JP2015528563A5 - - Google Patents

Download PDF

Info

Publication number
JP2015528563A5
JP2015528563A5 JP2015525931A JP2015525931A JP2015528563A5 JP 2015528563 A5 JP2015528563 A5 JP 2015528563A5 JP 2015525931 A JP2015525931 A JP 2015525931A JP 2015525931 A JP2015525931 A JP 2015525931A JP 2015528563 A5 JP2015528563 A5 JP 2015528563A5
Authority
JP
Japan
Prior art keywords
pressure dependent
artifact
magnitude
dependent diamond
reference spectrum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015525931A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015528563A (ja
JP6210462B2 (ja
Filing date
Publication date
Priority claimed from GB1213997.8A external-priority patent/GB2504928A/en
Application filed filed Critical
Publication of JP2015528563A publication Critical patent/JP2015528563A/ja
Publication of JP2015528563A5 publication Critical patent/JP2015528563A5/ja
Application granted granted Critical
Publication of JP6210462B2 publication Critical patent/JP6210462B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015525931A 2012-08-06 2013-07-23 ダイヤモンドatrアーチファクト補正 Expired - Fee Related JP6210462B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1213997.8A GB2504928A (en) 2012-08-06 2012-08-06 Diamond attenuated total reflectance spectrum artefact correction
GB1213997.8 2012-08-06
PCT/GB2013/000320 WO2014023924A1 (en) 2012-08-06 2013-07-23 Diamond atr artefact correction

Publications (3)

Publication Number Publication Date
JP2015528563A JP2015528563A (ja) 2015-09-28
JP2015528563A5 true JP2015528563A5 (enExample) 2017-08-24
JP6210462B2 JP6210462B2 (ja) 2017-10-11

Family

ID=46934948

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015525931A Expired - Fee Related JP6210462B2 (ja) 2012-08-06 2013-07-23 ダイヤモンドatrアーチファクト補正

Country Status (6)

Country Link
US (1) US10018561B2 (enExample)
EP (1) EP2880422A1 (enExample)
JP (1) JP6210462B2 (enExample)
CA (1) CA2878884C (enExample)
GB (1) GB2504928A (enExample)
WO (1) WO2014023924A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102277902B1 (ko) * 2014-09-05 2021-07-15 삼성전자주식회사 피검체 접촉압력 측정기와 그 제조 및 측정방법
CN113970531B (zh) * 2020-07-24 2025-02-11 中国石油化工股份有限公司 一种校正光谱的方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3146700A1 (de) * 1981-11-25 1983-07-07 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und vorrichtung zur detektion thermooptischer signale
US5579462A (en) * 1994-11-03 1996-11-26 Bio-Rad Laboratories User interface for spectrometer
EP0982584B1 (en) * 1998-08-28 2006-02-08 Perkin-Elmer Limited Spectrometer accessory for carrying out attenuated total reflectance measurements
JP2001091452A (ja) * 1999-09-27 2001-04-06 Shimadzu Corp Atrマッピング測定装置
GB0320925D0 (en) * 2003-09-06 2003-10-08 Smiths Group Plc Spectrometer apparatus
EP1550854A2 (en) * 2003-12-30 2005-07-06 Rohm And Haas Company Method for diagnosing and identifying contaminants
US20070170362A1 (en) * 2006-01-25 2007-07-26 The Regents Of The University Of California Method and apparatus for internal reflection imaging
DE102006036808A1 (de) * 2006-08-07 2008-02-14 Bruker Optik Gmbh Strukturierter ATR-Kristall aus Diamant
JP4784755B2 (ja) * 2006-09-14 2011-10-05 株式会社島津製作所 Atr自動密着装置
JP2008209371A (ja) * 2007-02-28 2008-09-11 Toppan Printing Co Ltd 赤外分光分析用加圧セル
JP2009002703A (ja) * 2007-06-19 2009-01-08 Shimadzu Corp ダイヤモンド検査装置
US8629399B2 (en) * 2009-09-22 2014-01-14 Bp Corporation North America Inc. Methods and apparatuses for measuring biological processes using mid-infrared spectroscopy
JP5576696B2 (ja) * 2010-04-14 2014-08-20 日本分光株式会社 紫外線硬化樹脂の物性測定装置
JP4997652B2 (ja) * 2010-06-10 2012-08-08 横河電機株式会社 分光分析装置
EP2852828B1 (en) * 2012-05-23 2016-04-06 GlaxoSmithKline Biologicals S.A. Method for determining a concentration of a polysorbate species in a mixture

Similar Documents

Publication Publication Date Title
EP3534281A4 (en) DEVICE, METHOD AND PROGRAM FOR DETERMINING DISEASE DEVELOPMENT
JP2013188229A5 (enExample)
EP3057033A4 (en) Fingerprint identification element, display screen and display device
EP3240029A4 (en) Display substrate, manufacturing method and display device thereof
IL263480B (en) Polishing pad and polishing method using same
EP3151278A4 (en) Array substrate and manufacturing method therefor, and display device
EP3128548A4 (en) Semiconductor device, layered semiconductor device, sealed-then-layered semiconductor device, and manufacturing methods therefor
TWI563258B (en) Probe head, probe card assembly using the same, and manufacturing method thereof
SG10201407479UA (en) Dynamic Handwriting Verification And Handwriting-Based User Authentication
EP3153957A4 (en) Array substrate and manufacturing method therefor, and display device
EP3270415A4 (en) Display backplate and manufacturing method therefor, and display device
EP3242516A4 (en) Narrowband allocation method and device, and narrowband allocation acquiring method and device
EP3199934A4 (en) Pressure change measurement device, altitude measurement device, and pressure change measurement method
FI20145862A7 (fi) Kannettava biometrinen laite ja menetelmä sen valmistamiseksi
EP3200038A4 (en) Model evaluation device, model evaluation method, and program recording medium
JP2014022036A5 (enExample)
EP3171398A4 (en) Array substrate and manufacturing method therefor, and display apparatus
EP3128549A4 (en) Semiconductor device, layered semiconductor device, sealed-then-layered semiconductor device, and manufacturing methods therefor
EP3136085A4 (en) Spectroscopic quantification method, and spectroscopic quantification device and program
SG11201704948TA (en) Patterned stamp manufacturing method, patterned stamp and imprinting method
EP3205418A4 (en) Material-property-value estimating method, material-property-value estimating device, and steel-strip manufacturing method
EP3246841A4 (en) Data assessment device, data assessment method, and program
JP2016540360A5 (ja) 基板処理システム及び基板処理方法
EP3012576A4 (en) Measurement method, measurement device, measurement program, and computer-readable recording medium recording measurement program
DE102013001948A8 (de) Oberflächenformmessverfahren und -vorrichtung, Computerprogramm, computerlesbares nichtflüchtiges Speichermedium. optisches Element und dessen Herstellungsverfahren