JP2018205147A - Circuit board connection fitting, sensor for measurement, and measurement device - Google Patents

Abstract

To provide a circuit board connection fitting for preventing a measurement object liquid from being in contact with a connecting electrode of a circuit board for measurement and a connector brought into contact with this connecting electrode.SOLUTION: A circuit board connection fitting includes: an O ring 54 configured to be electrically connectable with a measurement circuit board 4 formed in one surface Fa with a connecting electrode provided with a liquid contact part in contact with a measurement object liquid and disposed at a location facing one surface Fa of the measurement circuit boar 4 when mounted with the measurement circuit board 4 and made to contact one surface Fa so as to surround the forming location of the connecting electro in one surface Fa; ; a probe pin 53 connected to a conductor 52 for being connected to a measurement device main body and disposed at an inner side of a layout area of the O ring 54 so as to electrically contact with the connecting electrode when mounted with the measurement circuit board 4; and a pressing part for contacting the other surface Fb in the measurement circuit board 4 and pressing at least one surface Fa toward the probe pin 53 and the O ring 54.SELECTED DRAWING: Figure 3

Description

  The present invention relates to a substrate connector configured such that a measurement substrate provided with a liquid contact portion that comes into contact with a measurement target liquid can be electrically connected to a measurement apparatus main body, such a substrate connector and a measurement target substrate And a measurement apparatus configured to include such a measurement sensor and a measurement apparatus main body.

  For example, in the following patent document, a counter electrode, a reference electrode, and a working electrode (hereinafter also referred to as “measurement electrode” when they are not distinguished from each other) are formed on the substrate surface of an insulating substrate (a flat substrate). An invention of a metal ion sensor (substrate type sensor: hereinafter also referred to as “measuring substrate”) is disclosed.

  This measurement substrate is connected to a connector for connecting to a measuring instrument and is connected to a connector in the connector (measurement terminal: connection electrode: hereinafter also referred to as “connection electrode”) Are formed on the same substrate surface as the formation surface of each measurement electrode, and each measurement electrode and each connection electrode are connected to each other by a lead wiring (wiring member: hereinafter also referred to as “conductor pattern”). Electrically connected. Therefore, in this measurement substrate, each measurement electrode is inserted into the connector and the connection electrode is brought into contact with the connector in the connector so that each measurement electrode has a conductor pattern, a connection electrode, and a connection electrode. It will be in the state connected to the measuring device via the connector (connector).

  In the measurement process (electrochemical measurement process) using this measurement substrate, as an example, by inserting the measurement substrate into the connector provided at one end of the wiring cable connected to the measuring instrument, The measurement substrate (measurement electrode) is connected to the measuring instrument via the connector. Next, the measurement substrate is immersed in the measurement target liquid in the container, and each measurement electrode is brought into contact with the measurement target liquid. Subsequently, the measuring device is operated to execute a desired electrochemical measurement process. Thereby, various measurement values required for the analysis of the measurement target liquid are acquired.

JP 2014-102257 A (pages 19-38, FIG. 1-42)

  However, the measurement process using the above-described measurement substrate has the following problems to be solved. Specifically, in the measurement process using the above-described measurement substrate, the measurement substrate is inserted into the connector, and each connection electrode is brought into contact with each connector in the connector so that each measurement electrode is used as a measuring instrument. In this state, each measurement electrode is brought into contact with the measurement target liquid by immersing the measurement substrate in the measurement target liquid.

  In this case, in the above-described measurement substrate, since the conductor pattern that connects each measurement electrode and each connection electrode to each other is configured by an inner layer pattern, each measurement electrode is in contact with the measurement target liquid. Thus, when the measurement substrate is immersed in the measurement target liquid, the conductor pattern does not come into contact with the measurement target liquid. In addition, when the measurement substrate is immersed in the measurement target solution, only the formation site of each measurement electrode is immersed in the measurement target solution (so that the connector does not contact the measurement target solution). In order to adjust the insertion depth of the measurement substrate, each connection electrode or connector (each connector) is not in contact with the liquid to be measured in a normal usage pattern.

  However, for example, the measurement substrate (or connector) is detached from the holder (or the hand of the measurer) that holds the measurement substrate (or connector) on the container in which the liquid to be measured is stored. When dropped, the connection electrodes of the measurement substrate and the connectors of the connector are in contact with the liquid to be measured in the container.

  In this case, if each connection electrode or each connector comes into contact with the liquid to be measured during the measurement process (while voltage is being applied to each measurement electrode), the wrong measured value is measured, or in the worst case In some cases, the measuring instrument (measurement circuit) is damaged. Moreover, regardless of whether the measurement is being performed or not being measured, when each connection electrode or each connector comes into contact with the measurement target liquid, the operation of removing (cleaning) the measurement target liquid from them is performed. Necessary. In addition, depending on the components of the liquid to be measured, the surface of each connection electrode or each connector is modified and becomes unusable, making it difficult to reuse the measurement board or replacing the connector. It occurs.

  Even if the measurement substrate or connector is not dropped into the measurement target liquid, the measurement target liquid splashes when the measurement substrate is immersed in the measurement target liquid or when the measurement substrate is pulled up from the measurement target liquid. This splash may permeate into the insertion portion (gap) of the measurement substrate with respect to the connector and the measurement target liquid may come into contact with each connection electrode or each connector. In addition to the measurement process of immersing the measurement substrate (measurement electrode) in the measurement target solution, the measurement target solution is dropped on the same substrate (measurement electrode) as the measurement substrate. Even during the measurement process of the droplet method in which the measurement is performed, there is a possibility that the measurement target liquid is in contact with each connection electrode or each connector, and thus the same problem as in the measurement process of the immersion method occurs.

  The present invention has been made in view of such problems, and a substrate connector that can suitably avoid contact of a measurement target liquid with a connection electrode of a measurement substrate or a connector brought into contact with the measurement electrode, and measurement The main object is to provide a sensor and a measuring device.

  In order to achieve the above object, the substrate connector according to claim 1 is provided with a liquid contact portion in contact with the liquid to be measured, and at least one surface of the connection electrode electrically connected to the liquid contact portion. A substrate connection tool configured to be electrically connectable to a measurement apparatus main body, and when the measurement substrate is mounted, the at least one surface of the measurement substrate An annular elastic body that is disposed in an opposing portion and is brought into contact with the at least one surface so as to surround the connection electrode forming portion on the at least one surface, and a connection for connecting to the measuring device main body In addition to being connected to a conductor, it is disposed inside the region where the annular elastic body is disposed so as to be in contact with and electrically connected to the connection electrode when the measurement substrate is mounted. And connectors, and a wherein at least one of the contacts on the back surface pressing presses toward the at least one surface to the annular elastic body and the connecting element unit in the measurement substrate.

  According to a second aspect of the present invention, there is provided the substrate connector according to the first aspect, wherein the connector elastic body, the connector main body in which the connection conductor and the connector are disposed, and the pressing portion are disposed. And a movable part that is attached to the connector main body so as to be movable toward and away from the connector main body and sandwiches the measurement substrate together with the connector main body.

  According to a third aspect of the present invention, there is provided the substrate connector according to the second aspect, wherein a substrate mounting portion on which the measurement substrate can be mounted is provided on either the connector main body or the movable portion. Yes.

  The substrate connector according to claim 4 is the substrate connector according to claim 3, wherein the measurement on the substrate mounting portion is in contact with the peripheral portion of the measurement substrate placed on the substrate mounting portion. There is provided a movement restricting portion for restricting movement of the measurement substrate along the mounting surface of the measurement substrate.

  The substrate connector according to claim 5 is the substrate connector according to claim 3 or 4, wherein the substrate mounting portion has an opening communicated in a thickness direction of the measurement substrate to be mounted; At least one of a concave portion that creates a gap with the measurement substrate to be placed is formed.

  A measurement sensor according to a sixth aspect includes the substrate connector according to any one of the first to fifth aspects, and the measurement substrate.

  A measuring apparatus according to a seventh aspect includes the measuring sensor according to the sixth aspect and the measuring apparatus main body.

  In the substrate connector according to claim 1, when the measurement substrate is mounted, the connection electrode is disposed on a portion of the measurement substrate facing the formation surface (at least one surface) of the connection electrode. An annular elastic body that is brought into contact with the forming surface so as to surround the forming portion, and a region where the annular elastic body is disposed so as to be in contact with the connection electrode and electrically connected to the connection electrode when the measurement substrate is mounted. And a pressing portion that contacts the back surface of the connection electrode forming surface of the measurement substrate and presses the forming surface toward the annular elastic body and the connector. According to a sixth aspect of the present invention, there is provided a measurement sensor comprising the above-described substrate connector and a measurement substrate. Furthermore, a measuring apparatus according to a seventh aspect includes the above-described measuring sensor and a measuring apparatus main body.

  Therefore, according to the substrate connector according to claim 1, the measurement sensor according to claim 6, and the measurement device according to claim 7, one of the measurement substrates in a state in which the measurement substrate is mounted on the substrate connector. Electrode for connecting the measurement substrate and the substrate in a sealed space formed by the inner surface of the ring elastic body and the inner portion of the annular elastic body in the substrate connector (a portion facing the one surface of the measurement substrate) Since the connector in the connector is located, splash of the measurement target liquid adheres to the outer surface of the substrate connection tool or the measurement substrate, or the substrate connection tool and the measurement substrate are accidentally dropped into the measurement target liquid. Even in such a case, it is possible to suitably avoid a situation in which the liquid to be measured comes into contact with the connection electrode or the connector. As a result, high-precision measurement processing using the measurement substrate can be performed over a long period of time without cleaning the connection electrodes and connectors or replacing parts.

  3. The board connector according to claim 2, wherein a connector main body provided with an annular elastic body, a connecting conductor and a connector, and a pressing portion are provided and can be moved toward and away from the connector main body. And a movable part that is attached to the main body and sandwiches the measurement substrate together with the connector main body. Therefore, according to the substrate connector according to claim 2, the measurement sensor including such a substrate connector, and the measurement apparatus including such a measurement sensor, for example, the same as the end face shape of the measurement substrate A slit of the same size is formed in the shape of this, and the measurement substrate is inserted into the slit so that the connector is brought into contact with the connection electrode, and the annular elastic body is brought into contact with one surface of the measurement substrate Unlike the substrate connector having the configuration, by separating the movable portion from the connector main body when attaching or detaching the measurement substrate, the measurement substrate can be attached or detached without sliding with respect to the connector or the annular elastic body. Therefore, the service life of the connector and the annular elastic body can be sufficiently increased.

  According to a third aspect of the present invention, there is provided a substrate mounting portion on which the measurement substrate can be mounted on either the connector main body or the movable portion. Therefore, according to the board connector according to claim 3, the measurement sensor provided with such a board connector, and the measurement apparatus provided with such a measurement sensor, the measurement board is provided with respect to the board connector. Since the situation of wobbling can be avoided, the occurrence of contact failure of the connector with respect to the connection electrode can be preferably avoided. In addition, by providing a substrate placement portion that is sufficiently larger than the measurement substrate, the substrate placement portion functions as a guard member, so that the measurement substrate comes into contact with and breaks a container that stores the liquid to be measured. The situation can be suitably avoided.

  According to a fourth aspect of the present invention, there is provided the substrate connector, wherein the movement restricting portion that restricts the movement of the measurement substrate along the placement surface of the measurement substrate in the substrate placement portion in contact with the peripheral portion of the measurement substrate to be placed. It is provided in the substrate platform. Therefore, according to the board connector of claim 4, the measurement sensor provided with such a board connector, and the measurement apparatus provided with such a measurement sensor, the measurement board is provided by the connector body and the movable part. In a state where the connector is sandwiched, it is possible to reliably maintain the state in which the connector is brought into contact with the connection electrode. In addition, it is possible to suitably avoid a situation in which the measurement substrate slides down from the substrate mounting portion in a state where the movable portion is separated from the connector main body when the measurement substrate is attached or detached.

  In the substrate connector according to claim 5, at least one of an opening communicated in the thickness direction of the measurement substrate to be placed and a concave portion that creates a gap between the measurement substrate to be placed is provided. It is formed on the substrate platform. Therefore, according to the substrate connector according to claim 5, the measurement sensor including such a substrate connector, and the measurement apparatus including such a measurement sensor, the measurement mounted on the substrate mounting portion Since the measurement substrate can be easily detached, the situation where the measurement substrate is damaged at the time of removal from the substrate connector can be suitably avoided.

1 is a configuration diagram of a measuring device 1. FIG. 3 is a plan view of a measurement substrate 4. FIG. It is sectional drawing of the board | substrate connector 30 of the state which mounted | wore the board | substrate 4 for a measurement. 5 is a cross-sectional view for explaining attachment / detachment of the measurement substrate 4 to / from the substrate connector 30. FIG. 3 is an external perspective view of a board connector 30. FIG. 6 is another external perspective view of the board connector 30. FIG. FIG. 6 is an external perspective view of a probe pin 53 and a rubber sheet 54a which is another example of an “annular elastic body”. It is an external appearance perspective view of the board connector 30A. It is an external appearance perspective view of the board connector 30B. It is an external appearance perspective view of the board connector 30C.

  Hereinafter, embodiments of a substrate connector, a measurement sensor, and a measurement apparatus will be described with reference to the accompanying drawings.

  A measuring apparatus 1 shown in FIG. 1 is an electrochemical measuring apparatus that is an example of a “measuring apparatus”, and includes a measuring apparatus body 2, a sensor cable 3, and a measurement substrate 4, and is an example of a “measuring liquid”. Various electrochemical measurement processes for the electrolytic solution X such as an electrolytic plating solution can be executed.

  In this case, the measurement substrate 4 is a substrate-type sensor (a chip electrode for electrochemical measurement) which is an example of a “measurement substrate”, and as shown in FIG. Electrodes 11a and 11b (pattern electrodes: an example of “liquid contact portion”) and connection electrodes 12a and 12b (for connecting both measurement electrodes 11a and 11b to the measurement apparatus main body 2 via the sensor cable 3) Land for connection: (an example of “connection electrode”), and conductor patterns 13a, 13b for connecting the measurement electrodes 11a, 11b and the connection electrodes 12a, 12b to each other are provided on one surface Fa (“at least An example of “one surface”).

  In the measurement substrate 4, as an example, the entire area of the one surface Fa excluding the measurement electrodes 11 a and 11 b and the connection electrodes 12 a and 12 b is covered with an insulating film resistant to an electrolytic solution such as the electrolytic solution X for protection. (Not shown). In the following description, when the measurement electrodes 11a and 11b are not distinguished from each other, they are also referred to as “measurement electrodes 11”, and when the connection electrodes 12a and 12b are not distinguished from each other, they are also referred to as “connection electrodes 12” and the conductor patterns 13a and 13b. Are also referred to as “conductor pattern 13”.

  Moreover, although the example using the measurement board | substrate 4 in which the two measurement electrodes 11 were formed is demonstrated, in order to perform the electrochemical measurement process by tripolar measurement, the 3rd measurement electrode 11 was formed. A “measuring substrate” can also be used. Although illustration and description are omitted, in the tripolar measurement, the measurement substrate 4 on which the two measurement electrodes 11 are formed as described above and the measurement substrate 4 are separated from the “measurement electrode (one example). The rod-shaped electrode) ”can be used together to perform the measurement process.

  On the other hand, the measurement apparatus main body 2 is an example of a “measurement apparatus main body”, and includes a measurement unit 21, an operation unit 22, a display unit 23, a processing unit 24, and a storage unit 25 as shown in FIG. ing. The measurement unit 21 performs various electrochemical measurement processes on the electrolytic solution X using the measurement substrate 4 connected via the sensor cable 3. The measurement unit 21 includes a potentiostat, an I / V conversion circuit, a voltage value measurement circuit, and the like. However, since these configurations and operations are known, illustration and detailed description thereof are omitted.

  The operation unit 22 includes an operation switch for instructing start / stop of measurement and an operation switch for setting an operation condition (measurement condition) of the measurement apparatus main body 2. The display unit 23 displays the measurement result by the measurement unit 21 according to the control of the processing unit 24. The processing unit 24 controls the measuring apparatus main body 2 in a comprehensive manner. Specifically, the processing unit 24 controls the measurement unit 21 to execute measurement processing, and displays the measurement result on the display unit 23 or stores the measurement result in the storage unit 25. The storage unit 25 stores an operation program of the processing unit 24 and a measurement result by the measurement unit 21.

  The sensor cable 3 constitutes an example of a “measurement sensor” together with the measurement substrate 4 in a state where the measurement substrate 4 is attached. As shown in FIG. 1, the sensor cable 3 includes a board connector 30 and a cable body 31. The substrate connector 30 is an example of a “substrate connector”, and the measurement substrate 4 is electrically connected to the measurement device body 2 (measurement unit 21) via the cable body 31 (insulated conductive wire). It is configured so that it can be connected.

  As shown in FIGS. 3 and 4, the board connector 30 includes a connector body 41, a movable portion 42, a support shaft 43, a screw 44, and a coil spring 45. The connector main body 41 is an example of a “connector main body”, and includes a base body 51, a pair of conductors 52, 52, a pair of probe pins 53, 53, an O-ring 54, and a lid body 55. The cable body 31 is drawn out from the right end side, not shown. In both figures, only one of the pair of conductors 52 and 52 and only one of the pair of probe pins 53 and 53 are illustrated.

  The base 51 is configured to be able to attach the respective constituent elements 52 to 55, and is configured to be able to attach the movable portion 42 via the support shaft 43. Further, the base 51 is formed with a screw hole 51a into which the screw 44 can be screwed. The conductor 52 together with the cable body 31 constitutes a “connecting conductor”, and a probe pin 53 is attached (electrically connected) to one end side (left end side in both figures). The cable main body 31 is connected to the right end portion side not shown in FIG.

  The probe pin 53 is a telescopic pin-like probe that is an example of a “connector”, and is attached to the base body 51 together with the conductor 52 in a state of being attached to the conductor 52. As shown in FIG. 3, when the measurement substrate 4 is attached to the substrate connector 30, the probe pins 53 are in contact with the measurement substrate 4 (connection electrode 12) and the connection electrodes 12 It is attached to the base 51 so as to be electrically connected.

  The O-ring 54 is an example of an “annular elastic body”, and is disposed in a portion of the base 51 that faces the one surface Fa of the measurement substrate 4 when the measurement substrate 4 is attached to the substrate connector 30. It is made to contact one surface Fa so that the formation site | part (electrode formation area A12 shown in FIG. 2) of measurement electrode 11a, 11b in one surface Fa of the measurement board | substrate 4 may be enclosed. In FIG. 2, a portion where the O-ring 54 contacts the one surface Fa of the measurement substrate 4 (arrangement region of the annular elastic body) is indicated by a broken line.

  The lid body 55 is fixed to the base body 51 so as to sandwich the conductor 52 with the probe pin 53 attached thereto, so that the conductor 52 (probe pin 53) can be held together with the base body 51. It is configured as follows.

  The movable portion 42 is an example of a “movable portion”, and can be rotated with respect to the connector main body 41 (an example of “contact / separation movement with respect to the connector main body”). As shown in FIG. 3, it is configured so that one end of the measurement substrate 4 can be clamped together with the connector main body 41.

  As shown in FIGS. 3 and 4, the movable portion 42 is in contact with the other surface Fb (the back surface of the surface on which the connection electrode 12 is formed: an example of “the back surface of at least one surface”) of the measurement substrate 4. A pressing portion 61 (an example of a “pressing portion”) that presses one surface Fa toward the probe pin 53 and the O-ring 54, and a substrate mounting portion 62 (“substrate mounting portion”) on which the measurement substrate 4 can be mounted. One example side (right end side in both figures) of the pressing part 61 is pivotally supported by the connector main body 41 via the support shaft 43 (the “substrate mounting part” is provided in the “movable part”). Example of a configured configuration).

  The pressing portion 61 is formed with an insertion hole 61 a through which the support shaft 43 can be inserted and an insertion hole 61 b through which the screw 44 can be inserted. As shown in FIG. 5, the substrate mounting portion 62 is in contact with the peripheral portion of the measurement substrate 4 to be placed, and the measurement substrate along the mounting surface F <b> 62 of the measurement substrate 4 in the substrate mounting portion 62. 4 is provided with a movement restriction rib 63 (an example of a “movement restriction portion”). Further, the substrate mounting portion 62 is formed with a notch 64 (an example of an “opening”) communicated in the thickness direction of the measurement substrate 4 to be mounted.

  The screw 44 is screwed into the screw hole 51a of the base body 51 in the connection tool body 41 in a state where the screw 44 is inserted through the insertion hole 61a of the pressing part 61 in the movable part 42, whereby the connection tool body 41 (base body 51) is inserted. The movable portion 42 (pressing portion 61) is brought close to the measurement tool 4 on the substrate mounting portion 62 by the connector main body 41 and the movable portion 42. Further, in the board connector 30 of this example, the coil spring 45 is disposed between the connector main body 41 and the movable portion 42, and the connector is released by the elastic return force of the coil spring 45 by loosening the screw 44. A configuration in which the movable portion 42 is separated from the main body 41 is employed.

  In the substrate connector 30 of this example, the base 51 and the lid 55 of the connector main body 41 and the movable portion 42 are made of a chemical-resistant resin material (for example, PEEK (polyetheretherketone) resin, PTFE ( (Polytetrafluoroethylene) various engineering plastics such as resin). Further, in the board connector 30 of the present example, the portion of the connector body 41 between the base body 51 and the lid body 55 and the part where the cable body 31 is drawn from the base body 51 is sealed with a sealing material (not shown).

  Next, the measurement process for the electrolyte solution X by the measuring apparatus 1 will be described with reference to the accompanying drawings.

  In this measuring apparatus 1, as will be described later, the measuring substrate 4 can be easily attached to and detached from the sensor cable 3 (substrate connector 30) in a short time. Therefore, measurement is carried out in a carrying container for transporting the measurement substrate 4 so that the measurement substrate 4 is not damaged when the measurement device 1 is transported between the storage location and the measurement processing site. The measurement substrate 4 is transported together with the measurement apparatus main body 2 and the sensor cable 3 in a state where the measurement substrate 4 is accommodated. On the other hand, during the measurement process, the carrying container (measuring substrate 4) is transported to the site together with the measuring device main body 2 and the sensor cable 3, and the sensor cable 3 (connected to the measuring device main body 2 in a state where the power is cut off at the site. The measurement substrate 4 is mounted on the substrate connector 30).

  Specifically, first, the screw 44 screwed into the connector main body 41 (base 51) is loosened. At this time, as shown in FIG. 5, the movable portion 42 is rotated with respect to the connector main body 41 around the support shaft 43 by the elastic restoring force of the coil spring 45, so that the movable portion 42 The pressing portion 61 and the substrate mounting portion 62 are separated from the base body 51 (location where the probe pins 53 and the O-ring 54 are disposed) in the connector main body 41.

  Next, the measurement substrate 4 is taken out of the carrying container, and the end on the side where the connection electrode 12 is formed is connected to the connector main body 41 (base 51) with the one surface Fa facing upward, as shown by a broken line in FIG. And the movable part 42 (pressing part 61). Subsequently, as shown by a solid line in the figure, the measurement substrate 4 is placed on the substrate placement portion 62 of the movable portion 42, and the other surface Fb of the measurement substrate 4 is placed on the placement surface of the substrate placement portion 62. The surface is brought into contact with F62. At this time, the peripheral edge portion of the measurement substrate 4 is in contact with each movement restriction rib 63 of the substrate placement portion 62, and the movement of the measurement substrate 4 along the placement surface F62 is restricted. Become.

  Next, the screw 44 is screwed into the screw hole 51a of the connector main body 41 (base 51). At this time, the movable portion 42 is rotated with respect to the connection tool main body 41 with the support shaft 43 as the rotation center, and the pressing portion 61 and the substrate mounting portion 62 of the movable portion 42 are connected to the probe in the connection tool main body 41. It is made to approach the arrangement | positioning site | part of the pin 53 and the O-ring 54. When the screw 44 is fully screwed, the end of the measurement substrate 4 on the side where the connection electrode 12 is formed is sandwiched between the connector main body 41 and the movable portion 42 as shown in FIGS. It will be in the state.

  Further, in a state where the measurement substrate 4 is sandwiched between the connector main body 41 and the movable portion 42, the measurement substrate 4 is pressed toward the connector main body 41 by the movable portion 42 as shown in FIG. Become. As a result, the tip of the probe pin 53 disposed on the connector main body 41 is in contact with the connection electrode 12 of the measurement substrate 4 and the probe pin 53 is electrically connected to the connection electrode 12. The measurement electrode 11 is connected to the measurement apparatus main body 2 (measurement unit 21) via the cable body 31, the conductor 52, the probe pin 53, the connection electrode 12, and the conductor pattern 13.

  Further, in a state where the measurement substrate 4 is pressed toward the connector main body 41 by the movable portion 42, the O-ring 54 disposed on the connector main body 41 comes into contact with the one surface Fa of the measurement substrate 4 and is elastically deformed. To do. As a result, the electrolyte solution X or the like depends on one surface Fa of the measurement substrate 4, the O-ring 54, and the inner portion of the O-ring 54 in the substrate connector 30 (the portion facing the one surface Fa in the connector main body 41 (base 51)). A sealed space (a very small gap) is not formed, and the connection electrode 12 (electrode formation region A12) of the measurement substrate 4 and the probe pin 53 in the substrate connector 30 are formed in the sealed space. The tip is positioned. Thus, the mounting of the measurement substrate 4 to the substrate connector 30 is completed.

  Thereafter, after turning on the power to the measuring apparatus main body 2, as an example, as shown in FIG. 1, the tip of the measurement substrate 4 (site where the measurement electrode 11 is formed) is poured into the electrolyte X poured into the measurement container. And the desired electrochemical measurement process is performed. In this case, as described above, since the connection electrode 12 and the probe pin 53 are located in the sealed space formed by the one surface Fa of the measurement substrate 4, the connector main body 41, and the O-ring 54, When the measurement substrate 4 is immersed in the electrolytic solution X, the electrolytic solution X splashes and adheres to the substrate connector 30 or the like, or the measurement substrate 4 and the substrate connector 30 are mistakenly placed in the measurement container (electrolysis). Even if the liquid X is dropped into the liquid X), the situation in which the electrolytic solution X is in contact with the connection electrode 12 or the probe pin 53 is avoided.

  On the other hand, when the measurement process is completed, the measurement substrate 4 is pulled up from the electrolytic solution X. At this time, the electrolyte X is splashed and adhered to the substrate connector 30 or the like, or the measurement substrate 4 and the substrate connector 30 are accidentally dropped into the measurement container (in the electrolyte X). Even if it does, the situation where the electrolyte solution X contacts the connection electrode 12 and the probe pin 53 is avoided.

  Then, if necessary, the electrolytic solution X adhering to the measurement substrate 4 is wiped off, or the tip portion of the measurement substrate 4 is immersed in a cleaning solution for cleaning, and then the procedure reverse to the mounting procedure described above. Then, the measurement substrate 4 is removed from the substrate connector 30. In this case, when the screw 44 is loosened, the movable portion 42 on which the measurement substrate 4 is placed is moved from the connector main body 41 (the probe pin 53 and the O-ring 54) by the elastic return force of the coil spring 45. As a result of being rotated so as to be separated, the measurement substrate 4 can be removed from the movable portion 42.

  In this case, in the substrate connector 30 of this example, the notch 64 is formed in the substrate mounting part 62, and the other surface Fb of the measurement substrate 4 on the substrate mounting part 62 is exposed at the part of the notch 64. Yes. Accordingly, the other surface Fb of the measurement substrate 4 is pushed away from the substrate mounting portion 62 by a tool or the like at the notch 64, or the one surface Fa and the other surface Fb of the measurement substrate 4 are moved away from the notch 64. It can be picked up by a holding tool (tweezers or the like) and detached from the substrate mounting portion 62. Thereafter, the removed measurement substrate 4 is accommodated in a carrying container, whereby a series of operations relating to the measurement of the electrolytic solution X is completed.

  As described above, in this board connector 30, when the measurement board 4 is mounted, the board connection tool 30 is disposed at a portion facing the formation surface (one face Fa) of the connection electrode 12 on the measurement board 4 and connected to the one face Fa. An O-ring 54 that is brought into contact with one surface Fa so as to surround the formation site (electrode formation region A12) of the electrode 12, and the connection electrode 12 in electrical contact with the connection electrode 12 when the measurement substrate 4 is mounted. The probe pin 53 disposed inside the region where the O-ring 54 is disposed so as to be connected, and the pressing of pressing the one surface Fa toward the probe pin 53 and the O-ring 54 in contact with the other surface Fb of the measurement substrate 4 Part 61. The “measurement sensor” includes the substrate connector 30 and the measurement substrate 4. Further, the measuring apparatus 1 includes the “measuring sensor” and the measuring apparatus main body 2.

  Therefore, according to the substrate connector 30, the “measurement sensor”, and the measurement apparatus 1, the measurement device 4 has the one surface Fa, the O-ring 54, and the substrate in a state where the measurement substrate 4 is mounted on the substrate connector 30. In the sealed space formed by the inner part of the O-ring 54 in the connector 30 (the part facing the one surface Fa), the connection electrode 12 of the measurement substrate 4 and the probe pin 53 (probe pin 53 in the substrate connector 30). Therefore, the splash of the electrolyte X adheres to the outer surface of the substrate connector 30 and the measurement substrate 4 or the substrate connector 30 and the measurement substrate 4 are mistakenly placed in the electrolyte X. Even if it drops, the situation where the electrolyte solution X contacts the connection electrode 12 or the probe pin 53 can be preferably avoided. As a result, high-precision measurement processing using the measurement substrate 4 can be performed over a long period of time without cleaning the connection electrode 12 or the probe pin 53 or replacing parts.

  Further, in this board connector 30, the connector main body 41 in which the O-ring 54, the conductor 52 and the probe pin 53 are disposed, and the pressing portion 61 are disposed, and the contact / separation movement with respect to the connector main body 41 is possible. A movable part 42 that is attached to the connector main body 41 and sandwiches the measurement substrate 4 together with the connector main body 41 is configured. Therefore, according to the board connector 30, the “measurement sensor”, and the measurement apparatus 1, for example, a slit having the same size as the end face shape of the measurement board 4 is formed and the measurement is performed in the slit. Unlike the “substrate connector” in which the probe pin 53 is brought into contact with the connection electrode 12 by inserting the substrate 4 and the O-ring 54 is brought into contact with one surface Fa of the measurement substrate 4, the measurement substrate 4 By separating the movable portion 42 from the connector main body 41 when attaching / detaching the probe, the measurement substrate 4 can be attached / detached without sliding relative to the probe pin 53 or O-ring 54. The service life of 54 can be made sufficiently long.

  Further, the substrate connector 30 is provided with a substrate mounting portion 62 on which the measurement substrate 4 can be mounted on one of the connector main body 41 and the movable portion 42 (in this example, the movable portion 42). . Therefore, according to the board connector 30, the “measurement sensor”, and the measuring apparatus 1, the measurement board 4 can be prevented from wobbling with respect to the board connector 30, so that the probe pin 53 contacts the connection electrode 12. The occurrence of defects can be preferably avoided. In addition, since the substrate platform 62 functions as a guard member by providing a substrate platform 62 that is sufficiently larger than the measurement substrate 4, the measurement substrate 4 is applied to a container or the like for storing the electrolyte X. It is possible to preferably avoid the situation of contact and damage.

  Moreover, in this board | substrate connector 30, the movement of the measurement board | substrate 4 along the mounting surface F62 of the measurement board | substrate 4 in the board | substrate mounting part 62 is controlled in contact with the peripheral part of the measurement board | substrate 4 mounted. Movement restricting ribs 63 are provided on the substrate platform 62. Therefore, according to the board connector 30, the “measurement sensor”, and the measuring apparatus 1, the probe pin 53 is attached to the connection electrode 12 in a state where the measurement board 4 is held between the connector body 41 and the movable portion 42. The contacted state can be reliably maintained. Further, when the measurement substrate 4 is attached / detached, it is possible to preferably avoid the situation where the measurement substrate 4 slides off the substrate mounting portion 62 in a state where the movable portion 42 is separated from the connector main body 41.

  Further, in the substrate connector 30, a notch 64 communicated in the thickness direction of the measurement substrate 4 to be placed is formed in the substrate placing portion 62. Therefore, according to the substrate connector 30, the “measurement sensor”, and the measuring apparatus 1, the measurement substrate 4 placed on the substrate platform 62 can be easily detached from the substrate connector 30. A situation in which the measurement substrate 4 is damaged at the time of removing can be suitably avoided.

  Note that the configurations of the “board connector”, “measurement sensor”, and “measurement apparatus” are not limited to the examples of the respective configurations in the measurement apparatus 1 described above. For example, the substrate connector 30 configured to include the O-ring 54 that is an example of the “annular elastic body” has been described as an example. However, as in the example illustrated in FIG. Rubber sheet 54a (an elastic body formed in an annular shape centered on a very small hole that can penetrate the probe pin 53: a sheet-like elastic body that can penetrate the probe pin 53) It can also be configured with an “annular elastic body”.

  Further, the substrate connector 30 in which the notch 64 that is an example of the “opening portion” is formed in the substrate mounting portion 62 has been described as an example. Like the substrate mounting portion 62a (another example of the “movable portion” and its “substrate mounting portion”) of the movable portion 42a in the substrate connector 30A (another example of “substrate connecting device”) shown in FIG. The hole 64a, which is another example of the “opening”, can be formed in the substrate mounting portion 62a. The opening shape of the “hole (opening)” to be formed can be arbitrarily changed. Even when such a configuration is adopted, the other surface Fb of the measurement substrate 4 on the substrate mounting portion 62a is exposed at the site of the hole 64a. The surface Fb can be easily detached from the substrate platform 62a by pushing the surface Fb with a tool or the like. In addition, in the board connector 30A shown in the figure, and the board connectors 30B and 30C described later, the same components as those of the board connector 30 described above are denoted by the same reference numerals, and redundant description is omitted.

  Furthermore, the substrate mounting portion 62b (“movable portion” and its “substrate mounting portion”) of the movable portion 42b in the substrate connecting tool 30B (another example of the “substrate connecting device”) shown in FIG. ), The concave portion 64b which is an example of the “concave portion” can be formed in the substrate mounting portion 62b. Note that the shape of the “concave portion” to be formed can be arbitrarily changed. When such a configuration is adopted, the substrate is placed by inserting a tool into a gap (inside the recess 64b) generated between the other surface Fb of the measurement substrate 4 on the substrate platform 62b and the bottom surface of the recess 64b. It can be detached from the part 62b.

  According to the substrate connector 30B, the “measurement sensor” configured to include the substrate connector 30B, and the “measurement device” configured to include such a “measurement sensor”, the “substrate mounting unit” Since the measurement substrate 4 placed on the substrate platform 62b can be easily detached in the same manner as the “substrate connector” provided with an “opening” in the section, it can be removed from the substrate connector 30B. The situation where the measurement substrate 4 is sometimes damaged can be preferably avoided.

  In addition, the configuration including the substrate mounting portions 62, 62a, and 62b that are formed in a size larger than the measurement substrate 4 and on which the entire measurement substrate 4 can be mounted has been described as an example. As shown in the substrate mounting part 62c ("movable part" and still another example of the "substrate mounting part") of the movable part 42c in the illustrated substrate connecting tool 30C (a further example of "substrate connecting tool") It is also possible to configure the “substrate mounting portion” so that it is formed in a size smaller than the measurement substrate 4 and only one end side of the measurement substrate 4 is in contact with the mounting surface F62.

  Further, like the substrate mounting portion 62c of the movable portion 42c in the substrate connector 30C, the measurement substrate 4 is detached from the substrate mounting portion 62c (mounting surface F62), for example, at the upper end portion of the movement restricting rib 63. It is also possible to form a separation restricting claw portion 65 that restricts the movement. By adopting such a configuration, the “measurement substrate” is detached from the “substrate mounting portion” even when the measurement substrate 4 is not sandwiched between the “connector body” and the “movable portion”. Since the situation is avoided, it is possible to preferably avoid an accident in which the “measuring substrate” falls before the completion of mounting. Note that the “removal restriction claw portion” such as the separation restriction claw portion 65 can be formed separately from the “movement restriction portion” such as the movement restriction rib 63 (not shown).

  In addition, the present invention is not limited to the configuration in which a plurality of “movement restricting portions” are formed so as to be in contact with all the sides of the “measuring substrate”. Or a “movement restricting portion” (not shown) so as to be in contact with at least two corners (preferably four corners) of the “measuring substrate”. Furthermore, the “movement restricting portion” is not limited to a rib shape like the movement restricting rib 63, and may be formed in a pin shape (bar shape) (not shown). Even when the “movement restricting portion” as described above is formed, the movement of the “measuring substrate” along the “mounting surface” can be suitably avoided. In addition, when the movement of the “measuring substrate” is sufficiently restricted when sandwiched between the “connector body” and the “movable part”, a configuration in which the “movement restricting part” is not provided can be employed (see FIG. Not shown).

  Furthermore, the configuration in which the “movable part” is provided with the “substrate placement part” has been described as an example, but the “connector body” can also be provided with a “substrate placement part” (not shown). Further, the substrate connector 30 including the probe pin 53 as the “connector” has been described as an example. However, in place of the probe pin 53, various types such as a ball shape (spherical shape) and a plate shape (plate spring shape) are available. A “connector” having a shape can be provided to constitute a “board connector” (not shown).

  Further, the configuration in which the measurement substrate 4 on which the measurement electrode 11 (patterned electrode) as the “liquid contact portion” is formed is mounted and used has been described as an example. However, the pin-shaped (bar-shaped) electrode is described. Alternatively, a “measurement substrate” (not shown) provided with a substrate-mounted sensor element as a “liquid contact portion” may be used by being attached to a “substrate connector”. Further, the example in which the measurement substrate 4 in which both the measurement electrode 11 and the connection electrode 12 are formed on one surface Fa is mounted has been described, but the “measurement electrode” is formed on one surface, and A “measuring substrate” (not shown) having a “connecting electrode” formed on the other surface can also be used by being attached to a “substrate connector”.

  Furthermore, the “substrate connector” can be configured so that a “measuring substrate” (not shown) in which “connecting electrodes” are formed on both one surface and the other surface can be mounted. When such a “measuring board” is to be mounted, a plurality of combinations of “connectors” and “annular elastic bodies” may be provided, and each set may be arranged oppositely so as to sandwich the “measuring board” ( Not shown).

  In addition, the “measuring device” using the “substrate connector” is not limited to a device capable of performing electrochemical measurement, such as the measuring device 1, and is not limited to pH measurement, ion concentration measurement, dissolved oxygen concentration measurement, conductivity. “Board connection” described above in various “measuring devices” that perform measurement processing such as measurement and AC impedance measurement (measurement processing performed with the “liquid contact portion” of the “measurement substrate” in contact with the measurement target liquid) A configuration similar to that of the tool can be employed.

DESCRIPTION OF SYMBOLS 1 Measuring apparatus 2 Measuring apparatus main body 3 Sensor cable 4 Measurement board 10 Board main body 11a, 11b Measuring electrode 12a, 12b Connecting electrode 13a, 13b Conductor pattern 21 Measuring part 30, 30A-30C Board connector 31 Cable main body 41 Connection Tool body 42, 42a-42c Movable part 51 Base 52 Conductor 53 Probe pin 54 O-ring 54a Rubber sheet 61 Pressing part 61a, 61b Insertion hole 62, 62a-62c Substrate placement part 63 Movement restriction rib 64 Notch 64a Hole 64b Recess 65 Claw part for detachment regulation A12 Electrode formation area F62 Placement surface Fa One side Fb Other side X Electrolyte

Claims (7)

A measurement substrate having a liquid contact portion in contact with the liquid to be measured and having a connection electrode electrically connected to the liquid contact portion formed on at least one surface is electrically connected to the measurement apparatus main body. A board connector configured to be connectable to
The at least one surface is disposed at a portion facing the at least one surface of the measurement substrate when the measurement substrate is mounted so as to surround the connection electrode forming portion on the at least one surface. An annular elastic body brought into contact with
The annular elastic member is connected to a connecting conductor for connecting to the measuring device main body and is in contact with the connecting electrode and electrically connected to the connecting electrode when the measuring substrate is mounted. A connector disposed on the inside of the body disposition region;
A board connector comprising a pressing portion that contacts a back surface of the at least one surface of the measurement substrate and presses the at least one surface toward the annular elastic body and the connector. A connector main body in which the annular elastic body, the connection conductor and the connector are disposed;
The pressing portion is disposed and a movable portion that is attached to the connector main body so as to be movable toward and away from the connector main body and sandwiches the measurement substrate together with the connector main body. The board connector according to claim 1.   The substrate connector according to claim 2, wherein a substrate mounting portion capable of mounting the measurement substrate is provided on any one of the connector main body and the movable portion.   The substrate placement portion is in contact with a peripheral edge of the measurement substrate placed on the substrate placement portion and restricts movement of the measurement substrate along the placement surface of the measurement substrate in the substrate placement portion. The board | substrate connector of Claim 3 with which the part is provided.   The substrate mounting portion has at least one of an opening communicated in the thickness direction of the measurement substrate to be placed and a recess that creates a gap between the measurement substrate to be placed. The board | substrate connector of Claim 3 or 4 currently formed.   A measurement sensor comprising the substrate connector according to claim 1 and the measurement substrate.   A measuring apparatus comprising the measuring sensor according to claim 6 and the measuring apparatus main body.

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