JP2018526064A5 - - Google Patents

Download PDF

Info

Publication number
JP2018526064A5
JP2018526064A5 JP2018501245A JP2018501245A JP2018526064A5 JP 2018526064 A5 JP2018526064 A5 JP 2018526064A5 JP 2018501245 A JP2018501245 A JP 2018501245A JP 2018501245 A JP2018501245 A JP 2018501245A JP 2018526064 A5 JP2018526064 A5 JP 2018526064A5
Authority
JP
Japan
Prior art keywords
ray radiation
ray
mirror
radiation
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2018501245A
Other languages
English (en)
Japanese (ja)
Other versions
JP6545353B2 (ja
JP2018526064A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2016/066596 external-priority patent/WO2017009363A1/en
Publication of JP2018526064A publication Critical patent/JP2018526064A/ja
Publication of JP2018526064A5 publication Critical patent/JP2018526064A5/ja
Application granted granted Critical
Publication of JP6545353B2 publication Critical patent/JP6545353B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2018501245A 2015-07-14 2016-07-13 変調されたx線放射による撮像 Expired - Fee Related JP6545353B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15176597.1 2015-07-14
EP15176597 2015-07-14
PCT/EP2016/066596 WO2017009363A1 (en) 2015-07-14 2016-07-13 Imaging with modulated x-ray radiation

Publications (3)

Publication Number Publication Date
JP2018526064A JP2018526064A (ja) 2018-09-13
JP2018526064A5 true JP2018526064A5 (OSRAM) 2019-02-07
JP6545353B2 JP6545353B2 (ja) 2019-07-17

Family

ID=53541613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018501245A Expired - Fee Related JP6545353B2 (ja) 2015-07-14 2016-07-13 変調されたx線放射による撮像

Country Status (5)

Country Link
US (1) US10925556B2 (OSRAM)
EP (1) EP3322341B1 (OSRAM)
JP (1) JP6545353B2 (OSRAM)
CN (1) CN107847201B (OSRAM)
WO (1) WO2017009363A1 (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3603516A1 (de) * 2018-08-02 2020-02-05 Siemens Healthcare GmbH Röntgenvorrichtung und verfahren zum betrieb der röntgenvorrichtung
KR20210109304A (ko) * 2020-02-27 2021-09-06 주식회사 에이치디엑스윌 동적 제어가 가능한 콜리메이터를 구비한 콘빔 ct 장치

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4242588A (en) * 1979-08-13 1980-12-30 American Science And Engineering, Inc. X-ray lithography system having collimating optics
US5077774A (en) * 1989-07-12 1991-12-31 Adelphi Technology Inc. X-ray lithography source
US6031892A (en) * 1989-12-05 2000-02-29 University Of Massachusetts Medical Center System for quantitative radiographic imaging
EP0498908A1 (de) * 1991-02-13 1992-08-19 Siemens Aktiengesellschaft Speicherleuchtschirm mit einem stimulierbaren Speicherleuchtstoff
US5268951A (en) 1992-12-22 1993-12-07 International Business Machines Corporation X-ray beam scanning method for producing low distortion or constant distortion in x-ray proximity printing
JP3078168B2 (ja) 1994-02-28 2000-08-21 三菱電機株式会社 電磁波検出装置及び基板加工装置
US5757882A (en) * 1995-12-18 1998-05-26 Osmic, Inc. Steerable x-ray optical system
GB9920327D0 (en) 1999-08-28 1999-11-03 Koninkl Philips Electronics Nv Menu display for a graphical user interface
DE10236640B4 (de) * 2002-08-09 2004-09-16 Siemens Ag Vorrichtung und Verfahren zur Erzeugung monochromatischer Röntgenstrahlung
US6917667B2 (en) * 2002-09-03 2005-07-12 Rigaku Corporation Method and apparatus for making parallel X-ray beam and X-ray diffraction apparatus
KR100576921B1 (ko) * 2003-01-15 2006-05-03 한국원자력연구소 고광도의 평행빔 생성 장치
DE10322137A1 (de) * 2003-05-16 2004-12-16 Siemens Ag Röntgengerät mit verbesserter Effizienz
US7068754B2 (en) 2003-06-30 2006-06-27 Siemens Medical Solutions Usa, Inc. System to generate therapeutic radiation
WO2005010799A2 (en) * 2003-07-16 2005-02-03 Shrenik Deliwala Optical encoding and reconstruction
WO2005091225A1 (en) * 2004-03-17 2005-09-29 Philips Intellectual Property & Standards Gmbh Beam-hardening and attenuation correction for coherent-scatter ct
US7330535B2 (en) * 2005-11-10 2008-02-12 General Electric Company X-ray flux management device
DE102006015933B3 (de) * 2006-04-05 2007-10-31 Incoatec Gmbh Vorrichtung und Verfahren zum Justieren eines optischen Elements
ATE547803T1 (de) 2007-06-21 2012-03-15 Koninkl Philips Electronics Nv Schnelle dosismodulierung über z-deflektion in einer rotierenden anode oder einer rotierenden rahmenröhre
US20090041198A1 (en) * 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
US7742566B2 (en) * 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
JP4650642B2 (ja) * 2007-12-13 2011-03-16 株式会社エーイーティー X線発生装置
CA2709216C (en) * 2008-01-30 2013-07-02 Reflective X-Ray Optics Llc Mirror mounting, alignment, and scanning mechanism and scanning method for radiographic x-ray imaging, and x-ray imaging device having same
WO2010051469A1 (en) 2008-10-30 2010-05-06 Kenneth Oosting X-ray beam processor
JP4868034B2 (ja) * 2009-07-16 2012-02-01 横河電機株式会社 放射線検査装置
JP4919115B2 (ja) * 2009-09-24 2012-04-18 横河電機株式会社 放射線検査装置
EP2494576A2 (en) 2009-10-28 2012-09-05 Koninklijke Philips Electronics N.V. Switching of anode potential of an x-ray generating device
JP4911373B2 (ja) * 2009-11-26 2012-04-04 横河電機株式会社 X線測定装置
JP2011112561A (ja) * 2009-11-27 2011-06-09 Yokogawa Electric Corp X線測定装置
JP4883378B2 (ja) * 2009-12-22 2012-02-22 横河電機株式会社 放射線検出装置
JP2011164043A (ja) * 2010-02-15 2011-08-25 Yokogawa Electric Corp X線装置
DE102010022851B4 (de) * 2010-06-07 2014-11-13 Siemens Aktiengesellschaft Röntgenstrahlungsvorrichtung zur Erzeugung von quasimonochromatischer Röntgenstrahlung und Radiographie-Röntgenaufnahmesystem
US8311184B2 (en) * 2010-08-30 2012-11-13 General Electric Company Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices
US20130114795A1 (en) * 2011-09-22 2013-05-09 Canon Kabushiki Kaisha X-ray waveguide, method for manufacturing x-ray waveguide, and method for controlling x-ray waveguide
US9117622B2 (en) 2012-08-08 2015-08-25 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Miniaturized high-speed modulated X-ray source
CN103234987B (zh) 2013-04-17 2015-06-03 同济大学 一种时间分辨的多色单能x射线成像谱仪

Similar Documents

Publication Publication Date Title
US20150071402A1 (en) X-ray imaging system
JP2020501130A5 (OSRAM)
CN106461579B (zh) X射线衍射装置
US10141186B2 (en) Target image-capture device, extreme-ultraviolet-light generation device, and extreme-ultraviolet-light generation system
US10248027B2 (en) Projection system
KR987000797A (ko) X-선 초점이동 보상시스템(X-ray focal spot movement compensation system)
JP2009536717A5 (OSRAM)
JP2012049134A5 (OSRAM)
CN108096718A (zh) 加速器系统和控制方法
IL312300B2 (en) Optical systems, metrology apparatus and associated methods
ES2808908T3 (es) Obtención de imágenes por retroalimentación de dosis ultra-bajas con fuentes láser Compton de rayos X y rayos gamma
JP2018526064A5 (OSRAM)
JP2018189572A5 (OSRAM)
RU2545095C1 (ru) Устройство для испускания лучей и система формирования изображений с данным устройством
US7736055B2 (en) X-ray device
KR101734944B1 (ko) 상하이동식 조리개를 이용한 방사선 조사야 조절장치와 그 방법
JP2014168608A5 (OSRAM)
JP6937025B2 (ja) X線回折装置
JP6545353B2 (ja) 変調されたx線放射による撮像
US9020098B2 (en) Radiation imaging apparatus
KR102185019B1 (ko) 다중 레이저 대즐링 효과도 측정 장치
JP5548505B2 (ja) コヒーレント放射を一様化するための装置
EP3322340B1 (en) Imaging with enhanced x-ray radiation
KR102613795B1 (ko) 선폭이 조절된 광을 이용한 오브젝트 스캔 방법 및 장치
KR102139670B1 (ko) 레이저 대즐링 효과도 측정 장치 및 방법