016-11-20 検出値決定システム Active JP7059180B6 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15195557 2015-11-20
EP15195557.2 2015-11-20
PCT/EP2016/078216 WO2017085304A1 (en) 2015-11-20 2016-11-20 Detection values determination system

Publications (4)

Publication Number Publication Date
JP2019502100A JP2019502100A (ja) 2019-01-24
JP2019502100A5 true JP2019502100A5 (https=) 2021-03-11
JP7059180B2 JP7059180B2 (ja) 2022-04-25
JP7059180B6 JP7059180B6 (ja) 2022-06-02

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Family Applications (1)

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JP2018526076A Active JP7059180B6 (ja) 2015-11-20 2016-11-20 検出値決定システム

Country Status (5)

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US (1) US11002865B2 (https=)
EP (1) EP3377921B1 (https=)
JP (1) JP7059180B6 (https=)
CN (1) CN108291976B (https=)
WO (1) WO2017085304A1 (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6655765B2 (ja) * 2016-11-24 2020-02-26 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器装置に対する散乱線除去グリッドアセンブリ
EP3508887A1 (en) 2018-01-09 2019-07-10 Koninklijke Philips N.V. Charge sharing calibration method and system
EP3514577A1 (en) * 2018-01-19 2019-07-24 Koninklijke Philips N.V. Apparatus, system, method and computer program for reconstructing a spectral image of a region of interest of an object
JP7179177B2 (ja) * 2018-11-19 2022-11-28 プリズマティック、センサーズ、アクチボラグ エッジオン光子計数検出器
EP3709059A1 (en) 2019-03-14 2020-09-16 Koninklijke Philips N.V. Charge sharing compensation with sampled discriminators
US11246547B2 (en) * 2019-07-22 2022-02-15 Redlen Technologies, Inc. Compensation for charge sharing between detector pixels in a pixilated radiation detector
JP7337596B2 (ja) * 2019-08-20 2023-09-04 キヤノンメディカルシステムズ株式会社 X線撮影装置、医用情報処理装置、x線検出器及びx線検出器の補正方法
US11013487B2 (en) 2019-10-18 2021-05-25 Canon Medical Systems Corporation Method and apparatus for computed tomography (CT) and material decomposition with count-rate dependent pileup correction
EP3842839A1 (en) 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
CN111337967B (zh) * 2020-03-04 2021-10-15 中国科学院高能物理研究所 一种消除电荷共享装置及像素探测系统
DE112021004442T5 (de) * 2020-08-27 2023-06-15 Analog Devices, Inc. Energie-bin-ereignis-zählsystem
US12287437B2 (en) * 2022-01-19 2025-04-29 Analog Devices, Inc. Quantitative pulse selection for photon-counting computed tomography scanning systems
SE2250970A1 (en) 2022-08-17 2023-06-13 Direct Conv Ab Readout circuit for radiation detectors with improved charge sharing correction
EP4660668A1 (de) * 2024-06-07 2025-12-10 Siemens Healthineers AG Elektronische schaltung, photonenzählender röntgendetektor, computertomographiesystem und verfahren zum erfassen von koinzidenzereignissen eines computertomographiesystems
CN120336723B (zh) * 2025-06-16 2025-09-12 中检易兴元科技(北京)有限公司 一种xrf分析仪探测器计数效率提升方法及系统

Family Cites Families (12)

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Publication number Priority date Publication date Assignee Title
US7606347B2 (en) 2004-09-13 2009-10-20 General Electric Company Photon counting x-ray detector with overrange logic control
US7486764B2 (en) * 2007-01-23 2009-02-03 General Electric Company Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors
US20090008564A1 (en) 2007-07-05 2009-01-08 Cmt Medical Technologies Ltd. Modular X-Ray Detector With Single Photon Counting, Energy Sensitivity And Integration Capabilities
US8017906B2 (en) 2008-04-08 2011-09-13 Robert Sigurd Nelson Slit and slot scan, SAR, and compton devices and systems for radiation imaging
CN101750621A (zh) * 2008-12-08 2010-06-23 皇家飞利浦电子股份有限公司 对来自像素化探测器的测量的评估
JP5237919B2 (ja) * 2009-11-13 2013-07-17 株式会社日立製作所 核医学診断装置
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors
EP2609449B1 (en) 2010-08-26 2017-12-20 Koninklijke Philips N.V. Pixellated detector device
DE102012224209B4 (de) * 2012-12-21 2017-09-14 Siemens Healthcare Gmbh Zählender digitaler Röntgendetektor und Verfahren zur Aufnahme eines Röntgenbildes
ES2696748T3 (es) * 2013-12-09 2019-01-17 Hamamatsu Photonics Kk Elemento de conteo de fotones bidimensional
CN108139487B (zh) * 2015-08-27 2021-12-31 皇家飞利浦有限公司 光子计数设备和方法
CN108603942A (zh) * 2016-02-01 2018-09-28 深圳帧观德芯科技有限公司 能够管理电荷共用的x射线检测器

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