JP2015206789A5 - - Google Patents

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Publication number
JP2015206789A5
JP2015206789A5 JP2015080578A JP2015080578A JP2015206789A5 JP 2015206789 A5 JP2015206789 A5 JP 2015206789A5 JP 2015080578 A JP2015080578 A JP 2015080578A JP 2015080578 A JP2015080578 A JP 2015080578A JP 2015206789 A5 JP2015206789 A5 JP 2015206789A5
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JP
Japan
Prior art keywords
potential
transistor
under test
terminal
node
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JP2015080578A
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English (en)
Japanese (ja)
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JP2015206789A (ja
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Priority to JP2015080578A priority Critical patent/JP2015206789A/ja
Priority claimed from JP2015080578A external-priority patent/JP2015206789A/ja
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Publication of JP2015206789A5 publication Critical patent/JP2015206789A5/ja
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JP2015080578A 2014-04-11 2015-04-10 電流測定方法 Withdrawn JP2015206789A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015080578A JP2015206789A (ja) 2014-04-11 2015-04-10 電流測定方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014082224 2014-04-11
JP2014082224 2014-04-11
JP2015080578A JP2015206789A (ja) 2014-04-11 2015-04-10 電流測定方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019216174A Division JP2020056794A (ja) 2014-04-11 2019-11-29 電流測定方法

Publications (2)

Publication Number Publication Date
JP2015206789A JP2015206789A (ja) 2015-11-19
JP2015206789A5 true JP2015206789A5 (enrdf_load_stackoverflow) 2018-05-17

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JP2015080578A Withdrawn JP2015206789A (ja) 2014-04-11 2015-04-10 電流測定方法
JP2019216174A Withdrawn JP2020056794A (ja) 2014-04-11 2019-11-29 電流測定方法

Family Applications After (1)

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JP2019216174A Withdrawn JP2020056794A (ja) 2014-04-11 2019-11-29 電流測定方法

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JP (2) JP2015206789A (enrdf_load_stackoverflow)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001249147A (ja) * 2000-03-03 2001-09-14 Nec Corp 電流検出回路および電流検出方法
KR101124665B1 (ko) * 2005-07-08 2012-03-28 삼성전자주식회사 누설전류 측정회로 및 누설전류 비교회로
US9057758B2 (en) * 2009-12-18 2015-06-16 Semiconductor Energy Laboratory Co., Ltd. Method for measuring current, method for inspecting semiconductor device, semiconductor device, and test element group
EP2519969A4 (en) * 2009-12-28 2016-07-06 Semiconductor Energy Lab SEMICONDUCTOR COMPONENT
JP2011237418A (ja) * 2010-04-16 2011-11-24 Semiconductor Energy Lab Co Ltd 電流測定方法、半導体装置の検査方法、半導体装置、および特性評価用回路
JP6506566B2 (ja) * 2014-02-21 2019-04-24 株式会社半導体エネルギー研究所 電流測定方法

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