JP2016050803A5 - - Google Patents

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Publication number
JP2016050803A5
JP2016050803A5 JP2014175114A JP2014175114A JP2016050803A5 JP 2016050803 A5 JP2016050803 A5 JP 2016050803A5 JP 2014175114 A JP2014175114 A JP 2014175114A JP 2014175114 A JP2014175114 A JP 2014175114A JP 2016050803 A5 JP2016050803 A5 JP 2016050803A5
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Japan
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wavelength
gap
light
imaging pixels
changing unit
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JP2014175114A
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Japanese (ja)
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JP6394189B2 (ja
JP2016050803A (ja
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Priority to JP2014175114A priority Critical patent/JP6394189B2/ja
Priority claimed from JP2014175114A external-priority patent/JP6394189B2/ja
Priority to CN201510526441.XA priority patent/CN105391920B/zh
Priority to US14/835,843 priority patent/US9835492B2/en
Publication of JP2016050803A publication Critical patent/JP2016050803A/ja
Publication of JP2016050803A5 publication Critical patent/JP2016050803A5/ja
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JP2014175114A 2014-08-29 2014-08-29 分光画像取得装置、及び分光画像取得方法 Active JP6394189B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014175114A JP6394189B2 (ja) 2014-08-29 2014-08-29 分光画像取得装置、及び分光画像取得方法
CN201510526441.XA CN105391920B (zh) 2014-08-29 2015-08-25 分光图像取得装置以及分光图像取得方法
US14/835,843 US9835492B2 (en) 2014-08-29 2015-08-26 Spectroscopic image acquiring apparatus and spectroscopic image acquiring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014175114A JP6394189B2 (ja) 2014-08-29 2014-08-29 分光画像取得装置、及び分光画像取得方法

Publications (3)

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JP2016050803A JP2016050803A (ja) 2016-04-11
JP2016050803A5 true JP2016050803A5 (enExample) 2017-10-05
JP6394189B2 JP6394189B2 (ja) 2018-09-26

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JP2014175114A Active JP6394189B2 (ja) 2014-08-29 2014-08-29 分光画像取得装置、及び分光画像取得方法

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US (1) US9835492B2 (enExample)
JP (1) JP6394189B2 (enExample)
CN (1) CN105391920B (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5987573B2 (ja) 2012-09-12 2016-09-07 セイコーエプソン株式会社 光学モジュール、電子機器、及び駆動方法
JP6930869B2 (ja) * 2017-06-28 2021-09-01 パイオニア株式会社 撮像装置、撮像方法及びプログラム
US10955336B2 (en) * 2017-08-26 2021-03-23 Innovative Micro Technology Gas sensor comprising a rotatable Fabry-Perot multilayer etalon
US10763144B2 (en) * 2018-03-01 2020-09-01 Verity Instruments, Inc. Adaptable-modular optical sensor based process control system, and method of operation thereof
JP2019152518A (ja) * 2018-03-02 2019-09-12 セイコーエプソン株式会社 検査装置、検査システム、及び検査方法
JP7484139B2 (ja) * 2019-11-22 2024-05-16 セイコーエプソン株式会社 分光装置、及び分光装置の駆動方法
WO2021167254A1 (ko) * 2020-02-21 2021-08-26 장민준 깊이 이미징 장치 및 입사각에 따른 크로스토크가 저감된 깊이 이미징 장치용 간섭필터
JP7497622B2 (ja) * 2020-06-05 2024-06-11 セイコーエプソン株式会社 画像生成装置、及び画像生成方法
CN112532832B (zh) * 2020-11-23 2022-04-12 Oppo（重庆）智能科技有限公司 成像装置与电子设备
JP2022117068A (ja) * 2021-01-29 2022-08-10 ｉ－ＰＲＯ株式会社 撮像装置
KR102643832B1 (ko) 2021-05-27 2024-03-06 (주)제이앤씨테크 간섭 필터, 이를 구비한 광각 분광 이미징 장치 및 이를 구비한 깊이 이미징 장치
US20230384497A1 (en) * 2021-05-27 2023-11-30 J&C Technology Co.,Ltd. Interference filter, wide-angle spectral imaging device having same, and depth imaging device having same
CN115326202B (zh) * 2022-08-11 2024-10-18 中南大学 高光谱成像装置及其制备方法、成像方法
KR20240059148A (ko) 2022-10-27 2024-05-07 (주)제이앤씨테크 광 간섭 필터
KR20240109764A (ko) 2023-01-05 2024-07-12 (주)제이앤씨테크 중심 파장 모니터링 기능을 구비한 깊이 이미징 장치
KR20240109765A (ko) 2023-01-05 2024-07-12 (주)제이앤씨테크 소스 광의 중심 파장 변화에 대응한 깊이 이미지 획득 방법

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
US5442438A (en) * 1988-12-22 1995-08-15 Renishaw Plc Spectroscopic apparatus and methods
US7340127B1 (en) * 2005-01-31 2008-03-04 Sunrise Telecom Incorporated Full-band optical spectrum analyzer and method
US7734131B2 (en) * 2006-04-18 2010-06-08 Xerox Corporation Fabry-Perot tunable filter using a bonded pair of transparent substrates
FI119830B (fi) * 2006-05-24 2009-03-31 Valtion Teknillinen Spektrometri ja inferferometrinen menetelmä
JP5040628B2 (ja) 2007-12-10 2012-10-03 カシオ計算機株式会社 撮像装置、印刷システム、撮像装置制御プログラム及び撮像装置制御方法
US20100211333A1 (en) * 2009-01-14 2010-08-19 Integrated Process Resources, Inc. Leak Detection and Identification System
JP5668345B2 (ja) 2010-07-13 2015-02-12 セイコーエプソン株式会社 光フィルター、光フィルターモジュール、分光測定器および光機器
JP5609542B2 (ja) 2010-10-28 2014-10-22 セイコーエプソン株式会社 光測定装置
JP5842386B2 (ja) * 2011-05-25 2016-01-13 セイコーエプソン株式会社 光フィルター、光フィルターモジュール、および光分析装置
JP2014157018A (ja) * 2011-06-14 2014-08-28 Olympus Corp 分光画像撮影装置
JP5987573B2 (ja) * 2012-09-12 2016-09-07 セイコーエプソン株式会社 光学モジュール、電子機器、及び駆動方法

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