JP2016080607A5 - - Google Patents

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Publication number
JP2016080607A5
JP2016080607A5 JP2014214170A JP2014214170A JP2016080607A5 JP 2016080607 A5 JP2016080607 A5 JP 2016080607A5 JP 2014214170 A JP2014214170 A JP 2014214170A JP 2014214170 A JP2014214170 A JP 2014214170A JP 2016080607 A5 JP2016080607 A5 JP 2016080607A5
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JP
Japan
Prior art keywords
ray
rays
opening
collimator
parallelism
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JP2014214170A
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English (en)
Japanese (ja)
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JP6430208B2 (ja
JP2016080607A (ja
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Priority to JP2014214170A priority Critical patent/JP6430208B2/ja
Priority claimed from JP2014214170A external-priority patent/JP6430208B2/ja
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Publication of JP2016080607A5 publication Critical patent/JP2016080607A5/ja
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JP2014214170A 2014-10-21 2014-10-21 X線照射装置 Active JP6430208B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014214170A JP6430208B2 (ja) 2014-10-21 2014-10-21 X線照射装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014214170A JP6430208B2 (ja) 2014-10-21 2014-10-21 X線照射装置

Publications (3)

Publication Number Publication Date
JP2016080607A JP2016080607A (ja) 2016-05-16
JP2016080607A5 true JP2016080607A5 (enExample) 2017-11-24
JP6430208B2 JP6430208B2 (ja) 2018-11-28

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Family Applications (1)

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JP2014214170A Active JP6430208B2 (ja) 2014-10-21 2014-10-21 X線照射装置

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JP (1) JP6430208B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6851107B2 (ja) * 2019-03-29 2021-03-31 株式会社応用科学研究所 X線分析装置
CN115876812A (zh) * 2022-12-15 2023-03-31 浙江大学杭州国际科创中心 基于两级放大的单相位光栅x射线显微成像系统
EP4621394A1 (en) * 2023-01-17 2025-09-24 Hamamatsu Photonics K.K. Radiation beam scanning optical system and inspection apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09180661A (ja) * 1995-12-27 1997-07-11 Toyota Motor Corp X線管
JP2008268105A (ja) * 2007-04-24 2008-11-06 Toshiba Corp X線ビーム源、x線ビーム照射装置、x線ビーム透過撮影装置、x線ビームct装置、x線元素マッピング検査装置及びx線ビーム形成方法

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