JP2019021625A5 - - Google Patents

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Publication number
JP2019021625A5
JP2019021625A5 JP2018130470A JP2018130470A JP2019021625A5 JP 2019021625 A5 JP2019021625 A5 JP 2019021625A5 JP 2018130470 A JP2018130470 A JP 2018130470A JP 2018130470 A JP2018130470 A JP 2018130470A JP 2019021625 A5 JP2019021625 A5 JP 2019021625A5
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Japan
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target
axis
sample
electron beam
flaky
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JP2018130470A
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Japanese (ja)
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JP2019021625A (ja
JP7046746B2 (ja
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JP2018130470A 2017-07-11 2018-07-10 Ｘ線生成のための薄片成形されたターゲット Active JP7046746B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762531097P 2017-07-11 2017-07-11
US62/531,097 2017-07-11

Publications (3)

Publication Number Publication Date
JP2019021625A JP2019021625A (ja) 2019-02-07
JP2019021625A5 true JP2019021625A5 (https=) 2021-05-13
JP7046746B2 JP7046746B2 (ja) 2022-04-04

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JP2018130470A Active JP7046746B2 (ja) 2017-07-11 2018-07-10 Ｘ線生成のための薄片成形されたターゲット

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US (1) US10746672B2 (https=)
EP (1) EP3428928A1 (https=)
JP (1) JP7046746B2 (https=)
CN (1) CN109243947B (https=)

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US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2021011209A1 (en) 2019-07-15 2021-01-21 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
EP4111235A4 (en) 2020-02-26 2023-11-01 Shenzhen Xpectvision Technology Co., Ltd. IMAGING SYSTEMS AND METHODS OF USE
CN113764246B (zh) * 2020-06-03 2025-04-18 宁波伯锐锶电子束科技有限公司 一种显微镜
CN112213343B (zh) * 2020-12-03 2021-03-16 中国科学院自动化研究所 塑料条带承载生物超薄切片快速成像方法、系统、装置
DE112023000574B4 (de) 2022-01-13 2026-02-26 Sigray, Inc. Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
CN117062289A (zh) * 2023-08-09 2023-11-14 深圳综合粒子设施研究院 基于金属丝靶的射线源
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2026009290A1 (ja) * 2024-07-01 2026-01-08 株式会社日立ハイテク 電子線応用装置とその制御方法
CN121114108B (zh) * 2025-11-13 2026-01-23 哈尔滨工业大学(深圳)(哈尔滨工业大学深圳科技创新研究院) 一种在双束电镜内实现微区xrf的分析方法与系统

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