JP2016118924A5 - - Google Patents

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JP2016118924A5
JP2016118924A5 JP2014258014A JP2014258014A JP2016118924A5 JP 2016118924 A5 JP2016118924 A5 JP 2016118924A5 JP 2014258014 A JP2014258014 A JP 2014258014A JP 2014258014 A JP2014258014 A JP 2014258014A JP 2016118924 A5 JP2016118924 A5 JP 2016118924A5
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JP2014258014A
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JP2016118924A (ja
JP6460520B2 (ja
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JP2014258014A 2014-12-19 2014-12-19 特徴記述装置、方法及びプログラム Active JP6460520B2 (ja)

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JP2014258014A JP6460520B2 (ja) 2014-12-19 2014-12-19 特徴記述装置、方法及びプログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014258014A JP6460520B2 (ja) 2014-12-19 2014-12-19 特徴記述装置、方法及びプログラム

Publications (3)

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JP2016118924A JP2016118924A (ja) 2016-06-30
JP2016118924A5 true JP2016118924A5 (enExample) 2018-06-14
JP6460520B2 JP6460520B2 (ja) 2019-01-30

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JP2014258014A Active JP6460520B2 (ja) 2014-12-19 2014-12-19 特徴記述装置、方法及びプログラム

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112381085B (zh) * 2020-10-16 2024-07-26 西安工程大学 一种基于ia-faif的服装特征提取与匹配方法
CN112381844B (zh) * 2020-11-12 2022-12-02 三峡大学 基于图像分块的自适应orb特征提取方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8253754B2 (en) * 2001-01-16 2012-08-28 Microsoft Corporation Sampling-efficient mapping of images
US7729526B2 (en) * 2003-09-09 2010-06-01 The Board Of Trustees Of The University Of Illinois Fast hierarchical tomography methods and apparatus
EP2507743A2 (en) * 2009-12-02 2012-10-10 QUALCOMM Incorporated Fast subspace projection of descriptor patches for image recognition
JP5289412B2 (ja) * 2010-11-05 2013-09-11 株式会社デンソーアイティーラボラトリ 局所特徴量算出装置及び方法、並びに対応点探索装置及び方法
JP2013058174A (ja) * 2011-09-09 2013-03-28 Fujitsu Ltd 画像処理プログラム、画像処理方法および画像処理装置

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