JP6460520B2 - 特徴記述装置、方法及びプログラム - Google Patents

特徴記述装置、方法及びプログラム Download PDF

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JP6460520B2
JP6460520B2 JP2014258014A JP2014258014A JP6460520B2 JP 6460520 B2 JP6460520 B2 JP 6460520B2 JP 2014258014 A JP2014258014 A JP 2014258014A JP 2014258014 A JP2014258014 A JP 2014258014A JP 6460520 B2 JP6460520 B2 JP 6460520B2
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JP2016118924A5 (enExample
JP2016118924A (ja
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康平 松▲崎▼
康平 松▲崎▼
祐介 内田
祐介 内田
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KDDI Corp
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CN112381085B (zh) * 2020-10-16 2024-07-26 西安工程大学 一种基于ia-faif的服装特征提取与匹配方法
CN112381844B (zh) * 2020-11-12 2022-12-02 三峡大学 基于图像分块的自适应orb特征提取方法

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US8253754B2 (en) * 2001-01-16 2012-08-28 Microsoft Corporation Sampling-efficient mapping of images
DE602004022565D1 (de) * 2003-09-09 2009-09-24 Univ Illinois Schnelle hierarchische tomographieverfahren und -vorrichtungen
KR101420550B1 (ko) * 2009-12-02 2014-07-16 퀄컴 인코포레이티드 이미지 인식을 위한 기술자 패치들의 고속 서브스페이스 투영을 위한 방법, 디바이스 및 컴퓨터-판독가능 저장 매체
JP5289412B2 (ja) * 2010-11-05 2013-09-11 株式会社デンソーアイティーラボラトリ 局所特徴量算出装置及び方法、並びに対応点探索装置及び方法
JP2013058174A (ja) * 2011-09-09 2013-03-28 Fujitsu Ltd 画像処理プログラム、画像処理方法および画像処理装置

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