JP2015215296A - Surface characteristic measuring device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a surface characteristic measuring device capable of performing both glossiness measurement and reflection characteristic measurement, and improving uniformity of annular illumination light.SOLUTION: An illumination mechanism for glossiness measurement makes illumination light move along a first optical axis, and illuminates an illumination target surface with the illumination light. A light receiving mechanism for glossiness measurement receives first reflection light. An illumination mechanism for colorimetry illuminates the illumination target surface with annular illumination light. The annular illumination light is made incident upon the illumination target surface from a direction of an illumination angle of 45°. A light receiving mechanism for colorimetry receives second reflection light, and after makes the second reflection light move along a first section of a second optical axis, it makes the second reflection light move along a second section of the second optical axis. The second reflection light is emitted from the illumination target surface in a direction of an acceptance angle of 0°. The first section of the second optical axis extends in a direction of an acceptance angle of 0°. The second section of the second optical axis extends in a direction different from the direction of the first section of the second optical axis. The second section of the second optical axis is included in a plane including the first optical axis and the normal of the illumination target surface.

Description

  The present invention relates to a surface property measuring apparatus.

  In a colorimetry gloss meter that also functions as a colorimeter and gloss meter, the illumination mechanism for gloss measurement illuminates the illuminated surface with illumination light, and the light reception mechanism for gloss measurement receives reflected light, and the illumination mechanism for color measurement May illuminate the surface to be illuminated with annular illumination light, and a light-measuring mechanism for colorimetry may receive reflected light. Patent document 1 is an example. The illumination mechanism for colorimetry illuminates the surface to be illuminated with annular illumination light so that the reflected light does not fluctuate greatly depending on the orientation of the surface to be illuminated even when the reflection characteristics of the surface to be illuminated are anisotropic. This is for improving the color stability.

JP 2005-24562 A

  In colorimetric gloss meters, miniaturization is also required.

  However, when the colorimetric gloss meter is miniaturized, the illumination mechanism for gloss measurement, the measurement mechanism for gloss measurement, and the light measurement mechanism for color measurement interfere with the illumination mechanism for color measurement, and light is incident on the annular illumination light. Missing bundle occurs. When the light flux is lost in the annular illumination light, the annular illumination light becomes non-uniform and the colorimetric stability is lowered. This problem also occurs in a reflection characteristic measurement device other than a colorimeter and a surface characteristic measurement device that also serves as a gloss meter.

  The present invention is made to solve this problem. An object of the present invention is to improve the uniformity of annular illumination light in a small surface characteristic measuring apparatus capable of performing both gloss measurement and reflection characteristic measurement.

  The surface property measuring apparatus includes a first illumination mechanism, a first light receiving mechanism, a second illumination mechanism, and a second illumination mechanism.

  The first illumination mechanism advances the illumination light along the first optical axis, and illuminates the surface to be illuminated with the illumination light.

  The first light receiving mechanism receives the first reflected light and outputs a measurement result for the first reflected light. The first reflected light is generated when the surface to be illuminated regularly reflects the illumination light.

  The second illumination mechanism illuminates the illuminated surface with annular illumination light. The annular illumination light enters the surface to be illuminated from a direction with an illumination angle of 45 °.

  The second light receiving mechanism receives the second reflected light, advances the second reflected light along the first section of the second optical axis, and then enters the second section of the second optical axis. The measurement result for the second reflected light is output. The second reflected light is generated when the illuminated surface reflects the annular illumination light, and is emitted from the illuminated surface in the direction of the light receiving angle of 0 °. The first section of the second optical axis extends in the direction of the light receiving angle of 0 °. The second section of the second optical axis extends in a different direction from the first section of the second optical axis.

  The second section of the second optical axis is included in a plane including the first optical axis and the normal line of the illuminated surface.

  When the surface characteristic measuring device is downsized, the first illumination mechanism, the first light receiving mechanism, and the second light receiving mechanism that interfere with the second illumination mechanism and cause the annular illumination light to be lost are the same. Arranged along a plane. The loss of the light bundle occurs only in the portion along the plane, and the annular illumination light becomes uniform. The annular illumination light becomes uniform in a small surface characteristic measuring apparatus capable of performing both gloss measurement and reflection characteristic measurement.

It is a schematic diagram of a gloss colorimeter. It is a top view of a measurement mechanism. It is a bottom view of a measurement mechanism. It is a cross-sectional view of a measurement mechanism. It is a longitudinal cross-sectional view of a measurement mechanism. It is a perspective view which shows an optical axis etc. It is sectional drawing of a light emission mechanism. It is a perspective view of a part of straight pipe type xenon lamp and a part of baffle. It is a perspective view which shows arrangement | positioning of a plane reflective surface.

1 Colorimetric Gloss Meter The schematic diagram of FIG. 1 shows a gloss colorimeter.

  A gloss colorimeter 1000 shown in FIG. 1 serves as a gloss meter and a spectrocolorimeter, and measures the gloss and spectral reflectance of a sample. Reflection characteristics other than the spectral reflectance may be measured. For example, the color value may be measured. That is, the function of the spectrocolorimeter of the gloss colorimeter 1000 is changed to the function of a reflection characteristic measurement device other than the spectrocolorimeter, and the gloss colorimeter 1000 functions as a gloss meter and a reflection characteristic measurement device. It may be changed to a device. For example, the spectrocolorimeter function of the gloss colorimeter 1000 may be changed to the colorimeter function.

  The gloss is measured by a geometry with an illumination angle and a light reception angle of 60 °. Spectral reflectance is measured by a geometry with an illumination angle of 45 ° and a light receiving angle of 0 °. When the gloss is measured, the illuminated surface is illuminated by one-way illumination. When the spectral reflectance is measured, the illuminated surface is illuminated by the annular illumination. The illuminated surface is the surface of the sample. Geometry and / or lighting may be changed.

  The surface to be illuminated when the gloss is measured is the same as the surface to be illuminated when the spectral reflectance is measured. The gloss colorimeter 1000 may measure only the gloss of the illuminated surface, may measure only the spectral reflectance of the illuminated surface, or may determine the gloss of the illuminated surface and the spectral reflectance of the illuminated surface. May be measured continuously.

  The gloss colorimeter 1000 includes a measurement mechanism 1010, a controller 1011 and a housing 1012. The measurement mechanism 1010 is responsible for gloss measurement and color measurement. The controller 1011 controls the measurement mechanism 1010. The housing 1012 houses the measurement mechanism 1010, the controller 1011 and the like.

2 Measuring Mechanism The schematic diagram of FIG. 2 shows the top surface of the measuring mechanism. The schematic diagram of FIG. 3 shows the lower surface of the measurement mechanism. The schematic diagram of FIG. 4 shows a cross section of the measurement mechanism. The schematic diagram of FIG. 5 shows a longitudinal section of the measurement mechanism. The schematic diagram of FIG. 6 is a perspective view showing an optical axis and the like.

  The measurement mechanism 1010 shown in FIGS. 2 to 5 includes an illumination mechanism 1030 for gloss measurement, a light reception mechanism 1031 for gloss measurement, an illumination mechanism 1032 for color measurement, a light reception mechanism 1033 for color measurement, and a light reception for correction. A mechanism 1034 and the like are provided. The gloss measurement illumination mechanism 1030 illuminates the illuminated surface 1050 with illumination light 1040. The gloss measurement light receiving mechanism 1031 receives the reflected light 1041 and outputs a measurement result for the reflected light 1041. The illumination mechanism 1032 for colorimetry illuminates the illuminated surface 1050 with the annular illumination light 1042. The colorimetric light receiving mechanism 1033 receives the reflected light 1043 and outputs a measurement result for the reflected light 1043. The correction light receiving mechanism 1034 receives the light 1045 and outputs a measurement result for the light 1045.

3 Illumination mechanism for gloss measurement The illumination mechanism 1030 for gloss measurement shown in FIGS. 3 and 4 includes a lamp 1070, an aperture plate 1071, a mirror 1072, an aperture plate 1073, a lens 1074, a mirror, as shown in FIG. A cylinder 1075 and the like are provided. The lamp 1070 emits illumination light 1040. The aperture plate 1071 limits the beam bundle of the illumination light 1040. The mirror 1072 reflects the illumination light 1040. The aperture plate 1073 limits the beam bundle of the illumination light 1040. The lens 1074 collimates the illumination light 1040. The lens barrel 1075 holds a lamp 1070, an aperture plate 1071, a mirror 1072, an aperture plate 1073, a lens 1074, and the like.

  The reflecting surface 1080 of the mirror 1072 faces an intermediate direction between the direction toward the lamp 1070 and the direction toward the illuminated surface 1050. The opening 1090 formed in the opening plate 1071 is between the lamp 1070 and the reflecting surface 1080. The aperture 1100 and the lens 1074 formed in the aperture plate 1073 are between the reflective surface 1080 and the illuminated surface 1050.

  The illumination light 1040 travels along the optical axis 1110. The illumination light 1040 exits from the lamp 1070, passes through the opening 1090, is reflected by the mirror 1072, sequentially passes through the opening 1100 and the lens 1074, and enters the illuminated surface 1050 from a direction with an illumination angle of 60 °. The direction of the illumination angle of 60 ° is a direction that forms a 60 ° with the normal line 1120 of the surface to be illuminated 1050. When the illumination light 1040 passes through the opening 1090, the light flux of the illumination light 1040 is limited. The opening 1090 determines the opening angle of the light bundle of the illumination light 1040. When the illumination light 1040 is reflected by the mirror 1072, the optical axis 1110 is bent. When the illumination light 1040 passes through the opening 1100, the light flux of the illumination light 1040 is limited. The size of the illumination area is determined by the opening 1100. When the illumination light 1040 passes through the lens 1074, the illumination light 1040 is collimated.

  As shown in FIG. 6, the optical axis 1110 and the normal 1120 of the illuminated surface 1050 are included in the same plane 1130. The first section 1140 of the optical axis 1110 is a section from the lamp 1070 to the reflecting surface 1080, extends in a direction parallel to the direction in which the normal 1120 extends, and extends in the direction in which the second section 1141 of the optical axis 1110 extends. Extend in different directions. The first section 1140 approaches a plane including the illuminated surface 1050 as it approaches the reflecting surface 1080. The second section 1141 is a section from the reflective surface 1080 to the illuminated surface 1050 and extends in the direction of the illumination angle of 60 °. The optical axis 1110 is bent so that the illumination light 1040 travels along the first section 1140 and then travels along the second section 1141, thereby illuminating light without increasing the illumination mechanism 1030 for gloss measurement. The optical path of 1040 can be extended, and the focal length of the lens 1074 can be extended. When the focal length of the lens 1074 is extended, the optical path from the lens 1074 to the opening 1090 is extended, and the opening 1090 can be enlarged while keeping the opening angle of the opening 1090 viewed from the lens 1074 constant. Enlarging the opening 1090 contributes to increasing the light amount of the illumination light 1040, mitigating the influence of the position shift of the light source, and increasing the beam bundle of the illumination light 1040. When the light beam of the illumination light 1040 is thick, the reflected light 1041 does not vary greatly depending on the position of the illuminated surface 1050 even when the reflection characteristics of the illuminated surface 1050 are non-uniform, and the stability of gloss measurement is improved. The direction in which the first section 1140 extends may be slightly inclined from the direction parallel to the direction in which the normal 1120 extends. When the gloss measuring illumination mechanism 1030 is allowed to be slightly larger, the mirror 1072 may be omitted and the optical axis 1110 may not be bent.

  The mirror 1072 may be replaced with another type of bending optical element. For example, the mirror 1072 may be replaced with a prism. A bending optical element other than the mirror 1072 may be added, and both or one of the first section 1140 and the second section 1141 of the optical axis 1110 may be bent. The optical system including the mirror 1072 and the lens 1074 may be replaced with another type of optical system that bends the optical axis 1110 and collimates the illumination light 1040. For example, the optical system including the mirror 1072 and the lens 1074 may be replaced with an optical system including a mirror having a concave reflecting surface. The illumination light 1040 may be reflected by the mirror 1072 after passing through the lens 1074. Both or one of the aperture plate 1071 and the aperture plate 1073 may be replaced with a beam bundle limiting mechanism having a shape that is difficult to call a plate.

4 Light Receiving Mechanism of Gloss Measurement Mechanism The light receiving mechanism 1031 for gloss measurement shown in FIGS. 2 to 4 includes a lens 1150, a mirror 1151, an aperture plate 1152, a sensor 1153, and a lens barrel 1154 as shown in FIG. Prepare. The lens 1150 converges the light beam of the reflected light 1041. The mirror 1151 reflects the reflected light 1041. The aperture plate 1152 limits the beam bundle of the reflected light 1041. The sensor 1153 outputs a signal corresponding to the amount of reflected light 1041.

  The reflecting surface 1180 of the mirror 1151 faces an intermediate direction between the direction toward the illuminated surface 1050 and the direction toward the sensor 1153. The lens 1150 is between the illuminated surface 1050 and the reflecting surface 1180. The opening 1160 formed in the opening plate 1152 is between the reflecting surface 1180 and the sensor 1153.

  The reflected light 1041 travels along the optical axis 1111. The reflected light 1041 is generated by regular reflection of the illumination light 1040 by the illuminated surface 1050, exits from the illuminated surface 1050 in the direction of the light receiving angle of 60 °, passes through the lens 1150, is reflected by the mirror 1151, and is opened. The light passes through 1160 and is received by the sensor 1153. The direction of the light receiving angle of 60 ° is a direction that forms 60 ° with the normal line 1120 of the illuminated surface 1050. The sensor 1153 outputs a signal corresponding to the amount of reflected light 1041. A signal output from the sensor 1153 is a result of measurement with respect to the reflected light 1041. When the reflected light 1041 passes through the lens 1150, the light beam of the reflected light 1041 is converged. The reflected light 1041 is reflected by the mirror 1151 so that the optical axis 1111 is bent. When the reflected light 1041 passes through the opening 1160, the beam bundle of the reflected light 1041 is limited. The opening angle of the light beam of the reflected light 1041 is determined by the opening 1160.

  As shown in FIG. 6, the optical axis 1111 is included in the plane 1130. A first section 1170 of the optical axis 1111 is a section from the illuminated surface 1050 to the reflecting surface 1180, and extends in the direction of the light receiving angle of 60 °. A second section 1171 of the optical axis 1111 is a section from the reflecting surface 1180 to the sensor 1153 and extends in a direction different from the direction in which the first section 1170 extends. The second section 1171 approaches a plane including the illuminated surface 1050 as it approaches the sensor 1153. By bending the optical axis 1111 so that the reflected light 1041 travels along the first section 1170 and then travels along the second section 1171, the reflected light is reflected without enlarging the light receiving mechanism 1031 for gloss measurement. The optical path 1041 can be extended, and the focal length of the lens 1150 can be extended. When the focal length of the lens 1150 is extended, the optical path from the lens 1150 to the opening 1160 is extended, and the opening 1160 can be enlarged while keeping the opening angle of the opening 1160 viewed from the lens 1150 constant. Enlarging the opening 1160 contributes to increasing the light amount of the reflected light 1041, mitigating the influence of the position shift of the sensor 1153, and increasing the beam bundle of the reflected light 1041. When the light beam of the reflected light 1041 is thick, the reflected light 1041 does not fluctuate greatly depending on the position of the illuminated surface 1050 even when the reflected characteristics of the illuminated surface 1050 are non-uniform, and the stability of gloss measurement is improved. As the second section 1171 approaches the plane including the illuminated surface 1050 as it approaches the sensor 1153, the aperture plate 1152 and the sensor 1153 are separated from the light-receiving mechanism 1033 for colorimetry, and the aperture plate 1152 and the sensor 1153 are for colorimetry. Interference with the light receiving mechanism 1033 is suppressed. In the case where the light receiving mechanism 1031 for gloss measurement is allowed to be slightly larger, the mirror 1151 is omitted and the optical axis 1111 is not allowed to be bent.

  The mirror 1151 may be replaced with another type of bending optical element. For example, the mirror 1151 may be replaced with a prism. A bending optical element other than the mirror 1151 may be added, and the second section 1171 of the optical axis 1111 may be bent. The optical system including the lens 1150 and the mirror 1151 may be replaced with another type of optical system that bends the optical axis 1111 and converges the light beam of the reflected light 1041. For example, the optical system including the lens 1150 and the mirror 1151 may be replaced with an optical system including a mirror having a concave reflecting surface. The reflected light 1041 may be reflected by the mirror 1151 and then pass through the lens 1150.

5. Illumination mechanism for color measurement The illumination mechanism 1032 for color measurement shown in FIGS. 2 to 5 includes a light emission mechanism 1190, a reflection mechanism 1191, and the like as shown in FIGS. The light emitting mechanism 1190 emits light 1044, light 1045, and the like. The reflection mechanism 1191 changes the light 1044 into the annular illumination light 1042.

6 Light Emission Mechanism FIG. 7 shows a cross section of the light emission mechanism.

  The light emission mechanism 1190 shown in FIGS. 4, 5, and 7 includes a straight tube type xenon lamp 1200, an integrating sphere 1201, a baffle 1202, and the like. The straight tube xenon lamp 1200 emits light. The integrating sphere 1201 makes the light uniform. The baffle 1202 prevents light from being emitted without being made uniform.

  A spherical space 1210 formed in the integrating sphere 1201 is defined on the inner surface 1220 of the integrating sphere 1201. A round hole-shaped exit port 1211 formed in the integrating sphere 1201 is defined on the inner peripheral surface 1221 of the integrating sphere 1201. The emission port 1211 communicates the space 1210 and the outside of the integrating sphere 1201. The diameter of the exit port 1211 becomes wider from one end on the space 1210 side toward the other end on the outer side of the integrating sphere 1201.

  In order to say that the space 1210 is spherical, it is only necessary to grasp a sphere having a spherical surface along the main part of the inner surface 1220. In order to say that the exit port 1211 has a round hole shape, it is only necessary to grasp a rotationally symmetric body having an outer peripheral surface along the main part of the inner peripheral surface 1221. Therefore, the inner surface 1220 or the inner peripheral surface 1221 may have some unevenness, and some holes may be exposed on the inner surface 1220 or the inner peripheral surface 1221. The emission port 1211, the insertion hole 1270, and the insertion hole 1271 exposed on the inner surface 1220 also correspond to the holes.

  The space 1210 and the emission port 1211 have a common center axis 1230. The symmetry axis of the grasped sphere and the symmetry axis of the grasped rotational symmetry body are on the central axis 1230. The center 1240 of the integrating sphere 1201 is the center of the grasped sphere and is on the central axis 1230. The central axis 1230 coincides with the normal line 1120 of the illuminated surface 1050.

  The inner surface 1220 has a diffuse reflection surface 1245. Desirably, the entire inner surface 1220 becomes the diffuse reflection surface 1245, but the inner surface 1220 may have a slight surface that is not the diffuse reflection surface 1245. The diffuse reflection surface 1245 is a surface painted with a white matte paint. The white matte paint includes a resin, a white pigment, a matte material, and the like. The resin is an acrylic resin or the like. The white pigment is a powder of titanium oxide, zinc oxide, barium sulfate, calcium carbonate or the like. The matting material is fine particles such as silica, calcium carbonate, calcium phosphate. The white matte paint may be replaced with an achromatic matte paint other than white. The diffuse reflection surface 1245 may be formed by roughening the inner surface 1220.

  The schematic diagram of FIG. 8 is a perspective view of a part of a straight tube type xenon lamp and a part of a baffle.

  As shown in FIG. 7, the straight tube type xenon lamp 1200 shown in FIGS. 4, 5, 7, and 8 includes an arc tube 1250, an electrode 1251, an electrode 1252, a sealed gas 1253, and the like. The electrode 1251 is sealed to one end of the arc tube 1250. The electrode 1252 is sealed to the other end of the arc tube 1250. The sealed gas 1253 is sealed in the arc tube 1250. The main component of the sealed gas 1253 is xenon gas. The straight tube type xenon lamp 1200 extends in the tube axis direction in which the tube shaft 1310 extends. The straight tube type xenon lamp 1200 has a discharge section 1260. The discharge section 1260 is between the electrode 1251 and the electrode 1252. When a voltage is applied between the electrode 1251 and the electrode 1252, a discharge occurs in the discharge section 1260 and light is emitted from the straight tube xenon lamp 1200. The straight tube type xenon lamp 1200 is inexpensive and has an advantage that the amount of light emitted over the entire visible region is large. This advantage contributes to lowering the manufacturing cost of the gloss colorimeter 1000 and improving the colorimetric signal-to-noise ratio.

  The straight tube type xenon lamp 1200 is inserted into the insertion hole 1270 and the insertion hole 1271 and fixed to the integrating sphere 1201. The straight tube type xenon lamp 1200 traverses the space 1210. When the straight tube xenon lamp 1200 crosses the space 1210, it is easy to make both the straight tube xenon lamp 1200 larger and the integrating sphere 1201 smaller. Increasing the straight tube xenon lamp 1200 contributes to increasing the amount of light emitted by the straight tube xenon lamp 1200 and extending the life of the straight tube xenon lamp 1200.

  The baffle 1202 is between the discharge section 1260 and the exit port 1211. The baffle 1202 prevents a part or all of the exit port 1211 from being seen through the discharge section 1260, and desirably prevents the whole exit port 1211 from being seen through the discharge section 1260. One position being seen from another position means that there is no light shielding object on a straight line connecting the one position and the other position, and the light beam directly reaches from one position to another position. . The baffle 1202 shields the light beam that travels directly from the discharge section 1260 to the exit port 1211, and suppresses the light emitted from the discharge section 1260 from exiting from the exit port 1211 without being diffusely reflected by the diffuse reflection surface 1245. As a result, stray light is suppressed and the accuracy of colorimetry is improved. When the light emitted from the discharge section 1260 is diffused and reflected by the diffuse reflection surface 1245 and then emitted from the emission port 1211, the uniformed light 1045 is received by the light receiving mechanism 1034 for correction, and the emission port 1211. The fluctuation of the light 1044 emitted from the light source is appropriately monitored. Conversely, when the light emitted from the discharge section 1260 is emitted from the exit 1211 without being diffusely reflected by the diffuse reflection surface 1245, the influence of the drawback of the straight tube xenon lamp 1200 that the horizontal light distribution characteristic is not uniform. Therefore, the fluctuation of the light 1045 emitted from the emission port 1211 is not properly monitored. However, even when the baffle 1202 is omitted, the function of the integrating sphere 1201 for making the light uniform is not lost, and the usefulness of the light emitting mechanism 1190 is not lost.

  The baffle 1202 has a partial cylindrical shape and extends in a direction parallel to the direction in which the discharge section 1260 extends. The partial cylinder refers to a shape obtained by cutting a part from one circumferential position of the cylinder to another circumferential position. An inner peripheral surface 1275 of the baffle 1202 is directed to the discharge section 1260. The outer peripheral surface 1276 of the baffle 1202 is directed to the emission port 1211. The shape of the baffle 1202 may be changed.

  The surface 1280 of the baffle 1202 has a diffuse reflection surface 1290. Desirably, the entire surface 1280 is the diffuse reflection surface 1290, but the surface 1280 may have a slight surface that is not the diffuse reflection surface 1290. However, even when the surface of the baffle 1202 does not have the diffuse reflection surface 1290, the function of the integrating sphere 1201 for making the light uniform is not lost, and the usefulness of the light emitting mechanism 1190 is not lost.

  When the straight tube xenon lamp 1200 emits light, the light sequentially proceeds through the space 1210 and the emission port 1211 and finally exits the integrating sphere 1201. The light is diffusely reflected on the diffuse reflection surface 1245 at least once while traveling through the space 1210. Most of the light is diffusely reflected by the diffuse reflection surface 1245 repeatedly while traveling through the space 1210. The light is diffused and reflected by the diffuse reflection surface 1245 and then emitted from the emission port 1211, whereby the light emitted from the light emission mechanism 1190 becomes uniform, and the light emission mechanism 1190 is substantially vertically distributed according to Lambert's cosine law. It has characteristics. When the light emitting mechanism 1190 has a vertical light distribution characteristic according to Lambert's cosine law, the luminous intensity of light emitted in a direction that forms an angle θ with the central axis 1230 is proportional to the cosine cos θ of the angle θ.

  The straight tube type xenon lamp 1200 has a drawback that the vertical light distribution characteristic does not follow Lambert's cosine law. Further, the straight tube type xenon lamp 1200 has a drawback that the horizontal light distribution characteristic is not uniform. However, these disadvantages are alleviated to such an extent that they are not substantially problematic by integrating sphere 1201.

7 Arrangement of Straight Tube Xenon Lamp The center 1300 of the discharge section 1260 is along the center axis 1230 and preferably on the center axis 1230. One end 1301 and the other end 1302 of the discharge section 1260 are along the inner surface 1220, preferably on the spherical surface of the grasped sphere. When one end 1301 and the other end 1302 of the discharge section 1260 are along the inner surface 1220, the protrusion of the straight tube type xenon lamp 1200 from the space 1210 is reduced, and the light emission mechanism 1190 is reduced in size. Further, most of the discharge section 1260 is accommodated in the space 1210, and most of the light emitted from the straight tube xenon lamp 1200 is emitted to the space 1210, so that the efficiency of the light emission mechanism 1190 is improved.

  The center 1300 of the discharge section 1260 is on the tube axis 1310 of the straight tube type xenon lamp 1200 and at the same distance from the electrode 1251 and the electrode 1252. A center 1240 of the space 1210 is in a region where the discharge section 1260 exists.

  The exit 1211 is in the tube radial direction 1320 that is away from the tube axis 1310 when viewed from the discharge section 1260. The discharge section 1260 is preferably perpendicular to the axial direction 1330 in which the central axis 1230 extends, extends in a direction parallel to the direction in which the emission port 1211 extends, extends in a direction parallel to the illuminated surface 1050, and is included in the plane 1130. It is.

8 Reflecting Mechanism The schematic diagram of FIG. 9 is a perspective view showing the arrangement of the planar reflecting surface.

  The reflection mechanism 1191 shown in FIGS. 4 and 5 has ten plane reflection surfaces 1340 as shown in FIG. Each of the ten planar reflecting surfaces 1340 is a mirror surface and reflects the light 1044. The ten planar reflecting surfaces 1340 are arranged around the central axis 1230 and distributed in the circumferential direction 1350 around the central axis 1230. The ten planar reflecting surfaces 1340 face the radially inner side 1355 that approaches the central axis 1230. The ten planar reflecting surfaces 1340 are arranged so that the light 1044 becomes incident light and the reflected light becomes annular illumination light 1042. The annular illumination light 1042 enters the illuminated surface 1050 from a direction with an illumination angle of 45 °. The direction of the illumination angle of 45 ° is a direction that forms a 45 ° with the normal line 1120 of the surface to be illuminated 1050.

  The vertical light distribution characteristic of the light emitting mechanism 1190 follows Lambert's cosine law, and the light 1044 emitted from the emission port 1211 in the direction of 45 ° with the central axis 1230 enters the illuminated surface 1050 from the direction of the illumination angle of 45 °. In the case of light, the illuminance does not fluctuate greatly even when the illuminated surface 1050 moves in the axial direction 1330 from the reference position, and the colorimetric stability is improved.

  In the case where two or more plane reflecting surfaces 1340 are arranged in the circumferential direction 1350, the illuminated surface 1050 is illuminated from two or more directions dispersed in the circumferential direction 1350. When the illuminated surface 1050 is illuminated from two or more directions dispersed in the circumferential direction 1350, the reflected light 1043 is greatly increased depending on the orientation of the illuminated surface 1050 even when the reflection characteristics of the illuminated surface 1050 are anisotropic. The stability of colorimetry is improved without fluctuation. In the case where the reflection characteristic of the illuminated surface 1050 has anisotropy, the illuminated surface 1050 may have wrinkles, streaky patterns, irregularities, and the like.

  The ten plane reflecting surfaces 1340 are arranged so as to avoid the light path of the light beam emitted from the light 1044 in the tube axis direction 1357 where the tube axis 1310 extends when viewed from the axial direction 1330. The light bundle is a light bundle that travels along the plane 1130. As a result, the illuminated surface 1050 is not illuminated by the light beam. When the illuminated surface 1050 is not illuminated with the light bundle, the illuminated surface 1050 is not illuminated with the light bundle that is relatively deviated from Lambert's cosine law, and the illuminated surface 1050 moves in the axial direction 1330 from the reference position. Even when moved, the illuminance does not fluctuate greatly and the colorimetric stability is improved. However, a reflection surface that converts the light bundle into a light bundle constituting the annular illumination light 1042 may be provided. In the case where the reflecting surface is provided, the illuminance tends to fluctuate when the illuminated surface 1050 moves in the axial direction 1330 from the reference position, but the illuminance increases.

  Desirably, a light absorption surface such as a black surface is disposed in the optical path of the light beam. When the light absorption surface is disposed in the optical path of the light beam, the light beam is absorbed by the light absorption surface, and stray light is suppressed.

  The reflection mechanism 1191 may be replaced with another type of illumination light mechanism. For example, the reflection mechanism 1191 may be replaced with a light guide mechanism including two or more optical fibers. In this case, the light 1045 is incident on one end of each of the two or more optical fibers, and the annular illumination light 1042 is emitted from the other end of each of the two or more optical fibers.

  The ten plane reflecting surfaces 1340 may be replaced with nine or less or eleven or more plane reflecting surfaces.

  The ten plane reflecting surfaces 1340 may be replaced with a cylindrical reflecting surface, a spheroid reflecting surface or the like around the central axis 1230.

9 Colorimetric Light-Receiving Mechanism The colorimetric light-receiving mechanism 1033 shown in FIGS. 2 to 5 includes a mirror 1360, a lens 1361, a spectroscopic measurement mechanism 1362, and a lens barrel 1363, as shown in FIG. The mirror 1360 reflects the reflected light 1043. The lens 1361 converges the light beam of the reflected light 1043. The spectroscopic measurement mechanism 1362 outputs a signal corresponding to the light amount of each wavelength component of the reflected light 1043. The lens barrel 1363 is integrated with the lens barrel 1075 and the lens barrel 1154 to constitute a lens barrel assembly.

  The mirror 1360 is on the normal 1120. The reflecting surface 1380 of the mirror 1360 faces the middle direction between the direction toward the illuminated surface 1050 and the direction toward the spectroscopic measurement mechanism 1362. The lens 1361 is between the reflecting surface 1380 and the spectroscopic measurement mechanism 1362.

  The reflected light 1043 travels along the optical axis 1112. The reflected light 1043 is generated when the illuminated surface 1050 reflects the annular illumination light 1042, is emitted from the illuminated surface 1050 in the direction of the light receiving angle of 0 °, is reflected by the mirror 1360, passes through the lens 1361, and is spectrally separated. Light is received by the measurement mechanism 1362. The direction of the light receiving angle of 0 ° is a direction that forms 0 ° with the normal line 1120 of the illuminated surface 1050. The spectroscopic measurement mechanism 1362 outputs a signal corresponding to the light amount of each wavelength component of the reflected light 1043. A signal output from the spectroscopic measurement mechanism 1362 becomes a result of measurement with respect to the reflected light 1043. The reflected light 1043 is reflected by the mirror 1360 so that the optical axis 1112 is bent. When the reflected light 1043 passes through the lens 1361, the light flux of the reflected light 1043 is converged.

  As shown in FIG. 6, the optical axis 1112 is included in the plane 1130. A first section 1370 of the optical axis 1112 is a section from the illuminated surface 1050 to the reflecting surface 1380 and extends in the direction of the light receiving angle of 0 °. A second section 1371 of the optical axis 1112 is a section from the reflecting surface 1380 to the spectroscopic measurement mechanism 1362 and extends in a direction different from the direction in which the first section 1370 extends. The reflected light 1043 travels along the second section 1371 after traveling along the first section 1370.

  The mirror 1360 may be replaced with other types of bending optical elements. For example, the mirror 1360 may be replaced with a prism. A bending optical element other than the mirror 1360 may be added, and the second section 1371 may be bent. The optical system including the mirror 1360 and the lens 1361 may be replaced with another type of optical system that bends the optical axis 1112 and converges the light beam of the reflected light 1043. For example, an optical system including the mirror 1360 and the lens 1361 may be replaced with an optical system including a mirror having a concave reflecting surface. When the spectrocolorimeter provided in the gloss colorimeter 1000 is changed to a colorimeter, the spectroscopic mechanism 1362 may be replaced with a mechanism for measuring tristimulus values.

10. Correction Light Receiving Mechanism The correction light receiving mechanism 1034 shown in FIGS. 2 and 4 includes a mirror 1390, an optical fiber 1391, a spectroscopic measurement mechanism 1392, and a holder 1393, as shown in FIG. The spectroscopic measurement mechanism 1392 is shared with the spectroscopic measurement mechanism 1362. The spectroscopic measurement mechanism 1392 may be a component that is not shared with the spectroscopic measurement mechanism 1362. The mirror 1390 reflects the light 1045. The optical fiber 1391 guides the light 1045. The spectroscopic measurement mechanism 1392 outputs a signal corresponding to the light amount of each wavelength component of the light 1045. The holder 1393 holds the optical fiber 1391 and is coupled to the lens barrel 1363.

  The mirror 1390 is on the central axis 1230. The reflecting surface 1400 of the mirror 1390 faces in the middle direction between the direction toward the center 1240 of the space 1210 and the direction toward the entrance 1410 of the optical fiber 1391.

  The light 1045 travels along the optical axis 1113. Light 1045 exits from the exit port 1211 in a direction that forms 0 ° with the central axis 1230, is reflected by the mirror 1390, is guided to the optical fiber 1391, and is received by the spectroscopic measurement mechanism 1392. The spectroscopic measurement mechanism 1392 outputs a signal corresponding to the light amount of each wavelength component of the light 1045. A signal output from the spectroscopic measurement mechanism 1392 becomes a result of measurement with respect to the light 1045. The optical axis 1113 is bent by the light 1045 being reflected by the mirror 1390.

  As shown in FIG. 6, the optical axis 1113 is included in the plane 1130. A first section 1395 of the optical axis 1113 is a section from the exit port 1211 to the reflection surface 1400 and extends in a direction that forms 0 ° with the central axis 1230. A second section 1396 of the optical axis 1113 is a section from the reflection surface 1400 to the entrance 1410 of the optical fiber 1391 and extends in a direction different from the direction in which the first section 1395 extends. The light 1045 travels along the second section 1396 after traveling along the first section 1395.

  The mirror 1390 may be replaced with other types of bending optical elements. For example, the mirror 1390 may be replaced with a prism. A bending optical element other than the mirror 1390 may be added, and the second section 1396 may be bent. The optical fiber 1391 may be replaced with another type of light guide mechanism. For example, the optical fiber 1391 may be replaced with a bending optical element. The optical fiber 1391 may be omitted, and the light 1045 may travel straight from the reflection surface 1400 to the spectroscopic measurement mechanism 1392.

  When measurement for correction is performed on the light 1045 emitted from the emission port 1211 in the direction of 0 ° with the central axis 1230, what is the emission port 1211 in order to obtain light for which measurement for correction is performed? It is not necessary to form another exit port in the integrating sphere 1201, and the efficiency of the light emitting mechanism 1190 is improved.

11 Arrangement of Illumination Mechanism and Light-Reception Mechanism As shown in FIG. 6, the optical axis 1111, the optical axis 1112, and the optical axis 1113 are included in a plane 1130 that includes the optical axis 1110 and the normal 1120. When the optical axis 1111, the optical axis 1112, and the optical axis 1113 are included in the plane 1130, the illumination mechanism 1030 for gloss measurement, the light reception mechanism 1031 for gloss measurement, the light reception mechanism 1033 for color measurement, and the light reception mechanism 1034 for correction. Are arranged along the plane 1130. When the illumination mechanism 1030 for gloss measurement, the light reception mechanism 1031 for gloss measurement, the light reception mechanism 1033 for color measurement, and the light reception mechanism 1034 for correction are arranged along the plane 1130, the illumination mechanism 1030 for gloss measurement, Even when the light receiving mechanism 1031 for gloss measurement, the light receiving mechanism 1033 for color measurement, and the light receiving mechanism 1034 for correction interfere with the illumination mechanism 1032 for color measurement to cause the annular illumination light 1042 to be lost, the light bundle Is generated only in a portion along the plane 1130, and the annular illumination light 1042 becomes uniform. When the illumination mechanism 1030 for gloss measurement, the light reception mechanism 1031 for gloss measurement, the light reception mechanism 1033 for color measurement, and the light reception mechanism 1034 for correction interfere with the illumination mechanism 1032 for color measurement, the gloss colorimeter 1000 is It is likely to occur when it is downsized. For this reason, including the optical axis 1111, the optical axis 1112, and the optical axis 1113 in the plane 1130 makes the annular illumination light 1042 uniform in a small gloss colorimeter 1000 that can perform both gloss measurement and color measurement. It contributes to that. Uniformity of the annular illumination light 1042 contributes to improving the colorimetric stability when the reflection characteristic of the illuminated surface 1050 has anisotropy. The ray bundle along the plane 1130 has a relatively large deviation from Lambert's cosine law.

12 Controller The controller 1011 shown in FIG. 1 includes an embedded computer, a control circuit, and the like, and causes the embedded computer to execute firmware. All or part of the processing by the embedded computer may be realized by hardware that does not execute the program.

  The controller 1011 controls the measurement mechanism 1010. The controller 1011 controls lighting of the lamp 1070 and the straight tube xenon lamp 1200, acquires the measurement result from the sensor 1153, and acquires the measurement result from the spectroscopic measurement mechanism 1362 and the spectroscopic measurement mechanism 1392. The controller 1011 obtains gloss information from the measurement result acquired from the sensor 1153 and obtains colorimetric information from the measurement result acquired from the spectroscopic measurement mechanism 1362. The controller 1011 performs correction to reflect the measurement result acquired from the spectroscopic measurement mechanism 1392 when obtaining colorimetric information. Thereby, the influence which the fluctuation | variation of the light which the light emission mechanism 1190 radiates has on colorimetric information is mitigated. The gloss information is a gloss level or the like. The colorimetric information is a spectral spectrum, a color value, and the like.

  While the invention has been shown and described in detail, the above description is illustrative in all aspects and not restrictive. Accordingly, it is understood that numerous modifications and variations can be devised without departing from the scope of the present invention.

1000 gloss colorimeter 1010 measurement mechanism 1011 controller 1030 illumination mechanism for gloss measurement 1031 light reception mechanism for gloss measurement 1032 illumination mechanism for color measurement 1033 light reception mechanism for color measurement 1034 light reception mechanism for correction 1190 light emission mechanism 1191 reflection Mechanism 1200 Straight tube xenon lamp 1201 Integrating sphere 1202 Baffle

Claims (6)

Illumination light travels along a first optical axis, illuminates a surface to be illuminated with the illumination light, and the first illumination includes normal lines of the first optical axis and the illuminated surface in the same plane. Mechanism,
A first light-receiving mechanism that receives first reflected light generated by specularly reflecting the illumination light by the surface to be illuminated, and that outputs a measurement result for the first reflected light;
A second illumination mechanism that illuminates the illuminated surface with annular illumination light incident on the illuminated surface from an illumination angle of 45 °;
The illuminated surface receives second reflected light that is generated by reflecting the annular illumination light and is emitted from the illuminated surface in a direction with a light receiving angle of 0 °, and the second reflected light is reflected as the second light. Advancing along the first section of the axis and then along the second section of the second optical axis, the first section of the second optical axis extends in the direction of the light receiving angle of 0 ° The second section of the second optical axis extends in a direction different from the first section of the second optical axis and is included in the plane, and outputs a measurement result for the second reflected light. The light receiving mechanism of
A surface property measuring apparatus comprising: The second illumination mechanism includes:
A light emitting mechanism that emits first light in a direction that forms 45 ° with the central axis, and that emits second light in a direction that forms 0 ° with the central axis;
An illumination opticalization mechanism that changes the first light into the annular illumination light;
With
Receiving the second light, traveling the second light along the first section of the third optical axis, and then proceeding along the second section of the third optical axis; The first section of the third optical axis extends in a direction forming 0 ° with the central axis, and the second section of the third optical axis is in a direction different from the first section of the third optical axis. A third light receiving mechanism that is included in the plane and outputs a measurement result for the second light;
A derivation unit for deriving colorimetric information from the measurement result for the second reflected light and performing correction to reflect the measurement result for the second light when deriving the colorimetry information;
The surface property measuring apparatus according to claim 1, further comprising: The first illumination mechanism includes:
A lamp that emits the illumination light;
A first beam bundle limiting mechanism for limiting the beam bundle of the illumination light;
A first optical system that is arranged so that the illumination light passes after passing through the first beam bundle limiting mechanism, bends the first optical axis, and collimates the illumination light;
A surface property measuring apparatus according to claim 1 or 2. The first light receiving mechanism advances the first reflected light along a fourth optical axis,
The first light receiving mechanism includes:
A second optical system that bends the fourth optical axis and converges the first reflected light;
A second light flux limiting mechanism that is arranged so that the first reflected light passes after passing through the second optical system, and limits the light flux of the first reflected light;
A sensor configured to receive the first reflected light after the first reflected light passes through the second light beam limiting mechanism, and to output a signal corresponding to the amount of the first reflected light; ,
A surface property measuring apparatus according to any one of claims 1 to 3. The second illumination mechanism includes:
A light emission mechanism having a vertical light distribution characteristic according to Lambert's cosine law and emitting a first light in a direction of 45 ° with the central axis;
An illumination opticalization mechanism that changes the first light into the annular illumination light;
With
The illumination light mechanism is
Two or more plane reflection surfaces are arranged, and the two or more plane reflection surfaces are distributed around the central axis and distributed in a circumferential direction around the central axis, and the first light is incident The surface characteristic measuring apparatus according to claim 1, further comprising a reflection mechanism in which the two or more planar reflection surfaces are arranged so that reflected light becomes the annular illumination light. The second illumination mechanism includes:
A light emitting mechanism that emits the first light in a direction that forms 45 ° with the central axis;
An illumination opticalization mechanism that changes the first light into the annular illumination light;
With
The light emission mechanism is:
A spherical space and a round hole-shaped exit port are formed, the inner surface defines the space, the inner surface has a diffuse reflection surface, the exit port connects the space and the outside, and the space and Integrating spheres having a common central axis of the exit ports;
Crossing the space, having a discharge section, the center of the discharge section is along the central axis, one end and the other end of the discharge section are along the inner surface, and the discharge section is parallel to the surface to be illuminated. A straight tube type xenon lamp extending in the direction and included in the plane;
A surface property measuring apparatus according to any one of claims 1 to 5.

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