JP2016517630A - 選択的にドープされた導電性酸化物層を有する太陽電池およびそれを作製する方法 - Google Patents
選択的にドープされた導電性酸化物層を有する太陽電池およびそれを作製する方法 Download PDFInfo
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- JP2016517630A JP2016517630A JP2016500963A JP2016500963A JP2016517630A JP 2016517630 A JP2016517630 A JP 2016517630A JP 2016500963 A JP2016500963 A JP 2016500963A JP 2016500963 A JP2016500963 A JP 2016500963A JP 2016517630 A JP2016517630 A JP 2016517630A
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- oxide layer
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 5
- 238000000576 coating method Methods 0.000 claims abstract description 186
- 239000011248 coating agent Substances 0.000 claims abstract description 185
- 239000000463 material Substances 0.000 claims abstract description 86
- 239000002243 precursor Substances 0.000 claims abstract description 76
- 239000002019 doping agent Substances 0.000 claims abstract description 63
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 238000005229 chemical vapour deposition Methods 0.000 claims abstract description 22
- 239000010410 layer Substances 0.000 claims description 110
- 229910052731 fluorine Inorganic materials 0.000 claims description 33
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims description 29
- 239000011737 fluorine Substances 0.000 claims description 29
- 229910052718 tin Inorganic materials 0.000 claims description 20
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 20
- 229910001887 tin oxide Inorganic materials 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 16
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- 239000011247 coating layer Substances 0.000 claims description 10
- 229910052725 zinc Inorganic materials 0.000 claims description 10
- 239000008199 coating composition Substances 0.000 claims description 9
- 229910052738 indium Inorganic materials 0.000 claims description 9
- 229910052719 titanium Inorganic materials 0.000 claims description 8
- 229910052787 antimony Inorganic materials 0.000 claims description 7
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- 229910052742 iron Inorganic materials 0.000 claims description 6
- 229910052726 zirconium Inorganic materials 0.000 claims description 6
- 229910052684 Cerium Inorganic materials 0.000 claims description 5
- 229910045601 alloy Inorganic materials 0.000 claims description 5
- 239000000956 alloy Substances 0.000 claims description 5
- 229910052797 bismuth Inorganic materials 0.000 claims description 5
- 229910052804 chromium Inorganic materials 0.000 claims description 5
- 229910052735 hafnium Inorganic materials 0.000 claims description 5
- 229910052748 manganese Inorganic materials 0.000 claims description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 4
- 229910052698 phosphorus Inorganic materials 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 3
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims description 2
- LCUOIYYHNRBAFS-UHFFFAOYSA-N copper;sulfanylideneindium Chemical compound [Cu].[In]=S LCUOIYYHNRBAFS-UHFFFAOYSA-N 0.000 claims description 2
- AKUCEXGLFUSJCD-UHFFFAOYSA-N indium(3+);selenium(2-) Chemical compound [Se-2].[Se-2].[Se-2].[In+3].[In+3] AKUCEXGLFUSJCD-UHFFFAOYSA-N 0.000 claims description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 2
- 239000011521 glass Substances 0.000 description 36
- DTQVDTLACAAQTR-UHFFFAOYSA-N Trifluoroacetic acid Chemical compound OC(=O)C(F)(F)F DTQVDTLACAAQTR-UHFFFAOYSA-N 0.000 description 34
- 239000011135 tin Substances 0.000 description 24
- 230000005540 biological transmission Effects 0.000 description 15
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 14
- 239000000203 mixture Substances 0.000 description 14
- 229910052751 metal Inorganic materials 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 8
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- 229910052760 oxygen Inorganic materials 0.000 description 8
- YMLFYGFCXGNERH-UHFFFAOYSA-K butyltin trichloride Chemical compound CCCC[Sn](Cl)(Cl)Cl YMLFYGFCXGNERH-UHFFFAOYSA-K 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
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- 238000000149 argon plasma sintering Methods 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- 230000005855 radiation Effects 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000010408 film Substances 0.000 description 4
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 238000006124 Pilkington process Methods 0.000 description 3
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- 238000007796 conventional method Methods 0.000 description 3
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- 229910052721 tungsten Inorganic materials 0.000 description 3
- BNEMLSQAJOPTGK-UHFFFAOYSA-N zinc;dioxido(oxo)tin Chemical compound [Zn+2].[O-][Sn]([O-])=O BNEMLSQAJOPTGK-UHFFFAOYSA-N 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
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- 229910052715 tantalum Inorganic materials 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-L terephthalate(2-) Chemical compound [O-]C(=O)C1=CC=C(C([O-])=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-L 0.000 description 2
- MCULRUJILOGHCJ-UHFFFAOYSA-N triisobutylaluminium Chemical compound CC(C)C[Al](CC(C)C)CC(C)C MCULRUJILOGHCJ-UHFFFAOYSA-N 0.000 description 2
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- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 1
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- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
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- 238000009792 diffusion process Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
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- 239000011133 lead Substances 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 150000002734 metacrylic acid derivatives Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- INFDPOAKFNIJBF-UHFFFAOYSA-N paraquat Chemical compound C1=C[N+](C)=CC=C1C1=CC=[N+](C)C=C1 INFDPOAKFNIJBF-UHFFFAOYSA-N 0.000 description 1
- 229910001392 phosphorus oxide Inorganic materials 0.000 description 1
- LFGREXWGYUGZLY-UHFFFAOYSA-N phosphoryl Chemical class [P]=O LFGREXWGYUGZLY-UHFFFAOYSA-N 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
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- 229910001415 sodium ion Inorganic materials 0.000 description 1
- HUAUNKAZQWMVFY-UHFFFAOYSA-M sodium;oxocalcium;hydroxide Chemical compound [OH-].[Na+].[Ca]=O HUAUNKAZQWMVFY-UHFFFAOYSA-M 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000005118 spray pyrolysis Methods 0.000 description 1
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- WROMPOXWARCANT-UHFFFAOYSA-N tfa trifluoroacetic acid Chemical compound OC(=O)C(F)(F)F.OC(=O)C(F)(F)F WROMPOXWARCANT-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- NXHILIPIEUBEPD-UHFFFAOYSA-H tungsten hexafluoride Chemical compound F[W](F)(F)(F)(F)F NXHILIPIEUBEPD-UHFFFAOYSA-H 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0321—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 characterised by the doping material
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- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
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- C03C17/3618—Coatings of type glass/inorganic compound/other inorganic layers, at least one layer being metallic
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- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
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- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
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- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
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- C03C17/3602—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
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- C23C16/40—Oxides
- C23C16/407—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45595—Atmospheric CVD gas inlets with no enclosed reaction chamber
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1884—Manufacture of transparent electrodes, e.g. TCO, ITO
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2217/00—Coatings on glass
- C03C2217/90—Other aspects of coatings
- C03C2217/91—Coatings containing at least one layer having a composition gradient through its thickness
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2217/00—Coatings on glass
- C03C2217/90—Other aspects of coatings
- C03C2217/94—Transparent conductive oxide layers [TCO] being part of a multilayer coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
Description
本出願は、2013年3月12日に提出された米国仮特許出願第61/777,316号明細書に対する優先権を主張し、その全体が参照により本明細書に組み込まれている。
しかしながら、本発明は、様々な代替的な向きをとることができ、したがって、そのような用語は限定として考えられるべきではないことを理解されたい。さらに、本明細書において使用される場合、本明細書および特許請求の範囲に使用されている寸法、物理的特性、処理パラメータ、成分の量、反応条件などを表すすべての数は、すべての事例において用語「約」によって修飾されていることを理解されたい。したがって、特に明記しない限り、以下の本明細書および特許請求の範囲内に記載されている数値は、本発明によって得ようとする所望の特性に応じて変化してもよい。最低限でも、また特許請求項の範囲への均等物の原則の適用を制限しようとするものではなく、各数値は少なくとも、報告されている有効桁の数に照らして、また通常の丸め技法を適用することによって解釈されるべきである。その上、本明細書において開示されているすべての範囲は、始まりおよび終わりの範囲値ならびにその中に含まれるあらゆる部分範囲を包含することを理解されたい。例えば、「1〜10」と記載されている範囲は、最小値1と最大値10との間の(それらの数値を含む)あらゆる部分範囲、すなわち、最小値1以上で始まり、最大値10以下で終わるすべての部分範囲、例えば、1〜3.3、4.7〜7.5、5.5〜10などを含むと考えられるべきである。さらに、本明細書において使用される場合、「の上に形成される」、「の上に堆積させる」、「の上に設けられる」、または「の上に配置される」という用語は、表面上に形成される、堆積させる、設けられる、または配置されることを意味するが、必ずしも表面に直接接触しているとは限らない。例えば、基板「の上に形成される」コーティング層は、形成されるコーティング層と基板との間に配置される同じまたは異なる組成の1つまたは複数の他のコーティング層またはフィルムが存在することを除外するものではない。本明細書において使用される場合、「ポリマー」または「ポリマーの」という用語は、オリゴマー、ホモポリマー、共重合体、およびターポリマー、例えば、2つ以上のタイプのモノマーまたはポリマーから形成されるポリマーを含む。「可視領域」または[可視光]という用語は、380nm〜760nmの範囲内の波長を有する電磁放射を指す。「赤外線領域」または[赤外線放射]という用語は、760nm超〜100,000nmの範囲内の波長を有する電磁放射を指す。「紫外線領域」または「紫外線放射」という用語は、200nm〜380nm未満の範囲内の波長を有する電磁エネルギーを意味する。「マイクロ波領域」または「マイクロ波放射」という用語は、300メガヘルツ〜300ギガヘルツの範囲内の周波数を有する電磁放射を指す。加えて、本明細書において参照される交付済み特許および特許出願など、これらに限定されないすべての文献は、それらの全体が「参照により組み込まれている」と考えられるべきである。以下の説明において、屈折率値は、550ナノメートル(nm)の参照波長に関するものである。「フィルム」という用語は、所望のまたは選択される組成を有するコーティングの領域を指す。「層」は、1つまたは複数の「フィルム」を含む。「コーティング」または「コーティングスタック」は、1つまたは複数の「層」から構成される。
代替的に、第1の基板12は、半透明であってもよい。「半透明」とは、電磁エネルギー(例えば、可視光)が通過することを許容するが、観察者の反対側にある物体が明瞭に見えないようにこのエネルギーを拡散することを意味する。適切な材料の例としては、プラスチック基板(ポリアクリレートなどのアクリルポリマー;ポリメチルメタクリレート、ポリエチルメタクリレート、ポリプロピルメタクリレートなどのポリアルキルメタクリレート;ポリウレタン;ポリカーボネート;ポリエチレンテレフタレート(PET)、ポリプロピレンテレフタレート、ポリブチレンテレフタレートなどのポリアルキルテレフタレート;ポリシロキサン含有ポリマー;もしくはこれらを調製するための任意のモノマーの共重合体;またはそれらの任意の混合物など);ガラス基板;または上記のいずれかの混合物もしくは組合せが挙げられるが、これらに限定されない。例えば、第1の基板12は、従来のソーダ石灰ケイ酸塩ガラス、ホウケイ酸ガラス、または鉛枠ガラスを含んでもよい。ガラスは透明ガラスであってもよい。「透明ガラス」とは、着色されていないまたは無色のガラスを意味する。代替的に、ガラスは、着色されたまたは他の様態で有色のガラスであってもよい。ガラスは焼きなましまたは熱処理されたガラスであってもよい。本明細書において使用される場合、「熱処理された」という用語は、焼き戻しまたは少なくとも部分的に焼き戻しされていることを意味する。ガラスは、従来のフロートガラスなどの任意のタイプのものであってもよく、任意の光学的特性、例えば、任意の値の可視光透過率、紫外線透過率、赤外線透過率、および/または全太陽エネルギー透過率を有する任意の組成のものであってもよい。「フロートガラス」とは、溶融スズなどの溶融金属浴上に溶融ガラスを堆積させる従来のフロート工程によって形成されるガラスを意味する。ガラスの底面、すなわち、溶融スズ浴と接触した面は、「スズ面」と従来称され、ガラスの上面は「空気面」と従来称されている。ガラスのスズ面は、ガラス表面内に組み込まれている小量のスズを有し得る。本発明の実践に使用することができるガラスの非限定例として、Solargreen(登録商標)、Solextra(登録商標)、GL−20(登録商標)、GL−35(商標)、Solarbronze(登録商標)、Starphire(登録商標)、Solarphire(登録商標)、Solarphire PV(登録商標)およびSolargray(登録商標)ガラスが挙げられ、これらはすべて、ペンシルヴァニア州ピッツバーグのPPG Industries Inc.から市販されている。
本発明の好適な一実践において、また図2に示されているように、従来のフロートガラス工程の溶融金属(スズ)スズ浴52内に位置付けられたCVDコーティングシステム50を使用してTCO層20を堆積させる。CVDコーティングシステム50は、1つのコーティング装置、または複数のコーティング装置を有してもよい。図2に示されている実施形態において、コーティングシステムは、第1のCVDコーティング装置54および第2のCVDコーティング装置54を有する。しかしながら、任意の所望の数のコーティング装置が使用されてもよい。各コーティング装置52および54は、ガラス基板56が溶融金属浴内の溶融金属の上部に沿って移動するときにコーティング材料を下にあるガラス基板56上に供給するために複数のコーティングセル(例えば、コーティングスロット)を有する。CVDコーティング装置および従来のフロートガラス工程の一般的な構造および動作は当業者にはよく理解されており、それゆえ、詳細には説明されない。
しかしながら、これは、本発明の一般的な概念を例示するためのものに過ぎず、本発明はこれらの特定の材料には限定されないことを理解されたい。
したがって、本明細書において詳細に説明されている特定の実施形態は例示に過ぎず、添付の特許請求項およびそのあらゆる均等物の全範囲が与えられるべき本発明の範囲に対する限定ではない。
Claims (20)
- ドーパントが選択的に分散されているコーティング層を有する被覆基板を作製する方法であって、
マルチセル化学気相成長コーティング装置のコーティングセルにコーティング前駆体材料を供給するステップと、
マルチセル化学気相成長コーティング装置のコーティングセルにドーパント前駆体材料を供給するステップと、
前記コーティング前駆体材料および前記ドーパント前駆体材料のうちの少なくとも一方の前記供給を制御して、前記コーティングセルにおける前記ドーパント前駆体材料と前記コーティング前駆体材料との選択される比を有するコーティング組成物を定めるステップと、
コーティング組成物を基板上に堆積させて、ドープコーティング層を形成するステップとを含み、
前記ドーパント前駆体材料と前記コーティング前駆体材料との前記比は、結果としてもたらされるドープコーティングの所望のドーパント含量対コーティング深さプロファイル を定めるように選択される、方法。 - 前記コーティングセルの少なくとも一部分は、コーティング前駆体供給源およびドーパント前駆体供給源に個々に接続されている、請求項1に記載の方法。
- 前記コーティング層は透明導電性酸化物層である、請求項1に記載の方法。
- 前記コーティング前駆体材料は、Zn、Fe、Mn、Al、Ce、Sn、Sb、Hf、Zr、Ni、Zn、Bi、Ti、Co、Cr、Si、In、または、これらの材料のうちの2つ以上の合金のうちの1つまたは複数を含む酸化物コーティングのための前駆体材料を含む、請求項1に記載の方法。
- 前記ドーパント前駆体材料は、F、In、Al、P、およびSbから選択される少なくとも1つのドーパントを含む、請求項1に記載の方法。
- 前記ドーパントが酸化スズ層内に不均一に分散されるように、前記コーティング前駆体材料および前記ドーパント前駆体材料のうちの少なくとも一方の前記供給を制御することを含む、請求項1に記載の方法。
- 前記コーティング前駆体材料は、酸化スズ層を形成するために酸化スズ前駆体を含み、前記ドーパント前駆体材料は、フッ素前駆体を含む、請求項1に記載の方法。
- フッ素含量は、前記酸化スズ層の上部において、前記酸化スズ層の下部付近よりも高い、請求項7に記載の方法。
- フッ素含量は、前記酸化スズ層の上部において、前記酸化スズ層の下部付近よりも低い、請求項7に記載の方法。
- フッ素含量は、前記酸化スズ層の中央部内で、前記酸化スズ層の上部または下部よりも高い、請求項7に記載の方法。
- 第1の表面および第2の表面を有する第1の基板と、
前記第2の表面の少なくとも一部分の上にある第1の導電層であって、前記第1の導電層は、ドーパント材料を組み込んだ透明導電性酸化物層であり、前記ドーパント材料は、前記導電層内に選択的に分散されている、第1の導電層と、
前記第1の透明導電層の上の半導体層と、
前記半導体層の少なくとも一部分の上にある第2の導電層と
を備える、太陽電池。 - 前記第2の表面と前記第1の導電層との間に、下地コーティング層をさらに備える、請求項11に記載の太陽電池。
- 前記第2の導電層の上に第2の基板をさらに備える、請求項11に記載の太陽電池。
- 前記第1の導電層は、Zn、Fe、Mn、Al、Ce、Sn、Sb、Hf、Zr、Ni、Zn、Bi、Ti、Co、Cr、Si、In、または、これらの材料のうちの2つ以上の合金のうちの1つまたは複数の酸化物を含む、請求項11に記載の太陽電池。
- 前記第1の導電層は、F、In、Al、P、およびSbから選択される少なくとも1つのドーパントを含む、請求項14に記載の太陽電池。
- 前記第1の導電層はフッ素をドープした酸化スズ層を含む、請求項15に記載の太陽電池。
- 前記フッ素は前記酸化スズ層内に不均一に分散されている、請求項16に記載の太陽電池。
- フッ素含量は、前記酸化スズ層の上部において、前記酸化スズ層の下部付近よりも高い、請求項17に記載の太陽電池。
- 前記半導体層は、単結晶シリコン、多結晶シリコン、アモルファスシリコン、テルル化カドミウム、およびセレン化/硫化銅インジウムから選択される、請求項1に記載の太陽電池。
- 複数のコーティングセルを有する少なくとも1つのコーティング装置を備える化学気相成長システムであって、
前記コーティングセルは、少なくとも1つの酸化物前駆体材料および少なくとも1つのドーパント材料を備えるそれぞれのコーティング供給源に個々に接続されている、化学気相成長システム。
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- 2014-03-10 KR KR1020157024433A patent/KR20150119017A/ko active Search and Examination
- 2014-03-10 CN CN201480013920.5A patent/CN105074937A/zh active Pending
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2017
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2018
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2019
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US20140311573A1 (en) | 2014-10-23 |
US11031514B2 (en) | 2021-06-08 |
CN108807566A (zh) | 2018-11-13 |
CN105074937A (zh) | 2015-11-18 |
JP2018040059A (ja) | 2018-03-15 |
TW201505194A (zh) | 2015-02-01 |
JP2019149557A (ja) | 2019-09-05 |
TWI529955B (zh) | 2016-04-11 |
US20180190844A1 (en) | 2018-07-05 |
WO2014164434A1 (en) | 2014-10-09 |
KR20150119017A (ko) | 2015-10-23 |
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