JP2018067393A - X線検査装置 - Google Patents
X線検査装置 Download PDFInfo
- Publication number
- JP2018067393A JP2018067393A JP2016203719A JP2016203719A JP2018067393A JP 2018067393 A JP2018067393 A JP 2018067393A JP 2016203719 A JP2016203719 A JP 2016203719A JP 2016203719 A JP2016203719 A JP 2016203719A JP 2018067393 A JP2018067393 A JP 2018067393A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- aging
- stage
- inspection apparatus
- ray source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 52
- 230000032683 aging Effects 0.000 claims abstract description 53
- 238000003384 imaging method Methods 0.000 claims abstract description 29
- 230000007246 mechanism Effects 0.000 claims abstract description 15
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 230000002431 foraging effect Effects 0.000 abstract description 3
- 238000002834 transmittance Methods 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/54—Protecting or lifetime prediction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/02—Constructional details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/085—Circuit arrangements particularly adapted for X-ray tubes having a control grid
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/085—Target treatment, e.g. ageing, heating
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- X-Ray Techniques (AREA)
Abstract
【解決手段】電源が投入されれば、ステージ移動機構23a、23bの駆動により、ステージ10がX、Y方向に移動し、X線源がステージ10における支持板11の側方に配設されたX線遮蔽板13の下方のエージング位置で停止する。この状態において、エージングが開始される。そして、エージングが終了すれば、X線撮影についての撮影指令が入力されるまで待機する。
【選択図】図2
Description
11 支持板
12 枠体
13 X線遮蔽板
21 X線源
22 X線検出器
23 ステージ移動機構
24 表示部
25 操作部
30 制御部
31 画像処理部
32 移動制御部
33 X線源制御部
100 ケーシング
W ワーク
Claims (3)
- 被検査物にX線を照射するX線源と、前記X線源から照射され前記被検査物と透過したX線を検出するX線検出器と、を有するX線撮影系と、
前記X線源と前記X線検出器との間に配置され、前記被検査物が載置されるステージと、
前記ステージと前記X線撮影系とを相対的に移動させる移動機構と、
を備えたX線検査装置であって、
前記ステージにおける前記被検査物の載置領域の側方に配設されたX線遮蔽部材と、
前記X線源に対してエージングを実行するときに、前記移動機構を制御することにより、前記X線源と前記X線遮蔽部材とが対向するエージング位置に、前記X線撮影系を前記ステージに対して相対的に移動させる制御部と、
を備えたことを特徴とするX線検査装置。 - 請求項1に記載のX線検査装置において、
前記制御部は、検査の開始時または検査の終了時に、前記X線撮影系を前記エージング位置に移動させるX線検査装置。 - 請求項1に記載のX線検査装置において、
前記制御部は、エージングの開始を指令する操作がなされたときに、前記X線撮影系を前記エージング位置に移動させるX線検査装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016203719A JP6665753B2 (ja) | 2016-10-17 | 2016-10-17 | X線検査装置 |
US15/685,703 US10398012B2 (en) | 2016-10-17 | 2017-08-24 | X-ray inspection system |
CN201710761526.5A CN107957427B (zh) | 2016-10-17 | 2017-08-30 | X射线检查装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016203719A JP6665753B2 (ja) | 2016-10-17 | 2016-10-17 | X線検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018067393A true JP2018067393A (ja) | 2018-04-26 |
JP6665753B2 JP6665753B2 (ja) | 2020-03-13 |
Family
ID=61902381
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016203719A Active JP6665753B2 (ja) | 2016-10-17 | 2016-10-17 | X線検査装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US10398012B2 (ja) |
JP (1) | JP6665753B2 (ja) |
CN (1) | CN107957427B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024190632A1 (ja) * | 2023-03-13 | 2024-09-19 | オムロン株式会社 | X線検査装置及びその制御方法 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7415898B2 (ja) * | 2020-12-02 | 2024-01-17 | 株式会社島津製作所 | X線撮像装置 |
CN116626074A (zh) * | 2023-07-26 | 2023-08-22 | 无锡日联科技股份有限公司 | X射线动态实验检测系统 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2634369B2 (ja) * | 1993-07-15 | 1997-07-23 | 浜松ホトニクス株式会社 | X線装置 |
JP2000030890A (ja) | 1998-07-14 | 2000-01-28 | Shimadzu Corp | X線高電圧装置 |
US7529338B2 (en) * | 2006-02-22 | 2009-05-05 | Focalspot, Inc. | Method and apparatus for inspecting circuit boards |
CN101960296B (zh) * | 2007-12-27 | 2012-12-12 | 欧姆龙株式会社 | X射线检查装置及x射线检查方法 |
JP2009266688A (ja) | 2008-04-25 | 2009-11-12 | Shimadzu Corp | X線測定システム |
JP2015150054A (ja) | 2014-02-12 | 2015-08-24 | 株式会社島津製作所 | X線透視撮影台 |
JP2015194423A (ja) * | 2014-03-31 | 2015-11-05 | 株式会社日立ハイテクサイエンス | X線透過検査装置 |
CN203981890U (zh) * | 2014-07-04 | 2014-12-03 | 上海奕瑞光电子科技有限公司 | 一种x射线平板探测器结构 |
US9606072B2 (en) * | 2015-06-09 | 2017-03-28 | Shimadzu Corporation | Radiation inspecting apparatus |
-
2016
- 2016-10-17 JP JP2016203719A patent/JP6665753B2/ja active Active
-
2017
- 2017-08-24 US US15/685,703 patent/US10398012B2/en active Active
- 2017-08-30 CN CN201710761526.5A patent/CN107957427B/zh active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024190632A1 (ja) * | 2023-03-13 | 2024-09-19 | オムロン株式会社 | X線検査装置及びその制御方法 |
Also Published As
Publication number | Publication date |
---|---|
CN107957427A (zh) | 2018-04-24 |
US10398012B2 (en) | 2019-08-27 |
CN107957427B (zh) | 2020-10-09 |
US20180110115A1 (en) | 2018-04-19 |
JP6665753B2 (ja) | 2020-03-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6157818B2 (ja) | X線診断装置 | |
JP2021118882A (ja) | X線低減システム | |
CN107957427B (zh) | X射线检查装置 | |
WO2014054442A1 (ja) | X線診断装置及びx線診断装置の制御方法 | |
JP2017080042A (ja) | X線画像診断装置 | |
JP2018191976A (ja) | 放射線撮影装置 | |
WO2013187174A1 (ja) | X線診断装置 | |
JP2007130058A (ja) | 放射線画像撮影装置 | |
JP2015232453A (ja) | X線検査装置 | |
US8475043B2 (en) | Radiation imaging apparatus and processing method therefor | |
JP5259061B2 (ja) | 医用画像撮影装置 | |
KR102502082B1 (ko) | 동물진단용 엑스레이 촬영장치 및 그 제어방법 | |
JP2017164426A (ja) | 放射線撮影装置 | |
WO2017098610A1 (ja) | X線撮影装置 | |
US10987074B2 (en) | Radiation image capturing apparatus | |
JP2006122448A (ja) | X線映像装置 | |
JP2015150054A (ja) | X線透視撮影台 | |
JP2010220838A (ja) | 放射線撮影装置 | |
WO2013175977A1 (ja) | X線診断装置 | |
JP2020031872A (ja) | X線撮影装置 | |
JP2014155599A (ja) | 放射線撮影装置 | |
JP4522437B2 (ja) | X線画像撮影装置及び撮影方法 | |
JP5085204B2 (ja) | 放射線透視撮影装置および放射線透視撮影装置の制御方法 | |
JP2008212420A (ja) | 補償フィルタの駆動装置及び駆動方法 | |
JP6367420B2 (ja) | X線診断装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190205 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20200121 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20200122 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20200203 |
|
R151 | Written notification of patent or utility model registration |
Ref document number: 6665753 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R151 |