JP2018536298A - 量子ドット光検出器装置およびそれに関連する方法 - Google Patents
量子ドット光検出器装置およびそれに関連する方法 Download PDFInfo
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Abstract
Description
Claims (16)
- 第1の光検出器および第2の光検出器の対を少なくとも1対備える装置であって、
前記光検出器の対の各光検出器は、チャネル部材と、間にある前記チャネル部材に電流が流れるようにそれぞれ構成されたソース電極およびドレイン電極と、入射電磁放射線に暴露されると電子正孔対を生成して、前記チャネル部材を流れる前記電流の検出可能な変化をもたらすように構成された複数の量子ドットとを含み、
前記装置は、前記光検出器の対の前記第1の光検出器および前記第2の光検出器が、それぞれ前記チャネル部材を通る電流の増加および減少をもたらす電子正孔対を生成して、前記第1の光検出器および前記第2の光検出器の対の電流の前記変化の合計が、前記入射電磁放射線の存在および大きさのうちの一方または両方を示すように構成される
装置。 - 前記複数の量子ドットは、当該量子ドットに結合した配位子を含み、当該配位子は、生成された前記電子正孔対の電子または正孔のいずれかの、前記チャネル部材への移動を可能にし、移動しない方の電荷キャリアが前記量子ドットに残り、電流の前記検出可能な変化をもたらすように構成される、
請求項1に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器は、同じ型にドープされたチャネル部材を含み、電流にもたらす前記変化が互いに異なるよう、前記第1の光検出器の前記配位子は、前記第2の光検出器の前記配位子と異なる型の電荷キャリアの、それぞれの前記チャネル部材への移動を可能にするように構成される
請求項2に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器は、異なる型にドープされたチャネル部材を含み、電流にもたらす前記変化が互いに異なるよう、前記第1の光検出器の前記配位子は、前記第2の光検出器の前記配位子と同じ型の電荷キャリアの、それぞれの前記チャネル部材への移動を可能にするように構成される
請求項2に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器はそれぞれ、電圧が印加されると電界を発生させるように構成されたゲート電極を含み、発生した前記電界は、生成された前記電子正孔対の電子または正孔のいずれかの、前記チャネル部材への移動を可能にし、前記移動しない方の電荷キャリアが前記量子ドットに残り、電流の前記検出可能な変化をもたらす
請求項1〜4のいずれか1項に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器は、同じ型にドープされたチャネル部材を含み、電流にもたらす前記変化が互いに異なるよう、前記第1の光検出器の前記ゲート電極に印加される前記電圧は、結果として生じる前記電界が、異なる型の電荷キャリアの、それぞれの前記チャネル部材への移動を可能にするように、前記第2の光検出器の前記ゲート電極に印加される前記電圧と反対の極性を有する
請求項5に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器は、異なる型にドープされたチャネル部材を含み、電流にもたらす前記変化が互いに異なるよう、前記第1の光検出器の前記ゲート電極に印加される前記電圧は、結果として生じる前記電界が、同じ型の電荷キャリアの、それぞれの前記チャネル部材への移動を可能にするように、前記第2の光検出器の前記ゲート電極に印加される前記電圧と同じ極性を有する
請求項5に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器のうちの一方または両方の前記ゲート電極は、印加された前記電圧によって発生した前記電界が、前記配位子による電荷キャリアの、それぞれの前記チャネル部材への移動を促進または抑制するように構成される
請求項2〜4のいずれか1項に従属する請求項5〜7のいずれか1項に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器のうちの一方または両方の前記ゲート電極は、印加された前記電圧によって発生した前記電界が、それぞれの前記チャネル部材の静電気ドーピングを引き起こすように構成される
請求項5〜8のいずれか1項に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器は、電流の前記変化の合計が、対応する電圧信号に変換されるように配置される
請求項1〜9のいずれか1項に記載の装置。 - 前記光検出器の対の前記第1の光検出器および前記第2の光検出器は、電流の前記変化の合計をシングルエンド電圧信号に変換するように構成されたハーフブリッジ回路を形成するように配置される
請求項10に記載の装置。 - 前記装置は、前記電流の前記変化の合計を差動電圧信号に変換するように構成されたフルブリッジ回路を形成するように配置された第1の光検出器および第2の光検出器の対を少なくとも2対備える
請求項10に記載の装置。 - 前記装置は、前記光検出器の対の前記第1の光検出器および前記第2の光検出器が、前記チャネル部材をそれぞれ通る電流の増加および減少を同時にもたらす電子正孔対を生成するように構成される
請求項1〜12のいずれか1項に記載の装置。 - 第1の光検出器および第2の光検出器の対を少なくとも1対備える装置を使用する方法であって、
前記光検出器の対の各光検出器は、チャネル部材と、間にある前記チャネル部材に電流が流れるようにそれぞれ構成されたソース電極およびドレイン電極と、入射電磁放射線に暴露されると電子正孔対を生成して、前記チャネル部材を流れる前記電流の検出可能な変化をもたらすように構成された複数の量子ドットとを含み、
前記装置は、前記光検出器の対の前記第1の光検出器および前記第2の光検出器が、それぞれ前記チャネル部材を通る電流の増加および減少をもたらす電子正孔対を生成して、前記第1の光検出器および前記第2の光検出器の対の電流の変化の合計が、前記入射電磁放射線の存在および大きさのうちの一方または両方を示すように構成され、
前記方法は、前記入射電磁放射線の結果として、前記第1の光検出器および前記第2の光検出器の対の電流の前記変化の合計に基づいて、前記装置上の入射電磁放射線の存在の判定および大きさの測定のうちの一方または両方を行うステップを含む
方法。 - 第1の光検出器および第2の光検出器の対を少なくとも1対備える装置を作製する方法であって、
前記光検出器の対の各光検出器は、チャネル部材と、間にある前記チャネル部材に電流が流れるようにそれぞれ構成されたソース電極およびドレイン電極と、入射電磁放射線に暴露されると電子正孔対を生成して、前記チャネル部材を流れる前記電流の検出可能な変化をもたらすように構成された複数の量子ドットとを含み、
前記方法は、前記光検出器の対の前記第1の光検出器および前記第2の光検出器が、それぞれ前記チャネル部材を通る電流の増加および減少をもたらす電子正孔対を生成して、前記第1の光検出器および前記第2の光検出器の対の電流の前記変化の合計が、前記入射電磁放射線の存在および大きさのうちの一方または両方を示すように前記装置を構成するステップを含む
方法。 - 請求項14または15に記載の方法を実行するように構成されたコンピュータコードを含むコンピュータプログラム。
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