JP2019032380A - microscope - Google Patents

Abstract

To provide a microscope for preventing an index line of a reticle from disturbing observation of a sample during normal observation, and for preventing a sense of discomfort from being generated during observation with a camera and observation with an eyepiece lens.SOLUTION: A microscope 1 comprises: a stage on which a sample is placed; a transmitted illumination optical system 20 having a light source 24 for generating illumination light with which the sample is irradiated, a capacitor lens 22a for irradiating the sample with the illumination light, and a visual field diaphragm 261 for adjusting a range of the illumination light with which the sample is irradiated; and a reticle 27. The capacitor lens 22a is configured so as to be movable along an optical axis of the transmitted illumination optical system 20, and the reticle 27 is disposed at a position which may be conjugated to the sample by movement of the capacitor lens 22a in the vicinity of the visual field diaphragm 261.SELECTED DRAWING: Figure 2

Description

  The present invention relates to a microscope.

  2. Description of the Related Art Conventionally, a microscope in which a reticle (reticle plate) made of a glass plate engraved with an index line such as a crosshair is inserted into an eyepiece is known. By using such a reticle, for example, in order to see the degree of invasion of cancer cells, the user measures how many mm the cancer cells have infiltrated from the epidermis, or has a diameter of 20 mm within a field of view of 22 mm. It is possible to display the index line and count abnormal cells in the index line to determine the degree of disease progression.

  On the other hand, the reticle index line only needs to be displayed when the cell to be measured is indicated or when the count range is defined, which is an obstacle during normal observation. Therefore, for example, Patent Document 1 proposes a technique in which an index line of a reticle is composed of an electro-optic element that switches between transparent and opaque according to an applied voltage. By configuring the index line with the electro-optic element in this way, the index line can be displayed in the field of view only when necessary, so that the index line does not hinder the observation of the sample.

Japanese Utility Model Publication No. 57-68209

  However, when the reticle proposed in Patent Document 1 is used, the following problems occur. First, the index line of the reticle inserted into the eyepiece lens is likely to cause an error in the vertical direction of the optical axis due to the looseness of fitting to the mounting portion and the variation of the center of the index line. Further, since the optical path of the image to be observed is different between the eyepiece lens and the camera, the visual field center is different. For this reason, the index line of the reticle inserted into the eyepiece does not coincide with the index line displayed superimposed on the image captured by the camera. Therefore, for example, in a teacher's field, when a teacher observes a specimen through an image photographed by a camera and a student observes the specimen through an eyepiece, the teacher positions the cell accurately with respect to the student. It becomes difficult to indicate.

  Further, the index line is stamped on a transparent glass plate, and this glass plate is inserted at a position conjugate with the image plane. For this reason, if any foreign matter such as dust adheres to the glass plate, the foreign matter can be seen in the field of view. However, since the camera cannot confirm the foreign matter, it is recognized between a user who observes the specimen through an image photographed by the camera and a user who observes the specimen through an eyepiece, for example. Deviation occurs. Furthermore, since the reticle is made of a glass plate, careful work is required when it is inserted into the eyepiece, which causes a problem of stressing the user.

  The present invention has been made in view of the above, and the reticle index line does not interfere with the observation of the specimen during normal observation, and there is a sense of incongruity between observation with a camera and observation with an eyepiece. It aims at providing the microscope which does not produce.

  In order to solve the above-described problems and achieve the object, a microscope according to the present invention irradiates a stage on which a specimen is mounted, a light source that generates illumination light for illuminating the specimen, and the illumination light to the specimen. A condenser lens, and a transmission illumination optical system having a field stop that adjusts a range of illumination light irradiated on the specimen; and an index member; and the condenser lens extends along the optical axis of the transmission illumination optical system. The indicator member is movable, and is arranged in the vicinity of the field stop and at a position that can be conjugated with the sample by the movement of the condenser lens.

  In the microscope according to the present invention, in the above invention, the field stop is disposed between the light source and the condenser lens, and the index member is disposed between the field stop and the condenser lens. It is characterized by being.

  In the microscope according to the present invention, the index member is detachably attached to an upper surface of a window lens provided on the stage side of the field stop.

  The microscope according to the present invention is characterized in that, in the above invention, the index member is formed integrally with a window lens provided on the stage side of the field stop.

  In the microscope according to the present invention as set forth in the invention described above, the index member is configured to be movable along the optical axis in the vicinity of the field stop.

  The microscope according to the present invention is characterized in that, in the above-mentioned invention, the microscope further comprises display control means for controlling display of the index line on the index member in accordance with the magnification of the objective lens inserted in the optical axis.

  The microscope according to the present invention is characterized in that, in the above invention, the microscope further includes a light amount control means for controlling the light amount of the light source in accordance with the position of the condenser lens in the optical axis direction.

  The microscope according to the present invention is characterized in that, in the above invention, the index member has a light shielding region at an outer edge.

  According to the present invention, since the index member is arranged at a position that can be conjugate with the sample by the movement of the condenser lens, the index line of the reticle does not interfere with the sample observation during normal observation, and the camera The user does not feel uncomfortable between the observation and the observation with the eyepiece.

FIG. 1 is a diagram showing a configuration of a microscope according to Embodiment 1 of the present invention. FIG. 2 is an enlarged partial cross-sectional view showing the configuration of the transmission illumination optical system of the microscope according to Embodiment 1 of the present invention. FIG. 3A is a diagram showing an example of a reticle applicable to the microscope according to Embodiment 1 of the present invention. FIG. 3B is a diagram showing another example of a reticle applicable to the microscope according to Embodiment 1 of the present invention. FIG. 3C is a diagram showing another example of a reticle applicable to the microscope according to Embodiment 1 of the present invention. FIG. 4A is a diagram showing a configuration of the adapter of the microscope according to Embodiment 1 of the present invention. FIG. 4B is a diagram showing a configuration of the adapter of the microscope according to Embodiment 1 of the present invention. FIG. 5 is an enlarged partial sectional view showing the configuration of the transmission illumination optical system of the microscope according to the second embodiment of the present invention. FIG. 6 is an enlarged partial sectional view showing a configuration of a transmission illumination optical system of a microscope according to Embodiment 3 of the present invention. FIG. 7 is an enlarged partial sectional view showing a configuration of a transmission illumination optical system of a microscope according to Embodiment 4 of the present invention. FIG. 8 is a diagram showing a configuration of a transmission illumination optical system of a microscope according to Embodiment 5 of the present invention. FIG. 9 is an enlarged partial sectional view showing a configuration of a transmission illumination optical system of a microscope according to Embodiment 6 of the present invention. FIG. 10 is a diagram showing a configuration of a modified example of the reticle of the microscope according to the embodiment of the present invention.

  Hereinafter, embodiments of a microscope according to the present invention will be described with reference to the drawings. The present invention is not limited to the following embodiments, and constituent elements in the following embodiments include those that can be easily replaced by those skilled in the art or those that are substantially the same.

(Embodiment 1)
The configuration of the microscope 1 according to the first embodiment of the present invention will be described with reference to FIGS. As shown in FIG. 1, the microscope 1 according to the present embodiment includes a microscope main body 10, a transmission illumination optical system 20, an objective lens 31, a revolver 32, a lens barrel 33, an eyepiece lens 35, and a camera adapter. 36 and a camera 37 are mainly provided.

  The microscope main body 10 has a base portion 11a, a column portion 11b standing on the back side of the base portion 11a, and an arm portion 11c supported by the column portion 11b and extending toward the front side. . The base portion 11a is a portion that is directly placed on a place such as a desk where the microscope 1 is installed, and the transmission illumination optical system 20 is disposed therein.

  The column portion 11 b is integrated with the base portion 11 a at the lower end portion, and holds the stage 21 on which the sample S is placed via the stage holding member 12. The stage holding member 12 is configured to be movable along a guide (not shown) arranged in the optical axis direction in the column portion 11b. The “optical axis” described above indicates the optical axis of the transmission illumination optical system 20.

  The stage 21 held by the stage holding member 12 moves up and down along the optical axis by operating the stage focusing handle 13. As a result, the relative distance between the specimen S on the stage 21 and the objective lens 31 changes, and focus adjustment is performed.

  The stage holding member 12 has a capacitor guide 14 that allows the capacitor unit 22 to move along the optical axis. The capacitor unit 22 moves up and down by operating the condenser focusing handle 15.

  The revolver 32 is attached to the lower surface of the arm portion 11c. A plurality of objective lenses 31 having different magnifications are detachably attached to the revolver 32. The selected objective lens 31 is arranged on the optical axis by rotating the revolver 32.

  The lens barrel 33 is detachably attached to the upper surface of the arm portion 11c, and two eyepieces 35, a camera adapter 36, and a camera 37 are attached. The lens barrel 33 is provided with a switching lever 34 for switching the optical path between the eyepiece 35 and the camera 37.

  The transmission illumination optical system 20 includes a light source 24 that generates illumination light that irradiates the sample S, a capacitor unit 22 that irradiates the sample S with illumination light, and a field stop unit that adjusts the range of illumination light irradiated to the sample S. 26 mainly.

  The illumination light emitted from the light source 24 of the transmission illumination optical system 20 is applied to the specimen S via the collector lens 25 and the condenser unit 22. The light transmitted through the specimen S forms an observation image with an objective lens 31 and an imaging lens (not shown) in the lens barrel 33, and the user passes through the eyepiece lens 35 or through an image photographed by the camera 37. An image can be observed.

  The condenser unit 22 is configured to be movable along the optical axis and includes a condenser lens 22a inside. The field stop unit 26 is disposed on the base portion 11a and includes a field stop 261, a unit main body 262, a field stop handle 263, and a window lens 264, as shown in FIG. In the drawing, the upper portion of the unit main body 262, the window lens 264, the reticle 27 and the adapter 28 described later are shown in cross section.

  The field stop 261 is disposed between the light source 24 and the condenser lens 22a. The diameter of the field stop 261 is changed by rotating the field stop handle 263. Further, by operating the centering knob 23 of the condenser lens 22a, the condenser lens 22a can be moved in the direction perpendicular to the optical axis. Thereby, the center of the field stop 261 can be aligned with the center of the field of view.

  The window lens 264 is provided on the upper side of the field stop 261, that is, on the stage 21 side, and prevents foreign substances such as dust from entering the field stop 261 and prevents the user from directly touching the field stop 261. . On the upper surface of the window lens 264, a reticle (index member) 27 made of a glass plate engraved with an index line is disposed.

  The reticle 27 is disposed between the field stop 261 and the condenser lens 22a. Specifically, the reticle 27 is disposed in the vicinity of the field stop 261 and at a position that can be conjugate with the sample S by the movement of the condenser unit 22. Has been. The reticle 27 is detachably attached to the upper surface of the window lens 264 via the adapter 28.

  As the reticle 27, for example, as shown in FIG. 3A, a cross line 271 with an index line provided with a scale 272 can be used. Further, instead of the reticle 27, for example, as shown in FIG. 3B, a reticle 27A in which an index line in which a plurality of concentric circles 273 are provided on a cross line 271 may be used. Further, instead of the reticle 27, a reticle 27B provided with a crosshair 271 and having a light shielding region 274 at the outer edge may be used. By using such a reticle 27B, disturbance light can be blocked by the light shielding region 274, and the reticle 27B can function as an aperture.

  Note that the interval between the scale 272 in FIG. 3A and the concentric circle 273 in FIG. 3B needs to be a value that takes into account the interval required on the sample surface. For example, when the projection magnification when the index line is projected onto the sample surface is 0.5, and the line interval of 1 mm is to be displayed on the sample surface, the line interval of the index line on the reticle 27 is 1 mm / 0. Set 5 = 2 mm. The line width of the index line is the same as the line interval. For example, when it is desired to display a line width of 0.1 mm on the sample surface, the line width of the index line on the reticle 27 is 0.1 mm / 0.5. = Set to 0.2 mm.

  The adapter 28 is detachably attached to the upper surface of the window lens 264. As shown in FIGS. 4A and 4B, the adapter 28 includes an adapter main body 281 formed in an annular shape and a flange portion 282 extending inward from the inner periphery of the adapter main body 281. A reticle 27 is fixedly or detachably attached to the flange portion 282.

  Here, when the field stop 261 and the sample S are in an optically conjugate positional relationship, the transmission illumination optical system 20 is in an optical ideal state. Accordingly, only the specimen S can be seen when observed with the eyepiece 35 and the camera 37.

  On the other hand, when the condenser focusing handle 15 is operated to lower the condenser unit 22 below the position when the transmitted illumination optical system 20 is in the optical ideal state, the index line of the reticle 27 and the sample S are optically aligned. This is a conjugate positional relationship. Accordingly, when observed with the eyepiece 35 and the camera 37, the index line of the reticle 27 can be seen in addition to the specimen S.

  According to the microscope 1 having the above-described configuration, since the reticle 27 is arranged at a position that can be conjugated with the sample S by the movement of the condenser lens 22a, the index line of the reticle 27 is used to observe the sample S during normal observation. And the user does not feel uncomfortable between the observation with the camera 37 and the observation with the eyepiece 35.

  That is, in the microscope 1, when the condenser unit 22 is arranged so that the transmitted illumination optical system 20 is in an optical ideal state, the index line of the reticle 27 is not focused and the index line cannot be seen. On the other hand, when the capacitor unit 22 is lowered toward the reticle 27 in the optical axis direction, the index line of the reticle 27 is focused when the conjugate positional relationship is established, and the index line becomes visible. Thereby, the index line of the reticle 27 can be displayed only when the cell to be measured is specified or the count range is defined, for example, without displaying the index line of the reticle 27 during normal observation.

  In the microscope 1, the index line of the reticle 27 observed with the camera 37 is observed because the camera 37 and the eyepiece 35 observe the same reticle 27 instead of displaying the index line with the camera in the conventional manner. And the positional relationship with the index line of the reticle 27 observed with the eyepiece 35 coincide. Therefore, for example, when the teacher observes the specimen S through the image taken by the teacher 37 at the teacher's site and the student observes the specimen S through the eyepiece 35, the teacher gives It is possible to indicate an accurate position or the like.

  Further, in the microscope 1, the reticle 27 is arranged on the upper surface of the window lens 264 via the adapter 28, so that it is difficult to cause a fitting backlash with respect to a conventional attachment portion and an error in the direction perpendicular to the optical axis. In the microscope 1, the reticle 27 is arranged on the upper surface of the window lens 264, so that even if foreign matter such as dust adheres to the reticle 27, it can be easily cleaned.

(Embodiment 2)
The configuration of the microscope 1A according to Embodiment 2 of the present invention will be described with reference to FIG. In the following, description and illustration of the same configuration as in the first embodiment will be omitted, and only the configuration different from that of the first embodiment will be described.

  As shown in FIG. 5, the microscope 1A is different from the first embodiment in the configuration of the field stop unit 26A. That is, in the field stop unit 26A, unlike the first embodiment, the reticle 27C is configured integrally with the window lens. That is, the reticle 27C is fixed to the upper part of the unit main body 262 of the field stop unit 26A, and also has a window lens function.

  According to the microscope 1A having the configuration as described above, the index line of the reticle 27C does not interfere with the observation of the sample S during normal observation, and the observation with the camera 37, as in the first embodiment. The user does not feel uncomfortable between the time and the observation with the eyepiece 35. Further, according to the microscope 1A, since the number of parts can be reduced as compared with the first embodiment, the cost can be reduced.

(Embodiment 3)
The configuration of the microscope 1B according to Embodiment 3 of the present invention will be described with reference to FIG. In the following, description and illustration of the same configuration as in the first embodiment will be omitted, and only the configuration different from that of the first embodiment will be described.

  As shown in FIG. 6, the reticle 27 of the microscope 1 </ b> B is configured to be movable along the optical axis in the vicinity of the field stop 261. That is, in the microscope 1B, the reticle 27 is held by the reticle holder 41, not the upper surface of the window lens 264.

  The reticle holder 41 is configured to be movable along a reticle guide 42 disposed in the optical axis direction. The reticle guide 42 is attached to a reticle guide holding portion 43 provided in the column portion 11b. The reticle 27 held by the reticle holder 41 moves in the vertical direction along the optical axis by operating the reticle focusing handle 44.

  According to the microscope 1B having the above configuration, the projection magnification when the reticle 27 is projected onto the specimen surface can be changed depending on the position of the reticle 27 in the optical axis direction. Thereby, when observing with the eyepiece lens 35 or the camera 37, the space | interval of the scale 272 (refer FIG. 3A) of the index line of the reticle 27 can be changed arbitrarily, for example. Therefore, according to the microscope 1B, it is possible to observe the specimen S at various scales using the single reticle 27.

(Embodiment 4)
The configuration of the microscope 1C according to the fourth embodiment of the present invention will be described with reference to FIG. In the following, description and illustration of the same configuration as in the first embodiment will be omitted, and only the configuration different from that of the first embodiment will be described.

  As shown in FIG. 7, the reticle 27 of the microscope 1C is configured to be movable along the optical axis in the vicinity of the field stop 261 by a method different from that of the third embodiment. That is, in the microscope 1C, the field stop unit 26 is held by the field stop unit holder 45, not on the base portion 11a.

  The field stop unit holder 45 is configured to be movable along a field stop unit guide 46 disposed in the optical axis direction. The field stop unit guide 46 is attached to a field stop unit guide holding part 47 provided in the column part 11b. The field stop unit 26 and the reticle 27 held by the field stop unit holder 45 are moved in the vertical direction along the optical axis by the operation of the field stop focusing handle 48.

  The capacitor unit 22 is adjusted so as to be disposed at the optically ideal position at the maximum upper limit position. The configuration may be such that the reticle 27 is disposed directly on the field stop unit holder 45 without providing the field stop unit 26.

  According to the microscope 1C having the above-described configuration, the projection magnification when the reticle 27 is projected onto the specimen surface can be changed according to the position of the reticle 27 in the optical axis direction, as in the third embodiment. Therefore, it is possible to observe the specimen S at various scales using the single reticle 27.

(Embodiment 5)
The configuration of the microscope 1D according to the fifth embodiment of the present invention will be described with reference to FIG. In the following, description and illustration of the same configuration as in the first embodiment will be omitted, and only the configuration different from that of the first embodiment will be described.

  As shown in FIG. 8, the microscope 1 </ b> D includes display control means for controlling display of the index line on the reticle 27 </ b> D according to the magnification of the objective lens 31. The reticle 27D is configured by a liquid crystal display. In addition to the configuration of the first embodiment, the microscope 1D includes an address sensor 49, a revolver position detection circuit 50, a CPU (Central Processing Unit) 51, a graphics controller (Graphics Controller) 52 that functions as display control means, Is further provided. The graphic controller 52 is configured by an integrated circuit such as a CPU or a GPU (Graphics Processing Unit).

  The address sensor 49 includes a hall element for detecting the position of the objective lens 31 inserted in the optical axis, and is built in the revolver 32. Information from the address sensor 49 is input to the graphic controller 52 via the revolver position detection circuit 50 and the CPU 51. In response to this, the graphic controller 52 changes the display content of the reticle 27D formed of a liquid crystal display.

  According to the microscope 1D having the above-described configuration, the line width and line interval of the index line of the reticle 27D can be changed to an optimal one according to the magnification of the objective lens 31.

(Embodiment 6)
A configuration of a microscope 1E according to the sixth embodiment of the present invention will be described with reference to FIG. In the following, description and illustration of the same configuration as in the first embodiment will be omitted, and only the configuration different from that of the first embodiment will be described.

  As shown in FIG. 9, the microscope 1E includes light amount control means for controlling the light amount of the light source 24 in accordance with the position of the condenser lens 22a in the optical axis direction. In addition to the configuration of the first embodiment, the microscope 1E includes a photo interrupter 53, a plate member 54, a sensor on / off detection circuit 55, a CPU 56, a D / A converter 57, and a drive that functions as a light amount control unit. And a circuit 58.

  The photo interrupter 53 is attached to the stage holding member 12. The plate member 54 is attached to the capacitor unit 22. When the capacitor unit 22 is disposed at the ideal optical position, the plate member 54 blocks the photo interrupter 53 and becomes a sensor on. On the other hand, when the capacitor unit 22 is disposed at a position lower than the optical ideal position, the plate member 54 is detached from the photo interrupter 53 and becomes a sensor off. The states of sensor on and sensor off are detected by a sensor on / off detection circuit 55 connected to the photo interrupter 53.

  The signal detected by the sensor on / off detection circuit 55 is input to the drive circuit 58 via the CPU 56 and the D / A converter 57. In response to this, the drive circuit 58 controls the brightness of the illumination light of the light source 24. Based on the control of the drive circuit 58, the light source 24 increases the brightness of the illumination light by a preset ratio when the sensor is turned off with reference to the brightness when the sensor is turned on.

  Here, when the brightness of the light source 24 is unchanged, when the condenser unit 22 is lowered from the optical ideal position, the brightness when observed with the eyepiece 35 or the camera 37 is reduced. On the other hand, according to the microscope 1E having the configuration as described above, the illumination light can be adjusted to an optimum brightness according to the position of the capacitor unit 22, and therefore when observed with the eyepiece 35 or the camera 37. Brightness can be made constant.

  As described above, the microscope according to the present invention has been specifically described by the mode for carrying out the invention. However, the gist of the present invention is not limited to these descriptions, and is broadly based on the description of the claims. Must be interpreted. Needless to say, various changes and modifications based on these descriptions are also included in the spirit of the present invention.

  For example, in the first, third, fourth, and sixth embodiments described above, a reticle 27E as shown in FIG. 10 can be used instead of reticle 27 (or reticles 27A and 27B). The reticle 27E includes a cylindrical wire frame 275 and a wire 276 stretched in a cross shape on the wire frame 275.

  The reticle 27E having such a configuration can be used by being fixed or detachably attached to, for example, the adapter 28 (see FIGS. 2, 7, and 9) or the reticle holder 41 (see FIG. 6). In this way, by configuring the index line of the reticle 27E with the wire 276, foreign matter such as dust is less likely to accumulate, so that the risk of the foreign matter being visible in the field of view can be reduced. Note that the thickness of the wire 276 of the reticle 27E may be changed according to the magnification at the time of observing the specimen S. That is, when the specimen S is observed at a high magnification, the thin reticle 27E of the wire 276 may be used, and when the specimen S is observed at a low magnification, the thick reticle 27E of the wire 276 may be used.

  In the first embodiment described above, the reticle 27 is attached to the upper surface of the window lens 264 via the adapter 28, but only the reticle 27 is arranged on the upper surface of the window lens 264 without using the adapter 28. May be. In this case, it is necessary to align the center of the reticle 27 with the optical axis.

  In the first embodiment described above, for example, a transparent spacer may be installed between the reticle 27 and the window lens 264 to adjust the height. Thereby, since the position of the reticle 27 in the optical axis direction can be changed, the projection magnification when the reticle 27 is projected onto the specimen surface can be changed as in the third and fourth embodiments. Using the single reticle 27, the specimen S can be observed at various scales.

1, 1A, 1B, 1C, 1D, 1E Microscope 10 Microscope body 11a Base portion 11b Column portion 11c Arm portion 12 Stage holding member 13 Stage focusing handle 14 Capacitor guide 15 Capacitor focusing handle 20 Transmitting illumination optical system 21 Stage 22 Capacitor Unit 23 Centering knob 24 Light source 25 Collector lens 26 Field stop unit 261 Field stop 262 Unit main body 263 Field stop handle 264 Window lens 27, 27A, 27B, 27C, 27D, 27E Reticle (index member)
271 Crosshair 272 Scale 273 Concentric circle 274 Light shielding area 275 Wire frame 276 Wire 28 Adapter 281 Adapter body 282 Flange 31 Objective lens 32 Revolver 33 Lens tube 34 Switching lever 35 Eyepiece lens 36 Camera adapter 37 Camera 41 Reticle holder 43 Reticle guide 43 Guide holding part 44 Reticle focusing handle 45 Field stop unit holder 46 Field stop unit guide 47 Field stop unit guide holding part 48 Field stop focusing handle 49 Address sensor 50 Revolver position detection circuit 51, 56 CPU
52 Graphic controller (display control means)
53 Photo interrupter 54 Plate member 55 Sensor on / off detection circuit 57 D / A converter 58 Drive circuit (light quantity control means)

Claims (8)

A stage for placing the specimen;
A light source that generates illumination light for illuminating the specimen, a condenser lens that illuminates the specimen with the illumination light, and a transmission illumination optical system having a field stop that adjusts the range of illumination light radiated to the specimen;
An indicator member;
With
The condenser lens is movable along the optical axis of the transmission illumination optical system;
2. The microscope according to claim 1, wherein the index member is disposed in the vicinity of the field stop and at a position that can be conjugated with the sample by movement of the condenser lens. The field stop is disposed between the light source and the condenser lens;
The microscope according to claim 1, wherein the index member is disposed between the field stop and the condenser lens.   The microscope according to claim 1 or 2, wherein the index member is detachably attached to an upper surface of a window lens provided on the stage side of the field stop.   The microscope according to claim 1, wherein the index member is configured integrally with a window lens provided on the stage side of the field stop.   The microscope according to any one of claims 1 to 4, wherein the index member is configured to be movable along the optical axis in the vicinity of the field stop.   6. The display control unit according to claim 1, further comprising a display control unit configured to control display of an index line on the index member according to a magnification of an objective lens inserted into the optical axis. Microscope.   The microscope according to any one of claims 1 to 6, further comprising a light amount control unit that controls a light amount of the light source according to a position of the condenser lens in a direction of the optical axis.   The microscope according to any one of claims 1 to 7, wherein the indicator member has a light shielding region at an outer edge portion.