JP2017536879A5 - - Google Patents
Info
- Publication number
- JP2017536879A5 JP2017536879A5 JP2017523461A JP2017523461A JP2017536879A5 JP 2017536879 A5 JP2017536879 A5 JP 2017536879A5 JP 2017523461 A JP2017523461 A JP 2017523461A JP 2017523461 A JP2017523461 A JP 2017523461A JP 2017536879 A5 JP2017536879 A5 JP 2017536879A5
- Authority
- JP
- Japan
- Prior art keywords
- grating
- ray
- source
- cone angle
- pitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP14192623.8 | 2014-11-11 | ||
| EP14192623 | 2014-11-11 | ||
| PCT/EP2015/076213 WO2016075140A1 (en) | 2014-11-11 | 2015-11-10 | Source-detector arrangement |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017536879A JP2017536879A (ja) | 2017-12-14 |
| JP2017536879A5 true JP2017536879A5 (enExample) | 2022-08-31 |
| JP7171190B2 JP7171190B2 (ja) | 2022-11-15 |
Family
ID=51945717
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017523461A Active JP7171190B2 (ja) | 2014-11-11 | 2015-11-10 | 線源－検出器装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10485492B2 (enExample) |
| EP (1) | EP3217879B1 (enExample) |
| JP (1) | JP7171190B2 (enExample) |
| CN (1) | CN106999125B (enExample) |
| WO (1) | WO2016075140A1 (enExample) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10357222B2 (en) * | 2014-12-26 | 2019-07-23 | Hitachi, Ltd. | X-ray diagnostic imaging apparatus, monitoring server and anomaly detection method |
| US9561206B2 (en) * | 2015-01-07 | 2017-02-07 | The United States Of America, As Represented By The Secretary Of The Navy | Use of heptadecanoic acid (C17:0) to detect risk of and treat hyperferritinemia and metabolic syndrome |
| HK1256971A1 (zh) | 2015-09-28 | 2019-10-04 | 博莱佳私人有限公司 | 空间分析测量系统和方法 |
| US10835193B2 (en) * | 2016-09-08 | 2020-11-17 | Koninklijke Philips N.V. | Source grating for X-ray imaging |
| DE102016217509A1 (de) * | 2016-09-14 | 2018-03-15 | Siemens Healthcare Gmbh | Verfahren und Röntgenvorrichtung zur Erzeugung einer projektiven Röntgendarstellung eines Untersuchungsobjektes |
| CA3044075A1 (en) * | 2016-11-16 | 2018-05-24 | Baraja Pty Ltd | An optical beam director |
| US11039807B2 (en) * | 2016-12-19 | 2021-06-22 | Koninklijke Philips N.V. | System and method for dark-field-imaging |
| US10872708B2 (en) * | 2017-07-24 | 2020-12-22 | Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College | Phase contrast X-ray interferometry |
| EP3446630A1 (en) | 2017-08-23 | 2019-02-27 | Koninklijke Philips N.V. | Device and method for phase stepping in phase contrast image acquisition |
| KR102701244B1 (ko) | 2017-10-23 | 2024-09-02 | 에피트래커, 인코포레이티드 | 지방산 유사체 및 대사 증후군 관련 병태 치료에서의 그의 용도 |
| EP3502674A1 (en) * | 2017-12-19 | 2019-06-26 | Koninklijke Philips N.V. | Testing of curved x-ray gratings |
| CN110868932B (zh) * | 2017-12-25 | 2024-02-09 | 株式会社岛津制作所 | 放射线相位差摄影装置 |
| AU2019274431B2 (en) | 2018-05-23 | 2025-03-13 | Epitracker, Inc. | Compositions and methods for diagnosis and treatment of conditions related to the quality of aging and longevity |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
| DE112019004478T5 (de) | 2018-09-07 | 2021-07-08 | Sigray, Inc. | System und verfahren zur röntgenanalyse mit wählbarer tiefe |
| TWI682160B (zh) * | 2018-12-11 | 2020-01-11 | 國立交通大學 | 生物訊號分析元件、生物感測裝置、感測方法以及生物訊號分析元件的製作方法 |
| EP3908374A4 (en) | 2019-01-09 | 2022-12-28 | Epitracker, Inc. | COMPOSITIONS AND METHODS FOR DIAGNOSIS AND TREATMENT OF NEURODEGENERATIVE DISEASES |
| JP7404382B2 (ja) | 2019-03-04 | 2023-12-25 | エピトラッカー インコーポレイテッド | 脂肪酸アナログ、ならびに認知機能障害、行動症状および慢性疼痛の処置におけるそれらの使用 |
| US11143605B2 (en) | 2019-09-03 | 2021-10-12 | Sigray, Inc. | System and method for computed laminography x-ray fluorescence imaging |
| CN110664420B (zh) * | 2019-10-11 | 2023-04-07 | 上海联影医疗科技股份有限公司 | 焦点校正方法、装置、计算机设备和计算机可读存储介质 |
| JP7705852B2 (ja) * | 2019-10-24 | 2025-07-10 | ノヴァ メジャリング インスツルメンツ インコーポレイテッド | パターン化ｘ線放出ターゲット |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| EP3925539A1 (en) | 2020-06-19 | 2021-12-22 | Koninklijke Philips N.V. | X-ray imaging system |
| JP7640682B2 (ja) | 2020-09-17 | 2025-03-05 | シグレイ、インコーポレイテッド | Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法 |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| KR102927910B1 (ko) | 2020-12-07 | 2026-02-19 | 시그레이, 아이엔씨. | 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템 |
| EP4426130A1 (en) | 2021-11-03 | 2024-09-11 | Epitracker, Inc. | Pentadecanoylcarnitine for treatment of conditions related to the quality of aging and longevity |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| DE112023001408T5 (de) | 2022-03-15 | 2025-02-13 | Sigray, Inc. | System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung |
| DE112023002079T5 (de) | 2022-05-02 | 2025-02-27 | Sigray, Inc. | Sequenzielles wellenlängendispersives röntgenspektrometer |
| WO2024173256A1 (en) | 2023-02-16 | 2024-08-22 | Sigray, Inc. | X-ray detector system with at least two stacked flat bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| WO2025101530A1 (en) | 2023-11-07 | 2025-05-15 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| WO2025151383A1 (en) | 2024-01-08 | 2025-07-17 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10127269B4 (de) * | 2001-06-05 | 2015-09-24 | Siemens Aktiengesellschaft | Verfahren für die Computertomographie sowie Computertomographie (CT)-Gerät |
| WO2007074029A1 (de) | 2005-12-27 | 2007-07-05 | Siemens Aktiengesellschaft | Fokus- detektor- anordnung zur erzeugung von phasenkontrast-röntgenaufnahmen und verfahren hierzu |
| DE102006037256B4 (de) | 2006-02-01 | 2017-03-30 | Paul Scherer Institut | Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen sowie Röntgensystem, Röntgen-C-Bogen-System und Röntgen-CT-System |
| DE102006063048B3 (de) | 2006-02-01 | 2018-03-29 | Siemens Healthcare Gmbh | Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen |
| DE102006037254B4 (de) * | 2006-02-01 | 2017-08-03 | Paul Scherer Institut | Fokus-Detektor-Anordnung zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen mit röntgenoptischen Gittern, sowie Röntgen-System, Röntgen-C-Bogen-System und Röntgen-Computer-Tomographie-System |
| JP2009133823A (ja) | 2007-10-31 | 2009-06-18 | Fujifilm Corp | 放射線画像検出器および放射線位相画像撮影装置 |
| EP2073040A2 (en) * | 2007-10-31 | 2009-06-24 | FUJIFILM Corporation | Radiation image detector and phase contrast radiation imaging apparatus |
| JP5461438B2 (ja) * | 2008-02-14 | 2014-04-02 | コーニンクレッカ フィリップス エヌ ヴェ | 位相コントラストイメージング用のｘ線検出器 |
| US8401144B2 (en) * | 2008-08-07 | 2013-03-19 | Koninklijke Philips Electronics N.V. | Method and apparatus for correcting artifacts in circular CT scans |
| DE102008048688B4 (de) * | 2008-09-24 | 2011-08-25 | Paul Scherrer Institut | Röntgen-CT-System zur Erzeugung tomographischer Phasenkontrast- oder Dunkelfeldaufnahmen |
| CN101413905B (zh) * | 2008-10-10 | 2011-03-16 | 深圳大学 | X射线微分干涉相衬成像系统 |
| RU2529497C2 (ru) * | 2008-12-08 | 2014-09-27 | Конинклейке Филипс Электроникс Н.В. | Компенсация колебаний анода в рентгеновских трубках с вращающимся анодом |
| DE102009004702B4 (de) * | 2009-01-15 | 2019-01-31 | Paul Scherer Institut | Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung |
| US7949095B2 (en) * | 2009-03-02 | 2011-05-24 | University Of Rochester | Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT |
| WO2010150136A1 (en) | 2009-06-22 | 2010-12-29 | Koninklijke Philips Electronics N. V. | Grating-based phase contrast x-ray imaging apparatus and methods |
| CN102651998B (zh) | 2009-12-10 | 2015-08-05 | 皇家飞利浦电子股份有限公司 | 用于微分相衬成像的扫描系统 |
| US9031201B2 (en) | 2010-07-05 | 2015-05-12 | Canon Kabushiki Kaisha | X-ray source, X-ray imaging apparatus, and X-ray computed tomography imaging system |
| JP2012143553A (ja) | 2010-12-24 | 2012-08-02 | Fujifilm Corp | 放射線画像撮影装置および放射線画像検出器 |
| JP5804843B2 (ja) * | 2011-08-22 | 2015-11-04 | キヤノン株式会社 | Ｘ線撮像装置 |
| US9001967B2 (en) | 2012-12-28 | 2015-04-07 | Carestream Health, Inc. | Spectral grating-based differential phase contrast system for medical radiographic imaging |
| EP2956954B1 (en) | 2013-02-13 | 2017-03-15 | Koninklijke Philips N.V. | Multiple x-ray beam tube |
| EP2978377B1 (en) | 2013-03-26 | 2021-05-05 | Institute of Experimental and Applied Physics | Method of phase gradient radiography and arrangement of an imaging system for application of the method |
| DE102013214393A1 (de) * | 2013-07-23 | 2014-11-20 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping |
-
2015
- 2015-11-10 JP JP2017523461A patent/JP7171190B2/ja active Active
- 2015-11-10 EP EP15791642.0A patent/EP3217879B1/en active Active
- 2015-11-10 WO PCT/EP2015/076213 patent/WO2016075140A1/en not_active Ceased
- 2015-11-10 CN CN201580060997.2A patent/CN106999125B/zh active Active
- 2015-11-10 US US15/524,112 patent/US10485492B2/en active Active
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