JP2016142523A5 - - Google Patents

Download PDF

Info

Publication number
JP2016142523A5
JP2016142523A5 JP2015015735A JP2015015735A JP2016142523A5 JP 2016142523 A5 JP2016142523 A5 JP 2016142523A5 JP 2015015735 A JP2015015735 A JP 2015015735A JP 2015015735 A JP2015015735 A JP 2015015735A JP 2016142523 A5 JP2016142523 A5 JP 2016142523A5
Authority
JP
Japan
Prior art keywords
reflective surface
amount
shows
interferogram
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015015735A
Other languages
Japanese (ja)
Other versions
JP6482886B2 (en
JP2016142523A (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2015015735A priority Critical patent/JP6482886B2/en
Priority claimed from JP2015015735A external-priority patent/JP6482886B2/en
Publication of JP2016142523A publication Critical patent/JP2016142523A/en
Publication of JP2016142523A5 publication Critical patent/JP2016142523A5/ja
Application granted granted Critical
Publication of JP6482886B2 publication Critical patent/JP6482886B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Description

物体面上の理想的な輝点から発せられた光線群は、導入光学系や結像光学系を構成するレンズの円形開口によるフラウンホーファー回折を生じ、エアリーパターンと呼ばれる同心円状の明暗パターンである干渉縞を結像面上に形成する。エアリーパターン(明暗パターン)は、その中心が「エアリーディスク」とよばれる明るい領域であり、その周りを複数の同心円環がとりまく。一般的に、エアリーディスクは、レンズの円形開口による多光線干渉現象として理解される。 A group of light rays emitted from an ideal bright spot on the object surface is a concentric light-dark pattern called an Airy pattern, which causes Fraunhofer diffraction due to the circular aperture of the lenses constituting the introduction optical system and the imaging optical system. Interference fringes are formed on the image plane. The Airy pattern (light / dark pattern) is a bright region whose center is called an “Airy disk”, and a plurality of concentric rings surround it. In general, an Airy disk is understood as a multi-beam interference phenomenon due to a circular aperture of a lens.

分光特性測定装置によって試料面から出射された測定光が固定反射面及び可動反射面によって反射された後、結像レンズによって結像面上に集光する様子を説明する図。The figure explaining a mode that the measurement light radiate | emitted from the sample surface by the spectral characteristic measuring apparatus is condensed on an imaging surface by an imaging lens, after being reflected by the fixed reflective surface and the movable reflective surface. 固定反射面と可動反射面の間の角度ずれ量、結像レンズの焦点距離、結像面上の集光位置のずれ量の関係を示す図。The figure which shows the relationship between the amount of angular deviation between a fixed reflective surface and a movable reflective surface, the focal distance of an imaging lens, and the deviation | shift amount of the condensing position on an imaging surface. 固定反射面と可動反射面の間の角度ずれ量がゼロのときに結像面上に形成されるエアリーディスクの説明図。Explanatory drawing of the Airy disk formed on an image plane when the amount of angular deviations between a fixed reflective surface and a movable reflective surface is zero. 固定反射面と可動反射面の間の角度ずれ量がθのときに結像面上に形成されるエアリーディスクの説明図。Explanatory drawing of the Airy disk formed on an image plane when the amount of angle shifts between a fixed reflective surface and a movable reflective surface is (theta). 本発明の一実施形態に係る分光特性測定装置の概略構成図。1 is a schematic configuration diagram of a spectral characteristic measuring apparatus according to an embodiment of the present invention. 位相シフタの全体構成を示す斜視図。The perspective view which shows the whole structure of a phase shifter. 第1治具の構成を示す図。The figure which shows the structure of a 1st jig | tool. 第1実施例の判別方法を説明するための図であり、被測定物(人物)の撮影画像(a)及び中赤外画像(b)並びに固定反射面と可動反射面の傾きがほぼ同じであるときの測定光のインターフェログラム(c)及びこのインターフェログラムをフーリエ変換して得られるスペクトル(d)の例を示す。It is a figure for demonstrating the discrimination | determination method of 1st Example, and the inclination of a picked-up image (a) and a mid-infrared image (b) of a to-be-measured object (person), and a fixed reflective surface and a movable reflective surface is substantially the same. An example of an interferogram (c) of measurement light at a certain time and a spectrum (d) obtained by Fourier transforming this interferogram are shown. 固定反射面と可動反射面の間の相対的な角度ずれ量を徐々に変化させたときのインターフェログラムの変化を示す図。The figure which shows the change of an interferogram when changing the relative angular deviation | shift amount between a fixed reflective surface and a movable reflective surface gradually. 第2実施例の判別方法を説明するための図であり、物体面にピンホールを有する調整部材を設置した状態の分光特性測定装置の概略図(a)、及び結像面上に形成される輝点像(b)。It is a figure for demonstrating the discrimination method of 2nd Example, and is formed on the schematic surface (a) of the spectral characteristic measuring apparatus of the state which installed the adjustment member which has a pinhole in an object surface, and an image plane Bright spot image (b). 第1治具のねじのねじ込み量を変化させたときの輝点像の移動の様子を示す図。The figure which shows the mode of the movement of the bright spot image when changing the screwing amount of the screw of a 1st jig | tool. 第2治具のねじのねじ込み量を変化させたときの輝点像の移動の様子を示す図 The figure which shows the mode of the movement of a bright spot image when changing the screwing amount of the screw of a 2nd jig | tool . 調整目標値の求め方の説明図。Explanatory drawing of how to obtain | require adjustment target value. 調整目標値から輝点像までの位置ずれ量の求め方の説明図。Explanatory drawing of how to obtain | require the positional offset amount from an adjustment target value to a luminescent spot image. 第1治具の変形例。The modification of a 1st jig | tool.

CCDカメラ13は、受光面が受光した光の強度を検出する、2次元配置された複数の検出画素を備えている。制御装置14は、CCDカメラ13の検出信号からインターフェログラムを求め、このインターフェログラムを数学的にフーリエ変換て測定光の波長毎の相対強度である分光特性(スペクトル)を求める処理部141、CCDカメラ13の検出信号から、位相シフタ11を構成する固定ミラー部20及び可動ミラー部30の位置関係を判別する判別部142、処理部141の処理結果や判別部142の判別結果等を出力するディスプレイ、プリンタ等の出力装置143を備える。 The CCD camera 13 includes a plurality of two-dimensionally arranged detection pixels that detect the intensity of light received by the light receiving surface. The control device 14 obtains an interferogram from the detection signal of the CCD camera 13, and mathematically Fourier transforms the interferogram to obtain a spectral characteristic (spectrum) that is a relative intensity for each wavelength of the measurement light. From the detection signal of the CCD camera 13, a determination unit 142 for determining the positional relationship between the fixed mirror unit 20 and the movable mirror unit 30 constituting the phase shifter 11, a processing result of the processing unit 141, a determination result of the determination unit 142, and the like are output. An output device 143 such as a display or a printer is provided.

JP2015015735A 2015-01-29 2015-01-29 Spectral characteristic measuring apparatus and adjustment method thereof Active JP6482886B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015015735A JP6482886B2 (en) 2015-01-29 2015-01-29 Spectral characteristic measuring apparatus and adjustment method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015015735A JP6482886B2 (en) 2015-01-29 2015-01-29 Spectral characteristic measuring apparatus and adjustment method thereof

Publications (3)

Publication Number Publication Date
JP2016142523A JP2016142523A (en) 2016-08-08
JP2016142523A5 true JP2016142523A5 (en) 2017-11-30
JP6482886B2 JP6482886B2 (en) 2019-03-13

Family

ID=56568621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015015735A Active JP6482886B2 (en) 2015-01-29 2015-01-29 Spectral characteristic measuring apparatus and adjustment method thereof

Country Status (1)

Country Link
JP (1) JP6482886B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7422413B2 (en) * 2019-02-28 2024-01-26 国立大学法人 香川大学 Spectrometer

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6038625A (en) * 1983-08-12 1985-02-28 Hitachi Ltd 2-luminous flux interferometer
JPS63168502A (en) * 1986-12-30 1988-07-12 Shimadzu Corp Control apparatus of interferometer
JPS63168522A (en) * 1986-12-30 1988-07-12 Shimadzu Corp Adjuscting apparatus for interferometer
JP2582007Y2 (en) * 1991-02-27 1998-09-30 株式会社東芝 Interferometer
US5546185A (en) * 1994-09-23 1996-08-13 Kabushiki Kaisha Toshiba Angle detecting apparatus for detecting angle of inclination of scanning mirror provided on michelson interferometer
JP5078004B2 (en) * 2007-06-15 2012-11-21 国立大学法人 香川大学 Spectroscopic measurement apparatus and spectral measurement method
JP5648961B2 (en) * 2011-02-28 2015-01-07 国立大学法人 香川大学 Spectral characteristic measuring apparatus and calibration method thereof
JP5881051B2 (en) * 2012-10-05 2016-03-09 国立大学法人 香川大学 Spectral characteristic measuring device

Similar Documents

Publication Publication Date Title
US11019326B2 (en) Light-source characterizer and associated methods
JP6442078B2 (en) Image plane sensor alignment system and method
US9442075B2 (en) Galvanometer scanned camera with variable focus and method
EP3169975B1 (en) Method and measuring instrument for target detection and/or identification
JP2015506471A5 (en)
EP2856093B1 (en) Imaging system with multiple focal plane array sensors
CA2901299A1 (en) Fluorescence imaging autofocus systems and methods
JP2013257162A (en) Distance measuring device
JP2012181060A (en) Spectral characteristic measuring apparatus and calibration method thereof
WO2016181206A1 (en) The measurement setup for determining position of focal plane and effective focal length of an optical system and the method of determining position of focal plane and effective focal length of an optical system
JP5764189B2 (en) Precision angle positioning device
WO2013066457A2 (en) Blur-calibration system for electro-optical sensors and method using a moving multi-focal multi-target constellation
KR101274032B1 (en) Auto focusing arranging device for electric optical image processing apparatus and method thereof
JP2016142523A5 (en)
KR101826127B1 (en) optical apparatus for inspecting pattern image of semiconductor wafer
JP2019215262A5 (en)
CN105589191B (en) The focus cameras and its focus adjustment method confocal for adjusting astronomical telescope system
JP2016148569A (en) Image measuring method and image measuring device
WO2018037448A1 (en) Wavefront measurement device and optical system assembly device
CN205427305U (en) Be used for adjusting confocal focusing camera of astronomical telescope system and focusing device thereof
JP5857887B2 (en) Wavefront measuring device
KR101620594B1 (en) spectroscopy apparatus
KR101333161B1 (en) Apparatus of processing image based on confocal and method thereof
Goossens et al. Spectral shift correction for fabry-perot based spectral cameras
US10070080B2 (en) Multi-directional, multi-spectral star tracker with a common aperture and common camera