JP2018190404A - 記憶装置およびリフレッシュ方法 - Google Patents
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40615—Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
- G06F3/0655—Vertical data movement, i.e. input-output transfer; data movement between one or more hosts and one or more storage devices
- G06F3/0656—Data buffering arrangements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/20—Initialising; Data preset; Chip identification
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0602—Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
- G06F3/0614—Improving the reliability of storage systems
- G06F3/0619—Improving the reliability of storage systems in relation to data integrity, e.g. data losses, bit errors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
- G06F3/0653—Monitoring storage devices or systems
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0668—Interfaces specially adapted for storage systems adopting a particular infrastructure
- G06F3/0671—In-line storage system
- G06F3/0673—Single storage device
- G06F3/0679—Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Computer Security & Cryptography (AREA)
- Read Only Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Memory System (AREA)
Abstract
Description
100 記憶装置
101 フラッシュメモリアレイ
102 コントローラ
INS アクセス指示
S202〜S210 ステッププロセス
Claims (11)
- 複数のブロックを含み、前記ブロックは、データを記憶するように用いられるフラッシュメモリアレイと、
アイドル時間内に前記フラッシュメモリアレイをスキャンし、前記フラッシュメモリアレイに記憶されたデータの正確性を確認するコントローラを含む記憶装置。 - 前記アイドル時間は、前記記憶装置が初期化を完了した後からホストが初期化を完了する時間である請求項1に記載の記憶装置。
- 前記アイドル時間は、前記記憶装置が初期化を完了した後から、ホストからのアクセス指示を受ける前までの時間である請求項1に記載の記憶装置。
- 前記コントローラがフラッシュメモリアレイをスキャンしたとき、前記コントローラは、前記各ブロックの少なくとも1つのページを選んでスキャンし、前記ページに対応するエラービットがしきい値を超えるかどうかを判定する請求項1に記載の記憶装置。
- 前記ページの何れかにおけるエラービットが前記しきい値を超えるとき、前記コントローラは、前記フラッシュメモリアレイにリフレッシュ工程を行う請求項4に記載の記憶装置。
- 前記ページの何れかにおけるエラービットが前記しきい値を超えるとき、前記コントローラは、前記エラービットの数が超過する前記ページに対応する前記ブロックにリフレッシュ工程を行う請求項4に記載の記憶装置。
- 記憶装置に用いられるリフレッシュ方法であって、前記リフレッシュ方法は、
前記記憶装置を初期化するステップ、
アイドル時間内に前記記憶装置をスキャンし、前記記憶装置に記憶されたデータの正確性を確認するステップ、および
外部からのアクセス指示を受ける準備をする待機状態に入るステップを含むリフレッシュ方法。 - 前記アイドル時間は、前記記憶装置が初期化を完了した後からホストが初期化を完了する時間である請求項7に記載のリフレッシュ方法。
- 前記アイドル時間は、前記記憶装置が初期化を完了した後から、ホストからのアクセス指示を受ける前までの時間である請求項7に記載のリフレッシュ方法。
- 前記記憶装置は、フラッシュメモリアレイを含み、前記フラッシュメモリアレイは、複数のブロックを含み、
前記アイドル時間内に前記フラッシュメモリアレイをスキャンし、前記フラッシュメモリアレイに記憶されたデータの正確性を確認するステップは、
前記各ブロックの少なくとも1つのページをスキャンするステップ、
スキャンされた前記ページの何れかにおけるエラービットがしきい値を超えるかどうかを判定するステップ、および
前記ページの何れかにおけるエラービットがしきい値を超えるとき、前記フラッシュメモリアレイにリフレッシュ工程を行うステップを更に含む請求項7に記載のリフレッシュ方法。 - 前記記憶装置は、フラッシュメモリアレイを含み、前記フラッシュメモリアレイは、複数のブロックを含み、
前記アイドル時間内に前記フラッシュメモリアレイをスキャンし、前記フラッシュメモリアレイに記憶されたデータの正確性を確認するステップは、
前記各ブロックの少なくとも1つのページをスキャンするステップ、
スキャンされた前記ページのエラービットがしきい値を超えるかどうかを判定するステップ、および
前記ページの何れかにおけるエラービットがしきい値を超えるとき、前記エラービットの数が超過する前記ページに対応する前記ブロックにリフレッシュ工程を行うステップを更に含む請求項7に記載のリフレッシュ方法。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762504140P | 2017-05-10 | 2017-05-10 | |
US62/504,140 | 2017-05-10 | ||
TW106129948A TWI650641B (zh) | 2017-05-10 | 2017-09-01 | 儲存裝置以及刷新方法 |
TW106129948 | 2017-09-01 |
Publications (2)
Publication Number | Publication Date |
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JP2018190404A true JP2018190404A (ja) | 2018-11-29 |
JP6734320B2 JP6734320B2 (ja) | 2020-08-05 |
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JP2018079740A Active JP6734320B2 (ja) | 2017-05-10 | 2018-04-18 | 記憶装置およびリフレッシュ方法 |
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Country | Link |
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US (1) | US20180329649A1 (ja) |
JP (1) | JP6734320B2 (ja) |
CN (1) | CN108877858B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI719550B (zh) * | 2019-07-23 | 2021-02-21 | 慧榮科技股份有限公司 | 記憶體控制器、資料儲存裝置及其開卡方法 |
US11157624B2 (en) * | 2019-08-14 | 2021-10-26 | Silicon Motion, Inc. | Scheme of using electronic device to activate mass production software tool to initialize memory device including flash memory controller and flash memory |
KR20220138289A (ko) * | 2021-04-05 | 2022-10-12 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 그 동작 방법 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008192267A (ja) * | 2007-02-07 | 2008-08-21 | Megachips Lsi Solutions Inc | ビットエラーの予防方法、情報処理装置 |
JP2009087509A (ja) * | 2007-10-03 | 2009-04-23 | Toshiba Corp | 半導体記憶装置 |
JP2009205578A (ja) * | 2008-02-29 | 2009-09-10 | Toshiba Corp | 半導体記憶装置 |
JP2011128751A (ja) * | 2009-12-16 | 2011-06-30 | Clarion Co Ltd | データ記録装置およびデータ記録装置の制御方法 |
Family Cites Families (6)
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US20160162215A1 (en) * | 2014-12-08 | 2016-06-09 | Sandisk Technologies Inc. | Meta plane operations for a storage device |
TWI599880B (zh) * | 2016-03-22 | 2017-09-21 | 威盛電子股份有限公司 | 非揮發性記憶體裝置及其操作方法 |
TWI631463B (zh) * | 2016-03-22 | 2018-08-01 | 威盛電子股份有限公司 | 非揮發性記憶體裝置及其操作方法 |
US10339044B2 (en) * | 2016-03-30 | 2019-07-02 | Sandisk Technologies Llc | Method and system for blending data reclamation and data integrity garbage collection |
US10297333B2 (en) * | 2016-04-08 | 2019-05-21 | Steven McConnell | Drying system and method |
TWI621129B (zh) * | 2016-10-25 | 2018-04-11 | 慧榮科技股份有限公司 | 資料儲存裝置及其資料寫入方法 |
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2018
- 2018-01-02 CN CN201810001350.8A patent/CN108877858B/zh active Active
- 2018-04-16 US US15/954,308 patent/US20180329649A1/en not_active Abandoned
- 2018-04-18 JP JP2018079740A patent/JP6734320B2/ja active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008192267A (ja) * | 2007-02-07 | 2008-08-21 | Megachips Lsi Solutions Inc | ビットエラーの予防方法、情報処理装置 |
JP2009087509A (ja) * | 2007-10-03 | 2009-04-23 | Toshiba Corp | 半導体記憶装置 |
JP2009205578A (ja) * | 2008-02-29 | 2009-09-10 | Toshiba Corp | 半導体記憶装置 |
JP2011128751A (ja) * | 2009-12-16 | 2011-06-30 | Clarion Co Ltd | データ記録装置およびデータ記録装置の制御方法 |
Also Published As
Publication number | Publication date |
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CN108877858A (zh) | 2018-11-23 |
US20180329649A1 (en) | 2018-11-15 |
JP6734320B2 (ja) | 2020-08-05 |
CN108877858B (zh) | 2021-02-19 |
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