JP2016099296A - 探傷対象物の内部欠陥を検出する探傷システム、及び探傷方法 - Google Patents

探傷対象物の内部欠陥を検出する探傷システム、及び探傷方法 Download PDF

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JP2016099296A
JP2016099296A JP2014238361A JP2014238361A JP2016099296A JP 2016099296 A JP2016099296 A JP 2016099296A JP 2014238361 A JP2014238361 A JP 2014238361A JP 2014238361 A JP2014238361 A JP 2014238361A JP 2016099296 A JP2016099296 A JP 2016099296A
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flaw detection
image
detection object
frequency
thermal
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JP2016099296A5 (enExample
Inventor
嘉郎 羽深
Yoshiro Habuka
嘉郎 羽深
真 宇都宮
Makoto Utsunomiya
真 宇都宮
豊 西谷
Yutaka Nishitani
豊 西谷
涼 福井
Ryo Fukui
涼 福井
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KJTD Co Ltd
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KJTD Co Ltd
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Publication of JP2016099296A5 publication Critical patent/JP2016099296A5/ja
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JP2014238361A 2014-11-26 2014-11-26 探傷対象物の内部欠陥を検出する探傷システム、及び探傷方法 Pending JP2016099296A (ja)

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JP2014238361A JP2016099296A (ja) 2014-11-26 2014-11-26 探傷対象物の内部欠陥を検出する探傷システム、及び探傷方法

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JP2014238361A JP2016099296A (ja) 2014-11-26 2014-11-26 探傷対象物の内部欠陥を検出する探傷システム、及び探傷方法

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JP2016099296A true JP2016099296A (ja) 2016-05-30
JP2016099296A5 JP2016099296A5 (enExample) 2017-11-09

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024204424A1 (ja) * 2023-03-28 2024-10-03 パナソニックＩｐマネジメント株式会社 画像処理装置及び画像処理方法
US12492943B2 (en) 2021-09-10 2025-12-09 Kabushiki Kaisha Toshiba Generation device, generation system, processing system, generation method, and storage medium

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050008215A1 (en) * 1999-12-02 2005-01-13 Shepard Steven M. System for generating thermographic images using thermographic signal reconstruction
JP2012512419A (ja) * 2008-12-17 2012-05-31 ケーエルエー−テンカー・コーポレーション 欠陥の検出及び応答

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050008215A1 (en) * 1999-12-02 2005-01-13 Shepard Steven M. System for generating thermographic images using thermographic signal reconstruction
JP2012512419A (ja) * 2008-12-17 2012-05-31 ケーエルエー−テンカー・コーポレーション 欠陥の検出及び応答

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12492943B2 (en) 2021-09-10 2025-12-09 Kabushiki Kaisha Toshiba Generation device, generation system, processing system, generation method, and storage medium
WO2024204424A1 (ja) * 2023-03-28 2024-10-03 パナソニックＩｐマネジメント株式会社 画像処理装置及び画像処理方法

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