JP2014514449A - Tubular target with protective device - Google Patents
Tubular target with protective device Download PDFInfo
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- JP2014514449A JP2014514449A JP2014502951A JP2014502951A JP2014514449A JP 2014514449 A JP2014514449 A JP 2014514449A JP 2014502951 A JP2014502951 A JP 2014502951A JP 2014502951 A JP2014502951 A JP 2014502951A JP 2014514449 A JP2014514449 A JP 2014514449A
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- tubular target
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- 230000001681 protective effect Effects 0.000 title claims abstract description 32
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims abstract description 32
- 229910052750 molybdenum Inorganic materials 0.000 claims abstract description 32
- 239000011733 molybdenum Substances 0.000 claims abstract description 32
- 239000003507 refrigerant Substances 0.000 claims abstract description 20
- 229920000642 polymer Polymers 0.000 claims abstract description 16
- 229910001182 Mo alloy Inorganic materials 0.000 claims abstract description 11
- 238000004544 sputter deposition Methods 0.000 claims abstract description 9
- 239000000463 material Substances 0.000 claims description 22
- 238000000576 coating method Methods 0.000 claims description 11
- 239000011248 coating agent Substances 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 239000000919 ceramic Substances 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 5
- 239000003822 epoxy resin Substances 0.000 claims description 5
- 229920000647 polyepoxide Polymers 0.000 claims description 5
- 239000000945 filler Substances 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 4
- -1 polyethylene Polymers 0.000 claims description 4
- 238000005507 spraying Methods 0.000 claims description 4
- 239000002826 coolant Substances 0.000 claims description 3
- 239000011888 foil Substances 0.000 claims description 3
- 229910002804 graphite Inorganic materials 0.000 claims description 3
- 239000010439 graphite Substances 0.000 claims description 3
- 229920000728 polyester Polymers 0.000 claims description 3
- 229920002635 polyurethane Polymers 0.000 claims description 3
- 239000004814 polyurethane Substances 0.000 claims description 3
- 239000004698 Polyethylene Substances 0.000 claims description 2
- 239000004743 Polypropylene Substances 0.000 claims description 2
- 150000002739 metals Chemical class 0.000 claims description 2
- 229920000573 polyethylene Polymers 0.000 claims description 2
- 229920001155 polypropylene Polymers 0.000 claims description 2
- 229920000915 polyvinyl chloride Polymers 0.000 claims description 2
- 239000004800 polyvinyl chloride Substances 0.000 claims description 2
- 239000002356 single layer Substances 0.000 claims description 2
- 229920001567 vinyl ester resin Polymers 0.000 claims description 2
- 229920001973 fluoroelastomer Polymers 0.000 claims 1
- 238000003780 insertion Methods 0.000 claims 1
- 230000037431 insertion Effects 0.000 claims 1
- 230000007774 longterm Effects 0.000 abstract description 2
- 238000005477 sputtering target Methods 0.000 description 12
- 239000010410 layer Substances 0.000 description 11
- 239000010959 steel Substances 0.000 description 10
- 229910000831 Steel Inorganic materials 0.000 description 9
- 238000005260 corrosion Methods 0.000 description 7
- 230000007797 corrosion Effects 0.000 description 7
- 238000005488 sandblasting Methods 0.000 description 6
- 239000010949 copper Substances 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 229910000679 solder Inorganic materials 0.000 description 4
- 229910000851 Alloy steel Inorganic materials 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000013077 target material Substances 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 239000003112 inhibitor Substances 0.000 description 2
- 238000005304 joining Methods 0.000 description 2
- MEFBJEMVZONFCJ-UHFFFAOYSA-N molybdate Chemical compound [O-][Mo]([O-])(=O)=O MEFBJEMVZONFCJ-UHFFFAOYSA-N 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 238000005554 pickling Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910000967 As alloy Inorganic materials 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910000846 In alloy Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 229920000180 alkyd Polymers 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- GPBUGPUPKAGMDK-UHFFFAOYSA-N azanylidynemolybdenum Chemical compound [Mo]#N GPBUGPUPKAGMDK-UHFFFAOYSA-N 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000011231 conductive filler Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000013074 reference sample Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000002893 slag Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 229910000601 superalloy Inorganic materials 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000007751 thermal spraying Methods 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/342—Hollow targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3426—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
- H01J37/3491—Manufacturing of targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
- H01J37/3497—Temperature of target
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
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- Organic Chemistry (AREA)
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Abstract
本発明は、モリブデン又はモリブデン合金からなり、少なくとも一定の領域で冷媒と接触する内側表面(3)を備え、内側表面(3)の少なくとも一定の領域が少なくとも1つの保護装置(4)により冷媒(4)から分離されている、バッキングチューブを有しない陰極スパッタリング用管状ターゲット(1)に関する。保護装置(4)は、例えばポリマー層として設計可能である。管状ターゲット(1)は、卓越した長時間耐性を有する。
【選択図】図1The present invention comprises an inner surface (3) made of molybdenum or a molybdenum alloy and in contact with the refrigerant in at least a certain region, wherein at least a certain region of the inner surface (3) is cooled by at least one protective device (4) ( It relates to a tubular target (1) for cathode sputtering that does not have a backing tube and is separated from 4). The protective device (4) can be designed, for example, as a polymer layer. The tubular target (1) has excellent long-term resistance.
[Selection] Figure 1
Description
本発明は、スパッタ表面と、少なくとも部分的に冷媒と接触させられている内側表面とを、備える、モリブデン又は少なくとも50原子%のモリブデン含有量を有するモリブデン合金からなる、陰極スパッタリング用のバッキングチューブを有しない管状ターゲットに関する。 The present invention provides a backing tube for cathode sputtering comprising a molybdenum surface or a molybdenum alloy having a molybdenum content of at least 50 atomic%, comprising a sputter surface and an inner surface that is at least partially in contact with a coolant. It relates to a tubular target that does not have.
純モリブデン及びモリブデン合金、例えばMo−Na、からなる管状ターゲットは、Cu(Inx、Ga1-x)(Sey、S1-y)2(Ga:CIGS付き、Ga:CISなし)をベースとする薄膜太陽電池又はTFT−LCD用の薄膜トランジスタの製造時等における、陰極スパッタリング、例えばマグネトロンスパッタリング、によるモリブデン含有層の堆積に使用される。この場合、モリブデン含有層は、数nmから数μmの厚さを有する。スパッタリングに必要な出発材料(陰極)は、スパッタリングターゲットと呼ばれ、塗被設備の形態に応じて、平板又は管の形で使用される。管状ターゲットとも呼ばれる管状スパッタリングターゲットは、操作中に、ターゲットの内部に配置された固定磁石系又は可動磁石系の周りを回転させられる。平板状のスパッタリングターゲットに比べて、管状スパッタリングターゲットは、材料の均一な除去と従って高い材料収率とが達成される利点を有する。特に製造が複雑な高価な材料については、管状スパッタリングターゲットが勝っている。セラミック及び脆性材料では、管状ターゲットは、少なくとも2分割され、管状ターゲットの保持及び移動に必要な力が脆性の、従って破損しやすい、スパッタ材料に作用しないようにされている。この場合、スパッタ材料からなる管又は複数の管片は、例えば非磁性鋼又はチタンからなる、バッキングチューブと接合される。接合技術として、低融点の半田、例えばインジウム又はインジウム合金、を使用する半田付け法が用いられている。 Pure molybdenum and molybdenum alloys, for example, Mo-Na, tubular target formed from, Cu (In x, Ga 1 -x) (Se y, S 1-y) 2 (Ga: with CIGS, Ga: no CIS) based The film is used for depositing a molybdenum-containing layer by cathode sputtering, for example, magnetron sputtering, in the production of a thin film solar cell or TFT-LCD thin film transistor. In this case, the molybdenum-containing layer has a thickness of several nm to several μm. The starting material (cathode) necessary for sputtering is called a sputtering target and is used in the form of a flat plate or a tube depending on the form of the coating equipment. Tubular sputtering targets, also called tubular targets, are rotated around a fixed or movable magnet system disposed within the target during operation. Compared to flat sputtering targets, tubular sputtering targets have the advantage that a uniform removal of the material and thus a high material yield is achieved. Especially for expensive materials that are complex to manufacture, tubular sputtering targets are superior. In ceramic and brittle materials, the tubular target is divided into at least two parts so that the force required to hold and move the tubular target does not act on the sputtered material, which is brittle and therefore prone to breakage. In this case, the tube or the plurality of tube pieces made of the sputtered material is joined to a backing tube made of nonmagnetic steel or titanium, for example. As a joining technique, a soldering method using a low melting point solder such as indium or an indium alloy is used.
スパッタリングの際に用いられるエネルギーの75%超は、熱としてスパッタリングターゲットに入る。スパッタリングターゲットの表面上への高エネルギーイオンの衝撃により発生する熱エネルギーは、スパッタリングターゲット材料及び/又は半田材料の過熱を防ぐために、十分に効果的に、放散する必要がある。それ故、スパッタリングターゲットの冷却は、重要な意味を持つ。管状ターゲットの場合、スパッタリングターゲットの内側表面が、全面的に又は一定の領域において、冷媒の貫流により冷却される。この場合、冷媒は、管状ターゲットの形態に応じて、スパッタ材料に直接接触させられるか又はバッキングチューブに接触させられる。 More than 75% of the energy used during sputtering enters the sputtering target as heat. The thermal energy generated by the bombardment of high energy ions on the surface of the sputtering target must be dissipated sufficiently effectively to prevent overheating of the sputtering target material and / or solder material. Therefore, cooling the sputtering target is important. In the case of a tubular target, the inner surface of the sputtering target is cooled entirely or in certain areas by the flow of coolant. In this case, the refrigerant is brought into direct contact with the sputtered material or brought into contact with the backing tube, depending on the form of the tubular target.
モリブデン又はモリブデン合金製の管状ターゲットは、広くバッキングチューブとともに使用されている。この場合の欠点は、スパッタ材料とバッキングチューブとの接合に労力を要することだけではなく、密実なバッキングチューブ及び半田材料により熱拡散が妨げられることである。例えば鋼は、モリブデンに比して相当程度、熱伝導特性が劣っている。 Tubular targets made of molybdenum or molybdenum alloys are widely used with backing tubes. The disadvantage in this case is not only that labor is required for joining the sputtered material and the backing tube, but also that heat diffusion is hindered by the dense backing tube and solder material. For example, steel is inferior in heat conductivity to a considerable extent compared to molybdenum.
モリブデン又はモリブデン合金製の管状ターゲットがバッキングチューブなしで作られると、冷媒とターゲット材料との直接的な接触が生じる。モリブデン及びモリブデン合金は、通常の冷媒の長時間の作用を受けると、腐食する。この場合の腐食速度は、冷媒の組成及び種類並びに使用条件に応じて、1年に10分の数ミリメートルに達する。冷媒との接触により生じるモリブデンの溶解及びこの場合に発生する腐食生成物(主としてモリブデン酸塩又は例えば銅との混合モリブデン酸塩)により、冷媒の特性が変化する。例えば、冷媒のpH値が著しく低下し、それとともに冷却循環路において使用されるほかの材料(例えば銅、真鍮、特殊鋼)が著しく腐食作用を受ける。冷却循環路におけるモリブデン及びほかの材料の腐食は、有機又は無機抑制剤の冷媒への添加により抑制されるが、完全に防止することはできない。モリブデン用の腐食抑制剤は、例えば特許文献1に記載されている。冷媒の状態の定期的監視及び場合によって必要な添加物の補充は、更に設備経費を高めることになる。
When a tubular target made of molybdenum or molybdenum alloy is made without a backing tube, direct contact between the refrigerant and the target material occurs. Molybdenum and molybdenum alloys corrode when subjected to the long-term action of ordinary refrigerants. The corrosion rate in this case reaches a few tenths of a millimeter per year, depending on the composition and type of refrigerant and the conditions of use. The characteristics of the refrigerant change due to the dissolution of molybdenum caused by contact with the refrigerant and the corrosion products generated in this case (mainly molybdate or a mixed molybdate with copper, for example). For example, the pH value of the refrigerant is significantly reduced, and other materials used in the cooling circuit (for example, copper, brass, special steel) are significantly corroded. Corrosion of molybdenum and other materials in the cooling circuit is suppressed by the addition of organic or inorganic inhibitors to the refrigerant, but cannot be completely prevented. A corrosion inhibitor for molybdenum is described in
使用される冷媒の特性の一覧例を表1にまとめる。
更に考慮しなければならないことは、モリブデンの原料価格が極めて高いことである。モリブデン製の使用済みスパッタリングターゲットは、通常はリサイクルされずに、コンパクトな形で鋼及び超合金の製造用の合金金属として使用される。(ほかの金属の混入のない)単一品のスクラップは、通常の鋼合金にとっては異種である元素を含むMoスクラップよりも明らかに高い価格になる。それ故、バッキングチューブを備えたモリブデン管ターゲットは、まず半田付けを解き、通常は鋼合金にとって異種である半田材料を、労力を掛けて、除去する必要がある。 A further consideration is that the raw material price of molybdenum is very high. Spent sputtering targets made of molybdenum are not normally recycled but are used in compact form as alloy metals for the production of steel and superalloys. A single piece of scrap (without any other metal contamination) is clearly more expensive than a Mo scrap containing elements that are dissimilar to ordinary steel alloys. Therefore, a molybdenum tube target with a backing tube must first be unsoldered and remove the solder material that is usually dissimilar to the steel alloy with effort.
それ故、本発明の課題は、先行技術の項で述べたような欠点を持たないモリブデン又はモリブデン合金製の管状ターゲットを提供することにある。この点に関して特に強調すべきことは、熱放散が十分に保証され、管状ターゲットの使用期間全体に亘って腐食をできる限り回避し、そして、使用済みスパッタリングターゲットが鋼工業用の合金材料として容易に使用できるようにすることである。 The object of the present invention is therefore to provide a tubular target made of molybdenum or a molybdenum alloy which does not have the disadvantages mentioned in the prior art section. What should be particularly emphasized in this regard is that heat dissipation is sufficiently ensured, corrosion is avoided as much as possible throughout the lifetime of the tubular target, and the used sputtering target is easily used as an alloy material for the steel industry. Is to be able to use it.
この課題は、独立請求項の特徴部分により解決される。本発明の実施により、腐食は確実に避けられ、熱放散が許容できないほど悪くなることはない。更に、使用済み管状ターゲットは、労力の掛かる分離や洗浄なしに、鋼製造用合金スクラップとして使用できる。何故なら、保護装置のモリブデン成分量は、僅かであるからである。 This problem is solved by the features of the independent claims. By implementing the present invention, corrosion is reliably avoided and heat dissipation is not unacceptably worse. Furthermore, the used tubular target can be used as an alloy scrap for steel production without labor intensive separation or cleaning. This is because the amount of molybdenum component in the protective device is very small.
管状ターゲットは、純モリブデン又はモリブデン合金からなる。この場合、モリブデン合金とは、モリブデン含有量が50原子%を超える全てのモリブデン含有材料を指す。以下の記載でモリブデンについて言及するときは、常に純モリブデンとモリブデン含有量が50原子%を超える全てのモリブデン含有材料とを含むものとする。管状ターゲットは、バッキングチューブなしで形成される。この場合、「バッキングチューブなし」とは、バッキングチューブが全く使用されないことを意味する。モリブデン管状ターゲットは、それ故、スパッタ設備の保持系又は端末ブロックに直接接合される。スパッタ表面とは、管状ターゲットの外側表面のことを言う。内側表面は、管状ターゲットの内壁に相当する。内側表面の少なくとも一部の領域は、少なくとも1つの保護装置により、冷媒から分離される。ターゲット材料と保護装置との面接触が生じると有利である。更に、冷媒と接触する全ての内側表面が、少なくとも1つの保護装置により、冷媒から分離されると有利である。保護装置が(半径方向に測定して)0.0005mm〜1mmの厚さを有すると有利である。特に有利なのは、保護装置が(半径方向に測定して)0.0005mm〜0.1mmの厚さを有することである。保護装置の熱伝導率が1W/m.K未満であれば、保護装置の厚さは、0.0005mm〜0.5mmが好適である。更に、保護装置が単層又は複層であれば有利である。層の付着を改良するためには、保護装置の取り付け前に、管の内側表面を前処理、例えば脱脂又は粗面化、すると有利である。更に有利な実施形態は、保護装置が薄壁の膜又は薄壁の管の形をとり、加圧された冷媒の作用下で、管状ターゲットの内側表面に継ぎ目なく当接することである。この場合、薄壁とは1mmまでの範囲の厚さのものを言う。保護装置は、少なくともポリマー、金属、セラミック及びガラスからなる群から選ばれる1つの材料からなると有利である。好適な金属は、例えばニッケルであり、これは、化学的ニッケルメッキにより簡単に取り付けることができる。セラミック材料では、モリブデン窒化物が挙げられるが、これはモリブデン管の窒化により簡単に製造できる。ガラスからなる層では、ケイ素酸化物をベースとする系が特に適している。 The tubular target is made of pure molybdenum or a molybdenum alloy. In this case, the molybdenum alloy refers to all molybdenum-containing materials whose molybdenum content exceeds 50 atomic%. References to molybdenum in the following description always include pure molybdenum and all molybdenum-containing materials with a molybdenum content greater than 50 atomic percent. The tubular target is formed without a backing tube. In this case, “no backing tube” means that no backing tube is used. The molybdenum tubular target is therefore directly joined to the holding system or terminal block of the sputtering equipment. The sputter surface refers to the outer surface of the tubular target. The inner surface corresponds to the inner wall of the tubular target. At least a portion of the inner surface is separated from the refrigerant by at least one protective device. It is advantageous if surface contact between the target material and the protective device occurs. Furthermore, it is advantageous if all inner surfaces in contact with the refrigerant are separated from the refrigerant by at least one protective device. It is advantageous if the protective device has a thickness (measured in the radial direction) of 0.0005 mm to 1 mm. It is particularly advantageous that the protective device has a thickness of 0.0005 mm to 0.1 mm (measured in the radial direction). The thermal conductivity of the protective device is 1 W / m. If it is less than K, 0.0005 mm-0.5 mm are suitable for the thickness of a protective device. Furthermore, it is advantageous if the protective device is a single layer or multiple layers. In order to improve the adhesion of the layers, it is advantageous if the inner surface of the tube is pretreated, for example degreased or roughened, before the protective device is installed. A further advantageous embodiment is that the protective device takes the form of a thin-walled membrane or a thin-walled tube and seamlessly abuts the inner surface of the tubular target under the action of a pressurized refrigerant. In this case, the thin wall means one having a thickness in the range of up to 1 mm. The protective device is advantageously made of at least one material selected from the group consisting of polymer, metal, ceramic and glass. A suitable metal is, for example, nickel, which can be easily attached by chemical nickel plating. Ceramic materials include molybdenum nitride, which can be easily manufactured by nitriding a molybdenum tube. For layers made of glass, systems based on silicon oxide are particularly suitable.
更に、鋼製造にとって問題のない材料としては、例えばポリマーのように、その成分(炭素)が一方では鋼の全炭素含有量に関して問題のない添加材料であり他方では鋼製造の際に気体の形(窒素・水素・塩素・フッ素等)で消失する材料が、選ばれる。保護装置がセラミック又はガラスから成る場合には、鋼製造時にこれらの成分はスラグとして析出される。 Furthermore, as a material that is not problematic for steel production, for example, its component (carbon) is an additive material that is not problematic with respect to the total carbon content of the steel, on the one hand, and on the other hand in the form of gas during steel production. Materials that disappear with (nitrogen, hydrogen, chlorine, fluorine, etc.) are selected. If the protective device is made of ceramic or glass, these components are deposited as slag during steel production.
製造コスト及びリサイクル性を考慮すると、保護装置が少なくとも1つのポリマーを含有してなると有利である。ポリマーが0.5W/m.Kを超える、特に1W/m.Kを超える、熱伝導率を有すると特に有利である。電気伝導性も管状ターゲットの使用特性に有利に作用する。熱及び/又は電気伝導性は、例えば、ポリマーが1つ又は複数の伝導性充填材を備えていれば得られる。好適な充填材としては、セラミック、グラファイト及び金属からなる群から選ばれる材料が挙げられる。特に好適な充填材は、Cu、Al、Si、Zn、Mo、W、例えばAl2O3のような酸化物、例えばAlN、TiN、BN、MoN又はSiNのような窒化物、例えばSiC、TiC又はWCのようなカーバイド、及び、グラファイトである。 In view of production costs and recyclability, it is advantageous if the protective device comprises at least one polymer. Polymer was 0.5 W / m. K, in particular 1 W / m. It is particularly advantageous to have a thermal conductivity exceeding K. Electrical conductivity also has an advantageous effect on the usage characteristics of the tubular target. Thermal and / or electrical conductivity can be obtained, for example, if the polymer comprises one or more conductive fillers. Suitable fillers include materials selected from the group consisting of ceramic, graphite and metal. Particularly suitable fillers are Cu, Al, Si, Zn, Mo, W, oxides such as Al 2 O 3 , eg nitrides such as AlN, TiN, BN, MoN or SiN, eg SiC, TiC. Or carbide such as WC and graphite.
更に、保護装置が少なくとも1つのポリマーからなると有利である。非充填及び充填状態において特に好適なポリマーは、エポキシ樹脂、ポリエチレン、ポリプロピレン、ポリウレタン、ポリ塩化ビニル、ポリエステル、ビニルエステル及びフッ素化エラストマーからなる群から選ばれるポリマーである。 Furthermore, it is advantageous if the protective device consists of at least one polymer. Particularly preferred polymers in the unfilled and filled state are polymers selected from the group consisting of epoxy resins, polyethylene, polypropylene, polyurethane, polyvinyl chloride, polyesters, vinyl esters and fluorinated elastomers.
保護装置は、湿式塗布、塗装、噴霧又は箔の貼り付けにより載置し又は取り付けると有利である。 The protective device is advantageously placed or attached by wet application, painting, spraying or foil application.
しかし、また、ほかの塗被方法、例えば化学的気相析出(CVD)、熱噴霧、低温噴霧、ゾル・ゲル塗被法、メッキ、陰極スパッタリング(PVD)、電気メッキ、化学的及び電気化学的プロセス、焼結、拡散塗被、擦り付け、又はバックキャスティングも適している。 However, other coating methods such as chemical vapor deposition (CVD), thermal spraying, low temperature spraying, sol-gel coating, plating, cathode sputtering (PVD), electroplating, chemical and electrochemical Process, sintering, diffusion coating, rubbing, or back casting is also suitable.
以下に本発明を実施例により説明する。 Hereinafter, the present invention will be described by way of examples.
図1は、スパッタ表面(2)、内側表面(3)及び保護装置(4)を備えた本発明による管状ターゲット(1)の概略斜視図を示す。 FIG. 1 shows a schematic perspective view of a tubular target (1) according to the invention with a sputter surface (2), an inner surface (3) and a protective device (4).
〔例1〕
125mmの内径と165mmの外径とを有し、スパッタ表面(2)を備えたモリブデン管(1)は、欧州特許出願公開第1937866号明細書に記載された製法で作られた。モリブデン管の塗被すべき内側表面(3)は、1,500mmの長さを有していた。塗被されるべき内側表面は、先ず、サンドブラストで粗面化された。続いての塗被は、粒径50μmのAlを70容量%充填したエポキシ樹脂の塗付により行なわれた。保護装置(4)の層厚は、約300μmであった。
[Example 1]
A molybdenum tube (1) having an inner diameter of 125 mm and an outer diameter of 165 mm and provided with a sputter surface (2) was made by the process described in EP 1937866. The inner surface (3) to be coated of the molybdenum tube had a length of 1,500 mm. The inner surface to be coated was first roughened by sandblasting. Subsequent coating was performed by applying an epoxy resin filled with 70% by volume of Al having a particle size of 50 μm. The layer thickness of the protective device (4) was about 300 μm.
〔例2〕
直径10mm及び長さ50mmの円筒状モリブデン試料の耐腐食性が、塗被されてない状態及び塗被された状態(例2a−2g)で、曝露テストにより、試験された。サンプルは、この場合、種々の冷媒中において160時間の期間に亘り貯蔵され、サンプルの質量減少が測定された。冷媒浴は、実験期間中、マグネチックスターラーにより撹拌された。測定結果を表2に示した。Rで示したサンプル(参照サンプル)は、従来技術に相当する(塗被されていない)。例2aから2gは、本発明による例である。
[Example 2]
The corrosion resistance of cylindrical molybdenum samples 10 mm in diameter and 50 mm in length was tested by an exposure test in the uncoated state and in the coated state (Examples 2a-2g). The sample was then stored in various refrigerants for a period of 160 hours and the mass loss of the sample was measured. The refrigerant bath was stirred by a magnetic stirrer during the experiment. The measurement results are shown in Table 2. The sample indicated by R (reference sample) corresponds to the prior art (not coated). Examples 2a to 2g are examples according to the invention.
〔例2a〕
塗被すべき表面は、サンドブラストで粗面化された。続いての塗被は、粒径50μmのAlを70容量%充填したエポキシ樹脂の塗付により行なわれた。層厚は、約300μmであった。
[Example 2a]
The surface to be coated was roughened by sandblasting. Subsequent coating was performed by applying an epoxy resin filled with 70% by volume of Al having a particle size of 50 μm. The layer thickness was about 300 μm.
〔例2b〕
塗被すべき表面は、サンドブラストで粗面化された。続いての塗被はアルキド樹脂塗料(ポリエステル)の湿式塗付により行なわれ、空気中で乾燥された。層厚は、約100μmであった。
[Example 2b]
The surface to be coated was roughened by sandblasting. Subsequent coating was performed by wet coating of an alkyd resin paint (polyester) and dried in air. The layer thickness was about 100 μm.
〔例2c〕
塗被すべき表面は、サンドブラストで粗面化された。続いての塗被は粒径50μmのAl2O3を70容量%充填したエポキシ樹脂の塗付により行なわれた。層厚は、約300μmであった。
[Example 2c]
The surface to be coated was roughened by sandblasting. Subsequent coating was performed by applying an epoxy resin filled with 70% by volume of Al 2 O 3 having a particle size of 50 μm. The layer thickness was about 300 μm.
〔例2d〕
塗被すべき表面は、酸洗いにより洗浄脱脂された。続いての塗被は、ポリウレタン化合物の粉末噴霧により行なわれた。層厚は、約500μmであった。
[Example 2d]
The surface to be coated was washed and degreased by pickling. Subsequent coating was performed by powder spraying of the polyurethane compound. The layer thickness was about 500 μm.
〔例2e〕
塗被すべき表面は、酸洗いにより洗浄脱脂された。通常のメッキ化学法(硫酸銅ベース)で厚さ15μmの銅層が析出された。
[Example 2e]
The surface to be coated was washed and degreased by pickling. A copper layer having a thickness of 15 μm was deposited by an ordinary plating chemical method (based on copper sulfate).
〔例2f〕
塗被すべき表面は、サンドブラストで粗面化された。続いてSiO2をベースとするスラリーが塗布され、200℃/60minで熱処理された。
[Example 2f]
The surface to be coated was roughened by sandblasting. Subsequently, a slurry based on SiO 2 was applied and heat-treated at 200 ° C./60 min.
〔例2g〕
塗被すべき表面は、サンドブラストで粗面化された。続いて厚さ2μmのTiN層がCVDにより適用された。
[Example 2g]
The surface to be coated was roughened by sandblasting. Subsequently, a 2 μm thick TiN layer was applied by CVD.
1 管状ターゲット
2 スパッタ表面
3 内側表面
4 保護装置
DESCRIPTION OF
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PCT/AT2012/000094 WO2012135883A1 (en) | 2011-04-08 | 2012-04-05 | Tubular target having a protective device |
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CN105296944A (en) * | 2015-10-27 | 2016-02-03 | 有研亿金新材料有限公司 | Target material assembly with antioxidative plating |
TW201911853A (en) * | 2017-08-10 | 2019-03-16 | 聚晶半導體股份有限公司 | Dual-camera image pick-up apparatus and image capturing method thereof |
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Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02301559A (en) * | 1989-05-15 | 1990-12-13 | Kojundo Chem Lab Co Ltd | Target for sputtering having integrated structure |
JPH0499270A (en) * | 1990-08-11 | 1992-03-31 | Fujitsu Ltd | Sputtering target and film formation by sputtering |
JPH0539566A (en) * | 1991-02-19 | 1993-02-19 | Mitsubishi Materials Corp | Sputtering target and its production |
JPH0817763A (en) * | 1994-06-28 | 1996-01-19 | Riyouka Massey Kk | Sputtering target |
JP2000239839A (en) * | 1999-02-19 | 2000-09-05 | Tadahiro Omi | Sputtering device |
WO2001077402A2 (en) * | 2000-04-07 | 2001-10-18 | Surface Engineered Products Corporation | Method and apparatus for magnetron sputtering |
JP2005520935A (en) * | 2002-03-22 | 2005-07-14 | ヴルチンガー・ディーター | Rotatable tubular cathode |
JP2007302981A (en) * | 2006-05-15 | 2007-11-22 | Hitachi Metals Ltd | METHOD FOR MANUFACTURING CYLINDRICAL SPUTTERING TARGET MATERIAL OF Mo ALLOY |
WO2008150686A1 (en) * | 2007-05-30 | 2008-12-11 | Applied Materials, Inc. | Bonding method for cylindrical target |
JP2012162759A (en) * | 2011-02-04 | 2012-08-30 | Sumitomo Metal Mining Co Ltd | Cylindrical sputtering target |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2301559A (en) * | 1938-10-21 | 1942-11-10 | Hancock Mfg Company | Door latch |
US4719035A (en) | 1984-01-27 | 1988-01-12 | The United States Of America As Represented By The Secretary Of The Air Force | Corrosion inhibitor formulation for molybdenum tungsten and other metals |
KR0163981B1 (en) | 1993-06-29 | 1999-01-15 | 사또오 아키오 | Resin composition for sealing liquid crystal cell made of film |
WO2002020866A1 (en) | 2000-09-08 | 2002-03-14 | Asahi Glass Company, Limited | Cylindrical target and method of manufacturing the cylindrical target |
JP2004123874A (en) * | 2002-10-01 | 2004-04-22 | Nippon Steel Chem Co Ltd | Film-forming resin composition and film-like adhesive |
CN1538545A (en) * | 2003-04-16 | 2004-10-20 | 刘奥宇 | Controllable metal fuel battery |
WO2005119841A2 (en) * | 2004-06-04 | 2005-12-15 | Radiall Antenna Technologies, Inc. | Circuit component and circuit component assembly for antenna circuit |
US20050279630A1 (en) * | 2004-06-16 | 2005-12-22 | Dynamic Machine Works, Inc. | Tubular sputtering targets and methods of flowforming the same |
DE102005030484B4 (en) | 2005-06-28 | 2007-11-15 | Carl Freudenberg Kg | Elastic nonwoven fabric, process for its preparation and its use |
ES2293442T3 (en) | 2005-08-02 | 2008-03-16 | APPLIED MATERIALS GMBH & CO. KG | TUBULAR CATODE FOR CATHODIC SPRAYING. |
AT8697U1 (en) | 2005-10-14 | 2006-11-15 | Plansee Se | TUBE TARGET |
WO2007049765A1 (en) * | 2005-10-27 | 2007-05-03 | Mitsubishi Plastics, Inc. | Separator for fuel cell, fuel cell using the separator, and paint composition for preparaing the separator |
CN100511524C (en) | 2005-12-29 | 2009-07-08 | 华晶科技股份有限公司 | Connecting structure of control switch |
DE102006003279B4 (en) * | 2006-01-23 | 2010-03-25 | W.C. Heraeus Gmbh | Sputtering target with high melting phase |
US20080127887A1 (en) * | 2006-12-01 | 2008-06-05 | Applied Materials, Inc. | Vertically mounted rotary cathodes in sputtering system on elevated rails |
CN101434818A (en) | 2007-11-15 | 2009-05-20 | 郭东明 | Isocyanate modified aqueous polymer waterproof coating material |
CN101386719B (en) | 2008-08-28 | 2010-12-08 | 冯守中 | Multifunctional coatings and preparation method thereof |
US7785921B1 (en) * | 2009-04-13 | 2010-08-31 | Miasole | Barrier for doped molybdenum targets |
US20110014469A1 (en) * | 2009-07-14 | 2011-01-20 | Sakai Chemical Industry Co., Ltd. | Magnesium oxide particle, method for producing it, exoergic filler, resin composition, exoergic grease and exoergic coating composition |
US8449818B2 (en) | 2010-06-30 | 2013-05-28 | H. C. Starck, Inc. | Molybdenum containing targets |
-
2011
- 2011-04-08 AT ATGM203/2011U patent/AT12695U1/en not_active IP Right Cessation
-
2012
- 2012-03-01 TW TW101106684A patent/TWI568870B/en active
- 2012-04-05 CN CN201280017348.0A patent/CN103518002A/en active Pending
- 2012-04-05 WO PCT/AT2012/000094 patent/WO2012135883A1/en active Application Filing
- 2012-04-05 CN CN201811191898.XA patent/CN109609917A/en active Pending
- 2012-04-05 EP EP12725603.0A patent/EP2694697B1/en active Active
- 2012-04-05 KR KR1020137026436A patent/KR102068366B1/en active IP Right Grant
- 2012-04-05 JP JP2014502951A patent/JP6328550B2/en active Active
- 2012-04-05 US US14/110,527 patent/US10978279B2/en active Active
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02301559A (en) * | 1989-05-15 | 1990-12-13 | Kojundo Chem Lab Co Ltd | Target for sputtering having integrated structure |
JPH0499270A (en) * | 1990-08-11 | 1992-03-31 | Fujitsu Ltd | Sputtering target and film formation by sputtering |
JPH0539566A (en) * | 1991-02-19 | 1993-02-19 | Mitsubishi Materials Corp | Sputtering target and its production |
US5435965A (en) * | 1991-02-19 | 1995-07-25 | Mitsubishi Materials Corporation | Sputtering target and method for manufacturing same |
JPH0817763A (en) * | 1994-06-28 | 1996-01-19 | Riyouka Massey Kk | Sputtering target |
JP2000239839A (en) * | 1999-02-19 | 2000-09-05 | Tadahiro Omi | Sputtering device |
WO2001077402A2 (en) * | 2000-04-07 | 2001-10-18 | Surface Engineered Products Corporation | Method and apparatus for magnetron sputtering |
JP2005520935A (en) * | 2002-03-22 | 2005-07-14 | ヴルチンガー・ディーター | Rotatable tubular cathode |
US20050178662A1 (en) * | 2002-03-22 | 2005-08-18 | Dieter Wurczinger | Rotating tubular cathode |
JP2007302981A (en) * | 2006-05-15 | 2007-11-22 | Hitachi Metals Ltd | METHOD FOR MANUFACTURING CYLINDRICAL SPUTTERING TARGET MATERIAL OF Mo ALLOY |
WO2008150686A1 (en) * | 2007-05-30 | 2008-12-11 | Applied Materials, Inc. | Bonding method for cylindrical target |
JP2012162759A (en) * | 2011-02-04 | 2012-08-30 | Sumitomo Metal Mining Co Ltd | Cylindrical sputtering target |
Also Published As
Publication number | Publication date |
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KR20140018274A (en) | 2014-02-12 |
KR102068366B1 (en) | 2020-01-20 |
EP2694697A1 (en) | 2014-02-12 |
AT12695U1 (en) | 2012-10-15 |
CN103518002A (en) | 2014-01-15 |
EP2694697B1 (en) | 2018-08-01 |
TWI568870B (en) | 2017-02-01 |
WO2012135883A1 (en) | 2012-10-11 |
US10978279B2 (en) | 2021-04-13 |
TW201245482A (en) | 2012-11-16 |
CN109609917A (en) | 2019-04-12 |
US20140027276A1 (en) | 2014-01-30 |
JP6328550B2 (en) | 2018-05-23 |
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