JP2018151832A - 情報処理装置、情報処理方法、および、プログラム - Google Patents

情報処理装置、情報処理方法、および、プログラム Download PDF

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Publication number
JP2018151832A
JP2018151832A JP2017047327A JP2017047327A JP2018151832A JP 2018151832 A JP2018151832 A JP 2018151832A JP 2017047327 A JP2017047327 A JP 2017047327A JP 2017047327 A JP2017047327 A JP 2017047327A JP 2018151832 A JP2018151832 A JP 2018151832A
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JP
Japan
Prior art keywords
information
illumination light
reflected light
light
information processing
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JP2017047327A
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English (en)
Japanese (ja)
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JP2018151832A5 (enExample
Inventor
悠修 古賀
Hironobu Koga
悠修 古賀
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2017047327A priority Critical patent/JP2018151832A/ja
Priority to CN201810188718.6A priority patent/CN108573508A/zh
Priority to US15/918,009 priority patent/US11039076B2/en
Publication of JP2018151832A publication Critical patent/JP2018151832A/ja
Publication of JP2018151832A5 publication Critical patent/JP2018151832A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/90—Determination of colour characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4204—Photometry, e.g. photographic exposure meter using electric radiation detectors with determination of ambient light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/71—Circuitry for evaluating the brightness variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0297—Constructional arrangements for removing other types of optical noise or for performing calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/76—Circuitry for compensating brightness variation in the scene by influencing the image signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4266—Photometry, e.g. photographic exposure meter using electric radiation detectors for measuring solar light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan
    • G01J2003/2869—Background correcting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J2003/425—Reflectance

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Sustainable Development (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Processing (AREA)
JP2017047327A 2017-03-13 2017-03-13 情報処理装置、情報処理方法、および、プログラム Pending JP2018151832A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2017047327A JP2018151832A (ja) 2017-03-13 2017-03-13 情報処理装置、情報処理方法、および、プログラム
CN201810188718.6A CN108573508A (zh) 2017-03-13 2018-03-08 信息处理装置、信息处理方法和存储介质
US15/918,009 US11039076B2 (en) 2017-03-13 2018-03-12 Information processing apparatus, information processing method, and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017047327A JP2018151832A (ja) 2017-03-13 2017-03-13 情報処理装置、情報処理方法、および、プログラム

Publications (2)

Publication Number Publication Date
JP2018151832A true JP2018151832A (ja) 2018-09-27
JP2018151832A5 JP2018151832A5 (enExample) 2020-04-23

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US (1) US11039076B2 (enExample)
JP (1) JP2018151832A (enExample)
CN (1) CN108573508A (enExample)

Cited By (2)

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WO2020241111A1 (ja) * 2019-05-28 2020-12-03 キヤノン株式会社 画像処理方法、画像処理装置、撮像システム、および、プログラム
WO2022102295A1 (ja) * 2020-11-10 2022-05-19 ソニーグループ株式会社 撮像装置

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EP3057067B1 (en) * 2015-02-16 2017-08-23 Thomson Licensing Device and method for estimating a glossy part of radiation
CN112329256A (zh) * 2020-11-13 2021-02-05 北京环境特性研究所 一种涂层材质反射偏振特性分析方法及装置
US11741658B2 (en) * 2021-12-28 2023-08-29 Advanced Micro Devices, Inc. Frustum-bounding volume intersection detection using hemispherical projection

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WO2020241111A1 (ja) * 2019-05-28 2020-12-03 キヤノン株式会社 画像処理方法、画像処理装置、撮像システム、および、プログラム
JP2020193856A (ja) * 2019-05-28 2020-12-03 キヤノン株式会社 画像処理方法、画像処理装置、撮像システム、および、プログラム
JP7313906B2 (ja) 2019-05-28 2023-07-25 キヤノン株式会社 画像処理方法、画像処理装置、撮像システム、および、プログラム
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US20180262666A1 (en) 2018-09-13
US11039076B2 (en) 2021-06-15
CN108573508A (zh) 2018-09-25

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