WO2015132788A3 - System and method for performing tear film structure measurement and evaporation rate measurements - Google Patents

System and method for performing tear film structure measurement and evaporation rate measurements Download PDF

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Publication number
WO2015132788A3
WO2015132788A3 PCT/IL2015/050232 IL2015050232W WO2015132788A3 WO 2015132788 A3 WO2015132788 A3 WO 2015132788A3 IL 2015050232 W IL2015050232 W IL 2015050232W WO 2015132788 A3 WO2015132788 A3 WO 2015132788A3
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WO
WIPO (PCT)
Prior art keywords
tear film
camera
color
spectrometer
point
Prior art date
Application number
PCT/IL2015/050232
Other languages
French (fr)
Other versions
WO2015132788A2 (en
Inventor
Yoel Arieli
Yoel Cohen
Shlomi EPSTEIN
Dror ARBEL
Original Assignee
Adom, Advanced Optical Technologies Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adom, Advanced Optical Technologies Ltd. filed Critical Adom, Advanced Optical Technologies Ltd.
Priority to EP15753474.4A priority Critical patent/EP3113668B1/en
Priority to EP18192052.1A priority patent/EP3434173B1/en
Publication of WO2015132788A2 publication Critical patent/WO2015132788A2/en
Publication of WO2015132788A3 publication Critical patent/WO2015132788A3/en
Priority to US15/227,839 priority patent/US9757027B2/en
Priority to US16/322,083 priority patent/US11116394B2/en
Priority to US15/671,413 priority patent/US9833139B1/en
Priority to US15/802,829 priority patent/US10456029B2/en
Priority to US17/473,839 priority patent/US12023099B2/en

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/101—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for examining the tear film
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/0016—Operational features thereof
    • A61B3/0025—Operational features thereof characterised by electronic signal processing, e.g. eye models
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/1005—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for measuring distances inside the eye, e.g. thickness of the cornea
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/14—Arrangements specially adapted for eye photography
    • A61B3/15—Arrangements specially adapted for eye photography with means for aligning, spacing or blocking spurious reflection ; with means for relaxing
    • A61B3/152—Arrangements specially adapted for eye photography with means for aligning, spacing or blocking spurious reflection ; with means for relaxing for aligning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0675—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02025—Interference between three or more discrete surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces
    • G02B3/08—Simple or compound lenses with non-spherical faces with discontinuous faces, e.g. Fresnel lens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/066—Modifiable path; multiple paths in one sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30041—Eye; Retina; Ophthalmic

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Ophthalmology & Optometry (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Signal Processing (AREA)
  • Analytical Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Eye Examination Apparatus (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

In a system and method for performing tear film structure measurement and evaporation rate measurements a broadband light source illuminates the tear film and a spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera obtains a large field of view image of the tear film so as to obtain color information for all points of the tear film imaged by the color camera and an autofocusing mechanism focusses the color camera and the spectrometer. A processing unit coupled to the camera and to the spectrometer calibrates the camera so that the color obtained by the camera at the at least one point measured by the spectrometer matches the color of the spectrometer at the same point, and determines from the color of each point of the calibrated camera the thickness of the lipids at the respective point.
PCT/IL2015/050232 2014-03-06 2015-03-04 System and method for performing tear film structure measurement and evaporation rate measurements WO2015132788A2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
EP15753474.4A EP3113668B1 (en) 2014-03-06 2015-03-04 System and method for performing tear film structure measurement and evaporation rate measurements
EP18192052.1A EP3434173B1 (en) 2014-03-06 2015-03-04 System and method for performing tear film structure measurement
US15/227,839 US9757027B2 (en) 2014-03-06 2016-08-03 System and method for performing tear film structure measurement and evaporation rate measurements
US16/322,083 US11116394B2 (en) 2014-03-06 2017-08-02 System and method for performing tear film structure measurement
US15/671,413 US9833139B1 (en) 2014-03-06 2017-08-08 System and method for performing tear film structure measurement
US15/802,829 US10456029B2 (en) 2014-03-06 2017-11-03 Apparatus and method for detecting surface topography
US17/473,839 US12023099B2 (en) 2021-09-13 System and method for performing tear film structure measurement

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461948579P 2014-03-06 2014-03-06
US61/948,579 2014-03-06

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US15/227,839 Continuation-In-Part US9757027B2 (en) 2014-03-06 2016-08-03 System and method for performing tear film structure measurement and evaporation rate measurements

Publications (2)

Publication Number Publication Date
WO2015132788A2 WO2015132788A2 (en) 2015-09-11
WO2015132788A3 true WO2015132788A3 (en) 2015-12-17

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PCT/IL2015/050232 WO2015132788A2 (en) 2014-03-06 2015-03-04 System and method for performing tear film structure measurement and evaporation rate measurements
PCT/IL2017/050853 WO2018025265A2 (en) 2014-03-06 2017-08-02 System and method for performing tear film structure measurement

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Application Number Title Priority Date Filing Date
PCT/IL2017/050853 WO2018025265A2 (en) 2014-03-06 2017-08-02 System and method for performing tear film structure measurement

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US (3) US9757027B2 (en)
EP (3) EP3113668B1 (en)
WO (2) WO2015132788A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7068869B2 (en) 2017-03-14 2022-05-17 株式会社トプコン Tear layer thickness measuring device and method

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US9360414B2 (en) * 2011-10-14 2016-06-07 University of Pittsburgh—of the Commonwealth System of Higher Education Light refraction imaging to measure liquid volume
US9615735B2 (en) * 2014-01-31 2017-04-11 University Of Rochester Measurement of the lipid and aqueous layers of a tear film
US11399713B2 (en) 2014-01-31 2022-08-02 University Of Rochester Measurement of multi-layer structures
US11116394B2 (en) * 2014-03-06 2021-09-14 Adom, Advanced Optical Technologies Ltd. System and method for performing tear film structure measurement
WO2015132788A2 (en) 2014-03-06 2015-09-11 Adom, Advanced Optical Technologies Ltd. System and method for performing tear film structure measurement and evaporation rate measurements
JP7005392B2 (en) * 2017-03-14 2022-01-21 株式会社トプコン Tear layer thickness measuring device and method
FI127458B (en) 2017-05-18 2018-06-29 Icare Finland Oy Apparatus and method for measuring physiological parameters of eye
WO2019009277A1 (en) * 2017-07-04 2019-01-10 興和株式会社 Lacrimal fluid layer evaluation method, computer program, and device
JP6550101B2 (en) * 2017-07-13 2019-07-24 Ｊｆｅテクノリサーチ株式会社 Film thickness measuring method and film thickness measuring apparatus
KR20200096796A (en) * 2017-12-08 2020-08-13 비욘드 700 피티와이 리미티드 Method based on tear film behavior
US10574852B2 (en) * 2018-01-12 2020-02-25 Seiko Epson Corporation Imaging optical mechanism, reading module, and image reading apparatus
US10893796B2 (en) * 2018-01-26 2021-01-19 Topcon Corporation 2D multi-layer thickness measurement
EP3755993B1 (en) * 2018-02-20 2023-07-19 Pressco Technology, Inc. A method and system for monitoring and controlling online beverage can color decoration specification
JP2019154764A (en) * 2018-03-13 2019-09-19 株式会社トプコン Tear film thickness measurement apparatus and method
IL261815B2 (en) * 2018-09-16 2023-05-01 Adom Advanced Optical Tech Ltd Apparatus and methods for calibrating optical measurements
US11614321B2 (en) * 2019-03-29 2023-03-28 Topcon Corporation Method and apparatus for measuring tear film thickness using optical interference
US11684253B2 (en) * 2019-04-24 2023-06-27 Topcon Corporation 2D multi-layer thickness measurement with reconstructed spectrum
IL274295A (en) 2020-04-27 2021-10-31 Adom Advanced Optical Tech Ltd Method and apparatus for detection and measurement of external bodies and sublayers in biological films using spectral measurement
KR20240042697A (en) * 2022-09-26 2024-04-02 가톨릭대학교 산학협력단 Apparatus for Observing lipid layer of eye surface for mouse

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JP2001309889A (en) * 2000-05-01 2001-11-06 Nidek Co Ltd Ophthalmologic equipment
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7068869B2 (en) 2017-03-14 2022-05-17 株式会社トプコン Tear layer thickness measuring device and method

Also Published As

Publication number Publication date
US9833139B1 (en) 2017-12-05
US20170332897A1 (en) 2017-11-23
EP3434173B1 (en) 2020-06-17
EP3434173A1 (en) 2019-01-30
WO2018025265A2 (en) 2018-02-08
US20160338585A1 (en) 2016-11-24
EP3493727A2 (en) 2019-06-12
WO2018025265A3 (en) 2018-04-26
US9757027B2 (en) 2017-09-12
US20180070813A1 (en) 2018-03-15
EP3113668B1 (en) 2018-09-26
WO2015132788A2 (en) 2015-09-11
US10456029B2 (en) 2019-10-29
EP3113668A2 (en) 2017-01-11

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