JP2014530081A5 - - Google Patents

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Publication number
JP2014530081A5
JP2014530081A5 JP2014536385A JP2014536385A JP2014530081A5 JP 2014530081 A5 JP2014530081 A5 JP 2014530081A5 JP 2014536385 A JP2014536385 A JP 2014536385A JP 2014536385 A JP2014536385 A JP 2014536385A JP 2014530081 A5 JP2014530081 A5 JP 2014530081A5
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Japan
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magnetic resonance
imaging
spatial
magnetic field
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JP2014536385A
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English (en)
Japanese (ja)
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JP2014530081A (ja
JP6030143B2 (ja
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Priority claimed from PCT/IB2012/055619 external-priority patent/WO2013057655A1/en
Publication of JP2014530081A publication Critical patent/JP2014530081A/ja
Publication of JP2014530081A5 publication Critical patent/JP2014530081A5/ja
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Publication of JP6030143B2 publication Critical patent/JP6030143B2/ja
Expired - Fee Related legal-status Critical Current
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JP2014536385A 2011-10-18 2012-10-16 Ｍｒ電気特性断層撮影 Expired - Fee Related JP6030143B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161548445P 2011-10-18 2011-10-18
US61/548,445 2011-10-18
PCT/IB2012/055619 WO2013057655A1 (en) 2011-10-18 2012-10-16 Mr electrical properties tomography

Publications (3)

Publication Number Publication Date
JP2014530081A JP2014530081A (ja) 2014-11-17
JP2014530081A5 true JP2014530081A5 (enExample) 2015-12-03
JP6030143B2 JP6030143B2 (ja) 2016-11-24

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ID=47226241

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014536385A Expired - Fee Related JP6030143B2 (ja) 2011-10-18 2012-10-16 Ｍｒ電気特性断層撮影

Country Status (8)

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US (1) US20140239951A1 (enExample)
EP (1) EP2753238A1 (enExample)
JP (1) JP6030143B2 (enExample)
CN (1) CN103957785B (enExample)
BR (1) BR112014009099A2 (enExample)
IN (1) IN2014CN02545A (enExample)
RU (1) RU2616984C2 (enExample)
WO (1) WO2013057655A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5865262B2 (ja) * 2010-01-18 2016-02-17 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 電気特性断層画像化方法及びシステム
IN2014CN02545A (enExample) * 2011-10-18 2015-08-07 Koninkl Philips Nv
WO2014154728A1 (en) * 2013-03-29 2014-10-02 Koninklijke Philips N.V. Amide proton transfer (apt) and electric properties tomography (ept) imaging in a single mr acquisition
EP3378426A1 (en) * 2017-03-20 2018-09-26 Koninklijke Philips N.V. Locating ablated tissues using electric properties tomography
EP3407079B1 (en) 2017-05-22 2022-12-07 Orta Dogu Teknik Universitesi An induced current magnetic resonance electrical impedance tomography (icmreit) pulse sequence based on monopolar slice selection gradient pulses
CN107390149B (zh) * 2017-07-21 2019-12-13 上海联影医疗科技有限公司 梯度线圈极性的检测方法、存储介质及磁共振扫描系统
EP3447515A1 (en) * 2017-08-23 2019-02-27 Koninklijke Philips N.V. Magnetic resonance imaging with a variable field magnet
DE102017220697A1 (de) * 2017-11-20 2019-05-23 Siemens Healthcare Gmbh Verfahren zum Betreiben einer MRT-Anlage und MRT-Anlage
EP3543724A1 (en) 2018-03-20 2019-09-25 Koninklijke Philips N.V. (3-n)-dimensional determination of electric conductivity
EP3581090A1 (en) * 2018-06-11 2019-12-18 Koninklijke Philips N.V. Electrical properties tomography mapping of conductivity changes
JP2022516675A (ja) * 2019-01-14 2022-03-01 コーニンクレッカ フィリップス エヌ ヴェ Ｅｅｇに関する高周波導電率から低周波導電率へ区画特有のダウンスケーリング
EP3736593A1 (en) * 2019-05-09 2020-11-11 Koninklijke Philips N.V. Dual echo steady state mr imaging using bipolar diffusion gradients
JP7163516B2 (ja) * 2020-01-15 2022-10-31 朝日インテック株式会社 測定装置、検出装置、および測定方法
CN113495242B (zh) * 2020-04-03 2022-12-20 上海联影医疗科技股份有限公司 相位误差探测方法、装置、磁共振系统及其成像方法
JP7438398B2 (ja) * 2020-11-11 2024-02-26 朝日インテック株式会社 測定装置および測定方法
US11698428B2 (en) 2021-01-27 2023-07-11 The University Of Tokyo Information processing apparatus and information processing method

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100451671C (zh) * 2002-11-18 2009-01-14 皇家飞利浦电子股份有限公司 磁共振方法和设备
WO2004062464A2 (en) * 2003-01-10 2004-07-29 Kohwang Foundation, Kohwang Board Of Trustee System and method for three-dimensional visualization of conductivity and current density distribution in electrically conducting object
GB0427686D0 (en) * 2004-12-17 2005-02-02 Univ Basel Method for detection and imaging of synchronous spin and charged particle motion
CN101208610A (zh) * 2005-06-24 2008-06-25 皇家飞利浦电子股份有限公司 同时多核磁共振成像
JP5203199B2 (ja) * 2005-08-08 2013-06-05 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 電気インピーダンス撮像システム
WO2008135885A1 (en) * 2007-05-03 2008-11-13 Koninklijke Philips Electronics N.V. Propeller mri with phase correction
JP2009119204A (ja) * 2007-11-13 2009-06-04 Masaki Sekino インピーダンス分布測定方法及びインピーダンス分布測定装置
JP5177379B2 (ja) * 2008-01-07 2013-04-03 株式会社日立メディコ 磁気共鳴イメージング装置
JP5865262B2 (ja) * 2010-01-18 2016-02-17 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 電気特性断層画像化方法及びシステム
US9453897B2 (en) * 2010-08-26 2016-09-27 Hitachi Medical Corporation Magnetic resonance imaging apparatus and vibrational error magnetic field reduction method
IN2014CN02545A (enExample) * 2011-10-18 2015-08-07 Koninkl Philips Nv

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