JP2015082387A5 - - Google Patents

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Publication number
JP2015082387A5
JP2015082387A5 JP2013219352A JP2013219352A JP2015082387A5 JP 2015082387 A5 JP2015082387 A5 JP 2015082387A5 JP 2013219352 A JP2013219352 A JP 2013219352A JP 2013219352 A JP2013219352 A JP 2013219352A JP 2015082387 A5 JP2015082387 A5 JP 2015082387A5
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JP
Japan
Prior art keywords
equivalent
operation time
secondary battery
deterioration
deterioration rate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2013219352A
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English (en)
Japanese (ja)
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JP2015082387A (ja
JP6222822B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2013219352A priority Critical patent/JP6222822B2/ja
Priority claimed from JP2013219352A external-priority patent/JP6222822B2/ja
Priority to PCT/JP2014/077604 priority patent/WO2015060200A1/ja
Priority to SG11201602054QA priority patent/SG11201602054QA/en
Priority to US15/022,289 priority patent/US20160231389A1/en
Publication of JP2015082387A publication Critical patent/JP2015082387A/ja
Publication of JP2015082387A5 publication Critical patent/JP2015082387A5/ja
Application granted granted Critical
Publication of JP6222822B2 publication Critical patent/JP6222822B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2013219352A 2013-10-22 2013-10-22 劣化関数算出装置、劣化率推定システム、劣化関数算出方法、及びプログラム Expired - Fee Related JP6222822B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2013219352A JP6222822B2 (ja) 2013-10-22 2013-10-22 劣化関数算出装置、劣化率推定システム、劣化関数算出方法、及びプログラム
PCT/JP2014/077604 WO2015060200A1 (ja) 2013-10-22 2014-10-16 劣化関数算出装置、劣化率推定装置、劣化率推定システム、劣化関数算出方法、劣化率推定方法、及びプログラム
SG11201602054QA SG11201602054QA (en) 2013-10-22 2014-10-16 Deterioration function calculation device, deterioration rate estimation device, deterioration rate estimation system, deterioration function calculation method, deterioration rate estimation method, and program
US15/022,289 US20160231389A1 (en) 2013-10-22 2014-10-16 Deterioration function calculation device, deterioration rate estimation device, deterioration rate estimation system, deterioration function calculation method, deterioration rate estimation method, and program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013219352A JP6222822B2 (ja) 2013-10-22 2013-10-22 劣化関数算出装置、劣化率推定システム、劣化関数算出方法、及びプログラム

Publications (3)

Publication Number Publication Date
JP2015082387A JP2015082387A (ja) 2015-04-27
JP2015082387A5 true JP2015082387A5 (enExample) 2016-10-06
JP6222822B2 JP6222822B2 (ja) 2017-11-01

Family

ID=52992798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013219352A Expired - Fee Related JP6222822B2 (ja) 2013-10-22 2013-10-22 劣化関数算出装置、劣化率推定システム、劣化関数算出方法、及びプログラム

Country Status (4)

Country Link
US (1) US20160231389A1 (enExample)
JP (1) JP6222822B2 (enExample)
SG (1) SG11201602054QA (enExample)
WO (1) WO2015060200A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3009093B1 (fr) * 2013-07-29 2017-01-13 Renault Sa Estimation de l'etat de vieillissement d'une batterie electrique
JP6222841B2 (ja) * 2014-03-25 2017-11-01 三菱重工業株式会社 運行管理装置、列車制御方法及びプログラム
CN109784510A (zh) * 2019-01-21 2019-05-21 上海船舶研究设计院（中国船舶工业集团公司第六0四研究院） 船舶设备健康维护方法及系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002354708A (ja) * 2001-05-24 2002-12-06 Shin Kobe Electric Mach Co Ltd 無停電電源装置
JP2007055450A (ja) * 2005-08-24 2007-03-08 Fuji Heavy Ind Ltd 蓄電デバイスの劣化状態推定システム
US20070055450A1 (en) * 2005-09-08 2007-03-08 Searete Llc, A Limited Liability Corporation Of State Of Delaware Data techniques related to tissue coding
WO2011135609A1 (ja) * 2010-04-26 2011-11-03 トヨタ自動車株式会社 蓄電素子の劣化推定装置および劣化推定方法
WO2011160258A1 (zh) * 2010-06-24 2011-12-29 松下电器产业株式会社 获取电池的劣化度的方法和系统

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