JP2015197418A - Bundle of light separation mechanism, illumination mechanism, and reflection characteristics measurement device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To obtain reference light without influencing light volume of illumination light.SOLUTION: A space formed in a structure is specified by an inner peripheral surface. The inner peripheral surface includes a diffusion reflecting surface. The space includes an incident port and an emission port. The emission port can be seen through the incident port. An opening formed on the structure includes an inlet and an outlet. The inlet is located on the inner peripheral surface. When the bundle of diffusion light is incident into the incident port, the bundle of illumination light is emitted out of the emission port and the bundle of reference light is emitted out of the emission port.

Description

  The present invention relates to a light beam separation mechanism, an illumination mechanism, and a reflection characteristic measurement device.

  The color meter is used for quantitatively measuring the color of industrial products, foods and the like. In the colorimeter, a sample is illuminated with illumination light, reflected light reflected by the sample is measured, and a color value is derived from the measurement result. In the colorimeter, fluctuations in the intensity of the illumination light are monitored, and correction is performed to cancel the fluctuations in the intensity of the illumination light when a color value is derived. For example, in the invention described in Patent Document 1, light emitted from a light source is divided into illumination light and reference light by a beam splitter, and the light quantity of the reference light is measured.

Chinese Patent Application No. 10907493

  In the invention described in Patent Document 1, since the light emitted from the light source is divided into illumination light and reference light by the beam splitter, the amount of illumination light is reduced when the reference light is obtained. For this reason, in the invention described in Patent Document 1, it may be difficult to obtain a sufficient amount of reference light. Or in the invention described in patent document 1, in order to obtain reference light of sufficient light quantity, a color meter may enlarge. This problem also occurs in reflection characteristic measuring devices other than the colorimeter.

  The present invention aims to solve this problem. An object of the present invention is to obtain reference light without affecting the amount of illumination light.

  The space formed in the structure is defined by the inner peripheral surface. The inner peripheral surface has a diffuse reflection surface. The space has an entrance and an exit. The exit is seen from the entrance. The opening formed in the structure has an inlet and an outlet. The entrance is on the inner peripheral surface. When the diffused light beam is incident on the incident port, the light beam of the illumination light is emitted from the output port, and the light beam of the reference light is emitted from the above.

  The light bundle traveling in the direction of looking through the exit exit enters the entrance entrance, travels through the space without being diffusely reflected by the diffuse reflection surface, exits from the exit exit, and becomes illumination light. The light bundle that travels in a direction other than the direction through which the exit exit is seen enters the entrance entrance, propagates through the space, diffusely reflects on the diffuse reflection surface while propagating through the space, enters the entrance, propagates through the opening, and exits from the exit. And become reference light. A light beam that cannot be used as illumination light becomes reference light. Reference light can be obtained without affecting the amount of illumination light.

  These and other objects, features, aspects and advantages of the invention will become more apparent from the following detailed description of the invention when considered in conjunction with the accompanying drawings.

It is a schematic diagram of a color meter. It is sectional drawing of a measurement mechanism. It is sectional drawing of the light beam separation mechanism and the light-receiving mechanism for reference lights. It is sectional drawing of the light reception mechanism for an integrating sphere and reflected light. It is sectional drawing of the light reception mechanism for an integrating sphere and reflected light. It is sectional drawing of a measurement mechanism. It is sectional drawing of the light beam separation mechanism and the light-receiving mechanism for reference lights.

(1) Outline The schematic diagram of FIG. 1 shows a colorimeter. The schematic diagram of FIG. 2 shows the longitudinal cross section of the measuring mechanism which comprises a color meter. The schematic diagram of FIG. 3 shows a cross section of a light beam separating mechanism and a light receiving mechanism for reference light that constitute the colorimeter. The schematic diagrams of FIGS. 4 and 5 show cross sections of the integrating sphere and the light receiving mechanism for reflected light that constitute the colorimeter. FIG. 5 shows an enlarged view of the vicinity of the light receiving mechanism for reflected light.

  A color meter 1000 shown in FIG. 1 includes a measurement mechanism 1010 and a controller 1011. As shown in FIGS. 1 and 2, the measurement mechanism 1010 includes an illumination mechanism 1020, an integrating sphere 1021, a light receiving mechanism 1022 for reflected light, and a light receiving mechanism 1023 for reference light. The illumination mechanism 1020 includes a radiation mechanism 1030, a light beam separation mechanism 1031 and an imaging mechanism 1032. The radiation mechanism 1030 and the imaging mechanism 1032 constitute an illumination optical system. The radiation mechanism 1030 and the light beam separation mechanism 1031 constitute a reference optical system.

  The radiation mechanism 1030 emits a diffused beam. The beam bundle separating mechanism 1031 separates the diffuse beam bundle into a beam bundle 1041 for illumination light and a beam bundle 1042 for reference light. The imaging mechanism 1032 images the light beam 1041 of the illumination light. Thereby, the illumination mechanism 1020 illuminates the sample with the light beam 1041 of the illumination light.

  The integrating sphere 1021 diffuses and reflects the light beam 1043 of the reflected light reflected by the sample and then guides it to the light receiving mechanism 1022 for the reflected light. The light receiving mechanism 1022 for reflected light receives the reflected light bundle 1043 and outputs the measurement results of the tristimulus values X, Y, and Z of the reflected light. The reference light receiving mechanism 1023 receives the reference light beam 1042 and outputs the measurement results of the tristimulus values X, Y, and Z of the reference light. Thereby, the measurement mechanism 1010 outputs the measurement result of the tristimulus values X, Y, and Z of the reflected light and the measurement result of the tristimulus values X, Y, and Z of the reference light.

  The controller 1011 controls the radiation of the diffuse light beam by the radiation mechanism 1030. The controller 1011 acquires the measurement results of the tristimulus values X, Y, and Z of the reflected light and the measurement results of the tristimulus values X, Y, and Z of the reference light, and the tristimulus values X, Y, and Z of the reflected light. The color value is derived from the measurement result. When the color value is derived, correction based on the measurement results of the tristimulus values X, Y and Z of the reference light is performed. This makes the color value less susceptible to illumination light fluctuations.

(2) Radiation mechanism The radiation mechanism 1030 includes a pulse xenon lamp 1050, a reflector 1051, and a diffusion plate 1052. The pulse xenon lamp 1050 emits a light beam. The reflector 1051 diffusely reflects the light beam. The diffusing plate 1052 diffuses the light beam into a diffused beam beam.

  The pulse xenon lamp 1050 emits flash light. When flash is emitted, the sample is illuminated with a large amount of light in a short time, improving the signal-to-noise ratio of the measurement. The pulse xenon lamp 1050 may be replaced with another type of light source. For example, the pulse xenon lamp 1050 may be replaced with a tungsten lamp, a light emitting diode, or the like.

  The reflector 1051 has a diffuse reflection surface 1060. The reflector 1051 may be replaced with a reflector having a shape that is difficult to say as an umbrella.

  When the pulse xenon lamp 1050 emits a light beam, the light beam emitted toward the diffusion plate 1052 is converted into a diffusion light beam by the diffusion plate 1052. In addition, the light beam emitted toward the diffuse reflection surface 1060 is diffusely reflected by the diffuse reflection surface 1060 and is converted into a diffuse light beam by the diffusion plate 1052 toward the diffusion plate 1052. Thereby, the light flux emitted from the pulse xenon lamp 1050 is efficiently used.

  The pulse xenon lamp 1050 is a discharge lamp. In a discharge lamp, since the discharge path differs for each flash radiation, the flash radiation source differs for each flash radiation. In the radiation mechanism 1030, the light flux emitted from the pulse xenon lamp 1050 is diffusely reflected by the diffuse reflection surface 1060 and diffused by the diffuser plate 1052, so that the diffuse light flux is not easily affected by the flash radiation source.

(3) Ray bundle separating mechanism As shown in FIGS. 2 and 3, the ray bundle separating mechanism 1031 includes a rectangular tubular structure 1070 and an attachment mechanism 1071.

  A space 1080 formed in the rectangular tube-shaped structure 1070 is defined on the inner peripheral surface 1090 of the rectangular tube-shaped structure 1070, and has an incident port 1100 at one end and an output port 1101 at the other end. The shape of the cross section perpendicular to the optical axis direction indicated by the arrow 1110 in the space 1080 is a rectangular shape, and is constant even when going in the optical axis direction. The space 1080 extends straight in the optical axis direction and extends from the entrance 1100 to the exit 1101. When the cross-sectional shape of the space 1080 is constant and the space 1080 extends straight, the entire exit port 1101 is seen from the entrance port 1100. When the entire exit port 1101 is seen from the entrance port 1100, there is a light flux that enters the entrance port 1100, travels through the space 1080 without being reflected by the inner peripheral surface 1090, and exits from the exit port 1101. When the cross-sectional shape of the space 1080 is not constant or when the space 1080 does not extend straight, the entire exit port 1101 may not be seen through the entrance port 1100. However, even when a part of the exit port 1101 is seen through the entrance port 1100, there is a light beam that enters the entrance port 1100, travels through the space 1080 without being reflected by the inner peripheral surface 1090, and exits from the exit port 1101. To do. When one position is seen from another position, it means that there is no light shielding object on the straight line connecting one position and the other position, and that the light beam directly reaches the one position from the other position. Say.

  The inner peripheral surface 1090 has a diffuse reflection surface 1120. Desirably, the entire inner peripheral surface 1090 is the diffuse reflection surface 1120, but the inner peripheral surface 1090 may have a slight surface that is not the diffuse reflection surface 1120.

  The openings 1130, 1131 and 1132 formed in the rectangular tubular structure 1070 have inlets 1140, 1141 and 1142 at one end and outlets 1150, 1151 and 1152 at the other ends, respectively. The inner peripheral surface 1090 of 1070 extends to the outer peripheral surface 1091 of the rectangular tubular structure 1070. The inlets 1140, 1141 and 1142 are in the inner peripheral surface 1090. Outlets 1150, 1151, and 1152 are on the outer peripheral surface 1091. Diffuse reflecting surface 1120 is seen from each of outlets 1150, 1151, and 1152. The openings 1130, 1131 and 1132 extend in a direction perpendicular to the optical axis direction. When the diffuse reflection surface 1120 is seen through each of the exits 1150, 1151, and 1152, the light enters the entrance 1100, travels through the space 1080, and is diffusely reflected by the diffuse reflection surface 1120 while traveling through the space 1080, and the entrances 1140, 1141. And 1142, travel through apertures 1130, 1131, and 1132, and exit from exits 1150, 1151, and 1152.

  The diffused light beam emitted from the radiation mechanism 1030 is incident on the incident port 1100. When the diffused light beam is incident on the incident port 1100, the light beam traveling in the direction of looking through the output port 1101 travels through the space 1080 without being diffusely reflected by the diffuse reflection surface 1120, and is emitted from the output port 1101. become. In addition, the light beam traveling in a direction other than the direction through which the exit port 1101 is seen travels through the space 1080 and is diffused and reflected by the diffuse reflection surface 1120 while traveling through the space 1080, and enters the entrances 1140, 1141 and 1142, and the openings 1130, 1131 and Proceeding 1132, the light exits from exits 1150, 1151, and 1152 and becomes reference light. When the light beam traveling in a direction other than the direction through which the exit port 1101 is viewed becomes the reference light, the light beam that cannot be the illumination light becomes the reference light, and the reference light can be obtained without affecting the light quantity of the illumination light.

  The light bundle that enters the entrance 1100, travels through the space 1080, is diffusely reflected by the diffuse reflection surface 1120 while traveling through the space 1080, and exits from the exit 1101 may be part of the illumination light. This improves the measurement signal-to-noise ratio.

  The diffuse reflection surface 1120 is a surface painted with a white matte paint. The white matte paint includes a resin, a white pigment, a matte material, and the like. The resin is an acrylic resin or the like. The white pigment is a powder of titanium oxide, zinc oxide, barium sulfate, calcium carbonate or the like. The matting material is fine particles such as silica, calcium carbonate, calcium phosphate. When the diffuse reflection surface 1120 is a surface painted with a white matte paint, the spectral spectrum of the reference light is less affected by the number of diffuse reflections, and the measurement results of the tristimulus values X, Y, and Z of the reference light Correction by is appropriately performed. The white matte paint may be replaced with an achromatic matte paint other than white. The diffuse reflection surface 1120 may be formed by roughening the inner peripheral surface 1090.

  The entrance 1100 is not seen through the exits 1150, 1151, and 1152. When the entrance 1100 is not seen through the exits 1150, 1151 and 1152, the light bundle does not directly reach the exits 1150, 1151 and 1152 from the entrance 1100, and the light bundle 1042 of the reference light becomes uniform.

  When it is desired to increase the amount of the reference light, the space 1080 is extended in the optical axis direction to increase the area of the diffuse reflection surface 1120 seen from the exits 1150, 1151 and 1152, and the openings 1130, 1131 and The diameter of 1132 is enlarged. This improves the measurement signal-to-noise ratio. Since the light amount of the reference light is proportional to the product of the area of the entrance 1100 and the length of the space 1080 in the optical axis direction, the illumination mechanism 1020 does not become excessively large in order to increase the light amount of the reference light.

  The rectangular tubular structure 1070 may be replaced with another type of structure. For example, the rectangular tubular structure 1070 may be replaced with a cylindrical structure.

  A light receiving mechanism 1023 for reference light is attached to the attachment mechanism 1071.

(4) Imaging Mechanism As shown in FIG. 2, the imaging mechanism 1032 includes a field stop 1160, an aperture stop 1161, a lens 1162, and a lens barrel 1163. The field stop 1160 and the aperture stop 1161 limit the beam bundle 1041 of the illumination light. The lens 1162 forms an image of the light beam 1041 of the illumination light. The lens barrel 1163 supports the field stop 1160, the aperture stop 1161, and the lens 1162. The field stop 1160, the aperture stop 1161 and the lens 1162 constitute an imaging optical system. The field stop illuminated by the beam bundle 1041 of the illumination light is adjusted by the field stop 1160. The numerical aperture is adjusted by the aperture stop 1161.

  Optical elements other than the field stop 1160, the aperture stop 1161, and the lens 1162 may be added to the imaging mechanism 1032. For example, as shown in FIG. 6, a diffusion plate 1164 may be added in front of the aperture stop 1161.

  The imaging mechanism 1032 may be replaced with a collimating mechanism that collimates the light beam 1041 of the illumination light.

(5) Integrating Sphere The integrating sphere 1021 is a hollow spherical structure as shown in FIGS.

  A space 1170 formed in the integrating sphere 1021 is defined on the inner surface 1180 of the integrating sphere 1021. The shape of the space 1170 is spherical. A sample window 1190 formed on the integrating sphere 1021 is seen from an illumination window 1191 formed on the integrating sphere 1021. The sample window 1190 and the illumination window 1191 are not seen through the light receiving window 1192 formed in the integrating sphere 1021. An illumination mechanism 1020 is coupled to the illumination window 1191. A light receiving mechanism 1022 for reflected light is attached to the light receiving window 1192.

  The inner surface 1180 has a diffuse reflection surface 1200. Desirably, the entire inner surface 1180 is the diffuse reflection surface 1200, but the inner surface 1180 may have a slight surface that is not the diffuse reflection surface 1200.

  Similar to the diffuse reflection surface 1120, the diffuse reflection surface 1200 is a surface painted with a white matte paint.

  When the illumination mechanism 1020 emits a light beam 1041 of illumination light, the light beam 1041 of illumination light enters the illumination window 1191, travels through the space 1170 without being reflected by the inner surface 1180, and reaches the sample window 1190. When there is a sample in the sample window 1190, the sample is illuminated by the beam bundle 1041 of the illumination light reaching the sample window 1190, and the sample reflects the beam bundle 1043 of the reflected light. The reflected light bundle 1043 propagates through the space 1170, is diffusely reflected by the diffuse reflection surface 1200 while propagating through the space 1170, and exits from the light receiving window 1192.

(6) Light receiving mechanism for reflected light The light receiving mechanism 1022 for reflected light includes a sensor unit 1210 as shown in FIG.

  The sensor unit 1210 includes filters 1220, 1221 and 1222, stops 1230, 1231 and 1232, light receiving sensors 1240, 1241 and 1242, and a structure 1250.

  The filters 1220, 1221, and 1222 are inserted into holes 1260, 1261, and 1262 formed in the structure 1250, respectively, and are supported by the structure 1250. The apertures 1230, 1231, and 1232 are inserted into holes 1260, 1261, and 1262 formed in the structure 1250, respectively, and are supported by the structure 1250. The light receiving sensors 1240, 1241, and 1242 are inserted into holes 1260, 1261, and 1262 formed in the structure 1250, respectively, and are supported by the structure 1250.

  The diaphragm 1270, the filter 1220, the diaphragm 1230, and the light receiving sensor 1240 formed in the structure 1250 constitute a light receiving optical system that measures the stimulus value X. The diaphragm 1271, the filter 1221, the diaphragm 1231, and the light receiving sensor 1241 formed on the structure 1250 constitute a light receiving optical system that measures the stimulus value Y. The diaphragm 1272, the filter 1222, the diaphragm 1232, and the light receiving sensor 1242 formed in the structure 1250 constitute a light receiving optical system that measures the stimulus value Z.

  A common point of the light receiving optical system that measures the stimulus value X, the light receiving optical system that measures the stimulus value Y, and the light receiving optical system that measures the stimulus value Z will be described by taking a light receiving optical system that measures the stimulus value X as an example.

  The diaphragm 1270, the filter 1220, the diaphragm 1230, and the light receiving sensor 1240 are arranged in the order described.

  When the reflected light bundle 1043 enters the aperture 1260, the reflected beam 1043 travels through the aperture 1260 and passes through the aperture 1270, filter 1220, and aperture 1230 in the order described. The light receiving sensor 1240 receives the light. The apertures 1270 and 1230 limit the beam bundle 1043 of the reflected light. The light receiving sensor 1240 receives the reflected light beam 1043 and outputs a signal corresponding to the amount of received light. Thereby, the stimulus value X is measured. By the apertures 1270 and 1230, the incident angle of the reflected light bundle 1043 to the filter 1220 is reduced. That is, the reflected light beam 1043 enters the filter 1220 substantially perpendicularly.

  The operating angle θ 1 of the sensor unit 1210, that is, the opening angle θ 1 of the light beam passing through the apertures 1270 and 1230, the light beam 1041 of the illumination light incident on the illumination window 1191 is not received by the light receiving sensor 1240 and the reflected light beam The bundle 1043 is set so as not to be received by the light receiving sensor 1240 without being diffusely reflected by the diffuse reflection surface 1200. Thus, the light flux 1043 of the reflected light is uniformly mixed by diffuse reflection and then received by the light receiving sensor 1240. The opening angle θ1 is set large within a range that satisfies this condition, and is set to about 40 °, for example. Thereby, the light flux 1043 of the reflected light is taken in from a wide range of the diffuse reflection surface 1200, and the measurement signal-to-noise ratio is improved.

(7) Filter The filter 1220 has a bimodal wavelength transmittance characteristic corresponding to the stimulus value X. The filter 1221 has a single-peak wavelength transmittance characteristic corresponding to the stimulus value Y. The filter 1222 has a single-peak wavelength transmittance characteristic corresponding to the stimulus value Z. The wavelength transmittance characteristics of the filters 1220, 1221 and 1222 are set so that an appropriate color value is derived when the color value is derived by applying the weighting coefficient of the 10 ° field of view of the D65 light source.

  The filters 1220, 1221 and 1222 are interference film filters. When the filter 1220 is an interference film filter, it is easy to provide the filter 1220 with a bimodal wavelength transmittance characteristic.

  The interference film filter has an advantage that a necessary wavelength transmittance characteristic can be easily obtained by a combination of interference films. For example, necessary wavelength transmittance characteristics can be easily obtained by stacking about 40 to 60 layers of interference films. For this reason, when an interference film filter is used, the accuracy of measurement is improved.

  The interference film filter has an advantage of high transmittance at the peak wavelength. For this reason, when an interference film filter is used, the amount of light received by the light receiving sensor is increased, and the signal-to-noise ratio of the measurement is improved.

  The interference film filter has a drawback that the wavelength transmittance characteristic varies depending on the incident angle. This drawback is caused by the fact that the interference condition (interference distance) varies depending on the incident angle. In the light receiving mechanism 1022 for reflected light, the incident angle of the reflected light beam 1043 to the filters 1220, 1221 and 1222 is small, so that this defect is difficult to manifest.

  A filter other than the interference filter may be used. For example, colored glass or acetate film may be used. However, when a colored glass, an acetate film, or the like is used, a bimodal wavelength transmittance characteristic corresponding to the stimulus value X cannot be realized by a combination of two or more colored glasses, an acetate film, or the like. For this reason, when a colored glass, an acetate film, or the like is used, a single-peak wavelength transmittance characteristic having a peak at the first peak wavelength is given to the first colored glass, an acetate film, etc. A single-peak wavelength transmittance characteristic having a peak at the peak wavelength is given to the second colored glass, acetate film, etc., and the first colored glass, acetate film, etc. are used to measure the stimulation value X1, A second colored glass, acetate film or the like is used to measure the value X2, and the stimulus value X is derived from the stimulus values X1 and X2. However, if two filters are used to measure the stimulus value X, four filters are used to measure the stimulus values X, Y and Z, increasing the manufacturing cost of the colorimeter 1000. . Focusing on the fact that the peak wavelength of the unimodal wavelength transmittance characteristic corresponding to the stimulus value Z is close to the first peak wavelength, the stimulus value X1 is derived by multiplying the stimulus value Z by a coefficient, thereby obtaining the first color. Omitting glass, acetate film, etc. is also performed. However, even if the stimulus value Z is multiplied by a coefficient, the exact stimulus value X1 is not derived. Therefore, if the first colored glass, acetate film, or the like is omitted by this method, the measurement accuracy decreases.

(8) Light receiving mechanism for reference light The light receiving mechanism 1023 for reference light includes a diffusion plate 1280 and a sensor unit 1281 as shown in FIG.

  The diffusion plate 1280 is disposed between the openings 1130, 1131, and 1132 and the sensor unit 1281, and diffuses the light beam 1042 of the reference light.

  The sensor unit 1281 includes filters 1290, 1291 and 1292, stops 1300, 1301 and 1302, light receiving sensors 1310, 1311 and 1312, and a structure 1320. In the structure 1320, apertures 1330, 1331, and 1332 are formed, and holes 1340, 1341, and 1342 are formed.

  The sensor unit 1281 is the same type as the sensor unit 1210. The sensor unit 1281 being the same type as the sensor unit 1210 reduces the manufacturing cost of the color meter 1000.

  When the light receiving mechanism 1023 for reference light receives the light beam 1042 for reference light, the diffusion plate 1280 diffuses the light beam 1042 for reference light. The diffused beam of reference light 1042 is incident on the holes 1340, 1341 and 1342. The diffuser plate 1280 causes a part of the light beam that travels in a direction other than the direction from the outlets 1150, 1151, and 1152 to the light receiving sensors 1310, 1311, and 1312 to the light receiving sensors 1310, 1311, and 1312, thereby improving the measurement signal-to-noise ratio. The

  When the sensor unit 1281 is the same type as the sensor unit 1210, the sensor unit 1281 includes the diaphragms 1300, 1301, and 1302 and the diaphragms 1330, 1331, and 1332, so that the light receiving sensors 1310, 1311, and 1312 are connected from the outlets 1150, 1151, and 1152. Installed away. When the light receiving sensors 1310, 1311, and 1312 are installed apart from the outlets 1150, 1151, and 1152, the light flux that goes in a direction other than the direction from the outlets 1150, 1151, and 1152 toward the light receiving sensors 1310, 1311, and 1312 increases. The light flux received by the light receiving sensors 1310, 1311 and 1312 decreases, and the measurement signal-to-noise ratio deteriorates. The diffuser plate 1280 suppresses such a decrease in received light flux.

  The sensor unit 1281 may be replaced with a sensor unit that is not the same type as the sensor unit 1210. When the sensor unit 1281 is replaced with a sensor unit that is not the same type as the sensor unit 1210, the sensor unit 1281 is preferably replaced with a sensor unit without an aperture.

  The schematic diagram of FIG. 7 shows a cross section of the light beam separation mechanism and the light receiving mechanism for reference light when the sensor unit is replaced with a sensor unit that does not include a diaphragm.

  The sensor unit 1350 shown in FIG. 7 includes light receiving sensors 1360, 1361, and 1362, and filters 1370, 1371, and 1372. The light receiving sensors 1360, 1361 and 1362 are installed close to the outlets 1150, 1151 and 1152.

(9) Change of measurement method The measurement method of the light receiving mechanism 1022 for reflected light and the light receiving mechanism 1023 for reference light may be changed from the tristimulus value method to the spectroscopic method. As a spectroscopic light receiving mechanism, there is a polychromator including a wavelength dispersion element such as a diffraction grating or a prism. When the measuring method of the light receiving mechanism 1022 for reflected light and the light receiving mechanism 1023 for reference light is changed to a spectroscopic method, a spectrocolorimeter that measures a spectroscopic spectrum may be configured. A reflection characteristic measurement device that measures reflection characteristics other than the color value and the spectral spectrum may be configured.

(10) Diameter and thickness of the aperture The opening angle θ3 of the light beam passing through the apertures 1130, 1131 and 1132, is determined by the operating angle θ2 of the sensor unit 1281, that is, the apertures 1330, 1331 and 1332 and the apertures 1300, 1301 and 1302. It is set to be approximately the same as the opening angle θ2 of the light beam passing through or set wider than the opening angle θ2. The opening angle θ3 is determined by the diameters and thicknesses of the openings 1130, 1131 and 1132.

  The opening angle θ3 is set so that the diffused light beam incident on the entrance 1100 does not pass through the openings 1130, 1131 and 1132 without being reflected by the diffuse reflection surface 1120. Thereby, the beam bundle 1042 of the reference light becomes uniform.

  The incident angle of the reference light beam 1042 to the sensor unit 1281 is desirably the same as the incident angle of the reflected light beam 1043 to the sensor unit 1210. Accordingly, even when an interference film filter having different wavelength transmittance characteristics depending on the incident angle is used, the light receiving characteristics of the sensor unit 1281 are the same as the light receiving characteristics of the sensor unit 1210.

  Since the sensor unit 1210 is used for color measurement while the sensor unit 1281 is used for monitoring the fluctuation of illumination light, the light receiving characteristic of the sensor unit 1281 may be different from the light receiving characteristic of the sensor unit 1210. . However, when the opening angle θ3 becomes too narrow, for example, when the opening angles θ1 and θ2 are 40 ° and the opening angle θ3 is 20 °, the amount of the reference light decreases, and the measurement signal The noise to noise ratio gets worse.

(11) Controller The controller 1011 is an embedded computer, and performs control by executing firmware. All or part of the control by the controller 1011 may be realized by hardware without software.

The controller 1011 controls the pulse xenon lamp 1050 and causes the pulse xenon lamp 1050 to emit a light beam. Further, the controller 1011 acquires the tristimulus values X, Y and Z of the reflected light from the light receiving sensors 1240, 1241 and 1242, respectively, when the pulse xenon lamp 1050 emits the light bundle, and the tristimulus values of the reference light. X, Y, and Z are acquired from the light receiving sensors 1310, 1311, and 1312, respectively. Furthermore, the controller 1011 derives a color value from the tristimulus values X, Y, and Z of the reflected light. The color values are expressed in Munsell color system, L ^* a ^* b ^* color system, L ^* C ^* h color system, Hunter Lab color system, XYZ color system, and the like. When the color value is derived, correction by the tristimulus values X, Y and Z of the reference light is performed.

  While the invention has been shown and described in detail, the above description is illustrative in all aspects and not restrictive. Accordingly, it is understood that numerous modifications and variations can be devised without departing from the scope of the present invention.

1000 Colorimeter 1010 Measurement mechanism 1011 Controller 1020 Illumination mechanism 1021 Integrating sphere 1022 Light reception mechanism for reflected light 1023 Light reception mechanism for reference light 1030 Radiation mechanism 1031 Beam bundle separation mechanism 1032 Imaging mechanism 1041 Beam bundle of illumination light 1042 Reference light Ray bundle 1043 ray bundle of reflected light 1080 space 1130, 1131, 1132 opening

Claims (10)

A space and an opening are formed, having an inner peripheral surface defining the space, the inner peripheral surface having a diffuse reflection surface, the space having an entrance and an exit, and the opening having an entrance and an exit When the exit is seen from the entrance, the entrance is on the inner peripheral surface, and a diffused light bundle is incident on the entrance, the light bundle of illumination light exits from the exit and is referred to A beam bundle separating mechanism comprising a structure in which a beam bundle of light is emitted from the exit. The light flux separating mechanism according to claim 1, wherein the diffuse reflection surface is a surface painted with a white matte paint. The light beam separation mechanism according to claim 1 or 2, wherein the entrance is not seen through the exit. A radiation mechanism for emitting the diffuse beam;
The light beam separation mechanism according to any one of claims 1 to 3,
An optical system that images or collimates the beam of illumination light; and
An illumination mechanism comprising: The optical system is
A field stop for limiting the light flux of the illumination light;
An aperture stop for limiting the light flux of the illumination light;
A lens that forms an image of the light bundle of the illumination light;
The illumination mechanism according to claim 4. The radiation mechanism is
A light source that emits a bundle of rays;
A diffusion plate that diffuses the light flux into the diffuse light flux;
The illumination mechanism according to claim 4 or 5. The illumination mechanism according to claim 6, wherein the light source is a pulsed xenon lamp. The diffuse reflection surface is a first diffuse reflection surface;
The radiation mechanism further comprises a reflector having a second diffuse reflection surface;
The beam bundle includes a first beam bundle and a second beam bundle;
The first light beam is emitted toward the diffuser;
The illumination mechanism according to claim 6 or 7, wherein the second light beam is emitted toward the second diffuse reflection surface, diffusely reflected by the second diffuse reflection surface, and directed toward the diffusion plate. An illumination mechanism according to any one of claims 4 to 8,
A first light receiving mechanism that receives a bundle of reflected light reflected by the sample and outputs a first measurement result;
A second light receiving mechanism for receiving a beam of the reference light and outputting a second measurement result;
A derivation unit that performs correction based on the second measurement result and derives a reflection characteristic from the first measurement result;
A reflection characteristic measuring apparatus comprising: The first light receiving mechanism includes:
A first aperture stop, a second aperture stop, and a first light receiving sensor, wherein the first aperture stop and the second aperture stop restricting a beam bundle of the reflected light, and the first light receiving sensor is A first sensor unit for receiving the light beam;
The second light receiving mechanism includes:
A reference light diffusing plate for diffusing a beam of the reference light;
A third diaphragm, a fourth diaphragm, and a second light receiving sensor, wherein the third diaphragm and the fourth diaphragm limit a beam bundle of the reference light, and the second light receiving sensor A second sensor unit for receiving the light beam;
The reflection characteristic measuring apparatus according to claim 9.

Images