JP2017538471A5 - - Google Patents

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Publication number
JP2017538471A5
JP2017538471A5 JP2017525975A JP2017525975A JP2017538471A5 JP 2017538471 A5 JP2017538471 A5 JP 2017538471A5 JP 2017525975 A JP2017525975 A JP 2017525975A JP 2017525975 A JP2017525975 A JP 2017525975A JP 2017538471 A5 JP2017538471 A5 JP 2017538471A5
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JP
Japan
Prior art keywords
ray
imaging system
grating
detector
line
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JP2017525975A
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English (en)
Japanese (ja)
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JP6688795B2 (ja
JP2017538471A (ja
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Priority claimed from PCT/EP2015/076734 external-priority patent/WO2016083182A1/en
Publication of JP2017538471A publication Critical patent/JP2017538471A/ja
Publication of JP2017538471A5 publication Critical patent/JP2017538471A5/ja
Application granted granted Critical
Publication of JP6688795B2 publication Critical patent/JP6688795B2/ja
Expired - Fee Related legal-status Critical Current
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JP2017525975A 2014-11-24 2015-11-17 Ｘ線位相コントラストトモシンセシス撮像に対する検出器及び撮像システム Expired - Fee Related JP6688795B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14194482 2014-11-24
EP14194482.7 2014-11-24
PCT/EP2015/076734 WO2016083182A1 (en) 2014-11-24 2015-11-17 Detector and imaging system for x-ray phase contrast tomo-synthesis imaging

Publications (3)

Publication Number Publication Date
JP2017538471A JP2017538471A (ja) 2017-12-28
JP2017538471A5 true JP2017538471A5 (https=) 2018-12-06
JP6688795B2 JP6688795B2 (ja) 2020-04-28

Family

ID=52016407

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017525975A Expired - Fee Related JP6688795B2 (ja) 2014-11-24 2015-11-17 Ｘ線位相コントラストトモシンセシス撮像に対する検出器及び撮像システム

Country Status (8)

Country Link
US (1) US10470721B2 (https=)
EP (1) EP3223707A1 (https=)
JP (1) JP6688795B2 (https=)
CN (1) CN106999137B (https=)
BR (1) BR112017010593B1 (https=)
MX (1) MX2017006619A (https=)
RU (1) RU2708816C2 (https=)
WO (1) WO2016083182A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10365235B2 (en) * 2014-12-22 2019-07-30 Shimadzu Corporation Radiation phase-contrast imaging device
CN112218583B (zh) * 2018-03-19 2025-02-21 森瑟实验室有限责任公司 X射线断层摄影术
JP7443331B2 (ja) * 2018-07-30 2024-03-05 センスラボ エルエルシー Ｘ線イメージング及び造影剤のための装置及び方法
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2073040A2 (en) 2007-10-31 2009-06-24 FUJIFILM Corporation Radiation image detector and phase contrast radiation imaging apparatus
JP2010012030A (ja) * 2008-07-03 2010-01-21 Fujifilm Corp 放射線画像撮影装置
CN101413905B (zh) 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
EP2343537B1 (en) * 2008-10-29 2019-04-10 Canon Kabushiki Kaisha X-ray imaging device and x-ray imaging method
JP5759474B2 (ja) 2009-12-10 2015-08-05 コーニンクレッカ フィリップス エヌ ヴェ 移動可能ｘ線検出器要素を有する位相コントラスト画像化装置及び方法
JP2012090945A (ja) * 2010-03-30 2012-05-17 Fujifilm Corp 放射線検出装置、放射線撮影装置、放射線撮影システム
JP2012143550A (ja) 2010-12-20 2012-08-02 Fujifilm Corp 放射線画像撮影装置および放射線画像取得方法
JP2012148068A (ja) * 2010-12-27 2012-08-09 Fujifilm Corp 放射線画像取得方法および放射線画像撮影装置
JP2012200567A (ja) * 2011-03-28 2012-10-22 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
JP2014155509A (ja) * 2011-06-10 2014-08-28 Fujifilm Corp 放射線撮影システム
JP6353361B2 (ja) 2011-07-04 2018-07-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 位相コントラストイメージング装置
WO2013089154A1 (ja) * 2011-12-12 2013-06-20 株式会社 日立メディコ Ｘ線ｃｔ装置
EP2806798B1 (en) * 2012-01-24 2016-11-23 Koninklijke Philips N.V. Multi-directional phase contrast x-ray imaging
JP2013164339A (ja) 2012-02-10 2013-08-22 Canon Inc Ｘ線撮像装置
US20150055743A1 (en) * 2012-02-24 2015-02-26 University Of Massachusetts Medical School Apparatus and method for x-ray phase contrast imaging
CN103365067B (zh) * 2012-04-01 2016-12-28 中国科学院高能物理研究所 可实现三维动态观测的光栅剪切成像装置和方法
JP2014090967A (ja) * 2012-11-06 2014-05-19 Canon Inc Ｘ線撮像装置
JP2014178130A (ja) * 2013-03-13 2014-09-25 Canon Inc Ｘ線撮像装置及びｘ線撮像システム
US9726622B2 (en) * 2013-10-31 2017-08-08 Tohoku University Non-destructive inspection device

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