CN109387933A - Microscope - Google Patents

Abstract

Microscope (1) includes: objective table, is used to load sample；Transillumination optical system (20) has the light source (24) of the illumination light for generating irradiation sample, for the visual field aperture (261) of the collector lens (22a) to sample irradiation illumination light and the range for adjusting the illumination light irradiated to sample；And graticule (27), collector lens (22a) can be mobile along the optical axis of transillumination optical system (20), and graticule (27) configuration is near visual field aperture (261) and is the position for utilizing the movement of collector lens (22a) and capable of becoming conjugation with sample.

Description

Microscope

Technical field

The present invention relates to a kind of microscopes.

Background technique

Conventionally, there is known a kind of by the graticule being made of the glass plate for being imprinted with the markings such as cross hairs (レ チ Network Le) (graticule plate) is inserted into the microscope of eyepiece.User is by using such graticule, so as to thin in order to observe such as cancer The infiltration degree of born of the same parents and measure cancer cell from epidermis infiltrated several mm orVisual field in display's Markings are simultaneously counted in abnormal cell therein, determine the progress extent of disease.

On the other hand, the markings of graticule are only aobvious when instruction is as the cell of measurement object or limits count range Show, then becomes obstruction in usual observation.Thus, for example proposed in Japanese Unexamined Patent Publication 57-68209 bulletin by Correspondingly switch the mode that transparent/opaque electrooptic cell constitutes the markings of graticule with voltage is applied.In this way by electricity Optical element constitutes markings, and so as to only show markings in visual field in the case of necessary, therefore markings will not hamper Hinder the observation of sample.

But proposed in using Japanese Unexamined Patent Publication 57-68209 bulletin graticule in the case where, generate and below ask Topic.Firstly, in view of the deviation of chimeric loosening, markings center for mounting portion, the markings for being inserted into the graticule of eyepiece are easy In mistake occurs in optical axis vertical direction.In addition, in eyepiece and camera, since the optical path of the image of observation is different, because This field of view center is different.Therefore, the markings for being inserted into the graticule of eyepiece are shown with the picture registration taken by camera The markings shown become inconsistent.Thus, for example, teacher scene in teacher by the image viewing mark taken by camera In the case that sheet and student observe sample by eyepiece, teacher becomes difficult the correct position etc. of student's indicator cells.

In addition, markings are imprinted at transparent glass plate, which is inserted into the position with image surface conjugation.Cause This can also see the foreign matter even if adhering to the foreign matters such as a little dust in glass plate in visual field.But due to utilizing photograph Machine not can confirm that the foreign matter, therefore for example in the user by the image viewing sample taken by camera and by eyepiece Observe the deviation that understanding is generated between the user of sample.Also, it since graticule is made of glass plate, is inserted into eyepiece When need prudent operation, there is also cause stress such problems to user.

The present invention is to complete in view of the foregoing, and its purpose is to provide a kind of marks of graticule in usual observation Will line will not interfere the observation of sample and will not generate not when being observed when being observed using camera and using eyepiece The microscope of suitable sense.

Summary of the invention

The microscope of a technical solution of the invention includes: objective table, is used to load sample；Transillumination optical system System has the light source for generating the illumination light for irradiating the sample, for irradiating the poly- of the illumination light to the sample The visual field aperture of optical lens and the range for adjusting the illumination light irradiated to the sample；And mark component, it is described poly- Optical lens can be moved along the optical axis of the transillumination optical system, and the mark component configuration is in the visual field aperture It nearby and is the position for utilizing the movement of the collector lens and conjugation capable of being become with the sample.

As long as detailed description and accompanying drawings of the present invention in contradistinction to reads by below, it will be able to further understand the above theory Bright content, other purposes of the invention, feature, advantage and technically and the meaning in industry.

Detailed description of the invention

Fig. 1 is the figure for indicating the microscopical structure of embodiments of the present invention 1.

Fig. 2 is the amplification part for the structure of microscopical transillumination optical system for indicating embodiments of the present invention 1 Cross-sectional view.

Fig. 3 A is the figure for indicating can be applied to an example of microscopical graticule for embodiments of the present invention 1.

Fig. 3 B is the figure for indicating can be applied to another example of microscopical graticule of embodiments of the present invention 1.

Fig. 3 C is the figure for indicating can be applied to another example of microscopical graticule of embodiments of the present invention 1.

Fig. 4 A is the figure for indicating the structure of microscopical adapter of embodiments of the present invention 1.

Fig. 4 B is the figure for indicating the structure of microscopical adapter of embodiments of the present invention 1.

Fig. 5 is the amplification part for the structure of microscopical transillumination optical system for indicating embodiments of the present invention 2 Cross-sectional view.

Fig. 6 is the amplification part for the structure of microscopical transillumination optical system for indicating embodiments of the present invention 3 Cross-sectional view.

Fig. 7 is the amplification part for the structure of microscopical transillumination optical system for indicating embodiments of the present invention 4 Cross-sectional view.

Fig. 8 is the figure for indicating the structure of microscopical transillumination optical system of embodiments of the present invention 5.

Fig. 9 is the amplification part for the structure of microscopical transillumination optical system for indicating embodiments of the present invention 6 Cross-sectional view.

Figure 10 is the figure for indicating the structure of the variation of microscopical graticule of embodiments of the present invention.

Specific embodiment

Hereinafter, being described with reference to microscopical embodiment of the invention.In addition, the present invention is not limited to below Embodiment, the constituent element of the following embodiments and the accompanying drawings also include that those skilled in the art can replace and readily constitute and want Plain or substantially the same constituent element.

Embodiment 1

Referring to Fig.1~Fig. 4 illustrates the structure of the microscope 1 of embodiments of the present invention 1.As shown in Figure 1, present embodiment Microscope 1 mainly include microscope body 10, transillumination optical system 20, object lens 31, nosepiece 32, lens barrel 33, mesh Mirror 35, camera adapter 36 and camera 37.

Microscope body 10 has column portion 11b, Yi Jizhi of basal part 11a, the back side for standing up basal part 11a Hold in column portion 11b and towards face side extend arm 11c.Basal part 11a is directly to be positioned on desk equal, setting microscope The part in 1 place is configured with transillumination optical system 20 in the inside of basal part 11a.

Column portion 11b is integrated with basal part 11a in its lower end, keeps by objective table holding member 12 for loading The objective table 21 of sample S.Objective table holding member 12 is configured to scheme along what is configured in the direction of the optical axis in column portion 11b The guiding piece shown is mobile.In addition, " optical axis " indicates the optical axis of transillumination optical system 20.

The objective table 21 of objective table holding member 12 is held in using the operation of objective table focus handle 13 and along optical axis It moves in the up-down direction.The relative distance between the sample S and object lens 31 on objective table 21 changes as a result, carries out burnt Point adjustment.

Objective table holding member 12 has condenser guiding piece 14, which can make condenser unit 22 It is moved along optical axis.Condenser unit 22 is moved in the up-down direction using the operation of condenser focus handle 15.

Nosepiece 32 is mounted on the lower surface of arm 11c.It is equipped with again in nosepiece 32 in detachable mode The different multiple object lens 31 of rate.Then, make its rotation by operating nosepiece 32, to make the object lens 31 selected configuration in light On axis.

Lens barrel 33 is mounted on the upper surface of arm 11c in detachable mode, and there are two eyepieces 35, camera for installation Adapter 36 and camera 37.In addition, being equipped with the switching of the optical path for carrying out eyepiece 35 and camera 37 in lens barrel 33 Changer lever 34.

Transillumination optical system 20 mainly includes for generating the light source 24 for the illumination light for irradiating sample S, being used for mark The condenser unit 22 of this S irradiation illumination light and the visual field aperture list of the range for adjusting the illumination light to sample S irradiation Member 26.

The illumination light come from the irradiation of the light source 24 of transillumination optical system 20 is via collector lens 25 and condenser unit 22 irradiate to sample S.The light for having transmitted sample S forms observation figure using the imaging len (not shown) in object lens 31, lens barrel 33 Picture, user can cross eyepiece 35 or the image by the image viewing sample S taken by camera 37.

Condenser unit 22 is configured to move along optical axis, has collector lens 22a inside it.Visual field aperture list 26 configuration of member is on basal part 11a, as shown in Figure 2 comprising visual field aperture 261, unit main body 262, visual field aperture handle 263 And window mirror 264.In addition, in the figure, with section indicate the top of unit main body 262, window mirror 264, aftermentioned graticule 27 and Adapter 28.

Visual field aperture 261 configures between light source 24 and collector lens 22a.By rotating visual field aperture handle 263, from And the diameter of visual field aperture 261 changes.In addition, by the centering knob 23 of operation collector lens 22a, so as to make to gather Optical lens 22a is moved on the direction vertical with optical axis.Thereby, it is possible to so that the center of visual field aperture 261 is directed at field of view center.

Window mirror 264 is set to the side of the upside of visual field aperture 261, i.e. objective table 21, prevents the foreign matters such as dust from entering view Field aperture 261, and user is made directly not contact visual field aperture 261.It is configured in the upper surface of window mirror 264 by being imprinted with mark The graticule (mark component) 27 that the glass plate of will line is constituted.

Graticule 27 configures between visual field aperture 261 and collector lens 22a, is specifically disposed on visual field aperture 261 Near, and configured using the movement of condenser unit 22 in the position for becoming conjugation with sample S.Graticule 27 is across adapter 28 are mounted on the upper surface of window mirror 264 in detachable mode.

As graticule 27, the mark being for example imprinted with like that shown in Fig. 3 A in cross hairs 271 equipped with scale 272 can be used The component of line.In addition it is also possible to substitute graticule 27 and use example be imprinted with as shown in fig. 3b cross hairs 271 be equipped with it is multiple The graticule 27A of the markings of concentric circles 273.In addition it is also possible to substitute graticule 27 and use and be equipped with cross hairs 271 and in outer edge Graticule 27B with lightproof area 274.It is dry so as to be blocked using lightproof area 274 by using such graticule 27B Light is disturbed, and graticule 27B can be made to function as aperture.

In addition, the interval of the concentric circles 273 of the scale 272 of Fig. 3 A, Fig. 3 B needs to be set as to consider required for sample face It is worth obtained from interval.For example, the projection multiplying power when markings are projected on sample face is 0.5 times, is intended to show in sample face In the case where the line interval of 1mm, the line interval of the markings on graticule 27 is set as 1mm/0.5=2mm.In addition, markings Line width is also identical as line interval, such as the markings in the case where line width of sample face 0.1mm to be shown, on graticule 27 Line width be set as 0.1mm/0.5=0.2mm.

Adapter 28 is mounted on the upper surface of window mirror 264 in detachable mode.As shown in Figure 4 A and 4 B shown in FIG., adapter 28 flange parts that there is the adapter main body 281 for being formed as circular and extend on the inside of the inner circumferential of adapter main body 281 282.Graticule 27 is installed on flange part 282 in fixed or detachable mode.

Here, in the case where visual field aperture 261 and sample S are the positional relationships being optically conjugated, transillumination light System 20 becomes optical perfect condition.Thus, when being observed using eyepiece 35 and camera 37, it is only capable of seeing sample S。

On the other hand, in operation condenser focus handle 15, and make condenser unit 22 compared to transillumination optical system When the position decline for the case where system 20 is optical perfect condition, the markings and sample S of graticule 27, which become, to be optically conjugated Positional relationship.Thus, when being observed using eyepiece 35 and camera 37, other than it can see sample S, it can be seen that The markings of graticule 27.

Using the microscope 1 with above such structure, since the configuration of graticule 27 is in the movement using collector lens 22a And become the position of conjugation with sample S, therefore the markings of graticule 27 will not interfere the observation of sample S in usual observation, and User will not be allowed to generate sense of discomfort when being observed when being observed using camera 37 and using eyepiece 35.

That is, configuring condenser in such a way that transillumination optical system 20 is optical perfect condition in microscope 1 In the case where unit 22, focus is misaligned the markings of graticule 27, can't see markings.On the other hand, if making condenser unit 22 decline towards graticule 27 along optical axis direction, then in the positional relationship for becoming conjugation, the markings of focus alignment target 27, It can be seen that markings.It does not show the markings of graticule 27 in usual observation as a result, such as is only used as measurement object in instruction Cell or while limiting count range can show the markings of graticule 27.

In addition, in microscope 1, due to showing markings by software using camera unlike the past, but Identical graticule 27, therefore the markings and benefit of the graticule 27 observed using camera 37 are observed using camera 37 and eyepiece 35 Positional relationship with the markings of the graticule 27 of the observation of eyepiece 35 is consistent.Thus, such as in teacher scene teacher by by taking a picture In the case that the image viewing sample S and student that machine 37 takes observe sample S by eyepiece 35, teacher can refer to student Show the correct position etc. of cell.

In addition, in microscope 1, due to configuring graticule 27 across adapter 28 in the upper surface of window mirror 264, also not For the mistake in the chimeric loosening of mounting portion, optical axis vertical direction as generating in the past.In addition, in microscope 1, by It is configured with graticule 27 in the upper surface in window mirror 264, so even the foreign matters such as dust are attached in graticule 27, it also can be easily It cleans.

Embodiment 2

Illustrate the structure of the microscope 1A of embodiments of the present invention 2 referring to Fig. 5.In addition, identical as embodiment 1 below Incomplete structure explanation and diagram, only the structure different from the embodiment 1 is illustrated.

As shown in figure 5, microscope 1A, compared with embodiment 1, the structure of visual field aperture unit 26A is different.That is, Visual field aperture unit 26A is different from embodiment 1, and graticule 27C is integrally formed with window mirror.That is, graticule 27C is fixed on visual field light The top of the unit main body 262 of coil unit 26A, also has both the function of window mirror.

It is identical as the embodiment 1 using the microscope 1A with above such structure, in usually observation markers The markings of line 27C will not interfere the observation of sample S, and be seen when being observed using camera 37 and using eyepiece 35 User will not be allowed to generate sense of discomfort when examining.In addition, components can be reduced compared with embodiment 1 using microscope 1A Number, therefore cost can be cut down.

Embodiment 3

Illustrate the structure of the microscope 1B of embodiments of the present invention 3 referring to Fig. 6.In addition, identical as embodiment 1 below Incomplete structure explanation and diagram, only the structure different from the embodiment 1 is illustrated.

As shown in fig. 6, the graticule 27 of microscope 1B is configured near visual field aperture 261 to move along optical axis. That is, graticule 27 is not kept by the upper surface of window mirror 264 in microscope 1B, kept by graticule holder 41.

Graticule holder 41 is configured to move along the graticule guiding piece 42 configured in the direction of the optical axis.Graticule guidance Part 42 is installed on the graticule guiding piece maintaining part 43 in column portion 11b setting.In addition, being held in 27 benefit of graticule of graticule holder 41 It is moved in the up-down direction with the operation of graticule focus handle 44 along optical axis.

Using the microscope 1B with above such structure, can be changed according to the position on the optical axis direction of graticule 27 Become projection multiplying power when graticule 27 to be projected on to sample face.As a result, when being observed using eyepiece 35, camera 37, such as The interval of the scale 272 (referring to Fig. 3 A) of the markings of graticule 27 can arbitrarily be changed.Thus, it, can using microscope 1B Sample S is observed using a graticule 27 with various scale bars.

Embodiment 4

Illustrate the structure of the microscope 1C of embodiments of the present invention 4 referring to Fig. 7.In addition, identical as embodiment 3 below Incomplete structure explanation and diagram, only the structure different from the embodiment 3 is illustrated.

As shown in fig. 7, the graticule 27 of microscope 1C is configured to using the method different from embodiment 3 in visual field aperture It can be moved along optical axis near 261.That is, visual field aperture unit 26 is not maintained at basal part 11a in microscope 1C On, but it is held in visual field aperture unit holder 45.

Visual field aperture unit holder 45 is configured to along the visual field aperture unit guidance configured in the direction of the optical axis Part 46 is mobile.Visual field aperture unit guiding piece 46 is installed on the visual field aperture unit guiding piece maintaining part 47 in column portion 11b setting. In addition, being held in the visual field aperture unit 26 and the utilization visual field aperture focus handle 48 of graticule 27 of visual field aperture unit holder 45 Operation and moved in the up-down direction along optical axis.

Condenser unit 22 is adjusted to configure in most upper limit position in optical ideal position.In addition, being to be not provided with regarding Aperture unit 26 and the structure that directly configures graticule 27 in visual field aperture unit holder 45 is then preferable.

It is identical as the embodiment 3 using the microscope 1C with above such structure, it can be according to graticule 27 Optical axis direction on position and change projection multiplying power when graticule 27 to be projected on to sample face, therefore be able to use a graticule 27 observe sample S with various scale bars.

Embodiment 5

Illustrate the structure of the microscope 1D of embodiments of the present invention 5 referring to Fig. 8.In addition, identical as embodiment 1 below Incomplete structure explanation and diagram, only the structure different from the embodiment 1 is illustrated.

As shown in figure 8, microscope 1D has the display for the markings for correspondingly controlling graticule 27D with the multiplying power of object lens 31 Display control section.Graticule 27D is made of liquid crystal display.Microscope 1D is also wrapped other than the structure with embodiment 1 Include address sensor 49, nosepiece position detecting circuit 50, CPU (Central Processing Unit: central processing unit) 51 and the graphics controller (Graphics Controller) 52 that is functioned as display control section.In addition, figure Controller 52 is made of integrated circuits such as CPU, GPU (Graphics Processing Unit: graphics processing unit).

Address sensor 49 is sensed by the composition such as Hall element of position of object lens 31 being inserted on optical axis, in It is placed in nosepiece 32.Information from address sensor 49 is input to via nosepiece position detecting circuit 50 and CPU51 Graphics controller 52.Graphics controller 52 receives the information and changes the display content for the graticule 27D being made of liquid crystal display.

It, can be with the multiplying powers of object lens 31 correspondingly by graticule 27D's using the microscope 1D with the above such structure The line width of markings, line interval are changed to optimal mode.

Embodiment 6

Illustrate the structure of the microscope 1E of embodiments of the present invention 6 referring to Fig. 9.In addition, identical as embodiment 1 below Incomplete structure explanation and diagram, only the structure different from the embodiment 1 is illustrated.

As shown in figure 9, microscope 1E, which has, correspondingly controls light source 24 with the position on the optical axis direction of collector lens 22a Light quantity fader control component.Microscope 1E further includes optical chopper 53, plate other than the structure with embodiment 1 Component 54, sensor unlatching/shutdown detecting circuit 55, CPU56, D/A converter 57 and as fader control means play function The drive circuit 58 of energy.

Optical chopper 53 is installed on objective table holding member 12.Board member 54 is installed on condenser unit 22.In condenser In the case that unit 22 is configured at optical ideal position, board member 54 blocks optical chopper 53 and is sensor unlatching.It is another Aspect, when condenser unit 22 is configured at from the position that optical ideal position declines, board member 54 is de- from optical chopper 53 From and be sensor close.Using the sensor unlatching/shutdown detecting circuit 55 being connect with optical chopper 53 come detection sensor Open the state closed with sensor.

Drive is input to via CPU56 and D/A converter 57 by the signal that sensor unlatching/shutdown detecting circuit 55 detects Dynamic device circuit 58.Drive circuit 58 receives the signal and controls the brightness of the illumination light of light source 24.Light source 24 is based on driver The control of circuit 58 by sensor open when brightness on the basis of with when sensor is closed pre-set ratio increase The brightness of illumination light.

Here, in the case where the brightness of light source 24 is constant, when condenser unit 22 declines from optical ideal position, Brightness when being observed using eyepiece 35, camera 37 is become smaller.On the other hand, using with the micro- of such structure Illumination light correspondingly can be adjusted to optimal brightness with the position of condenser unit 22, therefore can make to utilize mesh by mirror 1E Mirror 35, brightness constancy when camera 37 is observed.

More than, microscope of the invention, but purport of the invention are specifically illustrated in the way of for carrying out an invention It is not limited to these records, it is necessary to which the record based on claim column widely explains.In addition, based on these record into It is self-evident that mode made of the various changes of row, change etc., which is also contained in purport of the invention,.

For example, can substitute graticule 27 (or graticule 27A, 27B) in the embodiment 1,3,4,6 and use figure Graticule 27E shown in 10.Graticule 27E has cylindric operation wire frame 275 and draws the behaviour for being set to operation wire frame 275 in crosswise Make line 276.

The graticule 27E being made of the structure for example can be installed on adapter 28 in a manner of fixed or can assemble and disassemble (referring to Fig. 2, Fig. 7 and Fig. 9), graticule holder 41 (referring to Fig. 6) use.Graticule 27E is constituted by operation lines 276 in this way Markings, so that the foreign matters such as dust are not easy to accumulate, therefore can reduce the risk that the foreign matter is seen in visual field.In addition, Can according to the observation sample S when multiplying power change the rugosity of the operation lines 276 of graticule 27E.That is, being also possible to high magnification The thinner graticule 27E of operation lines 276 is used in the case where observing sample S, behaviour is used in the case where observing sample S with low range Make the thicker graticule 27E of line 276.

In addition, graticule 27 is mounted on the upper surface of window mirror 264 across adapter 28 in the embodiment 1, but Only graticule 27 can be configured in the upper surface of window mirror 264 without using adapter 28.In this case, it carries out making graticule The contraposition of 27 center alignment optical axis.

In addition, in the embodiment 1, for example, can also be arranged between graticule 27 and window mirror 264 it is transparent every Off member and adjust height.Thereby, it is possible to change the position on the optical axis direction of graticule 27, therefore can be with the embodiment 3,4 similarly change projection multiplying power when graticule 27 to be projected on to sample face, therefore are able to use a graticule 27 with various each The scale bar of sample observes sample S.

Claims (8)

1. a kind of microscope, which is characterized in that

The microscope includes:

Objective table is used to load sample；

Transillumination optical system has the light source for generating the illumination light for irradiating the sample, is used for the sample Irradiate the collector lens of the illumination light and the visual field aperture of the range for adjusting the illumination light irradiated to the sample； And

Indicate component,

The collector lens can be moved along the optical axis of the transillumination optical system,

It is described mark component configuration near the visual field aperture and be using the collector lens movement and can be with institute Stating sample becomes the position of conjugation.

2. microscope according to claim 1, which is characterized in that

The visual field aperture configures between the light source and the collector lens,

The mark component configuration is between the visual field aperture and the collector lens.

3. microscope according to claim 1 or 2, which is characterized in that

The mark component is installed in detachable mode leans on the objective table side to be arranged in the visual field aperture The upper surface of window mirror.

4. microscope according to claim 1 or 2, which is characterized in that

The mark component is integrally formed with the window mirror by objective table side setting in the visual field aperture.

5. microscope according to claim 1 or 2, which is characterized in that

The mark component is configured near the visual field aperture to move along the optical axis.

6. microscope according to claim 1 or 2, which is characterized in that

The microscope has the markings that the mark component is correspondingly controlled with the multiplying power for the object lens being inserted on the optical axis Display display control section.

7. microscope according to claim 1 or 2, which is characterized in that

The microscope has the light that the light source is correspondingly controlled with the position on the direction of the optical axis of the collector lens The fader control component of amount.

8. microscope according to claim 1 or 2, which is characterized in that

The mark component has lightproof area in its outer edge.