JP2017228009A5 - - Google Patents

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Publication number
JP2017228009A5
JP2017228009A5 JP2016122286A JP2016122286A JP2017228009A5 JP 2017228009 A5 JP2017228009 A5 JP 2017228009A5 JP 2016122286 A JP2016122286 A JP 2016122286A JP 2016122286 A JP2016122286 A JP 2016122286A JP 2017228009 A5 JP2017228009 A5 JP 2017228009A5
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Japan
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information
measuring
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JP2016122286A
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English (en)
Japanese (ja)
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JP2017228009A (ja
JP6767786B2 (ja
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Priority claimed from JP2016122286A external-priority patent/JP6767786B2/ja
Priority to PCT/JP2017/022583 priority patent/WO2017221902A1/ja
Publication of JP2017228009A publication Critical patent/JP2017228009A/ja
Publication of JP2017228009A5 publication Critical patent/JP2017228009A5/ja
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JP2016122286A 2016-06-21 2016-06-21 測定支援システム及び測定支援方法 Active JP6767786B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016122286A JP6767786B2 (ja) 2016-06-21 2016-06-21 測定支援システム及び測定支援方法
PCT/JP2017/022583 WO2017221902A1 (ja) 2016-06-21 2017-06-19 測定支援システム及び測定支援方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016122286A JP6767786B2 (ja) 2016-06-21 2016-06-21 測定支援システム及び測定支援方法

Publications (3)

Publication Number Publication Date
JP2017228009A JP2017228009A (ja) 2017-12-28
JP2017228009A5 true JP2017228009A5 (enExample) 2019-06-27
JP6767786B2 JP6767786B2 (ja) 2020-10-14

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ID=60784527

Family Applications (1)

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JP2016122286A Active JP6767786B2 (ja) 2016-06-21 2016-06-21 測定支援システム及び測定支援方法

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JP (1) JP6767786B2 (enExample)
WO (1) WO2017221902A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6830167B1 (ja) * 2020-01-29 2021-02-17 レノボ・シンガポール・プライベート・リミテッド 検査支援装置、検査支援システム、及び検査支援方法
JP2024039590A (ja) 2022-09-09 2024-03-22 Dmg森精機株式会社 携帯端末および計測管理プログラム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2674868B2 (ja) * 1990-06-30 1997-11-12 株式会社ミツトヨ 測定支援装置
JPH07334781A (ja) * 1994-06-06 1995-12-22 Hitachi Ltd 測定指示システム
JP3796454B2 (ja) * 2001-02-20 2006-07-12 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP2004227483A (ja) * 2003-01-27 2004-08-12 Seiko Epson Corp 計測器管理装置、計測器管理システム及び製造支援システム
JP2008027342A (ja) * 2006-07-25 2008-02-07 Incs Inc 金型部品の測定点自動作成表示装置
JP5100249B2 (ja) * 2006-08-23 2012-12-19 キヤノン株式会社 情報処理方法、情報処理装置およびプログラム
JP5066165B2 (ja) * 2009-12-07 2012-11-07 株式会社日立製作所 検査データ管理装置

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