JP2014518112A5 - - Google Patents
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- JP2014518112A5 JP2014518112A5 JP2014517686A JP2014517686A JP2014518112A5 JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5 JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014517686 A JP2014517686 A JP 2014517686A JP 2014518112 A5 JP2014518112 A5 JP 2014518112A5
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- JP
- Japan
- Prior art keywords
- grating
- imaging system
- ray
- detector
- analyzer
- Prior art date
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- 238000003384 imaging method Methods 0.000 claims 19
- 238000006073 displacement reaction Methods 0.000 claims 5
- 230000006835 compression Effects 0.000 claims 3
- 238000007906 compression Methods 0.000 claims 3
- 230000000694 effects Effects 0.000 claims 3
- 210000000481 breast Anatomy 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000009897 systematic effect Effects 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161504260P | 2011-07-04 | 2011-07-04 | |
| SE1150622-7 | 2011-07-04 | ||
| US61/504,260 | 2011-07-04 | ||
| SE1150622 | 2011-07-04 | ||
| PCT/EP2012/062489 WO2013004574A1 (en) | 2011-07-04 | 2012-06-27 | Phase contrast imaging apparatus |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014518112A JP2014518112A (ja) | 2014-07-28 |
| JP2014518112A5 true JP2014518112A5 (OSRAM) | 2015-07-09 |
| JP6353361B2 JP6353361B2 (ja) | 2018-07-04 |
Family
ID=47436543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014517686A Expired - Fee Related JP6353361B2 (ja) | 2011-07-04 | 2012-06-27 | 位相コントラストイメージング装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9757082B2 (OSRAM) |
| EP (1) | EP2729069B1 (OSRAM) |
| JP (1) | JP6353361B2 (OSRAM) |
| CN (1) | CN103648388B (OSRAM) |
| RU (1) | RU2620892C2 (OSRAM) |
| WO (1) | WO2013004574A1 (OSRAM) |
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| BR112014017853A8 (pt) | 2012-01-24 | 2017-07-11 | Koninklijke Philips Nv | Sistema de geração de imagens por raios x para a geração de imagens de contraste de fase de um objeto, método para a geração de imagens por de contraste de fase de raios x de um objeto, elemento de programa de computador para o controle de um aparelho, e meio legível por computador |
| US9717470B2 (en) | 2012-08-20 | 2017-08-01 | Koninklijke Philips N.V. | Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging |
| WO2014137922A1 (en) * | 2013-03-05 | 2014-09-12 | Rambus Inc. | Phase gratings with odd symmetry for high-resoultion lensless optical sensing |
| WO2014187885A1 (de) * | 2013-05-22 | 2014-11-27 | Siemens Aktiengesellschaft | Phasenkontrast-rontgenbildgebungsvorrichtung |
| CN105338901B (zh) * | 2013-06-28 | 2019-03-08 | 皇家飞利浦有限公司 | 狭缝扫描相位衬度成像中的校正 |
| US9297772B2 (en) | 2013-07-30 | 2016-03-29 | Industrial Technology Research Institute | Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements |
| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| EP2943124B1 (en) * | 2013-09-30 | 2016-08-31 | Koninklijke Philips N.V. | Differential phase contrast imaging device with movable grating(s) |
| US10045749B2 (en) | 2013-10-22 | 2018-08-14 | Koninklijke Philips N.V. | X-ray system, in particular a tomosynthesis system and a method for acquiring an image of an object |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| WO2015090949A1 (en) * | 2013-12-17 | 2015-06-25 | Koninklijke Philips N.V. | Phase retrieval for scanning differential phase contrast systems |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| TWI629474B (zh) | 2014-05-23 | 2018-07-11 | 財團法人工業技術研究院 | X光光源以及x光成像的方法 |
| JP6369206B2 (ja) * | 2014-08-06 | 2018-08-08 | コニカミノルタ株式会社 | X線撮影システム及び画像処理装置 |
| JP6688795B2 (ja) | 2014-11-24 | 2020-04-28 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | X線位相コントラストトモシンセシス撮像に対する検出器及び撮像システム |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| CN106483548B (zh) * | 2015-08-28 | 2019-07-26 | 北京纳米维景科技有限公司 | 一种光子计数探测器阵列及其成像方法 |
| EP3383273B1 (en) * | 2015-12-01 | 2021-05-12 | Koninklijke Philips N.V. | Apparatus for x-ray imaging an object |
| JP6613988B2 (ja) * | 2016-03-30 | 2019-12-04 | コニカミノルタ株式会社 | 放射線撮影システム |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| JP6937380B2 (ja) | 2017-03-22 | 2021-09-22 | シグレイ、インコーポレイテッド | X線分光を実施するための方法およびx線吸収分光システム |
| EP3444826A1 (en) * | 2017-08-14 | 2019-02-20 | Koninklijke Philips N.V. | Low profile anti scatter and anti charge sharing grid for photon counting computed tomography |
| EP3446630A1 (en) | 2017-08-23 | 2019-02-27 | Koninklijke Philips N.V. | Device and method for phase stepping in phase contrast image acquisition |
| EP3447538A1 (en) * | 2017-08-23 | 2019-02-27 | Koninklijke Philips N.V. | X-ray detection |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| DE112019002822T5 (de) | 2018-06-04 | 2021-02-18 | Sigray, Inc. | Wellenlängendispersives röntgenspektrometer |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| US10962491B2 (en) | 2018-09-04 | 2021-03-30 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| CN113167917B (zh) | 2018-11-19 | 2024-03-12 | 棱镜传感器公司 | 使用光子计数事件进行相衬成像的x射线成像系统 |
| CN114729907B (zh) | 2019-09-03 | 2023-05-23 | 斯格瑞公司 | 用于计算机层析x射线荧光成像的系统和方法 |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| CN114930162A (zh) | 2020-02-27 | 2022-08-19 | 深圳帧观德芯科技有限公司 | 相位对比成像法 |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| DE112021004828T5 (de) | 2020-09-17 | 2023-08-03 | Sigray, Inc. | System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse |
| JP7626856B2 (ja) | 2020-12-07 | 2025-02-04 | シグレイ、インコーポレイテッド | 透過x線源を用いた高スループット3d x線撮像システム |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11992350B2 (en) | 2022-03-15 | 2024-05-28 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| DE112023002079T5 (de) | 2022-05-02 | 2025-02-27 | Sigray, Inc. | Sequenzielles wellenlängendispersives röntgenspektrometer |
| US12209977B2 (en) | 2023-02-16 | 2025-01-28 | Sigray, Inc. | X-ray detector system with at least two stacked flat Bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| CN120195197A (zh) * | 2023-12-21 | 2025-06-24 | 清华大学 | 辐射成像设备和方法 |
| WO2025151383A1 (en) | 2024-01-08 | 2025-07-17 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| US12431256B2 (en) | 2024-02-15 | 2025-09-30 | Sigray, Inc. | System and method for generating a focused x-ray beam |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5335255A (en) * | 1992-03-24 | 1994-08-02 | Seppi Edward J | X-ray scanner with a source emitting plurality of fan beams |
| US5812629A (en) * | 1997-04-30 | 1998-09-22 | Clauser; John F. | Ultrahigh resolution interferometric x-ray imaging |
| RU2150888C1 (ru) * | 1998-06-26 | 2000-06-20 | Технико-медицинское отделение Научно-исследовательского института электромеханики | Аппарат рентгеновский |
| SE528366C2 (sv) | 2004-02-13 | 2006-10-31 | Sectra Mamea Ab | Metod och anordning avseende röntgenbildtagning |
| US7412026B2 (en) * | 2004-07-02 | 2008-08-12 | The Board Of Regents Of The University Of Oklahoma | Phase-contrast x-ray imaging systems and methods |
| US7583779B2 (en) * | 2004-11-24 | 2009-09-01 | General Electric Company | System and method for acquisition and reconstruction of contrast-enhanced, artifact-reduced CT images |
| US7869563B2 (en) * | 2004-11-26 | 2011-01-11 | Hologic, Inc. | Integrated multi-mode mammography/tomosynthesis x-ray system and method |
| US20070076842A1 (en) * | 2005-09-30 | 2007-04-05 | Tkaczyk John E | Adaptable energy discriminating computed tomography system |
| US7302031B2 (en) * | 2005-10-27 | 2007-11-27 | Sectra Mamea Ab | Method and arrangement relating to X-ray imaging |
| DE102006015356B4 (de) * | 2006-02-01 | 2016-09-22 | Siemens Healthcare Gmbh | Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System |
| EP1879020A1 (en) | 2006-07-12 | 2008-01-16 | Paul Scherrer Institut | X-ray interferometer for phase contrast imaging |
| WO2008102598A1 (ja) * | 2007-02-21 | 2008-08-28 | Konica Minolta Medical & Graphic, Inc. | 放射線画像撮影装置及び放射線画像撮影システム |
| JP2008206560A (ja) * | 2007-02-23 | 2008-09-11 | Kyushu Univ | 骨塩量測定装置 |
| WO2008132988A1 (ja) * | 2007-04-12 | 2008-11-06 | Konica Minolta Medical & Graphic, Inc. | X線画像分析システム及びプログラム |
| US7924973B2 (en) * | 2007-11-15 | 2011-04-12 | Csem Centre Suisse D'electronique Et De Microtechnique Sa | Interferometer device and method |
| RU2489762C2 (ru) * | 2008-02-14 | 2013-08-10 | Конинклейке Филипс Электроникс Н.В. | Детектор рентгеновского излучения для формирования фазово-контрастных изображений |
| JP5539307B2 (ja) * | 2008-03-19 | 2014-07-02 | コーニンクレッカ フィリップス エヌ ヴェ | 位相コントラストイメージングのための回転x線装置 |
| EP2168488B1 (de) * | 2008-09-30 | 2013-02-13 | Siemens Aktiengesellschaft | Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung |
| US7949095B2 (en) * | 2009-03-02 | 2011-05-24 | University Of Rochester | Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT |
| US8848863B2 (en) | 2009-12-10 | 2014-09-30 | Koninklijke Philips N.V. | Non-parallel grating arrangement with on-the-fly phase stepping, X-ray system |
| JP5702586B2 (ja) | 2010-02-04 | 2015-04-15 | 富士フイルム株式会社 | 放射線撮影システム |
| JP2012090945A (ja) | 2010-03-30 | 2012-05-17 | Fujifilm Corp | 放射線検出装置、放射線撮影装置、放射線撮影システム |
| EP2585817B1 (en) * | 2010-06-28 | 2020-01-22 | Paul Scherrer Institut | A method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry |
-
2012
- 2012-06-27 EP EP12731408.6A patent/EP2729069B1/en active Active
- 2012-06-27 JP JP2014517686A patent/JP6353361B2/ja not_active Expired - Fee Related
- 2012-06-27 RU RU2014103625A patent/RU2620892C2/ru active
- 2012-06-27 WO PCT/EP2012/062489 patent/WO2013004574A1/en not_active Ceased
- 2012-06-27 CN CN201280033300.9A patent/CN103648388B/zh not_active Expired - Fee Related
-
2016
- 2016-07-15 US US15/211,228 patent/US9757082B2/en not_active Expired - Fee Related
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