JP2016114598A5 - - Google Patents

Download PDF

Info

Publication number
JP2016114598A5
JP2016114598A5 JP2015225385A JP2015225385A JP2016114598A5 JP 2016114598 A5 JP2016114598 A5 JP 2016114598A5 JP 2015225385 A JP2015225385 A JP 2015225385A JP 2015225385 A JP2015225385 A JP 2015225385A JP 2016114598 A5 JP2016114598 A5 JP 2016114598A5
Authority
JP
Japan
Prior art keywords
image data
data
light source
reflecting surface
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015225385A
Other languages
English (en)
Japanese (ja)
Other versions
JP6661336B2 (ja
JP2016114598A (ja
Filing date
Publication date
Priority claimed from EP14197409.7A external-priority patent/EP3032241B1/en
Application filed filed Critical
Publication of JP2016114598A publication Critical patent/JP2016114598A/ja
Publication of JP2016114598A5 publication Critical patent/JP2016114598A5/ja
Application granted granted Critical
Publication of JP6661336B2 publication Critical patent/JP6661336B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015225385A 2014-12-11 2015-11-18 構造体から光学信号を表すデータを取得するためのシステム、そのデータをマッピングする方法、および、非一過性コンピュータ読み取り可能媒体 Active JP6661336B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP14197409.7A EP3032241B1 (en) 2014-12-11 2014-12-11 Method and apparatus for digitizing the appearance of a real material
EP14197409.7 2014-12-11

Publications (3)

Publication Number Publication Date
JP2016114598A JP2016114598A (ja) 2016-06-23
JP2016114598A5 true JP2016114598A5 (cg-RX-API-DMAC7.html) 2018-12-27
JP6661336B2 JP6661336B2 (ja) 2020-03-11

Family

ID=52302047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015225385A Active JP6661336B2 (ja) 2014-12-11 2015-11-18 構造体から光学信号を表すデータを取得するためのシステム、そのデータをマッピングする方法、および、非一過性コンピュータ読み取り可能媒体

Country Status (5)

Country Link
US (2) US10026215B2 (cg-RX-API-DMAC7.html)
EP (1) EP3032241B1 (cg-RX-API-DMAC7.html)
JP (1) JP6661336B2 (cg-RX-API-DMAC7.html)
CN (1) CN105701793B (cg-RX-API-DMAC7.html)
DE (1) DE202015102081U1 (cg-RX-API-DMAC7.html)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6604744B2 (ja) * 2015-05-03 2019-11-13 キヤノン株式会社 画像処理装置、画像処理方法、画像形成システム及びプログラム
WO2017048674A1 (en) * 2015-09-14 2017-03-23 University Of Florida Research Foundation, Inc. Method for measuring bi-directional reflectance distribution function (brdf) and associated device
US20170109895A1 (en) * 2015-10-19 2017-04-20 Honeywell International Inc. Apparatus and method for measuring haze of sheet materials or other materials using off-axis detector
US11170514B2 (en) * 2015-10-27 2021-11-09 Canon Kabushiki Kaisha Image processing apparatus, image processing method, 3D printing system, and storage medium
CZ2016752A3 (cs) * 2016-11-30 2018-03-28 ÄŚeskĂ© vysokĂ© uÄŤenĂ­ technickĂ© v Praze Přenosné zařízení pro měření geometrie objektu a prostorově proměnné funkce odrazivosti na povrchu vzorku s multiplikací prvků podílejících se na zobrazování a snímacích systémů na pohyblivých ramenech umožňující terénní měření
US10636140B2 (en) * 2017-05-18 2020-04-28 Applied Materials Israel Ltd. Technique for inspecting semiconductor wafers
JP6950544B2 (ja) * 2018-01-17 2021-10-13 トヨタ自動車株式会社 シミュレーション装置、反射特性の推定方法、及びプログラム
WO2019177153A1 (ja) * 2018-03-16 2019-09-19 コニカミノルタ株式会社 光沢色の色調定量化装置、光沢色の色調測定装置および光沢色の色調定量化方法
WO2019182911A1 (en) 2018-03-17 2019-09-26 Nvidia Corporation Reflection denoising in ray-tracing applications
US11436791B2 (en) * 2018-04-30 2022-09-06 The Regents Of The University Of California Methods and systems for acquiring svBRDF measurements
JP7087687B2 (ja) * 2018-06-01 2022-06-21 株式会社サタケ 穀物の光沢測定装置
KR102599207B1 (ko) * 2018-07-20 2023-12-15 삼성전자 주식회사 전자 디바이스의 표면 측정 장치 및 방법
US10991079B2 (en) 2018-08-14 2021-04-27 Nvidia Corporation Using previously rendered scene frames to reduce pixel noise
US11029146B2 (en) * 2018-10-18 2021-06-08 Cyberoptics Corporation Three-dimensional sensor with counterposed channels
US11295969B2 (en) 2018-11-27 2022-04-05 International Business Machines Corporation Hybridization for characterization and metrology
US11480868B2 (en) 2019-03-22 2022-10-25 International Business Machines Corporation Determination of optical roughness in EUV structures
US12146734B2 (en) 2019-06-28 2024-11-19 Koh Young Technology Inc. Apparatus and method for determining three-dimensional shape of object
JP7326972B2 (ja) * 2019-07-30 2023-08-16 株式会社リコー 表面特性評価方法、表面特性評価装置、及び表面特性評価プログラム
US10805549B1 (en) * 2019-08-20 2020-10-13 Himax Technologies Limited Method and apparatus of auto exposure control based on pattern detection in depth sensing system
EP4078148B1 (en) * 2019-12-19 2024-02-07 Teknologian Tutkimuskeskus VTT OY Method and apparatus for determining the quality of fresh concrete or the like
JP7411928B2 (ja) * 2019-12-26 2024-01-12 株式会社Rutilea 物品撮影装置
CN115997238A (zh) * 2020-06-29 2023-04-21 巴斯夫涂料有限公司 双向纹理函数的用途
CN113138027A (zh) * 2021-05-07 2021-07-20 东南大学 一种基于双向折射率分布函数的远红外非视域物体定位方法
EP4184145B1 (de) * 2021-11-17 2023-08-30 KRÜSS GmbH, Wissenschaftliche Laborgeräte Vorrichtung zur erfassung einer geometrie eines auf einer probenoberfläche angeordneten tropfens
JP2023121518A (ja) * 2022-02-21 2023-08-31 日本電気株式会社 外観検査装置、外観検査装置の制御方法、および外観検査装置の制御プログラム

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2353512A (en) * 1943-05-05 1944-07-11 Simmon Alfred Photographic enlarger
DE1489395B2 (de) * 1965-06-01 1971-07-22 Maehler & Kaege Elektrotechnische Spezialfabnk AG, 6507 Ingelheim Abblendbare kontrolleuchte
JP3072998B2 (ja) * 1990-04-18 2000-08-07 株式会社日立製作所 はんだ付け状態検査方法及びその装置
US5710876A (en) * 1995-05-25 1998-01-20 Silicon Graphics, Inc. Computer graphics system for rendering images using full spectral illumination data
US6084663A (en) * 1997-04-07 2000-07-04 Hewlett-Packard Company Method and an apparatus for inspection of a printed circuit board assembly
GB9911266D0 (en) * 1999-05-15 1999-07-14 Metcalfe Nicholas Display apparatus
US6507036B1 (en) * 1999-06-01 2003-01-14 National Research Council Of Canada Three dimensional optical scanning
US6950104B1 (en) * 2000-08-30 2005-09-27 Microsoft Corporation Methods and systems for animating facial features, and methods and systems for expression transformation
US7102647B2 (en) * 2001-06-26 2006-09-05 Microsoft Corporation Interactive horizon mapping
US6831641B2 (en) * 2002-06-17 2004-12-14 Mitsubishi Electric Research Labs, Inc. Modeling and rendering of surface reflectance fields of 3D objects
JP4335589B2 (ja) * 2002-06-27 2009-09-30 ミツビシ・エレクトリック・リサーチ・ラボラトリーズ・インコーポレイテッド 3dオブジェクトをモデル化する方法
CN101184986B (zh) * 2005-04-25 2012-06-13 爱色丽公司 使用空间欠采样双向反射分布功能测量表面的外观属性
US20080232679A1 (en) * 2005-08-17 2008-09-25 Hahn Daniel V Apparatus and Method for 3-Dimensional Scanning of an Object
JP5251678B2 (ja) * 2009-03-31 2013-07-31 ソニー株式会社 外観検査用照明装置および外観検査装置
CN101901302A (zh) * 2010-07-16 2010-12-01 中国人民解放军信息工程大学 复杂空间目标光散射建模方法
CN102175012A (zh) * 2011-03-17 2011-09-07 赵景琪 一种光源调整装置
WO2013009676A1 (en) * 2011-07-13 2013-01-17 Faro Technologies, Inc. Device and method using a spatial light modulator to find 3d coordinates of an object
GB201222361D0 (en) * 2012-12-12 2013-01-23 Univ Birmingham Surface geometry imaging
US9562857B2 (en) * 2013-03-14 2017-02-07 University Of Southern California Specular object scanner for measuring reflectance properties of objects
US20150032430A1 (en) 2013-07-29 2015-01-29 X-Rite Europe Gmbh Visualization Method

Similar Documents

Publication Publication Date Title
JP2016114598A5 (cg-RX-API-DMAC7.html)
JP6661336B2 (ja) 構造体から光学信号を表すデータを取得するためのシステム、そのデータをマッピングする方法、および、非一過性コンピュータ読み取り可能媒体
CN108292361B8 (zh) 具有角度限制反射器的显示器集成的光学指纹传感器
JP2014106543A5 (cg-RX-API-DMAC7.html)
CN109313821A (zh) 三维对象扫描反馈
WO2012088320A3 (en) Real-time, three-dimensional optical coherence tomography system
WO2014114737A3 (de) Verfahren und vorrichtung zur bestimmung der geometrie von strukturen mittels computertomografie
WO2016020763A3 (en) Handheld multi-sensor system for sizing irregular objects
WO2014200648A3 (en) System and method for determining the position of defects on objects, coordinate measuring unit and computer program for coordinate measuring unit
JP2015111375A5 (ja) 情報処理システム、出力装置、および出力方法
JP2014517380A5 (cg-RX-API-DMAC7.html)
JP2019184340A (ja) 情報処理装置、情報処理方法、及びプログラム
US20240371038A1 (en) Systems, methods, and media for calibrating structured light camera systems
US20180113321A1 (en) Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
WO2015076811A1 (en) Projection screen for specularly reflecting infrared light
JP2017207367A5 (ja) 情報処理装置、情報処理方法、プログラム、反射特性プロファイル
WO2009096592A4 (en) Information processing apparatus and method
EP4116941A3 (en) Detection system, processing apparatus, movement object, detection method, and program
JP2019005942A5 (cg-RX-API-DMAC7.html)
CN116091684A (zh) 基于WebGL的图像渲染方法、装置、设备及存储介质
JP2017018435A5 (cg-RX-API-DMAC7.html)
IT201600091510A1 (it) Sistema e metodo per la creazione di modelli tridimensionali.
EP2781951A3 (en) Optical scanner, actuator, image display device, and head-mounted display
JP2018005542A5 (cg-RX-API-DMAC7.html)
US20240338882A1 (en) Rendering a visual representation of a luminaire by re-using light values