JP2015510653A - Analog memory cell programming and erasing methods - Google Patents

Abstract

A method for storing data is applied to a group of memory cells in a memory including a plurality of analog memory cells based on one or more data values stored in at least one of the memory cells in the memory. Setting the parameters of the iterative process to be performed. The iterative process is executed in the memory cell group according to the set parameters. [Selection] Figure 1

Description

  The present invention relates generally to data storage, and more particularly to a method and system for programming and erasing analog memory cells.

  Some types of memory devices, such as flash memory, use an array of analog memory cells to store data. Each analog memory cell holds a given physical quantity at a certain level, such as charge or voltage, thereby representing the data stored in the cell. This level of physical quantity is also called a stored value or an analog value. For example, in a flash memory, each analog memory cell holds a specific amount of charge. The possible range of analog values is usually divided into several regions, each region corresponding to a programming state representing one or more data bit values. Data is written to the analog memory cell by writing a nominal analog value corresponding to the desired bit.

  Some memory devices, commonly referred to as single level cell (SLC) devices, store a single bit of information in each memory cell. That is, each memory cell can be programmed to assume two possible memory states. Higher density devices, often referred to as multilevel cell (MLC) devices, can store more than one bit per memory cell, ie, can be programmed to take more than two possible memory states. it can.

  Regarding flash memory, for example, in “Introduction to Flash Memory”, Processeds of the IEEE, volume 91, number 4, April, 2003, pages 489-502, which is incorporated herein by reference. Is explained by. For multi-level flash cells and their devices, see, for example, “Multilevel Flash Cells and the Tair Trade-Offs”, Proceedings of the 1996, IEEE International Electronics IME, which is incorporated herein by reference. New York, pages 169-172, described by Eitan et al. This paper compares several types of multi-level flash cells such as common ground cells, DINOR cells, AND cells, NOR cells, and NAND cells.

Eitan et al., “Can NROM, a 2-bit, Trapping Storage NVM Cell, Give a Real Challenge to Floating Gate Cells?”, Proceedings of the World 1999, which is incorporated herein by reference. and Materials (SSDM), Tokyo, Japan, September 21-24, 1999, pages 522-524, describe another type of analog memory cell called nitride read only memory (NROM). The NROM cell is also incorporated herein by reference, “A 512 Mb NROM Flash Data Storage Memory with 8 MB / s Data Rate”, Proceedings of the 2002 ISCE International Society. In San Francisco, California, February 3-7, 2002, pages 100-101, also described by Mayan et al. Other exemplary types of analog memory cells include floating gate (FG) cells, ferroelectric RAM (FRAM) cells, magnetic RAM (MRAM) cells, charge trap flash (CTF) cells, and phase change RAM (PRAM). , Also called phase change memory (PCM)) cells. FRAM, MRAM, and for PRAM cell, for example, are incorporated herein by reference, "Future Memory Technology including Emerging New ^{Memories", Proceedings of the 24 th International Conference} on Microelectronics (MIEL), Nis, Serbia and Montenegro, May 16-19, 2004, volume 1, pages 377-384, as described by Kim and Koh.

  There are various known methods in the art for programming and erasing analog memory cells. Some memory devices use an iterative process of programming and verification (P & V) that applies a pulse train to a group of memory cells and verifies the programmed values during that time.

  Certain embodiments of the invention described herein provide a method of data storage. The method includes setting the memory cells in the group to their respective analog values by performing an iterative process of applying a pulse train to the group of analog memory cells. During the iterative process, the progress of the iterative process is evaluated, and the parameters of the iterative process are modified according to the evaluated progress. The iterative process continues according to the modified parameters.

  In some embodiments, performing the iterative process includes programming memory cells in the group with data. In another embodiment, performing the iterative process includes erasing a group of memory cells.

  In some embodiments, the step of evaluating progress comprises evaluating that the number of memory cells in the group that have reached their intended analog value as a result of the pulse exceeds a predetermined number. Including. Modifying the parameter can include modifying the pulse amplitude or pulse width increment between successive pulses in the pulse train. In another embodiment, evaluating the progress includes evaluating that the number of pulses applied to the memory cells in the group exceeds a predetermined number.

  In certain disclosed embodiments, the step of modifying the parameters includes increasing the pulse amplitude or pulse width between successive pulses in the pulse train, the amplitude or width of the initial pulse in the pulse train, the word line applied to the memory cells. A programming voltage, a word line deselection voltage applied to another group of memory cells, a bit line programming voltage applied to a memory cell intended to receive a subsequent pulse in the group, and / or a subsequent in group Modifying the bit line inhibit voltage applied to the memory cell intended to be inhibited from receiving the current pulse.

  The step of modifying the parameter depends on the bit line programming voltage applied to the memory cells intended to receive subsequent pulses in the group, Modifying a word line deselect voltage applied to the memory cell group or a bit line inhibit voltage applied to a memory cell intended to inhibit reception of a subsequent pulse in the group. .

  According to an embodiment of the present invention, there is further provided a data storage device including a memory and a storage circuit. The memory includes a plurality of analog memory cells. The storage circuit executes the iterative process of applying a pulse train to a group of analog memory cells, sets the memory cells in the group to respective analog values, evaluates the progress of the iterative process, and according to the evaluated progress The iterative processing parameter is modified, and the iterative processing is continued according to the modified parameter.

  In accordance with certain embodiments of the present invention, a method for storing data in a memory including a plurality of analog memory cells is also provided. The method includes setting iteration parameters applied to a group of memory cells based on one or more data values stored in at least one of the memory cells in the memory. The iterative process is executed in the memory cell group according to the set parameters.

  In some embodiments, performing the iterative process includes programming memory cells in the group with data. In another embodiment, performing the iterative process includes erasing a group of memory cells. In some embodiments, setting the parameter includes copying a data value from at least one of the memory cells to an alternative storage location and setting the parameter based on the copied data value.

  In another embodiment, setting the parameters includes incrementing the pulse amplitude or pulse width between successive pulses in the iterative process, initial pulse amplitude or width in the iterative process, word line programming applied to the memory cells. A voltage, a word line deselect voltage applied to another group of memory cells, a bit line programming voltage applied to a memory cell intended to receive a subsequent pulse in the group, and / or a subsequent in group Setting a bit line inhibit voltage applied to a memory cell intended to inhibit the reception of a pulse.

  According to an embodiment of the present invention, there is further provided a data storage device including a memory and a storage circuit. The memory includes a plurality of analog memory cells. The storage circuit sets a parameter for an iterative process applied to the group of memory cells based on one or more data values stored in at least one of the memory cells in the memory, and according to the set parameter An iterative process is performed in the memory cell group.

  According to an embodiment of the present invention, there is further provided a method for storing data in a memory including a plurality of analog memory cells. The method includes programming one or more of the memory cells with data by performing a programming operation. A performance index of a programming operation performed on the programmed memory cell is evaluated. After performing the programming operation, an erase operation is configured based on the performance index of the programming operation, and the group of memory cells of the memory is erased by executing the configured erase operation.

  In some embodiments, evaluating the performance metric includes measuring a duration of a programming operation. In some embodiments, the steps of configuring the erase operation include increasing the pulse amplitude or pulse width between successive erase pulses in the erase operation, the initial pulse amplitude or width in the erase operation, the word line applied during the erase operation. Setting a voltage and / or a bit line voltage applied during an erase operation.

  In one embodiment, estimating the performance metric includes determining the number of programming and erasing cycles applied to the programmed memory cell, and configuring the erasing operation includes determining the determined programming and erasing Configuring an erase operation based on the number of cycles.

  According to an embodiment of the present invention, an apparatus for data storage including a memory and a storage circuit is also provided. The memory includes a plurality of analog memory cells. The storage circuit programs one or more of the memory cells with data by performing a programming operation, evaluates a performance index of the programming operation performed on the programmed memory cell, and executes the programming operation. An erase operation is configured based on the performance index of the programming operation, and the group of memory cells of the memory is erased by executing the configured erase operation.

  According to an embodiment of the present invention, there is further provided a method for storing data in a memory including a plurality of analog memory cells. The method includes applying to the memory cell group an operation for setting the group of memory cells to a respective analog value. The performance index of the operation applied to the memory cell group is evaluated. Based on the performance index of the evaluated operation, the health status of the memory block containing this group in the memory is evaluated.

  Applying the operations can include programming memory cells in the group with data. Alternatively, applying the operation can include erasing a group of memory cells. In some embodiments, evaluating the performance index includes measuring a duration of operation. In another embodiment, evaluating the health condition includes marking the memory block as bad when the performance index is outside a predetermined range. In yet another embodiment, evaluating the health condition includes marking the memory block for further evaluation when the performance index is outside a predetermined range. In yet another embodiment, evaluating the health condition includes setting a storage configuration for storage of data in subsequent memory blocks depending on the performance index.

  According to an embodiment of the present invention, there is further provided a data storage device including a memory and a storage circuit. The memory includes a plurality of analog memory cells. The storage circuit applies the operation of setting each analog value to the group of memory cells to the group of memory cells, evaluates the performance index of the operation applied to the memory cell group, and based on the performance index of the evaluated operation And is configured to evaluate the health status of the memory block including this group in the memory.

  The invention will be more fully understood from the following detailed description of embodiments of the invention in conjunction with the following drawings, in which:

1 is a block diagram schematically illustrating a memory system according to an embodiment of the present invention. 1 is a circuit diagram schematically illustrating an array of analog memory cells according to an embodiment of the present invention. FIG. FIG. 3 is a diagram schematically illustrating a process of programming a group of analog memory cells according to an embodiment of the present invention. 6 is a diagram schematically illustrating a process of erasing a group of analog memory cells according to an embodiment of the present invention. FIG. 6 is a flowchart schematically illustrating a method of programming or erasing a group of analog memory cells according to an embodiment of the present invention. 5 is a flowchart schematically illustrating a method for programming a group of analog memory cells according to an embodiment of the present invention. 4 is a flowchart schematically illustrating a method for erasing a group of analog memory cells according to an embodiment of the present invention. 5 is a flowchart schematically illustrating a method for evaluating a health level of a group of analog memory cells according to an embodiment of the present invention.

Overview In a memory device such as a flash memory, data is typically stored in memory cells by programming the analog memory cells to their respective analog values representing the stored bit values. Each bit value corresponds to a respective programming level or programming state represented by a particular region of analog values.

  In some memory devices, a group of analog memory cells is programmed in an iterative process of programming and verification (P & V) that applies a programming pulse train to the memory cells in the group. The analog value of the memory cell is verified during the pulse train by comparing each analog value with a respective verification threshold corresponding to the intended programming state of the memory cell being programmed. Programming continues only for memory cells whose analog values are still below their respective verification thresholds. The other memory cells are assumed to be programmed correctly and reception of subsequent programming pulses is suppressed. A block of flash memory cells is typically erased using a repeated erase process that applies an erase pulse train to the memory cells in the block. The analog values of the memory cells are verified during the pulse train by comparing them with the erase threshold.

  The embodiments of the present invention described below provide an improved method and system for programming and erasing analog memory cells, such as flash cells. The disclosed technique achieves shorter programming and erasing times and higher programming and erasing reliability compared to conventional programming and erasing schemes.

  In some embodiments, a storage circuit (eg, a read / write circuit coupled to a memory cell or memory controller) evaluates the progress of the iterative process of programming or erasing, and one of the iterative processes based on the evaluated progress. Modify one or more parameters. Progress can be assessed, for example, with respect to the percentage of memory cells that have reached the intended analog value, or with respect to the number of programming or erase pulses applied to the memory cells.

  Based on progress, for example, pulse amplitude or pulse width increments between successive programming pulses or successive erase pulses, initial pulse amplitude, or various word line voltages applied during the programming or erase process or Various programming or erasing parameters such as bit line voltage can be modified.

  In an alternative embodiment, the storage circuit sets one or more parameters of the programming or erasing process based on data stored in one or more of the memory cells. In other embodiments, the storage circuit configures one or more parameters of the erase operation based on the performance of the programming operation. For example, the storage circuit can measure the average programming time for a page in a particular memory block and configure the erase operation for that block depending on the measured programming time.

In yet another embodiment, the storage circuit evaluates the health status of the memory block based on performance indicators of programming or erasing operations performed within the block (eg, based on programming time or erasing time).
System description

  FIG. 1 is a block diagram schematically illustrating a memory system 20 according to an embodiment of the present invention. The system 20 includes a computing device, a cellular phone or other communication terminal, a removable memory module (sometimes referred to as a “USB flash drive”), a solid state disk (SSD), a digital camera, a music player, or other media player. And / or can be used in various host systems and devices, such as any other system or device in which data is stored and retrieved.

  The system 20 includes a memory device 24, and the memory device that stores data in the memory cell array 28 includes a plurality of memory blocks 34. Each memory block 34 includes a plurality of analog memory cells 32. In the context and claims of this patent application, the term “analog memory cell” is used to describe any memory cell that holds a continuous analog value of a physical parameter such as voltage or charge. The array 28 includes, for example, NAND, NOR, and charge trap flash (CTF) cells, phase change RAM (PRAM, also called phase change memory (PCM)), nitride read only memory (NROM), and ferroelectric RAM. Any type of analog memory cell may be provided, such as (FRAM), magnetic RAM (MRAM), and / or dynamic RAM (DRAM) cells.

  In this specification, the charge level stored in a cell and / or the analog voltage or current written to and read from the cell are collectively referred to as an analog value, an analog stored value, or a stored value. The stored value can include, for example, a threshold voltage or any other suitable type of stored value. System 20 stores data in analog memory cells by programming the cells to take their respective programming states (also called programming levels). Programming states are selected from a finite set of possible states, each programming state corresponding to a certain nominal stored value. For example, a 3 bit / cell MLC can be programmed to take one of eight possible programming states by writing one of eight possible nominal stored values into the cell. .

  The memory device 24 includes a read / write (R / W) unit 36 that converts data stored in the memory device into analog stored values and writes them into the memory cells 32. In form, the R / W unit does not perform the conversion and is supplied with voltage samples, i.e. stored values for storage in the cell. When reading data from the array 28, the R / W unit 36 converts the stored value of the memory cell 32 into a digital sample having a resolution of 1 bit or more. Usually, data is written to and read from memory cells in groups called pages. In some embodiments, the R / W unit can erase a group of cells 32 by applying one or more negative erase pulses to the cells. Normally, erasing is performed on the entire memory block.

  Data is stored in and retrieved from the memory device 24 by the memory controller 40. The memory controller includes an interface 44 that communicates with the memory device 24 and a processor 48 that performs various memory management functions. The memory controller 40 receives data to be stored in the memory device and communicates with the host 52 to output the data retrieved from the memory device. The memory controller 40, in particular the processor 48, can be implemented in hardware. Alternatively, the memory controller can include a microprocessor executing suitable software, or a combination of hardware and software elements.

  The configuration of FIG. 1 is merely an exemplary system configuration shown for conceptual clarity. Any other suitable memory system configuration may be used. Elements that are not necessary to understand the principles of the present invention, such as various interfaces, addressing circuits, timing and sequencing circuits, and debugging circuits, have been omitted from the figure for clarity.

  Although the example of FIG. 1 shows a single memory device 24, the system 20 can comprise multiple memory devices controlled by a memory controller 40. In the exemplary system configuration shown in FIG. 1, memory device 24 and memory controller 40 are implemented as two separate integrated circuits (ICs). However, in an alternative embodiment, the memory device and memory controller can be integrated on separate semiconductor dies in a single multi-chip package (MCP) or system on chip (SoC) and interconnected by an internal bus can do. As a further alternative, some or all of the memory controller circuitry may reside on the same die where the memory array is located. As a further alternative, some or all of the functionality of the memory controller 40 may be implemented in software and executed by a processor or other element of the host system. In some embodiments, the host 52 and the memory controller 40 can be fabricated on the same die or on separate dies in the same device package.

  In some embodiments, the memory controller 40 comprises a general purpose processor programmed in software to perform the functions described herein. The software can be downloaded to the processor in electronic form, for example via a network, or by another method or additionally by a permanent tangible medium such as magnetic memory, optical memory or electronic memory Can be provided and / or stored.

  In the configuration example of the array 28, the memory cells 32 are arranged in a plurality of rows and columns, and each memory cell includes a floating gate transistor. The gates of the transistors in each row are connected by a word line, and the sources of the transistors in each column are connected by a bit line. A memory array is usually divided into a plurality of pages (ie, groups of memory cells that are programmed and read simultaneously). A page may be subdivided into sectors. In some embodiments, each page includes an entire row of the array. In an alternative embodiment, each row (word line) can be divided into two or more pages. For example, in some devices, each row is divided into two pages, one containing odd-order cells and the other containing even-order cells.

Generally, the memory controller 40 programs data in units of pages, but erases the entire memory block 34. Generally, but not necessarily, the memory block is about 10 ⁶ memory cells, while the page is about 10 ³ to 10 ⁴ memory cells.

  Several examples of techniques for programming and erasing memory cells 32 of array 28 are described below. The disclosed techniques may be performed by the memory controller 40 and / or the R / W unit 36. For purposes of clarity, the following description refers to programming and erasing processes performed by the R / W unit 36 in the memory device. In general, however, the various tasks that make up the disclosed programming and erasing techniques can be divided between the memory controller and the R / W circuit in any suitable manner, or of these elements Can be performed by any one of the following: Therefore, in the context and claims of this patent application, the memory controller 40 and the R / W circuit 36 are collectively referred to as a storage circuit that implements the disclosed technique.

  FIG. 2 is a circuit diagram that schematically illustrates an array of analog memory cells that can be used to implement array 28, in accordance with an embodiment of the present invention. In this embodiment, the array comprises a plurality of flash memory cells (shown as floating gate transistors in the figure) connected by word lines 64 and bit lines 68.

  In some embodiments, the R / W unit 36 uses programming and verification (P & V) iterations to process a group of memory cells (eg, all memory cells of an word line, odd order) of a given word line 64. Or even-order cells) with data. In such a process, unit 36 applies a programming pulse train to this group of cells and verifies the threshold voltage of the cells in the group after each pulse. Unit 36 inhibits subsequent programming of cells that have reached their intended threshold voltage. This ensures that subsequent pulses are selectively applied only to cells that have not yet reached the intended threshold voltage.

  During P & V processing, unit 36 biases the various word lines 64 and bit lines 68 with suitable voltages. The example of FIG. 2 shows three word lines 64, of which the middle word line is being programmed. This example shows a specific example during the P & V process in which the memory cell 72 is programmed (since it has not yet reached its intended threshold voltage). At the same time, the memory cell 80 of the same word line has already reached its intended threshold voltage, so programming must be inhibited. Other word line memory cells, such as memory cell 80, must not be programmed.

  To program the appropriate memory cell, the R / W unit 36 biases the middle word line with a programming voltage labeled Vpgm and the other word lines in the block with a pass voltage labeled Vpass_pgm. . Unit 36 biases the bit line to be programmed with a bit line programming voltage labeled Vbitline_pgm, and biases the bit line that should be inhibited from programming with a bit line inhibit voltage labeled Vbitline_inhibit.

  FIG. 3A is a diagram schematically illustrating a process of programming a group of analog memory cells 28 according to an embodiment of the present invention. This example shows a group of 2 bit / cell memory cells programmed with data (eg, all memory cells on a word line, odd-order cells, or even-order cells). Each cell is programmable to one of four possible programming levels (also referred to as programming states) corresponding to the four threshold voltage distributions 84A-84D. Each programming level corresponds to a respective 2-bit data value. The programming level 84A corresponding to the negative threshold voltage also serves as an erased level. All memory cells in the group are set to an erased level before programming begins.

  In some embodiments, the R / W unit 36 programs the memory cells in the group using the P & V iteration process described above. When verifying the threshold voltage of a cell after a given programming pulse, unit 36 compares the threshold voltage of the cell with one or more verification thresholds. In this example, unit 36 uses three verification thresholds 88A-88C that correspond to programming levels 84B-84D, respectively. When the threshold voltage of a particular memory cell intended to be programmed to a particular programming level exceeds the verification threshold for that programming level, the memory cell is inhibited from receiving subsequent programming pulses. Inhibition is usually performed by switching the bit line voltage of the cell from Vbitline_pgm to Vbitline_inhibit.

  (For the sake of clarity, this example shows a programming process that simultaneously programs four programming levels. In some embodiments, unit 36 includes a group of memory cells having two pages in two phases. (Ie, one phase programs the first page using two programming levels, and the second phase programs the second page using all four programming levels.)

  FIG. 3B is a diagram schematically illustrating a process of erasing a group of analog memory cells 28 according to an embodiment of the present invention. The erase process is usually applied to the entire block 34 simultaneously. In the erase process, unit 36 verifies the threshold voltage of the cell by applying a sequence of erase pulses to the memory cell and comparing them to an erase threshold 92. The erase process continues until all memory cells in the block (or a predetermined managed number of cells in some embodiments) have a threshold voltage lower than threshold 92.

The embodiment of FIGS. 3A and 3B refers to programming and erasing of 2 bit / cell memory cells. However, the disclosed techniques may be applied to any other suitable type of memory cell having any desired number and arrangement of programming levels.
Adaptive modification of programming / erase iteration parameters based on programming / erase progress

  In some embodiments, when programming or erasing a group of analog memory cells, the R / W unit 36 evaluates the progress of the iterative programming or erasing process. When the progress meets certain switching conditions, unit 36 modifies one or more of the processing parameters.

  Unit 36 can evaluate progress in various ways, i.e., can define and evaluate various types of switching conditions. For example, unit 36 may determine whether a predetermined percentage of the memory cells in the group has reached an intended threshold voltage (eg, an appropriate verify threshold has been exceeded for a programming operation, or an erase threshold for an erase operation is set). Can be checked). In an erase operation, unit 36 can evaluate the number of cells that have been sufficiently erased after the first erase pulse or two erase pulses. In an alternative embodiment, unit 36 may add up the number of cells in two or more different verification stages of the iterative process.

  When using this type of condition, the R / W unit 36 can assume that the data is scrambled, or in other words, evenly distributed among the programming levels. In alternative embodiments, the R / W circuit can determine the number of cells at each programming level before initiating a programming operation, or can obtain this information in any other suitable manner.

  As another example of the switching condition, there is a method of correcting the programming parameter or the erasing parameter after executing the repetitive process a predetermined number of times, that is, after applying the predetermined number of programming pulses or the erasing pulse. As a further alternative, the R / W unit can evaluate the switching condition by determining the absolute value of certain parameters related to programming or erasure.

  In various embodiments, the R / W unit can modify any suitable parameter of the programming or erase iteration when the switching condition is met. For example, the parameter may be an increment of pulse amplitude or pulse width between successive programming / erase pulses in the pulse train (sometimes referred to as incremental step pulse programming (ISPP)), and / or the initial pulse amplitude or width of the pulse train. Can be included.

  Additionally or alternatively, in a programming operation, the modified parameters are: pass voltage applied to unselected word lines (Vpass_pgm), word line voltage applied to selected word lines (Vpgm). ), The bit line voltage applied to the programmed cell (Vbitline_pgm), the bit line voltage applied to the inhibited cell (Vbitline_inhibit), and / or any other suitable parameter. Additionally or alternatively, in an erase operation, the parameters that are modified can include, for example, a word line voltage and / or a bit line voltage applied within the block being erased.

  In an exemplary embodiment, unit 36 evaluates the number of memory cells that have reached the intended programming level within the group. When that percentage exceeds a predetermined value, unit 36 changes the increment of pulse amplitude between successive pulses.

  In another exemplary embodiment, unit 36 begins the erase process with a high erase pulse voltage. When the percentage of memory cells successfully erased reaches a certain predetermined value, unit 36 reduces the erase pulse voltage of subsequent pulses.

  In another embodiment, the R / W unit 36 modifies one or more of the bias voltages (eg, Vbitline_pgm, Vbitline_inhibit, Vpass_pgm) as a function of Vpgm. This type of programming allows the unit 36 to optimize the word line voltage and / or the bit line voltage and efficiently program the memory cells.

  Voltage optimization can be performed, for example, to minimize program interference from adjacent memory cells (on adjacent word lines and / or adjacent bit lines). In some embodiments, the optimization is performed as a function of the absolute value of Vpgm.

  FIG. 4 is a flow chart that schematically illustrates a method for programming or erasing a group of analog memory cells 32, in accordance with an embodiment of the present invention. The method begins with an initialization step 96 in which the R / W unit 36 begins an iterative process of programming or erasing within a group of memory cells.

  At some point during the programming or erasure process, unit 36 evaluates the progress of the process in progress evaluation step 100. In a completion check step 104, the unit 36 checks whether the processing is complete. Unit 36 can, for example, check whether all cells have reached the intended threshold voltage. If the processing is complete, the method ends at end step 108.

Alternatively, in the switching condition evaluation step 112, the unit 36 checks whether a predetermined switching condition is satisfied (based on the progress evaluated in step 100). If the progress of the iterative process satisfies the switching condition, in parameter modification step 116, unit 36 modifies one or more of the parameters of the iterative process. The method then loops back to step 100, where unit 36 continues to monitor the progress of the iterative process.
Adaptive setting of programming processing parameters based on data

  In some embodiments, the R / W unit 36 sets one or more parameters of the programming or erase iteration based on data currently stored in one or more of the memory cells. . Any suitable programming or erasure processing parameters such as the parameters listed above (eg, ISPP, amplitude or width of the initial pulse in the pulse train, and / or any word line or bit line voltage) Can be set.

  For example, when programming a group of memory cells (eg, a page), unit 36 may be based on data stored on the same word line as the programmed group and / or one or more other (eg, adjacent). Programming parameters can be set based on the data stored in the word line. For example, unit 36 may set Vbitline_pgm based on the data (or threshold voltage) in the corresponding cell of the adjacent word line below or above the programmed group of word lines. In some embodiments, unit 36 may first read the data used to set the programming parameters and store it in an alternative location prior to programming.

  As another example, when erasing a block, unit 36 may set one or more parameters for the erasure process based on the data stored in the block. For example, unit 36 may set the erase process parameters as a function of the number of word lines programmed in the block prior to erase. In an exemplary embodiment, unit 36 sets a certain erase voltage (Verase) when all word lines in the block are programmed, and only a portion of the word lines are programmed. Set a different erase voltage. In some embodiments, the memory controller 40 provides an indication to the unit 36 regarding the number of word lines being programmed. In other embodiments, unit 36 determines the number of word lines that are programmed independently of the memory controller. In some embodiments, unit 36 changes one or more parameters of the programming process based on the number of programmed word lines in the block.

  As yet another example, if the block contains many memory cells that are programmed to a high threshold voltage, unit 36 can set the initial amplitude of the erase pulse to a high value, and vice versa. Is possible.

  FIG. 5 is a flow chart that schematically illustrates a method for programming a group of analog memory cells 32, in accordance with an embodiment of the present invention. Although the description of FIG. 5 refers to a programming process for a group of memory cells, a similar method can also be used for the erasing process.

The method begins with reading data from one or more memory cells by unit 36 in read step 120. The read memory cell may or may not belong to the group of memory cells being programmed. In parameter setting step 124, unit 36 sets one or more parameters of the programming process based on the data read in step 120. The unit 36 then stores the data in the memory cells in programming step 128 using an iterative programming process with the set parameters.
Setting erasure processing parameters based on the performance of the programming process

  In some embodiments, unit 36 configures an erase operation applied to a group of memory cells based on the performance of the program operation applied to the memory. Generally, but not necessarily, the erase operation of a given group of cells (eg, a block) is the performance of a program operation applied to one or more memory cells (eg, a page in the block) within that group. Based on

  The fact is that the memory cell's responsiveness to a program operation (typically applying a positive voltage programming pulse) suggests the memory cell's responsiveness to an erase operation (typically applying a negative voltage programming pulse) Based on. Unit 36 may evaluate any suitable type of performance index of the programming operation and configure the erase operation in any suitable manner based on the evaluated performance index.

  For example, unit 36 may measure the programming time (duration) of a programming operation (eg, the time that elapses between the start and completion of the operation), or the number of P & V iterations performed in the programming operation. Unit 36 can then configure an erase operation based on the measured programming time. In an exemplary embodiment, unit 36 may measure the number or percentage of cells that have reached the intended programming level as a function of the number of iterations. In other words, unit 36 can evaluate the cumulative distribution function (CDF) of the number of cells successfully programmed.

  Unit 36 may determine the initial magnitude or duration of the erase pulse, the increment between successive erase pulses, and / or any bit line voltage or word line voltage applied during erase, based on the performance of the programming operation. The erase operation can be configured by setting any suitable erase parameter.

  FIG. 6 is a flow chart that schematically illustrates a method for erasing a group of analog memory cells 32, in accordance with an embodiment of the present invention. The description of FIG. 6 refers to programming and erasing of the same group of memory cells. In general, however, the disclosed techniques can also be used to erase a particular group of memory cells based on the performance of the step of programming another group of memory cells. The two groups may or may not have a common memory cell.

  The method begins with a programming step 132 where unit 36 programs a group of memory cells with data by performing a programming operation (eg, P & V processing). In a performance estimation step 136, unit 36 estimates the performance index of the programming operation. For example, unit 36 may estimate programming time (programming duration), or any other suitable performance indicator.

  In erase configuration step 140, unit 36 configures an erase operation to be applied to the memory cells based on the estimated performance index of the programming operation. In erase step 144, unit 36 erases the memory cells using the configured erase operation.

In some embodiments, unit 36 or memory controller 40 configures the erase operation for a particular memory block based on other performance metrics such as the number of programming and erase (P / E) cycles applied to the block. can do. In one embodiment, the unit 36 or the memory controller 40 can record some indication of the age of the block after programming and retrieve this indication before erasing to constitute the erasing operation. Can do.
Health level assessment based on programming or erasure performance

  In some embodiments, unit 36 measures the performance of the iterative programming or erasing process applied to a group of memory cells and evaluates the health status of the memory cells based on the measured performance. Although the following description refers to measuring the duration of a programming or erasure process, the disclosed techniques can be used for other suitable performance indicators.

  In some embodiments, unit 36 measures the time for programming or erasing various groups of memory cells. A programming or erase time that is out of range (eg, below a certain lower threshold and / or above a certain upper threshold) may indicate that the health of the memory cell is unfavorable And is unreliable or may fail soon.

  In some embodiments, if the programming or erasing time of a given memory block (or group of memory cells within the block) is outside a predetermined range, the memory controller 40 marks the block as bad or suspicious. To do. Bad blocks are usually suspended. Suspicious blocks are usually subjected to additional evaluation before marking as bad. The memory controller will fail the block based on the average programming or erase time of the block, the maximum or minimum programming time or erase time of the block, or any other suitable indicator of the programming time or erase time associated with the block. Or it can be marked as suspicious.

  In one embodiment, the memory controller measures the number or percentage of cells that have reached the intended programming level as a function of the number of iterations, in other words, the CDF of the number of successfully programmed cells, and blocks this evaluation result. It can be used as an indicator of health status.

  In some embodiments, the memory controller marks the block as bad based on programming time criteria, even if the P & V processing within the block is successfully completed. In some embodiments, the memory controller applies the verification technique following P & V only for blocks whose programming time is outside a predetermined range. Examples of post-P & V verification techniques that can be used for this purpose are described in US patent application Ser. No. 13 / 356,694, cited above.

  In the erase operation, unit 36 or memory controller 40 can take various actions based on the health status of the evaluated block. For example, the R / W unit or the memory controller may set the storage configuration (eg, error correction code and / or number of bits per cell) of subsequent programming commands in the block based on the health status of the evaluated block. Can do.

  FIG. 7 is a flowchart schematically illustrating a method for evaluating the health level of a group of analog memory cells according to an embodiment of the present invention. The method begins at operation step 148 where the R / W unit 36 or memory controller 40 applies a programming or erasing operation to a group of memory cells. Unit 36 or memory controller 40 estimates the performance index of the programming or erasing operation in performance estimation step 152. The performance index can include, for example, the duration of a programming or erasing operation. In the health state evaluation step 156, the unit 36 or the controller 40 evaluates the health state of the memory cell group based on the performance index.

  It will be understood that the above-described embodiments have been given by way of example, and that the present invention is not limited to what has been particularly shown and described hereinabove. Rather, the scope of the present invention covers both the various feature combinations and subcombinations described above, as well as those not disclosed in the prior art that would occur to those skilled in the art upon reading the foregoing description. Including variations and modifications. References incorporated into this patent application by this reference are to the extent that any term is defined in a way that conflicts with the definition made expressly or implicitly within these incorporated references. It should be considered an essential part of the present application, except that only definitions within this specification are to be considered.

Claims (20)

A method of storing data,
An iterative process applied to a group of memory cells in a memory including a plurality of analog memory cells based on one or more data values stored in at least one of the memory cells in the memory Setting the parameters of
Performing the iterative process in the group of memory cells according to the set parameters;
Including a method.   The method of claim 1, wherein performing the iterative process comprises programming the memory cells in the group with data.   The method of claim 1, wherein performing the iterative process comprises erasing the group of memory cells.   Setting the parameter includes copying the data value from the at least one of the memory cells to an alternative storage location, and setting the parameter based on the copied data value. The method of claim 1.   The step of setting the parameter comprises: increment of pulse amplitude or pulse width between successive pulses in the iterative process; amplitude or width of an initial pulse in the iterative process; word line programming voltage applied to the memory cells; A word line deselection voltage applied to another group of the memory cells, a bit line programming voltage applied to the memory cells intended to receive subsequent pulses in the group, and the 2. The method of claim 1, comprising setting at least one parameter selected from a group of types consisting of bit line suppression voltages applied to the memory cells intended to be suppressed from receiving subsequent pulses. The method described. A device for storing data,
A memory comprising a plurality of analog memory cells;
Setting an iterative parameter applied to the group of memory cells based on one or more data values stored in at least one of the memory cells in the memory, and according to the set parameter A storage circuit configured to perform the iterative process within the group of memory cells;
Including the device.   The apparatus of claim 6, wherein the iterative process comprises a programming process that programs the memory cells in the group with data.   The apparatus according to claim 6, wherein the iterative process includes an erase process for erasing the memory cell group.   The storage circuit is configured to copy the data value from the at least one of the memory cells to an alternative storage location and set the parameter based on the copied data value. Item 7. The apparatus according to Item 6.   The storage circuit includes a pulse amplitude or pulse width increment between successive pulses in the iterative process, an initial pulse amplitude or width in the iterative process, a word line programming voltage applied to the group of memory cells, A word line deselect voltage applied to another group of memory cells, a bit line programming voltage applied to the memory cells intended to receive subsequent pulses in the group, and the subsequent in the group The at least one parameter selected from the group of types consisting of bit line suppression voltages applied to the memory cells intended to be inhibited from receiving a plurality of pulses. 6. The apparatus according to 6. A method of storing data,
Applying to the memory cell group an operation of setting a group of the memory cells to respective analog values in a memory including a plurality of analog memory cells;
Evaluating a performance index of the operation applied to the memory cell group;
Evaluating a health state of a memory block including the group in the memory based on the evaluated performance index of the operation;
Including a method.   The method of claim 11, wherein applying the operation comprises programming the memory cells in the group with data.   The method of claim 11, wherein applying the operation comprises erasing the group of memory cells.   The method of claim 11, wherein evaluating the performance indicator comprises measuring a duration of the operation.   The method of claim 11, wherein assessing the health condition comprises marking the memory block as defective when the performance indicator is outside a predetermined range.   The method of claim 11, wherein the step of evaluating the health condition includes marking the memory block for further evaluation when the performance index is outside a predetermined range.   The method of claim 11, wherein assessing the health condition comprises setting a storage configuration for subsequent data storage in the memory block as a function of the performance index. A device for storing data,
A memory including a plurality of analog memory cells;
Applying an operation of setting the memory cells in the group to respective analog values to a group of the memory cells, evaluating a performance index of an operation applied to the memory cell group, and A storage circuit configured to evaluate a health state of a memory block including the group in the memory based on a performance index;
Including the device.   The apparatus of claim 18, wherein the operation comprises a programming process that programs the memory cells in the group with data.   The apparatus of claim 18, wherein the operation comprises an erase operation of erasing the group of memory cells.

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