JP2015501928A - 検出器装置及び検出方法 - Google Patents

検出器装置及び検出方法 Download PDF

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Publication number
JP2015501928A
JP2015501928A JP2014542933A JP2014542933A JP2015501928A JP 2015501928 A JP2015501928 A JP 2015501928A JP 2014542933 A JP2014542933 A JP 2014542933A JP 2014542933 A JP2014542933 A JP 2014542933A JP 2015501928 A JP2015501928 A JP 2015501928A
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Prior art keywords
detector
radiation
data
deconvolution
detectors
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JP2014542933A
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Japanese (ja)
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JP2015501928A5 (enExample
Inventor
ウィタカー スノー スティーヴン
ウィタカー スノー スティーヴン
ラドレイ イアン
ラドレイ イアン
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Kromek Ltd
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Kromek Ltd
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Publication of JP2015501928A5 publication Critical patent/JP2015501928A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/345—Accessories, mechanical or electrical features mathematical transformations on beams or signals, e.g. Fourier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/618—Specific applications or type of materials food
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/626—Specific applications or type of materials radioactive material

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Measurement Of Radiation (AREA)
JP2014542933A 2011-11-23 2012-11-23 検出器装置及び検出方法 Pending JP2015501928A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1120165.4 2011-11-23
GBGB1120165.4A GB201120165D0 (en) 2011-11-23 2011-11-23 Detector apparatus and method
PCT/GB2012/052908 WO2013076504A1 (en) 2011-11-23 2012-11-23 Detector apparatus and method

Publications (2)

Publication Number Publication Date
JP2015501928A true JP2015501928A (ja) 2015-01-19
JP2015501928A5 JP2015501928A5 (enExample) 2015-11-26

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Family Applications (1)

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JP2014542933A Pending JP2015501928A (ja) 2011-11-23 2012-11-23 検出器装置及び検出方法

Country Status (5)

Country Link
US (1) US20140303932A1 (enExample)
EP (1) EP2783243B1 (enExample)
JP (1) JP2015501928A (enExample)
GB (1) GB201120165D0 (enExample)
WO (1) WO2013076504A1 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018124837A1 (ko) * 2017-01-02 2018-07-05 한국수력원자력 주식회사 방사능 측정방법 및 방사능 측정시스템
JP2020076644A (ja) * 2018-11-07 2020-05-21 有限会社 ワーコム農業研究所 肉質等級の品質基準のデジタル化方法、それによる品質基準を利用した品質評価のテジタル処理方法、それらを利用した自動肉質評価装置、および、それに搭載されるソフトウェア
WO2021060379A1 (ja) * 2019-09-25 2021-04-01 国立大学法人大阪大学 γ線計測方法およびγ線計測装置
JP2021124384A (ja) * 2020-02-05 2021-08-30 三菱電機株式会社 放射能検査装置
JP2021533347A (ja) * 2018-08-01 2021-12-02 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 光子カウントディテクター

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20210010935A1 (en) * 2019-07-08 2021-01-14 Lightsense Technology, Inc. Detection systems and method for multi-chemical substance detection using ultraviolet fluorescence, specular reflectance, and artificial intelligence
CN110854242B (zh) * 2019-12-18 2024-03-19 中国原子能科学研究院 辐射探测探头及其制备方法、辐射探测芯片
US12292376B2 (en) 2021-05-28 2025-05-06 Lightsense Technology, Inc. Miniature multispectral detection system having multiple spectrometers for enhanced photodetection spectroscopy for detection of pathogens, biomarkers, or any compound
CN115808430A (zh) * 2021-09-14 2023-03-17 中国科学院高能物理研究所 X射线透过率测量方法、装置、设备及介质
US12487178B2 (en) 2021-11-08 2025-12-02 Lightsense Technology, Inc. Systems and method for measuring pathogens and biomarkers in fluids
US20240038514A1 (en) * 2022-07-29 2024-02-01 Thermo Finnigan Llc Bayesian decremental scheme for charge state deconvolution
CN116125520A (zh) * 2022-12-26 2023-05-16 中核四0四有限公司 一种放射性污染沙土快速测量装置及测量方法
CN116184475A (zh) * 2022-12-29 2023-05-30 中核四0四有限公司 一种放射性污染沙土γ核素快速监测装置及方法

Citations (3)

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JPH03111790A (ja) * 1989-09-26 1991-05-13 Fujitsu Ltd Ｘ線強度スペクトルモニター方法
JP2001525933A (ja) * 1997-05-23 2001-12-11 ゲーエスエフ−フォルシュングスツェントルム フュア ウムヴェルト ウント ゲズントハイト ゲゼルシャフト ミット ベシュレンクテル ハフツング 中性子スペクトルの検出方法及びこの方法を実施するための装置
WO2009082587A2 (en) * 2007-11-27 2009-07-02 Canberra Industries, Inc. Hybrid radiation detection system

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FR2670302B1 (fr) * 1990-12-11 1995-11-03 France Etat Armement Appareil de mesure de la contamination radioactive d'un corps.
US6528797B1 (en) * 1999-04-16 2003-03-04 The Regents Of The University Of Michigan Method and system for determining depth distribution of radiation-emitting material located in a source medium and radiation detector system for use therein
US7105828B2 (en) * 2004-02-10 2006-09-12 Ge Medical Systems Global Technology Company, Llc Hybrid x-ray detector
GB2418015B (en) * 2004-05-24 2006-12-20 Symetrica Ltd Gamma ray spectrometers
US20070025514A1 (en) * 2005-06-06 2007-02-01 Ruediger Lawaczeck X-ray arrangement for graphic display of an object under examination and use of the x-ray arrangement
US20080144001A1 (en) * 2006-12-15 2008-06-19 Bauke Heeg Spectral imaging device
US20100305873A1 (en) * 2007-09-12 2010-12-02 Glenn Sjoden Method and Apparatus for Spectral Deconvolution of Detector Spectra
JP5620249B2 (ja) * 2010-03-17 2014-11-05 富士フイルム株式会社 放射線画像撮影システム
US9651505B2 (en) * 2010-06-23 2017-05-16 Arktis Radiation Detectors Ltd Method for obtaining information about a radiation source or a material interacting with a radiation source and a measurement setup for performing the method
GB2502307A (en) * 2012-05-22 2013-11-27 Kromek Ltd Radiation Detection

Patent Citations (3)

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JPH03111790A (ja) * 1989-09-26 1991-05-13 Fujitsu Ltd Ｘ線強度スペクトルモニター方法
JP2001525933A (ja) * 1997-05-23 2001-12-11 ゲーエスエフ−フォルシュングスツェントルム フュア ウムヴェルト ウント ゲズントハイト ゲゼルシャフト ミット ベシュレンクテル ハフツング 中性子スペクトルの検出方法及びこの方法を実施するための装置
WO2009082587A2 (en) * 2007-11-27 2009-07-02 Canberra Industries, Inc. Hybrid radiation detection system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JPN6015045816; Ｔ．　Ｊ．　Ｋｅｎｎｅｔｔ，　ｅｔ　ａｌ．: '"Ｂａｙｅｓｉａｎ　ｄｅｃｏｎｖｏｌｕｔｉｏｎ　Ｉ：　Ｃｏｎｖｅｒｇｅｎｔ　Ｐｒｏｐｅｒｔｉｅｓ"' Ｎｕｃｌｅａｒ　Ｉｎｓｔｒｕｍｅｎｔｓ　ａｎｄ　Ｍｅｔｈｏｄｓ Ｖｏｌｕｍｅ　１５１, 1978, Ｐａｇｅ　２８５-２９２ *

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11828887B2 (en) 2017-01-02 2023-11-28 Korea Hydro & Nuclear Power Co., Ltd Radioactivity measurement method and radioactivity measurement system
KR101920137B1 (ko) 2017-01-02 2018-11-19 한국수력원자력 주식회사 방사능 측정방법 및 방사능 측정시스템
CN110121663A (zh) * 2017-01-02 2019-08-13 韩国水力原子力株式会社 放射性测量方法和放射性测量系统
WO2018124837A1 (ko) * 2017-01-02 2018-07-05 한국수력원자력 주식회사 방사능 측정방법 및 방사능 측정시스템
CN110121663B (zh) * 2017-01-02 2023-08-18 韩国水力原子力株式会社 放射性测量方法和放射性测量系统
JP2021533347A (ja) * 2018-08-01 2021-12-02 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 光子カウントディテクター
JP7181378B2 (ja) 2018-08-01 2022-11-30 コーニンクレッカ フィリップス エヌ ヴェ 光子カウントディテクター
JP2020076644A (ja) * 2018-11-07 2020-05-21 有限会社 ワーコム農業研究所 肉質等級の品質基準のデジタル化方法、それによる品質基準を利用した品質評価のテジタル処理方法、それらを利用した自動肉質評価装置、および、それに搭載されるソフトウェア
WO2021060379A1 (ja) * 2019-09-25 2021-04-01 国立大学法人大阪大学 γ線計測方法およびγ線計測装置
JPWO2021060379A1 (enExample) * 2019-09-25 2021-04-01
JP7477890B2 (ja) 2019-09-25 2024-05-02 国立大学法人大阪大学 γ線計測方法およびγ線計測装置
JP2021124384A (ja) * 2020-02-05 2021-08-30 三菱電機株式会社 放射能検査装置
JP7183206B2 (ja) 2020-02-05 2022-12-05 三菱電機株式会社 放射能検査装置

Also Published As

Publication number Publication date
EP2783243B1 (en) 2017-05-10
WO2013076504A1 (en) 2013-05-30
EP2783243A1 (en) 2014-10-01
GB201120165D0 (en) 2012-01-04
US20140303932A1 (en) 2014-10-09

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