JP2016021179A - Quality management system and quality management method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a quality management system configured to easily obtain a parameter having an influence on quality, and to properly manage quality.SOLUTION: In a quality management system, when a dry lamination apparatus 100 produces a product 40, a quality management apparatus collects values measured by sensors 2, 3, 4, 5, 7, 8 or appearance defective data based on an image obtained by an imaging apparatus 6 capturing the product 40. The quality management apparatus receives an input of physical data based on results of testing the product 40. The data are compared. On the basis of comparison results, an appearance defective pattern or a physical defective pattern are created. In the quality management system, when the dry lamination apparatus 100 produces the product 40, the quality management apparatus compares the values measured by the sensors 2, 3, 4, 5, 7, 8 with the appearance defective pattern or the physical defective pattern, to manage quality.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a quality management system and a quality management method.

  As a quality control method at the production site, SPC (Statistical Process Control) is known. In quality control by SPC, it is possible to suppress the occurrence of defective products by managing parameter values related to the production process.

  In Patent Document 1, in a production line of a semiconductor device or the like, it is possible to collect and monitor a measurement value of a quality characteristic of a product related to an arbitrary manufacturing process or a processing result of the manufacturing apparatus to prevent occurrence of a quality trouble. Have been described.

JP 2002-149222 A

  However, in order to carry out the quality control method by SPC, in order to determine the parameters to be managed, it is necessary to first investigate which defective product is generated when which parameter changes. Since there are a large number of such parameter candidates at the production site, there is a problem that a great deal of labor is required to investigate the parameters.

  An object of the present invention is to provide a quality control system and the like that can easily obtain parameters that affect quality and that can also suitably perform quality control.

  A first invention for solving the above-described problem is a quality control system for performing quality control in a production process, and includes a process parameter for causing a physical property defect of a product by comparison with physical property data of the product. In order to obtain an appearance defect pattern, which is a condition of a process parameter for generating an appearance defect by comparison with the process parameter, a means for obtaining a process parameter for obtaining a physical property defect pattern which is a condition. And a means for acquiring appearance defect data based thereon.

It is desirable that the physical property data includes information related to the occurrence time of a physical property failure, and the appearance defect data includes information related to the occurrence time of the appearance failure.
Further, based on the comparison between the physical property data and the process parameter, means for generating the physical property defect pattern, and based on the comparison between the visual defect data and the process parameter, the means for generating the defective appearance pattern. It is desirable to provide further.
It is also desirable to further include an appearance inspection apparatus that monitors an appearance defect based on a photographed image obtained by photographing an object with the photographing apparatus.

  A second invention is a quality control system for performing quality control in a production process, and includes a process parameter acquisition means, the acquired process parameter, and a process parameter condition that causes a physical property defect of a product. Using a certain physical property defect pattern, a means for determining the presence / absence of occurrence of a physical property defect, and using the acquired process parameter and an appearance defect pattern which is a condition of the process parameter causing the appearance defect, And a means for determining whether or not there is a possibility of occurrence of a defect.

  A third invention is a quality control method for performing quality control in a production process, and obtains a physical property defect pattern which is a condition of a process parameter causing a physical property defect of a product by comparison with physical property data of the product. A process parameter acquisition step, and a step of acquiring appearance defect data based on a target captured image to obtain a defect pattern that is a condition of a process parameter that causes a defect in appearance by comparison with the process parameter. And a quality control method characterized by comprising:

  A fourth invention is a quality control method for performing quality control in a production process, wherein the process parameters are obtained at the step, the obtained process parameters, and the conditions of the process parameters at which a physical property defect of the product occurs. Using a certain physical property defect pattern to determine whether or not there is a possibility of occurrence of physical property failure, and using the acquired process parameter and an appearance defect pattern that is a condition of the process parameter causing the appearance defect, And a step of determining whether or not there is a possibility of occurrence of a failure.

  In the present invention, it is possible to obtain the process parameters related to the production process measured by the appearance inspection result and the sensor during the production of the product, and thereby, what process parameter is used when the appearance defect such as wrinkles occurs. It is immediately possible to know whether it has changed, and process parameters related to defects can be easily obtained. In the present invention, the physical property data of the product is also acquired from the test result, and this is matched with the process parameter, so that the process parameter related to the physical property defect of the product can also be acquired. By performing management by means of SPC using these process parameters and preventing the appearance defects and physical property defects, both the appearance defects and the physical property defects can be minimized.

  Further, since the physical property data and the appearance defect data include information on the occurrence time of the physical property defect and the appearance failure, they can be used to match the time change of the process parameter and obtain the process parameter that caused the process parameter. Furthermore, a physical property defect pattern and an appearance defect pattern can be automatically generated in the quality control system, thereby further reducing process parameter investigation time and investigation effort. In addition, by monitoring the appearance defect by the appearance inspection apparatus, it is possible to cope immediately even if an appearance defect occurs, prevent the occurrence of defects continuously, and improve the yield.

  According to the present invention, it is possible to provide a quality control system or the like that can easily obtain parameters that affect quality and that can suitably perform quality control.

The figure which shows the dry lamination apparatus 100 The figure which shows the quality control system 1 Flow chart showing data collection procedure Diagram showing the relationship between measured values and appearance defects and physical property defects Flow chart showing quality control procedure

  Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings.

(1. Dry lamination device 100)
FIG. 1A is a diagram showing a dry lamination apparatus 100 which is an application example of a quality management system according to an embodiment of the present invention.

  The dry lamination apparatus 100 is an apparatus that produces a product 40 (production product) by bonding a plurality of films 20 and 30 and is used for manufacturing packaging materials and the like.

  In the production process of the product 40 by the dry lamination apparatus 100, first, the film 20 wound around the reel 12 is unwound and conveyed. A coating unit 14 and a drying unit 15 are provided in the middle of the transport path.

  The application unit 14 applies the adhesive 21 to the film 20 through the roll 14b while sandwiching and transporting the film 20 between the rolls 14a and 14b. The film 20 after applying the adhesive 21 is conveyed to the drying unit 15.

  The drying unit 15 is, for example, an oven, and heats and dries the film 20 after the adhesive 21 is applied. The dried film 20 exiting the drying unit 15 is conveyed to the laminating unit 17.

  The laminating unit 17 is configured to superimpose the film 30 unwound from the reel 16 and the above film 20 between the rolls 17a and 17b, and apply the heat and pressure to bond the films 20 and 30 together. The product 40 after the films 20 and 30 are bonded together is taken up by the reel 18.

  The above-described transport of the film 20 or the like is performed by a transport roll 13 or the like provided at an appropriate location in the transport path.

  As for the product 40, as shown in FIG. 1B, a physical property value test using a test apparatus 50 is performed. The test items include, for example, the peel strength, thickness, weight, and the like of the product 40, and a test using the test piece of the product 40 is performed by an apparatus according to the test item.

  As shown in FIG. 1A, in the present embodiment, the dry lamination apparatus 100 is provided with sensors 2, 3, 4, 5 and the imaging apparatus 6. In addition, in the room where the dry lamination apparatus 100 is installed, sensors 7 and 8 are also provided.

  The sensors 2, 3, 4, 5, 7, 8 acquire measurement values (process parameters) relating to the production process of the product 40.

  The sensor 2 measures the tension of the film 20 or the like being conveyed. The sensor 2 is provided, for example, on one or a plurality of transport rolls 13 and measures a force applied from the film 20 or the like to each transport roll 13 as a tension.

  The sensor 3 measures the pressure applied to the film 20 between the rolls 14a and 14b and the pressure applied to the films 20 and 30 between the rolls 17a and 17b. The sensor 3 is provided, for example, on one roll and measures the force applied from the other roll.

  The sensor 4 measures the drying temperature of the film 20. The sensor 4 is a thermometer provided in the drying unit 15, for example, and measures the temperature in the drying unit 15 as the drying temperature of the film 20.

  The sensor 5 measures the conveyance speed of the film 20 or the like. The sensor 5 is an encoder provided in one or a plurality of transport rolls 13, for example, and measures the number of rotations of each transport roll 13 per unit time as the transport speed.

  The sensor 7 measures the temperature and humidity in the room where the dry lamination apparatus 100 is installed. The sensor 7 is a temperature / humidity meter provided at an appropriate location in the room, for example.

  The sensor 8 measures the cleanliness of the room where the dry lamination apparatus 100 is installed. As the sensor 8, for example, a dust meter that measures the amount of dust in the room can be used.

  The photographing device 6 is for photographing an object and performing an appearance inspection. In this embodiment, the product 40 being conveyed is photographed continuously. The captured image is sent in real time to an appearance inspection apparatus described later. If necessary, illumination for photographing is also provided.

(2. Quality control system 1)
FIG. 2 is a diagram showing the quality management system 1 according to the present embodiment. The quality management system 1 includes sensors 2, 3, 4, 5, 7, 8, an appearance inspection device 9, a quality management device 10, and the like.

  The appearance inspection apparatus 9 is, for example, a computer including a control unit, a storage unit, a communication unit, an input unit, a display unit, and the like. The captured image of the product 40 by the imaging device 6 is acquired by wireless communication or wired communication in real time. Defects are extracted and appearance defects are monitored. The defect extraction method is not particularly limited, and can be performed using a known image processing method such as edge extraction, binarization, and pattern classification.

  Information regarding the extracted defect is transmitted to the quality management apparatus 10 as appearance defect data. Appearance defect data includes the type of defect (wrinkles, coating unevenness, indentation, tearing, biting foreign matter, etc.), appearance time of appearance defect (for example, the shooting time of the image from which the defect is extracted), the position of the defect on the product 40, etc. There is.

  The quality management apparatus 10 can be realized by a computer including a control unit, a storage unit, a communication unit, an input unit, a display unit, and the like, for example. The quality control device 10 is connected to each sensor 2, 3, 4, 5, 7, 8 and the appearance inspection device 9 via a wireless or wired network, and from each sensor 2, 3, 4, 5, 7, 8. In addition to receiving the measurement value, the appearance defect data is received from the appearance inspection device 9.

  Further, the quality control device 10 accepts input of physical property data that is a test result of the product 40 by the test device 50. The physical property data includes the various physical property values described above, the lot number of the tested product 40, the time when the production of the product 40 of the lot is finished, and the like.

(3. Quality control method by quality control system 1)
Next, a quality management method by the quality management system 1 will be described.

(3-1. Data collection)
In the quality management system 1 of the present embodiment, data is collected when the product 40 is produced by the dry lamination apparatus 100. FIG. 3 is a flowchart showing the data collection procedure. Each step in the figure is a process executed by the control unit of the quality management apparatus 10.

  In the present embodiment, when the product 40 is produced by the dry lamination apparatus 100, the quality management apparatus 10 receives and acquires measurement values from the sensors 2, 3, 4, 5, 7, and 8 (S11). Further, the appearance defect data is received and acquired from the appearance inspection apparatus 9 (S12). The quality control device 10 collects the measurement values and appearance defect data of the sensors 2, 3, 4, 5, 7, 8 in real time when the product 40 is produced.

  In addition, the quality management apparatus 10 accepts an input of the above-described physical property data by an operator or the like (S13).

  As described above, data collection by the quality management apparatus 10 is performed. The quality management device 10 compares the measured values of the sensors 2, 3, 4, 5, 7, and 8 with the appearance defect data and physical property data, and determines which measurement value affects the appearance defect and the physical property defect. be able to.

  For example, as shown in FIG. 4A, if a measured value of a certain sensor is equal to or greater than a predetermined value during a predetermined time immediately before the appearance time of the appearance defect, the measurement value of the sensor affects the appearance defect. Can be determined. Such determination of parameters affecting appearance defects can be quickly performed in real time.

  For example, as shown in FIG. 4B, if a measured value of a sensor is less than a predetermined value during a predetermined time immediately before the occurrence time of a physical property failure, the measured value of the sensor is a physical property failure. Can be determined to affect Note that the occurrence time of the physical property failure is, for example, the time when the production of the product 40 whose physical property value is an abnormal value in the above physical property data is finished.

  These are examples of determination criteria, and the determination criteria are not limited to these. For example, when the measured value of a certain sensor continues to increase or decrease during the above-mentioned predetermined time, it may be determined that the measured value of that sensor has an effect on appearance or physical properties. In addition, there may be a case where it is determined that the measured values of a plurality of sensors affect the appearance defect and the physical property defect.

  Based on the above determination results, conditions for appearance defects such as sensor measurement values that affect appearance defects and their threshold values, such as “Wrinkles will occur if the measured value of the sensor is greater than or equal to ΔΔ”. Can be generated.

  Similarly, with respect to physical property defects, the occurrence of physical property defects such as sensor measurement values and their threshold values that affect physical property defects, such as “◎◎ If the measured value of the sensor is greater than or equal to ○, the peel strength becomes an abnormal value.” It is possible to generate a physical property defect pattern including conditions.

  The appearance defect pattern and the physical property defect pattern generated as described above are recorded in the storage unit or the like of the quality management apparatus 10. The above-described comparison determination and generation of the appearance defect pattern / physical property defect pattern based on the comparison determination can be automatically performed by the quality management apparatus 10 by setting the predetermined value, the predetermined time, and the like in advance. However, the operator or the like may compare and perform each determination.

(3-2. Quality control)
Next, in the quality management system 1 of the present embodiment, a method for performing quality management at the time of production of the product 40 by the dry lamination apparatus 100 will be described. When collecting the data, many sensors are provided to search for parameters affecting the appearance and physical properties, but in quality control, only the measured values of the sensors that are considered to affect the appearance and physical properties are measured. Since it is sufficient to measure, unnecessary sensors may be removed and only necessary sensors may be left.

  FIG. 5 is a flowchart showing a quality control procedure. Each step in the figure is a process executed by the control unit of the quality management apparatus 10.

  In the present embodiment, when the product 40 is produced by the dry lamination apparatus 100, the quality management apparatus 10 receives and acquires measurement values from each sensor in real time (S21).

  The quality management device 10 compares the measured value with the appearance defect pattern, and determines whether or not there is a possibility of appearance defect (S22). For example, if a measured value of a certain sensor corresponds to the appearance defect pattern, it is determined that there is a possibility of appearance defect.

  Further, the quality control device 10 compares the measured value with the physical property defect pattern, and determines whether or not there is a possibility of physical property failure (S23). Similarly to the above, for example, if a measured value of a certain sensor corresponds to the physical property failure pattern, it is determined that there is a possibility of physical property failure.

  When it is determined in S22 or S23 that there is a possibility of appearance failure or physical property failure (S22; “Yes” or S23; “Yes”), for example, the quality control device 10 controls to an alarm device (not shown) or the like. A signal is transmitted to generate a visual or audible alarm indicating that there is a possibility of appearance failure (physical property failure) (S24). The operator can prevent the appearance defect and the physical property defect from occurring by adjusting the production environment according to the alarm.

  On the other hand, if it is determined in S22 and S23 that there is no possibility of appearance failure and physical property failure (S22; “None” and S23; “None”), production is continued as it is.

  In the quality management system 1, the processes of S21 to S24 are repeated until the production of the product 40 is finished. In addition to this, the quality control system 1 also performs processing such as monitoring the appearance defect in real time by the appearance inspection device 9 and performing a warning similar to the above when a defect of the product 40 is extracted. The above processing can also be performed in parallel with the data collection procedure described above.

  As described above, according to the quality control system 1 of the present embodiment, a production inspection process is performed by installing a visual inspection system in a production apparatus and measuring a target visual inspection result and a sensor during production of the product 40. Thus, it is possible to immediately acquire the process parameters related to the defect, and thus it is possible to immediately know which process parameter has changed and how the process parameter related to the defect can be easily acquired when appearance defects such as wrinkles occur. Moreover, the physical property data of the product 40 is also acquired from the test result, and this is matched with the process parameter, so that the process parameter related to the physical property defect of the product 40 can also be acquired. By performing management by means of SPC using these process parameters and preventing the appearance defects and physical property defects, both the appearance defects and the physical property defects can be minimized.

  Further, the physical property data and the appearance defect data include information on the occurrence time of the physical property defect and the appearance defect such as the time when the production of the product 40 having the abnormal physical property value is finished and the photographing time of the image from which the defect is extracted. These can be used to match the time variation of the process parameter and obtain the process parameter that caused it. In addition, the information regarding the occurrence time of the physical property defect and the appearance defect is not limited to the above, and may be information associated with the occurrence time. For example, when the sampling position of the test piece in the product 40 is related to the time when the product 40 is produced up to that position, the sampling position of the test piece can be included in the physical property data and used.

  Further, the quality control system 1 can automatically generate a physical property defect pattern and an appearance defect pattern, thereby further reducing process parameter investigation time and investigation effort. In addition, by monitoring the appearance defect by the appearance inspection device 9, it is possible to cope immediately even if an appearance defect occurs, to prevent the occurrence of continuous defects, and to improve the yield.

  However, the present invention is not limited to the above embodiment. As an example, the arrangement of each sensor and the imaging device 6 can be freely determined. For example, as another embodiment, while monitoring the appearance defect using the photographing object 6 of the photographing apparatus 6 as the film 20, the appearance defect data of the film 20 is obtained and the appearance defect pattern is generated, and the quality control by the SPC or the like using the data. By performing this, it is possible to prevent the abnormality of the film 20 being conveyed.

  In the above embodiment, the dry lamination apparatus 100 is described as an application example of the quality management system 1, but the present invention is not limited to this. As other embodiments, the present invention can be applied to various production apparatuses such as various printing apparatuses.

  Moreover, the measured value by a sensor is not restricted to the above, The measured value according to an application object is measured. Examples include the temperature / PH / concentration of various chemicals, the temperature of the heater roll, the viscosity / coating amount of the adhesive, the environmental temperature, and the extrusion width / extrusion thickness of the extrusion molding apparatus.

  The preferred embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to such examples. It will be apparent to those skilled in the art that various changes or modifications can be conceived within the scope of the technical idea disclosed in the present application, and these are naturally within the technical scope of the present invention. Understood.

DESCRIPTION OF SYMBOLS 1; Quality control system 2, 3, 4, 5, 7, 8; Sensor 6; Imaging | photography apparatus 9; Appearance inspection apparatus 10; Quality control apparatus 20, 30; Film 40;

Claims (7)

A quality control system for quality control in the production process,
Means for obtaining process parameter to obtain a physical property defect pattern, which is a process parameter condition that causes physical property defect of the product by comparison with physical property data of the product;
Means for obtaining appearance defect data based on a target captured image to obtain an appearance defect pattern that is a condition of a process parameter in which appearance defects occur by comparison with the process parameter;
A quality control system characterized by comprising: The physical property data includes information on the occurrence time of physical property failure,
The quality control system according to claim 1, wherein the appearance defect data includes information related to occurrence time of appearance defects. Based on the comparison between the physical property data and the process parameter, the means for generating the physical property failure pattern,
Based on the comparison between the appearance defect data and the process parameters, the means for generating the appearance defect pattern,
The quality management system according to claim 1, further comprising:   The quality control system according to any one of claims 1 to 3, further comprising an appearance inspection device that monitors an appearance defect based on a photographed image obtained by photographing an object with the photographing device. A quality control system for quality control in the production process,
Means for obtaining process parameters;
Means for determining the presence or absence of the possibility of physical property failure using the acquired process parameter and a physical property failure pattern that is a condition of a process parameter causing a physical property failure of a product;
Means for determining the presence or absence of appearance defects, using the acquired process parameters and an appearance defect pattern that is a condition of process parameters causing appearance defects;
A quality control system characterized by comprising: A quality control method for quality control in a production process,
A step of obtaining process parameters for obtaining a physical property defect pattern, which is a process parameter condition that causes physical property defects of the product by comparison with physical property data of the product;
Obtaining external appearance defect data based on a target captured image to obtain an external appearance defect pattern, which is a process parameter condition that causes an external appearance defect by comparison with the process parameters;
A quality control method comprising: A quality control method for quality control in a production process,
Obtaining process parameters;
Using the acquired process parameter and a physical property defect pattern that is a condition of a process parameter in which a physical property defect of a product occurs, determining whether or not there is a possibility of occurrence of a physical property defect;
Using the acquired process parameters and an appearance defect pattern that is a condition of process parameters causing appearance defects, determining whether or not there is a possibility of appearance defects;
A quality control method comprising:

Images