|
US7643605B2
(en)
*
|
2006-02-27 |
2010-01-05 |
University Of Rochester |
Method and apparatus for cone beam CT dynamic imaging
|
|
US8086010B2
(en)
*
|
2006-06-30 |
2011-12-27 |
Kabushiki Kaisha Toshiba |
Medical image diagnosis apparatus and the control method thereof
|
|
US8411816B2
(en)
|
2007-02-21 |
2013-04-02 |
Konica Minolta Medical & Graphic, Inc. |
Radiological image capturing apparatus and radiological image capturing system
|
|
US7924973B2
(en)
*
|
2007-11-15 |
2011-04-12 |
Csem Centre Suisse D'electronique Et De Microtechnique Sa |
Interferometer device and method
|
|
EP2214558B1
(en)
*
|
2007-11-26 |
2017-08-30 |
Koninklijke Philips N.V. |
Detection setup for x-ray phase contrast imaging
|
|
US8023767B1
(en)
|
2008-03-10 |
2011-09-20 |
University Of Rochester |
Method and apparatus for 3D metal and high-density artifact correction for cone-beam and fan-beam CT imaging
|
|
US8565371B2
(en)
|
2008-03-19 |
2013-10-22 |
Koninklijke Philips N.V. |
Rotational X ray device for phase contrast imaging
|
|
DE102009004702B4
(de)
*
|
2009-01-15 |
2019-01-31 |
Paul Scherer Institut |
Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung
|
|
EP2586374B1
(en)
|
2009-01-21 |
2015-03-18 |
Koninklijke Philips N.V. |
Method and apparatus for large field of view imaging and detection and compensation of motion artifacts
|
|
US7949095B2
(en)
*
|
2009-03-02 |
2011-05-24 |
University Of Rochester |
Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
|
|
WO2010109390A1
(en)
*
|
2009-03-27 |
2010-09-30 |
Koninklijke Philips Electronics N. V. |
Achromatic phase-contrast imaging
|
|
EP2443491B1
(en)
*
|
2009-06-16 |
2020-03-04 |
Koninklijke Philips N.V. |
Tilted gratings and method for production of tilted gratings
|
|
JP5809143B2
(ja)
|
2009-09-08 |
2015-11-10 |
コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． |
Ｘ線装置
|
|
WO2011070519A1
(en)
*
|
2009-12-10 |
2011-06-16 |
Koninklijke Philips Electronics N.V. |
Scanning system for differential phase contrast imaging
|
|
WO2011070488A1
(en)
*
|
2009-12-10 |
2011-06-16 |
Koninklijke Philips Electronics N.V. |
Phase contrast imaging
|
|
WO2011114845A1
(ja)
*
|
2010-03-18 |
2011-09-22 |
コニカミノルタエムジー株式会社 |
Ｘ線撮影システム
|
|
DE102010019991A1
(de)
*
|
2010-05-10 |
2011-11-10 |
Siemens Aktiengesellschaft |
Computertomographiesystem
|
|
JP2012095865A
(ja)
*
|
2010-11-02 |
2012-05-24 |
Fujifilm Corp |
放射線撮影装置、放射線撮影システム
|
|
KR20140039151A
(ko)
*
|
2011-01-06 |
2014-04-01 |
더 리전트 오브 더 유니버시티 오브 캘리포니아 |
무렌즈 단층 촬영 이미징 장치들 및 방법들
|
|
DE102011082878A1
(de)
*
|
2011-09-16 |
2013-03-21 |
Siemens Aktiengesellschaft |
Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung
|
|
US20150117599A1
(en)
*
|
2013-10-31 |
2015-04-30 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
EP2806798B1
(en)
*
|
2012-01-24 |
2016-11-23 |
Koninklijke Philips N.V. |
Multi-directional phase contrast x-ray imaging
|
|
WO2014137318A1
(en)
*
|
2012-03-05 |
2014-09-12 |
University Of Rochester |
Methods and apparatus for differential phase-contrast cone-beam ct and hybrid cone-beam ct
|
|
DE102012204276A1
(de)
*
|
2012-03-19 |
2013-09-19 |
Siemens Aktiengesellschaft |
Bildaufnahmeeinrichtung
|
|
DE102012005767A1
(de)
|
2012-03-25 |
2013-09-26 |
DüRR DENTAL AG |
Phasenkontrast-Röntgen-Tomographiegerät
|
|
KR101378757B1
(ko)
*
|
2012-08-30 |
2014-03-27 |
한국원자력연구원 |
물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치
|
|
TWI488612B
(zh)
*
|
2012-11-20 |
2015-06-21 |
Iner Aec Executive Yuan |
Ｘ光投影成像裝置
|
|
US8989347B2
(en)
|
2012-12-19 |
2015-03-24 |
General Electric Company |
Image reconstruction method for differential phase contrast X-ray imaging
|
|
US9014333B2
(en)
*
|
2012-12-31 |
2015-04-21 |
General Electric Company |
Image reconstruction methods for differential phase contrast X-ray imaging
|
|
US9364191B2
(en)
|
2013-02-11 |
2016-06-14 |
University Of Rochester |
Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT
|
|
DE102013205406A1
(de)
*
|
2013-03-27 |
2014-10-16 |
Siemens Aktiengesellschaft |
Röntgenaufnahmesystem zur Röntgenbildgebung bei hohen Bildfrequenzen eines Untersuchungsobjekts mittels direkter Messung des Interferenzmusters
|
|
DE102013213244A1
(de)
*
|
2013-07-05 |
2015-01-08 |
Siemens Aktiengesellschaft |
Röntgenaufnahmesystem zur hochaufgelösten differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts
|
|
KR102139661B1
(ko)
*
|
2013-07-12 |
2020-07-30 |
삼성전자주식회사 |
회전 가능한 시준기를 구비한 ct 시스템
|
|
US10416099B2
(en)
|
2013-09-19 |
2019-09-17 |
Sigray, Inc. |
Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
|
|
US10269528B2
(en)
|
2013-09-19 |
2019-04-23 |
Sigray, Inc. |
Diverging X-ray sources using linear accumulation
|
|
US10297359B2
(en)
|
2013-09-19 |
2019-05-21 |
Sigray, Inc. |
X-ray illumination system with multiple target microstructures
|
|
US10295485B2
(en)
|
2013-12-05 |
2019-05-21 |
Sigray, Inc. |
X-ray transmission spectrometer system
|
|
CN104837409B
(zh)
*
|
2013-09-30 |
2019-08-13 |
皇家飞利浦有限公司 |
具有可移动光栅的微分相位衬度成像装置
|
|
US10304580B2
(en)
|
2013-10-31 |
2019-05-28 |
Sigray, Inc. |
Talbot X-ray microscope
|
|
USRE48612E1
(en)
|
2013-10-31 |
2021-06-29 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
US10265042B2
(en)
|
2014-01-27 |
2019-04-23 |
Epica International, Inc. |
Radiological imaging device with improved functioning
|
|
WO2015112424A1
(en)
*
|
2014-01-27 |
2015-07-30 |
Epica International, Inc. |
Radiological imaging device with improved functioning
|
|
JP2015166676A
(ja)
*
|
2014-03-03 |
2015-09-24 |
キヤノン株式会社 |
Ｘ線撮像システム
|
|
DE102014203811B4
(de)
|
2014-03-03 |
2019-07-11 |
Siemens Healthcare Gmbh |
Ergänzungssystem zur interferometrischen Röntgenbildgebung und projektive Röntgenvorrichtung
|
|
US10401309B2
(en)
|
2014-05-15 |
2019-09-03 |
Sigray, Inc. |
X-ray techniques using structured illumination
|
|
WO2015193761A1
(en)
*
|
2014-06-16 |
2015-12-23 |
Koninklijke Philips N.V. |
Computed tomography (ct) hybrid data acquisition
|
|
DE102014213817A1
(de)
*
|
2014-07-16 |
2015-06-18 |
Siemens Aktiengesellschaft |
Vorrichtung und Verfahren zur Gewinnung eines Phasenkontrastbildes
|
|
US10352880B2
(en)
|
2015-04-29 |
2019-07-16 |
Sigray, Inc. |
Method and apparatus for x-ray microscopy
|
|
WO2016177903A1
(en)
*
|
2015-05-07 |
2016-11-10 |
Koninklijke Philips N.V. |
Beam hardening correction for scanning dark field and phase contrast imaging
|
|
WO2017001294A1
(en)
|
2015-06-30 |
2017-01-05 |
Koninklijke Philips N.V. |
Scanning x-ray apparatus with full-field detector
|
|
US10295486B2
(en)
|
2015-08-18 |
2019-05-21 |
Sigray, Inc. |
Detector for X-rays with high spatial and high spectral resolution
|
|
US10660595B2
(en)
|
2016-06-16 |
2020-05-26 |
Koninklijke Philips N.V. |
Apparatus for x-ray imaging an object
|
|
EP3538879B1
(en)
*
|
2016-11-10 |
2022-06-01 |
Koninklijke Philips N.V. |
Grating-based phase contrast imaging
|
|
US10247683B2
(en)
|
2016-12-03 |
2019-04-02 |
Sigray, Inc. |
Material measurement techniques using multiple X-ray micro-beams
|
|
US11026643B2
(en)
|
2016-12-06 |
2021-06-08 |
Koninklijke Philips N.V. |
Interferometer grating support for grating-based x-ray imaging and/or a support bracket therefor
|
|
WO2018104469A1
(en)
|
2016-12-09 |
2018-06-14 |
Koninklijke Philips N.V. |
Projection data acquisition apparatus and subject support device
|
|
CN110192123B
(zh)
*
|
2017-01-23 |
2023-11-10 |
深圳帧观德芯科技有限公司 |
能识别和管理电荷共享的x射线检测器
|
|
US10578566B2
(en)
|
2018-04-03 |
2020-03-03 |
Sigray, Inc. |
X-ray emission spectrometer system
|
|
US10845491B2
(en)
|
2018-06-04 |
2020-11-24 |
Sigray, Inc. |
Energy-resolving x-ray detection system
|
|
GB2591630B
(en)
|
2018-07-26 |
2023-05-24 |
Sigray Inc |
High brightness x-ray reflection source
|
|
US10656105B2
(en)
|
2018-08-06 |
2020-05-19 |
Sigray, Inc. |
Talbot-lau x-ray source and interferometric system
|
|
WO2020051061A1
(en)
|
2018-09-04 |
2020-03-12 |
Sigray, Inc. |
System and method for x-ray fluorescence with filtering
|
|
WO2020051221A2
(en)
|
2018-09-07 |
2020-03-12 |
Sigray, Inc. |
System and method for depth-selectable x-ray analysis
|
|
CN110200652B
(zh)
*
|
2019-05-30 |
2022-11-29 |
东软医疗系统股份有限公司 |
一种医疗设备
|
|
DE112020004169T5
(de)
|
2019-09-03 |
2022-05-25 |
Sigray, Inc. |
System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
|
|
US11175243B1
(en)
|
2020-02-06 |
2021-11-16 |
Sigray, Inc. |
X-ray dark-field in-line inspection for semiconductor samples
|
|
JP7395775B2
(ja)
|
2020-05-18 |
2023-12-11 |
シグレイ、インコーポレイテッド |
結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法
|
|
EP3967231A1
(en)
|
2020-09-10 |
2022-03-16 |
Koninklijke Philips N.V. |
Mixed-use conventional and grating-based imaging
|
|
WO2022061347A1
(en)
|
2020-09-17 |
2022-03-24 |
Sigray, Inc. |
System and method using x-rays for depth-resolving metrology and analysis
|
|
US12480892B2
(en)
|
2020-12-07 |
2025-11-25 |
Sigray, Inc. |
High throughput 3D x-ray imaging system using a transmission x-ray source
|
|
KR20260030946A
(ko)
|
2020-12-07 |
2026-03-06 |
시그레이, 아이엔씨. |
투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
|
|
WO2023168204A1
(en)
|
2022-03-02 |
2023-09-07 |
Sigray, Inc. |
X-ray fluorescence system and x-ray source with electrically insulative target material
|
|
WO2023177981A1
(en)
|
2022-03-15 |
2023-09-21 |
Sigray, Inc. |
System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
|
|
CN119173759A
(zh)
|
2022-05-02 |
2024-12-20 |
斯格瑞公司 |
X射线顺序阵列波长色散光谱仪
|
|
CN121013975A
(zh)
|
2023-02-16 |
2025-11-25 |
斯格瑞公司 |
具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
|
|
US12181423B1
(en)
|
2023-09-07 |
2024-12-31 |
Sigray, Inc. |
Secondary image removal using high resolution x-ray transmission sources
|
|
US12429437B2
(en)
|
2023-11-07 |
2025-09-30 |
Sigray, Inc. |
System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
|
|
CN120189140A
(zh)
*
|
2023-12-21 |
2025-06-24 |
清华大学 |
辐射成像设备、ct成像设备及其方法
|
|
US12429436B2
(en)
|
2024-01-08 |
2025-09-30 |
Sigray, Inc. |
X-ray analysis system with focused x-ray beam and non-x-ray microscope
|
|
WO2025155719A1
(en)
|
2024-01-18 |
2025-07-24 |
Sigray, Inc. |
Sequential array of x-ray imaging detectors
|
|
WO2025174966A1
(en)
|
2024-02-15 |
2025-08-21 |
Sigray, Inc. |
System and method for generating a focused x‑ray beam
|