JP2015510595A5 - - Google Patents
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- Publication number
- JP2015510595A5 JP2015510595A5 JP2014558204A JP2014558204A JP2015510595A5 JP 2015510595 A5 JP2015510595 A5 JP 2015510595A5 JP 2014558204 A JP2014558204 A JP 2014558204A JP 2014558204 A JP2014558204 A JP 2014558204A JP 2015510595 A5 JP2015510595 A5 JP 2015510595A5
- Authority
- JP
- Japan
- Prior art keywords
- probe
- light source
- mode
- light
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims 23
- 230000005855 radiation Effects 0.000 claims 7
- 238000005259 measurement Methods 0.000 claims 4
- 238000000034 method Methods 0.000 claims 4
- 238000004611 spectroscopical analysis Methods 0.000 claims 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 2
- 238000001914 filtration Methods 0.000 claims 2
- 239000007789 gas Substances 0.000 claims 2
- 239000007788 liquid Substances 0.000 claims 2
- 239000003570 air Substances 0.000 claims 1
- -1 biological tissues Substances 0.000 claims 1
- 239000002131 composite material Substances 0.000 claims 1
- 238000004590 computer program Methods 0.000 claims 1
- 229920001940 conductive polymer Polymers 0.000 claims 1
- 238000013213 extrapolation Methods 0.000 claims 1
- 239000012212 insulator Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 229910001092 metal group alloy Inorganic materials 0.000 claims 1
- 150000002739 metals Chemical class 0.000 claims 1
- 229910052757 nitrogen Inorganic materials 0.000 claims 1
- 230000010355 oscillation Effects 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
- 239000000843 powder Substances 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000013085 surface photovoltaic technique Methods 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1203186.0 | 2012-02-24 | ||
| GB1203186.0A GB2495998B (en) | 2012-02-24 | 2012-02-24 | Measurement apparatus |
| PCT/GB2013/050427 WO2013124663A1 (en) | 2012-02-24 | 2013-02-21 | Measurement apparatus |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015510595A JP2015510595A (ja) | 2015-04-09 |
| JP2015510595A5 true JP2015510595A5 (cg-RX-API-DMAC7.html) | 2015-09-24 |
| JP6018645B2 JP6018645B2 (ja) | 2016-11-02 |
Family
ID=45991651
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014558204A Active JP6018645B2 (ja) | 2012-02-24 | 2013-02-21 | 測定装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8866505B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2783205B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP6018645B2 (cg-RX-API-DMAC7.html) |
| GB (1) | GB2495998B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2013124663A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9310396B2 (en) * | 2013-03-05 | 2016-04-12 | Alliance For Sustainable Energy, Llc | Apparatus and methods of measuring minority carrier lifetime using a liquid probe |
| US9170165B2 (en) * | 2013-03-25 | 2015-10-27 | Globalfoundries U.S. 2 Llc | Workfunction modulation-based sensor to measure pressure and temperature |
| US10060981B2 (en) | 2014-12-03 | 2018-08-28 | Power ProbeTeK, LLC | Diagnostic circuit test device |
| GB2539688B (en) * | 2015-06-24 | 2020-06-24 | Indikel As | Field Kelvin probe |
| US10620159B2 (en) * | 2015-06-24 | 2020-04-14 | Indikel As | Field Kelvin probe |
| JP6640531B2 (ja) * | 2015-11-02 | 2020-02-05 | 国立大学法人名古屋大学 | 電子が持つエネルギーの計測装置と計測方法 |
| JP6549309B2 (ja) * | 2016-03-18 | 2019-07-24 | シチズンファインデバイス株式会社 | 試料積載プレート及びその製造方法 |
| KR102457527B1 (ko) * | 2018-01-25 | 2022-10-21 | 한화정밀기계 주식회사 | 플립 칩의 플럭스 도포 상태 검사 방법 |
| US11885800B2 (en) * | 2019-10-18 | 2024-01-30 | Imra America, Inc. | Method and system for detecting analyte of interest using magnetic field sensor and magnetic particles |
| WO2021130760A1 (en) | 2019-12-28 | 2021-07-01 | Institute For Plasma Research | Vacuum compatible device for measurement of work function and alkali metal atom flux |
| CN111366540B (zh) * | 2020-03-30 | 2023-03-21 | 中国科学院苏州纳米技术与纳米仿生研究所 | 半导体材料纳米尺度各向异性吸收系数的测量装置及方法 |
| FR3129733B1 (fr) * | 2021-11-30 | 2024-02-16 | Commissariat Energie Atomique | Dispositif et procédé de caractérisation d’un matériau semiconducteur |
| CN118033301B (zh) * | 2024-04-10 | 2024-07-02 | 深圳市兴威格科技有限公司 | 一种导电背胶性能检测用智能检测系统及方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0711495B2 (ja) * | 1982-05-07 | 1995-02-08 | 株式会社日立製作所 | 光電子測定方法 |
| US4823368A (en) | 1987-06-30 | 1989-04-18 | Rikagaku Kenkyujyo | Open counter for low energy electron detection with suppressed background noise |
| JPH0362253A (ja) | 1989-07-31 | 1991-03-18 | Nec Corp | バスインタフェース回路 |
| JPH09162253A (ja) * | 1995-12-08 | 1997-06-20 | Hitachi Ltd | 半導体評価装置 |
| JP3481031B2 (ja) | 1996-02-07 | 2003-12-22 | 理化学研究所 | 二重円筒形オープンカウンター |
| JP3419662B2 (ja) * | 1997-09-19 | 2003-06-23 | 理研計器株式会社 | 仕事関数測定方法、仕事関数測定装置、及び試料ホルダ |
| CA2309412A1 (en) * | 2000-05-24 | 2001-11-24 | Michael Thompson | Scanning of biochemical microassays by kelvin microprobe |
| US7084661B2 (en) * | 2000-05-24 | 2006-08-01 | Sensorchem International Corporation | Scanning kelvin microprobe system and process for analyzing a surface |
| US6545758B1 (en) * | 2000-08-17 | 2003-04-08 | Perry Sandstrom | Microarray detector and synthesizer |
| US7116115B2 (en) * | 2003-06-06 | 2006-10-03 | The Regents Of The University Of Michigan | Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
| GB0612071D0 (en) * | 2006-06-17 | 2006-07-26 | Kp Technology | Measurement device and method |
| GB0612072D0 (en) * | 2006-06-17 | 2006-07-26 | Kp Technology | Measurement device and method |
-
2012
- 2012-02-24 GB GB1203186.0A patent/GB2495998B/en active Active
-
2013
- 2013-02-21 WO PCT/GB2013/050427 patent/WO2013124663A1/en not_active Ceased
- 2013-02-21 US US14/117,851 patent/US8866505B2/en active Active
- 2013-02-21 JP JP2014558204A patent/JP6018645B2/ja active Active
- 2013-02-21 EP EP13713476.3A patent/EP2783205B1/en active Active
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