JP2015143685A5 - - Google Patents

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JP2015143685A5
JP2015143685A5 JP2015004519A JP2015004519A JP2015143685A5 JP 2015143685 A5 JP2015143685 A5 JP 2015143685A5 JP 2015004519 A JP2015004519 A JP 2015004519A JP 2015004519 A JP2015004519 A JP 2015004519A JP 2015143685 A5 JP2015143685 A5 JP 2015143685A5
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detection
pixels
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JP2015004519A
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JP6359466B2 (ja
JP2015143685A (ja
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JP2015004519A 2014-01-13 2015-01-13 サブ解像度での光学的検出 Active JP6359466B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461926476P 2014-01-13 2014-01-13
US61/926,476 2014-01-13

Publications (3)

Publication Number Publication Date
JP2015143685A JP2015143685A (ja) 2015-08-06
JP2015143685A5 true JP2015143685A5 (enExample) 2017-12-07
JP6359466B2 JP6359466B2 (ja) 2018-07-18

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JP2015004519A Active JP6359466B2 (ja) 2014-01-13 2015-01-13 サブ解像度での光学的検出

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US (1) US9523771B2 (enExample)
EP (1) EP2894546B1 (enExample)
JP (1) JP6359466B2 (enExample)
KR (1) KR102046944B1 (enExample)
CN (1) CN104776797B (enExample)

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KR20170104506A (ko) * 2015-01-06 2017-09-15 페이스북, 인크. 패턴화 광을 사용하는 깊이 맵핑을 제공하기 위한 방법 및 시스템
EP3057067B1 (en) * 2015-02-16 2017-08-23 Thomson Licensing Device and method for estimating a glossy part of radiation
US10366674B1 (en) * 2016-12-27 2019-07-30 Facebook Technologies, Llc Display calibration in electronic displays
DE112018000284B4 (de) * 2017-01-24 2023-04-06 Analog Devices, Inc. Bereitstellen eines dynamischen Sichtfelds für von einer dynamischen Position empfangenes Licht
US10620316B2 (en) * 2017-05-05 2020-04-14 Qualcomm Incorporated Systems and methods for generating a structured light depth map with a non-uniform codeword pattern
KR102693894B1 (ko) 2019-03-29 2024-08-12 삼성전자주식회사 광각 고해상도 거리 측정 장치
DE102020207302A1 (de) 2020-06-10 2021-12-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Vorrichtung und Verfahren zur Aufnahme eines projizierten Punktmusters in einer Anzeigevorrichtung

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JP2755885B2 (ja) * 1992-11-26 1998-05-25 株式会社クボタ Ｃｃｄへの入射光線束の位置検出方法
JP2851227B2 (ja) * 1993-08-03 1999-01-27 株式会社クボタ Ｃｃｄへの入射光線束の位置検出方法
JP3212777B2 (ja) * 1993-10-28 2001-09-25 三菱電機株式会社 画像処理装置
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JP3858994B2 (ja) * 2002-11-28 2006-12-20 株式会社山武 位置検出方法および装置
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CN100580367C (zh) * 2007-02-13 2010-01-13 宏濑科技股份有限公司 侦测待测物表面的轮廓的测量方法
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