JP2018021106A - Resin composition - Google Patents
Resin composition Download PDFInfo
- Publication number
- JP2018021106A JP2018021106A JP2016152110A JP2016152110A JP2018021106A JP 2018021106 A JP2018021106 A JP 2018021106A JP 2016152110 A JP2016152110 A JP 2016152110A JP 2016152110 A JP2016152110 A JP 2016152110A JP 2018021106 A JP2018021106 A JP 2018021106A
- Authority
- JP
- Japan
- Prior art keywords
- resin composition
- resin
- manufactured
- layer
- epoxy resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011342 resin composition Substances 0.000 title claims abstract description 153
- 239000003822 epoxy resin Substances 0.000 claims abstract description 164
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 164
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 75
- 229920005989 resin Polymers 0.000 claims abstract description 74
- 239000011347 resin Substances 0.000 claims abstract description 74
- 238000007788 roughening Methods 0.000 claims abstract description 30
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 28
- 229910001868 water Inorganic materials 0.000 claims abstract description 28
- 239000004065 semiconductor Substances 0.000 claims abstract description 21
- 239000004020 conductor Substances 0.000 claims description 84
- 239000011256 inorganic filler Substances 0.000 claims description 42
- 229910003475 inorganic filler Inorganic materials 0.000 claims description 42
- 239000002245 particle Substances 0.000 claims description 25
- 238000009413 insulation Methods 0.000 claims description 24
- 150000002222 fluorine compounds Chemical class 0.000 claims description 17
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims description 13
- 239000011737 fluorine Substances 0.000 claims description 13
- 229910052731 fluorine Inorganic materials 0.000 claims description 13
- 229920001187 thermosetting polymer Polymers 0.000 claims description 11
- 239000006087 Silane Coupling Agent Substances 0.000 claims description 10
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 252
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 69
- -1 glycidyl ester Chemical class 0.000 description 58
- 238000000034 method Methods 0.000 description 53
- 239000000047 product Substances 0.000 description 51
- 239000000243 solution Substances 0.000 description 40
- 239000000126 substance Substances 0.000 description 34
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 32
- 229920003986 novolac Polymers 0.000 description 32
- 239000007787 solid Substances 0.000 description 32
- 239000000758 substrate Substances 0.000 description 31
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 30
- 239000004593 Epoxy Substances 0.000 description 28
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 28
- 229910052751 metal Inorganic materials 0.000 description 25
- 239000002184 metal Substances 0.000 description 25
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 24
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 22
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 22
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 22
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 22
- 230000008569 process Effects 0.000 description 21
- VHYFNPMBLIVWCW-UHFFFAOYSA-N 4-Dimethylaminopyridine Chemical compound CN(C)C1=CC=NC=C1 VHYFNPMBLIVWCW-UHFFFAOYSA-N 0.000 description 20
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 20
- 239000010949 copper Substances 0.000 description 20
- 238000007747 plating Methods 0.000 description 20
- 239000012756 surface treatment agent Substances 0.000 description 20
- 229910000831 Steel Inorganic materials 0.000 description 18
- 150000002148 esters Chemical group 0.000 description 18
- 239000010959 steel Substances 0.000 description 18
- 238000005259 measurement Methods 0.000 description 17
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 16
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 16
- 229910052802 copper Inorganic materials 0.000 description 16
- 238000011156 evaluation Methods 0.000 description 16
- 229920006287 phenoxy resin Polymers 0.000 description 15
- 239000013034 phenoxy resin Substances 0.000 description 15
- 206010042674 Swelling Diseases 0.000 description 14
- 239000010408 film Substances 0.000 description 14
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 14
- 230000008961 swelling Effects 0.000 description 14
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 13
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 description 13
- 229920005992 thermoplastic resin Polymers 0.000 description 13
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 12
- 239000007788 liquid Substances 0.000 description 12
- 239000000463 material Substances 0.000 description 12
- 239000000377 silicon dioxide Substances 0.000 description 12
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 11
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 11
- 239000003063 flame retardant Substances 0.000 description 11
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 11
- 239000010409 thin film Substances 0.000 description 11
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 10
- 125000003700 epoxy group Chemical group 0.000 description 10
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 10
- 239000000203 mixture Substances 0.000 description 10
- 229920001721 polyimide Polymers 0.000 description 10
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 9
- 229930003836 cresol Natural products 0.000 description 9
- 238000003475 lamination Methods 0.000 description 9
- 229920000139 polyethylene terephthalate Polymers 0.000 description 9
- 239000005020 polyethylene terephthalate Substances 0.000 description 9
- 238000002360 preparation method Methods 0.000 description 9
- 239000002904 solvent Substances 0.000 description 9
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 8
- 239000000654 additive Substances 0.000 description 8
- 229910045601 alloy Inorganic materials 0.000 description 8
- 239000000956 alloy Substances 0.000 description 8
- 150000001412 amines Chemical class 0.000 description 8
- ZFVMWEVVKGLCIJ-UHFFFAOYSA-N bisphenol AF Chemical compound C1=CC(O)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(O)C=C1 ZFVMWEVVKGLCIJ-UHFFFAOYSA-N 0.000 description 8
- 239000007800 oxidant agent Substances 0.000 description 8
- 230000001681 protective effect Effects 0.000 description 8
- 239000004642 Polyimide Substances 0.000 description 7
- 239000004305 biphenyl Substances 0.000 description 7
- 235000010290 biphenyl Nutrition 0.000 description 7
- 239000004643 cyanate ester Substances 0.000 description 7
- 239000011888 foil Substances 0.000 description 7
- 239000012766 organic filler Substances 0.000 description 7
- 238000004381 surface treatment Methods 0.000 description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 6
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 6
- 229910052799 carbon Inorganic materials 0.000 description 6
- 238000001816 cooling Methods 0.000 description 6
- 238000001035 drying Methods 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000012046 mixed solvent Substances 0.000 description 6
- 230000003472 neutralizing effect Effects 0.000 description 6
- 239000003960 organic solvent Substances 0.000 description 6
- AFEQENGXSMURHA-UHFFFAOYSA-N oxiran-2-ylmethanamine Chemical compound NCC1CO1 AFEQENGXSMURHA-UHFFFAOYSA-N 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 229920002554 vinyl polymer Polymers 0.000 description 6
- DHKHKXVYLBGOIT-UHFFFAOYSA-N 1,1-Diethoxyethane Chemical compound CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 description 5
- YTTFFPATQICAQN-UHFFFAOYSA-N 2-methoxypropan-1-ol Chemical compound COC(C)CO YTTFFPATQICAQN-UHFFFAOYSA-N 0.000 description 5
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 5
- 229960000549 4-dimethylaminophenol Drugs 0.000 description 5
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 5
- 229910000990 Ni alloy Inorganic materials 0.000 description 5
- 239000004962 Polyamide-imide Substances 0.000 description 5
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 5
- 239000011354 acetal resin Substances 0.000 description 5
- 239000007864 aqueous solution Substances 0.000 description 5
- 229910052804 chromium Inorganic materials 0.000 description 5
- 239000011651 chromium Substances 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 5
- 238000009826 distribution Methods 0.000 description 5
- 229910052759 nickel Inorganic materials 0.000 description 5
- 229920002312 polyamide-imide Polymers 0.000 description 5
- 229920006324 polyoxymethylene Polymers 0.000 description 5
- 238000003825 pressing Methods 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- 239000002966 varnish Substances 0.000 description 5
- 229910052725 zinc Inorganic materials 0.000 description 5
- 239000011701 zinc Substances 0.000 description 5
- XKZQKPRCPNGNFR-UHFFFAOYSA-N 2-(3-hydroxyphenyl)phenol Chemical group OC1=CC=CC(C=2C(=CC=CC=2)O)=C1 XKZQKPRCPNGNFR-UHFFFAOYSA-N 0.000 description 4
- ZTQSAGDEMFDKMZ-UHFFFAOYSA-N Butyraldehyde Chemical compound CCCC=O ZTQSAGDEMFDKMZ-UHFFFAOYSA-N 0.000 description 4
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 4
- ZRALSGWEFCBTJO-UHFFFAOYSA-N Guanidine Chemical compound NC(N)=N ZRALSGWEFCBTJO-UHFFFAOYSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- CHJJGSNFBQVOTG-UHFFFAOYSA-N N-methyl-guanidine Natural products CNC(N)=N CHJJGSNFBQVOTG-UHFFFAOYSA-N 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 4
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 125000003118 aryl group Chemical group 0.000 description 4
- KAKZBPTYRLMSJV-UHFFFAOYSA-N butadiene group Chemical group C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 239000011889 copper foil Substances 0.000 description 4
- 239000007822 coupling agent Substances 0.000 description 4
- 229920001971 elastomer Polymers 0.000 description 4
- 238000005227 gel permeation chromatography Methods 0.000 description 4
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 4
- 238000010030 laminating Methods 0.000 description 4
- 125000001624 naphthyl group Chemical group 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- 229920003023 plastic Polymers 0.000 description 4
- 239000004033 plastic Substances 0.000 description 4
- 235000013824 polyphenols Nutrition 0.000 description 4
- 229920002223 polystyrene Polymers 0.000 description 4
- 230000009467 reduction Effects 0.000 description 4
- 239000005060 rubber Substances 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- 229910052718 tin Inorganic materials 0.000 description 4
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 4
- XZKLXPPYISZJCV-UHFFFAOYSA-N 1-benzyl-2-phenylimidazole Chemical compound C1=CN=C(C=2C=CC=CC=2)N1CC1=CC=CC=C1 XZKLXPPYISZJCV-UHFFFAOYSA-N 0.000 description 3
- ULKLGIFJWFIQFF-UHFFFAOYSA-N 5K8XI641G3 Chemical compound CCC1=NC=C(C)N1 ULKLGIFJWFIQFF-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 229940123208 Biguanide Drugs 0.000 description 3
- 229930185605 Bisphenol Natural products 0.000 description 3
- 229910000599 Cr alloy Inorganic materials 0.000 description 3
- 229910000881 Cu alloy Inorganic materials 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 239000004721 Polyphenylene oxide Substances 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 239000012670 alkaline solution Substances 0.000 description 3
- 229920000180 alkyd Polymers 0.000 description 3
- 239000003638 chemical reducing agent Substances 0.000 description 3
- 239000000788 chromium alloy Substances 0.000 description 3
- XLJMAIOERFSOGZ-UHFFFAOYSA-M cyanate Chemical compound [O-]C#N XLJMAIOERFSOGZ-UHFFFAOYSA-M 0.000 description 3
- SWSQBOPZIKWTGO-UHFFFAOYSA-N dimethylaminoamidine Natural products CN(C)C(N)=N SWSQBOPZIKWTGO-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 230000001747 exhibiting effect Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 238000009499 grossing Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 125000002524 organometallic group Chemical group 0.000 description 3
- 229910052763 palladium Inorganic materials 0.000 description 3
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 3
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 3
- 229920002492 poly(sulfone) Polymers 0.000 description 3
- 229920000570 polyether Polymers 0.000 description 3
- 239000011112 polyethylene naphthalate Substances 0.000 description 3
- 239000009719 polyimide resin Substances 0.000 description 3
- 230000003746 surface roughness Effects 0.000 description 3
- 239000011135 tin Substances 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- KGSFMPRFQVLGTJ-UHFFFAOYSA-N 1,1,2-triphenylethylbenzene Chemical compound C=1C=CC=CC=1C(C=1C=CC=CC=1)(C=1C=CC=CC=1)CC1=CC=CC=C1 KGSFMPRFQVLGTJ-UHFFFAOYSA-N 0.000 description 2
- GIWQSPITLQVMSG-UHFFFAOYSA-N 1,2-dimethylimidazole Chemical compound CC1=NC=CN1C GIWQSPITLQVMSG-UHFFFAOYSA-N 0.000 description 2
- JWAZRIHNYRIHIV-UHFFFAOYSA-N 2-naphthol Chemical compound C1=CC=CC2=CC(O)=CC=C21 JWAZRIHNYRIHIV-UHFFFAOYSA-N 0.000 description 2
- CMLFRMDBDNHMRA-UHFFFAOYSA-N 2h-1,2-benzoxazine Chemical compound C1=CC=C2C=CNOC2=C1 CMLFRMDBDNHMRA-UHFFFAOYSA-N 0.000 description 2
- FVKFHMNJTHKMRX-UHFFFAOYSA-N 3,4,6,7,8,9-hexahydro-2H-pyrimido[1,2-a]pyrimidine Chemical compound C1CCN2CCCNC2=N1 FVKFHMNJTHKMRX-UHFFFAOYSA-N 0.000 description 2
- YATKABCHSRLDGQ-UHFFFAOYSA-N 5-benzyl-2-phenyl-1h-imidazole Chemical compound C=1C=CC=CC=1CC(N=1)=CNC=1C1=CC=CC=C1 YATKABCHSRLDGQ-UHFFFAOYSA-N 0.000 description 2
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 108010054404 Adenylyl-sulfate kinase Proteins 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- 229920002284 Cellulose triacetate Polymers 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- 239000005062 Polybutadiene Substances 0.000 description 2
- 239000004695 Polyether sulfone Substances 0.000 description 2
- 102100039024 Sphingosine kinase 1 Human genes 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- 229910001069 Ti alloy Inorganic materials 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 2
- ORLQHILJRHBSAY-UHFFFAOYSA-N [1-(hydroxymethyl)cyclohexyl]methanol Chemical compound OCC1(CO)CCCCC1 ORLQHILJRHBSAY-UHFFFAOYSA-N 0.000 description 2
- AHZMUXQJTGRNHT-UHFFFAOYSA-N [4-[2-(4-cyanatophenyl)propan-2-yl]phenyl] cyanate Chemical compound C=1C=C(OC#N)C=CC=1C(C)(C)C1=CC=C(OC#N)C=C1 AHZMUXQJTGRNHT-UHFFFAOYSA-N 0.000 description 2
- 239000012190 activator Substances 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
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Images
Classifications
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
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- C08G59/308—Di-epoxy compounds containing atoms other than carbon, hydrogen, oxygen and nitrogen containing halogen atoms
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
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- B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
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- B32B37/10—Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the pressing technique, e.g. using action of vacuum or fluid pressure
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- C—CHEMISTRY; METALLURGY
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- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
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- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
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- H05K1/0313—Organic insulating material
- H05K1/0353—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
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Abstract
Description
本発明は、樹脂組成物に関する。さらには、当該樹脂組成物を含有する、樹脂シート、プリント配線板、及び半導体装置に関する。 The present invention relates to a resin composition. Furthermore, the present invention relates to a resin sheet, a printed wiring board, and a semiconductor device containing the resin composition.
近年、電子機器の小型化を達成すべく、プリント配線板の更なる薄型化が進められており、内層基板や絶縁層の厚さは、さらに薄くなる傾向にある。内層基板や絶縁層の厚さを薄くするものとして、例えば、特許文献1に記載の薄型フィルム用樹脂組成物が知られている。 In recent years, in order to achieve miniaturization of electronic devices, the printed wiring board has been further reduced in thickness, and the thickness of the inner layer substrate and the insulating layer tends to be further reduced. As a material for reducing the thickness of an inner layer substrate or an insulating layer, for example, a thin film resin composition described in Patent Document 1 is known.
特許文献1において、本発明者らは、薄膜フィルムを絶縁層に適用した際に、粗度が大きくなり、剥離強度が低下する傾向があることを見出しており、これらの課題を解決するために熱可塑性樹脂の配合量を所定量とすることを提案している。しかしながら、該文献においては、絶縁層の厚みを薄くした場合の絶縁性能(以下、「薄膜絶縁性」ともいう)についてはなんら検討されていない。 In Patent Document 1, the present inventors have found that when a thin film is applied to an insulating layer, the roughness tends to increase and the peel strength tends to decrease, and in order to solve these problems It has been proposed that the blending amount of the thermoplastic resin is a predetermined amount. However, in this document, no consideration is given to the insulation performance (hereinafter also referred to as “thin film insulation”) when the thickness of the insulating layer is reduced.
絶縁層が薄膜である場合には、無機充填材粒子同士が接触して界面を伝って電流が流れやすくなったり、絶縁層の厚みが薄いことにより静電容量が大きくなりショートしやすくなってしまうなど、従来のものよりも絶縁性能を維持することが難しくなってしまう。 When the insulating layer is a thin film, the inorganic filler particles come into contact with each other and the current easily flows through the interface, or the capacitance of the insulating layer is increased and the short circuit is likely to occur. For example, it becomes difficult to maintain the insulation performance as compared with the conventional one.
本発明の課題は、絶縁性能に優れた薄い絶縁層を付与可能な樹脂組成物;当該樹脂組成物を含有する樹脂シート;絶縁性能に優れた薄い絶縁層を備えるプリント配線板、及び半導体装置を提供することにある。 An object of the present invention is to provide a resin composition capable of providing a thin insulating layer excellent in insulating performance; a resin sheet containing the resin composition; a printed wiring board including a thin insulating layer excellent in insulating performance; and a semiconductor device It is to provide.
本発明者らは、上記課題を解決すべく鋭意検討した結果、樹脂組成物の硬化物の粗化処理前の硬化物表面の水に対する接触角、及び樹脂組成物の硬化物の粗化処理後の硬化物表面の水に対する接触角を特定の範囲内にすることで、薄膜絶縁性が良好になることを見出し、本発明を完成するに至った。 As a result of intensive studies to solve the above-mentioned problems, the present inventors have found that the contact angle of the cured product surface with water before the roughening treatment of the resin composition and the roughening treatment of the cured product of the resin composition It was found that by making the contact angle of water on the surface of the cured product with water within a specific range, the thin film insulation was improved, and the present invention was completed.
すなわち、本発明は以下の内容を含む。
[1] (A)エポキシ樹脂、及び(B)硬化剤を含有する樹脂組成物であって、
樹脂組成物を100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時に、該硬化物表面を粗化処理する前の硬化物表面の水に対する接触角をX(°)とし、該硬化物表面を粗化処理した後の硬化物表面の水に対する接触角をY(°)としたとき、
X−Y≦0°、かつ、Y≧80°の関係を満たす、樹脂組成物。
[2] さらに、(C)無機充填材を含有する、[1]に記載の樹脂組成物。
[3] (C)成分の含有量が、樹脂組成物中の不揮発成分を100質量%とした場合、50質量%以上である、[2]に記載の樹脂組成物。
[4] (C)成分の平均粒径が、0.05μm〜0.35μmである、[2]又は[3]に記載の樹脂組成物。
[5] フッ素化合物を含有する、[1]〜[4]のいずれかに記載の樹脂組成物。
[6] フッ素化合物が、フッ素含有エポキシ樹脂である、[5]に記載の樹脂組成物。
[7] フッ素化合物が、(D)フッ素含有シランカップリング剤である、[5]又は[6]に記載の樹脂組成物。
[8] (C)成分が、(D)成分により表面処理されている、[7]に記載の樹脂組成物。
[9] プリント配線板の絶縁層形成用である、[1]〜[8]のいずれかに記載の樹脂組成物。
[10] 支持体と、該支持体上に設けられた、[1]〜[9]のいずれかに記載の樹脂組成物で形成された樹脂組成物層を含む、樹脂シート。
[11] 樹脂組成物層の厚みが、15μm以下である、[10]に記載の樹脂シート。
[12] 第1の導体層と、第2の導体層と、第1の導体層と第2の導体層との間に形成された厚みが6μm以下の絶縁層と、を含むプリント配線板の、該絶縁層形成用である、[11]に記載の樹脂シート。
[13] 第1の導体層、第2の導体層、及び、第1の導体層と第2の導体層との間に形成された厚みが6μm以下の絶縁層を含む、プリント配線板であって、
該絶縁層は、[1]〜[9]のいずれかに記載の樹脂組成物の硬化物である、プリント配線板。
[14] [13]に記載のプリント配線板を含む、半導体装置。
That is, the present invention includes the following contents.
[1] A resin composition containing (A) an epoxy resin and (B) a curing agent,
When a cured product was obtained by thermosetting the resin composition at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes, the contact angle of the cured product surface with water before roughening the surface of the cured product was X (° ), And when the contact angle of water on the surface of the cured product after roughening the surface of the cured product is Y (°),
A resin composition satisfying the relationship of XY ≦ 0 ° and Y ≧ 80 °.
[2] The resin composition according to [1], further comprising (C) an inorganic filler.
[3] The resin composition according to [2], wherein the content of the component (C) is 50% by mass or more when the nonvolatile component in the resin composition is 100% by mass.
[4] The resin composition according to [2] or [3], wherein the average particle diameter of the component (C) is 0.05 μm to 0.35 μm.
[5] The resin composition according to any one of [1] to [4], which contains a fluorine compound.
[6] The resin composition according to [5], wherein the fluorine compound is a fluorine-containing epoxy resin.
[7] The resin composition according to [5] or [6], wherein the fluorine compound is (D) a fluorine-containing silane coupling agent.
[8] The resin composition according to [7], wherein the component (C) is surface-treated with the component (D).
[9] The resin composition according to any one of [1] to [8], which is for forming an insulating layer of a printed wiring board.
[10] A resin sheet comprising a support and a resin composition layer formed on the support and formed from the resin composition according to any one of [1] to [9].
[11] The resin sheet according to [10], wherein the resin composition layer has a thickness of 15 μm or less.
[12] A printed wiring board including a first conductor layer, a second conductor layer, and an insulating layer having a thickness of 6 μm or less formed between the first conductor layer and the second conductor layer The resin sheet according to [11], which is used for forming the insulating layer.
[13] A printed wiring board including a first conductor layer, a second conductor layer, and an insulating layer having a thickness of 6 μm or less formed between the first conductor layer and the second conductor layer. And
The insulating layer is a printed wiring board which is a cured product of the resin composition according to any one of [1] to [9].
[14] A semiconductor device including the printed wiring board according to [13].
本発明によれば、絶縁性能に優れた薄い絶縁層を付与可能な樹脂組成物;当該樹脂組成物を含有する樹脂シート;絶縁性能に優れた薄い絶縁層を備えるプリント配線板、及び半導体装置を提供することができる。 According to the present invention, a resin composition capable of providing a thin insulating layer excellent in insulating performance; a resin sheet containing the resin composition; a printed wiring board including a thin insulating layer excellent in insulating performance; and a semiconductor device Can be provided.
以下、本発明の樹脂組成物、樹脂シート、プリント配線板、及び半導体装置について詳細に説明する。 Hereinafter, the resin composition, resin sheet, printed wiring board, and semiconductor device of the present invention will be described in detail.
[樹脂組成物]
本発明の樹脂組成物は、(A)エポキシ樹脂、及び(B)硬化剤を含有する樹脂組成物であって、樹脂組成物を100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時に、該硬化物表面を粗化処理する前の硬化物表面の水に対する接触角をX(°)とし、該硬化物表面を粗化処理した後の硬化物表面の水に対する接触角をY(°)としたとき、X−Y≦0°、かつ、Y≧80°の関係を満たす。X−Y≦0°、かつ、Y≧80°の関係を満たすように、接触角X及び接触角Yを調整することで絶縁層表面が疎水化されることにより絶縁層内に水分等が浸透しにくくなることにより絶縁性能に優れた薄い絶縁層を付与可能となる。以下、樹脂組成物を100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時の、粗化処理する前の硬化物表面の水に対する接触角を「接触角X」ということがあり、樹脂組成物を100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時の、粗化処理した後の硬化物表面の水に対する接触角を「接触角Y」ということがある。
ここで、接触角とは、静止液体の自由表面が、固体壁に接する場所で、液面と固体面とのなす角(液の内部にある角をとる)をいう。
[Resin composition]
The resin composition of the present invention is a resin composition containing (A) an epoxy resin and (B) a curing agent, and the resin composition is thermally cured at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes. When the cured product is obtained, the contact angle of the cured product surface with water before roughening the cured product surface is set to X (°), and the cured product surface is subjected to the roughened treatment with respect to water on the cured product surface. When the contact angle is Y (°), the relationship of XY ≦ 0 ° and Y ≧ 80 ° is satisfied. By adjusting the contact angle X and the contact angle Y so that the relationship of X−Y ≦ 0 ° and Y ≧ 80 ° is satisfied, the surface of the insulating layer is hydrophobized, so that moisture penetrates into the insulating layer. This makes it possible to provide a thin insulating layer with excellent insulating performance. Hereinafter, when the resin composition is thermally cured at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes to obtain a cured product, the contact angle with respect to water of the cured product surface before the roughening treatment is referred to as “contact angle X”. In some cases, when the cured product is obtained by thermosetting the resin composition at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes, the contact angle with water on the surface of the cured product after the roughening treatment is expressed as “contact”. Sometimes referred to as “angle Y”.
Here, the contact angle refers to an angle formed by the liquid surface and the solid surface (takes an angle inside the liquid) where the free surface of the stationary liquid is in contact with the solid wall.
樹脂組成物は、必要に応じて、さらに(C)無機充填材、(D)フッ素含有シランカップリング剤、(E)熱可塑性樹脂、(F)硬化促進剤、(G)難燃剤及び(H)有機充填材等の添加剤を含んでいてもよい。また、本発明の樹脂組成物は、接触角X及び接触角Yを所望の範囲に調整する観点からフッ素化合物を含有することが好ましい。フッ素化合物とは、一分子あたり1つ以上のフッ素原子を含有する化合物であり、有機化合物及び無機化合物を含む概念である。また、フッ素化合物の重量平均分子量は、通常100〜5000である。フッ素化合物は、(A)〜(H)成分のいずれかの成分として含有していることが好ましく、フッ素化合物が(A)成分として含有する及び/又は(D)成分として含有することが好ましい。フッ素化合物は、1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。また、フッ素化合物が(A)成分として含有する場合、(A)成分は、フッ素化合物及びフッ素化合物でない(A)成分を組み合わせて用いてもよい。以下、本発明の樹脂組成物に含まれる各成分について詳細に説明する。 If necessary, the resin composition may further comprise (C) an inorganic filler, (D) a fluorine-containing silane coupling agent, (E) a thermoplastic resin, (F) a curing accelerator, (G) a flame retardant, and (H ) It may contain additives such as organic fillers. Moreover, it is preferable that the resin composition of this invention contains a fluorine compound from a viewpoint of adjusting the contact angle X and the contact angle Y to a desired range. A fluorine compound is a compound containing one or more fluorine atoms per molecule and is a concept including an organic compound and an inorganic compound. Moreover, the weight average molecular weight of a fluorine compound is 100-5000 normally. The fluorine compound is preferably contained as any one of the components (A) to (H), and the fluorine compound is preferably contained as the component (A) and / or contained as the component (D). A fluorine compound may be used individually by 1 type, and may be used in combination of 2 or more type. Moreover, when a fluorine compound contains as (A) component, you may use (A) component combining (A) component which is not a fluorine compound and a fluorine compound. Hereinafter, each component contained in the resin composition of the present invention will be described in detail.
<(A)エポキシ樹脂>
(A)エポキシ樹脂としては、例えば、ビスフェノールAF型エポキシ樹脂、及びパーフルオロアルキル型エポキシ樹脂等のフッ素含有エポキシ樹脂、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールS型エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、トリスフェノール型エポキシ樹脂、ナフトールノボラック型エポキシ樹脂、フェノールノボラック型エポキシ樹脂、tert−ブチル−カテコール型エポキシ樹脂、ナフタレン型エポキシ樹脂、ナフトール型エポキシ樹脂、アントラセン型エポキシ樹脂、グリシジルアミン型エポキシ樹脂、グリシジルエステル型エポキシ樹脂、クレゾールノボラック型エポキシ樹脂、ビフェニル型エポキシ樹脂、線状脂肪族エポキシ樹脂、ブタジエン構造を有するエポキシ樹脂、脂環式エポキシ樹脂、複素環式エポキシ樹脂、スピロ環含有エポキシ樹脂、シクロヘキサンジメタノール型エポキシ樹脂、ナフチレンエーテル型エポキシ樹脂、トリメチロール型エポキシ樹脂、テトラフェニルエタン型エポキシ樹脂等が挙げられる。エポキシ樹脂は1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。
<(A) Epoxy resin>
(A) Examples of the epoxy resin include fluorine-containing epoxy resins such as bisphenol AF type epoxy resins and perfluoroalkyl type epoxy resins, bisphenol A type epoxy resins, bisphenol F type epoxy resins, bisphenol S type epoxy resins, dicyclo Pentadiene type epoxy resin, trisphenol type epoxy resin, naphthol novolak type epoxy resin, phenol novolak type epoxy resin, tert-butyl-catechol type epoxy resin, naphthalene type epoxy resin, naphthol type epoxy resin, anthracene type epoxy resin, glycidylamine type Epoxy resin, glycidyl ester type epoxy resin, cresol novolac type epoxy resin, biphenyl type epoxy resin, linear aliphatic epoxy resin, butadiene structure Epoxy resin, alicyclic epoxy resin, heterocyclic epoxy resin, spiro ring-containing epoxy resin, cyclohexanedimethanol type epoxy resin, naphthylene ether type epoxy resin, trimethylol type epoxy resin, tetraphenylethane type epoxy resin, etc. Can be mentioned. An epoxy resin may be used individually by 1 type, and may be used in combination of 2 or more type.
エポキシ樹脂は、1分子中に2個以上のエポキシ基を有するエポキシ樹脂を含むことが好ましい。エポキシ樹脂の不揮発成分を100質量%とした場合に、少なくとも50質量%以上は1分子中に2個以上のエポキシ基を有するエポキシ樹脂であるのが好ましい。中でも、1分子中に2個以上のエポキシ基を有し、温度20℃で液状のエポキシ樹脂(以下「液状エポキシ樹脂」という。)と、1分子中に3個以上のエポキシ基を有し、温度20℃で固体状のエポキシ樹脂(以下「固体状エポキシ樹脂」という。)とを含むことが好ましい。エポキシ樹脂として、液状エポキシ樹脂と固体状エポキシ樹脂とを併用することで、優れた可撓性を有し、硬化物の破断強度も向上する。 The epoxy resin preferably contains an epoxy resin having two or more epoxy groups in one molecule. When the nonvolatile component of the epoxy resin is 100% by mass, at least 50% by mass or more is preferably an epoxy resin having two or more epoxy groups in one molecule. Among them, it has two or more epoxy groups in one molecule, and has a liquid epoxy resin (hereinafter referred to as “liquid epoxy resin”) at a temperature of 20 ° C. and three or more epoxy groups in one molecule, It is preferable to contain a solid epoxy resin (hereinafter referred to as “solid epoxy resin”) at a temperature of 20 ° C. By using a liquid epoxy resin and a solid epoxy resin in combination as the epoxy resin, the epoxy resin has excellent flexibility and the breaking strength of the cured product is improved.
液状エポキシ樹脂としては、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールAF型エポキシ樹脂、ナフタレン型エポキシ樹脂、グリシジルエステル型エポキシ樹脂、グリシジルアミン型エポキシ樹脂、フェノールノボラック型エポキシ樹脂、エステル骨格を有する脂環式エポキシ樹脂、シクロヘキサンジメタノール型エポキシ樹脂、グリシジルアミン型エポキシ樹脂、及びブタジエン構造を有するエポキシ樹脂が好ましく、グリシジルアミン型エポキシ樹脂、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールAF型エポキシ樹脂及びナフタレン型エポキシ樹脂がより好ましい。液状エポキシ樹脂の具体例としては、DIC社製の「HP4032」、「HP4032D」、「HP4032SS」(ナフタレン型エポキシ樹脂)、三菱化学社製の「828US」、「jER828EL」(ビスフェノールA型エポキシ樹脂)、「jER807」(ビスフェノールF型エポキシ樹脂)、「jER152」(フェノールノボラック型エポキシ樹脂)、「YL7760」(ビスフェノールAF型エポキシ樹脂)、「630」、「630LSD」(グリシジルアミン型エポキシ樹脂)、新日鉄住金化学社製の「ZX1059」(ビスフェノールA型エポキシ樹脂とビスフェノールF型エポキシ樹脂の混合品)、新日鉄住金化学社製「YD−8125G」(ビスフェノールA型エポキシ樹脂)、ナガセケムテックス社製の「EX−721」(グリシジルエステル型エポキシ樹脂)、ダイセル社製の「セロキサイド2021P」(エステル骨格を有する脂環式エポキシ樹脂)、「PB−3600」(ブタジエン構造を有するエポキシ樹脂)、新日鐵化学社製の「ZX1658」、「ZX1658GS」(液状1,4−グリシジルシクロヘキサン)、三菱化学社製の「630LSD」(グリシジルアミン型エポキシ樹脂)、ダイキン工業社製の「E−7432」、「E−7632」(パーフルオロアルキル型エポキシ樹脂)等が挙げられる。これらは1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。 Liquid epoxy resins include bisphenol A type epoxy resins, bisphenol F type epoxy resins, bisphenol AF type epoxy resins, naphthalene type epoxy resins, glycidyl ester type epoxy resins, glycidyl amine type epoxy resins, phenol novolac type epoxy resins, and ester skeletons. Preferred are cycloaliphatic epoxy resins, cyclohexanedimethanol type epoxy resins, glycidylamine type epoxy resins, and epoxy resins having a butadiene structure. Glycidylamine type epoxy resins, bisphenol A type epoxy resins, bisphenol F type epoxy resins, bisphenol AF Type epoxy resin and naphthalene type epoxy resin are more preferable. Specific examples of the liquid epoxy resin include “HP4032”, “HP4032D”, “HP4032SS” (naphthalene type epoxy resin) manufactured by DIC, “828US”, “jER828EL” (bisphenol A type epoxy resin) manufactured by Mitsubishi Chemical Corporation. "JER807" (bisphenol F type epoxy resin), "jER152" (phenol novolak type epoxy resin), "YL7760" (bisphenol AF type epoxy resin), "630", "630LSD" (glycidylamine type epoxy resin), Nippon Steel “ZX1059” (mixed product of bisphenol A type epoxy resin and bisphenol F type epoxy resin) manufactured by Sumikin Chemical Co., Ltd., “YD-8125G” (bisphenol A type epoxy resin) manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., “ EX-7 1 "(glycidyl ester type epoxy resin)," Celoxide 2021P "(alicyclic epoxy resin having an ester skeleton) manufactured by Daicel," PB-3600 "(epoxy resin having a butadiene structure), manufactured by Nippon Steel Chemical Co., Ltd. "ZX1658", "ZX1658GS" (liquid 1,4-glycidylcyclohexane), "630LSD" (glycidylamine type epoxy resin) manufactured by Mitsubishi Chemical Corporation, "E-7432", "E-7632" manufactured by Daikin Industries, Ltd. (Perfluoroalkyl type epoxy resin) and the like. These may be used alone or in combination of two or more.
固体状エポキシ樹脂としては、ナフタレン型4官能エポキシ樹脂、クレゾールノボラック型エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、トリスフェノール型エポキシ樹脂、ナフトール型エポキシ樹脂、ビフェニル型エポキシ樹脂、ナフチレンエーテル型エポキシ樹脂、アントラセン型エポキシ樹脂、ビスフェノールA型エポキシ樹脂、テトラフェニルエタン型エポキシ樹脂が好ましく、ナフタレン型4官能エポキシ樹脂、ナフトール型エポキシ樹脂、及びビフェニル型エポキシ樹脂がより好ましい。固体状エポキシ樹脂の具体例としては、DIC社製の「HP4032H」(ナフタレン型エポキシ樹脂)、「HP−4700」、「HP−4710」(ナフタレン型4官能エポキシ樹脂)、「N−690」(クレゾールノボラック型エポキシ樹脂)、「N−695」(クレゾールノボラック型エポキシ樹脂)、「HP−7200」、「HP−7200HH」、「HP−7200H」(ジシクロペンタジエン型エポキシ樹脂)、「EXA−7311」、「EXA−7311−G3」、「EXA−7311−G4」、「EXA−7311−G4S」、「HP6000」(ナフチレンエーテル型エポキシ樹脂)、日本化薬社製の「EPPN−502H」(トリスフェノール型エポキシ樹脂)、「NC7000L」(ナフトールノボラック型エポキシ樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(ビフェニル型エポキシ樹脂)、新日鉄住金化学社製の「ESN475V」(ナフタレン型エポキシ樹脂)、「ESN485」(ナフトールノボラック型エポキシ樹脂)、三菱化学社製の「YX4000H」、「YL6121」(ビフェニル型エポキシ樹脂)、「YX4000HK」(ビキシレノール型エポキシ樹脂)、「YX8800」(アントラセン型エポキシ樹脂)、大阪ガスケミカル社製の「PG−100」、「CG−500」、三菱化学社製の「YL7800」(フルオレン型エポキシ樹脂)、三菱化学社製の「jER1010」、(固体状ビスフェノールA型エポキシ樹脂)、「jER1031S」(テトラフェニルエタン型エポキシ樹脂)等が挙げられる。 Solid epoxy resins include naphthalene type tetrafunctional epoxy resin, cresol novolac type epoxy resin, dicyclopentadiene type epoxy resin, trisphenol type epoxy resin, naphthol type epoxy resin, biphenyl type epoxy resin, naphthylene ether type epoxy resin, Anthracene type epoxy resin, bisphenol A type epoxy resin, and tetraphenylethane type epoxy resin are preferable, and naphthalene type tetrafunctional epoxy resin, naphthol type epoxy resin, and biphenyl type epoxy resin are more preferable. Specific examples of the solid epoxy resin include “HP4032H” (naphthalene type epoxy resin), “HP-4700”, “HP-4710” (naphthalene type tetrafunctional epoxy resin), “N-690” (manufactured by DIC) Cresol novolac type epoxy resin), "N-695" (cresol novolac type epoxy resin), "HP-7200", "HP-7200HH", "HP-7200H" (dicyclopentadiene type epoxy resin), "EXA-7311 ”,“ EXA-7311-G3 ”,“ EXA-7311-G4 ”,“ EXA-7311-G4S ”,“ HP6000 ”(naphthylene ether type epoxy resin),“ EPPN-502H ”(manufactured by Nippon Kayaku Co., Ltd.) Trisphenol type epoxy resin), "NC7000L" (naphthol novolac type epoxy) Fat), “NC3000H”, “NC3000”, “NC3000L”, “NC3100” (biphenyl type epoxy resin), “ESN475V” (naphthalene type epoxy resin), “ESN485” (naphthol novolak type epoxy resin) manufactured by Nippon Steel & Sumikin Chemical Co., Ltd. ), “YX4000H”, “YL6121” (biphenyl type epoxy resin), “YX4000HK” (bixylenol type epoxy resin), “YX8800” (anthracene type epoxy resin) manufactured by Mitsubishi Chemical Corporation, “PG” manufactured by Osaka Gas Chemical Co., Ltd. -100 "," CG-500 "," YL7800 "(fluorene type epoxy resin) manufactured by Mitsubishi Chemical Corporation," jER1010 "manufactured by Mitsubishi Chemical Corporation (solid bisphenol A type epoxy resin)," jER1031S "(tetraphenyl) Ethane type epoxy tree ), And the like.
液状エポキシ樹脂としては1分子中に2個以上のエポキシ基を有し、温度20℃で液状の芳香族系エポキシ樹脂が好ましく、固体状エポキシ樹脂としては1分子中に3個以上のエポキシ基を有し、温度20℃で固体状の芳香族系エポキシ樹脂が好ましい。なお、本発明でいう芳香族系エポキシ樹脂とは、その分子内に芳香環構造を有するエポキシ樹脂を意味する。 The liquid epoxy resin is preferably an aromatic epoxy resin having two or more epoxy groups in one molecule and a liquid at a temperature of 20 ° C. The solid epoxy resin has three or more epoxy groups in one molecule. And an aromatic epoxy resin that is solid at a temperature of 20 ° C. is preferable. In addition, the aromatic epoxy resin as used in the field of this invention means the epoxy resin which has an aromatic ring structure in the molecule | numerator.
(A)成分としては接触角X及び接触角Yを所望の範囲に調整する観点から、フッ素化合物であるフッ素含有エポキシ樹脂であることが好ましい。 The component (A) is preferably a fluorine-containing epoxy resin that is a fluorine compound from the viewpoint of adjusting the contact angle X and the contact angle Y to a desired range.
エポキシ樹脂として、液状エポキシ樹脂と固体状エポキシ樹脂とを併用する場合、それらの量比(液状エポキシ樹脂:固体状エポキシ樹脂)は、質量比で、1:0.1〜1:15の範囲が好ましい。液状エポキシ樹脂と固体状エポキシ樹脂との量比を斯かる範囲とすることにより、i)樹脂シートの形態で使用する場合に適度な粘着性がもたらされる、ii)樹脂シートの形態で使用する場合に十分な可撓性が得られ、取り扱い性が向上する、並びにiii)十分な破断強度を有する樹脂組成物層の硬化物を得ることができる等の効果が得られる。上記i)〜iii)の効果の観点から、液状エポキシ樹脂と固体状エポキシ樹脂の量比(液状エポキシ樹脂:固体状エポキシ樹脂)は、質量比で、1:0.1〜1:12の範囲がより好ましく、1:0.5〜1:10の範囲がさらに好ましい。 When a liquid epoxy resin and a solid epoxy resin are used in combination as an epoxy resin, the quantitative ratio thereof (liquid epoxy resin: solid epoxy resin) is in the range of 1: 0.1 to 1:15 in terms of mass ratio. preferable. By making the quantity ratio of the liquid epoxy resin and the solid epoxy resin within such a range, i) suitable adhesiveness is obtained when used in the form of a resin sheet, ii) when used in the form of a resin sheet Sufficient flexibility is obtained, handling properties are improved, and iii) a cured product of the resin composition layer having sufficient breaking strength can be obtained. From the viewpoint of the effects i) to iii), the quantitative ratio of liquid epoxy resin to solid epoxy resin (liquid epoxy resin: solid epoxy resin) is in the range of 1: 0.1 to 1:12 in terms of mass ratio. Is more preferable, and the range of 1: 0.5 to 1:10 is even more preferable.
樹脂組成物中のエポキシ樹脂の含有量は、良好な引張破壊強度、絶縁信頼性を示す絶縁層を得る観点から、好ましくは5質量%以上、より好ましくは9質量%以上、さらに好ましくは13質量%以上である。エポキシ樹脂の含有量の上限は、本発明の効果が奏される限りにおいて特に限定されないが、好ましくは50質量%以下、より好ましくは40質量%以下である。 The content of the epoxy resin in the resin composition is preferably 5% by mass or more, more preferably 9% by mass or more, and still more preferably 13% by mass from the viewpoint of obtaining an insulating layer exhibiting good tensile fracture strength and insulation reliability. % Or more. Although the upper limit of content of an epoxy resin is not specifically limited as long as the effect of this invention is show | played, Preferably it is 50 mass% or less, More preferably, it is 40 mass% or less.
なお、本発明において、樹脂組成物中の各成分の含有量は、別途明示のない限り、樹脂組成物中の不揮発成分を100質量%としたときの値である。 In addition, in this invention, content of each component in a resin composition is a value when the non-volatile component in a resin composition is 100 mass% unless there is separate description.
本発明の樹脂組成物が、2種以上の(A)成分を含む場合、樹脂組成物中のフッ素含有エポキシ樹脂の樹脂組成物中の不揮発成分を100質量%としたときの質量をWA、樹脂組成物中のフッ素含有エポキシ樹脂以外のエポキシ樹脂の樹脂組成物中の不揮発成分を100質量%としたときの質量をWBとしたとき、WB/WAは1〜10であることが好ましく、1〜5であることがより好ましく、1〜3であることがさらに好ましい。 The resin composition of the present invention, if it contains two or more component (A), the mass when the non-volatile components of the fluorine-containing epoxy resin in the resin composition in the resin composition is 100 mass% W A, when the mass when the non-volatile components of the fluorine-containing epoxy resin other than the epoxy resin resin composition of the resin composition was 100% by mass was W B, W B / W a has from 1 to 10 Preferably, it is 1-5, more preferably 1-3.
エポキシ樹脂のエポキシ当量は、好ましくは50〜5000、より好ましくは50〜3000、さらに好ましくは80〜2000、さらにより好ましくは110〜1000である。この範囲となることで、樹脂組成物層の硬化物の架橋密度が十分となり表面粗さの小さい絶縁層をもたらすことができる。なお、エポキシ当量は、JIS K7236に従って測定することができ、1当量のエポキシ基を含む樹脂の質量である。 The epoxy equivalent of the epoxy resin is preferably 50 to 5000, more preferably 50 to 3000, still more preferably 80 to 2000, and even more preferably 110 to 1000. By being in this range, the crosslinked density of the cured product of the resin composition layer is sufficient, and an insulating layer having a small surface roughness can be provided. The epoxy equivalent can be measured according to JIS K7236, and is the mass of a resin containing 1 equivalent of an epoxy group.
エポキシ樹脂の重量平均分子量は、好ましくは100〜5000、より好ましくは250〜3000、さらに好ましくは400〜1500である。ここで、エポキシ樹脂の重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)法により測定されるポリスチレン換算の重量平均分子量である。 The weight average molecular weight of an epoxy resin becomes like this. Preferably it is 100-5000, More preferably, it is 250-3000, More preferably, it is 400-1500. Here, the weight average molecular weight of the epoxy resin is a weight average molecular weight in terms of polystyrene measured by a gel permeation chromatography (GPC) method.
<(B)硬化剤>
硬化剤としては、エポキシ樹脂を硬化する機能を有するものであれば、特に限定されず、例えば、フェノール系硬化剤、ナフトール系硬化剤、活性エステル系硬化剤、ベンゾオキサジン系硬化剤、シアネートエステル系硬化剤、及びカルボジイミド系硬化剤などが挙げられる。硬化剤は1種単独で用いてもよく、又は2種以上を併用してもよい。
<(B) Curing agent>
The curing agent is not particularly limited as long as it has a function of curing an epoxy resin. For example, a phenolic curing agent, a naphthol curing agent, an active ester curing agent, a benzoxazine curing agent, a cyanate ester Examples thereof include a curing agent and a carbodiimide curing agent. A hardening | curing agent may be used individually by 1 type, or may use 2 or more types together.
フェノール系硬化剤及びナフトール系硬化剤としては、耐熱性及び耐水性の観点から、ノボラック構造を有するフェノール系硬化剤、又はノボラック構造を有するナフトール系硬化剤が好ましい。また、導体層との密着性の観点から、含窒素フェノール系硬化剤が好ましく、トリアジン骨格含有フェノール系硬化剤がより好ましい。中でも、耐熱性、耐水性、及び導体層との密着性を高度に満足させる観点から、トリアジン骨格含有フェノールノボラック硬化剤が好ましい。 As the phenol-based curing agent and the naphthol-based curing agent, a phenol-based curing agent having a novolak structure or a naphthol-based curing agent having a novolak structure is preferable from the viewpoint of heat resistance and water resistance. Moreover, from a viewpoint of adhesiveness with a conductor layer, a nitrogen-containing phenol type hardening | curing agent is preferable and a triazine frame | skeleton containing phenol type hardening | curing agent is more preferable. Among these, a triazine skeleton-containing phenol novolac curing agent is preferable from the viewpoint of highly satisfying heat resistance, water resistance, and adhesion to the conductor layer.
フェノール系硬化剤及びナフトール系硬化剤の具体例としては、例えば、明和化成社製の「MEH−7700」、「MEH−7810」、「MEH−7851」、日本化薬社製の「NHN」、「CBN」、「GPH」、新日鉄住金社製の「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN−495V」、「SN375」、「SN395」、DIC社製の「TD−2090」、「LA−7052」、「LA−7054」、「LA−1356」、「LA−3018−50P」、「EXB−9500」等が挙げられる。 Specific examples of the phenol-based curing agent and the naphthol-based curing agent include, for example, “MEH-7700”, “MEH-7810”, “MEH-7785” manufactured by Meiwa Kasei Co., Ltd., “NHN” manufactured by Nippon Kayaku Co., Ltd. “CBN”, “GPH”, “SN170”, “SN180”, “SN190”, “SN475”, “SN485”, “SN495”, “SN-495V”, “SN375”, “SN395” manufactured by Nippon Steel & Sumikin Co., Ltd. “TD-2090”, “LA-7052”, “LA-7054”, “LA-1356”, “LA-3018-50P”, “EXB-9500” and the like manufactured by DIC.
活性エステル系硬化剤としては、特に制限はないが、一般にフェノールエステル類、チオフェノールエステル類、N−ヒドロキシアミンエステル類、複素環ヒドロキシ化合物のエステル類等の、反応活性の高いエステル基を1分子中に2個以上有する化合物が好ましく用いられる。当該活性エステル系硬化剤は、カルボン酸化合物及び/又はチオカルボン酸化合物とヒドロキシ化合物及び/又はチオール化合物との縮合反応によって得られるものが好ましい。特に耐熱性向上の観点から、カルボン酸化合物とヒドロキシ化合物とから得られる活性エステル系硬化剤が好ましく、カルボン酸化合物とフェノール化合物及び/又はナフトール化合物とから得られる活性エステル系硬化剤がより好ましい。カルボン酸化合物としては、例えば安息香酸、酢酸、コハク酸、マレイン酸、イタコン酸、フタル酸、イソフタル酸、テレフタル酸、ピロメリット酸等が挙げられる。フェノール化合物又はナフトール化合物としては、例えば、ハイドロキノン、レゾルシン、ビスフェノールA、ビスフェノールF、ビスフェノールS、フェノールフタリン、メチル化ビスフェノールA、メチル化ビスフェノールF、メチル化ビスフェノールS、フェノール、o−クレゾール、m−クレゾール、p−クレゾール、カテコール、α−ナフトール、β−ナフトール、1,5−ジヒドロキシナフタレン、1,6−ジヒドロキシナフタレン、2,6−ジヒドロキシナフタレン、ジヒドロキシベンゾフェノン、トリヒドロキシベンゾフェノン、テトラヒドロキシベンゾフェノン、フロログルシン、ベンゼントリオール、ジシクロペンタジエン型ジフェノール化合物、フェノールノボラック等が挙げられる。ここで、「ジシクロペンタジエン型ジフェノール化合物」とは、ジシクロペンタジエン1分子にフェノール2分子が縮合して得られるジフェノール化合物をいう。 Although there is no restriction | limiting in particular as an active ester type hardening | curing agent, Generally 1 molecule of ester groups with high reaction activity, such as phenol ester, thiophenol ester, N-hydroxyamine ester, ester of a heterocyclic hydroxy compound, are carried out. A compound having two or more thereof is preferably used. The active ester curing agent is preferably obtained by a condensation reaction between a carboxylic acid compound and / or a thiocarboxylic acid compound and a hydroxy compound and / or a thiol compound. In particular, from the viewpoint of improving heat resistance, an active ester curing agent obtained from a carboxylic acid compound and a hydroxy compound is preferable, and an active ester curing agent obtained from a carboxylic acid compound and a phenol compound and / or a naphthol compound is more preferable. Examples of the carboxylic acid compound include benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, and pyromellitic acid. Examples of the phenol compound or naphthol compound include hydroquinone, resorcin, bisphenol A, bisphenol F, bisphenol S, phenolphthaline, methylated bisphenol A, methylated bisphenol F, methylated bisphenol S, phenol, o-cresol, m- Cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucin, Benzenetriol, dicyclopentadiene type diphenol compound, phenol novolac and the like can be mentioned. Here, the “dicyclopentadiene type diphenol compound” refers to a diphenol compound obtained by condensing two molecules of phenol with one molecule of dicyclopentadiene.
具体的には、ジシクロペンタジエン型ジフェノール構造を含む活性エステル化合物、ナフタレン構造を含む活性エステル化合物、フェノールノボラックのアセチル化物を含む活性エステル化合物、フェノールノボラックのベンゾイル化物を含む活性エステル化合物が好ましく、中でもナフタレン構造を含む活性エステル化合物、ジシクロペンタジエン型ジフェノール構造を含む活性エステル化合物がより好ましい。「ジシクロペンタジエン型ジフェノール構造」とは、フェニレン−ジシクロペンチレン−フェニレンからなる2価の構造単位を表す。 Specifically, an active ester compound containing a dicyclopentadiene-type diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound containing an acetylated product of a phenol novolac, and an active ester compound containing a benzoylated product of a phenol novolac are preferred, Of these, active ester compounds having a naphthalene structure and active ester compounds having a dicyclopentadiene type diphenol structure are more preferred. The “dicyclopentadiene type diphenol structure” represents a divalent structural unit composed of phenylene-dicyclopentylene-phenylene.
活性エステル系硬化剤の市販品としては、ジシクロペンタジエン型ジフェノール構造を含む活性エステル化合物として、「EXB9451」、「EXB9460」、「EXB9460S」、「HPC−8000−65T」、「HPC−8000H−65TM」、「EXB−8000L−65TM」(DIC社製)、ナフタレン構造を含む活性エステル化合物として「EXB9416−70BK」(DIC社製)、フェノールノボラックのアセチル化物を含む活性エステル化合物として「DC808」(三菱化学社製)、フェノールノボラックのベンゾイル化物を含む活性エステル化合物として「YLH1026」(三菱化学社製)、フェノールノボラックのアセチル化物である活性エステル系硬化剤として「DC808」(三菱化学社製)、フェノールノボラックのベンゾイル化物である活性エステル系硬化剤として「YLH1026」(三菱化学社製)、「YLH1030」(三菱化学社製)、「YLH1048」(三菱化学社製)等が挙げられる。 Commercially available active ester curing agents include "EXB9451", "EXB9460", "EXB9460S", "HPC-8000-65T", "HPC-8000H-" as active ester compounds containing a dicyclopentadiene type diphenol structure. 65TM "," EXB-8000L-65TM "(manufactured by DIC)," EXB9416-70BK "(manufactured by DIC) as an active ester compound containing a naphthalene structure, and" DC808 "as an active ester compound containing an acetylated product of phenol novolac ( Mitsubishi Chemical Co., Ltd.), “YLH1026” (manufactured by Mitsubishi Chemical Corporation) as an active ester compound containing a benzoylated product of phenol novolac, “DC808” (manufactured by Mitsubishi Chemical Corporation) as an active ester curing agent which is an acetylated product of phenol novolac, "YLH1026" as an active ester-based curing agent is benzoyl product of E Nord novolac (manufactured by Mitsubishi Chemical Corporation), "YLH1030" (manufactured by Mitsubishi Chemical Corporation), "YLH1048" (manufactured by Mitsubishi Chemical Corporation), and the like.
ベンゾオキサジン系硬化剤の具体例としては、昭和高分子社製の「HFB2006M」、四国化成工業社製の「P−d」、「F−a」が挙げられる。 Specific examples of the benzoxazine-based curing agent include “HFB2006M” manufactured by Showa Polymer Co., Ltd. and “Pd” and “Fa” manufactured by Shikoku Kasei Kogyo Co., Ltd.
シアネートエステル系硬化剤としては、例えば、ビスフェノールAジシアネート、ポリフェノールシアネート、オリゴ(3−メチレン−1,5−フェニレンシアネート)、4,4’−メチレンビス(2,6−ジメチルフェニルシアネート)、4,4’−エチリデンジフェニルジシアネート、ヘキサフルオロビスフェノールAジシアネート、2,2−ビス(4−シアネート)フェニルプロパン、1,1−ビス(4−シアネートフェニルメタン)、ビス(4−シアネート−3,5−ジメチルフェニル)メタン、1,3−ビス(4−シアネートフェニル−1−(メチルエチリデン))ベンゼン、ビス(4−シアネートフェニル)チオエーテル、及びビス(4−シアネートフェニル)エーテル等の2官能シアネート樹脂、フェノールノボラック及びクレゾールノボラック等から誘導される多官能シアネート樹脂、これらシアネート樹脂が一部トリアジン化したプレポリマーなどが挙げられる。シアネートエステル系硬化剤の具体例としては、ロンザジャパン社製の「PT30」及び「PT60」(フェノールノボラック型多官能シアネートエステル樹脂)、「ULL−950S」(多官能シアネートエステル樹脂)、「BA230」、「BA230S75」(ビスフェノールAジシアネートの一部又は全部がトリアジン化され三量体となったプレポリマー)等が挙げられる。 Examples of the cyanate ester curing agent include bisphenol A dicyanate, polyphenol cyanate, oligo (3-methylene-1,5-phenylene cyanate), 4,4′-methylenebis (2,6-dimethylphenyl cyanate), 4,4. '-Ethylidene diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-bis (4-cyanate) phenylpropane, 1,1-bis (4-cyanatephenylmethane), bis (4-cyanate-3,5-dimethyl) Bifunctional cyanate resins such as phenyl) methane, 1,3-bis (4-cyanatephenyl-1- (methylethylidene)) benzene, bis (4-cyanatephenyl) thioether, and bis (4-cyanatephenyl) ether, phenol Novolac and K Polyfunctional cyanate resin derived from tetrazole novolac, these cyanate resins and partially triazine of prepolymer. Specific examples of the cyanate ester curing agent include “PT30” and “PT60” (phenol novolac type polyfunctional cyanate ester resin), “ULL-950S” (polyfunctional cyanate ester resin), and “BA230” manufactured by Lonza Japan. , “BA230S75” (a prepolymer in which part or all of bisphenol A dicyanate is triazine-modified into a trimer), and the like.
カルボジイミド系硬化剤の具体例としては、日清紡ケミカル社製の「V−03」、「V−07」等が挙げられる。 Specific examples of the carbodiimide curing agent include “V-03” and “V-07” manufactured by Nisshinbo Chemical Co., Ltd.
エポキシ樹脂と硬化剤との量比は、[エポキシ樹脂のエポキシ基の合計数]:[硬化剤の反応基の合計数]の比率で、1:0.01〜1:2の範囲が好ましく、1:0.015〜1:1.5がより好ましく、1:0.02〜1:1がさらに好ましい。ここで、硬化剤の反応基とは、活性水酸基、活性エステル基等であり、硬化剤の種類によって異なる。また、エポキシ樹脂のエポキシ基の合計数とは、各エポキシ樹脂の固形分質量をエポキシ当量で除した値をすべてのエポキシ樹脂について合計した値であり、硬化剤の反応基の合計数とは、各硬化剤の固形分質量を反応基当量で除した値をすべての硬化剤について合計した値である。エポキシ樹脂と硬化剤との量比を斯かる範囲とすることにより、樹脂組成物層の硬化物の耐熱性がより向上する。 The amount ratio of the epoxy resin and the curing agent is preferably a ratio of [total number of epoxy groups of the epoxy resin]: [total number of reactive groups of the curing agent] in the range of 1: 0.01 to 1: 2. 1: 0.015 to 1: 1.5 are more preferable, and 1: 0.02 to 1: 1 are more preferable. Here, the reactive group of the curing agent is an active hydroxyl group, an active ester group or the like, and varies depending on the type of the curing agent. Moreover, the total number of epoxy groups of the epoxy resin is a value obtained by dividing the value obtained by dividing the solid mass of each epoxy resin by the epoxy equivalent for all epoxy resins, and the total number of reactive groups of the curing agent is: The value obtained by dividing the solid mass of each curing agent by the reactive group equivalent is the total value for all curing agents. By making the quantity ratio of an epoxy resin and a hardening | curing agent into such a range, the heat resistance of the hardened | cured material of a resin composition layer improves more.
一実施形態において、樹脂組成物は、先述のエポキシ樹脂及び硬化剤を含む。樹脂組成物は、(A)エポキシ樹脂として液状エポキシ樹脂と固体状エポキシ樹脂との混合物(液状エポキシ樹脂:固体状エポキシ樹脂の質量比は好ましくは1:0.1〜1:15、より好ましくは1:0.3〜1:12、さらに好ましくは1:0.6〜1:10)を、(B)硬化剤としてフェノール系硬化剤、ナフトール系硬化剤、活性エステル系硬化剤及びシアネートエステル系硬化剤からなる群から選択される1種以上(好ましくは活性エステル系硬化剤及びシアネートエステル系硬化剤からなる群から選択される1種以上)を、それぞれ含むことが好ましい。 In one embodiment, the resin composition includes the aforementioned epoxy resin and a curing agent. The resin composition is a mixture of a liquid epoxy resin and a solid epoxy resin (A) as an epoxy resin (mass ratio of liquid epoxy resin: solid epoxy resin is preferably 1: 0.1 to 1:15, more preferably 1: 0.3-1: 12, more preferably 1: 0.6-1: 10), (B) a phenolic curing agent, a naphthol curing agent, an active ester curing agent and a cyanate ester One or more selected from the group consisting of curing agents (preferably one or more selected from the group consisting of active ester curing agents and cyanate ester curing agents) are preferably included.
樹脂組成物中の硬化剤の含有量は特に限定されないが、好ましくは30質量%以下、より好ましくは25質量%以下、さらに好ましくは20質量%以下である。また、下限は特に制限はないが2質量%以上が好ましい。 Although content of the hardening | curing agent in a resin composition is not specifically limited, Preferably it is 30 mass% or less, More preferably, it is 25 mass% or less, More preferably, it is 20 mass% or less. The lower limit is not particularly limited but is preferably 2% by mass or more.
<(C)無機充填材>
一実施形態において、樹脂組成物は無機充填材を含有し得る。無機充填材の材料は特に限定されないが、例えば、シリカ、アルミナ、ガラス、コーディエライト、シリコン酸化物、硫酸バリウム、炭酸バリウム、タルク、クレー、雲母粉、酸化亜鉛、ハイドロタルサイト、ベーマイト、水酸化アルミニウム、水酸化マグネシウム、炭酸カルシウム、炭酸マグネシウム、酸化マグネシウム、窒化ホウ素、窒化アルミニウム、窒化マンガン、ホウ酸アルミニウム、炭酸ストロンチウム、チタン酸ストロンチウム、チタン酸カルシウム、チタン酸マグネシウム、チタン酸ビスマス、酸化チタン、酸化ジルコニウム、チタン酸バリウム、チタン酸ジルコン酸バリウム、ジルコン酸バリウム、ジルコン酸カルシウム、リン酸ジルコニウム、及びリン酸タングステン酸ジルコニウム等が挙げられる。これらの中でもシリカが特に好適である。シリカとしては、例えば、無定形シリカ、溶融シリカ、結晶シリカ、合成シリカ、中空シリカ等が挙げられる。またシリカとしては球状シリカが好ましい。無機充填材は1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。
<(C) Inorganic filler>
In one embodiment, the resin composition may contain an inorganic filler. The material of the inorganic filler is not particularly limited. For example, silica, alumina, glass, cordierite, silicon oxide, barium sulfate, barium carbonate, talc, clay, mica powder, zinc oxide, hydrotalcite, boehmite, water Aluminum oxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum nitride, manganese nitride, aluminum borate, strontium carbonate, strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide , Zirconium oxide, barium titanate, barium zirconate titanate, barium zirconate, calcium zirconate, zirconium phosphate, and zirconium tungstate phosphate. Of these, silica is particularly preferred. Examples of the silica include amorphous silica, fused silica, crystalline silica, synthetic silica, and hollow silica. Moreover, spherical silica is preferable as the silica. An inorganic filler may be used individually by 1 type, and may be used in combination of 2 or more type.
無機充填材の平均粒径は、0.35μm以下が好ましく、0.32μm以下がより好ましく、0.3μm以下がさらに好ましく、0.29μm以下がさらにより好ましい。該平均粒径の下限は、樹脂組成物層中の分散性向上という観点から、0.05μm以上が好ましく、0.06μm以上がより好ましく、0.07μm以上がさらに好ましい。このような平均粒径を有する無機充填材の市販品としては、例えば、電気化学工業社製「UFP−30」、新日鉄住金マテリアルズ社製「SPH516−05」等が挙げられる。無機充填材の平均粒径を上記範囲内に調整することで、絶縁性を向上させることができる。 The average particle size of the inorganic filler is preferably 0.35 μm or less, more preferably 0.32 μm or less, further preferably 0.3 μm or less, and even more preferably 0.29 μm or less. From the viewpoint of improving dispersibility in the resin composition layer, the lower limit of the average particle diameter is preferably 0.05 μm or more, more preferably 0.06 μm or more, and further preferably 0.07 μm or more. Examples of commercially available inorganic fillers having such an average particle diameter include “UFP-30” manufactured by Denki Kagaku Kogyo Co., Ltd. and “SPH516-05” manufactured by Nippon Steel & Sumikin Materials. Insulating properties can be improved by adjusting the average particle size of the inorganic filler within the above range.
無機充填材の平均粒径はミー(Mie)散乱理論に基づくレーザー回折・散乱法により測定することができる。具体的にはレーザー回折散乱式粒度分布測定装置により、無機充填材の粒度分布を体積基準で作成し、そのメディアン径を平均粒径とすることで測定することができる。測定サンプルは、無機充填材を超音波によりメチルエチルケトン中に分散させたものを好ましく使用することができる。レーザー回折散乱式粒度分布測定装置としては、堀場製作所社製「LA−500」、島津製作所社製「SALD−2200」等を使用することができる。 The average particle diameter of the inorganic filler can be measured by a laser diffraction / scattering method based on Mie scattering theory. Specifically, the particle size distribution of the inorganic filler can be prepared on a volume basis by a laser diffraction / scattering particle size distribution measuring apparatus, and the median diameter can be measured as the average particle diameter. As the measurement sample, an inorganic filler dispersed in methyl ethyl ketone by ultrasonic waves can be preferably used. As a laser diffraction scattering type particle size distribution measuring device, “LA-500” manufactured by Horiba, Ltd., “SALD-2200” manufactured by Shimadzu Corporation, etc. can be used.
無機充填材は、表面処理剤で表面処理されていることが好ましい。表面処理剤としては、後述する(D)フッ素含有シランカップリング剤、及び(D)成分以外の表面処理剤(以下、「他の表面処理剤」ということがある。)が挙げられる。(C)成分は、(D)成分で表面処理されていてもよく、他の表面処理剤で表面処理されていてもよく、接触角X及び接触角Yを調整する観点から、(C)成分は(D)成分で表面処理されていることが好ましい。表面処理剤は、1種類単独で用いてもよく、2種類以上を組み合わせて用いてもよい。 The inorganic filler is preferably surface-treated with a surface treatment agent. Examples of the surface treatment agent include (D) a fluorine-containing silane coupling agent, which will be described later, and a surface treatment agent other than the component (D) (hereinafter also referred to as “other surface treatment agent”). The component (C) may be surface-treated with the component (D) or may be surface-treated with another surface treatment agent. From the viewpoint of adjusting the contact angle X and the contact angle Y, the component (C) Is preferably surface-treated with component (D). A surface treating agent may be used individually by 1 type, and may be used in combination of 2 or more types.
他の表面処理剤としては、(D)成分以外のシランカップリング剤、アルコキシシラン化合物、及びオルガノシラザン化合物の少なくとも1種の表面処理剤が好ましい。これらは、オリゴマーであってもよい。他の表面処理剤の例としては、アミノシラン系カップリング剤、エポキシシラン系カップリング剤、メルカプトシラン系カップリング剤、シラン系カップリング剤、オルガノシラザン化合物、チタネート系カップリング剤等が挙げられる。表面処理剤の市販品としては、例えば、信越化学工業社製「KBM403」(3−グリシドキシプロピルトリメトキシシラン)、信越化学工業社製「KBM803」(3−メルカプトプロピルトリメトキシシラン)、信越化学工業社製「KBE903」(3−アミノプロピルトリエトキシシラン)、信越化学工業社製「KBM573」(N−フェニル−3−アミノプロピルトリメトキシシラン)、信越化学工業社製「SZ−31」(ヘキサメチルジシラザン)、信越化学工業社製「KBM103」(フェニルトリメトキシシラン)、信越化学工業社製「KBM−4803」(長鎖エポキシ型シランカップリング剤)等が挙げられる。 As the other surface treatment agent, at least one kind of surface treatment agent of a silane coupling agent other than the component (D), an alkoxysilane compound, and an organosilazane compound is preferable. These may be oligomers. Examples of other surface treatment agents include aminosilane coupling agents, epoxysilane coupling agents, mercaptosilane coupling agents, silane coupling agents, organosilazane compounds, titanate coupling agents, and the like. Examples of commercially available surface treatment agents include “KBM403” (3-glycidoxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd., “KBM803” (3-mercaptopropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd., Shin-Etsu. “KBE903” (3-aminopropyltriethoxysilane) manufactured by Chemical Industry Co., Ltd. “KBM573” (N-phenyl-3-aminopropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd., “SZ-31” manufactured by Shin-Etsu Chemical Co., Ltd. ( Hexamethyldisilazane), “KBM103” (phenyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd., “KBM-4803” (long-chain epoxy type silane coupling agent) manufactured by Shin-Etsu Chemical Co., Ltd., and the like.
表面処理剤による表面処理の程度は、無機充填材の分散性向上の観点から、(C)成分100質量部に対して、0.2質量部〜2質量部の表面処理剤で表面処理されていることが好ましく、0.2質量部〜1質量部で表面処理されていることが好ましく、0.3質量部〜0.8質量部で表面処理されていることが好ましい。 The degree of the surface treatment with the surface treatment agent is 0.2 to 2 parts by mass of the surface treatment agent with respect to 100 parts by mass of component (C) from the viewpoint of improving the dispersibility of the inorganic filler. The surface treatment is preferably performed at 0.2 parts by mass to 1 part by mass, and preferably at 0.3 parts by mass to 0.8 parts by mass.
表面処理剤による表面処理の程度は、無機充填材の単位表面積当たりのカーボン量によって評価することができる。無機充填材の単位表面積当たりのカーボン量は、無機充填材の分散性向上の観点から、0.02mg/m2以上が好ましく、0.1mg/m2以上がより好ましく、0.2mg/m2以上が更に好ましい。一方、樹脂ワニスの溶融粘度及びシート形態での溶融粘度の上昇を抑制する観点から、1mg/m2以下が好ましく、0.8mg/m2以下がより好ましく、0.5mg/m2以下が更に好ましい。 The degree of surface treatment with the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the inorganic filler. Carbon content per unit surface area of the inorganic filler, from the viewpoint of improving dispersibility of the inorganic filler is preferably 0.02 mg / m 2 or more, 0.1 mg / m 2 or more preferably, 0.2 mg / m 2 The above is more preferable. On the other hand, 1 mg / m 2 or less is preferable, 0.8 mg / m 2 or less is more preferable, and 0.5 mg / m 2 or less is more preferable from the viewpoint of suppressing the increase in melt viscosity of the resin varnish and the sheet form. preferable.
無機充填材の単位表面積当たりのカーボン量は、表面処理後の無機充填材を溶剤(例えば、メチルエチルケトン(MEK))により洗浄処理した後に測定することができる。具体的には、溶剤として十分な量のMEKを表面処理剤で表面処理された無機充填材に加えて、25℃で5分間超音波洗浄する。上澄液を除去し、固形分を乾燥させた後、カーボン分析計を用いて無機充填材の単位表面積当たりのカーボン量を測定することができる。カーボン分析計としては、堀場製作所社製「EMIA−320V」等を使用することができる。 The amount of carbon per unit surface area of the inorganic filler can be measured after the surface-treated inorganic filler is washed with a solvent (for example, methyl ethyl ketone (MEK)). Specifically, a sufficient amount of MEK as a solvent is added to the inorganic filler surface-treated with the surface treatment agent and ultrasonically cleaned at 25 ° C. for 5 minutes. After removing the supernatant and drying the solid, the carbon amount per unit surface area of the inorganic filler can be measured using a carbon analyzer. As the carbon analyzer, “EMIA-320V” manufactured by HORIBA, Ltd. can be used.
樹脂組成物中の無機充填材の含有量(充填量)は、樹脂組成物層の厚み安定性を向上させる観点から、樹脂組成物中の不揮発成分を100質量%としたとき、好ましくは50質量%以上、より好ましくは55質量%以上、さらに好ましくは60質量%以上である。樹脂組成物中の無機充填材の含有量の上限は、薄膜絶縁性の向上、並びに絶縁層(樹脂組成物層の硬化物)の引張破壊強度の観点から、好ましくは85質量%以下、より好ましくは80質量%以下、さらに好ましくは75質量%以下である。 From the viewpoint of improving the thickness stability of the resin composition layer, the content (filling amount) of the inorganic filler in the resin composition is preferably 50 masses when the nonvolatile component in the resin composition is 100 mass%. % Or more, more preferably 55% by mass or more, and still more preferably 60% by mass or more. The upper limit of the content of the inorganic filler in the resin composition is preferably 85% by mass or less, more preferably from the viewpoint of improvement in thin film insulation and tensile fracture strength of the insulating layer (cured product of the resin composition layer). Is 80% by mass or less, more preferably 75% by mass or less.
<(D)フッ素含有シランカップリング剤>
一実施形態において、本発明の樹脂組成物は、フッ素化合物としてフッ素含有シランカップリング剤を含有し得る。フッ素含有シランカップリング剤を含有させることで、接触角X及び接触角Yを調整することができる。
<(D) Fluorine-containing silane coupling agent>
In one embodiment, the resin composition of the present invention may contain a fluorine-containing silane coupling agent as a fluorine compound. The contact angle X and the contact angle Y can be adjusted by containing a fluorine-containing silane coupling agent.
(D)成分の具体例としては、信越化学工業社製の「KBM−7103」(3,3,3−トリフルオロプロピルトリメトキシシラン)等が挙げられる。(D)成分は1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。 Specific examples of the component (D) include “KBM-7103” (3,3,3-trifluoropropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd. (D) A component may be used individually by 1 type and may be used in combination of 2 or more type.
本発明の樹脂組成物中に含まれる(D)成分の態様は特に限定されないが、下記(i)〜(iii)の態様で樹脂組成物中に含有することが好ましく、(i)又は(ii)の態様で樹脂組成物中に含有することがより好ましく、(i)の態様で樹脂組成物中に含有することがさらに好ましい。即ち、(D)成分は、(C)成分の表面処理剤として樹脂組成物中に含有することが好ましい。
(i)(D)成分が(C)成分の表面処理剤として含有。
(ii)(D)成分単独で樹脂組成物中に含有。
(iii)(D)成分が(C)成分の表面処理剤として含有しているとともに、(D)成分単独で樹脂組成物中に含有。
「(D)成分が(C)成分の表面処理剤として含有」とは、(C)成分が(D)成分で表面処理されていることを表す。この場合、(D)成分は通常、(C)成分の表面にある。また、「(D)成分単独で樹脂組成物中に含有」とは、(D)成分が(C)成分の表面処理剤として含有していないことを表す。なお、(D)成分が(C)成分の表面処理剤として含有していない場合は、(C)成分は樹脂組成物中に遊離している。
Although the aspect of (D) component contained in the resin composition of this invention is not specifically limited, It is preferable to contain in the resin composition in the aspect of the following (i)-(iii), (i) or (ii) ) Is more preferably contained in the resin composition, and more preferably in the resin composition in the form (i). That is, the component (D) is preferably contained in the resin composition as a surface treatment agent for the component (C).
(I) (D) component contains as a surface treating agent of (C) component.
(Ii) Component (D) contained alone in the resin composition.
(Iii) The component (D) is contained as a surface treatment agent for the component (C), and the component (D) alone is contained in the resin composition.
“Contained as component (D) as a surface treatment agent for component (C)” means that component (C) is surface-treated with component (D). In this case, the component (D) is usually on the surface of the component (C). Moreover, “(D) component alone contained in resin composition” means that (D) component is not contained as a surface treatment agent for (C) component. In addition, when (D) component does not contain as a surface treating agent of (C) component, (C) component is free in the resin composition.
(D)成分の含有量は、0.1質量%以上が好ましく、0.15質量%以上がより好ましく、0.2質量%以上がさらに好ましい。上限は特に限定されないが、5質量%以下が好ましく、3質量%以下がより好ましく、1質量%以下がさらに好ましい。 The content of the component (D) is preferably 0.1% by mass or more, more preferably 0.15% by mass or more, and further preferably 0.2% by mass or more. Although an upper limit is not specifically limited, 5 mass% or less is preferable, 3 mass% or less is more preferable, and 1 mass% or less is further more preferable.
(D)成分を(C)成分の表面処理剤として含有させる場合、表面処理剤による表面処理の程度は、無機充填材の分散性向上の観点から、(C)成分100質量部に対して、0.2質量部〜2質量部の表面処理剤で表面処理されていることが好ましく、0.2質量部〜1質量部で表面処理されていることが好ましく、0.3質量部〜0.8質量部で表面処理されていることが好ましい。 When component (D) is included as the surface treatment agent for component (C), the degree of surface treatment with the surface treatment agent is based on 100 parts by weight of component (C) from the viewpoint of improving dispersibility of the inorganic filler. Surface treatment is preferably performed with 0.2 to 2 parts by mass of a surface treatment agent, preferably 0.2 to 1 part by mass, and preferably 0.3 to 0. It is preferable that the surface treatment is performed at 8 parts by mass.
<(E)熱可塑性樹脂>
一実施形態において、本発明の樹脂組成物は、さらに(E)熱可塑性樹脂を含有し得る。
<(E) Thermoplastic resin>
In one embodiment, the resin composition of the present invention may further contain (E) a thermoplastic resin.
熱可塑性樹脂としては、例えば、フェノキシ樹脂、ポリビニルアセタール樹脂、ポリオレフィン樹脂、ポリブタジエン樹脂、ポリイミド樹脂、ポリアミドイミド樹脂、ポリエーテルイミド樹脂、ポリスルホン樹脂、ポリエーテルスルホン樹脂、ポリフェニレンエーテル樹脂、ポリカーボネート樹脂、ポリエーテルエーテルケトン樹脂、ポリエステル樹脂が挙げられ、フェノキシ樹脂が好ましい。熱可塑性樹脂は、1種単独で用いてもよく、又は2種以上を組み合わせて用いてもよい。 Examples of the thermoplastic resin include phenoxy resin, polyvinyl acetal resin, polyolefin resin, polybutadiene resin, polyimide resin, polyamideimide resin, polyetherimide resin, polysulfone resin, polyethersulfone resin, polyphenylene ether resin, polycarbonate resin, and polyether. Examples include ether ketone resins and polyester resins, and phenoxy resins are preferred. A thermoplastic resin may be used individually by 1 type, or may be used in combination of 2 or more type.
熱可塑性樹脂のポリスチレン換算の重量平均分子量は8,000〜70,000の範囲が好ましく、10,000〜60,000の範囲がより好ましく、20,000〜60,000の範囲がさらに好ましい。熱可塑性樹脂のポリスチレン換算の重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)法で測定される。具体的には、熱可塑性樹脂のポリスチレン換算の重量平均分子量は、測定装置として島津製作所社製LC−9A/RID−6Aを、カラムとして昭和電工社製Shodex K−800P/K−804L/K−804Lを、移動相としてクロロホルム等を用いて、カラム温度を40℃にて測定し、標準ポリスチレンの検量線を用いて算出することができる。 The weight average molecular weight in terms of polystyrene of the thermoplastic resin is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, and still more preferably in the range of 20,000 to 60,000. The weight average molecular weight in terms of polystyrene of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, the polystyrene-converted weight average molecular weight of the thermoplastic resin is LC-9A / RID-6A manufactured by Shimadzu Corporation as a measuring device, and Shodex K-800P / K-804L / K- manufactured by Showa Denko KK as a column. 804L can be calculated using a standard polystyrene calibration curve by measuring the column temperature at 40 ° C. using chloroform or the like as the mobile phase.
フェノキシ樹脂としては、例えば、ビスフェノールA骨格、ビスフェノールF骨格、ビスフェノールS骨格、ビスフェノールアセトフェノン骨格、ノボラック骨格、ビフェニル骨格、フルオレン骨格、ジシクロペンタジエン骨格、ノルボルネン骨格、ナフタレン骨格、アントラセン骨格、アダマンタン骨格、テルペン骨格、及びトリメチルシクロヘキサン骨格からなる群から選択される1種以上の骨格を有するフェノキシ樹脂が挙げられる。フェノキシ樹脂の末端は、フェノール性水酸基、エポキシ基等のいずれの官能基でもよい。フェノキシ樹脂は1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。フェノキシ樹脂の具体例としては、三菱化学社製の「1256」及び「4250」(いずれもビスフェノールA骨格含有フェノキシ樹脂)、「YX8100」(ビスフェノールS骨格含有フェノキシ樹脂)、及び「YX6954」(ビスフェノールアセトフェノン骨格含有フェノキシ樹脂)が挙げられ、その他にも、新日鉄住金化学社製の「FX280」及び「FX293」、三菱化学社製の「YX6954BH30」、「YX7553」、「YX7553BH30」、「YL7769BH30」、「YL6794」、「YL7213」、「YL7290」及び「YL7482」等が挙げられる。 Examples of the phenoxy resin include bisphenol A skeleton, bisphenol F skeleton, bisphenol S skeleton, bisphenolacetophenone skeleton, novolac skeleton, biphenyl skeleton, fluorene skeleton, dicyclopentadiene skeleton, norbornene skeleton, naphthalene skeleton, anthracene skeleton, adamantane skeleton, terpene Examples thereof include phenoxy resins having a skeleton and one or more skeletons selected from the group consisting of a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group. A phenoxy resin may be used individually by 1 type, and may be used in combination of 2 or more type. Specific examples of the phenoxy resin include “1256” and “4250” (both bisphenol A skeleton-containing phenoxy resin), “YX8100” (bisphenol S skeleton-containing phenoxy resin), and “YX6954” (bisphenolacetophenone) manufactured by Mitsubishi Chemical Corporation. In addition, “FX280” and “FX293” manufactured by NS ”,“ YL7213 ”,“ YL7290 ”,“ YL7482 ”, and the like.
ポリビニルアセタール樹脂としては、例えば、ポリビニルホルマール樹脂、ポリビニルブチラール樹脂が挙げられ、ポリビニルブチラール樹脂が好ましい。ポリビニルアセタール樹脂の具体例としては、例えば、電気化学工業社製の「電化ブチラール4000−2」、「電化ブチラール5000−A」、「電化ブチラール6000−C」、「電化ブチラール6000−EP」、積水化学工業社製のエスレックBHシリーズ、BXシリーズ(例えばBX−5Z)、KSシリーズ(例えばKS−1)、BLシリーズ、BMシリーズ等が挙げられる。 Examples of the polyvinyl acetal resin include a polyvinyl formal resin and a polyvinyl butyral resin, and a polyvinyl butyral resin is preferable. Specific examples of the polyvinyl acetal resin include, for example, “Electrical butyral 4000-2”, “Electrical butyral 5000-A”, “Electrical butyral 6000-C”, “Electrical butyral 6000-EP”, and Sekisui. Examples include ESREC BH series, BX series (for example, BX-5Z), KS series (for example, KS-1), BL series, and BM series manufactured by Chemical Industries.
ポリイミド樹脂の具体例としては、新日本理化社製の「リカコートSN20」及び「リカコートPN20」が挙げられる。ポリイミド樹脂の具体例としてはまた、2官能性ヒドロキシル基末端ポリブタジエン、ジイソシアネート化合物及び四塩基酸無水物を反応させて得られる線状ポリイミド(特開2006−37083号公報記載のポリイミド)、ポリシロキサン骨格含有ポリイミド(特開2002−12667号公報及び特開2000−319386号公報等に記載のポリイミド)等の変性ポリイミドが挙げられる。 Specific examples of the polyimide resin include “Rika Coat SN20” and “Rika Coat PN20” manufactured by Shin Nippon Rika Co., Ltd. Specific examples of the polyimide resin include linear polyimide obtained by reacting a bifunctional hydroxyl group-terminated polybutadiene, a diisocyanate compound and a tetrabasic acid anhydride (polyimide described in JP-A-2006-37083), a polysiloxane skeleton. Examples thereof include modified polyimides such as containing polyimide (polyimides described in JP-A Nos. 2002-12667 and 2000-319386).
ポリアミドイミド樹脂の具体例としては、東洋紡績社製の「バイロマックスHR11NN」及び「バイロマックスHR16NN」が挙げられる。ポリアミドイミド樹脂の具体例としてはまた、日立化成工業社製の「KS9100」、「KS9300」(ポリシロキサン骨格含有ポリアミドイミド)等の変性ポリアミドイミドが挙げられる。 Specific examples of the polyamideimide resin include “Vilomax HR11NN” and “Vilomax HR16NN” manufactured by Toyobo Co., Ltd. Specific examples of the polyamide-imide resin also include modified polyamide-imides such as “KS9100” and “KS9300” (polysiloxane skeleton-containing polyamideimide) manufactured by Hitachi Chemical Co., Ltd.
ポリエーテルスルホン樹脂の具体例としては、住友化学社製の「PES5003P」等が挙げられる。 Specific examples of the polyethersulfone resin include “PES5003P” manufactured by Sumitomo Chemical Co., Ltd.
ポリスルホン樹脂の具体例としては、ソルベイアドバンストポリマーズ社製のポリスルホン「P1700」、「P3500」等が挙げられる。 Specific examples of the polysulfone resin include polysulfone “P1700” and “P3500” manufactured by Solvay Advanced Polymers.
中でも、熱可塑性樹脂としては、フェノキシ樹脂、ポリビニルアセタール樹脂が好ましい。したがって好適な一実施形態において、熱可塑性樹脂は、フェノキシ樹脂及びポリビニルアセタール樹脂からなる群から選択される1種以上を含む。 Of these, phenoxy resin and polyvinyl acetal resin are preferable as the thermoplastic resin. Accordingly, in a preferred embodiment, the thermoplastic resin includes one or more selected from the group consisting of a phenoxy resin and a polyvinyl acetal resin.
樹脂組成物が熱可塑性樹脂を含有する場合、熱可塑性樹脂の含有量は、好ましくは0.1質量%〜10質量%、より好ましくは0.2質量%〜5質量%、さらに好ましくは0.3質量%〜1質量%である。 When the resin composition contains a thermoplastic resin, the content of the thermoplastic resin is preferably 0.1% by mass to 10% by mass, more preferably 0.2% by mass to 5% by mass, and still more preferably 0.8%. 3% by mass to 1% by mass.
<(F)硬化促進剤>
一実施形態において、本発明の樹脂組成物は、さらに(F)硬化促進剤を含有し得る。
<(F) Curing accelerator>
In one embodiment, the resin composition of the present invention may further contain (F) a curing accelerator.
硬化促進剤としては、例えば、リン系硬化促進剤、アミン系硬化促進剤、イミダゾール系硬化促進剤、グアニジン系硬化促進剤、金属系硬化促進剤等が挙げられ、リン系硬化促進剤、アミン系硬化促進剤、イミダゾール系硬化促進剤、金属系硬化促進剤が好ましく、アミン系硬化促進剤、イミダゾール系硬化促進剤、金属系硬化促進剤がより好ましい。硬化促進剤は、1種単独で用いてもよく、2種以上を組み合わせて用いてもよい。 Examples of the curing accelerator include a phosphorus-based curing accelerator, an amine-based curing accelerator, an imidazole-based curing accelerator, a guanidine-based curing accelerator, a metal-based curing accelerator, and the like. A curing accelerator, an imidazole curing accelerator, and a metal curing accelerator are preferable, and an amine curing accelerator, an imidazole curing accelerator, and a metal curing accelerator are more preferable. A hardening accelerator may be used individually by 1 type, and may be used in combination of 2 or more type.
リン系硬化促進剤としては、例えば、トリフェニルホスフィン、ホスホニウムボレート化合物、テトラフェニルホスホニウムテトラフェニルボレート、n−ブチルホスホニウムテトラフェニルボレート、テトラブチルホスホニウムデカン酸塩、(4−メチルフェニル)トリフェニルホスホニウムチオシアネート、テトラフェニルホスホニウムチオシアネート、ブチルトリフェニルホスホニウムチオシアネート等が挙げられ、トリフェニルホスフィン、テトラブチルホスホニウムデカン酸塩が好ましい。 Examples of phosphorus curing accelerators include triphenylphosphine, phosphonium borate compounds, tetraphenylphosphonium tetraphenylborate, n-butylphosphonium tetraphenylborate, tetrabutylphosphonium decanoate, (4-methylphenyl) triphenylphosphonium thiocyanate. , Tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate and the like, and triphenylphosphine and tetrabutylphosphonium decanoate are preferable.
アミン系硬化促進剤としては、例えば、トリエチルアミン、トリブチルアミン等のトリアルキルアミン、4−ジメチルアミノピリジン、ベンジルジメチルアミン、2,4,6,−トリス(ジメチルアミノメチル)フェノール、1,8−ジアザビシクロ(5,4,0)−ウンデセン等が挙げられ、4−ジメチルアミノピリジン、1,8−ジアザビシクロ(5,4,0)−ウンデセンが好ましい。 Examples of amine curing accelerators include trialkylamines such as triethylamine and tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, 2,4,6, -tris (dimethylaminomethyl) phenol, 1,8-diazabicyclo. (5,4,0) -undecene and the like are mentioned, and 4-dimethylaminopyridine and 1,8-diazabicyclo (5,4,0) -undecene are preferable.
イミダゾール系硬化促進剤としては、例えば、2−メチルイミダゾール、2−ウンデシルイミダゾール、2−ヘプタデシルイミダゾール、1,2−ジメチルイミダゾール、2−エチル−4−メチルイミダゾール、1,2−ジメチルイミダゾール、2−エチル−4−メチルイミダゾール、2−フェニルイミダゾール、2−フェニル−4−メチルイミダゾール、1−ベンジル−2−メチルイミダゾール、1−ベンジル−2−フェニルイミダゾール、1−シアノエチル−2−メチルイミダゾール、1−シアノエチル−2−ウンデシルイミダゾール、1−シアノエチル−2−エチル−4−メチルイミダゾール、1−シアノエチル−2−フェニルイミダゾール、1−シアノエチル−2−ウンデシルイミダゾリウムトリメリテイト、1−シアノエチル−2−フェニルイミダゾリウムトリメリテイト、2,4−ジアミノ−6−[2’−メチルイミダゾリル−(1’)]−エチル−s−トリアジン、2,4−ジアミノ−6−[2’−ウンデシルイミダゾリル−(1’)]−エチル−s−トリアジン、2,4−ジアミノ−6−[2’−エチル−4’−メチルイミダゾリル−(1’)]−エチル−s−トリアジン、2,4−ジアミノ−6−[2’−メチルイミダゾリル−(1’)]−エチル−s−トリアジンイソシアヌル酸付加物、2−フェニルイミダゾールイソシアヌル酸付加物、2−フェニル−4,5−ジヒドロキシメチルイミダゾール、2−フェニル−4−メチル−5−ヒドロキシメチルイミダゾール、2,3−ジヒドロ−1H−ピロロ[1,2−a]ベンズイミダゾール、1−ドデシル−2−メチル−3−ベンジルイミダゾリウムクロライド、2−メチルイミダゾリン、2−フェニルイミダゾリン等のイミダゾール化合物及びイミダゾール化合物とエポキシ樹脂とのアダクト体が挙げられ、2−エチル−4−メチルイミダゾール、1−ベンジル−2−フェニルイミダゾールが好ましい。 Examples of the imidazole curing accelerator include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl- 2 Phenylimidazolium trimellitate, 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-undecylimidazolyl- (1 ′)]-ethyl-s-triazine, 2,4-diamino-6- [2′-ethyl-4′-methylimidazolyl- (1 ′)]-ethyl-s-triazine, 2,4-diamino- 6- [2′-Methylimidazolyl- (1 ′)]-ethyl-s-triazine isocyanuric acid adduct, 2-phenylimidazole isocyanuric acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl- 4-methyl-5-hydroxymethylimidazole, 2,3-dihydro-1H-pyrrolo [1,2-a] benzimidazole, 1-dodecyl-2-methyl Examples include imidazole compounds such as -3-benzylimidazolium chloride, 2-methylimidazoline, and 2-phenylimidazoline, and adducts of imidazole compounds and epoxy resins, such as 2-ethyl-4-methylimidazole and 1-benzyl-2- Phenylimidazole is preferred.
イミダゾール系硬化促進剤としては、市販品を用いてもよく、例えば、三菱化学社製の「P200−H50」等が挙げられる。 Commercially available products may be used as the imidazole curing accelerator, and examples thereof include “P200-H50” manufactured by Mitsubishi Chemical Corporation.
グアニジン系硬化促進剤としては、例えば、ジシアンジアミド、1−メチルグアニジン、1−エチルグアニジン、1−シクロヘキシルグアニジン、1−フェニルグアニジン、1−(o−トリル)グアニジン、ジメチルグアニジン、ジフェニルグアニジン、トリメチルグアニジン、テトラメチルグアニジン、ペンタメチルグアニジン、1,5,7−トリアザビシクロ[4.4.0]デカ−5−エン、7−メチル−1,5,7−トリアザビシクロ[4.4.0]デカ−5−エン、1−メチルビグアニド、1−エチルビグアニド、1−n−ブチルビグアニド、1−n−オクタデシルビグアニド、1,1−ジメチルビグアニド、1,1−ジエチルビグアニド、1−シクロヘキシルビグアニド、1−アリルビグアニド、1−フェニルビグアニド、1−(o−トリル)ビグアニド等が挙げられ、ジシアンジアミド、1,5,7−トリアザビシクロ[4.4.0]デカ−5−エンが好ましい。 Examples of the guanidine curing accelerator include dicyandiamide, 1-methylguanidine, 1-ethylguanidine, 1-cyclohexylguanidine, 1-phenylguanidine, 1- (o-tolyl) guanidine, dimethylguanidine, diphenylguanidine, trimethylguanidine, Tetramethylguanidine, pentamethylguanidine, 1,5,7-triazabicyclo [4.4.0] dec-5-ene, 7-methyl-1,5,7-triazabicyclo [4.4.0] Deca-5-ene, 1-methyl biguanide, 1-ethyl biguanide, 1-n-butyl biguanide, 1-n-octadecyl biguanide, 1,1-dimethyl biguanide, 1,1-diethyl biguanide, 1-cyclohexyl biguanide, 1 -Allyl biguanide, 1-phenyl biguanide, 1- ( - tolyl) biguanide, and the like, dicyandiamide, 1,5,7-triazabicyclo [4.4.0] dec-5-ene are preferred.
金属系硬化促進剤としては、例えば、コバルト、銅、亜鉛、鉄、ニッケル、マンガン、スズ等の金属の、有機金属錯体又は有機金属塩が挙げられる。有機金属錯体の具体例としては、コバルト(II)アセチルアセトナート、コバルト(III)アセチルアセトナート等の有機コバルト錯体、銅(II)アセチルアセトナート等の有機銅錯体、亜鉛(II)アセチルアセトナート等の有機亜鉛錯体、鉄(III)アセチルアセトナート等の有機鉄錯体、ニッケル(II)アセチルアセトナート等の有機ニッケル錯体、マンガン(II)アセチルアセトナート等の有機マンガン錯体等が挙げられる。有機金属塩としては、例えば、オクチル酸亜鉛、オクチル酸錫、ナフテン酸亜鉛、ナフテン酸コバルト、ステアリン酸スズ、ステアリン酸亜鉛等が挙げられる。 As a metal type hardening accelerator, the organometallic complex or organometallic salt of metals, such as cobalt, copper, zinc, iron, nickel, manganese, tin, is mentioned, for example. Specific examples of the organometallic complex include organic cobalt complexes such as cobalt (II) acetylacetonate and cobalt (III) acetylacetonate, organic copper complexes such as copper (II) acetylacetonate, and zinc (II) acetylacetonate. Organic zinc complexes such as iron (III) acetylacetonate, organic nickel complexes such as nickel (II) acetylacetonate, and organic manganese complexes such as manganese (II) acetylacetonate. Examples of the organic metal salt include zinc octylate, tin octylate, zinc naphthenate, cobalt naphthenate, tin stearate, and zinc stearate.
樹脂組成物中の硬化促進剤の含有量は特に限定されないが、エポキシ樹脂と硬化剤の不揮発成分を100質量%としたとき、0.01質量%〜3質量%が好ましい。 Although content of the hardening accelerator in a resin composition is not specifically limited, 0.01 mass%-3 mass% are preferable when the non-volatile component of an epoxy resin and a hardening | curing agent is 100 mass%.
<(G)難燃剤>
一実施形態において、本発明の樹脂組成物は、(G)難燃剤を含有し得る。難燃剤としては、例えば、有機リン系難燃剤、有機系窒素含有リン化合物、窒素化合物、シリコーン系難燃剤、金属水酸化物等が挙げられる。難燃剤は1種単独で用いてもよく、又は2種以上を併用してもよい。
<(G) Flame retardant>
In one embodiment, the resin composition of the present invention may contain (G) a flame retardant. Examples of the flame retardant include an organic phosphorus flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, a silicone flame retardant, and a metal hydroxide. A flame retardant may be used individually by 1 type, or may use 2 or more types together.
難燃剤としては、市販品を用いてもよく、例えば、三光社製の「HCA−HQ」、大八化学工業社製の「PX−200」等が挙げられる。難燃剤としては加水分解しにくいものが好ましく、例えば、10−(2,5−ジヒドロキシフェニル)−10−ヒドロ−9−オキサ−10−フォスファフェナンスレン−10−オキサイド等が好ましい。 Commercially available products may be used as the flame retardant, such as “HCA-HQ” manufactured by Sanko Co., Ltd., “PX-200” manufactured by Daihachi Chemical Industry Co., Ltd., and the like. As the flame retardant, those which are difficult to hydrolyze are preferable, and for example, 10- (2,5-dihydroxyphenyl) -10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide and the like are preferable.
樹脂組成物が難燃剤を含有する場合、難燃剤の含有量は特に限定されないが、好ましくは0.5質量%〜20質量%、より好ましくは0.5質量%〜15質量%、さらに好ましくは0.5質量%〜10質量%がさらに好ましい。 When the resin composition contains a flame retardant, the content of the flame retardant is not particularly limited, but is preferably 0.5% by mass to 20% by mass, more preferably 0.5% by mass to 15% by mass, and still more preferably. 0.5 mass%-10 mass% are further more preferable.
<(H)有機充填材>
一実施形態において、本発明の樹脂組成物は、(H)有機充填材を含有し得る。(H)成分を含有させることで、樹脂シートの樹脂組成物層の硬化物の引張破壊強度を向上させることができる。有機充填材としては、プリント配線板の絶縁層を形成するに際し使用し得る任意の有機充填材を使用してよく、例えば、ゴム粒子、ポリアミド微粒子、シリコーン粒子等が挙げられる。
<(H) Organic filler>
In one embodiment, the resin composition of the present invention may contain (H) an organic filler. By including the component (H), the tensile fracture strength of the cured product of the resin composition layer of the resin sheet can be improved. As the organic filler, any organic filler that can be used in forming the insulating layer of the printed wiring board may be used, and examples thereof include rubber particles, polyamide fine particles, and silicone particles.
ゴム粒子としては、市販品を用いてもよく、例えば、ダウ・ケミカル日本社製の「EXL2655」、アイカ工業社製の「AC3401N」、「AC3816N」等が挙げられる。 As the rubber particles, commercially available products may be used, and examples thereof include “EXL2655” manufactured by Dow Chemical Japan, “AC3401N” and “AC3816N” manufactured by Aika Industry.
ゴム粒子としては、イオン性が低く、樹脂組成物層の硬化物の抽出水導電率を低下させることができるという観点から、例えば、アイカ工業社製の「AC3816N」、「AC3401N」等が好ましい。 As the rubber particles, for example, “AC3816N” and “AC3401N” manufactured by Aika Kogyo Co., Ltd. are preferable from the viewpoint that the ionicity is low and the extraction water conductivity of the cured product of the resin composition layer can be lowered.
樹脂組成物が有機充填材を含有する場合、有機充填材の含有量は、好ましくは0.1質量%〜20質量%、より好ましくは0.2質量%〜10質量%、さらに好ましくは0.3質量%〜5質量%、又は0.5質量%〜3質量%である。 When the resin composition contains an organic filler, the content of the organic filler is preferably 0.1% by mass to 20% by mass, more preferably 0.2% by mass to 10% by mass, and still more preferably 0.8%. 3% by mass to 5% by mass, or 0.5% by mass to 3% by mass.
<(I)任意の添加剤>
一実施形態において、本発明の樹脂組成物は、さらに必要に応じて、他の添加剤を含んでいてもよく、斯かる他の添加剤としては、例えば、有機銅化合物、有機亜鉛化合物及び有機コバルト化合物等の有機金属化合物、並びに増粘剤、消泡剤、レベリング剤、密着性付与剤、及び着色剤等の樹脂添加剤等が挙げられる。
<(I) Optional additive>
In one embodiment, the resin composition of the present invention may further contain other additives as necessary. Examples of such other additives include organic copper compounds, organic zinc compounds, and organic compounds. Examples include organometallic compounds such as cobalt compounds, and resin additives such as thickeners, antifoaming agents, leveling agents, adhesion-imparting agents, and coloring agents.
<樹脂組成物の物性>
本発明の樹脂組成物を100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時に、該硬化物表面を粗化処理する前の硬化物表面の水に対する接触角をX(°)とし、該硬化物表面を粗化処理した後の硬化物表面の水に対する接触角をY(°)としたとき、X−Y≦0°であり、好ましくはX−Y≦−3°、より好ましくはX−Y≦−5°である。X−Yの下限は特に限定されないが、好ましくは−50°以上、より好ましくは−40°以上、さらに好ましくは−30°以上である。X−Y≦0°とすることで、薄膜絶縁性が良好になる。X−Yは、後述する<接触角の測定>に記載の方法に従って測定することができる。
<Physical properties of resin composition>
When the cured product is obtained by thermosetting the resin composition of the present invention at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes, the contact angle of water on the surface of the cured product before roughening the surface of the cured product is determined. X (°), where Y (°) is the contact angle of the cured product surface with water after roughening the surface of the cured product, XY ≦ 0 °, preferably XY ≦ −. 3 °, more preferably XY ≦ −5 °. Although the lower limit of XY is not specifically limited, Preferably it is -50 degrees or more, More preferably, it is -40 degrees or more, More preferably, it is -30 degrees or more. By setting X−Y ≦ 0 °, the thin-film insulation is improved. XY can be measured according to the method described in <Measurement of Contact Angle> described later.
本発明の樹脂組成物を、100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時に、該硬化物表面を粗化処理した後の硬化物表面の水に対する接触角Yは、Y≧80°であり、好ましくはY≧83°、より好ましくはY≧85°である。接触角Yの上限は特に限定されないが、好ましくは180°以下、より好ましくは150°以下、さらに好ましくは120°以下である。Y≧80°とすることで、薄膜絶縁性が良好になる。接触角Yは、後述する<接触角の測定>に記載の方法に従って測定することができる。 When the cured composition is obtained by thermally curing the resin composition of the present invention at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes, the contact angle of water on the surface of the cured product after roughening the surface of the cured product Y is Y ≧ 80 °, preferably Y ≧ 83 °, and more preferably Y ≧ 85 °. The upper limit of the contact angle Y is not particularly limited, but is preferably 180 ° or less, more preferably 150 ° or less, and further preferably 120 ° or less. By setting Y ≧ 80 °, the thin film insulation is improved. The contact angle Y can be measured according to the method described in <Measurement of Contact Angle> described later.
本発明の樹脂組成物を、100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時に、該硬化物表面を粗化処理する前の硬化物表面の水に対する接触角Xは、好ましくはX<80°、より好ましくはX≦79°である。接触角Xの下限は特に限定されないが、好ましくは30°以上、より好ましくは40°以上、さらに好ましくは50°以上である。X<80°とすることで、薄膜絶縁性が良好になる。接触角Xは、後述する<接触角の測定>に記載の方法に従って測定することができる。 When the cured composition is obtained by thermally curing the resin composition of the present invention at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes, the contact angle of water on the surface of the cured product before roughening the surface of the cured product X is preferably X <80 °, more preferably X ≦ 79 °. The lower limit of the contact angle X is not particularly limited, but is preferably 30 ° or more, more preferably 40 ° or more, and further preferably 50 ° or more. By setting X <80 °, the thin-film insulation is improved. The contact angle X can be measured according to the method described in <Measurement of Contact Angle> described later.
接触角を測定する際の粗化処理の手順は、後述する<接触角の測定>に記載の方法に従って行うことができる。詳細は、所定の膨潤液に60℃で5分間、次いで所定の酸化剤溶液に80℃で10分間、最後に中和液に40℃で5分間浸漬した後80℃で15分間乾燥させる。 The roughening treatment procedure when measuring the contact angle can be performed according to the method described in <Measurement of Contact Angle> described later. In detail, it is immersed in a predetermined swelling solution at 60 ° C. for 5 minutes, then in a predetermined oxidant solution at 80 ° C. for 10 minutes, finally immersed in a neutralizing solution at 40 ° C. for 5 minutes, and then dried at 80 ° C. for 15 minutes.
[樹脂シート]
本発明の樹脂シートは、支持体と、該支持体上に設けられた樹脂組成物層とを含み、樹脂組成物層は本発明の樹脂組成物から形成される。
[Resin sheet]
The resin sheet of the present invention includes a support and a resin composition layer provided on the support, and the resin composition layer is formed from the resin composition of the present invention.
樹脂組成物層の厚さは、プリント配線板の薄型化の観点から、好ましくは15μm以下、より好ましくは12μm以下、さらに好ましくは10μm以下、さらにより好ましくは8μm以下である。樹脂組成物層の厚さの下限は、特に限定されないが、通常、1μm以上、1.5μm以上、2μm以上等とし得る。 The thickness of the resin composition layer is preferably 15 μm or less, more preferably 12 μm or less, still more preferably 10 μm or less, and even more preferably 8 μm or less, from the viewpoint of reducing the thickness of the printed wiring board. Although the minimum of the thickness of a resin composition layer is not specifically limited, Usually, it may be 1 micrometer or more, 1.5 micrometers or more, 2 micrometers or more, etc.
支持体としては、例えば、プラスチック材料からなるフィルム、金属箔、離型紙が挙げられ、プラスチック材料からなるフィルム、金属箔が好ましい。 Examples of the support include a film made of a plastic material, a metal foil, and a release paper, and a film made of a plastic material and a metal foil are preferable.
支持体としてプラスチック材料からなるフィルムを使用する場合、プラスチック材料としては、例えば、ポリエチレンテレフタレート(以下「PET」と略称することがある。)、ポリエチレンナフタレート(以下「PEN」と略称することがある。)等のポリエステル、ポリカーボネート(以下「PC」と略称することがある。)、ポリメチルメタクリレート(PMMA)等のアクリル、環状ポリオレフィン、トリアセチルセルロース(TAC)、ポリエーテルサルファイド(PES)、ポリエーテルケトン、ポリイミド等が挙げられる。中でも、ポリエチレンテレフタレート、ポリエチレンナフタレートが好ましく、安価なポリエチレンテレフタレートが特に好ましい。 When a film made of a plastic material is used as the support, examples of the plastic material include polyethylene terephthalate (hereinafter sometimes abbreviated as “PET”) and polyethylene naphthalate (hereinafter abbreviated as “PEN”). .) Polyester, polycarbonate (hereinafter sometimes abbreviated as “PC”), polymethyl methacrylate (PMMA) and other acrylics, cyclic polyolefin, triacetyl cellulose (TAC), polyether sulfide (PES), polyether Examples include ketones and polyimides. Among these, polyethylene terephthalate and polyethylene naphthalate are preferable, and inexpensive polyethylene terephthalate is particularly preferable.
支持体として金属箔を使用する場合、金属箔としては、例えば、銅箔、アルミニウム箔等が挙げられ、銅箔が好ましい。銅箔としては、銅の単金属からなる箔を用いてもよく、銅と他の金属(例えば、スズ、クロム、銀、マグネシウム、ニッケル、ジルコニウム、ケイ素、チタン等)との合金からなる箔を用いてもよい。 When using metal foil as a support body, as metal foil, copper foil, aluminum foil, etc. are mentioned, for example, Copper foil is preferable. As the copper foil, a foil made of a single metal of copper may be used, and a foil made of an alloy of copper and another metal (for example, tin, chromium, silver, magnesium, nickel, zirconium, silicon, titanium, etc.). It may be used.
支持体は、樹脂組成物層と接合する面にマット処理、コロナ処理、帯電防止処理を施してあってもよい。 The support may be subjected to mat treatment, corona treatment, and antistatic treatment on the surface to be bonded to the resin composition layer.
また、支持体としては、樹脂組成物層と接合する面に離型層を有する離型層付き支持体を使用してもよい。離型層付き支持体の離型層に使用する離型剤としては、例えば、アルキド樹脂、ポリオレフィン樹脂、ウレタン樹脂、及びシリコーン樹脂からなる群から選択される1種以上の離型剤が挙げられる。離型層付き支持体は、市販品を用いてもよく、例えば、アルキド樹脂系離型剤を主成分とする離型層を有するPETフィルムである、リンテック社製の「SK−1」、「AL−5」、「AL−7」、東レ社製「ルミラーT60」帝人社製の「ピューレックス」、ユニチカ社製の「ユニピール」等が挙げられる。 Moreover, as a support body, you may use the support body with a release layer which has a release layer in the surface joined to a resin composition layer. Examples of the release agent used for the release layer of the support with a release layer include one or more release agents selected from the group consisting of alkyd resins, polyolefin resins, urethane resins, and silicone resins. . As the support with a release layer, a commercially available product may be used. For example, “SK-1”, “SK-1” manufactured by Lintec Corporation, which is a PET film having a release layer mainly composed of an alkyd resin release agent. “AL-5”, “AL-7”, “Lumirror T60” manufactured by Toray Industries, Inc., “Purex” manufactured by Teijin Limited, “Unipeel” manufactured by Unitika, and the like.
支持体の厚みとしては、特に限定されないが、5μm〜75μmの範囲が好ましく、10μm〜60μmの範囲がより好ましい。なお、離型層付き支持体を使用する場合、離型層付き支持体全体の厚さが上記範囲であることが好ましい。 Although it does not specifically limit as thickness of a support body, The range of 5 micrometers-75 micrometers is preferable, and the range of 10 micrometers-60 micrometers is more preferable. In addition, when using a support body with a release layer, it is preferable that the thickness of the whole support body with a release layer is the said range.
樹脂シートは、例えば、有機溶剤に樹脂組成物を溶解した樹脂ワニスを調製し、この樹脂ワニスを、ダイコーター等を用いて支持体上に塗布し、更に乾燥させて樹脂組成物層を形成させることにより製造することができる。 The resin sheet is prepared by, for example, preparing a resin varnish in which a resin composition is dissolved in an organic solvent, applying the resin varnish on a support using a die coater or the like, and further drying to form a resin composition layer. Can be manufactured.
有機溶剤としては、例えば、アセトン、メチルエチルケトン(MEK)及びシクロヘキサノン等のケトン類、酢酸エチル、酢酸ブチル、セロソルブアセテート、プロピレングリコールモノメチルエーテルアセテート及びカルビトールアセテート等の酢酸エステル類、セロソルブ及びブチルカルビトール等のカルビトール類、トルエン及びキシレン等の芳香族炭化水素類、ジメチルホルムアミド、ジメチルアセトアミド(DMAc)及びN−メチルピロリドン等のアミド系溶剤等を挙げることができる。有機溶剤は1種単独で使用してもよく、2種以上を組み合わせて使用してもよい。 Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone (MEK) and cyclohexanone, acetates such as ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate and carbitol acetate, cellosolve and butyl carbitol, etc. Carbitols, aromatic hydrocarbons such as toluene and xylene, amide solvents such as dimethylformamide, dimethylacetamide (DMAc), and N-methylpyrrolidone. An organic solvent may be used individually by 1 type, and may be used in combination of 2 or more type.
乾燥は、加熱、熱風吹きつけ等の公知の方法により実施してよい。乾燥条件は特に限定されないが、樹脂組成物層中の有機溶剤の含有量が10質量%以下、好ましくは5質量%以下となるように乾燥させる。樹脂ワニス中の有機溶剤の沸点によっても異なるが、例えば30質量%〜60質量%の有機溶剤を含む樹脂ワニスを用いる場合、50℃〜150℃で3分間〜10分間乾燥させることにより、樹脂組成物層を形成することができる。 Drying may be performed by a known method such as heating or hot air blowing. The drying conditions are not particularly limited, but the drying is performed so that the content of the organic solvent in the resin composition layer is 10% by mass or less, preferably 5% by mass or less. Depending on the boiling point of the organic solvent in the resin varnish, for example, when using a resin varnish containing 30% by mass to 60% by mass of the organic solvent, the resin composition is dried at 50 ° C. to 150 ° C. for 3 minutes to 10 minutes. A physical layer can be formed.
樹脂シートにおいて、樹脂組成物層の支持体と接合していない面(即ち、支持体とは反対側の面)には、支持体に準じた保護フィルムをさらに積層することができる。保護フィルムの厚さは、特に限定されるものではないが、例えば、1μm〜40μmである。保護フィルムを積層することにより、樹脂組成物層の表面へのゴミ等の付着やキズを防止することができる。樹脂シートは、ロール状に巻きとって保存することが可能である。樹脂シートが保護フィルムを有する場合、保護フィルムを剥がすことによって使用可能となる。 In the resin sheet, a protective film according to the support can be further laminated on the surface of the resin composition layer that is not bonded to the support (that is, the surface opposite to the support). Although the thickness of a protective film is not specifically limited, For example, they are 1 micrometer-40 micrometers. By laminating the protective film, it is possible to prevent dust and the like from being attached to the surface of the resin composition layer and scratches. The resin sheet can be stored in a roll. When the resin sheet has a protective film, it can be used by peeling off the protective film.
本発明の樹脂シートは、薄膜絶縁性に優れた絶縁層(樹脂組成物層の硬化物)をもたらす。したがって本発明の樹脂シートは、プリント配線板の絶縁層を形成するための(プリント配線板の絶縁層形成用の)樹脂シートとして好適に使用することができ、プリント配線板の層間絶縁層を形成するための樹脂シート(プリント配線板の層間絶縁層用樹脂シート)としてより好適に使用することができる。また、例えば、第1の導体層と、第2の導体層と、第1の導体層及び第2の導体層との間に設けられた絶縁層とを備えるプリント配線板において、本発明の樹脂シートにより絶縁層を形成することで、第1及び第2の導体層間の絶縁層の厚みを6μm以下(好ましくは5.5μm以下、より好ましくは5μm以下)としつつ絶縁性能に優れたものとすることができる。 The resin sheet of this invention brings about the insulating layer (cured material of the resin composition layer) excellent in thin film insulation. Therefore, the resin sheet of the present invention can be suitably used as a resin sheet (for forming an insulating layer of a printed wiring board) for forming an insulating layer of a printed wiring board, and forms an interlayer insulating layer of the printed wiring board. Therefore, it can be used more suitably as a resin sheet (resin sheet for an interlayer insulating layer of a printed wiring board). Further, for example, in a printed wiring board including a first conductor layer, a second conductor layer, and an insulating layer provided between the first conductor layer and the second conductor layer, the resin of the present invention. By forming the insulating layer with a sheet, the insulating layer between the first and second conductor layers has a thickness of 6 μm or less (preferably 5.5 μm or less, more preferably 5 μm or less), and excellent insulation performance. be able to.
本発明の樹脂シート(又は樹脂組成物)を使用して形成された絶縁層は、良好なめっき密着性を示す。即ち良好なめっきピール強度を示す絶縁層をもたらす。めっきピール強度は、好ましくは1.5kgf/cm以下、より好ましくは1kgf/cm以下、さらに好ましくは0.8kgf/cm以下である。上限は、0.1kgf/cm以上等とし得る。めっきピール強度の評価は、後述する(めっき密着性(めっきピール強度)の測定)に記載の方法に従って測定することができる。 The insulating layer formed using the resin sheet (or resin composition) of the present invention exhibits good plating adhesion. That is, an insulating layer exhibiting good plating peel strength is provided. The plating peel strength is preferably 1.5 kgf / cm or less, more preferably 1 kgf / cm or less, and still more preferably 0.8 kgf / cm or less. The upper limit may be 0.1 kgf / cm or more. The evaluation of the plating peel strength can be measured according to the method described later (Measurement of plating adhesion (plating peel strength)).
本発明の樹脂シート(又は樹脂組成物)を使用して形成された絶縁層は、130℃、85RH%、3.3V印加環境下で200時間経過後の絶縁抵抗値は良好な結果を示す。即ち良好な絶縁抵抗値を示す絶縁層をもたらす。該絶縁抵抗値の上限は、好ましくは1012Ω以下、より好ましくは1011Ω以下、さらに好ましくは1010Ω以下である。下限については特に限定されないが、好ましくは107Ω以上、より好ましくは108Ω以上である。絶縁抵抗値の測定は、後述する<絶縁層の絶縁信頼性の評価>に記載の方法に従って測定することができる。 The insulating layer formed using the resin sheet (or resin composition) of the present invention shows a good result of the insulation resistance value after elapse of 200 hours under a 130 ° C., 85 RH%, 3.3 V applied environment. That is, an insulating layer exhibiting a good insulation resistance value is provided. The upper limit of the insulation resistance value is preferably 10 12 Ω or less, more preferably 10 11 Ω or less, and further preferably 10 10 Ω or less. The lower limit is not particularly limited, but is preferably 10 7 Ω or more, more preferably 10 8 Ω or more. The insulation resistance value can be measured according to the method described in <Evaluation of insulation reliability of insulating layer> described later.
[プリント配線板、プリント配線板の製造方法]
本発明のプリント配線板は、本発明の樹脂組成物の硬化物により形成された絶縁層、第1の導体層、及び第2の導体層を含む。絶縁層は、第1の導体層と第2の導体層との間に設けられていて、第1の導体層と第2の導体層とを絶縁している(導体層は配線層ともいう)。本発明の樹脂組成物の硬化物により形成された絶縁層は薄膜絶縁性に優れることから、第1及び第2の導体層間の絶縁層の厚みが6μm以下であっても絶縁性に優れる。
[Printed wiring board, printed wiring board manufacturing method]
The printed wiring board of the present invention includes an insulating layer, a first conductor layer, and a second conductor layer formed of a cured product of the resin composition of the present invention. The insulating layer is provided between the first conductor layer and the second conductor layer, and insulates the first conductor layer and the second conductor layer (the conductor layer is also referred to as a wiring layer). . Since the insulating layer formed of the cured product of the resin composition of the present invention is excellent in thin film insulating properties, it is excellent in insulating properties even if the thickness of the insulating layer between the first and second conductor layers is 6 μm or less.
第1及び第2の導体層間の絶縁層の厚みは、好ましくは6μm以下、より好ましくは5.5μm以下、さらに好ましくは5μm以下である。下限については特に限定されないが0.1μm以上とし得る。第1及び第2の導体層間の絶縁層の厚みとは、図1に一例を示したように、第1の導体層5の主面51と第2の導体層6の主面61間の絶縁層7の厚みt1のことをいう。第1及び第2の導体層は絶縁層を介して隣り合う導体層であり、主面51及び主面61は互いに向き合っている。第1及び第2の導体層間の絶縁層の厚みは、後述する<導体層間の絶縁層の厚みの測定>に記載の方法に従って測定することができる。
The thickness of the insulating layer between the first and second conductor layers is preferably 6 μm or less, more preferably 5.5 μm or less, and even more preferably 5 μm or less. The lower limit is not particularly limited, but may be 0.1 μm or more. The thickness of the insulating layer between the first and second conductor layers is the insulation between the
なお、絶縁層全体の厚みt2は、好ましくは20μm以下、より好ましくは15μm以下、さらに好ましくは12μm以下である。下限については特に限定されないが1μm以上とし得る。 The total thickness t2 of the insulating layer is preferably 20 μm or less, more preferably 15 μm or less, and even more preferably 12 μm or less. The lower limit is not particularly limited, but may be 1 μm or more.
本発明のプリント配線板は、上述の樹脂シートを用いて、下記(I)及び(II)の工程を含む方法により製造することができる。
(I)内層基板上に、樹脂シートの樹脂組成物層が内層基板と接合するように積層する工程
(II)樹脂組成物層を熱硬化して絶縁層を形成する工程
The printed wiring board of this invention can be manufactured by the method including the process of following (I) and (II) using the above-mentioned resin sheet.
(I) The process of laminating | stacking so that the resin composition layer of a resin sheet may join to an inner layer board | substrate on an inner layer board | substrate (II) The process of thermosetting a resin composition layer and forming an insulating layer
工程(I)で用いる「内層基板」とは、主として、ガラスエポキシ基板、金属基板、ポリエステル基板、ポリイミド基板、BTレジン基板、熱硬化型ポリフェニレンエーテル基板等の基板、又は該基板の片面又は両面にパターン加工された導体層(回路)が形成された回路基板をいう。またプリント配線板を製造する際に、さらに絶縁層及び/又は導体層が形成されるべき中間製造物の内層回路基板も本発明でいう「内層基板」に含まれる。プリント配線板が部品内蔵回路板である場合、部品を内蔵した内層基板を使用し得る。 The “inner layer substrate” used in step (I) is mainly a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, a thermosetting polyphenylene ether substrate, or one or both surfaces of the substrate. A circuit board on which a patterned conductor layer (circuit) is formed. Further, when the printed wiring board is manufactured, an inner layer circuit board of an intermediate product in which an insulating layer and / or a conductor layer is further formed is also included in the “inner layer board” in the present invention. When the printed wiring board is a circuit board with a built-in component, an inner layer board with a built-in component can be used.
内層基板と樹脂シートの積層は、例えば、支持体側から樹脂シートを内層基板に加熱圧着することにより行うことができる。樹脂シートを内層基板に加熱圧着する部材(以下、「加熱圧着部材」ともいう。)としては、例えば、加熱された金属板(SUS鏡板等)又は金属ロール(SUSロール)等が挙げられる。なお、加熱圧着部材を樹脂シートに直接プレスするのではなく、内層基板の表面凹凸に樹脂シートが十分に追随するよう、耐熱ゴム等の弾性材を介してプレスするのが好ましい。 Lamination | stacking of an inner layer board | substrate and a resin sheet can be performed by heat-pressing a resin sheet to an inner layer board | substrate from the support body side, for example. Examples of the member that heat-presses the resin sheet to the inner layer substrate (hereinafter, also referred to as “heat-pressing member”) include a heated metal plate (SUS end plate) or a metal roll (SUS roll). It is preferable that the thermocompression-bonding member is not pressed directly on the resin sheet, but is pressed through an elastic material such as heat-resistant rubber so that the resin sheet sufficiently follows the surface irregularities of the inner layer substrate.
内層基板と樹脂シートの積層は、真空ラミネート法により実施してよい。真空ラミネート法において、加熱圧着温度は、好ましくは60℃〜160℃、より好ましくは80℃〜140℃の範囲であり、加熱圧着圧力は、好ましくは0.098MPa〜1.77MPa、より好ましくは0.29MPa〜1.47MPaの範囲であり、加熱圧着時間は、好ましくは20秒間〜400秒間、より好ましくは30秒間〜300秒間の範囲である。積層は、好ましくは圧力26.7hPa以下の減圧条件下で実施する。 Lamination of the inner layer substrate and the resin sheet may be performed by a vacuum laminating method. In the vacuum laminating method, the thermocompression bonding temperature is preferably in the range of 60 ° C to 160 ° C, more preferably 80 ° C to 140 ° C, and the thermocompression bonding pressure is preferably 0.098 MPa to 1.77 MPa, more preferably 0. The thermocompression bonding time is preferably in the range of 20 seconds to 400 seconds, more preferably in the range of 30 seconds to 300 seconds. Lamination is preferably performed under reduced pressure conditions with a pressure of 26.7 hPa or less.
積層は、市販の真空ラミネーターによって行うことができる。市販の真空ラミネーターとしては、例えば、名機製作所社製の真空加圧式ラミネーター、ニッコー・マテリアルズ社製のバキュームアップリケーター等が挙げられる。 Lamination can be performed with a commercially available vacuum laminator. Examples of the commercially available vacuum laminator include a vacuum pressure laminator manufactured by Meiki Seisakusho, a vacuum applicator manufactured by Nikko Materials, and the like.
積層の後に、常圧下(大気圧下)、例えば、加熱圧着部材を支持体側からプレスすることにより、積層された樹脂シートの平滑化処理を行ってもよい。平滑化処理のプレス条件は、上記積層の加熱圧着条件と同様の条件とすることができる。平滑化処理は、市販のラミネーターによって行うことができる。なお、積層と平滑化処理は、上記の市販の真空ラミネーターを用いて連続的に行ってもよい。 After lamination, the laminated resin sheets may be smoothed under normal pressure (atmospheric pressure), for example, by pressing a thermocompression bonding member from the support side. The pressing conditions for the smoothing treatment can be the same conditions as the thermocompression bonding conditions for the laminate. The smoothing treatment can be performed with a commercially available laminator. In addition, you may perform lamination | stacking and a smoothing process continuously using said commercially available vacuum laminator.
支持体は、工程(I)と工程(II)の間に除去してもよく、工程(II)の後に除去してもよい。 The support may be removed between step (I) and step (II), or may be removed after step (II).
工程(II)において、樹脂組成物層を熱硬化して絶縁層を形成する。 In step (II), the resin composition layer is thermally cured to form an insulating layer.
樹脂組成物層の熱硬化条件は特に限定されず、プリント配線板の絶縁層を形成するに際して通常採用される条件を使用してよい。 The thermosetting conditions for the resin composition layer are not particularly limited, and the conditions normally employed when forming the insulating layer of the printed wiring board may be used.
例えば、樹脂組成物層の熱硬化条件は、樹脂組成物の種類等によっても異なるが、硬化温度は120℃〜240℃の範囲(好ましくは150℃〜220℃の範囲、より好ましくは170℃〜200℃の範囲)、硬化時間は5分間〜120分間の範囲(好ましくは10分間〜100分間、より好ましくは15分間〜90分間)とすることができる。 For example, although the thermosetting conditions of the resin composition layer vary depending on the type of the resin composition, the curing temperature is in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 220 ° C, more preferably in the range of 170 ° C to 200 ° C.) and the curing time can be in the range of 5 minutes to 120 minutes (preferably 10 minutes to 100 minutes, more preferably 15 minutes to 90 minutes).
樹脂組成物層を熱硬化させる前に、樹脂組成物層を硬化温度よりも低い温度にて予備加熱してもよい。例えば、樹脂組成物層を熱硬化させるのに先立ち、50℃以上120℃未満(好ましくは60℃以上110℃以下、より好ましくは70℃以上100℃以下)の温度にて、樹脂組成物層を5分間以上(好ましくは5分間〜150分間、より好ましくは15分間〜120分間)予備加熱してもよい。 Before the resin composition layer is thermally cured, the resin composition layer may be preheated at a temperature lower than the curing temperature. For example, prior to thermosetting the resin composition layer, the resin composition layer is formed at a temperature of 50 ° C. or higher and lower than 120 ° C. (preferably 60 ° C. or higher and 110 ° C. or lower, more preferably 70 ° C. or higher and 100 ° C. or lower). Preheating may be performed for 5 minutes or more (preferably 5 minutes to 150 minutes, more preferably 15 minutes to 120 minutes).
プリント配線板を製造するに際しては、(III)絶縁層に穴あけする工程、(IV)絶縁層を粗化処理する工程、(V)導体層を形成する工程をさらに実施してもよい。これらの工程(III)乃至(V)は、プリント配線板の製造に用いられる、当業者に公知の各種方法に従って実施してよい。なお、支持体を工程(II)の後に除去する場合、該支持体の除去は、工程(II)と工程(III)との間、工程(III)と工程(IV)の間、又は工程(IV)と工程(V)との間に実施してよい。また、必要に応じて、工程(II)〜(V)の絶縁層及び導体層の形成を繰り返して実施し、多層配線板を形成してもよい。この場合、それぞれの導体層間の絶縁層の厚み(図1のt1)は上記範囲内であることが好ましい。 When manufacturing a printed wiring board, you may further implement (III) the process of drilling in an insulating layer, (IV) the process of roughening an insulating layer, and (V) the process of forming a conductor layer. These steps (III) to (V) may be carried out according to various methods known to those skilled in the art, which are used in the production of printed wiring boards. In addition, when removing a support body after process (II), removal of this support body is performed between process (II) and process (III), between process (III) and process (IV), or process ( It may be carried out between IV) and step (V). Moreover, if necessary, the multilayer wiring board may be formed by repeatedly forming the insulating layer and the conductor layer in the steps (II) to (V). In this case, the thickness of the insulating layer between the respective conductor layers (t1 in FIG. 1) is preferably within the above range.
工程(III)は、絶縁層に穴あけする工程であり、これにより絶縁層にビアホール、スルーホール等のホールを形成することができる。工程(III)は、絶縁層の形成に使用した樹脂組成物の組成等に応じて、例えば、ドリル、レーザー、プラズマ等を使用して実施してよい。ホールの寸法や形状は、プリント配線板のデザインに応じて適宜決定してよい。 Step (III) is a step of making a hole in the insulating layer, whereby holes such as via holes and through holes can be formed in the insulating layer. Step (III) may be performed using, for example, a drill, laser, plasma, or the like, depending on the composition of the resin composition used for forming the insulating layer. The dimensions and shape of the holes may be appropriately determined according to the design of the printed wiring board.
工程(IV)は、絶縁層を粗化処理する工程である。粗化処理の手順、条件は特に限定されず、プリント配線板の絶縁層を形成するに際して通常使用される公知の手順、条件を採用することができる。例えば、膨潤液による膨潤処理、酸化剤による粗化処理、中和液による中和処理をこの順に実施して絶縁層を粗化処理することができる。膨潤液としては特に限定されないが、アルカリ溶液、界面活性剤溶液等が挙げられ、好ましくはアルカリ溶液であり、該アルカリ溶液としては、水酸化ナトリウム溶液、水酸化カリウム溶液がより好ましい。市販されている膨潤液としては、例えば、アトテックジャパン社製の「スウェリング・ディップ・セキュリガンスP」、「スウェリング・ディップ・セキュリガンスSBU」等が挙げられる。膨潤液による膨潤処理は、特に限定されないが、例えば、30℃〜90℃の膨潤液に絶縁層を1分間〜20分間浸漬することにより行うことができる。絶縁層の樹脂の膨潤を適度なレベルに抑える観点から、40℃〜80℃の膨潤液に絶縁層を5分間〜15分間浸漬させることが好ましい。酸化剤としては、特に限定されないが、例えば、水酸化ナトリウムの水溶液に過マンガン酸カリウムや過マンガン酸ナトリウムを溶解したアルカリ性過マンガン酸溶液が挙げられる。アルカリ性過マンガン酸溶液等の酸化剤による粗化処理は、60℃〜80℃に加熱した酸化剤溶液に絶縁層を10分間〜30分間浸漬させて行うことが好ましい。また、アルカリ性過マンガン酸溶液における過マンガン酸塩の濃度は5質量%〜10質量%が好ましい。市販されている酸化剤としては、例えば、アトテックジャパン社製の「コンセントレート・コンパクトCP」、「ドージングソリューション・セキュリガンスP」等のアルカリ性過マンガン酸溶液が挙げられる。また、中和液としては、酸性の水溶液が好ましく、市販品としては、例えば、アトテックジャパン社製の「リダクションソリューション・セキュリガントP」が挙げられる。中和液による処理は、酸化剤による粗化処理がなされた処理面を30℃〜80℃の中和液に5分間〜30分間浸漬させることにより行うことができる。作業性等の点から、酸化剤による粗化処理がなされた対象物を、40℃〜70℃の中和液に5分間〜20分間浸漬する方法が好ましい。 Step (IV) is a step of roughening the insulating layer. The procedure and conditions for the roughening treatment are not particularly limited, and known procedures and conditions that are usually used when forming an insulating layer of a printed wiring board can be employed. For example, the insulating layer can be roughened by performing a swelling treatment with a swelling liquid, a roughening treatment with an oxidizing agent, and a neutralization treatment with a neutralizing liquid in this order. Although it does not specifically limit as a swelling liquid, An alkaline solution, surfactant solution, etc. are mentioned, Preferably it is an alkaline solution, As this alkaline solution, a sodium hydroxide solution and a potassium hydroxide solution are more preferable. Examples of commercially available swelling liquids include “Swelling Dip Securigans P” and “Swelling Dip Securigans SBU” manufactured by Atotech Japan. Although the swelling process by a swelling liquid is not specifically limited, For example, it can perform by immersing an insulating layer for 1 minute-20 minutes in 30 degreeC-90 degreeC swelling liquid. From the viewpoint of suppressing the swelling of the resin in the insulating layer to an appropriate level, it is preferable to immerse the insulating layer in a swelling liquid at 40 ° C. to 80 ° C. for 5 minutes to 15 minutes. Although it does not specifically limit as an oxidizing agent, For example, the alkaline permanganate solution which melt | dissolved potassium permanganate and sodium permanganate in the aqueous solution of sodium hydroxide is mentioned. The roughening treatment with an oxidizing agent such as an alkaline permanganic acid solution is preferably performed by immersing the insulating layer in an oxidizing agent solution heated to 60 to 80 ° C. for 10 to 30 minutes. The concentration of permanganate in the alkaline permanganate solution is preferably 5% by mass to 10% by mass. Examples of commercially available oxidizers include alkaline permanganate solutions such as “Concentrate Compact CP” and “Dosing Solution Securigans P” manufactured by Atotech Japan. As the neutralizing solution, an acidic aqueous solution is preferable, and as a commercially available product, for example, “Reduction Solution Securigant P” manufactured by Atotech Japan Co., Ltd. can be mentioned. The treatment with the neutralizing solution can be performed by immersing the treated surface subjected to the roughening treatment with the oxidizing agent in the neutralizing solution at 30 to 80 ° C. for 5 to 30 minutes. From the viewpoint of workability and the like, a method of immersing an object subjected to roughening treatment with an oxidizing agent in a neutralizing solution at 40 ° C. to 70 ° C. for 5 minutes to 20 minutes is preferable.
一実施形態において、粗化処理後の絶縁層表面の算術平均粗さRaは、好ましくは400nm以下、より好ましくは350nm以下、さらに好ましくは300nm以下である。下限については特に限定されないが、好ましくは0.5nm以上、より好ましくは1nm以上である。また、粗化処理後の絶縁層表面の二乗平均平方根粗さRqは、好ましくは400nm以下、より好ましくは350nm以下、さらに好ましくは300nm以下である.下限については特に限定されないが、好ましくは0.5nm以上、より好ましくは1nm以上である。絶縁層表面の算術平均粗さ(Ra)及び二乗平均平方根粗さ(Rq)は、非接触型表面粗さ計を用いて測定することができ、詳細は後述する(算術平均粗さ(Ra)、二乗平均平方根粗さ(Rq)の測定)に記載の方法に従って測定することができる。 In one embodiment, the arithmetic average roughness Ra of the surface of the insulating layer after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, and further preferably 300 nm or less. Although it does not specifically limit about a minimum, Preferably it is 0.5 nm or more, More preferably, it is 1 nm or more. The root mean square roughness Rq of the insulating layer surface after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, and further preferably 300 nm or less. Although it does not specifically limit about a minimum, Preferably it is 0.5 nm or more, More preferably, it is 1 nm or more. The arithmetic average roughness (Ra) and root mean square roughness (Rq) of the insulating layer surface can be measured using a non-contact type surface roughness meter, and details will be described later (arithmetic average roughness (Ra)). , Measurement of root mean square roughness (Rq)).
工程(V)は、導体層を形成する工程である。内層基板に導体層が形成されていない場合、工程(V)は第1の導体層を形成する工程であり、内層基板に導体層が形成されている場合、該導体層が第1の導体層であり、工程(V)は第2の導体層を形成する工程である。 Step (V) is a step of forming a conductor layer. When the conductor layer is not formed on the inner layer substrate, the step (V) is a step of forming the first conductor layer. When the conductor layer is formed on the inner layer substrate, the conductor layer is the first conductor layer. Step (V) is a step of forming the second conductor layer.
導体層に使用する導体材料は特に限定されない。好適な実施形態では、導体層は、金、白金、パラジウム、銀、銅、アルミニウム、コバルト、クロム、亜鉛、ニッケル、チタン、タングステン、鉄、スズ及びインジウムからなる群から選択される1種以上の金属を含む。導体層は、単金属層であっても合金層であってもよく、合金層としては、例えば、上記の群から選択される2種以上の金属の合金(例えば、ニッケル・クロム合金、銅・ニッケル合金及び銅・チタン合金)から形成された層が挙げられる。中でも、導体層形成の汎用性、コスト、パターニングの容易性等の観点から、クロム、ニッケル、チタン、アルミニウム、亜鉛、金、パラジウム、銀若しくは銅の単金属層、又はニッケル・クロム合金、銅・ニッケル合金、銅・チタン合金の合金層が好ましく、クロム、ニッケル、チタン、アルミニウム、亜鉛、金、パラジウム、銀若しくは銅の単金属層、又はニッケル・クロム合金の合金層がより好ましく、銅の単金属層が更に好ましい。 The conductor material used for the conductor layer is not particularly limited. In a preferred embodiment, the conductor layer is one or more selected from the group consisting of gold, platinum, palladium, silver, copper, aluminum, cobalt, chromium, zinc, nickel, titanium, tungsten, iron, tin and indium. Contains metal. The conductor layer may be a single metal layer or an alloy layer. As the alloy layer, for example, an alloy of two or more metals selected from the above group (for example, nickel-chromium alloy, copper- A layer formed from a nickel alloy and a copper / titanium alloy). Among them, from the viewpoint of versatility of conductor layer formation, cost, ease of patterning, etc., single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or nickel / chromium alloy, copper / An alloy layer of nickel alloy or copper / titanium alloy is preferable, and a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or an alloy layer of nickel / chromium alloy is more preferable, and a single layer of copper is preferable. A metal layer is more preferred.
導体層は、単層構造であっても、異なる種類の金属若しくは合金からなる単金属層又は合金層が2層以上積層した複層構造であってもよい。導体層が複層構造である場合、絶縁層と接する層は、クロム、亜鉛若しくはチタンの単金属層、又はニッケル・クロム合金の合金層であることが好ましい。 The conductor layer may have a single layer structure or a multilayer structure in which two or more single metal layers or alloy layers made of different types of metals or alloys are laminated. When the conductor layer has a multilayer structure, the layer in contact with the insulating layer is preferably a single metal layer of chromium, zinc or titanium, or an alloy layer of nickel / chromium alloy.
導体層の厚さは、所望のプリント配線板のデザインによるが、一般に3μm〜35μm、好ましくは5μm〜30μmである。 Although the thickness of a conductor layer is based on the design of a desired printed wiring board, generally it is 3 micrometers-35 micrometers, Preferably it is 5 micrometers-30 micrometers.
一実施形態において、導体層は、めっきにより形成してよい。例えば、セミアディティブ法、フルアディティブ法等の従来公知の技術により絶縁層の表面にめっきして、所望の配線パターンを有する導体層を形成することができる。以下、導体層をセミアディティブ法により形成する例を示す。 In one embodiment, the conductor layer may be formed by plating. For example, the surface of the insulating layer can be plated by a conventionally known technique such as a semi-additive method or a full additive method to form a conductor layer having a desired wiring pattern. Hereinafter, an example in which the conductor layer is formed by a semi-additive method will be described.
まず、絶縁層の表面に、無電解めっきによりめっきシード層を形成する。次いで、形成されためっきシード層上に、所望の配線パターンに対応してめっきシード層の一部を露出させるマスクパターンを形成する。露出しためっきシード層上に、電解めっきにより金属層を形成した後、マスクパターンを除去する。その後、不要なめっきシード層をエッチング等により除去して、所望の配線パターンを有する導体層を形成することができる。 First, a plating seed layer is formed on the surface of the insulating layer by electroless plating. Next, a mask pattern that exposes a part of the plating seed layer corresponding to a desired wiring pattern is formed on the formed plating seed layer. A metal layer is formed by electrolytic plating on the exposed plating seed layer, and then the mask pattern is removed. Thereafter, an unnecessary plating seed layer can be removed by etching or the like to form a conductor layer having a desired wiring pattern.
本発明の樹脂シートは、部品埋め込み性にも良好な絶縁層をもたらすことから、プリント配線板が部品内蔵回路板である場合にも好適に使用することができる。部品内蔵回路板は公知の製造方法により作製することができる。 Since the resin sheet of the present invention provides an insulating layer having a good component embedding property, it can be suitably used even when the printed wiring board is a component built-in circuit board. The component built-in circuit board can be manufactured by a known manufacturing method.
本発明の樹脂シートを用いて製造されるプリント配線板は、本発明の樹脂シートの樹脂組成物層の硬化物である絶縁層と、絶縁層に埋め込まれた埋め込み型配線層と、を備える態様であってもよい。 A printed wiring board manufactured using the resin sheet of the present invention includes an insulating layer that is a cured product of the resin composition layer of the resin sheet of the present invention, and an embedded wiring layer embedded in the insulating layer. It may be.
[半導体装置]
本発明の半導体装置は、本発明のプリント配線板を含む。本発明の半導体装置は、本発明のプリント配線板を用いて製造することができる。
[Semiconductor device]
The semiconductor device of the present invention includes the printed wiring board of the present invention. The semiconductor device of the present invention can be manufactured using the printed wiring board of the present invention.
半導体装置としては、電気製品(例えば、コンピューター、携帯電話、デジタルカメラ及びテレビ等)及び乗物(例えば、自動二輪車、自動車、電車、船舶及び航空機等)等に供される各種半導体装置が挙げられる。 Examples of the semiconductor device include various semiconductor devices used for electrical products (for example, computers, mobile phones, digital cameras, and televisions) and vehicles (for example, motorcycles, automobiles, trains, ships, and aircrafts).
本発明の半導体装置は、プリント配線板の導通箇所に、部品(半導体チップ)を実装することにより製造することができる。「導通箇所」とは、「プリント配線板における電気信号を伝える箇所」であって、その場所は表面であっても、埋め込まれた箇所であってもいずれでも構わない。また、半導体チップは半導体を材料とする電気回路素子であれば特に限定されない。 The semiconductor device of the present invention can be manufactured by mounting a component (semiconductor chip) on a conductive portion of a printed wiring board. The “conduction location” is a “location where an electrical signal is transmitted on a printed wiring board”, and the location may be a surface or an embedded location. The semiconductor chip is not particularly limited as long as it is an electric circuit element made of a semiconductor.
本発明の半導体装置を製造する際の半導体チップの実装方法は、半導体チップが有効に機能しさえすれば、特に限定されないが、具体的には、ワイヤボンディング実装方法、フリップチップ実装方法、バンプなしビルドアップ層(BBUL)による実装方法、異方性導電フィルム(ACF)による実装方法、非導電性フィルム(NCF)による実装方法、等が挙げられる。ここで、「バンプなしビルドアップ層(BBUL)による実装方法」とは、「半導体チップをプリント配線板の凹部に直接埋め込み、半導体チップとプリント配線板上の配線とを接続させる実装方法」のことである。 The semiconductor chip mounting method for manufacturing the semiconductor device of the present invention is not particularly limited as long as the semiconductor chip functions effectively, but specifically, a wire bonding mounting method, a flip chip mounting method, and no bumps. Examples include a mounting method using a build-up layer (BBUL), a mounting method using an anisotropic conductive film (ACF), and a mounting method using a non-conductive film (NCF). Here, “a mounting method using a build-up layer without a bump (BBUL)” means “a mounting method in which a semiconductor chip is directly embedded in a recess of a printed wiring board and the semiconductor chip and wiring on the printed wiring board are connected”. It is.
以下、本発明を実施例により具体的に説明する。本発明はこれらの実施例に限定されるものではない。なお、以下において、「部」及び「%」は、別途明示のない限り、それぞれ「質量部」及び「質量%」を意味する。 Hereinafter, the present invention will be specifically described by way of examples. The present invention is not limited to these examples. In the following, “part” and “%” mean “part by mass” and “% by mass”, respectively, unless otherwise specified.
<無機充填材の平均粒径の測定>
無機充填材100mg、分散剤(サンノプコ社製「SN9228」)0.1g、メチルエチルケトン10gをバイアル瓶に秤取り、超音波にて20分間分散した。レーザー回折式粒度分布測定装置(島津製作所社製「SALD−2200」)を使用して、回分セル方式で粒度分布を測定し、メディアン径による平均粒径を算出した。
<Measurement of average particle size of inorganic filler>
100 mg of an inorganic filler, 0.1 g of a dispersant (“SN9228” manufactured by San Nopco) and 10 g of methyl ethyl ketone were weighed in a vial and dispersed with an ultrasonic wave for 20 minutes. Using a laser diffraction type particle size distribution measuring device (“SALD-2200” manufactured by Shimadzu Corporation), the particle size distribution was measured by a batch cell method, and the average particle size by the median diameter was calculated.
<無機充填材の比表面積の測定>
BET全自動比表面積測定装置(マウンテック社製Macsorb HM−1210)を使用して、無機充填材の比表面積を測定した。
<Measurement of specific surface area of inorganic filler>
The specific surface area of the inorganic filler was measured using a BET fully automatic specific surface area measuring device (Macsorb HM-1210 manufactured by Mountec Co., Ltd.).
<使用した無機充填材>
無機充填材1:球状シリカ(新日鉄住金マテリアルズ社製「SPH516−05」、平均粒径0.29μm、比表面積16.3m2/g)100部に対して、3,3,3−トリフルオロプロピルトリメトキシシラン(信越化学工業社製、KBM−7103)1部、で表面処理したもの。
無機充填材2:球状シリカ(新日鉄住金マテリアルズ社製「SPH516−05」、平均粒径0.29μm、比表面積16.3m2/g)100部に対して、N−フェニル−3−アミノプロピルトリメトキシシラン(信越化学工業社製、KBM573)1部で表面処理したもの。
無機充填材3:球状シリカ(電気化学工業社製「UFP−30」、平均粒径0.078μm、比表面積30.7m2/g、)100部に対して、3,3,3−トリフルオロプロピルトリメトキシシラン(信越化学工業社製、KBM−7103)2部で表面処理したもの。
無機充填材4:球状シリカ(電気化学工業社製「UFP−30」、平均粒径0.078μm、比表面積30.7m2/g)100部に対して、N−フェニル−3−アミノプロピルトリメトキシシラン(信越化学工業社製、KBM573)2部で表面処理したもの。
無機充填材5:球形シリカ(アドマテックス社製「SC1500SQ」(ヘキサメチルジシラザンで表面処理された「SO−C1」)、平均粒径0.63μm、比表面積11.2m2/g)100部に対して、N−フェニル−3−アミノプロピルトリメトキシシラン(信越化学工業社製、KBM573)1部で表面処理したもの。
<Used inorganic filler>
Inorganic filler 1: 3,3,3-trifluoro with respect to 100 parts of spherical silica (“SPH516-05” manufactured by Nippon Steel & Sumikin Materials Co., Ltd., average particle size 0.29 μm, specific surface area 16.3 m 2 / g) Surface treatment with 1 part of propyltrimethoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., KBM-7103).
Inorganic filler 2: N-phenyl-3-aminopropyl with respect to 100 parts of spherical silica (“SPH516-05” manufactured by Nippon Steel & Sumikin Materials Co., Ltd., average particle size 0.29 μm, specific surface area 16.3 m 2 / g) Surface treated with 1 part of trimethoxysilane (KBM573, manufactured by Shin-Etsu Chemical Co., Ltd.).
Inorganic filler 3: 3,3,3-trifluoro with respect to 100 parts of spherical silica (“UFP-30” manufactured by Denki Kagaku Kogyo Co., Ltd., average particle size 0.078 μm, specific surface area 30.7 m 2 / g) Surface treated with 2 parts of propyltrimethoxysilane (KBE-7103, manufactured by Shin-Etsu Chemical Co., Ltd.).
Inorganic filler 4: N-phenyl-3-aminopropyltri to 100 parts of spherical silica (“UFP-30” manufactured by Denki Kagaku Kogyo Co., Ltd., average particle size 0.078 μm, specific surface area 30.7 m 2 / g) Surface treated with 2 parts of methoxysilane (KBM573, manufactured by Shin-Etsu Chemical Co., Ltd.).
Inorganic filler 5: 100 parts of spherical silica (“SC1500SQ” (“SO-C1” surface-treated with hexamethyldisilazane) manufactured by Admatechs Co., Ltd.), average particle size 0.63 μm, specific surface area 11.2 m 2 / g) In contrast, N-phenyl-3-aminopropyltrimethoxysilane (Shin-Etsu Chemical Co., Ltd., KBM573) was surface treated with 1 part.
[樹脂組成物の調製]
<樹脂組成物1の調製>
ビキシレノール型エポキシ樹脂(三菱化学社製「YX4000HK」、エポキシ当量約185)6部、ナフタレン型エポキシ樹脂(新日鉄住金化学社製「ESN475V」、エポキシ当量約332)10部、ビスフェノールAF型エポキシ樹脂(三菱化学社製「YL7760」、エポキシ当量約238)10部、ビスフェノール型エポキシ樹脂(新日鉄住金化学社製「ZX1059」、エポキシ当量約169、ビスフェノールA型とビスフェノールF型の1:1混合品)4部、フェノキシ樹脂(三菱化学社製「YX7553BH30」、固形分30質量%のシクロヘキサノン:メチルエチルケトン(MEK)の1:1溶液)2部を、ソルベントナフサ20部及びシクロヘキサノン10部の混合溶剤に撹拌しながら加熱溶解させた。室温にまで冷却した後、そこへ、トリアジン骨格含有ノボラック系硬化剤(DIC社製「LA7054」、水酸基当量約125、固形分60%のMEK溶液)3部、ナフトール系硬化剤(DIC社製「SN−495V」、水酸基当量約231)6部、無機充填材1を90部、アミン系硬化促進剤(4−ジメチルアミノピリジン(DMAP))0.05部を混合し、高速回転ミキサーで均一に分散した後に、カートリッジフィルター(ROKITECHNO社製「SHP020」)で濾過して、樹脂組成物1を調製した。
[Preparation of resin composition]
<Preparation of Resin Composition 1>
6 parts of bixylenol type epoxy resin (“YX4000HK” manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), 10 parts of naphthalene type epoxy resin (“ESN475V” manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., about 332), bisphenol AF type epoxy resin ( Mitsubishi Chemical Corporation "YL7760", epoxy equivalent of about 238) 10 parts, bisphenol type epoxy resin (Nippon Steel & Sumikin Chemical Co., Ltd. "ZX1059", epoxy equivalent of about 169, bisphenol A type and bisphenol F type 1: 1 mixture) 4 2 parts of phenoxy resin (“YX7553BH30” manufactured by Mitsubishi Chemical Corporation, 1: 1 solution of cyclohexanone: methyl ethyl ketone (MEK) having a solid content of 30% by mass) is stirred in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone. It was dissolved by heating. After cooling to room temperature, there were 3 parts of a triazine skeleton-containing novolak curing agent (“LA7054” manufactured by DIC, MEK solution having a hydroxyl equivalent weight of about 125 and a solid content of 60%), and a naphthol curing agent (manufactured by DIC “ SN-495V ”, hydroxyl equivalent of about 231) 6 parts, inorganic filler 1 90 parts, amine curing accelerator (4-dimethylaminopyridine (DMAP)) 0.05 part, and uniformly mixed with a high-speed rotary mixer After the dispersion, the resin composition 1 was prepared by filtering with a cartridge filter (“SHP020” manufactured by ROKITETECHNO).
<樹脂組成物2の調製>
ビキシレノール型エポキシ樹脂(三菱化学社製「YX4000HK」、エポキシ当量約185)6部、ナフタレン型エポキシ樹脂(新日鉄住金化学社製「ESN475V」、エポキシ当量約332)10部、ビスフェノールAF型エポキシ樹脂(三菱化学社製「YL7760」、エポキシ当量約238)10部、ビスフェノール型エポキシ樹脂(新日鉄住金化学社製「ZX1059」、エポキシ当量約169、ビスフェノールA型とビスフェノールF型の1:1混合品)4部、フェノキシ樹脂(三菱化学社製「YX7553BH30」、固形分30質量%のシクロヘキサノン:メチルエチルケトン(MEK)の1:1溶液)2部を、ソルベントナフサ20部及びシクロヘキサノン10部の混合溶剤に撹拌しながら加熱溶解させた。室温にまで冷却した後、そこへ、トリアジン骨格含有クレゾールノボラック系硬化剤(DIC社製「LA3018−50P」、水酸基当量約151、固形分50%の2−メトキシプロパノール溶液)4部、活性エステル系硬化剤(DIC社製「EXB−8000L−65M」、活性基当量約220、不揮発成分65質量%のMEK溶液)7部、無機充填材2を90部、アミン系硬化促進剤(4−ジメチルアミノピリジン(DMAP))0.05部を混合し、高速回転ミキサーで均一に分散した後に、カートリッジフィルター(ROKITECHNO社製「SHP020」)で濾過して、樹脂組成物2を調製した。
<Preparation of resin composition 2>
6 parts of bixylenol type epoxy resin (“YX4000HK” manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), 10 parts of naphthalene type epoxy resin (“ESN475V” manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., about 332), bisphenol AF type epoxy resin ( Mitsubishi Chemical Corporation "YL7760", epoxy equivalent of about 238) 10 parts, bisphenol type epoxy resin (Nippon Steel & Sumikin Chemical Co., Ltd. "ZX1059", epoxy equivalent of about 169, bisphenol A type and bisphenol F type 1: 1 mixture) 4 2 parts of phenoxy resin (“YX7553BH30” manufactured by Mitsubishi Chemical Corporation, 1: 1 solution of cyclohexanone: methyl ethyl ketone (MEK) having a solid content of 30% by mass) is stirred in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone. It was dissolved by heating. After cooling to room temperature, there are 4 parts of a triazine skeleton-containing cresol novolac-based curing agent (“LA3018-50P” manufactured by DIC, hydroxyl group equivalent of about 151, 2-methoxypropanol solution with a solid content of 50%), active ester system 7 parts of curing agent (“EXB-8000L-65M” manufactured by DIC, MEK solution having an active group equivalent of about 220 and 65% by mass of non-volatile components), 90 parts of inorganic filler 2, amine-based curing accelerator (4-dimethylamino) 0.05 part of pyridine (DMAP) was mixed and dispersed uniformly with a high-speed rotary mixer, and then filtered through a cartridge filter (“SHP020” manufactured by ROKITECHNO) to prepare Resin Composition 2.
<樹脂組成物3の調製>
ビキシレノール型エポキシ樹脂(三菱化学社製「YX4000HK」、エポキシ当量約185)6部、ナフタレン型エポキシ樹脂(新日鉄住金化学社製「ESN475V」、エポキシ当量約332)20部、ナフチレンエーテル型エポキシ樹脂(DIC社製「EXA−7311−G4」、エポキシ当量約213)2部を、ソルベントナフサ20部及びシクロヘキサノン10部の混合溶剤に撹拌しながら加熱溶解させた。室温にまで冷却した後、そこへ、トリアジン骨格含有クレゾールノボラック系硬化剤(DIC社製「LA3018−50P」、水酸基当量約151、固形分50%の2−メトキシプロパノール溶液)4部、活性エステル系硬化剤(DIC社製「EXB−8000L−65M」、活性基当量約220、不揮発成分65質量%のMEK溶液)7部、無機充填材3を50部、イミダゾール系硬化促進剤(1B2PZ、1−ベンジル−2−フェニルイミダゾール)0.05部を混合し、高速回転ミキサーで均一に分散した後に、カートリッジフィルター(ROKITECHNO社製「SHP020」)で濾過して、樹脂組成物3を調製した。
<Preparation of resin composition 3>
6 parts of bixylenol type epoxy resin (“YX4000HK” manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), 20 parts of naphthalene type epoxy resin (“ESN475V” manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., about 332), naphthylene ether type epoxy resin 2 parts (“EXA-731-G4” manufactured by DIC, epoxy equivalent of about 213) were dissolved by heating in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone with stirring. After cooling to room temperature, there are 4 parts of a triazine skeleton-containing cresol novolac-based curing agent (“LA3018-50P” manufactured by DIC, hydroxyl group equivalent of about 151, 2-methoxypropanol solution with a solid content of 50%), active ester system 7 parts of curing agent ("EXB-8000L-65M" manufactured by DIC, MEK solution having an active group equivalent of about 220 and 65% by mass of non-volatile components), 50 parts of inorganic filler 3, imidazole-based curing accelerator (1B2PZ, 1- 0.05 part of (benzyl-2-phenylimidazole) was mixed and dispersed uniformly with a high-speed rotary mixer, and then filtered through a cartridge filter (“SHP020” manufactured by ROKITECHNO) to prepare Resin Composition 3.
<樹脂組成物4の調製>
ビキシレノール型エポキシ樹脂(三菱化学社製「YX4000HK」、エポキシ当量約185)6部、ナフタレン型エポキシ樹脂(新日鉄住金化学社製「ESN475V」、エポキシ当量約332)10部、ビスフェノールAF型エポキシ樹脂(三菱化学社製「YL7760」、エポキシ当量約238)10部、ナフチレンエーテル型エポキシ樹脂(DIC社製「EXA−7311−G4」、エポキシ当量約213)2部を、ソルベントナフサ20部及びシクロヘキサノン10部の混合溶剤に撹拌しながら加熱溶解させた。室温にまで冷却した後、そこへ、トリアジン骨格含有クレゾールノボラック系硬化剤(DIC社製「LA3018−50P」、水酸基当量約151、固形分50%の2−メトキシプロパノール溶液)4部、活性エステル系硬化剤(DIC社製「EXB−8000L−65M」、活性基当量約220、不揮発成分65質量%のMEK溶液)7部、無機充填材4を50部、アミン系硬化促進剤(4−ジメチルアミノピリジン(DMAP))0.05部を混合し、高速回転ミキサーで均一に分散した後に、カートリッジフィルター(ROKITECHNO社製「SHP020」)で濾過して、樹脂組成物4を調製した。
<Preparation of resin composition 4>
6 parts of bixylenol type epoxy resin (“YX4000HK” manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), 10 parts of naphthalene type epoxy resin (“ESN475V” manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., about 332), bisphenol AF type epoxy resin ( 10 parts “YL7760” manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 238), 2 parts of naphthylene ether type epoxy resin (“EXA-7311-G4” manufactured by DIC, epoxy equivalent of about 213), 20 parts of solvent naphtha and 10 of cyclohexanone The mixture was heated and dissolved in a part of the mixed solvent with stirring. After cooling to room temperature, there are 4 parts of a triazine skeleton-containing cresol novolac-based curing agent (“LA3018-50P” manufactured by DIC, hydroxyl group equivalent of about 151, 2-methoxypropanol solution with a solid content of 50%), active ester system 7 parts of curing agent (“EXB-8000L-65M” manufactured by DIC, MEK solution with active group equivalent of about 220, 65% by mass of non-volatile component), 50 parts of inorganic filler 4 and amine-based curing accelerator (4-dimethylamino) 0.05 parts of pyridine (DMAP) was mixed and dispersed uniformly with a high-speed rotary mixer, and then filtered through a cartridge filter (“SHP020” manufactured by ROKITECHNO) to prepare Resin Composition 4.
<樹脂組成物5の調製>
ビキシレノール型エポキシ樹脂(三菱化学社製「YX4000HK」、エポキシ当量約185)6部、ナフタレン型エポキシ樹脂(新日鉄住金化学社製「ESN475V」、エポキシ当量約332)20部、シクロヘキサン型エポキシ樹脂(三菱化学社製「ZX1658GS」、エポキシ当量約135)4部を、ソルベントナフサ20部及びシクロヘキサノン10部の混合溶剤に撹拌しながら加熱溶解させた。室温にまで冷却した後、そこへ、トリアジン骨格含有ノボラック系硬化剤(DIC社製「LA7054」、水酸基当量約125、固形分60%のMEK溶液)3部、ナフトール系硬化剤(DIC社製「SN−495V」、水酸基当量約231)6部、無機充填材5を80部、アミン系硬化促進剤(4−ジメチルアミノピリジン(DMAP))0.05部を混合し、高速回転ミキサーで均一に分散した後に、カートリッジフィルター(ROKITECHNO社製「SHP020」)で濾過して、樹脂組成物5を調製した。
<Preparation of
6 parts of bixylenol type epoxy resin (Mitsubishi Chemical “YX4000HK”, epoxy equivalent of about 185), 20 parts of naphthalene type epoxy resin (“NSN475V” manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., about 332), cyclohexane type epoxy resin (Mitsubishi) 4 parts of “ZX1658GS” manufactured by Kagaku Co., Ltd., having an epoxy equivalent of about 135) was dissolved by heating in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone with stirring. After cooling to room temperature, there were 3 parts of a triazine skeleton-containing novolak curing agent (“LA7054” manufactured by DIC, MEK solution having a hydroxyl equivalent weight of about 125 and a solid content of 60%), and a naphthol curing agent (manufactured by DIC “ SN-495V ", hydroxyl equivalent of about 231) 6 parts,
<樹脂組成物6の調製>
ビキシレノール型エポキシ樹脂(三菱化学社製「YX4000HK」、エポキシ当量約185)6部、ナフタレン型エポキシ樹脂(新日鉄住金化学社製「ESN475V」、エポキシ当量約332)20部、ナフチレンエーテル型エポキシ樹脂(DIC社製「EXA−7311−G4」、エポキシ当量約213)2部、フェノキシ樹脂(三菱化学社製「YX7553BH30」、固形分30質量%のシクロヘキサノン:メチルエチルケトン(MEK)の1:1溶液)2部をソルベントナフサ20部及びシクロヘキサノン10部の混合溶剤に撹拌しながら加熱溶解させた。室温にまで冷却した後、そこへ、トリアジン骨格含有クレゾールノボラック系硬化剤(DIC社製「LA3018−50P」、水酸基当量約151、固形分50%の2−メトキシプロパノール溶液)4部、活性エステル系硬化剤(DIC社製「EXB−8000L−65M」、活性基当量約220、不揮発成分65質量%のMEK溶液)7部、無機充填材5を80部、イミダゾール系硬化促進剤(1B2PZ、1−ベンジル−2−フェニルイミダゾール)0.05部を混合し、高速回転ミキサーで均一に分散した後に、カートリッジフィルター(ROKITECHNO社製「SHP020」)で濾過して、樹脂組成物6を調製した。
<Preparation of
6 parts of bixylenol type epoxy resin (“YX4000HK” manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), 20 parts of naphthalene type epoxy resin (“ESN475V” manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., about 332), naphthylene ether type epoxy resin ("EXA-7311-G4" manufactured by DIC, epoxy equivalent of about 213), 2 parts, phenoxy resin ("YX7553BH30" manufactured by Mitsubishi Chemical Corporation, 1: 1 solution of cyclohexanone: methyl ethyl ketone (MEK) having a solid content of 30% by mass) The part was dissolved by heating in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone while stirring. After cooling to room temperature, there are 4 parts of a triazine skeleton-containing cresol novolac-based curing agent (“LA3018-50P” manufactured by DIC, hydroxyl group equivalent of about 151, 2-methoxypropanol solution with a solid content of 50%), active ester system 7 parts of curing agent ("EXB-8000L-65M" manufactured by DIC, MEK solution having an active group equivalent of about 220 and 65% by mass of non-volatile components), 80 parts of
樹脂組成物1〜6の調製に用いた成分とその配合量(不揮発分の質量部)を下記表に示した。なお、下記表中の略語等は以下のとおりである。
YX4000HK:ビキシレノール型エポキシ樹脂、三菱化学社製、エポキシ当量約185
ESN475V:ナフタレン型エポキシ樹脂、新日鉄住金化学社製、エポキシ当量約332
YL7760:ビスフェノールAF型エポキシ樹脂、三菱化学社製、エポキシ当量約238
EXA−7311−64:ナフチレンエーテル型エポキシ樹脂、DIC社製、エポキシ当量約213
ZX1059:ビスフェノール型エポキシ樹脂、新日鉄住金化学社製、エポキシ当量約169、ビスフェノールA型とビスフェノールF型の1:1混合品
ZX1658GS:シクロヘキサン型エポキシ樹脂、三菱化学社製、エポキシ当量約135
LA3018−50P:トリアジン骨格含有クレゾールノボラック系硬化剤、DIC社製、水酸基当量約151、固形分50%の2−メトキシプロパノール溶液
LA7054:トリアジン骨格含有ノボラック系硬化剤、DIC社製、水酸基当量約125、固形分60%のMEK溶液
SN−495V:ナフトール系硬化剤、DIC社製、水酸基当量約231
EXB−8000L−65M:活性エステル系硬化剤、DIC社製、活性基当量約220、不揮発成分65質量%のMEK溶液
YX7553BH30:フェノキシ樹脂、三菱化学社製、固形分30質量%のシクロヘキサノン:メチルエチルケトン(MEK)の1:1溶液
DMAP:アミン系硬化促進剤、4−ジメチルアミノピリジン
1B2PZ:イミダゾール系硬化促進剤、1−ベンジル−2−フェニルイミダゾール
The components used for the preparation of the resin compositions 1 to 6 and their blending amounts (parts by weight of nonvolatile content) are shown in the following table. The abbreviations in the table below are as follows.
YX4000HK: Boxylenol type epoxy resin, manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185
ESN475V: Naphthalene type epoxy resin, manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., epoxy equivalent of about 332
YL7760: Bisphenol AF type epoxy resin, manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 238
EXA-7311-64: naphthylene ether type epoxy resin, manufactured by DIC, epoxy equivalent of about 213
ZX1059: bisphenol type epoxy resin, manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., epoxy equivalent of about 169, 1: 1 mixture of bisphenol A type and bisphenol F type ZX1658GS: cyclohexane type epoxy resin, manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 135
LA3018-50P: Triazine skeleton-containing cresol novolak-based curing agent, manufactured by DIC, hydroxyl equivalent of about 151, 2-methoxypropanol solution having a solid content of 50% LA7054: Triazine skeleton-containing novolak-based curing agent, manufactured by DIC, hydroxyl equivalent of about 125 , 60% solid MEK solution SN-495V: naphthol-based curing agent, manufactured by DIC, hydroxyl equivalent of about 231
EXB-8000L-65M: Active ester type curing agent, manufactured by DIC, active group equivalent of about 220, MEK solution YX7553BH30 with 65% by mass of non-volatile components: Phenoxy resin, manufactured by Mitsubishi Chemical Co., Ltd., cyclohexanone with a solid content of 30% by mass: methyl ethyl ketone ( MEK) 1: 1 solution DMAP: amine-based curing accelerator, 4-dimethylaminopyridine 1B2PZ: imidazole-based curing accelerator, 1-benzyl-2-phenylimidazole
[樹脂シートの作製]
支持体として、アルキド樹脂系離型剤(リンテック社製「AL−5」)で離型処理したPETフィルム(東レ社製「ルミラーR80」、厚み38μm、軟化点130℃、「離型PET」)を用意した。
[Production of resin sheet]
As a support, a PET film (“Lumirror R80” manufactured by Toray Industries, Inc., thickness 38 μm, softening point 130 ° C., “release PET”) subjected to release treatment with an alkyd resin release agent (“AL-5” manufactured by Lintec) Prepared.
各樹脂組成物を離型PET上に、乾燥後の樹脂組成物層の厚みが13μmとなるよう、ダイコーターにて均一に塗布した70℃から95℃で2分間乾燥することにより、離型PET上に樹脂組成物層を得た。次いで、樹脂シートの支持体と接合していない面に、保護フィルムとしてポリプロピレンフィルム(王子エフテックス社製「アルファンMA−411」、厚み15μm)の粗面を、樹脂組成物層と接合するように積層した。これにより、離型PET(支持体)、樹脂組成物層、及び保護フィルムの順からなる樹脂シートを得た。 Each resin composition was uniformly applied with a die coater so that the thickness of the resin composition layer after drying was 13 μm on the release PET, and dried at 70 ° C. to 95 ° C. for 2 minutes, thereby releasing the release PET. A resin composition layer was obtained on top. Next, a rough surface of a polypropylene film (“Alphan MA-411” manufactured by Oji F-Tex Co., Ltd., thickness 15 μm) as a protective film is bonded to the resin composition layer on the surface not bonded to the support of the resin sheet. Laminated. This obtained the resin sheet which consists of order of mold release PET (support body), a resin composition layer, and a protective film.
[評価試験]
<粗度及びめっきピール強度の測定>
(評価用基板の調製)
(1)内層回路基板の下地処理
内層回路基板として、L/S=2μm/2μmの配線パターンにて形成された回路導体(銅)を両面に有するガラス布基材エポキシ樹脂両面銅張積層板(銅箔の厚さ3μm、基板厚み0.15mm、三菱ガス化学社製「HL832NSF LCA」、255×340mmサイズ)を用意した。該内層回路基板の両面を、メック社製「FlatBOND−FT」にて銅表面の有機被膜処理を行った。
[Evaluation test]
<Measurement of roughness and plating peel strength>
(Preparation of evaluation substrate)
(1) Ground treatment of inner layer circuit board As an inner layer circuit board, a glass cloth base epoxy resin double-sided copper-clad laminate having circuit conductors (copper) formed on both sides with a wiring pattern of L / S = 2 μm / 2 μm ( A copper foil thickness of 3 μm, a substrate thickness of 0.15 mm, and “HL832NSF LCA” (255 × 340 mm size) manufactured by Mitsubishi Gas Chemical Company, Inc. were prepared. Both surfaces of the inner layer circuit board were subjected to organic coating treatment on the copper surface with “FlatBOND-FT” manufactured by MEC.
(2)樹脂シートのラミネート
実施例及び比較例で作製した各樹脂シートから保護フィルムを剥がし、バッチ式真空加圧ラミネーター(ニッコー・マテリアルズ社製、2ステージビルドアップラミネーター、CVP700)を用いて、樹脂組成物層が内層回路基板と接するように、内層回路基板の両面にラミネートした。ラミネートは、30秒間減圧して気圧を13hPa以下とし、130℃、圧力0.74MPaにて45秒間圧着させることにより実施した。次いで、120℃、圧力0.5MPaにて75秒間熱プレスを行った。
(2) Lamination of resin sheet The protective film is peeled off from each resin sheet produced in the examples and comparative examples, and a batch type vacuum pressure laminator (manufactured by Nikko Materials, 2-stage buildup laminator, CVP700) is used. Lamination was performed on both surfaces of the inner layer circuit board so that the resin composition layer was in contact with the inner layer circuit board. Lamination was performed by reducing the pressure for 30 seconds to a pressure of 13 hPa or less, and pressing for 45 seconds at 130 ° C. and a pressure of 0.74 MPa. Next, hot pressing was performed at 120 ° C. and a pressure of 0.5 MPa for 75 seconds.
(3)樹脂組成物層の熱硬化
樹脂シートがラミネートされた内層回路基板を、100℃のオーブンに投入後30分間、次いで180℃のオーブンに移し替えた後30分間、熱硬化して厚みが5μmの絶縁層を形成し、離形PETを剥離した。これを「評価用基板A」とする。
(3) Thermosetting of resin composition layer The inner layer circuit board on which the resin sheet is laminated is placed in an oven at 100 ° C. for 30 minutes, then transferred to an oven at 180 ° C. and then thermoset for 30 minutes to obtain a thickness. A 5 μm insulating layer was formed, and the release PET was peeled off. This is referred to as “evaluation substrate A”.
(4)粗化処理を行う工程
絶縁層を形成した評価用基板Aに粗化処理としてのデスミア処理を行った。なお、デスミア処理としては、下記の湿式デスミア処理を実施した。
(4) Step of performing roughening treatment A desmear treatment as a roughening treatment was performed on the evaluation substrate A on which the insulating layer was formed. In addition, as a desmear process, the following wet desmear process was implemented.
湿式デスミア処理:
膨潤液(アトテックジャパン社製「スウェリングディップ・セキュリガントP」、ジエチレングリコールモノブチルエーテル及び水酸化ナトリウムの水溶液)に60℃で5分間、次いで酸化剤溶液(アトテックジャパン社製「コンセントレート・コンパクトCP」、過マンガン酸カリウム濃度約6%、水酸化ナトリウム濃度約4%の水溶液)に80℃で10分間、最後に中和液(アトテックジャパン社製「リダクションソリューション・セキュリガントP」、硫酸水溶液)に40℃で5分間、浸漬した後、80℃で15分間乾燥した。
Wet desmear treatment:
Swelling solution (“Swelling Dip Securigant P” manufactured by Atotech Japan Co., Ltd., aqueous solution of diethylene glycol monobutyl ether and sodium hydroxide) at 60 ° C. for 5 minutes, then oxidant solution (“Concentrate Compact CP” manufactured by Atotech Japan Co., Ltd.) , Aqueous solution with potassium permanganate concentration of about 6% and sodium hydroxide concentration of about 4%) at 80 ° C. for 10 minutes, and finally into neutralization solution (“Reduction Solution Securigant P”, sulfuric acid aqueous solution manufactured by Atotech Japan) After dipping at 40 ° C. for 5 minutes, it was dried at 80 ° C. for 15 minutes.
(5)導体層を形成する工程
(5−1)無電解めっき工程
上記回路基板の表面に導体層を形成するため、下記1〜6の工程を含むめっき工程(アトテックジャパン社製の薬液を使用した銅めっき工程)を行って導体層を形成した。
(5) Step of forming a conductor layer (5-1) Electroless plating step In order to form a conductor layer on the surface of the circuit board, a plating step including the following steps 1 to 6 (using chemicals manufactured by Atotech Japan) The copper plating step) was performed to form a conductor layer.
1.アルカリクリーニング(ビアホールが設けられた絶縁層の表面の洗浄と電荷調整)
商品名:Cleaning Cleaner Securiganth 902(商品名)を用いて60℃で5分間洗浄した。
2.ソフトエッチング(ビアホール内の洗浄)
硫酸酸性ペルオキソ二硫酸ナトリウム水溶液を用いて、30℃で1分間処理した。
3.プレディップ(Pd付与のための絶縁層の表面の電荷の調整)
Pre. Dip Neoganth B(商品名)を用い、室温で1分間処理した。
4.アクティヴェーター付与(絶縁層の表面へのPdの付与)
Activator Neoganth 834(商品名)を用い、35℃で5分間処理した。
5.還元(絶縁層に付与されたPdを還元)
Reducer Neoganth WA(商品名)とReducer Acceralator 810 mod.(商品名)との混合液を用い、30℃で5分間処理した。
6.無電解銅めっき工程(Cuを絶縁層の表面(Pd表面)に析出)
Basic Solution Printganth MSK−DK(商品名)と、Copper solution Printganth MSK(商品名)と、Stabilizer Printganth MSK−DK(商品名)と、Reducer Cu(商品名)との混合液を用いて、35℃で20分間処理した。形成された無電解銅めっき層の厚さは0.8μmであった。
1. Alkali cleaning (cleaning and charge adjustment of the surface of the insulating layer with via holes)
Product name: Cleaned at 60 ° C. for 5 minutes using Cleaning Cleaner Security 902 (trade name).
2. Soft etching (cleaning inside via holes)
The mixture was treated with an aqueous sodium peroxodisulfate solution at 30 ° C. for 1 minute.
3. Pre-dip (adjustment of surface charge of insulating layer for Pd application)
Pre. Using Dip Neoganth B (trade name), it was treated at room temperature for 1 minute.
4). Activator application (Pd application to the surface of the insulating layer)
Using Activator Neoganth 834 (trade name), it was treated at 35 ° C. for 5 minutes.
5. Reduction (reduction of Pd applied to the insulating layer)
Reducer Neoganth WA (trade name) and Reducer Accelerator 810 mod. Using a mixed solution with (trade name), it was treated at 30 ° C. for 5 minutes.
6). Electroless copper plating process (Cu is deposited on the surface of the insulating layer (Pd surface))
Using a mixture of Basic Solution Print MSK-DK (trade name), Copper solution Print MS MS (trade name), Stabilizer Printganth MSK-DK (trade name), and Reducer Cu (trade name) at 35 ° C. Treated for 20 minutes. The thickness of the formed electroless copper plating layer was 0.8 μm.
(5−2)電解めっき工程
次いで、アトテックジャパン社製の薬液を使用して、ビアホール内に銅が充填される条件で電解銅めっき工程を行った。その後に、エッチングによるパターニングのためのレジストパターンとして、ビアホールに導通された直径1mmのランドパターン及び、下層導体とは接続されていない直径10mmの円形導体パターンを用いて絶縁層の表面に10μmの厚さでランド及び導体パターンを有する導体層を形成した。次に、アニール処理を200℃にて90分間行った。この基板を「評価用基板B」とした。
(5-2) Electrolytic plating process Subsequently, the electrolytic copper plating process was performed on the conditions with which a via hole is filled with copper using the chemical solution made from Atotech Japan. Thereafter, as a resist pattern for patterning by etching, a land pattern having a diameter of 1 mm conducted to the via hole and a circular conductor pattern having a diameter of 10 mm not connected to the lower layer conductor are used to form a thickness of 10 μm on the surface of the insulating layer. A conductor layer having lands and conductor patterns was formed. Next, annealing was performed at 200 ° C. for 90 minutes. This substrate was designated as “evaluation substrate B”.
(算術平均粗さ(Ra)、二乗平均平方根粗さ(Rq)の測定)
評価用基板Bの円形導体パターン外の絶縁層表面を、非接触型表面粗さ計(ビーコインスツルメンツ社製WYKO NT3300)を用いて、VSIコンタクトモード、50倍レンズにより測定範囲を121μm×92μmとして得られる数値によりRa値、Rq値を求めた。それぞれ6点の平均値を算出し、下一桁を四捨五入した結果を下記表に示した。
(Measurement of arithmetic average roughness (Ra), root mean square roughness (Rq))
The surface of the insulating layer outside the circular conductor pattern of the evaluation substrate B is obtained by using a non-contact type surface roughness meter (WYKO NT3300, manufactured by Becoins Instruments Co., Ltd.) with a VSI contact mode and a 50 × lens as a measurement range of 121 μm × 92 μm. Ra values and Rq values were obtained from the obtained numerical values. The average value of 6 points was calculated for each, and the result of rounding off the last digit was shown in the table below.
(めっき密着性(めっきピール強度)の測定)
評価用基板Bの導体層に、幅10mm、長さ100mmの部分の切込みをいれ、この一端を剥がしてつかみ具(ティー・エス・イー社製、オートコム型試験機 AC−50C−SL)で掴み、インストロン万能試験機を用いて、室温中にて、50mm/分の速度で垂直方向に35mmを引き剥がした時の荷重(kgf/cm)を測定し、ピール強度とした。
(Measurement of plating adhesion (plating peel strength))
Cut the 10mm width and 100mm length into the conductor layer of the evaluation board B, peel off one end of the conductor layer, and use a gripping tool (manufactured by TS E Co., Ltd., Autocom type testing machine AC-50C-SL). Using a Instron universal testing machine, the load (kgf / cm) when 35 mm was peeled in the vertical direction at a speed of 50 mm / min at room temperature was measured, and the peel strength was obtained.
<導体層間の絶縁層の厚みの測定>
評価用基板BをFIB−SEM複合装置(SIIナノテクノロジー社製「SMI3050SE」)を用いて、断面観察を行った。詳細には、導体層の表面に垂直な方向における断面をFIB(集束イオンビーム)により削り出し、断面SEM画像から、導体層間の絶縁層厚を測定した。各サンプルにつき、無作為に選んだ5箇所の断面SEM画像を観察し、その平均値を導体層間の絶縁層の厚み(μm)とし、下記表に示した。
<Measurement of insulation layer thickness between conductor layers>
The evaluation substrate B was subjected to cross-sectional observation using an FIB-SEM composite device (“SMI3050SE” manufactured by SII Nanotechnology). Specifically, the cross section in the direction perpendicular to the surface of the conductor layer was cut out by FIB (focused ion beam), and the insulating layer thickness between the conductor layers was measured from the cross section SEM image. For each sample, five cross-sectional SEM images selected at random were observed, and the average value was defined as the thickness (μm) of the insulating layer between the conductor layers, and is shown in the following table.
<絶縁層の絶縁信頼性の評価>
上記において得られた評価用基板Bの直径10mmの円形導体側を+電極とし、直径1mmのランドと接続された内層回路基板の格子導体(銅)側を−電極として、高度加速寿命試験装置(ETAC社製「PM422」)を使用し、130℃、85%相対湿度、3.3V直流電圧印加の条件で200時間経過させた際の絶縁抵抗値を、エレクトロケミカルマイグレーションテスター(J−RAS社製「ECM−100」)にて測定した。この測定を6回行い、6点の試験ピース全てにおいてその抵抗値が107Ω以上の場合を「○」、1つでも107Ω未満の場合は「×」とし、評価結果と絶縁抵抗値とを、下記表に示した。下記表に記載の絶縁抵抗値は、6点の試験ピースの絶縁抵抗値の最低値である。
<Evaluation of insulation reliability of insulating layer>
The highly accelerated life test apparatus (with the 10 mm diameter circular conductor side of the evaluation substrate B obtained above as the + electrode and the grid conductor (copper) side of the inner layer circuit board connected to the 1 mm diameter land as the − electrode) Using an ETAC "PM422"), the insulation resistance value after passing 200 hours under conditions of 130 ° C, 85% relative humidity, and 3.3V DC voltage was applied to an electrochemical migration tester (manufactured by J-RAS). “ECM-100”). This measurement is performed 6 times. In all six test pieces, when the resistance value is 10 7 Ω or more, “◯” is indicated, and when any one is less than 10 7 Ω, “X” is indicated, and the evaluation result and the insulation resistance value are obtained. Are shown in the table below. The insulation resistance values listed in the table below are the minimum insulation resistance values of the six test pieces.
<接触角の測定>
硬化物表面に対する水滴の液滴法による接触角は、自動接触角計(共和界面科学社製DropMaster DMs−401)を用いて測定した。具体的には、純水をシリンジに充填し、1.0μLの水滴を作製し、評価用基板Aの絶縁層表面に付着させた。水滴を付着して2000ms後の接触角を、前記の自動接触角計で測定して、X(°)とした。
<Measurement of contact angle>
The contact angle of the water droplet on the cured product surface by the droplet method was measured using an automatic contact angle meter (DropMaster DMs-401 manufactured by Kyowa Interface Science Co., Ltd.). Specifically, pure water was filled in a syringe to produce 1.0 μL of water droplets, which were attached to the insulating layer surface of the evaluation substrate A. The contact angle after 2000 ms after adhering a water droplet was measured with the above-mentioned automatic contact angle meter, and was taken as X (°).
次いで、上記(4)粗化処理を行う工程と同様の方法にて、評価用基板Aにおける絶縁層の粗化処理を行った。その後、純水をシリンジに充填し、1.0μLの水滴を作製し、評価用基板Aの粗化処理を行った絶縁層表面に付着させた。水滴を付着して2000ms後の接触角を、前記の自動接触角計で測定して、Y(°)とした。X−Yが0以下である場合を「○」とし、X−Yが0を超える場合は「×」とした。また、Yが80°以上である場合を「○」とし、80°未満である場合を「×」とした。 Subsequently, the roughening process of the insulating layer in the evaluation substrate A was performed in the same manner as in the step (4) of performing the roughening process. Thereafter, pure water was filled in a syringe to produce 1.0 μL of water droplets, which were attached to the surface of the insulating layer subjected to the roughening treatment of the evaluation substrate A. The contact angle after 2000 ms after adhering a water droplet was measured with the above-mentioned automatic contact angle meter, and was defined as Y (°). The case where XY was 0 or less was “◯”, and the case where XY exceeded 0 was “x”. Moreover, the case where Y is 80 ° or more is “◯”, and the case where Y is less than 80 ° is “×”.
5 第1の導体層
51 第1の導体層の主面
6 第2の導体層
61 第2の導体層の主面
7 絶縁層
5
Claims (14)
樹脂組成物を100℃で30分間、さらに180℃で30分間熱硬化させて硬化物を得た時に、該硬化物表面を粗化処理する前の硬化物表面の水に対する接触角をX(°)とし、該硬化物表面を粗化処理した後の硬化物表面の水に対する接触角をY(°)としたとき、
X−Y≦0°、かつ、Y≧80°の関係を満たす、樹脂組成物。 (A) an epoxy resin, and (B) a resin composition containing a curing agent,
When a cured product was obtained by thermosetting the resin composition at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes, the contact angle of the cured product surface with water before roughening the surface of the cured product was X (° ), And when the contact angle of water on the surface of the cured product after roughening the surface of the cured product is Y (°),
A resin composition satisfying the relationship of XY ≦ 0 ° and Y ≧ 80 °.
該絶縁層は、請求項1〜9のいずれか1項に記載の樹脂組成物の硬化物である、プリント配線板。 A printed wiring board including a first conductor layer, a second conductor layer, and an insulating layer having a thickness of 6 μm or less formed between the first conductor layer and the second conductor layer,
The printed wiring board, wherein the insulating layer is a cured product of the resin composition according to any one of claims 1 to 9.
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07240117A (en) * | 1994-02-25 | 1995-09-12 | Matsushita Electric Works Ltd | Composite dielectric and its manufacture |
JP2005146234A (en) * | 2003-10-24 | 2005-06-09 | Sekisui Chem Co Ltd | Method for producing resin sheet and resin sheet for insulating substrate |
JP2011140614A (en) * | 2010-01-08 | 2011-07-21 | Samsung Electro-Mechanics Co Ltd | Composition for forming substrate, and prepreg and substrate using the same |
WO2011148857A1 (en) * | 2010-05-27 | 2011-12-01 | 昭和電工株式会社 | Fluorine- and epoxy group-containing copolymer, and method for producing same |
JP2012006390A (en) * | 2010-05-28 | 2012-01-12 | Taiyo Kagaku Kogyo Kk | Screen printing stencil having amorphous carbon film and its manufacturing method |
JP2013023666A (en) * | 2011-07-25 | 2013-02-04 | Sekisui Chem Co Ltd | Epoxy resin material, cured product, and plasma-roughened cured product |
JP2014152309A (en) * | 2013-02-13 | 2014-08-25 | Ajinomoto Co Inc | Resin composition for thin film, thin film, laminated sheet, and multilayer printed wiring board |
WO2016111045A1 (en) * | 2015-01-08 | 2016-07-14 | 株式会社村田製作所 | Piezoelectric vibration component and manufacturing method therefor |
JP2016176065A (en) * | 2015-03-19 | 2016-10-06 | ナガセケムテックス株式会社 | Epoxy resin composition for outdoor electric insulation and member for outdoor electric insulation |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101763975B1 (en) * | 2010-05-07 | 2017-08-01 | 스미토모 베이클리트 컴퍼니 리미티드 | Epoxy resin composition for circuit boards, prepreg, laminate, resin sheet, laminate for printed wiring boards, printed wiring boards, and semiconductor devices |
CN103319853B (en) * | 2012-03-23 | 2016-01-13 | 台光电子材料股份有限公司 | Insulating film resin combination and containing its insulating film, circuit card |
-
2016
- 2016-08-02 JP JP2016152110A patent/JP6766507B2/en active Active
-
2017
- 2017-07-06 TW TW106122714A patent/TWI738815B/en active
- 2017-07-31 KR KR1020170096919A patent/KR102490658B1/en active IP Right Grant
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Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07240117A (en) * | 1994-02-25 | 1995-09-12 | Matsushita Electric Works Ltd | Composite dielectric and its manufacture |
JP2005146234A (en) * | 2003-10-24 | 2005-06-09 | Sekisui Chem Co Ltd | Method for producing resin sheet and resin sheet for insulating substrate |
JP2011140614A (en) * | 2010-01-08 | 2011-07-21 | Samsung Electro-Mechanics Co Ltd | Composition for forming substrate, and prepreg and substrate using the same |
WO2011148857A1 (en) * | 2010-05-27 | 2011-12-01 | 昭和電工株式会社 | Fluorine- and epoxy group-containing copolymer, and method for producing same |
JP2012006390A (en) * | 2010-05-28 | 2012-01-12 | Taiyo Kagaku Kogyo Kk | Screen printing stencil having amorphous carbon film and its manufacturing method |
JP2013023666A (en) * | 2011-07-25 | 2013-02-04 | Sekisui Chem Co Ltd | Epoxy resin material, cured product, and plasma-roughened cured product |
JP2014152309A (en) * | 2013-02-13 | 2014-08-25 | Ajinomoto Co Inc | Resin composition for thin film, thin film, laminated sheet, and multilayer printed wiring board |
WO2016111045A1 (en) * | 2015-01-08 | 2016-07-14 | 株式会社村田製作所 | Piezoelectric vibration component and manufacturing method therefor |
JP2016176065A (en) * | 2015-03-19 | 2016-10-06 | ナガセケムテックス株式会社 | Epoxy resin composition for outdoor electric insulation and member for outdoor electric insulation |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019167269A (en) * | 2018-03-23 | 2019-10-03 | 株式会社アドマテックス | Silica particle material, and production method thereof |
JP7023764B2 (en) | 2018-03-23 | 2022-02-22 | 株式会社アドマテックス | Silica particle material and its manufacturing method |
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